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TW200834757A - Method of forming a micromechanical device with microfluidic lubricant channel - Google Patents

Method of forming a micromechanical device with microfluidic lubricant channel Download PDF

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Publication number
TW200834757A
TW200834757A TW096135957A TW96135957A TW200834757A TW 200834757 A TW200834757 A TW 200834757A TW 096135957 A TW096135957 A TW 096135957A TW 96135957 A TW96135957 A TW 96135957A TW 200834757 A TW200834757 A TW 200834757A
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Taiwan
Prior art keywords
lubricant
channel
lubricant passage
passage
treatment zone
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TW096135957A
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Chinese (zh)
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TWI351066B (en
Inventor
Dongmin Chen
William Spencer Worley
Hung-Nan Chen
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Miradia Inc
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    • H10W70/60

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  • Micromachines (AREA)

Abstract

A micromechanical device assembly includes a micromechanical device enclosed within a processing region and a lubricant channel formed through an interior wall of the processing region and in fluid communication with the processing region. Lubricant is injected into the lubricant channel via capillary forces and held therein via surface tension of the lubricant against the internal surfaces of the lubrication channel. The lubricant channel containing the lubricant provides a ready supply of fresh lubricant to prevent stiction from occurring between interacting components of the micromechanical device disposed within the processing region.

Description

200834757 九、發明說明: 【發明所屬技術領域】 本發明的實施例一般涉及微機電和奈機電系統,更特定而古,涉及芒 些具有一個或更多個微流體潤滑劑通道的系統。, ° ^ 【先前技術】 么衆所周知,隨著裝置變得更小,裝置組件之間的原子級和微觀位準力 憂彳寸愈加關鍵。此種與力之型式有關的問題在諸如微機電系統 和奈機電系統(NEMS)的微機械裝置中相當普遍。尤其是,在操作期間移 動、、且件之間有思或無思地彼此接觸所産生的‘‘黏著(sticti〇n ),,力,是微機械 ,置之共關題。當彼此接觸的移動部份之間所産生的表面間引力超過恢 復力時,發生黏著型故障。因此,這些組件的表面永久地或暫時地彼此黏 附,引起裝置故障或操作不良。黏著力是複雜的表面現象,其通常包括: 凡=力(VanderWaal’sf〇rce)、以及靜電引力。這裏所使用的術 =接觸-般摘是兩録面之間_何交互_,不局_表面實際實體 =。,典型的微機械裝㈣示例為:RF開關、光調變器、微歯輪、加速 二:輪在 ==體噴嘴、旋轉儀、以及其他類似的裝置器。 L 使用術語“施MS裝置,,以-般地說明微機械裝置, 匕括上面所时論的MEMS和NEMS裝置兩者。 問題的致動器中尤其容易産生 潤滑以減少組件表面之間的黏著和磨損的情3 ϊ種形式的 和麵產ΐ面千臨人=大=^^上可行的壽命。因此,零 性。 礼械之一疋黏者面上的接觸微結構的長期可靠 技術在 化或雷射圖案化),以藉由诗表進订紋理化處理(例如,藉,微圖案 樣的技術涉及選擇特定曰的材丈接觸面積來減小總的黏附力。另-種這 4,由此使接觸表面降低表面能量、減少充電、 5 200834757 或組件之間的接觸電位差。 滑判2二些習”參考文獻建議在交互作用裝置周圍的區域中加入潤 生與黏著有關的故障的機會。取決於材料的特性、溫度、壓 、r 啦“紐”騎酿在周®條件(即室溫和大氣壓)下處於固態或 2去潤滑劑。—些習知技術參考文獻描述了處於“蒸汽,,態的潤滑劑。這 文獻使用術語“氣相潤滑劑,,來一般地描述成分的混合,所述成分包 如’氣)和蒸汽化第二成分,所述蒸汽化第二成分在接近 和壓力(例如,S7P)下是固體或液體。在大部份的傳 固體或液體潤滑劑在高於室溫許多的溫度與低於大氣壓 多的壓力下,保持在固態或液態。 八 在周圍條件下和遠高於周圍溫度的溫度下是固體知夜體的典型潤滑劑 的二例、γ以在諸如美國專利第6,93G,367號的參考文獻中找到。此種習知 技,潤滑舰括:藉由個氣械積過㈣沈積在各歡互侧組件上的 二氯二甲基石夕烷(“DDMS”)、十八烷基三氯矽烷(“〇ts,〇、全氟辛基三氯 魏(“PFOTCS”)、全氟癸酸(“PFDA,,)、全基三氯石規(‘卞^了)、、 全氟聚_ (“PFPE”)及域氣烧基雜(“F0TS”),所述氣相沈積過程例如 是常壓化學氣相沈積(APCVD)、低壓化學氣相沈積(LPCVD)、電漿體 增強化學氣相沈積(PECVD)或其他類似的沈積過程。 、在MEMS組件的表面上形成低表面能有機鈍化層的技術在本領域中 通常稱為“瘵汽潤滑劑”塗佈。使用諸如自組裝單層(SAM)塗層之類的低 表面能有機鈍化層的一個嚴重缺陷是其典型地為大約一個單層^等=。通 常,因爲這些型式的塗層容易由於各個移動組件的交互作用生的衝擊 或磨損而發生損壞或位移,所以它們具有非常有限的可用壽命。這在具有 接觸表面的MEMS裝置(例如光調變器和RF開關)中不可避免地發生, 上述接觸表面會經受使用中的頻繁接觸和產品壽命期間的大量接觸。&quot;在沒 有某種方式來可靠地恢復或修復受損塗層的情況下,會發生黏著並迭成穿 置故障。 如第1A圖所示,一種用於潤滑MEMS組件的方法是在封裝1〇〇 (其 6 200834757 =括基底m、盍子ι〇4和密封件1〇6)内提供吸氣劑(神er) 11〇,碰娜 ^置108的陣列位於封裝1〇〇中。第ΐβ圖說明一個傳統的封裝—,其包 二壯MEMS裝置108、和位於封裝12〇的頭上空間124内的吸氣劑則。 ^衣^20更包括·封裝基板128、窗口 126、以及間隔環125。這兩種組態 65843593 6 659795893</ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; , ° ^ [Prior Art] It is well known that as devices become smaller, the atomic and microscopic level of force between device components becomes more critical. Such problems with the type of force are quite common in micromechanical devices such as MEMS and NEMS. In particular, the ‘‘stationary’, force, which is moved during operation, and which is in contact with each other with thought or innocence, is a micromechanical problem. Adhesive failure occurs when the inter-gravitational force generated between the moving parts in contact with each other exceeds the restoring force. Therefore, the surfaces of these components are permanently or temporarily adhered to each other, causing malfunction or malfunction of the device. Adhesion is a complex surface phenomenon that typically includes: VanderWaal’s f〇rce, and electrostatic attraction. The technique used here = contact-like pick is the interaction between the two recording faces _, the _ surface actual entity =. Typical micro-mechanical (4) examples are: RF switch, optical modulator, micro-turn wheel, acceleration 2: wheel in == body nozzle, rotator, and other similar devices. L uses the term "MS device" to describe the micromechanical device in a general manner, including both the MEMS and NEMS devices discussed above. The problematic actuator is particularly prone to lubrication to reduce adhesion between component surfaces. And wear and tear of love 3 ϊ 形式 形式 和 = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = Or laser patterning) to customize the texturing process by poetry (for example, the technique of micropatterning involves selecting the contact area of the material of a particular crucible to reduce the total adhesion. Another type of this, This reduces the surface energy of the contact surface, reduces the contact potential difference between charging, 5 200834757 or the component. The reference is recommended to add the opportunity of the adhesion-related failure in the area around the interaction device. Depending on the characteristics of the material, temperature, pressure, r, “New” riding is in the solid state or 2 delustering under the Week® conditions (ie room temperature and atmospheric pressure). Some of the prior art references describe the “steam, State Lubricant. This document uses the term "gas phase lubricant, to generally describe the mixing of ingredients, such as 'gas') and vaporized second ingredients, which are in proximity and pressure (eg Under S7P) is a solid or a liquid. Most of the solid or liquid lubricants remain in solid or liquid state at temperatures above room temperature and pressures below atmospheric pressure. VIII Under the ambient conditions and at temperatures well above ambient temperature, two examples of typical lubricants for solid corpuscles, gamma, are found in references such as U.S. Patent No. 6,93, 367. Such a conventional technique, a lubricating ship, consists of: (2) Dichlorodimethyl-infraline ("DDMS"), octadecyltrichloromethane ("D) deposited on each side component by a gas machine (" 〇ts, 〇, perfluorooctyl trichloro-Wei ("PFOTCS"), perfluorodecanoic acid ("PFDA,"), all-based triclosan ('卞^), perfluoropoly_ ("PFPE And gas-phase deposition processes ("F0TS"), such as atmospheric pressure chemical vapor deposition (APCVD), low pressure chemical vapor deposition (LPCVD), and plasma enhanced chemical vapor deposition ("F0TS"). PECVD) or other similar deposition processes. Techniques for forming a low surface energy organic passivation layer on the surface of a MEMS component are commonly referred to in the art as "steam lubricant" coatings, such as self-assembled monolayers (SAM). A serious drawback of low surface energy organic passivation layers such as coatings is that they are typically about a single layer, etc. Typically, because these types of coatings are susceptible to impact or wear due to the interaction of various moving components. Damage or displacement occurs, so they have a very limited usable life. Contact surface MEMS devices (such as optical modulators and RF switches) inevitably occur, and the contact surfaces described above are subject to frequent contact during use and substantial contact during product life. &quot; There is no way to reliably recover In the case of repairing a damaged coating, adhesion and lamination failure may occur. As shown in Fig. 1A, a method for lubricating a MEMS component is in a package (the 6 200834757 = base m, The 吸 〇 〇 4 and the seal 1 〇 6) provide a getter (God er) 11 〇, the array of the 娜 ^ 置 108 is located in the package 1 。. The ΐ β diagram illustrates a traditional package - its package The two MEMS device 108, and the getter in the head space 124 of the package 12〇, further includes a package substrate 128, a window 126, and a spacer ring 125. The two configurations 65843593 6 659795893

^魏置_某種型式的可逆吸收吸氣劑,來將潤滑劑分子儲存 微管的内部體積中。在這些設計中,潤滑劑來源被保持在吸 &gt;^將舰娜裝置1〇8潤滑所需要的適量潤滑劑在正常操作期 二w&amp;疋’增加可逆吸收吸__存庫雜持_麟劑增加封 =娜性,並且向製造過程增加了 _,所树些都增加了 姑u ^、S裳置的零件成本以及整體製造成本。因此,形成使用這些 需要數個勞力密集與昂#的處理步驟,例如:混合吸氣劑 2 劑材料錄於包含裝置的封裝、固化吸氣劑材料、調節或啟 動及賴!材料、然後將應廳裝置和吸氣劑密封在密封封裝中。 少麼常大娜竟巾存在的粒子、濕氣和其他污染物,其有害地 === 舰職置成品率、和臟S裝置醉鱗命。在防止 二巧化―努力中,此個以形成廳MS裝置的多個處理步驟通常在 室環境(例如,10級或更好)中完成。由於産生和保持iq 室環境所需要高成本,所以需要這種潔淨室環_ 讓^製造雛,錢少糊嫩繼環境的處理 數目種 ntn麵娜⑽祕與日麵絲魏_的努力巾,·MS 二將腿⑽裝置封在裝置封裝中,以使得在MEMS裝置周 === 專罐,過程,常要求包含在裝置封裝内 ㈣;並,U封瓜(尤其是晶圓級密閉封裝)的密封過程期間^Wei _ a type of reversible absorption getter to store lubricant molecules in the internal volume of the microtubes. In these designs, the source of the lubricant is kept in the suction &gt; ^ the amount of lubricant required to lubricate the naval unit 1〇8 in the normal operation period w &amp; 疋 ' increase reversible absorption _ _ _ _ _ _ The agent increases the seal = Na, and adds _ to the manufacturing process, which adds to the cost of parts and overall manufacturing costs. Therefore, the formation of these processes requires several labor-intensive and intensive treatment steps, for example: mixing getter 2 materials recorded in the package containing the device, curing the getter material, conditioning or starting and relying on the material, and then should The hall unit and getter are sealed in a sealed package. Less often, Chang Da Na actually has the particles, moisture and other pollutants in the towel, which is harmful to the === shipboard placement yield rate, and dirty S device drunk scale life. In the prevention of the ingenuity - the effort to complete the multiple processing steps of the hall MS device is typically done in a room environment (e.g., level 10 or better). Due to the high cost required to create and maintain the environment of the iq room, it is necessary to make such a clean room ring _ let ^ make the chicks, the money is less than the tenderness of the environment, the number of treatments of the kind of ntn face Na (10) secret and the surface silk Wei _ effort towel, · MS two will seal the leg (10) device in the device package, so that in the MEMS device week === special tank, the process is often required to be included in the device package (4); and, U-guap (especially wafer-level sealed package) During the sealing process

如_㈣合料晶接合之_傳膽封過程要 / 賴、錢其蜮放倾加朗以2贼至45(TC ΐ 高接if/嚴於裝置«關滑劑的型 式亚且通導致潤滑劑在長期的曝露之後蒸發掉或失效 7 200834757 合過程綱蒸發了 _ _可能概再凝 表面。因此’亦需要-種规泌裝置封 ^ '上亚且&gt;5染該密封 裴置製造雜_對高溫_露或料則、化〜^ _程擔潤滑劑在 【發明内容】 更多個通道的存在而具有改良的γ车又〜a.該微機械裝置由於一個或 本發明的實關說於形成微機卿置 本發明通常有關於形成微機械裝置的方法, 的方法,將 潤滑劑注入到微機械裝置總成的潤滑古土 式傳送到《截㈣找,以」賴以氣體形 所述封裝包括基底、插件、以及蓋子U裝私錢械裝置的方法,其中Such as _ (four) material crystal joints _ pass the bile seal process to / Lai, Qian Qichen put the lang to 2 thief to 45 (TC ΐ high connection if / strict device « slip agent type sub-pass and lead to lubrication Evaporation or failure of the agent after long-term exposure 7 200834757 The process of the process evaporates _ _ may re-condense the surface. Therefore, 'also need to - a type of device to seal the device ^ 'Asia and &gt; 5 dye the seal device manufacturing miscellaneous _For high temperature _ dew or material, 〜 _ _ 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承 承In the present invention, there is generally a method for forming a micromechanical device, a method of injecting a lubricant into a micromechanical device assembly, and transferring it to the "cutting (four) looking for" The package includes a substrate, an insert, and a method of attaching the device to the cover U, wherein

根據本發明-實施例形成微機械裝置 P 置和形成潤滑劑通道的步驟,所述潤滑劑通ί穿過微二機械裝 壁延伸,其中,潤滑劑通道的大部分長裝S3區内 置總成的外表Ϊ,步驟,該通道人口穿過微機械裝 通運入口與潤滑劑通道以流體連通。 延伸朗壁之愤而被其完全圍繞。麟射以在封 ϊί 酬滑舰道+。當在雖滅封讀添加潤滑 =ίΐ 道中與潤滑舰道進入處理區的開口接近的位A step of forming a micromechanical device P and forming a lubricant passage in accordance with the present invention-embodiment, the lubricant extending through the micro-two mechanical wall, wherein a majority of the long-distance S3 region of the lubricant passage has a built-in assembly The appearance of the step, the passage of the passage through the micromechanical loading inlet is in fluid communication with the lubricant passage. Extending the anger of Langfang and being completely surrounded by it. Lin shot in the seal ϊί paid slipway +. When the lubrication is added, the position close to the opening of the lubrication channel into the treatment zone is added.

械^處理、將騎劑儲存在具有微機械裝置和用於該微機 ^劑通逼中的步驟,該潤滑劑通道穿過處理區的内壁延伸,其中U 置處,其中’帽包括響應於光輻射或加熱而變為多孔之材料 =2發·-實施婦騎敝人舰賊裝魏成_ 卞的方法包括:職用於從外部接達耐舰道的孔、和藉由毛細力t、、i 注人酬滑劑通道中的步驟。孔可以用短脈衝雷射或長脈衝雷ΐ 2射鑽孔來形成,以及隨_㈣射、電子束源、或赌而密封衝= —只關中’在濁滑劑通道與外部之間保持麼力差,以致於潤滑劑通道中 200834757 之壓力两於外部壓力。 根據本發明一實施例在具有微機械裝置和用於該微機械裝置的處理區 的封裝中,以氣體形式將潤滑劑傳送到微機械裝置的方法包括:將潤严^ 儲存f與處理區流體連通的潤滑劑通道中、以及加熱該封裝的步驟, 潤滑劑通道具有1〇μπι至8〇〇μπι的寬度和1〇μιη至2〇〇_的深度。潤严; 通道進入處理區的開口具有組態在該開口中的帽,所述帽由響應於=== 或加熱而變得多孔的材料構成。 θ…罕田射 =本發明—實施·成具有基底、插件和蓋子的經封倾機械 勺方法匕括步驟:在基底上形成微機械裝置;將插件接合到基底;ς ^到插件;以及在基底、插件、以及蓋子之至少—者中形成麟劑通^, 八中,潤滑劑通道與微機械裝置的處理區流體連通。可以在高溫 1極接合、共晶接合、或玻璃料接合’也可以藉由使用環氧:脂 触接合在較低溫度下騎接合。#使用高溫接合時,在it 將撕娜加廟滑舰道巾。另—方面,#制魏接= 接合步驟之前將潤滑劑添加到潤滑劑通道。 守在 、本發明的-個優點在練置封裝内形成了爾材料的 可以將‘‘新鮮”麟材料之數量傳送到可能發生黏著的區域。在一觀 丄 =料包含在-個或更多個微通道中,這些微通於將移二= ^藉由-個通道以依序方式被帶人到裝置/或二 S可職技術相對於傳統潤滑劑二Ϊ 罪更,、成本效益方式,防止與黏著有關的裝置故障。 【實施方式】 簡 ,特徵。然而,應注意’此等所附圖式僅說明本發二型:瞭^本發= ==認為關本發明之朗,较由於本發啊心 9 200834757 為了清楚起見,在當應用時使用相同參考號碼,以表示在此等圖間所 共同之相同兀件。應當设想’可以將一實施例之特徵併入於其他實施例中, 而無需進一步說明。 本發明-般地涉及微機械裝i ’該微機械裝置由於存在一個或更多個 包含且傳送騎_通道、而具有改良之可伽壽命,所述珊劑可以降 低裝置的各個移動部份之間發生黏著的可能性。 本發明的貫施例包括圍繞的裝置封裝和形成該裝置封裝的方法,其中 圍2裝置織具有-個或更多她含輯_通道,騰制 =S裝置,MEMS裝置設4树置雕_麵_。所述― 爾_通道作騎鮮断_現成健,赠止域在裝置封 區域⑽裝置各個交互作用組件之間的黏著。新鮮潤滑 ^ ==用於補充各接觸表面之間損壞的澗滑劑(耗損Processing, storing the riding agent in a step having a micromechanical device for extending through the inner wall of the processing zone, wherein the U cap is disposed in response to the light Radiation or heating to become a porous material = 2 hair · - Implementation of the woman riding a scorpion ship thief to install Wei Cheng _ 卞 method includes: the job is used to access the hole from the outside, and by capillary force t, i Steps in the pay slip channel. Holes can be formed with short-pulse lasers or long-pulse Rays 2 shots, and with _(four) shots, electron beam sources, or gambling seals = - only in the middle 'between the wiper channel and the outside The force difference is such that the pressure of 200834757 in the lubricant passage is equal to the external pressure. According to an embodiment of the invention, in a package having a micromechanical device and a processing zone for the micromechanical device, the method of transferring the lubricant to the micromechanical device in the form of a gas comprises: storing the fluid and the fluid in the treatment zone In the connected lubricant passage, and in the step of heating the package, the lubricant passage has a width of from 1 μm to 8 μm and a depth of from 1 μm to 2〇〇. The opening of the channel into the treatment zone has a cap disposed in the opening, the cap being constructed of a material that becomes porous in response to === or heating. θ...罕田射=present invention—implementation into a pour-on mechanical scoop method having a substrate, an insert, and a lid, the method comprising: forming a micromechanical device on the substrate; joining the insert to the substrate; ς ^ to the insert; At least one of the substrate, the insert, and the cover forms a lining agent, and the lubricant passage is in fluid communication with the processing zone of the micromechanical device. It can be joined at a lower temperature by a high temperature 1-pole bond, a eutectic bond, or a frit bond&apos; by using an epoxy:lipt joint. # When using high temperature joints, it will tear the Nagar Temple slippery towel. On the other hand, the #魏接= lubricant is added to the lubricant passage before the joining step. The advantage of the present invention is that the material formed in the package can transfer the amount of ''fresh') material to the area where adhesion may occur. In one view, the material is contained in - or more In a microchannel, these micro-passes will be moved by two = ^ by a channel in a sequential manner to bring people to the device / or two S-services, compared to the traditional lubricants, more cost-effective, Preventing equipment failure related to adhesion. [Embodiment] Simple, characteristic. However, it should be noted that 'these drawings only show the second type of this invention: ^本发发=== thinks that the invention is the same, because For the sake of clarity, the same reference numbers are used when applied to indicate the same elements that are common between the figures. It is contemplated that the features of one embodiment may be incorporated in other embodiments. Without further elaboration. The present invention generally relates to micromechanical devices. The micromechanical device can be reduced by the presence of one or more inclusions and transporting ride-channels with improved gamma lifetime. Each moving part of the device The possibility of sticking occurs between the embodiments of the present invention. The present invention includes a surrounding device package and a method of forming the device package, wherein the package 2 has one or more of her _ channels, and the sigma = S device. The MEMS device is provided with 4 trees, _ _ _ _ _ _ _ channel for riding fresh _ ready-made, the binding field in the device sealing area (10) device between the various interaction components. Fresh lubrication ^ = = for Replenishing the slip agent between the contact surfaces (depletion)

本發_觀點對赠造微機械裝置特 I 如是麵8裝置、或其他類似的熱裝置或流體V置衣· 於新例t’旦選擇此設置在通道内的潤滑劑的數量和型式,以致 :==:;r區的壁“上’並且隨後作為分= 本領域技術人貞可㈣解,這裏所制的術語 向接觸表面提供晰、抗轉及/或抗絲躲的 ^二,適於 2術語“潤滑劑,’-般用來描述在施MS裝置的操作 ‘^晨所使用 瘵况及/或氣體狀之潤滑劑。 子J間處於液體、 典範系統的槪彼 ★在防止MEMS或NEMS、组件的壽命受污染影 封在與諸如粒子、濕氣或其他異質材料的“ ^⑽這些裝置 中。第2A圖說明典型的應施裳置封裝23〇的横截面圖^ 200834757 裝230包含封在處理區234内的meMS裝置231,處理區⑽形成在苗子 232、插件235和基底233之間。典型地,蓋子232、插件235和基底^33 都被密閉地或非密閉地密封,以致於處理區234中組件與可能干擾裝置使 用的外部污染隔離。 一 欠、 第2B圖說明可以在帛2A圖的meMs裝置231 _成的代表性的微 機械裝置,其在這裏用於描述本發明的各種實施例。第2B圖中所示的裝 置概要說明包含在空間光調變器(SLM)中的單__鏡總成1G1的橫截面圖: 因為本領域技術人員可以理解,在此所說明各種實施例可關於其他經驗 黏著或其他_問題的MEMS、NEMS、大規模致麵或或其他可 比較裝置,所以應當注意第況圖所示的廳MS裝置之用意並非以任何方 式限制在此賴_發明顧。雜以下騎制討論㈣應^或 NEMS型式裝置的本發明―個或更乡個各種實施例之顧,此等組態之用 意並非限制本發明的範圍。 通苇,單一鏡總成101可以包含:鏡102 ;基底1〇3 ;以及撓性構件 107 ’其將鏡102連接到基底103。基底1〇3 一般設有形成在基底1〇3的表 面105上的至少一個電極(元件1〇6A或1〇6B)。基底1〇3可以由任何合適 的材料製成’珊料-般機械上穩定並且能夠使祕獅半導體處理技術 來形成。在-觀財,基底1G3是由諸如含雜料的半導體材料所形成, 並且,據彳*準的半導體處理技術來處理。其他材料也可以用於本發明的可 替代實施例中。電極106A、1G6B可以由導電的任何材料製成。在一觀點 中’电極106A、106B由金屬(例如,!呂、鈦)製成,以及沈積在基底1〇3 的表面105上’並且被姓刻以產生所想要的形狀。在2〇〇4年7月28曰提 出申請之共同轉讓的美國專利申請案號帛1〇/爾,7〇6號中說明此種型式的 MEMS裝置。 —鏡102通常包含:反射表面1〇2A和鏡底1〇2B。反射表面呢八通常 ,由*在鏡底1G2B上沈積諸如!g或其他合適材料之類的金屬層而形成。鏡 〇2 ^由撓性構件107裝附至基底1〇3。在一觀點中,挽性構件1〇7是懸臂 ’彈男,其適於響應於所施加力而彎曲,並且隨後在去除所施加力之後返 回其原來形狀。在-個實施例中,基底期由第一單片材料製造,挽性構 11 200834757 件107和鏡底102B由諸如單晶石夕之類的第二單片材料製造。重要的是, 使用允許-倾件(例如,鏡1G2)的表面在裝置操作綱與另—個也件 (例如’基底1G3)的表面接觸,因而導致與黏著有__的任何裝 組態都落在本發明的範圍中。例如,響應於所施加之力而簡單支懸: • 繞,雜軸旋轉,以致於懸臂梁-端接難置另-個表面,這是在本^明 的範圍中。 ^ 在-個觀點中,在基底103的表面1〇5上形成一個或更多個可選的接 耆墊(landing — )(第2B圖中的元件10仏和1〇4B)。接著塾例如藉由沈 積包含铭、氮化鈦、鎢或其他合適的材料的金屬層而形成。在其他^二 • 接著塾可以由石夕⑻、多晶秒(p*-si)、氮化秒(SiN)、碳化石夕(&amp;)、 類金,石碳(DLC)、銅(〇〇、鈦㈤及/或其他合適材料構成。 第,2C 5U兒明由於靜電力Fe的施加而處於扭曲狀態的單一鏡 101,靜電力FE是藉由使用電源112在鏡搬和電極祕a之間施加電壓 νΑ而産生。如第2C圖所示,、經常想要將接著墊(例如,元件1〇4A)偏^ 至與鏡102相同的電位,以消除相對於鏡1〇2之接觸區域中的電崩 電充電。在典型的操作期間,單一鏡總成1〇1被致動,使得鏡1〇2與 墊104A接觸,以確保鏡1〇2和基底1〇3乂間達成所想要的角度,以致於 所輸入之光輻射“A”以想要的方向%,,從鏡1〇2的表面反射。.鏡1〇2由於電 壓Va的施加而朝電極106A偏轉,並由於撓性構件107的彎曲而産生恢&amp; 攀 力(例如力矩)。恢復力的大小一般由:撓性構件1〇7的實體尺寸和材料特 性、以及撓性構件H)7所經受的扭曲大小來決定。最大恢復力典型地受限 於:精由施加最大允許電壓vA所能産生的靜電力Fe所施加的力矩而限制。 為了確保鏡102和接著塾104A之間的接觸,靜電力&amp;必須大於最大恢復 力。 ▲ P遠著鏡102和接著墊104A之間的距離減小,這些組件的表面之 父互作用通常産生-個或更多個作驗鏡1G2峰著力。當這種點著 於或超過恢復力時,就發生了裝置故障,這是因為當由電壓%戶斤産生的靜 電力被去除或減小時,防止鏡102移動至不同位置。 純此處先前綱,黏著力是通常包括三餘要成分的複雜表面現 12 200834757 主魏分是所謂的“毛細力”,毛細力是由於在液齡面分子間力 失衡(例如,拉普減壓力差)、岐㈣和_之間齡面處 =The present invention is directed to the gift of a micromechanical device, such as a face 8 device, or other similar thermal device or fluid V. In the new case, the number and type of lubricants disposed in the channel are selected such that :==:; the wall of the r zone is "upper" and then as a sub-division = the technical person in the art can (4) solve the problem, the term made here provides the contact surface with clear, anti-rotation and/or anti-filament. The term "lubricant," is used to describe the use of the MS device and/or gaseous lubricants. The sub-J is in a liquid, exemplary system. In the prevention of MEMS or NEMS, the life of components is contaminated in "^(10) devices such as particles, moisture or other heterogeneous materials. Figure 2A illustrates a typical Cross-sectional view of the package 23 ^ 2008 200834757 The package 230 includes a meMS device 231 enclosed within a processing zone 234 formed between the seedling 232, the insert 235 and the substrate 233. Typically, the cover 232, the insert Both the 235 and the substrate ^33 are hermetically sealed or non-hermetically sealed such that the components in the processing zone 234 are isolated from external contamination that may interfere with the use of the device. An owing, Figure 2B illustrates the meMs device 231 in Figure 2A. Representative micromechanical device, which is used herein to describe various embodiments of the present invention. The device shown in Figure 2B outlines a single __ mirror assembly 1G1 included in a spatial light modulator (SLM) Cross-sectional view: As those skilled in the art will appreciate, the various embodiments described herein may be directed to other empirically adhered or otherwise problematic MEMS, NEMS, large scale face or other comparable devices, so care should be taken The intention of the hall MS device shown in the figure is not limited in any way. The following is a discussion of the invention of the NEMS type device or the various embodiments of the NEMS type device. The purpose of the configuration is not to limit the scope of the invention. By way of example, the single mirror assembly 101 can comprise: a mirror 102; a substrate 1〇3; and a flexible member 107' which connects the mirror 102 to the substrate 103. The substrate 1〇3 At least one electrode (element 1〇6A or 1〇6B) formed on the surface 105 of the substrate 1〇3 is generally provided. The substrate 1〇3 can be made of any suitable material and is mechanically stable and capable of The lion semiconductor processing technology is formed. In the case of the financial, the substrate 1G3 is formed by a semiconductor material such as a miscellaneous material, and is processed according to a semiconductor processing technology. Other materials can also be used in the present invention. In an alternative embodiment, the electrodes 106A, 1G6B may be made of any material that is electrically conductive. In one aspect, the 'electrodes 106A, 106B are made of metal (eg, Lu, Ti), and deposited on the substrate 1〇3 On the surface 105' and is engraved by the surname The MEMS device of this type is described in the commonly-assigned U.S. Patent Application Serial No. 帛1, er. 7, the entire disclosure of which is hereby incorporated by reference. It usually consists of a reflective surface 1〇2A and a mirror bottom 1〇2B. The reflective surface is usually formed by depositing a metal layer such as !g or other suitable material on the mirror bottom 1G2B. The member 107 is attached to the substrate 1 〇 3. In one aspect, the tract member 1 〇 7 is a cantilever 'elastic, which is adapted to bend in response to the applied force, and then returns to its original state after removing the applied force. shape. In one embodiment, the substrate phase is fabricated from a first monolithic material, and the pull-up structure 11 200834757 107 and the mirror base 102B are fabricated from a second monolithic material such as single crystal. It is important that the surface of the allowable-dip (eg, mirror 1G2) is in contact with the surface of the device (eg, 'substrate 1G3), thus resulting in any configuration with __ adhered It is within the scope of the invention. For example, it is simply suspended in response to the applied force: • Winding, miscellaneous axis rotation, so that the cantilever beam-termination is difficult to place another surface, which is within the scope of the present invention. ^ In one aspect, one or more optional landings are formed on the surface 1〇5 of the substrate 103 (elements 10仏 and 1〇4B in Fig. 2B). This is then formed, for example, by depositing a metal layer comprising indium, titanium nitride, tungsten or other suitable material. In the other ^2 • Next 塾 can be from Shi Xi (8), polycrystalline seconds (p*-si), nitriding seconds (SiN), carbonized stone (&amp;), gold-like, stone carbon (DLC), copper (〇 〇, titanium (five) and / or other suitable materials. First, 2C 5U children are in a twisted state of the single mirror 101 due to the application of electrostatic force Fe, the electrostatic force FE is used by the power supply 112 in the mirror and the electrode a The voltage ν is applied between them. As shown in Fig. 2C, it is often desirable to bias the pad (e.g., element 1〇4A) to the same potential as the mirror 102 to eliminate the contact area with respect to the mirror 1〇2. In the typical operation, the single mirror assembly 1〇1 is actuated, so that the mirror 1〇2 is in contact with the pad 104A to ensure that the mirror 1〇2 and the substrate 1〇3 are achieved. The angle is so large that the input light radiation "A" is reflected from the surface of the mirror 1〇2 in the desired direction %. The mirror 1〇2 is deflected toward the electrode 106A due to the application of the voltage Va, and The bending of the member 107 produces a recovery &amp; climbing force (e.g., moment). The magnitude of the restoring force is generally determined by the physical size and material of the flexible member 1〇7. Resistance, and a flexible member H) 7 is subjected twist to determine the size. The maximum restoring force is typically limited by the fact that the fine is limited by the moment applied by the electrostatic force Fe that can be generated by applying the maximum allowable voltage vA. In order to ensure contact between the mirror 102 and the subsequent turn 104A, the electrostatic force &amp; must be greater than the maximum restoring force. ▲ The distance between the P-lens 102 and the pad 104A is reduced, and the parental interaction of the surfaces of these components typically results in one or more of the spectacles 1G2 peak force. When this point is at or above the restoring force, a device failure occurs because the mirror 102 is prevented from moving to a different position when the static electricity generated by the voltage % is removed or reduced. Purely here, the adhesion is a complex surface usually consisting of three major components. 12 200834757 The main Wei is the so-called "capillary force", and the capillary force is due to the imbalance of the intermolecular forces in the liquid age (for example, Lapu reduction) Pressure difference), 岐 (four) and _ between the ages =

型吸引力。MEMS和NEMS袭置中的毛細力交互作用通常在薄層液體陷^ ,接觸組件,面之間時發h典型示例是周圍中的水蒸汽。黏著力的 弟-主要成分是凡德關力,凡德瓦目力是在軒或分子彼此非常接近時 産生的基本的量子麵分預力。#脱_彼此接騎,凡彳歧爾力由 於極化而赴,舰極化是因存在第二組件的原子碟—她件的原子中 引起的。當使用非常平坦的結構(例如娜·和姻_裝置中的那些平 坦、、、。構1〇1作日$ ’這麵式的黏著力可能由於有效接觸面積的大小而非常 =。黏著力的第二主要成分是由交互作驗件巾發生的鮮獲 庫侖吸引所産生的靜電力。 〆 _裝置封裝組释 第3A圖是第2A圖中所說明MEMS裝置封裝23〇的平面圖, 裝置封裝230中形成有微流體通道或潤滑劑通道3〇1。為了清楚起見,施娜 ,置封裝230是在去除了蓋子232的部份區段391而說明。潤滑劑通道3〇1 疋微通這’即具有幾微米至小於約lmm的液壓直徑的管道,並且可以形成 於圍,處理區234的任何-個壁中。在—個實施例中,如第3A圖所示,在 ^挨蓋子232下方的插件235中形成潤滑劑通道3(Π。或,可以在mems 裝置封裝230的蓋子232或基底233中形成潤滑劑通道301。 在一個實施例中,潤滑劑通道301從圍繞處理區234的一個壁的内表 面235Β延伸至通道入口 302 (參考第3Β圖)。通道入口 3〇2穿透外表面 235Α’以允許將一種或多種潤滑劑導入到潤滑劑通道3〇1中。在一替代實 施例中,潤滑劑通道301不延伸至外表面(參考第51圖), 二二 處理區234的此等壁之一上形成(參考第犯圖)。 TJ&quot;在圍孤 為了防止粒子、濕氣和其他污染物從外部環境進入到處理區234和潤 滑劑通道301中,潤滑劑通道301被組態,以致於對於外部環境密封。在 個貝加例中,如弟3B圖所圖示,在將潤滑劑(為了清楚起見未示出) 導入到潤滑劑通道301之後,用封閉物302A將通道入口 302密封。以下 13 200834757 結合第6F和6G圖以說明:此根據該實施例用於形成封閉物3〇2A而將通 道入口 302密封的方法。 、、在另-個實施例中,如同第sc圖中所示,在用潤滑劑填充潤滑劑通 迢301之後,將帽3〇4置於通道入口 3〇2上。帽3〇4可以是諸如環氧樹脂 或細之類的聚合物、或其他使用傳統的密封技術接合到外表面235A的 固體材料。在-觀財,帽綱滑劑填充漸舰道3gi之後置 於通,入π 302内的材料塞子。將通道入口搬密封的材料塞子可以是銦 ,屬基子#了以被作為焊料、熔滴施力口到通道入口搬,而不使用可能為 :亏‘物的焊㈣。這疋因為具有♦之銦合金,並因此潤濕外表面235人和通 道入口 302。將通道入口搬密封的材料塞子也可以包括厭水的高真空油 脂,例如Krytox®。 j滑劑通道301適於包含所需量的潤滑劑(未示出),制滑劑隨著時 間=说,散到處理區234中。潤滑劑遷移到處理區中的速率受許多因 =衫響,這些因素包括潤滑劑通道3〇1的幾何形狀、潤滑劑分子量、潤滑 劑至處理區表面(例如,藉由物理韻、化學吸附)賴合強度、潤滑劑 制滑劑通道3m内表面的表面張力所産生的毛細力、潤滑劑溫度、和處 理區234内容積壓力。 在個貝%例中,潤滑劑通道3〇1適於包含約〇·!奈升(ηι)至約1〇〇〇nl 之間的潤滑劑容積。參考第3B ,潤滑劑通道3〇1的體積由所形成的長 度朿=潤/月通道的毛田、截面積來界定。如第3B圖戶斤示,潤滑劑通道的 長度是從外表面235A延伸韻表面235B騎道長度,即線段A、B和c 的長度,和。通道長度在1G微米至lmm之間。在_觀財,潤滑劑通道 的k截面是矩形的,橫截面積(未示出)由潤滑劑通道3〇1的深度(未 不出)和寬度W來界定。在一個實施例中,潤滑劑通道3〇1的寬度|在 大約1〇微米(μπι)到大約_μηι之間,深度在大約1〇微米(μπι)到大 、’、勺200μιη之間。潤滑劑通這3〇1的横截面無須是方形或矩形的,在不偏離 本务明基本範圍的情況下可以是任何想要的形狀。 第3D圖說明潤滑劑通道3〇1,其具有設置於其中之潤滑劑5〇5容積, 以向處理區234提供潤滑劑的現成供應。在MEMS裝置231的正常操作期 14 200834757Attractive. The interaction of capillary forces in MEMS and NEMS hits is typically in the case of thin-layer liquid trapping, contact between components, and the surface is typically a water vapor in the surrounding. Adhesive brother - the main component is Van der Guan, the Van der Waals force is the basic quantum surface pre-force generated when Xuan or the molecules are very close to each other. #脱_接接骑骑,凡彳尔力力 went by polarization, the ship polarization is caused by the atomic disc of the second component - the atom of her piece. When using a very flat structure (such as those in the Na and _ devices), the adhesion of this surface may be very large due to the effective contact area. The second main component is the electrostatic force generated by the fresh Coulomb attraction generated by the interactive test towel. 〆_Device package group release 3A is a plan view of the MEMS device package 23A illustrated in FIG. 2A, the device package 230 A microfluidic channel or lubricant channel 3〇1 is formed therein. For the sake of clarity, the Schott, package 230 is illustrated with a portion 391 of the cover 232 removed. Lubricant channel 3〇1 疋 micropass 'i.e. a pipe having a hydraulic diameter of a few microns to less than about 1 mm, and may be formed in any wall of the treatment zone 234. In one embodiment, as shown in Figure 3A, the cover 232 A lubricant passage 3 is formed in the lower insert 235. Alternatively, the lubricant passage 301 may be formed in the cover 232 or the base 233 of the mems device package 230. In one embodiment, the lubricant passage 301 is from the surrounding treatment zone 234. The inner surface 235 of a wall is delayed To the channel inlet 302 (see Figure 3). The channel inlet 3〇2 penetrates the outer surface 235Α' to allow one or more lubricants to be introduced into the lubricant channel 3〇1. In an alternate embodiment, the lubricant channel 301 does not extend to the outer surface (refer to Fig. 51), and is formed on one of the walls of the second processing zone 234 (refer to the first map). TJ&quot; in the surrounding to prevent particles, moisture and other pollutants from the outside The environment enters the treatment zone 234 and the lubricant channel 301, and the lubricant channel 301 is configured such that it is sealed to the external environment. In a case of a case, as shown in the figure 3B, the lubricant is used (for clarity) The inlets 302 are sealed with the closure 302A after introduction into the lubricant passage 301. The following 13 200834757 incorporates the 6F and 6G diagrams to illustrate: this is used to form the closure 3〇2A according to this embodiment. A method of sealing the channel inlet 302. In another embodiment, as shown in the figure sc, after filling the lubricant port 301 with a lubricant, the cap 3〇4 is placed at the channel inlet 3〇2 Upper. Cap 3〇4 can be such as a ring Oxygen resin or fine polymer, or other solid material bonded to the outer surface 235A using conventional sealing techniques. After the capping agent is filled into the gradual channel 3gi, it is placed in the π 302 The material plug. The material plug that seals the inlet of the channel may be indium, which is a base. It is used as a solder and a droplet application port to the inlet of the channel, and may not be used for welding: (four). The indium alloy with ♦ and thus the outer surface 235 and the channel inlet 302. The material plug that seals the channel inlet may also include a water-repellent high vacuum grease such as Krytox®. The slip channel 301 is adapted to contain a desired amount of lubricant (not shown) which is dispersed into the treatment zone 234 as time is said. The rate at which the lubricant migrates into the treatment zone is affected by many factors, including the geometry of the lubricant channel 3〇1, the molecular weight of the lubricant, and the lubricant to the surface of the treatment zone (eg, by physical rhyme, chemisorption). The capillary strength, the lubricant temperature, and the internal pressure of the treatment zone 234 are generated by the strength of the lubricant, the surface tension of the inner surface of the lubricant slip channel 3m. In the case of a sample, the lubricant passage 3〇1 is adapted to contain a lubricant volume between about !·! η (ηι) to about 1〇〇〇nl. Referring to Fig. 3B, the volume of the lubricant passage 3〇1 is defined by the length of the formed 朿=run/moon passage, the cross-sectional area. As shown in Fig. 3B, the length of the lubricant passage is the length of the rhythm surface 235B from the outer surface 235A, that is, the length of the line segments A, B and c, and. The channel length is between 1G micron and 1mm. In the case of the wealth, the k-section of the lubricant passage is rectangular, and the cross-sectional area (not shown) is defined by the depth (not shown) and the width W of the lubricant passage 3〇1. In one embodiment, the width of the lubricant passage 3〇1 is between about 1 〇 micrometer (μπι) to about _μηι, and the depth is between about 1 〇 micrometer (μπι) to large, and the spoon is 200 μιη. The cross section of the lubricant through this 3 〇 1 need not be square or rectangular, and may be any desired shape without departing from the basic scope of the present invention. Figure 3D illustrates a lubricant passage 3〇1 having a volume of lubricant 5〇5 disposed therein to provide a ready supply of lubricant to the treatment zone 234. During the normal operation period of the MEMS device 231 14 200834757

^ 234 ° &gt;F^'f #J 505 ^ MEMS 接廳處纽與轉有_輯是有m互 ,潤滑劑分子在處理區234内的 =子==r的新鮮潤卿 片J刀子口而允許潤)月劑通道301中的潤滑劑505充當潤、、 ^請娜糊 種機構疋表面擴散機構,其中,潤滑劑分子擴散經 夺^ 234 ° &gt;F^'f #J 505 ^ MEMS access to the new and rotating _ series is m mutual, lubricant molecules in the processing area 234 = sub == r fresh Runqing J knife mouth The lubricant 505 in the lunar channel 301 is allowed to act as a moisturizing device, and the surface diffusion mechanism of the lubricant is diffused.

到達兩個交互作用MEMS組件之間的區。在__ 23=内= 泌了使潤滑劑5〇5在處理區234内包含的表面上有好的擴散== .機構是儲存在潤滑劑通道3〇1中的潤滑劑5〇5向兩個交互作用贿^ : 之間的接麵之汽相或氣相遷移。在—觀財,選鮮、門: ,料儲存的潤滑_,以致於從這些區域所吸=== I早=以威或氣體形式進入處理區234。在裝置的操作期間,潤滑劑 《子,理區234 _到平衡分壓(equilibriumpartialpre瞻e〉,然後以基 氣體狀態遷移到處理區234與MEMS裝置231的交互作用表面之間^ 因為這兩種型式的傳送機構有助於潤滑劑層的建立,因而減少 _MS組件的交互作帛,所以將潤滑瓣送到廳廳装置的曝露區^〜 ^通常稱為“補充,,潤滑劑層,並且由任—種傳送機構所傳送的潤滑= 稱為“移動潤滑劑”。通常,足夠數量的補充潤滑劑分子儲存在潤滑劑首 301内,以致於足夠的潤滑劑分子可供使用,而在産品的整個壽命周= 間防止MEMS裝置的交互作用區域處由黏著引起的故障。、口… 在一個實施例中,如同於第3E圖中說明,選擇潤滑劑通道3〇1的尺寸 並且選擇性地處理内表面234A,以使得液體潤滑劑505對潤滑劑通道3〇ι 的表面和内表面234A的表面張力使潤滑劑505從MEMS裝置封裝23〇 外的位置被吸入潤滑劑通道3〇1中,以及然後吸入處理區234中。以此方 式,潤滑劑通道301充當液體注入系統,其允許使用者藉由使用在當潤严 劑505接觸潤滑劑通道301的壁時所産生的毛細力,將適量的潤滑 15 200834757 傳送到處理區234中。在一個示例中,潤滑劑通道301的橫截面是矩形的, 潤滑劑通道301的寬度在大約100微米(pm)和大約600μηι之間,深度在 大約100μ!η士50μπι之間。在當使用時,毛細力可以傳送適量的潤滑劑=〇5 到處理區234,處理區234的體積小於或大於潤滑劑通道3〇1的體積。在 這種組態下,可以經由同一潤滑劑通道3〇1來順序地傳送不同體積的兩種 或更多種不同的潤滑劑。以替代方式,可以藉由潤滑劑通道3〇1傳送第一 潤滑劑,然後在隨後的步驟中,將第二潤滑劑保持在潤滑劑通道3〇ι中。 在另一個實施例中,選擇潤滑劑505以致於潤滑劑5〇5的一部分蒸汽 ,,而在裳置的正常操作期間在處理區内形成蒸汽或氣體。在施祕^置 間光調變H (SLM)的情況下,典型職置操作溫度的範圍可以^大 和大纟口叱之間。晰績域航或缝的能力取決独下因素而 潤制平衡部份壓力、其關賴溫度為函數而變化;圍繞潤滑劑 =區域的壓力、潤滑劑對處理區234内表面的接合強度;以及潤滑劑分子1 里。 實施例中,根據潤滑劑505沿著處理區234中表面快速擴散 選定區域可234内的接觸表面,處理區234的内表面234c中的 在處以作為用於潤滑劑505之非潤濕表面。以此方式, 件猶—紐贿庫,喊有預顧S裝置 在另-個實施例中,潤二 16 200834757 可以設置在潤滑劑通道301中而使用於防止mems裝置内的交互作用 組件發生黏著的潤滑劑505示例為:全氟化聚醚(PFPE)、自組裝單層 (SAM)、或其他液體潤滑劑。一些已知型式的ρ]ρρΕ潤滑劑是可從新澤西 州的Th^rofare的Solvay Solexis公司得到的γ或z型潤滑劑(例如, Fomblm Z25 )、來自Dupont的κ_χ、以及來自有限公 司的?emmim®。SAM的示例包括:二氯二甲基石夕烧卜㈤駡,。、十八烷 矽院(“ots”)全氟辛基三氯魏(“PFOTCS”)、全氟癸基三氯石夕 烧(“FDTS”)、氟烷基石夕烷(“F〇TS”)。 、在替代實施例中,可能想要更改潤滑劑通道301中表面性質,以改變 =劑與潤滑劑通道301的内部區域3〇5 (如第3B圖所示)的表面的接合 •bL例如’可能想要使用諸如自組裝單層(SAM)之類的有機鈍化材料 ϋΐίΐ劑通道3gi的表面。可用的圓材料包括但不侷限於有機矽 [ Z 例如十八烷基二氯矽烷(0TS )、全氟癸基三氯矽烷(FDTS )。 ,可以猎由__通道的表鱗露機波、—光、難或其他形 式的電磁輪射而修正’以改變潤滑劑通道3〇1的表面特性。 以伴說明’傳統技術需撕廳ms裝置封裝增加可逆吸收吸氣劑 I物了裝置封裝尺寸和形成裝置的複雜性,並且 加步驟。此觀置封裝設計由於增加了額外較氣劑組件 中二-二二件成本和總製造成本。因此,藉由在圍繞處理區的各個壁 可以来二4個ΐ之中或之上所形成的潤滑劑通道中設跡動潤滑劑’ 3以軸,,和可靠的MEMS裝置。使用潤滑劑通道3gi可以去 、了裝親尺寸、製造成本、以及零 與裝i封=======(卿,吸氣劑材料) 實施例亦可以改^=用_組件的接觸之可能性’在此所說明 週滑劑通道形成過葙 置 17 200834757 潤滑劑通道301類似的潤滑劑诵指。 使用晶圓級或晶圓級封裝過程,將職^ ^以上在第2A圖中所說明, 中。曰圓㈣脖卢· - h #MEMS裝置圍繞在规娜裝置封裝23〇 公號;:在下美 美麻w 如了以使用將形成MEMS裝置封裝230之 基底233 ’精由日日圓級逾、閉封裝,炎^ 士、 藉倉Η® ΜΡΜς狀罢私壯 來形成貝貝上類似於MEMS裝置230的 衣、衣。可以在基底233上形成多個MEMS裝置231,也 可以將多個MEMS裝置231單獨接人丨其 f 并丛曰问3 饲接口到基底233。可以猎由將基底233、 插件晶回和玻璃晶圓進行接合,來形成密 使用切割、雷射切割、或晶粒分離社m #衣直謂“、、後糟由 成個體MEMS裝置_。晶圓級密義裝和晶粒單—化之後的剩 裝和職酿並獨要超高潔淨室環境,降低製造裝置的總 封衣成本。此外,以下所說明本發明實施例對於傳統规⑽封裝過程具有 優點’這是由於本發明實施例在被使用以形成密封處理區⑽的步驟期 間,去除將MEMS裝置潤滑劑曝露於高溫之需求。 、,雖然以下討論集中於晶圓級封裝方法,但是這些技術和一般處理序列 亚無須魏於麵柄製造擁。因此,在此所綱本發明實施例之用意 亚不在於_本發明的範g。可以受益於在此所描述的本發獨一個或更 多個實施例之MEMS裝置封裝與形成MEMs裝置封裝過程之例,在以下 文件中進一步說明:共同讓與之專利申請中描述:2〇〇3年ι〇月24曰提出申 清之美國專利申請第10/693,323號、代理人文件號碼021713-000300 ; 2004 年7月28日提出申請之美國專利申請第i〇/9〇2,659號、代理人文件號碼 021713-001000;以及2004年12月8曰提出申請之美國專利申請第 11/008,483 號、代理人文件號碼 483021713-001300。 第4A圖說明根據本發明一實施例用於形成包括潤滑劑通道3〇1的 MEMS裝置封裝230的處理序列400。第5A-5F圖說明在處理序列400的 各個步驟被執行之後,MEMS裝置封裝230的一個或更多個組件之各種狀 態。第5A圖是可以使用以形成第5F圖所示多個MEMS裝置封裝230的 18 200834757 晶圓235C的橫截面圖。晶圓235C可以由諸如:石夕(Si)、金尸、女 料、塑膠材料、聚合物材料、或其他合適的材料的材料所形成。V玻耦材 現在參考帛4A圖和f 5Bffl,在步驟450中,用傳統的圖案化男 術、以及乾式侧技術,在晶圓235C的頂表面4〇4上形成潤滑劑通道: 和可選的凹陷40卜由在晶圓235C上實施傳統乾式侧的時間和 率,以設定潤滑劑通道301和凹陷401的深度D。應注意,可以萨 傳統的蝕刻、剝離(ablation)或其他製造技術來形成潤滑劑通道^^^ 陷401,而不會偏離基本的發明範圍。 凹 現在參考第4A圖和第5C圖,在步驟452中,使用傳統的圖案化 影術和乾式蝕刻技術穿過凹陷401的底壁403從背表面4〇5去除材料,以 形成界定内表面235B的通孔402。内表面235B與蓋子232和基底23 第5E-5F圖所示)一起界定了 meMS裝置封裝23〇的處理區234_。 235C去除材料以形成通孔402麟程也可以藉由傳統的餘刻、剥離或:他 類似的製造技術綠行。以替代方式,可以在先前的步财可鄉成^有 通孔402之晶圓235C。 口在步驟454中,如同於第4A圖和第5D圖中所示,蓋子232被接合到 晶圓235C的頂表面404,以圍繞潤滑劑通道3〇1並覆蓋每個通孔4〇2的一Reach the zone between the two interacting MEMS components. Within __ 23 = inside, the lubricant 5 〇 5 has a good diffusion on the surface contained in the treatment zone 234 == . The mechanism is the lubricant stored in the lubricant channel 3 〇 1 5 to 5 Interactions bribes ^: The vapor phase or gas phase migration between the junctions. In the - fortune, fresh, door:, the lubrication of the material storage _, so that it is sucked from these areas === I early = into the treatment area 234 in the form of gas or gas. During operation of the device, the lubricant "sub-zone 234" to equilibrium partial pressure (e, then migrates in a base gas state between the processing zone 234 and the interaction surface of the MEMS device 231) The type of conveying mechanism contributes to the establishment of the lubricant layer, thereby reducing the interaction of the _MS component, so that the lubrication flap is sent to the exposure area of the hall device ^~^ is commonly referred to as "supplement, lubricant layer, and Lubrication transmitted by any type of transfer mechanism is referred to as "moving lubricant." Typically, a sufficient amount of supplemental lubricant molecules are stored in the lubricant head 301 such that sufficient lubricant molecules are available for use in the product. The entire life cycle = between failures caused by adhesion at the interaction area of the MEMS device., port... In one embodiment, as illustrated in Figure 3E, the size of the lubricant channel 3〇1 is selected and selectively The inner surface 234A is treated such that the surface tension of the liquid lubricant 505 against the surface of the lubricant passage 3〇 and the inner surface 234A causes the lubricant 505 to be drawn from a position outside the MEMS device package 23 In the lubricant passage 3〇1, and then into the treatment zone 234. In this manner, the lubricant passage 301 acts as a liquid injection system that allows the user to use when the lubricant 505 contacts the wall of the lubricant passage 301. The resulting capillary force transfers an appropriate amount of lubrication 15 200834757 into the treatment zone 234. In one example, the cross section of the lubricant passage 301 is rectangular, and the width of the lubricant passage 301 is about 100 microns (pm) and approximately Between 600μηι, the depth is between about 100μ!η士 50μπι. When used, the capillary force can transfer an appropriate amount of lubricant = 〇5 to the treatment zone 234, the volume of the treatment zone 234 is smaller or larger than the lubricant channel 3〇1 In this configuration, two or more different lubricants of different volumes can be sequentially delivered via the same lubricant channel 3〇1. Alternatively, the lubricant channel 3〇1 can be used. The first lubricant is delivered, and then the second lubricant is held in the lubricant passage 3 in a subsequent step. In another embodiment, the lubricant 505 is selected such that a portion of the lubricant 5〇5 Steam, and steam or gas is formed in the treatment zone during the normal operation of the skirt. In the case of the light modulation H (SLM), the range of typical operating temperatures can be large and large. Between the 叱. The ability of the performance field or the seam depends on the unique factor and the balance part of the pressure, which depends on the temperature as a function; the pressure around the lubricant = area, the lubricant on the inner surface of the treatment zone 234 Bonding strength; and lubricant molecule 1. In the embodiment, the contact surface within the selected region 234 is rapidly diffused along the surface of the treatment zone 234 according to the lubricant 505, and the interior surface 234c of the treatment zone 234 is used as The non-wetting surface of the lubricant 505. In this way, the device is in the middle of another embodiment, and the Run No. 16 200834757 can be disposed in the lubricant channel 301 to prevent the interaction component in the MEMS device from sticking. Lubricant 505 is exemplified by perfluorinated polyether (PFPE), self-assembled monolayer (SAM), or other liquid lubricant. Some known types of ρ]ρρΕ lubricants are gamma or z-type lubricants available from Solvay Solexis, Inc. of Th^rofare, New Jersey (eg, Fomblm Z25), κ_χ from Dupont, and ?emmim from Co., Ltd. ®. Examples of SAM include: dichlorodimethyl shi shoubu (5) 骂,. , octadecane brothel ("ots") perfluorooctyl trichloropropene ("PFOTCS"), perfluorodecyl chloroform ("FDTS"), fluoroalkyl oxalate ("F〇TS" ). In an alternative embodiment, it may be desirable to modify the surface properties in the lubricant passage 301 to change the engagement of the agent with the surface of the inner region 3〇5 of the lubricant passage 301 (as shown in Figure 3B) • bL such as ' It may be desirable to use an organic passivation material such as a self-assembled monolayer (SAM) to etch the surface of the channel 3gi. Useful round materials include, but are not limited to, organic hydrazine [Z, such as octadecyldichlorodecane (0TS), perfluorodecyltrichlorodecane (FDTS). It can be modified by the __ channel's surface scale, wave, hard, or other form of electromagnetic firing to change the surface characteristics of the lubricant channel 3〇1. With the accompanying description, the conventional technology requires a retractable absorption getter to increase the resilience of the getter and the complexity of the device, and the steps are added. This view of the package design increases the cost of the two-two parts and the total manufacturing cost of the additional air-conditioning components. Therefore, the lubricant '3' is provided in the lubricant passage formed in or among the two or four crucibles around the respective walls of the treatment zone, and a reliable MEMS device. The use of the lubricant channel 3gi can go, the size of the fitting, the manufacturing cost, and the zero and the package ======= (Qing, getter material) The embodiment can also be changed to use the contact of the component Possibilities 'The slippery passage formed here is described here. 17200834757 Lubricant channel 301 is similar to the lubricant finger. Use the wafer level or wafer level packaging process, which is described above in Figure 2A.曰 round (four) neck Lu · - h #MEMS device around the 娜 装置 device package 23 〇 ; ;; in the next US w w 如 使用 使用 使用 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 MEMS MEMS 精 精 精 精 精 精 精 精 精 精 精 精 精炎^, 借ΗΗ® 罢 罢 罢 罢 罢 罢 罢 罢 罢 罢 罢 罢 罢 罢 。 。 。 贝 贝 类似于 类似于 类似于 类似于 类似于 类似于 类似于A plurality of MEMS devices 231 may be formed on the substrate 233, or a plurality of MEMS devices 231 may be individually connected to the substrate 233. It is possible to sculpt the substrate 233, the plug-in crystal back and the glass wafer to form a dense use cutting, laser cutting, or die separation, and the individual MEMS device is _. The round-scale compact packaging and the residual and manual brewing after the die-singleization and the ultra-high clean room environment are required to reduce the total sealing cost of the manufacturing device. In addition, the embodiment of the present invention is described below for the conventional gauge (10) package. The process has advantages 'this is because the embodiment of the present invention removes the need to expose the MEMS device lubricant to high temperatures during the steps used to form the sealed processing region (10). Although the following discussion focuses on the wafer level packaging method, These techniques and general processing sequences are not required to be fabricated by the handle. Therefore, the embodiments of the present invention are not intended to be in the scope of the present invention. An example of a MEMS device package and a process for forming a MEM device package of a further embodiment is further described in the following document: a patent application in the co-pending application: 2 〇〇 3 years ι〇月24曰U.S. Patent Application Serial No. 10/693,323, the entire disclosure of which is incorporated herein by reference in its entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire entire all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all all U.S. Patent Application Serial No. 11/008,483, filed on Dec. 8, 2004, and attorney file number No. 4,027,017, 001, 001,300. Figure 4A illustrates a MEMS device package for forming a lubricant channel 3〇1 in accordance with an embodiment of the present invention. Processing sequence 400 of 230. Figures 5A-5F illustrate various states of one or more components of MEMS device package 230 after various steps of processing sequence 400 have been performed. Figure 5A is a diagram that can be used to form Figure 5F. A cross-sectional view of 18 200834757 wafer 235C of a plurality of MEMS device packages 230. The wafer 235C may be fabricated by, for example, a stone sho (Si), a gold corpse, a female material, a plastic material, a polymeric material, or other suitable material. The material is formed. The V-glass coupling material is now referred to 帛4A and f 5Bffl, and in step 450, a lubricant channel is formed on the top surface 4〇4 of the wafer 235C by conventional patterned male and dry side techniques. : and can The selected recess 40 is defined by the time and rate of implementation of the conventional dry side on the wafer 235C to set the depth D of the lubricant channel 301 and the recess 401. It should be noted that conventional etching, ablation or other fabrication techniques can be used. To form the lubricant channel 401 without departing from the scope of the basic invention. Concave now with reference to Figures 4A and 5C, in step 452, through conventional patterning and dry etching techniques through the depression The bottom wall 403 of 401 removes material from the back surface 4〇5 to form a through hole 402 that defines the inner surface 235B. Inner surface 235B, together with cover 232 and base 23 shown in Figures 5E-5F, defines a treatment zone 234_ of the meMS device package 23A. The 235C removes the material to form the vias 402. It can also be greened by conventional engraving, stripping or his similar manufacturing techniques. Alternatively, the wafer 235C having the via 402 can be formed in the previous step. In step 454, as shown in Figures 4A and 5D, the cover 232 is bonded to the top surface 404 of the wafer 235C to surround the lubricant channel 3〇1 and cover each of the through holes 4〇2. One

端。典型的接合過程可以包括陽極接合(例如,電解過程)、共晶接合、溶 合接合、共價接合及/或玻璃料接合過程。在一個實施例中,蓋子232是顯end. Typical bonding processes may include anodic bonding (e.g., electrolysis processes), eutectic bonding, fused bonding, covalent bonding, and/or frit bonding processes. In one embodiment, the cover 232 is visible

,Coming^Eagle2000™) , a jjj 235C 藉由使用傳統的陽極接合技術將蓋子232接合到晶圓235C。典型地,施娜 裝置封裝中的-個或更多個組件的溫度在傳_陽極接合過程綱達到大 約35〇C和大約45〇。(:之間。關於陽極接合過程的更多資訊在施年1月 3日提出申請、共同讓與的美國專利申請第11/〇28,946號中提供,其在此 整個併入作為參考。 在步驟祝中,如同於第4A圖和第5E圖中所示,此具有複數個副鳩 衣置231安裝於其上之基底233被接合到晶圓235c的背表面4〇5,以形成 MEMS裝置231在其中被圍繞的處理區234。典型地,使用陽極接合(例 如,電解過程)、共晶接合、熔合接合、共價接合、及/或玻璃料接合過程, 19 200834757 將基底233接合到晶圓235C。在一個實施例中,基底233是含矽基板,晶 圓235C是含矽晶圓,使用玻璃料接合過程將基底233接合到晶圓235匸。 典型地’ MEMS裝置雜中的至少一個或更多個組件的溫度在玻璃料接合 ,程巧間_大約35GT:和大約45Gt:之間的溫度。關於玻補接合過程的 額外資訊在2G〇5年1月3日提出帽而制轉與之美國專利申請第 11/028,946號中提供,其在此整個併入作為參考。 現在參考第4A圖和第5F圖,在步驟458中,使用傳統的切割技術將 由基底233、晶圓235C、以及蓋子232組成的晶圓堆疊分開,以形成多個 MEMS裝置封裝23〇。然後,可以丢棄切割處理之後留下的過剩或廢棄材 料411。作爲步驟458的一部分,可以對在所形成的Mgs裝置上實施傳 統的引線接合和測試,從而確保其耐久性且備製裝置以使用於可以 使用MEMS裝置封裝230的系統中。也可以使用其他切割技術,首先曝露 出接合墊以允許晶圓級探測和晶粒分類,然後實施整體單一化。 、第6A圖是具有部分地形成的潤滑劑通道301的MEMS裝置封妒230 =平面圖,MEMS裝置封裝跡可以使用第4A圖所示的處理步驟至 v驟458來形成。為了清楚起見,裝置封裝23〇是在去除了蓋子Μ: =份區段6G1❿說明。如同所顯示,在插件235中僅部分地形成潤滑劑 =運301,以致於接近外表面235A之潤滑劑通道3〇ι末端被具有材料厚度 5〇2的過剩插件材料5〇1阻擋。通常,材料厚度5〇2可以較薄,以允許容 ,地去除侧鱗·训,鱗射歧· 1G微米—)至大約imm。 在這種組態中,潤滑劑通道則被形成爲從穿透内表面235B的出口璋3〇3 =至被過剩插件材料501阻擋的相反端。以此方式,在同以下第4A圖 句二驟460期間,在一直至去除過剩插件材料5〇1以將潤滑劑注 劑通道3〇1中之前,處理區234都保持密封。 在處理序列働的步驟補中,如同第紐圖和第π圖中說明,通道 =02被形成至潤滑劑通道3〇1巾。如同於第6b圖中所說明,可以萨 過剩插件材料501的步驟,以形成通道入口搬。以替代方式,曰 插輪的雜、研磨、或拋光技術,以去除實質上所有的過剩 插件材枓501,以曝露潤滑劑通道則,如同於第圖中說明。在一觀點 20 200834757 中,當去除過剩插件材料以確保粒子無法進入到處理區234中時,可&amp;令 人想要清理且去除由潤滑劑通道則産生的任何粒子。因為去除廳^^ 置封裝230的過剩插件材料501所用的準確度雜,所以可以在潤滑劑^ 道301的形成過程期間,在接近潤滑劑通道3〇1處形成厚度控制孔隙⑽, 如第6A圖所示。厚度控制孔隙503的存在使過剩插件材料5〇1的去除中 允許有偏差504 (參考第6A圖),而不會影響材料厚度5〇2。, Coming^Eagle2000TM), a jjj 235C Bonding the cover 232 to the wafer 235C by using conventional anodic bonding techniques. Typically, the temperature of one or more of the components in the Schna apparatus package is about 35 〇C and about 45 在 in the transfer-anode bonding process. (In the meantime, more information on the anodic bonding process is provided in the U.S. Patent Application Serial No. 11/28,946, filed on Jan. 3, the entire disclosure of which is hereby incorporated by reference. It is to be noted that, as shown in FIGS. 4A and 5E, the substrate 233 having the plurality of sub-clothes 231 mounted thereon is bonded to the back surface 4〇5 of the wafer 235c to form the MEMS device 231. Processing zone 234 surrounded therein. Typically, an anodic bonding (eg, electrolysis process), eutectic bonding, fusion bonding, covalent bonding, and/or frit bonding process is used, 19 200834757 bonding substrate 233 to the wafer 235C. In one embodiment, substrate 233 is a germanium containing substrate, wafer 235C is a germanium containing wafer, and substrate 233 is bonded to wafer 235 using a frit bonding process. Typically at least one of the 'MEMS device hybrids or The temperature of more components is in the frit joint, the temperature between the process _ about 35GT: and about 45Gt:. Additional information about the glass-bonding process is put forward on January 3rd, 2G〇5 US Patent Application No. 11/028, 94 Provided in No. 6, which is hereby incorporated by reference in its entirety. Referring now to Figures 4A and 5F, in step 458, wafer stacks consisting of substrate 233, wafer 235C, and cover 232 are stacked using conventional dicing techniques. Separate to form a plurality of MEMS device packages 23. The excess or waste material 411 left after the dicing process can then be discarded. As part of step 458, conventional wire bonding can be performed on the formed Mgs device and Testing to ensure its durability and fabrication of the device for use in systems where the MEMS device package 230 can be used. Other cutting techniques can also be used, first exposing the bond pads to allow wafer level detection and grain classification, and then implementing the overall Singularization. Figure 6A is a MEMS device package 230 with a partially formed lubricant channel 301 = plan view, the MEMS device package trace can be formed using the process steps shown in Figure 4A to step 458. See, the device package 23A is removed after the cover Μ: = part of the section 6G1 。. As shown, only the lubricant = 301 is formed in the insert 235, The end of the lubricant passage 3 〇 ι close to the outer surface 235A is blocked by the excess insert material 5 〇 1 having a material thickness of 5 〇 2. Generally, the material thickness 5 〇 2 can be thin to allow for the removal of the side scales. Training, scale shooting · 1G micron -) to about imm. In this configuration, the lubricant passage is formed from the outlet 璋3〇3 = penetrating the inner surface 235B to the opposite end blocked by the excess insert material 501. In this manner, during the second step 460 of Figure 4A below, the treatment zone 234 remains sealed until the excess insert material 5〇1 is removed to remove the lubricant injection channel 3〇1. In the step of processing the sequence 働, as illustrated in the first and the πth, the channel = 02 is formed to the lubricant channel 3〇1 towel. As illustrated in Figure 6b, the step of excess insert material 501 can be used to form a channel entry. Alternatively, the entanglement, grinding, or polishing technique of the ferrule removes substantially all of the excess insert 枓 501 to expose the lubricant passage as illustrated in the figures. In a view 20 200834757, when excess insert material is removed to ensure that particles cannot enter the processing zone 234, it is desirable to clean and remove any particles produced by the lubricant channels. Since the accuracy of the excess insert material 501 of the package 230 is removed, the thickness control aperture (10) can be formed near the lubricant passage 3〇1 during the formation process of the lubricant channel 301, such as the 6A. The figure shows. The presence of the thickness control aperture 503 allows for a deviation 504 in the removal of excess insert material 5〇1 (see Figure 6A) without affecting the material thickness of 5〇2.

在-個實施例中,如第6B圖所圖示,藉由傳送諸如雷射脈衝或電子 束脈衝之類的能量來産生通道入π 3G2,以鑽出穿過過剩插件材料撕並 ,入潤滑劑通道301的孔。可以使用諸如紫外(uv)雷射之類的短脈衝雷 射、或諸如紅外(IR)雷射之類的長脈衝雷射、或或恒定(cw)雷射,而 對通道入口 302實施雷射鑽孔。例如,當過剩插件材料5〇1是含$材 且材料厚度是大約1GG至2_η厚時,可以使用财m 2ge/shg 532啦 開關雷射。在這種情況下,用於鑽孔過㈣平均辨設定在大約ι 〇和大 、力2.5W之間’使用大約3〇〇〇至6000個脈衝(取決於過剩插件材料5〇1 的確實厚度和雜),Q 鮮小於大約觸服,脈衝寬度在大約6郎In one embodiment, as illustrated in FIG. 6B, the channel is introduced into π 3G2 by transferring energy such as a laser pulse or an electron beam pulse to drill through the excess insert material and to be lubricated. The aperture of the agent channel 301. Laser can be applied to channel inlet 302 using short pulsed lasers such as ultraviolet (uv) lasers, or long pulsed lasers such as infrared (IR) lasers, or constant (cw) lasers. drilling. For example, when the excess insert material 5〇1 is made of material and the material thickness is about 1GG to 2_η thick, the m 2ge/shg 532 switch laser can be used. In this case, the average for the drilling (4) is set between about ι 〇 and the maximum force is 2.5W 'use about 3 〇〇〇 to 6000 pulses (depending on the exact thickness of the excess insert material 5〇1) And miscellaneous), Q is less than about the touch, the pulse width is about 6 lang

和18ns之間。以替代方式,可以將IR雷射用於雷射鑽孔以形成通道入口 3〇2,例如具有L06_雷射波長的2〇w光纖雷射。在這種情況下,取決於 材料厚度502之確實值,傳送大約2,_個和1〇,_個之間的脈衝^且 以25kHz和40kHz之間的頻率傳送脈衝。據信,使用IR雷射與使用— 雷射相比,會由於這些波長的能量吸收率更高而減少鑽孔過程期間所産生 的粒子數目’而造成X熱的材料形成液體,該液體傾向於_倒潤滑舰 這301的内表面上。因此,IR雷射的使用可以大幅降低潤滑劑通道及 /或處理區234中所形成的粒子污染。 本案發明人《定,IR雷射祕_産生輸子可以藉由將雷射設定 最適化而最小化。例如,當過剩插件材料5〇1是含矽材料、材料厚度是大 約100至200μιη厚時,藉由調整IR雷射來形成直徑在大約1〇_ $大約 3〇μιη之間的通道入口 302亦可以將所産生的粒子最小化。此外,為了使+ 驟46〇的雷射鑽孔期間過剩插件材料5〇1的氧化最小化,可以在無氧二 中執行雷射鑽孔過程。例如,步驟偏可以發生在充有惰性氣體”(例如兄 21 200834757 惰性氣體或稀有氣體 氮)或稀有氣體(例如,氬)的室中。以替代方式, 可以用作局部清除氣體遮罩。 在一個實施例中,在MEMS裝置封裝230的形成期間,用氣體 理區234至大於大氣壓的壓力,以致於在過剩插件材料5〇1去除期間所= 生的任何粒子藉由流出氣體而被從處理區234驅逐。在一觀點中,+生 极(即,將基底233接合到晶圓235C的背表面4〇5的過程綱用$ ,充處理區Μ至高於大氣壓的壓力。在這種情況下,執行步驟456的产 境被保持在高於大氣壓的壓力下,以使得在處理區234被完全形成時,^And 18ns. Alternatively, an IR laser can be used for laser drilling to form a channel entrance 3〇2, such as a 2〇w fiber laser with an L06_laser wavelength. In this case, depending on the exact value of the material thickness 502, a pulse between about 2, _ and 1 〇, _ is transmitted ^ and the pulse is transmitted at a frequency between 25 kHz and 40 kHz. It is believed that the use of IR lasers results in the formation of liquids in the X-hot material due to the higher energy absorption rate of these wavelengths and the reduction in the number of particles produced during the drilling process. _Backflush the ship on the inner surface of this 301. Thus, the use of IR lasers can substantially reduce particle contamination formed in the lubricant passages and/or treatment zone 234. The inventor of the present case "set, IR laser secret _ generation of the output can be minimized by optimizing the laser setting. For example, when the excess insert material 5〇1 is a ruthenium-containing material and the material thickness is about 100 to 200 μm thick, the channel entrance 302 having a diameter of about 1 〇 to about 3 〇 μηη is formed by adjusting the IR laser. The generated particles can be minimized. Furthermore, in order to minimize oxidation of excess insert material 5〇1 during laser drilling of +46 〇, the laser drilling process can be performed in anaerobic. For example, the step bias can occur in a chamber filled with an inert gas (eg, brother 21 200834757 inert gas or rare gas nitrogen) or a rare gas (eg, argon). Alternatively, it can be used as a partial purge gas mask. In one embodiment, during formation of the MEMS device package 230, the gas conditioned zone 234 is used to a pressure greater than atmospheric pressure such that any particles generated during the removal of the excess plug material 5〇1 are processed from the effluent gas. The region 234 is expelled. In one aspect, the +-generation pole (i.e., the process of joining the substrate 233 to the back surface 4〇5 of the wafer 235C is $, the charge treatment zone is Μ to a pressure above atmospheric pressure. In this case The production site performing step 456 is maintained at a pressure above atmospheric pressure so that when the processing zone 234 is fully formed, ^

於大氣壓的氣體被陷在處理區234中。處理區234中保持的氣體可以η = 性氣體,例如氮或氬。 ’、 在另一個實施例中,裝置被放置在具有透明壁的〇形環密封容器中, 透明壁允許UV或IR雷射光束穿透。容器在進行雷射鑽孔以形成通道入口 3〇2之前被抽空至毫米汞柱程度的真空壓力。處理區2;34和抽空的室之間 的大壓力差進-步抑制:在通道入口 3〇2的形成期間,由雷射鑽孔所產二 的粒子進人潤滑舰道3G1中。隨後,在從密封容器巾取出裝置之前,使 用諸如乾氮或乾氬之類的所想要氣體以回填此容器和裝置。 、…茶考第4A圖,在步驟461中,將一種或多種潤滑劑被導入到潤滑劑 通迢301中。如上結合第3E圖所述,可以將潤滑劑通道3〇1和通道入口 302組態,以致於毛細力將潤滑劑5〇5吸入潤滑劑通道刈丨八中,如第 ^所圖示。因此,可以藉由使用注射器、移液管或其他類似的裳置,將適 里的潤滑力物5置於外表面23认上的通道入口搬附近,來用潤滑劑5〇5 填充潤滑劑通道301。 ^ 考第4A圖,在步驟462中,通道入口 3〇2被密封,以將潤滑劑通 迢则、處理區234、以及設置在其中的潤滑劑5〇5,與嫌·裝置封裝 230外部的環境隔離。在一個實施例中,如第6e圖所圖示,帽被安裝 ,道入1 302上,以密封潤滑劑通道·。帽3〇4的組成已在上面結合 第3^圖說明。在另一個實施例中,可以使用諸如雷射焊接之類的點焊方 法以检封通運人n 3G2。在-觀點巾,諸如IR雷射之賴長麟雷射或連 續雷射被用於該過程。為了使製造成本最小化,與步驟楊(即,穿過過 22 200834757 剩插件材料501形成通道入口 302的步驟)中所使用的雷射實質上類似的 IR虽射亦可以用於步驟462 (即,將潤滑劑通道3〇1密封的步驟)。例如, 當過剩插件材料501是含矽材料並且通道入口 3〇2具有大約1〇μιη和大約 30μιη之間的直徑時,具有106μιη雷射波長的R〇fm StarWdd 4〇可以在單 脈衝模式中使用,用大約lms的脈衝寬度、大約〇1和〇 6J之間的能量、 以及大約ΙΟΟμηι和4〇〇μηι之間的光點尺寸來密封通道入口 3〇2。 第6F圖說明根據一個實施例使用IR雷射來密封濶滑劑通道3〇1的方 法、’其中,雷射用於加熱與通道入口 3〇2鄰近的區域,因此一些過剩插件 材料501被溶合並且被推到通道入口 3〇2上。在該實施例中,使用汉或其 7長脈衝雷射在外表面235A上形成焊接坑52〇,焊接坑52〇的一部分521 私位到通道入口 302之上,因而密封潤滑劑通道3〇1。 第6G圖說明根據一實施例使用瓜雷射來密封潤滑劑通道3〇1的另一 種方法其中,用一個或更多個雷射脈衝來加熱外表面上的區域, 以在潤滑劑通道301内産生一個或更多個密封件522。在該實施例中,使 =足夠的能量在焊接區524中形成一個或更多個焊接坑523,以如圖所示 =内部密封潤滑劑通道3〇卜可以在焊接1 524中組態潤滑劑通道3〇1的 幾何形狀,以確保焊接坑523對於周圍環境完全密封潤滑劑通道3〇1。例 如,對應於焊接坑523位置的潤滑劑通道3〇1之部分可以:設置更接近外 ,面23认、及/或其可以形成實質上窄於潤滑劑通道3〇1的剩餘部分。如 第6G圖所忒明,使用焊接坑523來密封潤滑劑通道,可以使包含在密 封部分中的被氧化材料之數量最小化。 &quot; 第4B圖說明根據本發明一個實施例用於形成包含潤滑劑通道301的 衣置封裝230的處理序列410。處理序列41〇中的步驟450和452 實質亡與處理序列400中的步驟450和452相同,並且已在上面結合第4A 圖、第5A圖、第SB圖和第5C圖一起說明。 現在參考第4B圖,在步驟494中,具有複數個通道入口 302的蓋子 被與晶圓235C的頂表面4〇4對準並且被接合到晶圓议c的頂表面 一〇4繞潤滑劑通道301並覆蓋每個通孔術的一端,如f 5G圖所圖 不。第5G圖是接合之後晶圓235C和蓋子432的橫截面圖。步驟奶4實質 23 200834757 上類似於處理序列4i〇的步驟454,所不同者為蓋子432包括複數個通道 入口 302 ’設置這些通道入口 3〇2與晶圓use中所形成的各個潤滑劑通道 3〇1_的一部分對準。以替代方式,可以在蓋子432被接合到晶圓235c之後, 在二子432中形成通道入口 302。在這種情況下,可以藉由本技術中所共 同知曉之微影術、剝離、及/或蝕刻技術來形成通道入口 3〇2。在任一種情 況中,通道入口 302的形成或對準都是晶圓級過程的一部分。如上所述, 相比於晶片級過程,晶圓級過程通常降低此裝置之製造成本。 ^步驟496中,如第4Β圖和第5Η圖所示,具有複數個mems裝置 j 1女衣於其上之基底233被接合到晶圓235C的背表面405,以形成MEMS ,置231在其中之被圍繞的處理區234。步驟496實質上類似於第4八圖中 處理序列400的步驟456 〇 在步驟498中,如同於第4B圖和第51圖中所示,潤滑劑5〇5在晶圓 =過程中被導入到每個潤滑劑通道3〇1中。在該實施例中,在將潤滑劑5〇5 滑劑,3()1之前’並無須將由基底233、晶圓就和蓋子说 、、且成的晶圓堆璺切割成多個她撕裝置封裝23〇。反之,可以藉由使用、、主 液管、或其他類似的裝置’將適量的潤滑劑5〇5置於^蓋子税 力蔣上的通這入口 3G2中的每個開口鄰近的位置,並使用毛細 悔個潤滑劑通道3G1中。以此方式,將此製造施 衣置封衣230所㊉要的晶片級製造步驟的數目最小化。 在步驟499中,如第4B圖和第5J圖所示 二=環Γ離。處理序列410的步驟499基本類似於處理 序列400的步驟462,所不同者為步驟4的 ===,====賴刪則封, 中被移位,_封爾_/=表卿成轉接坑的一部分 共晶焊料、玻雜或其,型的韻《“密ί可⑽姆氧樹脂、 在步驟458中,如弟4Β圖和第5Κ圖中所示,用傳統的切割技術將由 24 200834757 盖子232組成的晶圓堆疊分開,以形成多個 衣置封衣23〇。處理序歹Β10的步驟458實質上與處理序列4〇〇 4—58相同:並且已在上面結合第4Α圖和第5F圖說明。然後,可以丢= 割過程之後留下的過剩或廢棄材料4n。作為步驟458的一部分㈣ i 裝置細_!丨雜合和舰,㈣雜其敎性並且^ 衣MEMS袭置’以用於可錢用裝置封襄23〇的系統中。也可= 首先曝露出接合塾以允許晶圓級探測和晶粒分類,然 第5L圖說明根據本發明一個實施例裝置裝總 圖,^中,通道入口 3〇2是在蓋子432中形成的,不穿透外表面= 千面 弟4C圖_根據本發明一個實施例用於形成廳娜 處理? ,細MS裝置封裝23G包含:潤滑劑通道姻和^除的= 滑劑基子。處理序列420中的步驟45〇和452實質上與處理序列彻 5驟450和452相同,並且已在上面結合第4A圖 二 第5C圖說明。 U乐加圓和 現在參考第4C圖,在步驟仙4中,將具有複數個湖娜裝置加 衣八上之基底233、與晶1] 235c的背表面4G5對準,並且接合 =脂層晶圓235C的背表面4〇5,如第5M圖所圖示。第5m圖 ^後部分地形成處理區234的晶圓235C和基底233的橫截_。相比 於%極接合、共晶接合、料接合、共價接合、及/或賴舰合接合,步 驟484的環氧樹脂接合過程是一種低溫過程。如同以上說曰月,潤滑 508也在每個濶滑劑« 301中形成,以將處繩234與潤滑劑通道3〇ι /刀開。如上所述,潤滑劑塞子5〇8可以是例如為光阻之聚合物,其在被曝 露於UY或其他波長的輻射時轉換成多孔材料。以替代对,潤滑継子 邶可以是聚合物或其他熱敏材料’其在當曝露於熱時失效或改變物 性。 在步驟486中’如第4C圖和第5N圖所示,一種或多種潤滑劑被導入 Ϊ潤5通^01中。因為在該處理步驟中,潤滑劑通道301是敞開的通 I私亚…須毛細力將潤滑劑5〇5吸入到潤滑劑通道3〇1巾。潤滑劑塞 25 200834757 子508防止潤滑劑505進入處理區234。 在步驟487中,如同在第4C圖和第50圖中所示,將蓋子432與晶圓 235C之頂表面404對準且以第二環氧樹脂層507接合到晶圓235C的頂表 面404,如同第50圖中說明。第5〇圖是在以第二環氧層5〇7接合之後, 晶圓235C、基底233、以及蓋子432的彳黃截面圖。將蓋子432接合到頂面 404上圍繞潤滑劑通道3〇1和包含於其中之潤滑劑5〇5,並完成了碰娜 裝置231在其中之處理區234。 在步驟488中,如同於第4C圖和第5P圖中所示,將潤滑劑塞子508 的密封破壞或進行實體改變,以允許潤滑劑5〇5進入處理區234中。去除 過程可以涉及曝露於穿過蓋子232的UV輻射或曝露於熱。 在步驟458中’如同於第4C圖中所示,用傳統的切割技術將由基底 233、曰曰圓235C、以及蓋子232組成的矽片堆疊分開,以形成多個 裝置封裝230。在上面結合第4A圖和第5F圖說明步驟458。 在替代實施例中,形成潤滑劑通道301,以致於可以穿過圍繞處理區 的光學透明壁(例如,蓋子232)看到潤滑劑通道301的内容。在這種組 態下’在蓋子232或插件235中形成潤滑劑通道301,以致於可以藉由光 學透明盍子232看到潤滑劑通道3〇1的内容。這種組態是有用的,因為其 允許使用者檢查潤滑劑通道301的内容,來瞭解潤滑劑通道3〇1中剩下多 少潤滑劑505,以致於如果須要可以採取校正措施。 在另一實施例中,藉由在將潤滑劑注入到MEMS裝置封裝23〇之前用 另一種液體稀釋潤滑劑,來改善對導入到潤滑劑通道3〇1和處理區234的 潤滑劑的量的控制。在一些應用中,將一定量潤滑劑準確和可重復地傳送 到潤滑劑通道301是重要的。太多的潤滑劑可能使處理區234的潤滑劑蒸 汽過飽和,導致交互作用MJEMS組件之間的接觸區處產生凝聚的潤滑夜 滴,該液滴可能産生黏著有關的故障。太少的潤滑劑可能縮短包含在 裝置封裝230中的廳應裝置231的壽命。然而,疆]^裝置封裝23〇 所需要的潤滑劑體積可能小至奈升等級,而已知的對液體進行準確體積的 傳送僅適用於比該體積大一個或更多個量級的液體體積。本案發明人已經 確定,藉由在另一種液體中稀釋潤滑劑,導入到MEMS裝置封裝23〇中的 26 200834757 液體,積可以大幅增加,例如10倍或100倍,而不增加導入到MEMS裝 置封裝230中的潤滑劑的數量。在該實施例的一個觀點中,以具有比潤滑 更低的蒸&gt;%墨力且體積大得多的溶劑來稀釋潤滑劑。在將潤滑劑一溶劑 溶液密封在潤滑劑通道301中之後,MEMS裝置封裝230經受烘乾和抽1 過程以去除溶劑,因為過高壓使得汽化溶劑分子擴散到MEMS封裝230之 外。在本發明的另一觀點中,將潤滑劑與體積大得多的液體混合所述液 體比潤滑劑具有更高的蒸汽壓力,並且至少與潤滑劑稍有可互溶性。在將 組合後的潤滑劑和更高蒸汽壓力的液體密封在潤滑劑通道3〇1中之後,以 下述溫度烘乾MEMS裝置封裝:該溫度高於潤滑劑的汽化溫度(例如, 200C ) ’且低於所述更高蒸汽壓力的液體的汽化溫度(例如,6⑻。。)。以 此方式,將潤滑劑活化,即,被汽化並且能擴散到處理區234中,而包含 潤滑劑的可互溶液體適當地保持在潤滑劑通道3〇1中之位置中。 在此所說明本發明實施例的一個優點涉及將潤滑劑5〇5傳送形 1EMS裝置封裝23〇的一般序列和時序。通常,在此所說明本發明的一 個或更多個實施例提供了一種序列,其中,在所有的高溫__裝置封裝 =(例如,陽極接合和玻璃料接合)已被執行之後,潤滑劑5〇5被傳送 =理區巾。該序騰低或社了在職的高溫接合過程期發 滑劑的過早釋放或失效,所述高溫接合過程達到請。c至柳。c的溫度= 執!丁高溫接合步驟之後將潤滑劑撕置於潤滑劑通道3〇1和處理區二中 的能力允許下述麟赌料:制滑紐料可能在典型的接合溫产 ,二並且/或降低潤滑劑材料在廳_裝置形成程中失效或 ^ ^此技術人士亦瞭解,她娛晶®級封裝過程,此使用晶片級封裝 置封裝中形成的潤賴通道301錢於··在實施臟S 例如,陽極接合、加焊接、電子束焊接)之後 要的ϊϊΐίϊϊΓί實施例的另一個優點涉及:形成_s裝置封裝需 吸氣_傳統MEMS裝置製造過程需要如下 咸 形成岔封的MEMS裝置封狀驗魏_難合職子轉他組^ 27 200834757 表面,以及2)加熱封裝以啟動吸氣劑裳置。去除這些步驟減少了需要在 潔淨室環境中執行的處理序列步驟的數目,以及因此降低了形成裝 置的成本。傳統的可逆吸收吸氣劑的存在亦限制將裝置封裝緊密密 封的溫度’尤其對於晶圓級處理而言。 雖然先础时論僅說明此種mems裝置封裝,即mems裝置且 用於將潤滑劑材料傳送到處理區234的單一潤滑劑通道,但是在繼裝 置封裝23〇内形成多個具有不同幾何特徵和位置的潤滑劑通道細 MEMS封裝巾更絲分佈雜潤·阿以為 特财利地合併至潤滑劑通道中以作為粒子過渡器或粒子陷^將成打 旦的通這的幾何特徵可以用於在産品壽命的不同階段傳送不同 圖是具有多個潤滑劑通道3〇ΐΑ· 同的ΐ产、开 多個潤滑劑通道301細^皮形成為具有不 不同ίί觀財,令人想要在應MS裝置封裝230的 於末自潤賴通道__分子在整個 = 於大晶粒尺寸的裝置尤其有益 ^二置封衣中相畜均勻。這對 和3〇lC的导声以魅制^在種清況中,可以調整潤滑劑通道3〇1Α 積最適化。、a -衣1^成本’或將包含在潤滑劑通道中的潤滑劑的體 例中,第-型式__^齡子賴材料。在一個實施 存在濁滑劑通道3G1A巾。第κ _ f &amp;舰道3G1A傳送、或儲 道3〇1B傳送、或儲存在潤滑^工道3〇=滑=子=以:藉由潤滑劑通 劑分子中分別在襄置的正f操作 中’二、中’弟-和第二移賴滑 在整個封裝巾具有不_遷移率i S 〃有不_平衡分壓及/或每翻滑劑 在另一個實施例中,第— 2从中,其中,針對處理區潤滑劑分子被導入到處理區 的内表面的接合娜而選擇第_型式的移動 28 200834757 然後’弟二型式的潤滑劑分 广補上形成均勻單層。 的多個單層在meMS裝㈣㈣壽劑分子 J以令^要調整這裏所描翻潤劑;二=存^在-觀點中, 度,,應於f中所處理的潤滑劑的型式。邊财和表面粗糖 個潤和3G1E的鶴橫截面圖,這兩 具有不同的幾何料以^丨口埠舰或麵,出口埠贿或細 可移到處理區中的速率。如同所顯示, 滑劑通道^具有第二_彳通道·,第一潤 r毛、截面積的出口埠303A來減少潤滑劑向處理區234 口Ξί〇3Β來^1 :) ’第二潤滑劑通道3〇1E具有大橫截面積的出 使用這浦及=雜珊2外當相互結合 细PWiLA从# ♦田Γ«弟一/門α Μ通逼3〇1Ε可以用於在MEMS裝置的啓動 f4内的表面飽和。然而,第一潤滑劑通道3〇id可 ^衣的Γ個哥命期間緩慢地向處理區234傳送新鮮潤滑劑。 —第7C图牙(7D圖δ兒明包含過濾區6〇5的潤滑劑通道3⑽的另一個 貝知例過濾、區605包含多個障礙物6〇1,這些障礙物6〇1用於將特定大 小的粒子從MEMS褒置封裝細外部的環境向處理區234的流入最小化。 Ρ章礙物6〇1 -般被組態為具有想要的長度6〇3、寬度6〇4和高度(未示出, 即’,入頁面之内)’各個障礙物601之間具有想要的間隔6〇2,因而用作 過濾1§以防肢大小的粒子流入處理區234中。可以在形成潤滑劑通道 301F的過程期間使用傳統的圖案化、微影術和乾式飿刻技術在潤滑劑通道 301F中形成障礙物601。在一個實施例中,潤滑劑通道3〇1F寬度w和設 置在潤滑劑通運301F中的障礙物6〇1方向被組態,以使潤滑劑到處理區的 流量最大化。在另一個實施例中,潤滑劑通道3〇1F的寬度w和其中所設 置的障礙物601的方向被組態,以控制潤滑劑的流動。通常,令人想要選 29 200834757 擇障礙物601的數目和方向,以及障礙物601之間空間的間隔602和深度 (未示出;即,進入第7D圖的頁面中),以使得想要大小的粒子不能進入 處理區234中。在一個實施例中,障礙物601具有大約50μτη到大約200μηι 之間的長度、大約Ιμπι到大約50μηι之間的寬度,大約Ιμχη到大約2〇, 之間之間隔602。在該實施例中’可以防止小至Ιμιη的粒子進入處理區 234。在一觀點中,間隔602的深度可以與通道的深度相同。 在另一個實施例中,潤滑劑通道301G包含障礙物601的多個陣列, 這些陣列沿著潤滑劑通道301G的部分長度而彼此交錯。在這種組態中, 尺寸小於過濾器間隙(即,間隔602)的粒子也可以被有效地阻播。在另 一個實施例中,多組障礙物601或多個過濾區605被放置在潤滑劑通道的 不同區域中,以進一步防止粒子進入所形成裝置的處理區。例如,如第7c 圖所示,可以令人想要具有一個接近潤滑劑通道入口的過濾區6〇5α和另 一個位於潤滑劑通道中接近處理區的過濾區605Β,過濾區605Α用於收集 可能從MEMS裝置封裝的外部進入的粒子,過濾區6〇5Β用作進入處理區 234之前的最終過濾裝置。 第7Ε圖是包含兩個潤滑劑通道的壁的橫截面圖,這兩個潤滑劑通道具 有不同的出口組態,這對於增強潤滑劑向處理區234的分配和傳送可能是 有用的。在一個實施例中,潤滑劑通道301G具有多個出口 〇列如,出口 埠303C-303D),這些出口適於改善潤滑劑向處理區的傳送速率並且/或改 善/閏滑劑向處理區中不同區域的分佈。在另一個實施例中,潤滑劑通道 301H具有用作噴嘴的大出口埠303E,出口埠303E促進了潤滑劑向處理區 234的傳送。 在另一個實施例中’如同於第8圖中所示,可以使用電阻性元件921 和溫度控制器922來控制潤滑劑通道301中所包含的潤滑劑的溫度,以進 一步控制潤滑劑的傳送。在這種組態中,控制器922適於向電阻性元件921 傳送所想要數量的功率,以控制設置在潤滑劑通道3〇1中潤滑劑的溫度, 並因而控制潤滑劑至處理區234的遷移率。在另一觀點中,此電阻性元件 921被女裝在圍繞處理區234的此等壁之一的外表面235A上,以方便控制 潤滑劑通道301中的潤滑劑溫度。在一觀點中,電阻性元件921是沈積在 30 200834757 圍繞處理區234的壁中之-的表面上的金屬。應當注意,因為汽化和 散都是受熱而啟賴過程,所Μ猶舰潤滑舰道3()1的遷移縣搞二The atmosphere at atmospheric pressure is trapped in the treatment zone 234. The gas held in the treatment zone 234 can be η = a gas, such as nitrogen or argon. In another embodiment, the device is placed in a beak ring sealed container having a transparent wall that allows UV or IR laser beam penetration. The vessel is evacuated to a vacuum pressure of millimeters of mercury before being drilled to form a channel inlet 3〇2. The large pressure difference between the treatment zone 2; 34 and the evacuated chamber is step-inhibited: during the formation of the channel inlet 3〇2, the particles produced by the laser drilling are enriched in the channel 3G1. Subsequently, the desired gas, such as dry nitrogen or dry argon, is used to backfill the container and apparatus prior to removal of the device from the sealed container. The tea test is shown in Fig. 4A, and in step 461, one or more lubricants are introduced into the lubricant through 301. As described above in connection with Fig. 3E, the lubricant passage 3〇1 and the passage inlet 302 can be configured such that the capillary force draws the lubricant 5〇5 into the lubricant passage ,8 as illustrated in the figure. Therefore, the lubricant can be filled with the lubricant 5〇5 by using a syringe, a pipette or the like to place the appropriate lubricating material 5 near the inlet of the passage recognized by the outer surface 23. 301. ^ In Figure 4A, in step 462, the channel inlet 3〇2 is sealed to pass the lubricant, the treatment zone 234, and the lubricant 5〇5 disposed therein, external to the device package 230. Environmental isolation. In one embodiment, as illustrated in Figure 6e, the cap is mounted and routed into 1 302 to seal the lubricant passage. The composition of the cap 3〇4 has been described above in connection with Fig. 3^. In another embodiment, a spot welding method such as laser welding can be used to seal the carrier n 3G2. In the point of view, a laser such as an IR laser or a continuous laser is used for the process. In order to minimize manufacturing costs, IR, which is substantially similar to the laser used in the step Yang (i.e., the step of forming the channel inlet 302 through the 22 200834757 remnant material 501), may also be used in step 462 (ie, , the step of sealing the lubricant passage 3〇1). For example, when the excess insert material 501 is a tantalum-containing material and the channel inlet 3〇2 has a diameter between about 1 μm and about 30 μm, R〇fm StarWdd 4〇 having a laser wavelength of 106 μm can be used in the single pulse mode. The channel inlet 3〇2 is sealed with a pulse width of about 1 ns, an energy between about 〇1 and 〇6J, and a spot size between about ημηι and 4〇〇μηι. Figure 6F illustrates a method of sealing a skid channel 3〇1 using an IR laser according to one embodiment, 'where the laser is used to heat a region adjacent to the channel inlet 3〇2, so some excess plug material 501 is dissolved. It is pushed and pushed to the channel entrance 3〇2. In this embodiment, a weld pit 52 is formed on the outer surface 235A using Han or its 7-pulse laser, and a portion 521 of the weld pit 52 is privately placed over the passage inlet 302, thereby sealing the lubricant passage 3〇1. Figure 6G illustrates another method of sealing a lubricant passage 3〇1 using a melon laser according to an embodiment in which one or more laser pulses are used to heat a region on the outer surface to be within the lubricant passage 301. One or more seals 522 are produced. In this embodiment, sufficient energy is allowed to form one or more weld pits 523 in the weld zone 524 to form a lubricant in weld 1 524 as shown in the figure = internal seal lubricant passage 3 The geometry of the channel 3〇1 ensures that the weld pit 523 completely seals the lubricant passage 3〇1 to the surrounding environment. For example, the portion of the lubricant passage 3〇 corresponding to the position of the weld pit 523 may be disposed closer to the outer face, and/or it may form a remainder substantially narrower than the lubricant passage 3〇1. As illustrated in Figure 6G, the use of weld pits 523 to seal the lubricant passage minimizes the amount of oxidized material contained in the seal portion. &quot; Figure 4B illustrates a process sequence 410 for forming a garment package 230 comprising a lubricant channel 301 in accordance with one embodiment of the present invention. Steps 450 and 452 in processing sequence 41 are substantially the same as steps 450 and 452 in processing sequence 400, and have been described above in connection with Figures 4A, 5A, SB, and 5C. Referring now to FIG. 4B, in step 494, a cover having a plurality of channel inlets 302 is aligned with the top surface 4A4 of the wafer 235C and bonded to the top surface of the wafer c. 301 and cover one end of each through hole, as shown in the f 5G diagram. Figure 5G is a cross-sectional view of wafer 235C and cover 432 after bonding. Step Milk 4 Substance 23 200834757 is similar to step 454 of processing sequence 4i, except that cover 432 includes a plurality of channel inlets 302' that provide these channel inlets 3〇2 and respective lubricant channels 3 formed in the wafer use. A part of 〇1_ is aligned. Alternatively, channel inlet 302 may be formed in two sub-432s after cover 432 is bonded to wafer 235c. In this case, the channel entrance 3〇2 can be formed by lithography, stripping, and/or etching techniques that are commonly known in the art. In either case, the formation or alignment of the channel entrance 302 is part of the wafer level process. As noted above, wafer level processes typically reduce the manufacturing cost of the device compared to wafer level processes. In step 496, as shown in FIG. 4 and FIG. 5, a substrate 233 having a plurality of MEMS devices thereon is bonded to the back surface 405 of the wafer 235C to form a MEMS in which the 231 is disposed. The processed area 234 is surrounded. Step 496 is substantially similar to step 456 of processing sequence 400 in FIG. 8A. In step 498, as shown in FIGS. 4B and 51, lubricant 5〇5 is introduced into the wafer=process. Each lubricant channel is in 3〇1. In this embodiment, before the lubricant 5〇5 slip agent, 3()1, there is no need to cut the wafer stack formed by the substrate 233, the wafer and the lid into a plurality of tearing devices. Package 23〇. Conversely, an appropriate amount of lubricant 5〇5 can be placed in the vicinity of each opening in the inlet 3G2 by using, a main liquid pipe, or the like, and used. Capillary refines the lubricant channel in 3G1. In this manner, the number of wafer level fabrication steps required to fabricate the garment 230 is minimized. In step 499, as shown in Figures 4B and 5J, the second = ring is separated. Step 499 of processing sequence 410 is substantially similar to step 462 of processing sequence 400, the difference being step = 4 =============================================================== A part of the transfer pit is eutectic solder, glassy or its type, "", "10" oxy-resin, in step 458, as shown in Figure 4 and Figure 5, using conventional cutting techniques will be 24 200834757 The wafers consisting of lids 232 are stacked to form a plurality of garment seals. The step 458 of process sequence 10 is substantially the same as the processing sequence 4〇〇4—58: and has been incorporated above with reference to FIG. And Figure 5F illustrates. Then, you can drop the excess or waste material 4n left after the cutting process. As part of step 458 (4) i device fine _! 丨 hybrid and ship, (d) miscellaneous and ^ MEMS attack It is used in a system for the use of a money-saving device. It is also possible to first expose the bonding defects to allow wafer level detection and grain classification, while FIG. 5L illustrates a device package according to an embodiment of the present invention. In the figure, ^, the channel inlet 3〇2 is formed in the cover 432, does not penetrate the outer surface = thousand face brother 4 Figure C - In accordance with one embodiment of the present invention for forming a chamber treatment, the fine MS device package 23G includes: a lubricant channel and a = slip agent base. Steps 45 and 452 in the process sequence 420 are substantially The processing sequence is identical to steps 450 and 452, and has been described above in connection with Figure 5A and Figure 5C. U-Le plus circle and now with reference to Figure 4C, in step 4, there will be a plurality of Laker devices The upper substrate 233 is aligned with the back surface 4G5 of the crystal 1] 235c, and bonded = the back surface 4〇5 of the grease layer wafer 235C, as illustrated in FIG. 5M. The 5th portion is formed later. The wafer 235C of the region 234 and the cross-section of the substrate 233. The epoxy bonding process of step 484 is a type of bonding process compared to % pole bonding, eutectic bonding, material bonding, covalent bonding, and/or bonding. Low temperature process. As mentioned above, lubrication 508 is also formed in each slip agent « 301 to open the rope 234 and the lubricant passage 3 〇 / knife. As mentioned above, the lubricant plug 5 〇 8 can Is a polymer such as a photoresist that is converted into a porous material when exposed to radiation of UY or other wavelengths. In the alternative, the lubricating scorpion sputum may be a polymer or other heat sensitive material that fails or changes physical properties when exposed to heat. In step 486 'as shown in Figures 4C and 5N, one or more The lubricant is introduced into the 55通^01. Because in this processing step, the lubricant passage 301 is open, and the lubricant 5 〇 5 is sucked into the lubricant passage 3 〇 1 towel. Lubricant plug 25 200834757 Sub 508 prevents lubricant 505 from entering treatment zone 234. In step 487, as shown in Figures 4C and 50, cover 432 is aligned with top surface 404 of wafer 235C and is A second epoxy layer 507 is bonded to the top surface 404 of the wafer 235C as illustrated in FIG. The fifth drawing is a yellow cross-sectional view of the wafer 235C, the substrate 233, and the cover 432 after bonding with the second epoxy layer 5〇7. The cover 432 is joined to the top surface 404 to surround the lubricant passage 3〇1 and the lubricant 5〇5 contained therein, and the treatment zone 234 in which the contact device 231 is completed is completed. In step 488, as shown in Figures 4C and 5P, the seal of the lubricant plug 508 is broken or physically altered to allow the lubricant 5〇5 to enter the treatment zone 234. The removal process can involve exposure to UV radiation passing through the cover 232 or exposure to heat. In step 458, as shown in Fig. 4C, the lamellae consisting of substrate 233, round 235C, and cover 232 are stacked by conventional cutting techniques to form a plurality of device packages 230. Step 458 is illustrated above in connection with Figures 4A and 5F. In an alternate embodiment, the lubricant passage 301 is formed such that the contents of the lubricant passage 301 can be seen through an optically transparent wall (e.g., cover 232) surrounding the treatment zone. In this configuration, the lubricant passage 301 is formed in the cover 232 or the insert 235 so that the contents of the lubricant passage 3〇1 can be seen by the optically transparent tweezers 232. This configuration is useful because it allows the user to check the contents of the lubricant passage 301 to see how much lubricant 505 remains in the lubricant passage 3〇1 so that corrective action can be taken if necessary. In another embodiment, the amount of lubricant introduced into the lubricant passage 3〇1 and the treatment zone 234 is improved by diluting the lubricant with another liquid prior to injecting the lubricant into the MEMS device package 23〇. control. In some applications, it is important to accurately and reproducibly transfer a quantity of lubricant to the lubricant passage 301. Too much lubricant may supersaturate the lubricant vapor in the treatment zone 234, resulting in a cohesive lubrication night at the contact zone between the interacting MJEMS components, which may cause adhesion-related failures. Too little lubricant may shorten the life of the chamber 231 contained in the device package 230. However, the volume of lubricant required for the package 23 可能 may be as small as the nanoliter level, and the known accurate volume transfer of the liquid is only applicable to liquid volumes one or more orders of magnitude larger than the volume. The inventors of the present invention have determined that by diluting the lubricant in another liquid, the 26 200834757 liquid introduced into the MEMS device package 23 can be substantially increased, for example, 10 times or 100 times without being introduced into the MEMS device package. The amount of lubricant in 230. In one aspect of this embodiment, the lubricant is diluted with a solvent having a lower steaming &gt;% ink force and a much larger volume than the lubrication. After sealing the lubricant-solvent solution in the lubricant channel 301, the MEMS device package 230 undergoes a drying and pumping process to remove the solvent because the overpressure causes the vaporized solvent molecules to diffuse out of the MEMS package 230. In another aspect of the invention, the lubricant is mixed with a much larger volume of liquid which has a higher vapor pressure than the lubricant and is at least slightly miscible with the lubricant. After sealing the combined lubricant and the higher vapor pressure liquid in the lubricant passage 3.1, the MEMS device package is dried at a temperature that is higher than the vaporization temperature of the lubricant (eg, 200 C)' and The vaporization temperature of the liquid below the higher vapor pressure (eg, 6 (8).). In this manner, the lubricant is activated, i.e., vaporized and can diffuse into the treatment zone 234, while the inter-solution containing the lubricant is suitably held in position in the lubricant passage 3〇1. One advantage of an embodiment of the invention described herein relates to the general sequence and timing of transferring the lubricant 5〇5 into a 1EMS device package 23〇. Generally, one or more embodiments of the invention described herein provide a sequence in which lubricant 5 is after all high temperature device packages = (eg, anodic bonding and frit bonding) have been performed. 〇 5 is transmitted = area towel. The sequence is low or the premature release or failure of the slip agent during the in-service high temperature bonding process, which is achieved. c to Liu. The temperature of c = the ability to tear the lubricant into the lubricant channel 3〇1 and the treatment zone 2 after the high temperature bonding step allows the following smashing material: the sliding material may be in a typical joint temperature production, And / or reduce the lubricant material in the hall - device formation process failure or ^ ^ This technical person also knows that she enters the crystal - level packaging process, which uses the wafer level sealing device package formed in the run-up channel 301 money ... Another advantage of the embodiment after implementing the dirty S, for example, anodic bonding, soldering, electron beam soldering, involves the formation of a _s device package that requires inhalation. Conventional MEMS device fabrication processes require the following salt-forming MEMS The device seals the test Wei _ difficult to turn the job to his group ^ 27 200834757 surface, and 2) heat the package to start the getter skirt. Removing these steps reduces the number of processing sequence steps that need to be performed in a clean room environment, and thus reduces the cost of forming the device. The presence of conventional reversible absorption getters also limits the temperature at which the device package is tightly sealed, especially for wafer level processing. Although the first theory only describes such a MEMS device package, ie a MEMS device and a single lubricant channel for transferring lubricant material to the processing zone 234, a plurality of different geometric features are formed in the device package 23〇 and The position of the lubricant channel fine MEMS encapsulating towel is more filthy and filthy. Ayi is specially incorporated into the lubricant channel to act as a particle transition or a particle trap. The geometric features of this can be used in Different stages of product life transfer different diagrams with multiple lubricant channels 3 〇ΐΑ · The same ΐ production, open a plurality of lubricant channels 301 fine skin formed to have no different ίί 财 , , , , , , , The device package 230 is uniformly self-lubricating channel __ molecules in the whole = large grain size device is particularly beneficial. The pair of sounds with the 3〇lC can be adjusted to the optimum of the lubricant channel 3〇1Α in the case of the charm. , a - clothing 1 / cost ' or the body of the lubricant to be included in the lubricant channel, the first type __ ^ 子 子 material. In one implementation there was a slippery channel 3G1A towel. The κ _ f &amp; channel 3G1A transmission, or the storage channel 3〇1B transmission, or stored in the lubrication ^gong 3 〇 = slip = sub = = by the lubricant flux in the molecule is placed in the positive f In operation, the second, middle, and second shifts have a non-mobility rate i S in the entire package, and there is no balance of partial pressure and/or per slip agent in another embodiment, the second - 2 From which, in the case where the lubricant molecules of the treatment zone are introduced into the inner surface of the treatment zone, the movement of the first type is selected 28 200834757 and then the lubricant of the second type is widely formed to form a uniform single layer. The multiple monolayers in the meMS are loaded with (4) (four) life agent molecules J to adjust the turbidity agent described herein; the second = deposits - in terms of degrees, the type of lubricant that should be treated in f. The cross-sectional view of the crane and the surface rough sugar and the 3G1E crane. These two have different geometric materials to smash the ship or the surface, and export the bribe or fine to the processing zone. As shown, the lubricant channel ^ has a second 彳 channel, the first rim, the cross-sectional area 埠 303A to reduce the lubricant to the treatment zone 234 Β 〇 〇 ^ ^ ^ :) 'Second lubricant Channel 3〇1E has a large cross-sectional area to use this Pu and = Miscellaneous Shan 2 when combined with fine PWiLA from # ♦ 田Γ«弟一/门α Μ通逼3〇1Ε can be used in the start of MEMS devices The surface inside f4 is saturated. However, the first lubricant passage 3〇id can slowly transfer fresh lubricant to the treatment zone 234 during the smear of the garment. - 7C tooth (7D figure δ 儿 ming contains another filter case 3 (10) of the filter channel 6 〇 5 filter, zone 605 contains a plurality of obstacles 〇 1 , these obstacles 〇 1 for The flow of particles of a particular size from the environment outside the MEMS package to the processing zone 234 is minimized. The barriers are generally configured to have a desired length of 6〇3, a width of 6〇4, and a height. (not shown, ie, 'into the page') each of the obstacles 601 has a desired spacing of 6〇2, and thus acts as a filter 1 § to prevent the size of the particles from flowing into the treatment zone 234. It may be formed The obstacle 601 is formed in the lubricant passage 301F during the process of the lubricant passage 301F using conventional patterning, lithography, and dry engraving techniques. In one embodiment, the lubricant passage 3〇1F width w and is disposed in the lubrication The obstacle 6〇1 direction in the agent transport 301F is configured to maximize the flow of lubricant to the treatment zone. In another embodiment, the width w of the lubricant passage 3〇1F and the obstacles disposed therein The direction of 601 is configured to control the flow of lubricant. Usually, it is thought The number and direction of the obstacles 601 and the interval 602 and depth of the space between the obstacles 601 are selected (not shown; that is, into the page of the 7D map) so that the particles of the desired size cannot enter. In one embodiment, the barrier 601 has a length between about 50 μτη to about 200 μm, a width between about Ιμπι and about 50 μm, and a spacing 602 between about 〇μχη and about 2 。. In the embodiment, it is possible to prevent particles as small as Ιμη from entering the treatment zone 234. In one aspect, the depth of the interval 602 may be the same as the depth of the channel. In another embodiment, the lubricant channel 301G includes a plurality of obstacles 601. Arrays, these arrays are staggered along a portion of the length of the lubricant channel 301G. In this configuration, particles having a size smaller than the filter gap (i.e., interval 602) can also be effectively blocked. In another embodiment In the middle, a plurality of sets of obstacles 601 or a plurality of filter zones 605 are placed in different areas of the lubricant passage to further prevent particles from entering the treatment zone of the formed device. As shown in Fig. 7c, it may be desirable to have a filtration zone 6〇5α close to the inlet of the lubricant passage and another filtration zone 605Β located in the lubricant passage close to the treatment zone, and the filtration zone 605Α may be used for collection from The externally entering particles of the MEMS device package, the filter zone 6〇5Β is used as the final filter device before entering the treatment zone 234. Figure 7 is a cross-sectional view of the wall containing two lubricant channels, the two lubricant channels having Different outlet configurations may be useful to enhance the distribution and transfer of lubricant to the processing zone 234. In one embodiment, the lubricant channel 301G has a plurality of outlet arrays, such as outlet ports 303C-303D), which The outlet is adapted to improve the rate of transfer of the lubricant to the treatment zone and/or to improve the distribution of the lubricant to different zones in the treatment zone. In another embodiment, the lubricant passage 301H has a large outlet port 303E that acts as a nozzle that facilitates transfer of lubricant to the treatment zone 234. In another embodiment, as shown in Fig. 8, a resistive element 921 and a temperature controller 922 can be used to control the temperature of the lubricant contained in the lubricant passage 301 to further control the transfer of the lubricant. In this configuration, the controller 922 is adapted to deliver a desired amount of power to the resistive element 921 to control the temperature of the lubricant disposed in the lubricant passage 3.1 and thereby control the lubricant to the treatment zone 234. Mobility. In another aspect, the resistive element 921 is worn over the outer surface 235A of one of the walls surrounding the processing zone 234 to facilitate control of the lubricant temperature in the lubricant passage 301. In one aspect, resistive element 921 is a metal deposited on the surface of 30 200834757 surrounding the walls of processing zone 234. It should be noted that since both vaporization and dispersion are subject to heat and the process is inevitable, the migration of the ship to the ship’s 3 (1)

丨通有溫沒的瑨加向膠脹,這便得潤滑劑通道3〇1中所設置的潤滑劑被 出口埠303,並且在當潤滑劑通道301中的溫度下降時收縮。在_個, 例中,在潤滑劑是黏性液體並且/或具有與潤滑劑通道301的内表面強^ _ _情況下’氣體9G1的體積可以麵微高於處理區234巾壓力的壓力下 增力:。此鱗當氣Μ積雜簡健力差時,氣體能鏡慢地將潤滑劑 傳送到處理區。 在一個實施例中,如同於第9Α圖中所示,帽3〇4Α可以被插入在 埠303,而將潤滑劑通道301與處理區234隔離,一直至去除帽3〇4八以允 許濁滑劑505 it入處理區234為止。在一觀點中,帽3〇4Α是諸如光 類的聚合物,該聚合物保持在出口埠3〇3上,一直至曝露於某種形式 學輕射或加熱為止。此光學輻射或加熱導致帽綱八情包含的 相分離或物理性質改變,因而將帽3〇4Α轉換為多孔材料。將潤 301的位置鄰近蓋子232 (參考第2八圖和名όΒ圖)组態,則上述組態特 • 子錢桃料形成,該透光觀讓想要波長的光藉由二使The enthalpy of the temperature is increased, and the lubricant set in the lubricant passage 3〇1 is discharged to the crucible 303, and is contracted when the temperature in the lubricant passage 301 is lowered. In the case where the lubricant is a viscous liquid and/or has a strong surface with the inner surface of the lubricant passage 301, the volume of the gas 9G1 may be slightly higher than the pressure of the treatment zone 234. Increase power: When the scale is poorly accumulating, the gas mirror slowly transfers the lubricant to the treatment zone. In one embodiment, as shown in Figure 9, the cap 3〇4Α can be inserted into the crucible 303 to isolate the lubricant passage 301 from the treatment zone 234 until the cap is removed 3 to allow for turbidity. The agent 505 it enters the processing zone 234. In one aspect, the cap 3 is a polymer such as a light-based polymer that remains on the exit 埠3〇3 until exposed to some form of light shot or heat. This optical radiation or heating causes a change in phase separation or physical properties contained in the cap, thereby converting the cap 3〇4Α into a porous material. The position of Run 301 is configured adjacent to the cover 232 (refer to Figure 2 and the figure), and the above configuration is formed by the special money peach, which allows the light of the desired wavelength to be made by two

在一個實施例中,如同於第9B圖中說明, 道301和MEMS裝置元件950的至少一部分。 可以如圖所示形成在插件235的辟Φ,士:人如 帽3G4A賴料失效。在另-種實施例中,帽綱a適於在溫度提高時失效。 該組態允許在使用較低溫度的密封方法(例如,環氧樹脂密封)接合裝置 基板之前,將所想要數量的潤滑劑封閉在潤_通道3G1中。可以在^封 ’在基底233上形成潤滑劑通 。潤滑劑通道301的剩餘部分 二以如圖所示形成在插件说的壁中,或全部形成在基底233中。施泌 衣置π件950被設置爲接近基底233中形成潤滑劑通道3〇1之部份,以致於 細娜裝置το件950的-部分951可以被致動,以覆蓋潤滑劑通道3〇1的出 31 200834757 =埠3〇3。可以在形成MEMS農置231的同時,在基底233中形成施泌 衣置兀件95=。在這種組態中,細廳裝置祕95()可以被電源ιΐ2從外部 啟動’以覆盍或曝露出口埠303,以致於廳奶裝置元件用作可以 潤滑劑材料從潤滑劑通道3()1流動進行調節的閥。所述部分951可以使用由 電源m所施加的偏壓而樞轉(參考第9BW中的 在一個實施射,如_ 1GA _ 1GB騎說日irm3s 封裝的處理_射所包含賴滑舰道包括··_個或更多侧作粒子陷 牌的幾何特徵。第1GA圖是根據本發明一實施例具有潤滑劑通道1〇〇1的 廳MS裝置雜1_的平關,爾舰道麵形成有粒子瞒議。 為了清楚起見,施MS裝置封裝麵是在蓋子232的部份區段麵被去 除的情況下說明。如同所顯示,潤滑劑通道麵在插件235中形成,並從 插件23S的外表面235A延伸至内表面23犯。潤滑劑通道讓實質上類似 於上述潤滑劑通道則,所不同者為潤滑劑通道觸!形成具有粒子陷牌 1002。粒子陷牌1〇02是這樣的腔體:它被形成為與潤滑劑通道議工的内 部區域30=流體連通,並設置與通道入口 3〇2相對。由於設置了粒子陷阱 1〇〇2,在藉由材料去除或其他類似過程而形成通道入口搬時、進入内部 區域305,的大部分粒子將被收集在粒子陷味麵内。使用雷射鑽孔過程以 形成通道入口 302時尤其真實。如圖所示,粒子陷牌繼是個死區,即一 個“死端”體積,該體積並非插件235的外表面235A與内表面235β之間的 流體通道的-部分。因此,當潤滑劑被藉由通道入口 3〇2導入刺滑劑通 道1001中日$,粒子陷胖1002巾收集的粒子不被運送到施廳 1030内的處理區234中。 n 為了進-步減少運送到處理區234中的粒子數目,當使用雷射鑽孔形 成通這入口 302時,粒子陷牌麵還可以被組態,以減少内部區域3〇5中 ,生的粒子數目。本案發明人已經確定,雷射光束可以在雷射鑽孔期間照 2内部區域305的表面産生粒子。在形成通道入口搬之後和酬雷射之 刖’可以由鑽孔雷射剝離内部區域3〇5的内表面1〇〇3。為了使鑽孔雷射對 表面1003的剝離所產生的粒子的數目最小化,粒子陷牌臟可以被组離, 以致於表面酬的位置遠離鑽孔雷射的焦點麵。由光線的相交點麵 32 200834757 和麵所表示的焦點10〇4實質上與通道入口 3〇2重合。藉由使表面騰 的位置遠離焦點賴和通道入口 3〇2,當入射到表面圓上時,穿透雷 射光束的能量密度被減小。據信,藉由此會使内部區域3G5中形成較少粒 子。内部區域305中存在的粒子一般會熔合到表面1003和其他内表面上, 因此’非移動粒子是不會被運送到處理區234中。 第10B圖是根據本發明一實施例具有潤滑劑通道1〇11的裝置 封=1031的平面圖,潤滑劑通道1〇11形成有非線性的粒子陷牌1〇的。在 忒貫施例中,潤滑劑通道1〇11實質上類似於第1〇A圖中的潤滑劑通道 1〇〇1,所不同者為:潤滑劑通道1011形成具有非線性的粒子陷阱ι〇〇9。 在該實施例中,非線性的粒子陷阱1009使表面1〇13的位置離穿透雷射光 束的焦點1004有一距離,並且將非線性粒子陷阱1〇〇9中所收集的粒子與 插件235的外表面235A和内表面23诏之間的流體通道進一步隔離。在/第 10B圖所說明實施例中,非線性的粒子陷牌1〇〇9組態具有一個如。彎曲, 但是可以想到,雜録子_膽也可以_設有—個錢乡個大於或 小於90。的彎曲,以收集通道入口 3〇2形成期間所形成的粒子。 潤滑劑去險步驟 在一個實施例中,令人想要將泵(未示出)連接到通道入口 3〇2 (如 第6B圖所示),以致於可以用於抽空此處理區,以去除其中所包含的一個 或更多個移細滑劑及/或稀獅。在這種情況下,可以躲可以將處理區 抽空至足夠的壓力,以使潤滑劑蒸發並從而被從裝置封裝中去除。在另一 個實施例中,令人想要將氣體源(未示出)連接到一個注入埠'('例如,第 7A圖中的元件301A),以及然後從另一個注入埠(例如,第7a圖中的元 件3〇1B)去除帽(例如,第7A圖中的元件綱),以致於從氣體源所傳送 的氣體可以用於清除任何所使用或退化的潤滑劑材料。在任一種情況中, 這些型式的技術可以用於去除舊的及/或退化的潤滑劑材料,以致於可以使 用上述方法將新的潤滑劑材料增加到處理區中,以延長裝置 命。 、、可 雖然此上之說明是關於本發明之實施例,可以設計本發明其他與進一 33 200834757 且本發明之範圍是由以下申請 步實施例,而不會偏離本發明之基本範圍 專利範圍所決定。 ^ 【圖式簡單說明】 第1AU概要說明包含吸氣獅f知技術裝裝 弟2圖5兄月根據本發明實施例的裝置封裝總成的橫截面圖. 第2B圖概要說明根據本發明實施例的單一鏡總成的橫截面圖.In one embodiment, track 301 and at least a portion of MEMS device component 950 are as illustrated in FIG. 9B. The plug-in 235 can be formed as shown in the figure, and the person such as the cap 3G4A fails. In another embodiment, the cap a is adapted to fail when the temperature is increased. This configuration allows the desired amount of lubricant to be enclosed in the Run_Channel 3G1 prior to joining the device substrate using a lower temperature sealing method (e.g., epoxy seal). A lubricant pass can be formed on the substrate 233. The remaining portion 2 of the lubricant passage 301 is formed in the wall of the insert as shown, or is formed entirely in the base 233. The splitting device π member 950 is disposed close to a portion of the substrate 233 where the lubricant passage 3〇1 is formed, so that the portion 951 of the thinner device 950 can be actuated to cover the lubricant passage 3〇1 Out of 31 200834757 =埠3〇3. The applicator member 95 = can be formed in the substrate 233 while forming the MEMS farm 231. In this configuration, the fine chamber device 95 () can be activated from the outside by the power supply ι 2 to cover or expose the outlet 埠 303 so that the hall milk device component can be used as a lubricant material from the lubricant channel 3 () 1 Flow regulating valve. The portion 951 can be pivoted using a bias voltage applied by the power source m (refer to the processing in a 9BW in one implementation, such as _ 1GA _ 1GB riding day irm3s encapsulation processing _ shooting includes the sliding channel including One or more sides are geometric features of the particle trap. The first GA map is a flat gate of a hall MS device having a lubricant passage 1〇〇1 according to an embodiment of the present invention, and the ship's channel surface is formed with For the sake of clarity, the application device package surface is illustrated with the partial section of the cover 232 removed. As shown, the lubricant passage face is formed in the insert 235 and from the insert 23S The outer surface 235A extends to the inner surface 23. The lubricant passage is substantially similar to the lubricant passage described above, the difference being the lubricant passage contact! The formation has a particle trap 1002. The particle trap 1 〇 02 is such a cavity Body: It is formed to be in fluid communication with the inner region 30 of the lubricant channel and is placed opposite the channel inlet 3〇2. Since the particle trap 1〇〇2 is set, by material removal or other similar process When the channel entrance is moved, it enters Most of the particles in the region 305 will be collected in the particle trapping surface. This is especially true when using the laser drilling process to form the channel inlet 302. As shown, the particle trap is followed by a dead zone, a "dead" The end volume, which is not the portion of the fluid passage between the outer surface 235A of the insert 235 and the inner surface 235β. Therefore, when the lubricant is introduced into the slip agent passage 1001 by the passage inlet 3〇2, the particle The particles collected by the obscured 1002 towel are not transported into the processing zone 234 within the hall 1030. n To further reduce the number of particles transported into the processing zone 234, when laser tunneling is used to form the inlet 302, The particle trapping surface can also be configured to reduce the number of particles produced in the inner region 3 〇 5. The inventors have determined that the laser beam can produce particles during the laser drilling of the surface of the inner region 305 during laser drilling. The inner surface 1〇〇3 of the inner region 3〇5 may be peeled off by the drilled laser after the passage of the inlet of the passage and the recursive laser. The number of particles generated by the peeling of the drilled laser to the surface 1003 Minimized, particle trap The dirty card can be grouped so that the surface is offset from the focal plane of the drilled laser. The focal point 10〇4 represented by the intersecting point 32 of the light and the surface is substantially coincident with the channel entrance 3〇2. By moving the surface away from the focus and channel entrance 3〇2, the energy density of the penetrating laser beam is reduced when incident on the surface circle. It is believed that the internal region 3G5 is formed. Less particles. Particles present in the inner region 305 will generally fuse to the surface 1003 and other inner surfaces, so 'non-moving particles will not be transported into the treatment zone 234. Figure 10B is a lubrication according to an embodiment of the invention The device channel of the agent channel 1〇11 is a plan view of=1031, and the lubricant channel 1〇11 is formed with a nonlinear particle trap. In a preferred embodiment, the lubricant passage 1〇11 is substantially similar to the lubricant passage 1〇〇1 in Figure 1A, except that the lubricant passage 1011 forms a particle trap with a non-linearity. 〇9. In this embodiment, the non-linear particle trap 1009 causes the position of the surface 1〇13 to be a distance from the focus 1004 of the penetrating laser beam, and the particles collected in the nonlinear particle trap 1〇〇9 and the insert 235 The fluid passage between outer surface 235A and inner surface 23A is further isolated. In the embodiment illustrated in Figure /B, the non-linear particle trapping 1〇〇9 configuration has one. Bending, but it is conceivable that the loggers can also be provided with a money of more than or less than 90. The curvature is formed to collect the particles formed during the formation of the channel entrance 3〇2. Lubricant Debulking Step In one embodiment, it is desirable to connect a pump (not shown) to the passage inlet 3〇2 (as shown in Figure 6B) so that it can be used to evacuate the treatment zone to remove One or more fine slip agents and/or lions contained therein. In this case, it is possible to evacuate the treatment zone to a sufficient pressure to allow the lubricant to evaporate and thereby be removed from the device package. In another embodiment, it is desirable to connect a gas source (not shown) to one implant 埠' ('eg, element 301A in Figure 7A), and then inject 埠 from another (eg, 7a) The element 3〇1B) in the figure removes the cap (e.g., the component class in Figure 7A) such that the gas delivered from the gas source can be used to remove any used or degraded lubricant material. In either case, these types of techniques can be used to remove old and/or degraded lubricant materials such that new lubricant materials can be added to the treatment zone using the methods described above to extend the life of the device. However, although the description herein is directed to embodiments of the present invention, it is contemplated that the invention can be devised by the following application. Decide. ^ [Simplified description of the drawings] The first AU outlines the cross-sectional view of the device package assembly according to the embodiment of the present invention. FIG. 2B is a schematic view showing the implementation of the device package assembly according to the embodiment of the present invention. A cross-sectional view of a single mirror assembly.

橫截^圖21圖概要制根據本發明實關的處於偏歡態的單-鏡總成的 第3A圖說明根據本發明實施例的裝置封裝總成的橫截面平面圖. 第3B圖和第3C圖說明根據本發明實施例帛从圖部段 滑劑通道近視圖; 第3D圖說明根據本發明實施例的潤滑劑通道、其具有設置在 滑劑容積、而將潤滑劑的現成供應提供給處理區域; 一 第3E圖說明根據本發明實施例的裝置封裴總成的橫截面平面圖; 第3F圖綱根據本發明實酬的裝置封裝總細觀面平_ 壯 置封裝總成在裝置封裝總成的處理區内具有通道; 衣 第3G圖說明根據本發明實施例的裝置封裝總成的橫截面平面圖、誃壯 置封裝總成在處理區的内表面上具有包含潤滑劑的通道; μ衣BRIEF DESCRIPTION OF THE DRAWINGS FIG. 21 is a cross-sectional plan view of a device package assembly in accordance with an embodiment of the present invention. FIG. 3B and FIG. 3C illustrate a third embodiment of a single-mirror assembly in a partial state in accordance with the present invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 3D is a close-up view of a lubricant passage from a drawing section in accordance with an embodiment of the present invention; FIG. 3D illustrates a lubricant passage having a set-up of a lubricant volume provided to provide a ready supply of lubricant to a process in accordance with an embodiment of the present invention. A section 3E illustrates a cross-sectional plan view of a device sealing assembly in accordance with an embodiment of the present invention; FIG. 3F illustrates a device in accordance with the present invention, a package package total fine viewing level _ sturdy package assembly in the device package total a channel having a channel in accordance with an embodiment of the present invention; a stent assembly having a channel containing a lubricant on an inner surface of the treatment zone;

第4A-4C圖說明根據本發明實施例用於形成包括潤滑劑通道之 裝置封裝的處理序列;MS 第5A-5P圖說明在執行第4A圖、第4B圖、以及第4C圖所說明产 序列中的各個步驟之後、MEMS裝置封裝之一或更多個組件的各種狀S·, 第6A圖說明根據本發明實施例在實施第4A圖所說明的處理序列中 多個步驟之後、裝置封裝總成的橫截面平面圖; 、 第6B圖和第6C圖說明根據本發明實施例形成進入潤滑劑通道中的通 道入口; 第6D圖說明根據本發明實施例在潤滑劑已被吸入到潤滑劑通道之 34 200834757 後、裝置封裝總成的橫截面平面圖; 第6E圖說明根據本發明實施例、被安裝在通道入口上以资 、 道之帽; ^封潤滑劑通 第6F圖和第6G圖說明根據本發明實施例使用汉 道的方法; 财滑劑通 第7A圖說明根據本發明實施例的裝置封裝總成之橫截面平面 第7B圖說明根據本發明實施例的裝置封裝總成之近視部份播=, 第7C圖說明根據本發明實施例的裝置封裝總成之近視部^面圖;4A-4C illustrate a processing sequence for forming a device package including a lubricant channel in accordance with an embodiment of the present invention; MS 5A-5P illustrates the production sequence illustrated in Figures 4A, 4B, and 4C. After each step in the process, the various forms of one or more components of the MEMS device package, FIG. 6A illustrates the total package of the device after performing multiple steps in the process sequence illustrated in FIG. 4A in accordance with an embodiment of the present invention. A cross-sectional plan view; FIG. 6B and FIG. 6C illustrate a channel inlet formed into the lubricant passage in accordance with an embodiment of the present invention; FIG. 6D illustrates the lubricant being drawn into the lubricant passage in accordance with an embodiment of the present invention. 34 200834757 rear cross-sectional plan view of the device package assembly; FIG. 6E illustrates a cap installed on the inlet of the channel for the purpose of loading and unloading according to an embodiment of the present invention; FIG. 6F and FIG. The embodiment of the present invention uses the method of the Han Road; the seventh embodiment of the device package assembly according to the embodiment of the present invention illustrates a cross-sectional plane of the apparatus package, and FIG. 7B illustrates a device seal according to an embodiment of the present invention. Part of multicast = myopia assembly, the first portion 7C myopic view illustrating assembly of the device package of the embodiment of FIG face ^ embodiment of the present invention;

第爪圖說明根據本發明實施例,第圖中所說明之近圖’· 圖, 々截面 第7Ε圖說明根據本發明實施例的裝置封裝總成之近視部 第8圖說明根據本發明實施例的裝置封裝總成之近視部份U面圖; 第9Α圖和第9Β圖說明根據本發明實施例的裝置封裝始:、圖, 橫截面圖; 、、心成之近視部份 第10Α圖是根據本發明實施例具有潤滑劑通道的廳μ 面圖、所述潤滑劑通道形成有粒子以及 、輯衣的平 第10Β圖是根據本發明實施例具有潤滑劑通道的應聰 面圖、所述潤滑劑通道形成具有非線性粒子陷阱。、 置封裝的平The first claw diagram illustrates a near view of the device package assembly according to an embodiment of the present invention. FIG. 8 illustrates a near view portion of the device package assembly according to an embodiment of the present invention. FIG. 8 illustrates an embodiment of the present invention. A near-view portion of the device package assembly; FIG. 9 and FIG. 9 are diagrams showing the device package start: diagram, cross-sectional view, and the myopic portion of the myopic portion according to an embodiment of the present invention. A plan view of a chamber having a lubricant passage, a lubricant passage formed with particles, and a plan view of a garment according to an embodiment of the present invention, in accordance with an embodiment of the present invention, The lubricant passage is formed with a nonlinear particle trap. Packaged flat

100 封裝 101 鏡總成 102 鏡 102 A 反射表面 102B 鏡底 103 .基底 104 蓋子 104A、 104B接著塾 105 表面 【主要元件符號說明】 35 200834757 106 密封件 106A 電極 106B 電極 107 撓性構件 108 MEMS 裝置 110 吸氣劑 111 基底 112 電源 120 封裝100 package 101 mirror assembly 102 mirror 102 A reflective surface 102B mirror base 103. substrate 104 cover 104A, 104B followed by 塾 105 surface [main component symbol description] 35 200834757 106 seal 106A electrode 106B electrode 107 flexible member 108 MEMS device 110 Getter 111 substrate 112 power supply 120 package

124 頭上空間 125 間隔環 126 窗口 128 封裝基板 230 MEMS裝置封裝 231 MEMS 裝置 232 蓋子 233 基底 234 處理區 234A、234B、234C 内表面 234D 槽 235 插件 235A 外表面 235B 内表面 235C 晶圓 301、301A、301B、301C、 301D、301E、301F、301G、301H 潤滑劑通道 302 通道入口 302A 封閉物 303、303A、303B、303C、303D、303E 出口埠 36 200834757124 head space 125 spacer ring 126 window 128 package substrate 230 MEMS device package 231 MEMS device 232 cover 233 substrate 234 processing region 234A, 234B, 234C inner surface 234D slot 235 insert 235A outer surface 235B inner surface 235C wafer 301, 301A, 301B , 301C, 301D, 301E, 301F, 301G, 301H Lubricant channel 302 Channel inlet 302A Enclosure 303, 303A, 303B, 303C, 303D, 303E Exit 埠 36 200834757

304 帽 305 内部區域 391 部份區段 400、 410、420 序列 401 凹陷 402 通孔 403 底壁 404 頂表面 405 背表面 411 廢棄材料 432 蓋子 432A 上表面 450、 452、454、456、458、460、46卜 462 步驟 484、 486、487、488 步驟 494、 496、498、499 步驟 501 插件材料 502 材料厚度 503 控制孔隙 504 偏差 505 潤滑劑 506 .環氧樹脂層 507 第二環氧樹脂層 508 潤滑劑塞子 520 焊接坑 521 部份 522 密封件 523 焊接坑 524 焊接區 601 部份區段/障礙物 37 200834757304 cap 305 inner region 391 partial section 400, 410, 420 sequence 401 recess 402 through hole 403 bottom wall 404 top surface 405 back surface 411 waste material 432 cover 432A upper surface 450, 452, 454, 456, 458, 460, 46 462 Steps 484, 486, 487, 488 Steps 494, 496, 498, 499 Step 501 Insert Material 502 Material Thickness 503 Control Pore 504 Deviation 505 Lubricant 506. Epoxy Layer 507 Second Epoxy Layer 508 Lubricant Plug 520 Weld pit 521 Part 522 Seal 523 Weld pit 524 Weld area 601 Part section / Obstacle 37 200834757

602 間隙 603 長度 604 寬度 605、 605A、605B過濾區 901 氣體 921 電阻性元件 922 溫度控制器 950 MEMS裝置元件 951 部份 1001 潤滑劑通道 1002 粒子陷阱 1003 表面 1004 焦點 1006 、1007光線的相交點 1009 粒子陷阱 1011 潤滑劑通道 1013 表面 1030 MEMS裝置封裝 1031 MEMS裝置封裝 1091 部份區段602 Clearance 603 Length 604 Width 605, 605A, 605B Filter Zone 901 Gas 921 Resistive Element 922 Temperature Controller 950 MEMS Device Element 951 Part 1001 Lubricant Channel 1002 Particle Trap 1003 Surface 1004 Focus 1006, 1007 Light Intersection Point 1009 Particles Trap 1011 Lubricant Channel 1013 Surface 1030 MEMS Device Package 1031 MEMS Device Package 1091 Partial Section

Claims (1)

200834757 十、申請專利範圍: 1· 一種形成微機械裝置總成之方法,包括以下步驟: 形成微機械裝置;以及 形成潤滑劑通道,其穿過該微機械裝置的處理區的内壁延伸,其中,該 潤/腎劑通道之實質長度延伸至該内壁中而被完全圍繞。 2· ί申請專利範圍第1項所述之方法,更包括: 穿過該微機械裝置總成的外表面形成通道入口的苴 口與該潤_财趙親。 ^该通運入 3·如申請專利範圍第2項所述之方法,更包括: 在接近該微機雖置誠驗核面翁該通道人㈣封㈣步驟。 4·如申請專利範圍第!項所述之方法,更包括: 在該潤滑劑内設置粒子過濾器的步驟。 5·如申請專利範圍第丨項所述之方法,更包括: 用有機鈍化材佈賴_魏_喊面的步驟。 機械裝置的在裝具有微機械裝置和用於該微 將潤滑劑添加至該潤滑齊;之中中。而被完全圍繞;以及 7.如申請專利範圍第6項所述之方法 在添加該潤滑劑的步驟之前將該封裝密封的步驟。 δ.如申請專利範圍第7項所述之方法,更包括以下步驟: 39 200834757 =成用於從外部接達該潤滑劑通道的孔;以及 藉由毛細力將該潤滑劑經過該孔注入到該潤滑劑通道中。 9·如申請專利範圍第6項所述之方法,更包括: 在添加該潤滑劑的步驟之後將該封裝密封之步驟。 10·如申請專利範圍第9項所述之方法,更包括:200834757 X. Patent Application Range: 1. A method of forming a micromechanical device assembly, comprising the steps of: forming a micromechanical device; and forming a lubricant passage extending through an inner wall of a processing region of the micromechanical device, wherein The substantial length of the moisturizing/renal passage extends into the inner wall to be completely surrounded. 2. The method of claim 1, wherein the method further comprises: forming an entrance of the passage through the outer surface of the micromechanical device assembly and the run. ^ The method of transporting into the 3rd, as described in the second paragraph of the patent application scope, further includes: In the approach of the microcomputer, although the nucleus of the channel is inspected, the channel (4) is sealed (four). 4. If you apply for a patent scope! The method of the invention, further comprising: the step of providing a particle filter in the lubricant. 5. The method described in the third paragraph of the patent application includes: the step of using the organic passivation material to _Wei_ shouting face. The mechanical device is provided with a micromechanical device and for the micro lubricant to be added to the lubrication; And being completely surrounded; and 7. The method of sealing the package before the step of adding the lubricant, as in the method of claim 6 of the patent application. δ. The method of claim 7, further comprising the steps of: 39 200834757 = into a hole for externally accessing the lubricant passage; and injecting the lubricant through the hole by capillary force In the lubricant channel. 9. The method of claim 6, further comprising the step of sealing the package after the step of adding the lubricant. 10. The method described in claim 9 of the patent scope further includes: 在該潤滑劑通道中靠近該潤滑劑通道進入該處理區的開口處置放帽的 步驟,其中,該帽包括響應於光學輻射或加熱而變為多孔之材料。 11· 一種將潤滑劑注入到微機械裝置總成的潤滑劑通道中之方法,包括以 步驟: 形成用於從外部接達該潤滑劑通道的孔;以及 藉由毛細力將該潤滑劑經過該孔注入到該潤滑劑通道中。 12·如申请專利範圍第η項所述之方法,甘中 形成該孔的步驟包括:使用短脈衝雷射和長脈衝雷射之一雨 孔的步驟。 每射鑽A step of disposing a cap in the lubricant passage adjacent the lubricant passage into the opening of the treatment zone, wherein the cap comprises a material that becomes porous in response to optical radiation or heating. 11. A method of injecting a lubricant into a lubricant passage of a micromechanical device assembly, comprising the steps of: forming a hole for receiving the lubricant passage from the outside; and passing the lubricant through the capillary force A hole is injected into the lubricant passage. 12. The method of claim n, wherein the step of forming the hole comprises the step of using a short pulse laser and a long pulse laser. Every shot 13·如申請專利範圍第12項所述之方法,更包括: 使用能《來㈣該步驟,其巾,該能量較短脈衝雷射、 衝雷射和電子束源之一 長脈 14.如申請專利範圍第12項所述之方法,吏包括: 使用油脂來密封該孔的步驟。 1S.如申請專利範圍第U項所述之方法,更包括以下步驟: =潤滑舰道與該外敎f雜持壓力差,錢麵雜通 力南於該外部的壓力。 、中的懕 200834757 ;以及 1Ξ= Π.如申請專利範圍第1ό項所述之方法,其中13. The method of claim 12, further comprising: using the "can (4) step of the towel, the energy of the shorter pulse laser, the laser and the electron beam source of the long pulse 14. The method of claim 12, comprising: the step of sealing the hole with grease. 1S. The method of claim U, further comprising the steps of: = lubricating the channel and the outer 敎 杂 杂 杂 杂 杂 杂 杂 杂 杂 杂 杂 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑 润滑, 中 懕 200834757 ; and 1Ξ = Π. The method of claim 1, wherein the method of claim 1 帽由響應於光雜射或者加熱而變得纽的材料製 進人該處理區的開口具有設置在該開口中的帽,以及該 成 18.如申請專利範圍第17項所述之方法,更包括: 在加熱步驟之祕該帽曝露於光學輻射的步驟。 19·如申請專利範圍第16項所述之方法,其中 该潤滑劑通道具有敞開的通道組態。 20·如申請專利範圍第16項所述之方法,其中 該潤滑舰道的實質長度延伸至該處理區的内壁中而被完全圍繞。 21· -種形成經封裝的微機械裝置之方法,該封裝包括基底 , 該方法包括以下步驟: 々孤丁 在該基底上形成微機械裝置; 將該插件接合到該基底,並將該蓋子接合到該插件;以及 在該基底、該插件、以及該蓋子的至少_中形成潤賴通道,其中, 該潤滑劑通道與該微機械裝置的處理區流體連通。 22·如申請專利範圍第21項所述之方法,其中 該插件被藉由環氧樹脂層接合到該基底,該蓋子被藉由環氧樹脂層接 41 200834757 合到該插件 23·如申請專利第22項所述之方法,更包括: 在接合步驟之可將潤滑劑添加到該潤滑劑通道中之步驟。 从如申請專利範圍第23項所述之方法,更包括: 到該潤滑劑通道中靠近該糊通道進入該處理區的開口位 25.如申請專利範圍第21項所述之方法,更包括: 到該基底,以及該蓋子藉由高溫接合過程 26· —種裝置總成,包括: 微機械裝置,其被圍繞在處理區中;以及 潤滑劑通道,其穿賴處理與贿理區流體 連通,其中,該潤滑劑通道之實質長度延伸至該至少一個内壁之 中從而被完全圍繞。 &amp; 27·如申請專利範圍第26項所述之裝置總成,其中 該潤滑劑通道的體積在大約〇·1奈升和大約1〇00奈升之間。 28·如申請專利範圍第27項所述之裝置總成,其中 潤滑劑被設置在該潤滑劑通道中。 29·如申請專利範圍第26項所述之裝置總成,其中 該潤滑劑通道的液壓直徑小於約lmm,該潤滑劑通道的長度遠大於該 潤滑劑通道的液壓直徑。 42 200834757The cap is made of a material that is responsive to light spurting or heating, and the opening of the processing zone has a cap disposed in the opening, and the method of the invention is as described in claim 17, Included: The step of exposing the cap to optical radiation during the heating step. The method of claim 16, wherein the lubricant passage has an open channel configuration. The method of claim 16, wherein the substantial length of the lubrication channel extends into the inner wall of the treatment zone to be completely surrounded. 21 - A method of forming a packaged micromechanical device, the package comprising a substrate, the method comprising the steps of: forming a micromechanical device on the substrate; bonding the insert to the substrate and joining the cover To the insert; and forming a flow channel in the substrate, the insert, and at least the lid of the lid, wherein the lubricant passage is in fluid communication with the processing zone of the micromechanical device. The method of claim 21, wherein the insert is bonded to the substrate by an epoxy layer, the cover being bonded to the insert by an epoxy layer 41 200834757. The method of item 22, further comprising the step of adding a lubricant to the lubricant passage during the joining step. The method of claim 23, further comprising: into the opening of the lubricant channel adjacent to the paste channel into the processing zone. The method of claim 21, further comprising: To the substrate, and the cover assembly by the high temperature bonding process, comprising: a micromechanical device surrounded by the processing zone; and a lubricant channel that is in fluid communication with the bribe zone Wherein the substantial length of the lubricant passage extends into the at least one inner wall to be completely surrounded. The device assembly of claim 26, wherein the lubricant passage has a volume of between about 1 liter and about 10,000 liters. 28. The device assembly of claim 27, wherein the lubricant is disposed in the lubricant passage. The device assembly of claim 26, wherein the lubricant passage has a hydraulic diameter of less than about 1 mm, the lubricant passage having a length that is substantially greater than a hydraulic diameter of the lubricant passage. 42 200834757 ’更包括: 其中,該通道入口被形成為穿 如申請專利範圍第26項所述之裝置總成 與該潤滑劑通道流體連通的通道入口, 過該裝置總成的外表面。 31·如申請專利範圍第30項所述之裝置總成,更包括: 在該通道入口中與該裝置總成的該外表面接近處所設置塞子。Further comprising: wherein the passage inlet is formed to pass through a passage inlet of the apparatus assembly as described in claim 26, in fluid communication with the lubricant passage, past the outer surface of the assembly. 31. The device assembly of claim 30, further comprising: a plug disposed in the inlet of the channel proximate the outer surface of the device assembly. 32·如申請專利範圍第26項所述之裝置總成,更包括: 設置在該潤滑劑通道中的粒子過澹器。 33·如申請專利範圍第32項所述之裝置總成,其中 該粒子過濾純括:該潤滑劑通道内表面上所形成的複數個障礙物。 34·如申請專利範圍第26項所述之裝置總成,其中 第-潤滑劑通道和第二潤滑劑通道各經由該處理區的不同内壁而形 成,而與該處理區流體連通。 35·如申请專利範圍第34項所述之裝置總成,其中 潤滑劑被没置在該第一和第二潤滑劑通道中,設置在該第一潤滑劑通 道中的潤滑劑不同於設置在該第二潤滑劑通道中的潤滑劑。 36· —種裝置總成,包括: 微機械裝置,其被圍繞在處理區中;以及 潤滑劑通道,其形成於該處理區的至少一個内壁上,其中,該潤滑劑 通道沿著其整個長度與該處理區流體連通,該潤滑劑通道被組 態,以致於用於該微機械裝置的潤滑劑藉由該潤滑劑對該潤滑劑 通道的内表面的表面張力而被保持在該潤滑劑通道中。 43 200834757 37·如申請專利範圍第36項所述之裝置總成,其中 該潤滑劑通道的寬度是1〇_至8〇〇μιη,該潤滑劑通道的深度是1(^111 至 2〇〇μιη。 38.如申請專利範圍第37項所述之裝置總成,其中 該潤滑劑通道的體積在約〇.丨奈升和約1〇〇〇奈升之間,該潤滑劑通道 的液壓直徑小於約lmm。 39·如申請專利範圍第36項所述之裝置總成,更包括: 另=潤滑劑通道’其經由該處理區的至少一個内壁而形成、而與該處 理區流體連通’其巾’該另―潤賴通道的實質長度延伸至該内壁之 至少之一中而被完全圍繞。 4〇·如申請專利範圍第36項所述之裝置總成,其中 其中 通。 該第一和第二潤滑劑通道各沿著其整個長度與該處理區流體連 =理區的至少-個内壁上軸第-潤賴通道和第二潤滑劑通道 其Φ,該笛一去7馇-m 一種經封裝微機械裝置,包括:32. The device assembly of claim 26, further comprising: a particle filter disposed in the lubricant passage. 33. The device assembly of claim 32, wherein the particle filter comprises: a plurality of obstacles formed on an inner surface of the lubricant passage. 34. The device assembly of claim 26, wherein the first lubricant passage and the second lubricant passage are each formed via a different inner wall of the treatment zone and in fluid communication with the treatment zone. 35. The device assembly of claim 34, wherein a lubricant is not disposed in the first and second lubricant passages, and a lubricant disposed in the first lubricant passage is different from being disposed in a lubricant in the second lubricant passage. 36. A device assembly comprising: a micromechanical device surrounded by a treatment zone; and a lubricant passage formed on at least one inner wall of the treatment zone, wherein the lubricant passage is along its entire length In fluid communication with the treatment zone, the lubricant passage is configured such that the lubricant for the micromechanical device is retained in the lubricant passage by the surface tension of the lubricant to the inner surface of the lubricant passage in. The apparatus assembly of claim 36, wherein the lubricant passage has a width of 1 〇 to 8 〇〇 μηη, and the lubricant passage has a depth of 1 (^111 to 2 〇〇). 38. The device assembly of claim 37, wherein the volume of the lubricant passage is between about 〇 丨 升 and about 1 〇〇〇, the hydraulic diameter of the lubricant passage. 39. The device assembly of claim 36, further comprising: another = lubricant passage 'which is formed via at least one inner wall of the treatment zone and is in fluid communication with the treatment zone' The device has a substantial length extending into at least one of the inner walls and is completely surrounded. The device assembly as described in claim 36, wherein the first and The second lubricant passages are fluidly connected to the treatment zone along the entire length of the treatment zone, at least one inner wall of the control zone, and the second lubricant channel and the second lubricant passage, Φ, the flute is 7 馇-m Packaged micromechanical devices, including: 42·如申請專利範圍第4lj員月 環氧樹脂層被插入介於: 之間。 項所述之經封裝微機械裝置,其中 於··該蓋子與該插件之間、以及該插件與該基底 44 200834757 43. 如申請專利範圍第42項所述之經封裝微機械裝置,其中 該潤滑劑通道延伸至該至少一個内壁中而被完全圍繞。 44. 如申請專利範圍第43項所述之經封裝微機械裝置,更包括: 設置在該潤滑劑通道中與該潤滑劑通道進入該處理區的開口接近之 帽。 45. 如申請專利範圍第44項所述之經封裝微機械裝置,其中 該帽包括:響應於光學輻射或加熱而變為多孔的材料。 46. 如申請專利範圍第42項所述之經封裝微機械裝置,更包括: 另一潤滑劑通道,其形成在該處理區的至少一個内壁上,其中,該另 一潤滑劑通道沿著其整個長度與該處理區流體連通。 47. 如申請專利範圍第41項所述之經封裝微機械裝置,其中 該蓋子和該插件受到料接合或共晶接合,該插件和該基底受到料接合 或共晶接合。 48. 如申請專利範圍第47項所述之經封裝微機械裝置,更包括: 與該潤滑劑通道流體連通的通道入口,其中,該通道入口經由該裝置 外表面而形成。 49. 如申請專利範圍第48項所述之經封裝微機械裝置,更包括: 設置在該通道入口中而靠近該裝置的該外表面之塞子。 50. 如申請專利範圍第41項所述之經封裝微機械裝置,其中 在該基底中形成該潤滑劑通道。 4542. If the patent application scope is 4ljj month, the epoxy layer is inserted between: The packaged micromechanical device of the present invention, wherein the cover and the insert are between the insert and the insert, and the insert and the base 44. The lubricant passage extends into the at least one inner wall to be completely surrounded. 44. The packaged micromechanical device of claim 43, further comprising: a cap disposed in the lubricant passage adjacent the opening of the lubricant passage into the treatment zone. 45. The packaged micromechanical device of claim 44, wherein the cap comprises: a material that becomes porous in response to optical radiation or heating. 46. The packaged micromechanical device of claim 42, further comprising: another lubricant passage formed on at least one inner wall of the treatment zone, wherein the other lubricant passage is along the same The entire length is in fluid communication with the processing zone. 47. The packaged micromechanical device of claim 41, wherein the cover and the insert are material bonded or eutectic bonded, the insert and the substrate being joined or eutectic bonded. 48. The packaged micromechanical device of claim 47, further comprising: a channel inlet in fluid communication with the lubricant channel, wherein the channel inlet is formed via the outer surface of the device. 49. The packaged micromechanical device of claim 48, further comprising: a plug disposed in the channel inlet adjacent the outer surface of the device. 50. The packaged micromechanical device of claim 41, wherein the lubricant channel is formed in the substrate. 45
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104884991A (en) * 2012-12-31 2015-09-02 皮克斯特隆尼斯有限公司 Preventing glass particle injection during the oil fill process
TWI715689B (en) * 2015-12-08 2021-01-11 德商羅伯特博斯奇股份有限公司 Sensor element with laser-activated getter material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104884991A (en) * 2012-12-31 2015-09-02 皮克斯特隆尼斯有限公司 Preventing glass particle injection during the oil fill process
TWI715689B (en) * 2015-12-08 2021-01-11 德商羅伯特博斯奇股份有限公司 Sensor element with laser-activated getter material

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