TW200828817A - Analog to digital converting system - Google Patents
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200828817 r〇zyjuu49TW 22487twf.doc/n 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種類比對數位轉換系統,且特別是 有關於一種次範圍連續近似類比對數位轉換系統。 【先前技術】 類比對數位轉換器(ADC)的架構種類繁多,如快閃式 (Flash)ADC、管線式(Pipelin啦DC、連續近似式 ; Approximation,SA)ADC 與雙階式(TW0-SteP)ADC。這些 ADC架構具備各自適合的應用範圍。 快閃式ADC雖然適用於高速取樣速率的應用中,但 其功率消耗大。連續近似式ADC的取樣頻率較低,但其 功率消耗低且其電路複雜度低。 ^ 管線式ADC的特性則是介於快閃式aDC與連續近似 式ADC之間’但管線式ADC需要使用乘法數位類比轉換 裔(Multiplier Digital-to_Analog Converter,MDAC)。而 MDAC内部包括剩餘(Residue)運算放大器,其為負回授架 U 構。因此’剩餘運算放大器將成為管線式ADC在高速取 樣頻率應用上的瓶頸。 雙P白式ADC又分類為位元循環式(Bit_Cycling)ADC與 - 次範圍式(Subranging)ADC。位元循環式ADC也需要剩餘 * 放大斋,故也有類似的問題。根據目前文獻記載,次範圍 . 式ADC能夠突破管線式ADC與採用位元循環式的雙階式 ADC的瓶頸,達到高速取樣頻率。 底下將分別介紹數個習知的ADC系統。 5 200828817 rozs,49TW 22487twf.doc/n 第一種習知ADC系統可參考美國專利US6124818。 其乃是運用管線式技術,故其運算能力大為增加。其運用 雙ADC的架構,内部的粗(c〇arse)ADc與細 都疋利用SA-ADC架構。因此,降低數位對類比轉換器 (DAC)解析度的需求’使得DAc的電路面積變小且adc 的貧料轉換速度高。但由於粗ADC採SA_ADC架構, 故其潛伏(Latency)時間長,且取樣頻率會比較慢。 第一種㊂知ADC系統可參考美國專利US5973632。 『 其乃是運用雙階式ADC的技術,其内部的粗ADC與細 ADC都^採用快閃式架構來進行資料轉換。因&,提昇了 ADC的貧料轉換速度。但由於細ADC採用快閃式架構, 其比較器的數目為(2職+2叫2),MSBs與LSBs分別代 表最南有效位元組與最低有效位元組,故比較器的數量較 夕口此電路複雜度咼、功率消耗較高與面積有效使用 率也較低。 第二種習知ADC系統可參考美國專利US567534〇。 V 其乃運用雙階式ADC的技術,其内部的粗ADC採用快閃 式ADC架構而、細ADC則採用sa_ad 比車識目僅為2職個,數量較少。因此功 低,且曰曰片面積也較小。但是,因其使用加法器(編㈨ ' 將造成DAC的資料轉換時間長,故不適合高速轉換架構。 ' 由於沒有採用次範圍的技術,故粗ADC轉出的MSBs必 須f給SA-ADC内部的DAC,故DAC的面積較大(因包括 較多的單位電容)。說的輸人料電容較高,故在相同 6 200828817 rozy3uu49TW 22487twf.doc/n 解析度下,ADC取樣頻率較慢。 咬^第四種習知ADC系統可參考美國專利uS52473〇i。 明麥考圖1,其顯示美國專利US52473〇1的代表圖(圖!)。 士圖j所不,此雙階式ADC主要包括··高位元比較器組^ 兩,兀取樣/保持(Sample/H〇ld,S/H)電路組2,高位元編 碼态,低位元比較器組4,低位元取樣/保持電路組$, • 低位元編碼器6,參考電壓產生器7,控制信號產生器8, • 類比開關Sm,以及緩衝器9。 Γ 高位元比較器組1包括多個比較器1-1〜l-m。高位元 ,較器組1比較參考電壓與輸入電壓vin。 咼位兀取樣/保持電路組2包括多組S/H電路2_丨〜2_m,各 S/Η電路包括開關S2、S2丨與電容α。高位元取樣/保持電 路組2對輸入電壓Vin進行取樣/保持,並將結果送給高位 元比較器組1。高位元編碼器3將高位元比較器組丨的比 較結果編碼成高位元組D〇H。 相似地,低位元比較器組4包括多個比較器‘丨沁⑺。 j 低位元比較器組4比較參考電壓VL-1〜VL-n與輸入電壓200828817 r〇zyjuu49TW 22487twf.doc/n IX. INSTRUCTIONS: FIELD OF THE INVENTION The present invention relates to an analog-to-digital conversion system, and more particularly to a sub-range continuous approximation analog-to-digital conversion system. [Prior Art] Analog to digital converter (ADC) architectures such as flash ADC, pipeline (Pipelin DC, continuous approximation; Approximation, SA) ADC and bi-step (TW0-SteP ) ADC. These ADC architectures have their own range of applications. Although fast-flash ADCs are suitable for high-speed sampling rate applications, they consume a lot of power. The continuous approximation ADC has a lower sampling frequency, but its power consumption is low and its circuit complexity is low. ^ The characteristics of a pipelined ADC are between a flash aDC and a continuous approximation ADC', but a pipelined ADC requires a Multiplier Digital-to-Analog Converter (MDAC). The MDAC internally includes a Residue operational amplifier, which is a negative feedback frame. Therefore, the residual op amp will become the bottleneck of the pipeline ADC in high-speed sampling frequency applications. The dual P white ADC is further classified into a bit-cycled (Bit_Cycling) ADC and a sub-ranged (Subranging) ADC. The bit-cycle ADC also needs the remaining * to amplify, so there are similar problems. According to the current literature, the sub-range ADC can break through the bottleneck of the pipeline ADC and the bi-stage ADC with bit-cycle, achieving high-speed sampling frequency. Several conventional ADC systems will be introduced below. 5 200828817 rozs, 49TW 22487twf.doc/n The first conventional ADC system can be found in U.S. Patent No. 6,124,818. It uses pipeline technology, so its computing power is greatly increased. It uses a dual ADC architecture, and the internal coarse (c〇arse) ADc and fines use the SA-ADC architecture. Therefore, reducing the need for digital to analog converter (DAC) resolution has made DAc's circuit area smaller and adc's poor material conversion speed high. However, since the coarse ADC adopts the SA_ADC architecture, its Latency time is long and the sampling frequency is relatively slow. The first type of three-information ADC system can be found in U.S. Patent 5,973,632. "It is a technology that uses a two-stage ADC. Both the internal coarse ADC and the thin ADC use a flash architecture for data conversion. Due to &, the ADC's lean material conversion speed is increased. However, since the fine ADC adopts a flash architecture, the number of comparators is (2 jobs + 2 calls 2), MSBs and LSBs represent the most south effective byte and the least significant byte respectively, so the number of comparators is relatively large. This circuit has a high complexity, high power consumption and low effective area utilization. A second conventional ADC system can be found in U.S. Patent No. 5,567,534. V is a technology that uses a two-stage ADC. The internal coarse ADC uses a flash ADC architecture, while the thin ADC uses sa_ad to identify only two jobs, and the number is small. Therefore, the work is low and the area of the bracts is small. However, because it uses the adder (Editor (9)' will cause the DAC data conversion time is long, it is not suitable for high-speed conversion architecture. 'Because there is no sub-range technology, the MSBs from the coarse ADC must be f to the internal of the SA-ADC. DAC, so the area of the DAC is larger (since it includes more unit capacitance). The input capacitor is higher, so the ADC sampling frequency is slower under the same resolution of 200828817 rozy3uu49TW 22487twf.doc/n. The fourth conventional ADC system can be referred to the US patent uS52473〇i. Ming Mai Khao Tu 1, which shows the representative figure (picture!) of the US patent US52473〇1. This figure is not included, this bi-stage ADC mainly includes High bit comparator group ^2, 兀Sampling/Holding (Sample/H〇ld, S/H) Circuit Group 2, High Bit Coded State, Low Bit Comparator Group 4, Low Bit Sample/Hold Circuit Group $, • Low bit encoder 6, reference voltage generator 7, control signal generator 8, • analog switch Sm, and buffer 9. Γ High bit comparator group 1 includes a plurality of comparators 1-1 to lm. Group 1 compares the reference voltage with the input voltage vin. The circuit group 2 includes a plurality of sets of S/H circuits 2_丨~2_m, each S/Η circuit includes switches S2, S2丨 and a capacitor α. The high bit sample/hold circuit group 2 samples/holds the input voltage Vin and The result is sent to the high bit comparator group 1. The high bit encoder 3 encodes the comparison result of the high bit comparator group 成 into the high byte D 〇 H. Similarly, the low bit comparator group 4 includes a plurality of comparators '丨沁(7). j Low bit comparator group 4 compares reference voltages VL-1 to VL-n with input voltage
Vin。低位元取樣/保持電路組5包括多組s/h電路 5-1〜5-n,各S/Η包括開關S5、S51與電容Ci。低位元取 - 樣/保持電路組5對輸入電壓Vin進行取樣/保持,並將結 - 果送給低位元比較器組4。低位元編碼器ό將低位元比較 - 為組4的比較結果編碼成低位元組d〇L。 參考電壓產生器7會產生高位元參考電壓 VH 1 VH-m給n位元比較為組1。此外,參考電壓產生哭 7 轉、Φδ2與怀5 2與低位元取樣/Vin. The low-order sample/hold circuit group 5 includes a plurality of sets of s/h circuits 5-1 to 5-n, and each S/Η includes switches S5 and S51 and a capacitor Ci. The low-order take-and-hold circuit group 5 samples/holds the input voltage Vin and sends the result to the low-order comparator group 4. The low bit coder compares the low bits - the result of the comparison of group 4 is encoded into the lower byte d 〇 L. The reference voltage generator 7 generates a high bit reference voltage VH 1 VH-m to compare n bits to group 1. In addition, the reference voltage produces crying 7 turns, Φδ2 and Huai 5 2 and low bit sampling /
200828817 P62950049TW 22487twf.doc/n 7會根據高位元組DoH來產生低位元參考電壓νι^〜ν 給低位元比較器組4。 控制號產生器8分別產生控制信號 給類比開關Sm、咼位元取樣/保持電路組 保持電路組5。 類比開關Sm控制輸入電壓Vin是否導通至高位元取 樣/保持電路組2與低位元取樣/保持電路組5。 第四種習知ADC架構合併運用雙階式ADC與次範圍 ADC。其資料轉換速度較快。但其比較器數目較多,因此, 電路複雜度高、功率雜較高、生產良率低與面積有效使 用率也較低。 第五種習知ADC系統可參考美國專利US49948〇6。 其使用快閃式ADC的高速轉換特徵,以提升ADC的轉換 速度。其使用SA-ADC,以提升ADC的精確度。其結合快 閃式ADC與SA-ADC的優點,在不需額外較正電路下, ,提升ADC的整體效能。但因為需要使用到剩餘放大器, 备ADC刼作於高速轉換頻率下,此放大器將變成整個 ADC系統的設計瓶頸。 【發明内容】 本發明提供一種類比對數位轉換系統,將一類比輸入 信號轉換成一數位輸出信號。該類比對數位轉換系統包 括·一追蹤與保持電路,追蹤並保持所追蹤到的該輸入信 號;一粗類比對數位轉換器,根據一第一參考電壓而轉換 該追蹤與保持電路之該輸出信號成一第 一數位碼,該第一 8 〇200828817 P62950049TW 22487twf.doc/n 7 will generate a low bit reference voltage νι^~ν to the lower bit comparator group 4 according to the high byte DoH. The control number generator 8 generates control signals for the analog switch Sm and the clamp sample/hold circuit group holding circuit group 5, respectively. The analog switch Sm controls whether the input voltage Vin is turned on to the high bit sample/hold circuit group 2 and the low bit sample/hold circuit group 5. The fourth conventional ADC architecture combines a two-stage ADC with a sub-range ADC. Its data conversion speed is faster. However, the number of comparators is large, and therefore, the circuit has high complexity, high power complexity, low production yield, and low effective area utilization. A fifth conventional ADC system can be found in U.S. Patent No. 4,994,848. It uses the high-speed conversion features of the flash ADC to increase the conversion speed of the ADC. It uses an SA-ADC to improve the accuracy of the ADC. It combines the advantages of a fast-flash ADC with a SA-ADC to improve the overall performance of the ADC without the need for additional correction circuitry. However, because the residual amplifier needs to be used and the standby ADC is used at high-speed switching frequency, this amplifier will become the design bottleneck of the entire ADC system. SUMMARY OF THE INVENTION The present invention provides an analog-to-digital conversion system that converts an analog input signal into a digital output signal. The analog-to-digital conversion system includes a tracking and holding circuit for tracking and maintaining the tracked input signal; a coarse analog-to-digital converter that converts the output signal of the tracking and holding circuit according to a first reference voltage Into a first digit code, the first 8
L 200828817 ^62950049TW 22487twf.doc/n =:=:=組;-編碼 =㈣於該數位輪_:最:==,,= ΐ:ί:=!;ϊ位碼編碼成-_位碼;::考 器,該參考電壓產二二::壓給該粗類比對數位轉換 _數位碼來產產生生:;:= _連續近似演算法來轉; 信號成該第二數位碼。 κ、保持電路之该輸出 此類比對數位轉換系統更包括:一時序 與保持電路、該粗類比對數位轉換器、該編 對數二該參考電以生器以及該連續近似式類比 當該類比對數位轉換系統之輸入 =該連續近似式類比對數位轉換器包括::二 出該第二數位碼與一第 ;= 舰的數位對類比轉換器,根據 出-第彳5 #u、該第二參考電壓與該第四數位碼,轉換 根據=電壓;—第二取樣/保持數位對類比轉換卜 該第四電路之該輸出信號、該第二參寺電壓與 數位石馬之该2的補數,轉換出一第二類比電壓;以 9 200828817 F62y5UU49TW 22487twf.doc/n 及一比較器,接收該第_盥第二且 對類比轉換11所輪能的數位 以,-輸出信號至該連續近似式暫存器=比電壓’ 生為’该比較器之該輪出信號用於更新、:的補數產 第四數位碼與該第四數位碼之該 數位碼、該 括:一前置放大器,接收該:々補數。該比較器包 的數位對類比轉換器所輪出今第n取樣/保持功能 Γ c, 該比較器之該輸出=。’接收該前置放大器之輪出以蓋生 動信寺,該連統之該輸入信號為全差 根據兮第_ 广、b電壓,一第二數位對類比轉換器, 出—;二2壓與該第四數位碼之該2的補數,轉換 與該追蹤與保持Ϊ路=輸比較該第一類比電壓 電二輸:信=== 之該輪出暫存,該2的補數產生器,該比較器 第赵;更新該第二數位碼、該第四數位碼與該 ίι碼之該2的補數。該比較器包括··—第一前置放 電^ 縱與保持電路之該輪出信號與該第一類比 I 第一刖置放大器,接收該追蹤與保持電路之該輸 10 200828817 P62950049TW 22487twf.doc/n 出信號與該第二類比雷M·一筮 ^ x 第二前置放大器之輪ί二第公力:法器,接收該第—與 二前置放大器之該輪出:以m器,接收該第-與第 乂御出,以及一閂鎖單元,接 第二出以產生該比㈣ 舉較_,下文特 【實施方式】西己口所附圖式,作詳細說明如下。 cL 200828817 ^62950049TW 22487twf.doc/n =:=:= group; -coding = (four) in the digit wheel _: most: ==,, = ΐ: ί:=!; ϊ bit code is encoded into -_ bit code; :: The tester, the reference voltage is generated by two:: Pressing the coarse analog to digital conversion _ digital code to produce a raw:;:= _ continuous approximation algorithm to turn; the signal into the second digital code. κ, the output of the hold circuit, such as the digital-to-digital conversion system further includes: a timing and hold circuit, the coarse analog-to-digital converter, the logarithm of the reference electrical generator, and the continuous approximation analogy when the analogy Input to the digital conversion system = the continuous approximation analog-to-digital converter includes: two out of the second digit code and a first; = ship digital to analog converter, according to out - the third 5 #u, the first The second reference voltage and the fourth digit code are converted according to the = voltage; the second sample/hold digit is analogized to the analog signal, the output signal of the fourth circuit, the second sac voltage and the digitizer The number is converted to a second analog voltage; with 9 200828817 F62y5UU49TW 22487twf.doc/n and a comparator, receiving the first _盥 second and analogizing the number of digits of the 11-bit analogy to - output signal to the continuous approximation The register is = the voltage 'generating', the round-off signal of the comparator is used to update, the complement of the fourth digit code and the digit code of the fourth digit code, the bracket: a preamplifier , receive the: 々 complement. The digits of the comparator packet are rounded up to the current nth sample/hold function Γ c, the output of the comparator =. 'Receiving the wheel of the preamplifier to cover the vivid temple, the input signal of the system is full difference according to 兮 _ 广, b voltage, a second digit to analog converter, out -; 2 2 pressure and The 2's complement of the fourth digit code, and the conversion and the tracking and holding circuit=transmission compare the first analog voltage to the second output: the letter === of the round-out temporary storage, the 2's complement generator The comparator is Zhao; updating the second digit code, the fourth digit code, and the 2's complement of the ί code. The comparator includes: the first pre-discharge transistor 1 and the first analog I first amplifier, receiving the tracking and holding circuit of the input 10 200828817 P62950049TW 22487twf.doc/ n output signal and the second analog mine M · a 筮 ^ x second preamplifier wheel ί ii metric force: the device, receiving the first and second preamplifier of the round: with m, receiving The first-and-third-out, and a latching unit are connected to the second to generate the ratio (4). The following is a detailed description of the embodiment of the Xijikou. c
Lj 每,二*二知例利用一進制連績近似轉換演算法。但該此 與該=====連續近似轉換演算法 Ϊ 一四位元的資料轉換,且採用同步時序二 士圖2所示’傳統二進制連續近似演算法 分佈的時ΐ讀的資料轉換情況,其有關於電荷重新 演算元==應用的二進制⑽ 位疋的貝科轉換分別由粗ADC執行最高有效 11 200828817 P62950049TW 22487twf.doc/n 位元組(MSBs)的資料轉換,而細ADC則執行最低有效位 元組(即MSB-2與LSB)的資料轉換。由於粗ADC採用快 閃式ADC架構,其具有很高速的資料轉換速度,故決定 出MSBs所需的時間ato可以小於2*ΔΤ1。由於細aDC 只負責LSBs的轉換且又採用次範圍技術,所以電荷重新 分佈時間將減少四倍,即。如此,整體資料 • 轉換速度可獲得顯著提昇。 、 • [第一實施例] 凊參考圖3 ’其顯示根據本發明第一實施例的ADC系 統的電路方塊圖。如圖3所示,此ADC系統30包括··追 蹤與保持電路(Track and Hold,T/H)31,粗類比對數位轉 換器(Coarse ADC)32,編碼與暫存單元(dec〇ding and buffering u_33,參考電壓產生器34,SA_ADC35,以及 時序控制單元36。 在追蹤模式時,追蹤與保持電路31會追蹤輸入信號。 # f保持模式時,追蹤與保持電路31會保持所追蹤到的β輸入 U 乜號並傳送給後端的電路(即粗類比對數位轉換器32、 SA-ADC 35以及參考電壓產生器34)。 粗類比對數位轉換裔32接收追蹤與保持電路Μ的輸 出信號,進行高位元的資料轉換以產生數位碼MSBs,並 ' 將數位碼MSBs傳給編碼與暫存單元33。數位碼MSBs有 關於最、冬結果Dout[nres-1 : 〇] (nres為解析度)之最高有效 位元組。粗類比對數位轉換器32所轉出的數位碼麟3 比如為格雷碼(Gray Code)。粗類比對數位轉換器%可利 12 200828817 爾 y,49TW 22487twf.doc/n 用快閃式ADC來實施,且其具有錯誤校正的功能。在本 貝施例中,粗類比對數位轉換器32的架構圖不特別限定, 只要能達到上述功能即可。 編碼與暫存單元33儲存MSBs與LSBs(其由 SA-ADC25所產生)。編碼與暫存單元33可將MSBs(其為 格雷碼)轉換成2MSBs (其為n之!碼(1-〇f_n c〇de)),並將 2MSBs傳送給參考電壓產生器34,以使得參考電壓產生器 34用以產生參考電壓vb(VBrt、VBrb與。N啦 的位元組等於MSBs與LSBs的位元數總和。當SA-ADC 35得到最終的數位碼LSBs時,編碼與暫存單元%可根 據數位碼MSBs與數位碼LSBs來產生最終結果 dout[nres-i : 〇]。在此,數位碼MSBs與LSBs的位元數 未必要相同。 參考電壓產生裔34會產生穩定的參考電壓源 VARB)給粗類比對數位轉換器32。參考電壓產 生态34會根據編碼與暫存單元33所傳來的數位碼(2mSBs) 來產生參考電壓VB給sa_adc 35。#輸人信號為全差動 信號時,參考電壓產生^34甚至會制此追雜保持電路 31的輸出信號的共模電壓(c〇mm〇n M〇de v〇ltage),以確 保參考電壓的精確性。 S^V-ADC 35接收追蹤與保持電路31的輸出信號,利 用連、、、1近似(SA):^异法來進行低位元的資料轉換以產生 LSBs二並將LSBs傳給編碼與暫存單元幻。 口月再-人參考圖2。粗ADC所轉出的MSBs有關於參考 13 200828817 P62950049TW 22487twf.doc/n 電壓VBRt與VBrb(供給SA-ADC)。這兩者間的關係比如 下表。 MSB ^ ' ~---- iYBRT^^B) 11 (VArt,VI) 10 " " -----------——. (VI,V2) 01 00 iYllVARB)Lj Each, two * two examples use a single-digit continuous performance approximation conversion algorithm. But this is the same as the ===== continuous approximation conversion algorithm Ϊ a four-bit data conversion, and the data conversion situation of the time-reading of the distribution of the traditional binary continuous approximation algorithm shown in Figure 2 of the synchronous timing , which has a charge recalculation element == applied binary (10) bit 贝 转换 转换 转换 由 由 由 由 由 粗 粗 粗 粗 粗 粗 粗 粗 粗 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 Data conversion for the least significant byte (ie MSB-2 and LSB). Since the coarse ADC uses a fast ADC architecture and has a very high data conversion speed, the time required to determine the MSBs can be less than 2*ΔΤ1. Since the fine aDC is only responsible for the conversion of the LSBs and the sub-range technique, the charge redistribution time is reduced by a factor of four, ie. In this way, the overall data • conversion speed can be significantly improved. [First Embodiment] Referring to Fig. 3', there is shown a circuit block diagram of an ADC system according to a first embodiment of the present invention. As shown in FIG. 3, the ADC system 30 includes a tracking and holding circuit (Track and Hold, T/H) 31, a coarse analog-to-digital converter (Coarse ADC) 32, and a coding and temporary storage unit (dec〇ding and Buffering u_33, reference voltage generator 34, SA_ADC 35, and timing control unit 36. In the tracking mode, the tracking and holding circuit 31 tracks the input signal. When the f mode is held, the tracking and holding circuit 31 maintains the tracked β. The U 乜 is input and transmitted to the circuit at the back end (ie, the coarse analog-to-digital converter 32, the SA-ADC 35, and the reference voltage generator 34). The coarse analog-to-digital conversion 32 receives the output signal of the tracking and holding circuit , The high-order data is converted to generate the digital code MSBs, and 'the digital code MSBs are passed to the encoding and temporary storage unit 33. The digital code MSBs has the most winter result Dout[nres-1 : 〇] (nres is the resolution) The most significant byte. The digital analog code 3 transferred from the coarse analog to digital converter 32 is, for example, Gray Code. The coarse analog-to-digital converter is available for 12 200828817 y, 49TW 22487twf.doc/n Using a flash ADC And it has a function of error correction. In the present embodiment, the architecture diagram of the coarse analog-to-digital converter 32 is not particularly limited as long as the above functions can be achieved. The encoding and temporary storage unit 33 stores MSBs and LSBs (which Generated by the SA-ADC 25) The encoding and temporary storage unit 33 can convert the MSBs (which are Gray codes) into 2MSBs (which is the n-code (1-〇f_n c〇de)), and transmit the 2MSBs to the reference. The voltage generator 34 is such that the reference voltage generator 34 is used to generate the reference voltage vb (the byte of VBrt, VBrb and .N is equal to the sum of the number of bits of the MSBs and the LSBs. When the SA-ADC 35 obtains the final digit code In LSBs, the encoding and temporary storage unit % can generate the final result dout[nres-i : 〇] according to the digital code MSBs and the digital code LSBs. Here, the number of bits of the digital code MSBs and LSBs is not necessarily the same. 34 generates a stable reference voltage source VARB) to the coarse analog-to-digital converter 32. The reference voltage generation state 34 generates a reference voltage VB to the sa_adc 35 based on the digital code (2 mSBs) transmitted from the encoding and temporary storage unit 33. When the input signal is a fully differential signal, the reference voltage is produced. ^34 even makes the common mode voltage (c〇mm〇n M〇de v〇ltage) of the output signal of the hybrid hold circuit 31 to ensure the accuracy of the reference voltage. S^V-ADC 35 Receive Tracking and Hold The output signal of the circuit 31 is subjected to the data conversion of the low bit by using the singular, (and), 1 approximation (SA): different method to generate the LSBs 2 and pass the LSBs to the coding and temporary storage unit. Mouth month again - people refer to Figure 2. The MSBs transferred from the coarse ADC are related to reference 13 200828817 P62950049TW 22487twf.doc/n Voltages VBRt and VBrb (supply SA-ADC). The relationship between the two is as follows. MSB ^ ' ~---- iYBRT^^B) 11 (VArt,VI) 10 "" -----------——. (VI,V2) 01 00 iYllVARB)
間的差值為固定。 # RT^ RE %序控制單元36產生控制信號,以讓單元31〜35能 夠進行正確的運作。時序控制單元36可以同步或非同步的 日守序控制方式來控制單元31〜35。時序控制單元36接收由 外部所傳來的取樣信號及/或時脈信號。特別是,當以同步 方式控制單元31〜35時,則需要外部時脈信號。當以非同 步方ί控制單70 31〜35時,則不需要外部時脈信號。時序 控制單元36亦負責與外部介面的溝通。 底下將說明圖3之操作原理。在此假設圖3之ADC 之解析度為4位元,而且MSBs與LSBs皆為2位元。請 一起參考圖2與圖3。 :…在八10内,粗類比對數位轉換器32會轉換出MSBs, 假設其為01。故而,參考電壓產生器34會依據MSBs而 產生適合的參考電壓VB給SA_ADC35。接著,在第一個 △T2内’ SA-ADC35會轉換出LSBs的較高位元。在第二 14 200828817 F(D2y^uu49TW 22487twf.doc/n 個ΛΤ2内’SA-ADC35會轉換出LSBs的較低位元。最後, 編碼與暫存單元33會將MSBs與LSBs結合成D0UT。至 此,完成ADC的轉換操作。 [第二實施例] "月參考圖4’其顯示根據本發明第二實施例的ADC系 統的電路方塊圖。如圖4所示,此ADC系統4〇包括:追 蹤與保持電路41,粗類比對數位轉換器42,編碼與暫存單 兀43,參考電壓產生器44,SA-ADC45,以及時序控制單 π 46。時序控制單元46可以非同步方式控制該些單元 41〜45及其内部子電路,故時序控制單元牝可以不需要外 部時脈信號。圖4適用於當輸入信號為全差動輸入信號時。 SA-ADC 45包括:2的補數產生器451,具有取樣保 持功能的數位對類比轉換器(DAC)452與453,比較器 ,以及連續近似暫存器(SAR)457。比較器454包括: 刖置放大器455與閂鎖單元456。比較器454同時具有偏 差調校功能。 U 在數位碼 Code—I 與 Code—II(CodeJI 為 c〇deJ 的 2 的補數)的控制下,DAC 452與453會根據T/H電路41的 輸出信號以及參考電壓VBrb、VBrt,_糾類比電屋 信號Vp與Vn。至於DAC 452與453如何進行轉換可來 - 底下圖式與描述。 - 匈置放大态455放大類比電壓信號Vp與。閂鎖抑 兀456閂鎖前置放大器455的輪出信號成數位輪出传號f 問鎖單元456的數位輸出信號會輸入至連續近似^器 15The difference between the two is fixed. #RT^ RE The sequence control unit 36 generates control signals to enable the units 31 to 35 to operate properly. The timing control unit 36 can control the units 31 to 35 in a synchronous or asynchronous day-to-day control mode. The timing control unit 36 receives the sampling signal and/or the clock signal transmitted from the outside. In particular, when the units 31 to 35 are controlled in a synchronous manner, an external clock signal is required. When the single 70 31 to 35 is controlled by the non-synchronization method, an external clock signal is not required. The timing control unit 36 is also responsible for communicating with the external interface. The principle of operation of Figure 3 will be explained below. It is assumed here that the resolution of the ADC of Figure 3 is 4 bits, and both MSBs and LSBs are 2 bits. Please refer to Figure 2 and Figure 3 together. :... Within eight-10, the coarse analog to digital converter 32 will convert the MSBs, assuming it is 01. Therefore, the reference voltage generator 34 generates a suitable reference voltage VB for the SA_ADC 35 in accordance with the MSBs. Next, within the first ΔT2, the SA-ADC 35 will convert the higher bits of the LSBs. In the second 14 200828817 F (D2y^uu49TW 22487twf.doc/n ΛΤ 2 'SA-ADC35 will convert the lower bits of the LSBs. Finally, the encoding and temporary storage unit 33 will combine the MSBs and the LSBs into the DOUT. The second embodiment of the ADC system is shown in Fig. 4, which shows a circuit block diagram of an ADC system according to a second embodiment of the present invention. As shown in Fig. 4, the ADC system 4 includes: Tracking and holding circuit 41, coarse analog-to-digital converter 42, encoding and temporary storage unit 43, reference voltage generator 44, SA-ADC 45, and timing control unit π 46. Timing control unit 46 can control the units in an asynchronous manner. 41~45 and its internal sub-circuit, so the timing control unit 牝 can not need external clock signal. Figure 4 is suitable when the input signal is fully differential input signal. SA-ADC 45 includes: 2's complement generator 451 A digital-to-analog converter (DAC) 452 and 453 with sample and hold functions, a comparator, and a continuous approximation register (SAR) 457. The comparator 454 includes: a set amplifier 455 and a latch unit 456. Comparator 454 At the same time, it has a deviation adjustment function U. Under the control of the digital code Code-I and Code-II (CodeJI is 2's complement of c〇deJ), the DACs 452 and 453 will be based on the output signal of the T/H circuit 41 and the reference voltages VBrb, VBrt, _. The analogy of the electrical house signals Vp and Vn. As for how the DAC 452 and 453 can be converted - the following figure and description - Hung amplification 455 amplification analog voltage signal Vp and. Latch suppression 456 latch preamplifier 455 The round-out signal is digitally rotated. The digital output signal of the request lock unit 456 is input to the continuous approximation device 15
Ο 200828817 P62950049TW 22487twf.doc/n 457與2的補數產生器451 Η士#靳淤仞满r η 在進仃位70循環(bitcyding) %Γ更新數位碼Code—I與Code II。 連續近似暫存器457的架構在此不需特別限定之。比 如其可為移位暫存器與邏輯電路的組合。 明參考圖5,其顯示圖4之參考電壓產生器44的一部 份,其用於追尋T/Η電路41的輸出信號的共模電壓 VCM—TH參考電壓產生器44的一部份包括··電阻收 與R52 ’放大器51,電流源52與53,以及電阻串%。電 阻串54包括複數個串聯的電阻r。 如圖5所示,電阻R51與R52可用於從丁/H電路4ι 的輸出信號取出其共模電壓VCM_TH。共模電壓VCM TH 輸入至放大器51,放大器51的另一端則連接至另一共模 電壓vacm。放大器51的輸出信號可用於控制電流源52。 透過元件51〜54所建立的負回授機制,將使得共模電壓 vacm追尋共模電壓VCM_TH。 請參考圖6,其顯示數位對類比轉換器452(具取樣/ 保持功能)的示意圖。數位對類比轉換器453的架構相同於 數位對類比轉換器452,差別僅在於b0〜b2的控制碼不同。 如圖6所示,數位對類比轉換器452包括:開關 61〜65 ’以及電容66〜69。本實施例中,電容66〜69的電容 比值為1 : 1 : 2 : 4。 當處於重設模式時,開關61會導通,而且開關62〜65 會連接至共模電壓VBCM。 當處於取樣階段時,開關61會導通,開關62〜65會 16 200828817 P62950049TW 22487twf.doc/n 切換至VO-TH,VOJTH為T/H電路41的輸出電壓。 當處於保持階段時,開關61會不通,開關62切換至 VBrb。開關63〜65會分別根據位元b0、Μ與b2而決定要 切換至VBrb或VBRT。比如,當位元b0為0時,開關63 會切換至VBrb;反之則切換至VBRT。位元b0〜b2為LSBs。 電壓Vp可表示如下··Ο 200828817 P62950049TW 22487twf.doc/n 476 and 2's complement generator 451 Gentleman 靳 靳 仞 r r 在 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 70 Γ Γ Γ Γ Γ The architecture of the continuous approximation register 457 is not particularly limited herein. For example, it can be a combination of a shift register and a logic circuit. Referring to FIG. 5, a portion of the reference voltage generator 44 of FIG. 4 is shown for tracking a portion of the common mode voltage VCM-TH reference voltage generator 44 of the output signal of the T/Η circuit 41. • Resistor receives R52 'amplifier 51, current sources 52 and 53, and resistor string %. Resistor string 54 includes a plurality of resistors r connected in series. As shown in Figure 5, resistors R51 and R52 can be used to extract their common mode voltage VCM_TH from the output signal of the D/H circuit 4i. The common mode voltage VCM TH is input to the amplifier 51, and the other end of the amplifier 51 is connected to another common mode voltage vacm. The output signal of amplifier 51 can be used to control current source 52. The negative feedback mechanism established by elements 51-54 will cause the common mode voltage vacm to pursue the common mode voltage VCM_TH. Please refer to FIG. 6, which shows a schematic diagram of a digital-to-analog converter 452 (with sample/hold function). The structure of the digital-to-analog converter 453 is the same as that of the digital-to-analog converter 452, except that the control codes of b0 to b2 are different. As shown in Fig. 6, the digital-to-analog converter 452 includes switches 61 to 65' and capacitors 66 to 69. In this embodiment, the capacitance ratio of the capacitors 66 to 69 is 1: 1: 2: 4. When in reset mode, switch 61 is turned "on" and switches 62-65 are connected to common mode voltage VBCM. When in the sampling phase, the switch 61 will be turned on, and the switches 62 to 65 will switch to VO-TH, which is the output voltage of the T/H circuit 41, 200828,278, P62950049TW 22487twf.doc/n. When in the hold phase, switch 61 will fail and switch 62 will switch to VBrb. The switches 63 to 65 decide to switch to VBrb or VBRT based on the bits b0, Μ and b2, respectively. For example, when bit b0 is 0, switch 63 will switch to VBrb; otherwise, switch to VBRT. Bits b0 to b2 are LSBs. The voltage Vp can be expressed as follows··
Vp 二 VBcm - VO—TH+ △ V一 MSBs*( 1 /2*b2+1 /4*bl +1 /8*b0 )+VBrb f: ⑴ 在上式(1)中,Δν—MSBs代表VBrt與VBrb的差值。 請參考圖7,其顯示圖4的架構在決定1^68時的一 個例子。根據連續近似演算法,Code_I與Code_II的預設 值皆為1〇〇。 在T1期間,會決定出位元b2。在此假設所決定出的 位元b2為〇。所決定出的位元b2會分別存至SAR 457以 及2的補數產生器451,以更新Code_I與Code_II,使其 分別變成010與110 〇 ij 在T2期間,會決定出位元bl。在丁3斯間,會決定 出位元bo。同樣地,所決定出的位元bl與bo會更新Code_I 與CodeJI,如圖7所示。在T3之後,即可決定出LSBs 的最終值。 • 圖4之架構比如可適用於超寬頻(Ultra-Wide Band ; ’ UWB)無線通訊。 [第三實施例] 晴參考圖8’其顯示根據本發明第三實施例的ADC系 17 200828817 P62950049TW 22487twf.doc/n 統的電路方塊圖。如圖8所示,此ADC系統80包括:追 蹤與保持電路81,粗ADC 82,編碼與暫存單元83,參考 電壓產生器84,SA-ADC85,以及時序控制單元86。時序 控制單元86可以同步方式控制該些單元81〜85及其内部 子電路’故日守序控制早元86需要外部時脈信號與取樣信 號。單元81,82,83,84與86相同或相類似於上述實施 例的元件,故於此不再重述。 SA-ADC 85包括:2的補數產生器851,DAC(不具取 樣/保持功能)852與853,比較器854,與連續近似暫存器 857。比較器854包括:前置放大器855a與855b,加法器 856a與856b,以及閂鎖單元858。比較器854同時具有偏 差調校功能。SA-ADC 85的内部元件的連接關係可參考圖 8而得,於此不再重述。 請參考圖9,其顯示數位對類比轉換器852的示意圖。 數位對類比轉換器853的架構類似或相同於數位對類比轉 換器852。 ' 如圖9所示,數位對類比轉換器852包括:開關 91〜94,以及電容95〜97。本實施例巾,電容95〜97的電容 比值為1 : 2 : 4。 當處於重設模式時,開關91會導通,而且開關92〜94 會連接至共模電壓VBCM。 當進行資料轉換時,開關91會斷路,開關92、93與 94會根據位元b〇、bl與b2而決定要切換至VBRB或VBrT。 比如,當位元b0為〇時,開關83會切換至VBrb ;反之則 18 200828817 P62950U49TW 22487twf.doc/n 切換至VBRT。位元b0〜b2為LSBs。 由圖9的架構可看出,電壓Vp可表示如^ :Vp II VBcm - VO-TH+ Δ V-MSBs*( 1 /2*b2+1 /4*bl +1 /8*b0 )+VBrb f: (1) In the above formula (1), Δν-MSBs represents VBrt and The difference between VBrb. Please refer to FIG. 7, which shows an example of the architecture of FIG. 4 when determining 1^68. According to the continuous approximation algorithm, the preset values of Code_I and Code_II are both 1〇〇. During T1, the bit b2 is determined. It is assumed here that the determined bit b2 is 〇. The determined bit b2 is stored in the SAR 457 and the 2's complement generator 451, respectively, to update Code_I and Code_II to become 010 and 110 〇 ij respectively. During T2, the bit bl is determined. In Ding 3, it will determine the position bo. Similarly, the determined bits bl and bo will update Code_I and CodeJI as shown in FIG. After T3, the final value of the LSBs can be determined. • The architecture of Figure 4 is applicable, for example, to Ultra-Wide Band ('UWB) wireless communications. [Third Embodiment] Fig. 8' is a circuit block diagram showing an ADC system 17 200828817 P62950049TW 22487 twf.doc/n according to a third embodiment of the present invention. As shown in FIG. 8, the ADC system 80 includes a tracking and holding circuit 81, a coarse ADC 82, a code and temporary storage unit 83, a reference voltage generator 84, an SA-ADC 85, and a timing control unit 86. The timing control unit 86 can control the units 81-85 and its internal sub-circuits in a synchronous manner. The day-to-day control of the early element 86 requires an external clock signal and a sample signal. The units 81, 82, 83, 84 and 86 are identical or similar to those of the above-described embodiments and will not be repeated here. The SA-ADC 85 includes: a 2's complement generator 851, a DAC (with no sample/hold function) 852 and 853, a comparator 854, and a continuous approximation register 857. The comparator 854 includes preamplifiers 855a and 855b, adders 856a and 856b, and a latch unit 858. The comparator 854 also has a bias adjustment function. The connection relationship of the internal components of the SA-ADC 85 can be referred to FIG. 8, and will not be repeated here. Please refer to FIG. 9, which shows a schematic diagram of a digital to analog converter 852. The digital to analog converter 853 architecture is similar or identical to the digital to analog converter 852. As shown in Fig. 9, the digital-to-analog converter 852 includes switches 91 to 94, and capacitors 95 to 97. In this embodiment, the capacitance ratio of the capacitors 95 to 97 is 1:2:4. When in reset mode, switch 91 is turned "on" and switches 92-94 are connected to common mode voltage VBCM. When data is converted, switch 91 is opened and switches 92, 93 and 94 are determined to switch to VBRB or VBrT based on bits b, bl and b2. For example, when bit b0 is 〇, switch 83 switches to VBrb; otherwise 18 200828817 P62950U49TW 22487twf.doc/n switches to VBRT. Bits b0 to b2 are LSBs. As can be seen from the architecture of Figure 9, the voltage Vp can be expressed as ^:
Vp=z\V—MSBs*(l/2*b2+l/4*bl + l/8*bO)+VBRB (2) 在上述實施例中,可獲得降低ADC電路消耗功率以 及知:幵資料轉換速度等兩項特點。其原因在於,以傳統雙 階式ADC架構為例,粗ADC比較器的需求量為(2 MSBS-i); 而細ADC比較器的需求量為。但在本實施例中,’ ADC内部比較器需求量僅a 2職,故而達到降低電路複 雜度與功率消耗的目的。此外,由於比較器的需求量減少, 故追縱與保持電路的負載電容量可被減少。且 ;==ADC内部的DAC的解析度降低,故縮短 电可重新刀佈%間,進而提昇ADC資料轉換速度。 容易於輪人等效電容值的降低,故而可採用 奋,達成佈局匹配且精確度較佳的Vp=z\V—MSBs*(l/2*b2+l/4*bl + l/8*bO)+VBRB (2) In the above embodiment, it is possible to reduce the power consumption of the ADC circuit and to know: Two characteristics such as conversion speed. The reason is that, in the case of the traditional two-stage ADC architecture, the demand for the coarse ADC comparator is (2 MSBS-i); and the demand for the fine ADC comparator is. However, in this embodiment, the demand for the internal comparator of the ADC is only a 2, so that the purpose of reducing circuit complexity and power consumption is achieved. In addition, since the demand for the comparator is reduced, the load capacitance of the tracking and holding circuit can be reduced. And ;==The resolution of the DAC inside the ADC is reduced, so the number of re-knifes can be shortened, and the ADC data conversion speed is improved. It is easy to reduce the equivalent capacitance of the wheel, so it can be used to achieve layout matching and better accuracy.
ScalmgPAC 架構(如圖 6 與圖 9)。 -式(ChargeScalmgPAC architecture (Figure 6 and Figure 9). -style (Charge
L 功率可達到中ΐ速取樣頻率、低 與面積有效使用率。”又卩達到提升晶片製作良率 限定發施例揭露如上,然其並非用以 脫離本發明之精神,術領域中具有通常知識者,在不 因此本發明之保當可作些許之更動與潤飾, 為準。 保當視彳細之申請專利範騎界定者L power can reach medium idle sampling frequency, low and area effective usage.卩 卩 提升 提升 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片, whichever is the best.
【圖式簡單說明J 19 200828817 ru,^u.49TW 22487twf.doc/n 圖 顯示美國專利US5247301的代表圖。 ㈣ΐ2難傳統二進制賴近似轉軸算法_型-進 制連績近似演算法之示意圖。 進 方塊=。3顯示根據本發明第一實施例的ADC系統的電路 ADC系統的電路 圖4顯示根據本發明第二實施例的 方塊圖。[Simple diagram of the drawing J 19 200828817 ru, ^u. 49TW 22487twf.doc/n Figure shows a representative diagram of US Pat. No. 5,247,301. (4) ΐ 2 difficult traditional binary Lai approximation of the axis algorithm _ type - the schematic diagram of the continuous performance approximation algorithm. Into the box =. 3 shows the circuit of the ADC system of the ADC system according to the first embodiment of the present invention. Fig. 4 is a block diagram showing the second embodiment of the present invention.
圖5顯示圖4之參考電壓產生器如何追尋追尋t/h 路的輪出信號的共模電壓。Figure 5 shows how the reference voltage generator of Figure 4 traces the common mode voltage of the round-trip signal of the t/h path.
f 6顯示圖4之數位義比轉換器(具取樣/保持功 的不意圖 圖7顯示圖4的架構在決定LSBs時的一個例子。 圖8顯示根據本發明第三實施例的ADC系統的電 方塊圖。 圖9顯示圖8 能)的示意圖。 之數位對類比轉換器(不具取樣/保持功f 6 shows the digital ratio converter of Fig. 4 (not intended for sampling/holding function. Fig. 7 shows an example of the architecture of Fig. 4 when determining LSBs. Fig. 8 shows the power of the ADC system according to the third embodiment of the present invention. Block diagram Figure 9 shows a schematic diagram of Figure 8. Digital to analog converter (without sampling/holding function)
【主要元件符號說明】 1 :高位元比較器組 2 :高位元取樣/保持電路組 3:高位元編碼器 4:低位元比較器組 5 ·低位元取樣/保持電路組 6:低位元編碼器 7:參考電壓產生器 20 200828817 P62950049TW 22487twf.doc/n 8:控制信號產生器 9 :緩衝器 Sm :類比開關 1- 1〜Ι-m :比較器 2- 1〜2-m ·取樣/保持電路 S2、S21 :開關[Main component symbol description] 1: High bit comparator group 2: High bit sample/hold circuit group 3: High bit encoder 4: Low bit comparator group 5 Low bit sample/hold circuit group 6: Low bit encoder 7: Reference voltage generator 20 200828817 P62950049TW 22487twf.doc/n 8: Control signal generator 9: Buffer Sm: Analog switch 1- 1 to Ι-m: Comparator 2- 1 to 2-m · Sample/hold circuit S2, S21: switch
Ci :電容 4- 1〜4-n :比較器 5- 1〜5-n :取樣/保持電路 S5、S51 :開關 30 : ADC系統 31 :追蹤與保持電路 32 :粗類比對數位轉換器 33 :編碼與暫存單元 34 :參考電壓產生器 35 ··連續近似類比對數位轉換器(SA-ADC) 36 :時序控制單元 40 : ADC系統 41 :追蹤與保持電路 42 :粗類比對數位轉換器 43 :編碼與暫存早元 44 :參考電壓產生器 45 :連續近似類比對數位轉換器(SA-ADC) 46 :時序控制單元 21 200828817 P62950049TW 22487twf.doc/n 451 : 2的補數產生器 452、453 :具取樣與保持功能的數位對類比轉換器 454 比較器 455 前置放大器 456 閂鎖單元 457 連續近似暫存器(SAR) R51〜R52 :電阻 51 :放大器 52與53 :電流源 54 :電阻串 61〜65 :開關 66〜69 :電容 80 : ADC系統 81 :追蹤與保持電路Ci: Capacitor 4- 1 to 4-n: Comparator 5- 1 to 5-n: Sample/hold circuit S5, S51: Switch 30: ADC system 31: Tracking and holding circuit 32: Rough analog-to-digital converter 33: Encoding and temporary storage unit 34: reference voltage generator 35 · Continuous Approximate Analog-to-Digital Converter (SA-ADC) 36: Timing Control Unit 40: ADC System 41: Tracking and Holding Circuit 42: Rough Analog-to-Digital Converter 43 : Code and Temporary Early Element 44: Reference Voltage Generator 45: Continuous Approximate Analog-to-Pixel Converter (SA-ADC) 46: Timing Control Unit 21 200828817 P62950049TW 22487twf.doc/n 451: 2's Complement Generator 452, 453: Digital to analog converter with sample and hold function 454 Comparator 455 Preamplifier 456 Latch unit 457 Continuous approximation register (SAR) R51~R52: Resistor 51: Amplifiers 52 and 53: Current source 54: Resistor String 61~65: Switch 66~69: Capacitor 80: ADC System 81: Tracking and Holding Circuit
82 ··粗 ADC 83 :編碼與暫存單元 84 :參考電壓產生器 85 :連續近似類比對數位轉換器(SA-ADC) 86 :時序控制單元 851 : 2的補數產生器 852與853 ··數位對類比轉換器(DAC) 854 :比較器 855a與855b :前置放大器 856a與856b ··加法器 22 200828817 P62950049TW 22487twf.doc/n 857 :連續近似暫存器(SAR) 858 :閂鎖單元 91〜94 :開關 95〜97 :電容 2382 ··Cold ADC 83: Encoding and temporary storage unit 84: Reference voltage generator 85: Continuous approximate analog-to-digital converter (SA-ADC) 86: Timing control unit 851: 2's complement generator 852 and 853 ·· Digital to analog converter (DAC) 854: comparators 855a and 855b: preamplifiers 856a and 856b · Adder 22 200828817 P62950049TW 22487twf.doc/n 857 : Continuous approximation register (SAR) 858: Latch unit 91 ~94: Switch 95~97: Capacitor 23
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI382669B (en) * | 2009-07-16 | 2013-01-11 | Ralink Technology Corp | Comparator for a pipelined analog to digital converter and related signal sampling method |
| US10180693B1 (en) | 2017-10-05 | 2019-01-15 | Nuvoton Technology Corporation | Processing circuit and method thereof |
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| KR101615400B1 (en) * | 2009-12-09 | 2016-04-25 | 트라이젠스 세미컨덕터 가부시키가이샤 | Selection device |
| US8248290B2 (en) * | 2010-09-13 | 2012-08-21 | Texas Instruments Incorporated | Multiplexed amplifier with reduced glitching |
| TWI489237B (en) * | 2012-11-16 | 2015-06-21 | Ind Tech Res Inst | Real-time sampling device and method thereof |
| JP2016111677A (en) * | 2014-09-26 | 2016-06-20 | 株式会社半導体エネルギー研究所 | Semiconductor device, wireless sensor and electronic device |
| CN108665930B (en) * | 2017-04-01 | 2024-11-26 | 兆易创新科技集团股份有限公司 | A NAND flash memory chip |
| US10541704B2 (en) * | 2018-04-03 | 2020-01-21 | Mediatek Inc. | Pipelined analog-to-digital converter |
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| US6340943B1 (en) * | 2000-01-14 | 2002-01-22 | Ati International Srl | Analog to digital converter method and apparatus |
| US6608580B2 (en) * | 2001-02-15 | 2003-08-19 | Sarnoff Corporation | Differential analog-to-digital converter |
| US6828927B1 (en) * | 2002-11-22 | 2004-12-07 | Analog Devices, Inc. | Successive approximation analog-to-digital converter with pre-loaded SAR registers |
| CN100576748C (en) * | 2003-01-17 | 2009-12-30 | Nxp股份有限公司 | Analog-to-digital conversion device, analog-to-digital conversion method, and signal processing system using the conversion device |
| FR2863120B1 (en) * | 2003-12-02 | 2006-02-17 | Atmel Grenoble Sa | FAST ANALOG-TO-DIGITAL CONVERTER |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| TWI382669B (en) * | 2009-07-16 | 2013-01-11 | Ralink Technology Corp | Comparator for a pipelined analog to digital converter and related signal sampling method |
| US10180693B1 (en) | 2017-10-05 | 2019-01-15 | Nuvoton Technology Corporation | Processing circuit and method thereof |
| CN109613950A (en) * | 2017-10-05 | 2019-04-12 | 新唐科技股份有限公司 | Processing circuit |
| TWI677777B (en) * | 2017-10-05 | 2019-11-21 | 新唐科技股份有限公司 | Processing circuit |
| CN109613950B (en) * | 2017-10-05 | 2020-12-01 | 新唐科技股份有限公司 | processing circuit |
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| TWI333335B (en) | 2010-11-11 |
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