TW200824032A - Customer tray and electronic component testing apparatus - Google Patents
Customer tray and electronic component testing apparatus Download PDFInfo
- Publication number
- TW200824032A TW200824032A TW096134819A TW96134819A TW200824032A TW 200824032 A TW200824032 A TW 200824032A TW 096134819 A TW096134819 A TW 096134819A TW 96134819 A TW96134819 A TW 96134819A TW 200824032 A TW200824032 A TW 200824032A
- Authority
- TW
- Taiwan
- Prior art keywords
- tray
- electronic component
- tested
- test
- custom
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims description 164
- 230000033001 locomotion Effects 0.000 claims abstract description 10
- 238000005259 measurement Methods 0.000 claims description 10
- 230000008646 thermal stress Effects 0.000 claims description 10
- 101000958041 Homo sapiens Musculin Proteins 0.000 claims 1
- 206010036790 Productive cough Diseases 0.000 claims 1
- 102000046949 human MSC Human genes 0.000 claims 1
- 210000003802 sputum Anatomy 0.000 claims 1
- 208000024794 sputum Diseases 0.000 claims 1
- 210000000078 claw Anatomy 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- FFBHFFJDDLITSX-UHFFFAOYSA-N benzyl N-[2-hydroxy-4-(3-oxomorpholin-4-yl)phenyl]carbamate Chemical compound OC1=C(NC(=O)OCC2=CC=CC=C2)C=CC(=C1)N1CCOCC1=O FFBHFFJDDLITSX-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000010977 jade Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035935 pregnancy Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2006/321491 WO2008050443A1 (fr) | 2006-10-27 | 2006-10-27 | Plateau client et appareil de test de composant électronique |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200824032A true TW200824032A (en) | 2008-06-01 |
Family
ID=39324257
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096134819A TW200824032A (en) | 2006-10-27 | 2007-09-19 | Customer tray and electronic component testing apparatus |
Country Status (2)
| Country | Link |
|---|---|
| TW (1) | TW200824032A (fr) |
| WO (1) | WO2008050443A1 (fr) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI414802B (fr) * | 2010-07-30 | 2013-11-11 | ||
| TWI418437B (zh) * | 2011-02-08 | 2013-12-11 | Cal Comp Optical Electronics Suzhou Co Ltd | 拆裝設備 |
| TWI470246B (zh) * | 2012-03-16 | 2015-01-21 | Tech Wing Co Ltd | 測試分選機 |
| TWI722680B (zh) * | 2018-11-27 | 2021-03-21 | 日商日本發條股份有限公司 | 探針單元 |
| US20220342785A1 (en) * | 2017-02-10 | 2022-10-27 | Optofidelity Oy | Method, an all-in-one tester and computer program product |
| TWI807327B (zh) * | 2020-05-25 | 2023-07-01 | 南韓商泰克元有限公司 | 測試處理器及其控制方法 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013137286A (ja) * | 2011-12-28 | 2013-07-11 | Advantest Corp | 電子部品試験装置 |
| JP7487076B2 (ja) * | 2020-11-17 | 2024-05-20 | 株式会社Ｎｓテクノロジーズ | デバイス搬送装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000111612A (ja) * | 1998-10-01 | 2000-04-21 | Advantest Corp | トレイ収納用ホルダ |
| JP4222442B2 (ja) * | 1999-07-16 | 2009-02-12 | 株式会社アドバンテスト | 電子部品試験装置用インサート |
| JP2001124825A (ja) * | 1999-10-28 | 2001-05-11 | Ando Electric Co Ltd | オートハンドラ用ハンド |
-
2006
- 2006-10-27 WO PCT/JP2006/321491 patent/WO2008050443A1/fr not_active Ceased
-
2007
- 2007-09-19 TW TW096134819A patent/TW200824032A/zh unknown
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI414802B (fr) * | 2010-07-30 | 2013-11-11 | ||
| TWI418437B (zh) * | 2011-02-08 | 2013-12-11 | Cal Comp Optical Electronics Suzhou Co Ltd | 拆裝設備 |
| TWI470246B (zh) * | 2012-03-16 | 2015-01-21 | Tech Wing Co Ltd | 測試分選機 |
| US20220342785A1 (en) * | 2017-02-10 | 2022-10-27 | Optofidelity Oy | Method, an all-in-one tester and computer program product |
| US12332756B2 (en) * | 2017-02-10 | 2025-06-17 | Optofidelity Oy | Method, an all-in-one tester and computer program product |
| TWI722680B (zh) * | 2018-11-27 | 2021-03-21 | 日商日本發條股份有限公司 | 探針單元 |
| TWI807327B (zh) * | 2020-05-25 | 2023-07-01 | 南韓商泰克元有限公司 | 測試處理器及其控制方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008050443A1 (fr) | 2008-05-02 |
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