200819824 • 九、發明說明： 【發明所屬之技術領域】 本發明係關於-種液晶顯示面板及測試其之探 =種:於降低測試成本及重複測試液晶顯示二之^ 5 日日纟、、員不面板及測試其之探針。 【先前技術】 -般在製作液晶顯示器的前段過程中，係使用蟲晶的 方法在-基板上形成數百萬顆的薄膜電晶 ： 丨。元’然而，若有部分之薄膜電晶體在製作時品質不=早 導致無法表現出其開關控制特性，則會產生如亮點及暗點 的缺陷，大幅的降低液晶顯示器的品質。因此，必須^效 率的對薄膜電晶體進行測試，以維持液晶顯示器的品質。 請參考圖1，係為習知之液晶顯示器測試線路示意圖。 15在液晶顯示器的基板上包含了複數條資料線"、複數條閉 極^12、兩個資料短路桿13以及兩個閘極短路桿14。此兩 们為料短路桿13係分別連接至奇數條的資料線丨1丨及偶數 條的貧料線112 ’而兩個閘極短路桿14係分別連接至奇數條 的間極線121及偶數條的閘極線122，最後’將資料短路桿 2〇 13以及閘極短路桿14之一端分別連接至相對應之測試墊 15，16，以供測試裝置之探測端接觸進行測試。此種方式係 為2D2G(即兩條資料線11以及兩極閘極線作測試12)之測試 線路。當進行測試時，測試裝置可藉由複數個探測端與相 對應之測試墊15，16相接觸後，將測試訊號經由資料短路桿 5 200819824 .13以及閘極短路桿14送人料之複數個薄膜電晶體中以進 行測試。在此測試方法由於任相鄰之兩條資料線11或是問 極線12均沒有連接至相同的短路桿。因此，當任相鄰之兩 條貧料線11或是閘極線12在製作上便已短路，可將此製造 5 瑕疵測試出來。 又，另一種習知液晶顯示器測試線路，請參考圖2，同 樣地在液晶顯示器的基板上包含了複數條資料線u、複數 條閘極線12、三個資料短路桿17以及兩個問極短路桿14。 三個資料短路桿η分別連接至如+1、h+M3·3之資料 10線113，114，115 ’其中m為零或正整數。而兩個問極短路桿 14係分別連接至奇數條之閘極線(2 i及偶數條之閘極線 122。最後將資料短路桿17以及閘極短路糾—端分別連接 至相對應之測試墊18，16，此種方式係為3D2G(即三條資料 線11以及兩極閘極線作職丨2)之測試、㈣。當進行測試 15時，測試裝置藉由複數個探測端與相對應之測試塾16，叫目 接觸後，將測試訊號經由資料短路桿17以及間極短路⑷旱 送入特定之薄膜電晶體中以進行測試。此測試方式將資料 線分類成與基本原色（紅色、綠色、藍色）相對應，經由特定 之資料短路桿輸入測試訊號後輸出特定的基本原色。 泊 ’然而，無論是圖lt2D2G或是圖2中3咖的測試線路 方式’均無法有效的同時提升液晶顯示器製作時陣列段 (Array)及晶胞段（CeU)的測試效率。此外，在線路判嘩+之 後均會將短路桿，亦即資料短路桿及閉極短路桿切斷，此 種方式在短路桿切斷之後無法再重新測試。即當要在液晶 6 200819824 ’無法重新測試線路是否短 顯示器產品的品質。 顯示器模組段之前要作測試時 路。因此，無法完全確保液晶 【發明内容】 有鑑於習知之缺 板，包括：一第一基板、一第二基板 本發明係提供一種液晶顯示面 液晶層、複數個 /百、固 15 旦素、複數條訊號線、複數個測試墊。第二基板係具有一 顯示區及一週邊線路區，而顯示區係對應於第一基板，週 邊線路區係位於該顯示區周圍。液晶層係位於該第一基板 及該第二基板之間。複數個晝素係形成於該第二基板^ 顯示區内。複數條訊號線係電性連接至該等畫素。複數個 測试塾係形成於該第二基板之該週邊線路區内並對應電性 連接至該等訊號線’該等測試塾間係以錯位排列之式形 成，並以!!個測試墊作-循環排列，分成㈣測試墊群:每 一測試墊群之該些測試墊係平行排列配置，其中，n係為 於等於2之正整數。 ” ' 本發明之液晶顯示面板，其中，n個測試墊係可包括沿 訊號線的垂直方向作循環排列。又，此等訊號線包括複： 條貧料線、複數條閘極線或共同電極線。此外，測試墊可 20電性連接至該複數條資料線。而此等測試塾中較佳地係可 包括以η=2為一循環排列或者是以㈣為一循環排列。再 者，此等測試墊係較佳可為一導電材料。較佳地，測試塾 的材質可與晝素的材質相同。 在本發明中第一基板係可為一料濾光基板，而第二 200819824 基板係可為一薄膜電晶體基板。… 在本發明中的測試墊係可與—測試土觸6玄寻測試 液晶顯示面板。其中，該：妾觸’以測試該 一軟性+踗柘、置係可包括一薄膜探針或 墊，此福數個；^、目彡 寻判忒衣置可包括複數個感測 墊此稷數個感測墊係可分別對應位 路區的賴㈣形成__群。 板上週邊線 由别述可知’本發明可审& 夕、目丨卜+十〃 Tm種賴液日日日顯示面板 之測试採針，用於測試一液 τ /夜日日顯不面板，該液晶顯示面板 具有禝數個測試墊群，至少向一 ^ 及複數個感測墊。複數個導後 ，、稷數個導線以 ^ 禝數们一線係位於該薄材内或 之表面，且該等導線間不 一、、弘性連接，该些導線電性連接至 驅動㈣。而複數個感測墊係位於該薄材之一側並 电性連接該等導線，且該些感測墊個別對應電性連接至1 液晶顯不面板之該些測試墊群。 人 15 本發明中測試液晶顯示面板的探針，其中，部 其感測塾係不限呈現何種形狀，只要可與液晶顯示 面板中的測試墊接觸即可，例如可呈現— 字型等形狀。 飞疋 “由前述可知，本發明經由在第二基板中的週邊線路區 ^測^墊的配置’可同時提供短路桿（如啊b㈣或是使測 口式的居彳木針中之感測墊完全接觸（比丨1⑶兩種測試方 當短路桿測試線路被切斷後，仍然可以在完成晶胞_) 段^後測#。在作測試時可針對奇數線路或偶數線路進行 測试，也可以針對不同區域的線路組進行獨立測試。本發 20 200819824 明係降低了測試成本 質。 同日守也提南了液晶顯示器產品的品 【實施方式】 以下係藉由特定的呈雜每> 一 的一體貝施例說明本發明之實施方 二1、白此技蟄之人士可由本說明書所揭示之内容輕易地 了解本發明之其他優點與功效。本發明亦可藉由其他不同 的具體實施例加以施行或應用’本說明書中的各項細節亦 10 15 可基於不同觀點與應用’在不棒離本發明之精神下進行各 種修飾與變更。 本發明之實施例中該等圖式均為簡化之示意圖。惟該 等圖式僅顯示與本發明有關之元件，其所顯示之元件非為 實際實施時之態樣’其實際實施時之元件數目、形狀等比 例為選擇性之設計，且其元件佈局型態可能更複雜。 實施例1 睛參考圖3，係為本發明之一液晶顯示面板2〇簡單示意 圖。其具有一彩色濾光基板21、一薄膜電晶體基板22以及 一液晶層23。其中，液晶層23係位於彩色濾光基板21及薄 膜電晶體基板22之間且液晶層23的外側具有一止膠層24。 20 而本實施例中薄膜電晶體基板22的結構，請參考圖4，係為 依據本發明之一種液晶顯示面板20之薄膜電晶體基板22示 意圖。此薄膜電晶體基板22具有一顯示區221及一週邊線路 區222，該顯示區221係對應於一如圖3所示之彩色濾光基板 21，該週邊線路區222係位於該顯示區221周圍。又在薄膜 9 200819824 電晶體基板22的顯示區221内形成複數個晝素31。此外具有 複數條可作為訊號線的資料線32以及閘極線33電性連接至 晝素3 1中。 10 15 接著，請參考圖5A係為圖3之液晶顯示面板2〇俯視圖且 係為薄膜電晶體基板22週邊線路區222放大示意圖。以 G…構為例，在溥膜電晶體基板μ的週邊線路區a]〗 中，係具有複數個測試墊34並對應電性連接至該等訊號 線，即資料線32或是閘極線33。此等測試墊34間係以兩兩 錯位排列之方式形成，可分成2組測試墊群341，342,每一測 j墊群341，342間之測試墊34a，34b係平行排列配置。此種測 试墊34間係以兩兩錯位排列之方式可先應用短路桿％，即 與訊號線連接的短路桿％經由短路測試墊36以2咖(即分 可對應連接至如圖4所不之資料線32及閘極線33)的線路 贼方式測試，如圖5A所示。在測試完之後，即將與短路 杯35連接的訊號線以磨斷或以雷射的方式切斷，如圖顺 「上、在此之後’在製作液晶顯示器的後續製程時，則此等 象式方式不會再針對液晶顯示面板如作測試。 &另外在本，施例中亦提供—種測試此種液晶顯示面 = 此探針在本實施例係為-軟性電路板· 探針。請參考圖6 ’係為本實施例中軟性電路 板4014液晶顯不面板2〇的 ^ 毛r生運接不思圖。茲將軟性電路 板40兵週邊線路區222接觸的 祐如尨命、六Η θ Λ又欲穴木看，此軟性電路 板40係”液日日顯不面板2 ;，寻胰弘日日體基板22的週邊線路 ㈣接觸。關於本實施例之探針，請參考圖7，其至少包 20 200819824 -括：薄材41、複數個導線421，422,423以及複數個感測墊 431，432,433。此等導線4：21，422,423係位於薄材41内或是薄 材41之表面，且導線421，422,423間不電性連接，這些導線 421，422,423電性連接至一測試驅動電路（圖未示）。感測墊 5 431，432,433則位於薄材41之一側並分別電性連接導線 421，422,423 ’且請再參考圖6，此等感測墊431，432個別對 應電性連接至液晶顯示面板2〇之測試墊群341，342。 本實施例如圖7所示之的導線421與其感測墊43 1呈現 一 T型，其係與本實施例中液晶顯示面板2〇的奇數個排列的 10測試墊群341電性連接。而與其感測墊432呈現一 L型的導線 422則與偶數個測試墊群342電性連接。而與其感測墊433呈 現一 一字型的導線423則與其中一測試墊34電性連接，此測 試墊34c則電性連接至液晶顯示面板2〇中的一訊號線。又， 此訊號線係為液晶顯示面板2〇中的共同電極線（圖未示），此 15共同電極線係連接薄膜電晶體基板22以及彩色濾光基板 21。因此，由前述可知，本實施例可依此探針偵測液晶顯 示面板20的薄膜電晶體是否有短路的現象。 又，可依此探針，請參考圖8，作一種2D2G的測試。 以測試Μ裝置電性連結測試探狀另1，以電路板叫 2〇為例，在電路板90的Χ轴方向，包括了如圖6所示之一條連 接薄膜電晶體基板22中週邊線路區222之奇數個排列的測 试塾群341之導線421、一條連接薄膜電晶體基板^中週邊 線路區222之偶數個排列的測試墊群342之導線a]以及一 條與連接至液晶顯示面板2〇中共同電極線之測試塾仏之 11 200819824 • 導線423,而在X軸方向的測試墊34則電性連接至薄膜電晶 體基板22的資料線32(如圖4所示）或共同電極線（圖未示）曰。曰 同樣地，在電路板的γ轴方向則包括了 —條連接薄膜電晶體 基板22中週邊線路區222之奇數個排列的測試墊群％丨之導 5線421以及一條連接薄膜電晶體基板22中週邊線路區222之 偶數個排列的測試墊群342之導線422。此時，γ轴方向的測 試墊3 4則f性連接至賴電晶體基板2 2的閘極線3 3 (如圖* 所示），並且探針中的導線421，422可與其感測墊们i 432妒 成兩個L型。最後，經由信號輸入至電路板9〇中之信號輸二 10墊91 ’可測試出液晶顯示面板中的薄膜電晶體是否短路。 在本實施例中，經過探針的測試之後，可在薄膜電晶 體基板22中之週邊線路區222的測試塾犯與複數個半導 體晶片連接，再繼續後續的製程，以完成液晶顯示器的组 裝。 、、 15 實施例2 本實施例係與實施例1大致上相同，但不同的是，請參 考圖9A ’此等測試墊5〇中本身係可分為第一測試塾51及第 二測試塾52’第-測試墊51係以錯位排列之方式形成，並 以3個第—測試塾51作—循環排列，分成3組測試墊群，亦 2〇即以第卜4、7…等測試墊作為第一組測試墊群511，以第2、 $ 8…等測4墊作為第二組測試塾群，以第3、6、9... 等測試塾作為第三組測試墊群513，每—測試塾群之測試塾 係平行排列配置。此外’此三組的測試塾群（第一組測試 墊群511、第二組測試塾群5!2及第三組測試塾群513)係可 12 200819824 •分別測試如圖3所示之彩色濾光基板21的基本原色，即紅 (R)、綠（G)、藍（B)。測試墊5〇中的第二測試塾52則兩兩互 相交錯著排列。 隨著薄膜電晶體基板22上的測試墊5〇的排列不同。因 5此’再請參考圖9B’本實施例的探針材料亦與實施例呀料 相同，然本實施例中探針，即軟性電路板4〇(或薄膜探針） 中導線423,424,425,426與感測塾433,434,435,436所呈現的 ⑽亦隨之改變。本實施例中與薄膜電晶體基板22中第一 測試墊51中之第—組測試墊群511電性連接的導線424及其 10感測墊434則呈現T型的形狀，其係可測試藍色（B)。另，與 薄膜電晶體基板22中第-測試墊51中之第二組測試塾群 5U電性連接的導線425及其感測墊435則呈現L型的形狀， 其係可測試綠色⑼。此外，與薄膜電晶體基板22中第一測 4墊51中之第三組測試墊群513電性連接的導線及其感 15測墊436亦可呈現1^^的形狀，其係可測試紅色（R)。再者' 與實施例1相同的導線423及其感測墊433可呈現一字型，此 ϋ #式則電性連接至液晶顯示面板中的-作為共同電極線的 訊號線。 本實施例同樣與實施例丨相同，利用電路板進行測試， 20請同時參考圖9及圖10，係為做一種3D2G的測試方式，在 電路板90的X軸方向，包括了一條連接薄 ^邊線路區222之第-測試墊51的第一組測試塾;^之 i線424 條連接薄膜笔晶體基板22中週邊線路區222之 第一測試墊51的第二組測試墊群512之導線425、一條連接 13 200819824 -薄膜電晶體基板22中週邊線路區222之第一測試墊5 1的第 一組測试墊群513之導線426以及一條與連接至液晶顯示面 板20中共同電極線之測試墊5〇之導線423。本實施例在電路 板90的Y轴方向則與實施例丨相同。本實施例經由信號輸入 5至電路板90中之信號輸入墊91，可測試出液晶顯示面板中 的薄膜電晶體是否短路。其餘部分則與實施例丨相同。 實施例3 本實施例係與實施例丨大致上相同，但不同的是，請參 考圖11A，本實施例的測試墊6〇中係以兩兩錯位排列之方式 10形成，並可分為2組測試墊群601，602。而測試墊60本身又可 分為第一測試墊61及第二測試墊62，而第一測試墊61係以 錯位排列之方式形成且每一測試墊群6〇丨，6〇2中之第一測試 墊61係平行排列配置。每一測試墊群6〇1，6〇2中第二測試墊 62則互相平行排列。 15 而測試本實施例中液晶顯示面板的探針（如圖11B所示） 以及利用電路板將信號輸入的方式則與實施例丨相同。此 外，在測試完後的測試墊6〇係可與一薄膜連接，再繼續後 續的製程，以完成液晶顯示器的組裝。 實施例4 20 本實施例係與實施例2大致相同，但不同的是，請參考 圖^，本實施例的測試墊7〇，其本身中的第一測試墊^係 與實施例2相同之方式排列，而每一第二測試墊72則皆互相 平行排列，大致上而言，本實施例的測試墊係以3個第一測 試塾群71作一循環排列，而可分成3組測試墊群 200819824 . 701，702,703。 另外’本實施例中測試液晶顯示面板的探針其排列方式 則可如實施例2相同。而與探針連接的電路板亦與實施例2 相同。 5 實施例5〜10 實施例5〜10係可依照實施例丨〜4中的測試墊之排列方 式，而製作出如圖13A所示之2D4G(實施例5)、如圖13B所 示之3D4G(貫施例6)、如圖13C所示之4D2G(實施例7)、如 圖13D所示之4D4G(實施例8)、如圖13E所示之6D2G(實施例 10 9)以及如圖13F所示之6D4G(實施例10)等測試。熟習此技藝 者，可據上作等效的變化與擴增，並不因此而限制本發^ 之實施方式。 、、，不上所述’本發明所提供的液晶顯示面板以及測試此種 液晶顯示面板的探針，係降低了測試成本。並且，在液晶 15顯示面板上的線路可局部在基板、電路板及軟性電路^ 上，取代了習知原來面板上的線路。此外，本發明亦提升 了液晶顯示器的品質。 上述實施例僅係為了方便說明而舉例而已，本發明所 主張之權利範圍自應以申請專利範圍所述為準，而非僅限 20 於上述實施例。 【圖式簡單說明】 圖1係習知之液晶顯示器測試線路示意圖。 圖2係另白知之液晶顯示器測試線路示意圖。 15 200819824 圖係本考x明車父佳實施例之液晶顯示面板剖視圖。 圖4係本發明—較佳實施例之薄膜電晶體基板示意圖。 圖5係本發明—較佳實施例之薄膜電晶體基板上週邊 線路區不意圖。 _圖6係本發明—較佳實施例之液晶顯示面板與探針接 觸不意圖。 圖7係本發明—較佳實施例之測試液晶顯示面板之探 針示意圖。 木 圖8係本發明—較佳實施例之以電路板測試液晶顯示 10 面板示意圖。 、圖9係本發明另—較佳實施例之薄膜電晶體基板上週 邊線路區及與其接觸之探針接觸示意圖。 圖10係本發明_較佳實施例之以電路板測試液晶顯示 面板示意圖。 Μ、® U係本發明另—較佳實施例之薄膜電晶體基板上週 邊線路區及與其接觸之探針接觸示意圖。 圖12係本發明另一較佳實施例之薄膜電晶體基板上週 邊線路區示意圖。 一圖13係本發明其他較佳實施例之以電路板測試液晶顯 20 示面板示意圖。 【主要元件符號說明】 11’111’112’113，114，115,32 資料線 12，121，122,33閘極線 13，17資料短路桿 16 200819824 14 閘極短路桿 15，16，18測試墊 20 液晶顯示面板 21 彩色濾光基板 22 薄膜電晶體基板 221 顯示區 222 週邊線路區 23 液晶層 24 止膠層 31 晝素 34,34a，34b，34c，50,60,70 測試墊 341，342,511，512,513,601，602,701，702,703 測試墊群 35 短路桿 36 短路測試墊 40 軟性電路板 41 薄材 421，422,423,424,425,426 導線 431，432,433,434,435,436 感測墊 51，61，71第一測試墊 52,62,72第二測試墊 90 電路板 91 信號輸入墊 17200819824 • Nine, invention description: [Technical field of invention] The present invention relates to a liquid crystal display panel and the test of the same type: in reducing the test cost and repeating the test liquid crystal display 2 Do not panel and test its probe. [Prior Art] Generally, in the process of fabricating the front stage of a liquid crystal display, millions of thin film crystals are formed on a substrate by using a crystal crystal method: 丨. However, if some of the thin film transistors are not produced at the time of production, the switch control characteristics cannot be exhibited, and defects such as bright spots and dark spots are generated, and the quality of the liquid crystal display is greatly reduced. Therefore, the thin film transistor must be tested to maintain the quality of the liquid crystal display. Please refer to FIG. 1 , which is a schematic diagram of a conventional liquid crystal display test circuit. 15 On the substrate of the liquid crystal display, a plurality of data lines ", a plurality of closed electrodes ^12, two data shorting bars 13 and two gate shorting bars 14 are included. The two short-circuit bars 13 are respectively connected to the odd-numbered data lines 丨1丨 and the even-numbered lean lines 112', and the two gate short-circuit bars 14 are respectively connected to the odd-numbered inter-pole lines 121 and even numbers. The gate line 122 of the strip, finally 'connects the data shorting rod 2〇13 and one end of the gate shorting rod 14 to the corresponding test pads 15, 16 for testing by the detecting end of the test device. This method is the test line for 2D2G (ie, two data lines 11 and two-pole gate lines for test 12). When the test is performed, the test device can contact the corresponding test pads 15, 16 by the plurality of probe ends, and then send the test signals through the data shorting bar 5 200819824 .13 and the gate shorting bar 14 Tested in thin film transistors. In this test method, either the adjacent two data lines 11 or the question line 12 are not connected to the same shorting bar. Therefore, when any two adjacent lean lines 11 or gate lines 12 are short-circuited in production, the manufacturing can be tested. Moreover, another conventional liquid crystal display test circuit, please refer to FIG. 2, similarly, on the substrate of the liquid crystal display, a plurality of data lines u, a plurality of gate lines 12, three data shorting bars 17 and two question poles are included on the substrate of the liquid crystal display. Shorting the rod 14. The three data shorting bars η are respectively connected to data 10, 113, 114, 115' such as +1, h+M3·3, where m is zero or a positive integer. The two pole shorting bars 14 are respectively connected to the odd-numbered gate lines (2 i and the even-numbered gate lines 122. Finally, the data short-circuiting rod 17 and the gate short-circuiting-correcting end are respectively connected to the corresponding test. Pads 18, 16, in this way are 3D2G (ie, three data lines 11 and two-pole gate lines for duty 2), and (4). When performing test 15, the test device is represented by a plurality of detectors and corresponding After the test, the test signal is sent to the specific thin film transistor via the data shorting rod 17 and the interpole short circuit (4) for testing. This test method classifies the data line into basic primary colors (red, green). Correspondingly, the specific basic color is output after inputting the test signal through the specific data shorting bar. Poor 'however, neither the lt2D2G nor the test line mode of the 3 coffee in Fig. 2 can effectively improve the liquid crystal at the same time. The test efficiency of the array segment (Array) and the cell segment (CeU) during display production. In addition, after the line is judged +, the shorting bar, that is, the data shorting bar and the closed pole shorting bar are cut off. short After the pole is cut, it can no longer be re-tested. That is, when the LCD 6 200819824 'can not re-test the quality of the short display product. The test module section should be tested before. Therefore, the LCD cannot be completely ensured. The present invention provides a liquid crystal display layer liquid crystal layer, a plurality of cells, a plurality of solid layers, a plurality of signal lines, and a plurality of test pads. The substrate has a display area and a peripheral line area, and the display area corresponds to the first substrate, and the peripheral circuit area is located around the display area. The liquid crystal layer is located between the first substrate and the second substrate. The halogen element is formed in the display area of the second substrate. The plurality of signal lines are electrically connected to the pixels. A plurality of test lines are formed in the peripheral circuit area of the second substrate and correspond to electrical properties. Connected to the signal lines 'The test ticks are formed in a misaligned arrangement and are arranged in a loop of !! test pads, divided into (4) test pad groups: each test pad group The test pads are arranged in parallel, wherein n is a positive integer equal to 2. "The liquid crystal display panel of the present invention, wherein the n test pads can be arranged in a circular direction along the vertical direction of the signal line. The signal line includes a plurality of: a lean line, a plurality of gate lines or a common electrode line. Further, the test pad 20 is electrically connected to the plurality of data lines. Preferably, the test items may include η=2 is a cyclical arrangement or is arranged in a cycle of (4). Further, the test pads are preferably a conductive material. Preferably, the material of the test flaw is the same as the material of the halogen. In the invention, the first substrate can be a filter substrate, and the second 200819824 substrate can be a thin film transistor substrate.... The test pad in the present invention can be used to test the liquid touch panel. . Wherein: the touch: to test the soft + 踗柘, the system may include a film probe or a pad, the number of the number; ^, the target 彡 置 可 can include a plurality of sensing pads A plurality of sensing pads can respectively form a __ group corresponding to the lands of the location area. The peripheral line on the board can be seen from the description of the present invention. The test needle for the day and day display panel of the Tm seed liquid is used for testing one liquid τ / night. The panel has a plurality of test pad groups, at least one and a plurality of sensing pads. After a plurality of leads, a plurality of wires are placed in or on the surface of the thin material by a number of wires, and the wires are electrically connected to each other, and the wires are electrically connected to the drive (4). The plurality of sensing pads are located on one side of the thin material and electrically connected to the wires, and the sensing pads are individually corresponding to the test pad groups electrically connected to the liquid crystal display panel. In the present invention, the probe of the liquid crystal display panel is tested, wherein the sensing system is not limited to what shape, as long as it can be in contact with the test pad in the liquid crystal display panel, for example, a shape such as a font can be presented. . According to the foregoing, the present invention can simultaneously provide a short-circuit bar (such as b (4) or a sense of the mouth-type eucalyptus needle via the configuration of the peripheral circuit area in the second substrate. The pad is completely in contact (compared to 丨1(3). When the shorting bar test line is cut, the cell _) can still be measured. After the test, it can be tested for odd or even lines. It can be tested independently for the line groups in different regions. This is a reduction in the cost of testing. The same day, the company also introduced the products of liquid crystal display products. [Embodiment] The following is based on the specificity of each > </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> <RTIgt; </ RTI> </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; The drawings are simplified schematic diagrams. However, the drawings only show the components related to the present invention, and the components shown therein are not in actual implementation. The actual number of components in the actual implementation is Selective design, and its component layout type may be more complicated. Embodiment 1 Eye Referring to FIG. 3, it is a simple schematic diagram of a liquid crystal display panel 2 of the present invention, which has a color filter substrate 21 and a thin film transistor. The substrate 22 and a liquid crystal layer 23. The liquid crystal layer 23 is disposed between the color filter substrate 21 and the thin film transistor substrate 22 and has a stopper layer 24 on the outer side of the liquid crystal layer 23. 20 In this embodiment, the thin film transistor For the structure of the substrate 22, please refer to FIG. 4, which is a schematic diagram of a thin film transistor substrate 22 of a liquid crystal display panel 20 according to the present invention. The thin film transistor substrate 22 has a display area 221 and a peripheral line area 222. 221 corresponds to a color filter substrate 21 as shown in FIG. 3, and the peripheral line region 222 is located around the display region 221. It is formed in the display region 221 of the film substrate 22 200819824. The plurality of halogen elements 31. In addition, the plurality of data lines 32 and the gate lines 33, which can be used as the signal lines, are electrically connected to the halogen element 31. 10 15 Next, please refer to FIG. 5A for the liquid crystal display panel 2 of FIG. The top view is an enlarged schematic view of the peripheral line region 222 of the thin film transistor substrate 22. Taking the G... structure as an example, in the peripheral line region a] of the 溥 film transistor substrate μ, there are a plurality of test pads 34 and corresponding electric Connected to the signal lines, that is, the data line 32 or the gate line 33. The test pads 34 are formed by two or two misalignment, and can be divided into two groups of test pads 341, 342, each test j The test pads 34a, 34b between the pad groups 341, 342 are arranged in parallel. The test pads 34 are arranged in a two-to-two misalignment manner, and the short-circuit bar % can be applied first, that is, the short-circuit bar % connected to the signal line is connected to the short-circuit test pad 36 by 2 coffees (ie, the points can be correspondingly connected to FIG. 4 The line thief mode test of the data line 32 and the gate line 33) is shown in Fig. 5A. After the test, the signal line to be connected to the short-circuit cup 35 is cut off or laser-cut, as shown in the figure below, "after, after" in the subsequent process of making the liquid crystal display, the image is The method will not be tested for the liquid crystal display panel. Also, in this example, a liquid crystal display surface is also provided. This probe is a flexible circuit board and probe in this embodiment. Referring to FIG. 6 ' is a soft circuit board 4014 liquid crystal display panel 2 〇 r 生 生 。 。 。 。 。 。 。 。 。 。 。 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软 软Η θ Λ and want to see the wood, this soft circuit board 40 series "liquid day display panel 2; With respect to the probe of the present embodiment, please refer to FIG. 7, which includes at least 20 200819824 - including a thin material 41, a plurality of wires 421, 422, 423, and a plurality of sensing pads 431, 432, 433. The wires 4:21,422,423 are located in the thin material 41 or on the surface of the thin material 41, and the wires 421, 422, 423 are not electrically connected, and the wires 421, 422, 423 are electrically connected to a test driving circuit (not shown) ). The sensing pads 5 431, 432, 433 are located on one side of the thin material 41 and electrically connected to the wires 421, 422, 423 ', respectively. Please refer to FIG. 6 again. The sensing pads 431, 432 are electrically connected to the liquid crystal display panel 2 respectively. Test pads 341, 342. The lead wire 421 and its sensing pad 43 1 shown in FIG. 7 are in a T-shape, which is electrically connected to an odd number of 10 test pad groups 341 of the liquid crystal display panel 2A in this embodiment. And the sensing pad 432 presents an L-shaped wire 422 electrically connected to an even number of test pad groups 342. The test lead 34 is electrically connected to one of the test pads 34, and the test pad 34c is electrically connected to a signal line in the liquid crystal display panel 2''. Further, the signal line is a common electrode line (not shown) in the liquid crystal display panel 2, and the common electrode line connects the thin film transistor substrate 22 and the color filter substrate 21. Therefore, as described above, the present embodiment can detect whether the thin film transistor of the liquid crystal display panel 20 has a short circuit according to the probe. Also, according to this probe, please refer to FIG. 8 for a 2D2G test. The test device is electrically connected to the test probe, and the circuit board is called an example. In the direction of the x-axis of the circuit board 90, a peripheral line region in the thin film transistor substrate 22 is connected as shown in FIG. The wire 421 of the odd-numbered test group 341 of 222, the wire a] connected to the even-numbered test pad group 342 of the peripheral circuit region 222 of the thin film transistor substrate, and one and the connection to the liquid crystal display panel 2 Test of common electrode line 11 200819824 • Conductor 423, and test pad 34 in the X-axis direction is electrically connected to data line 32 (shown in FIG. 4) or common electrode line of thin film transistor substrate 22 ( The figure is not shown) 曰. Similarly, in the γ-axis direction of the circuit board, a plurality of conductive test pads 丨 421 of the test pad group 以及 and a connection thin film transistor substrate 22 of the peripheral circuit region 222 in the thin film transistor substrate 22 are connected. The conductors 422 of the even number of test pad groups 342 of the middle peripheral line region 222. At this time, the test pad 34 in the γ-axis direction is f-connected to the gate line 3 3 of the photovoltaic substrate 2 2 (as shown in FIG. *), and the wires 421, 422 in the probe can be used with the sensing pad. We i 432 into two L-shaped. Finally, the signal transistor input to the circuit board 9A via the signal input terminal 10' can test whether the thin film transistor in the liquid crystal display panel is short-circuited. In this embodiment, after the test of the probe, the test of the peripheral line region 222 in the thin film transistor substrate 22 is connected to a plurality of semiconductor wafers, and the subsequent process is continued to complete the assembly of the liquid crystal display. . 15 Embodiment 15 This embodiment is substantially the same as Embodiment 1, but the difference is that, referring to FIG. 9A, the test pads 5 can be divided into a first test 51 and a second test. The 52' first-test pad 51 is formed in a misaligned arrangement, and is arranged in a loop by three first-test cymbals 51, and is divided into three groups of test pads, and two test pads, namely, pads 4, 7, etc. As the first group of test pad groups 511, the 4th test squad is measured by the 2nd, the 8th, and the like, and the test squad of the 3rd, 6th, 9th, etc. is used as the third test pad group 513. The test 每 of each test 塾 group is arranged in parallel. In addition, the test group of the three groups (the first group of test pads 511, the second group of test groups 5! 2 and the third group of test groups 513) can be 12 200819824 • The color shown in Figure 3 is tested separately. The basic primary colors of the filter substrate 21, namely red (R), green (G), and blue (B). The second test cymbal 52 in the test pad 5 is arranged in a staggered relationship. The arrangement of the test pads 5 on the thin film transistor substrate 22 is different. Because of this, please refer to FIG. 9B again. The probe material of this embodiment is also the same as the embodiment. However, the probe in this embodiment, that is, the flexible circuit board 4 (or thin film probe), the wires 423, 424, 425, 426 and the sense The (10) presented by the test 433, 434, 435, 436 also changes. The wire 424 and the 10 sensing pad 434 electrically connected to the first test pad group 511 of the first test pad 51 in the thin film transistor substrate 22 in this embodiment have a T-shaped shape, which can test the blue Color (B). In addition, the wires 425 electrically connected to the second group of test cymbals 5U in the first test pad 51 of the thin film transistor substrate 22 and the sensing pads 435 thereof have an L-shaped shape, which can be tested green (9). In addition, the wires electrically connected to the third group of test pads 513 of the first test 4 pads 51 in the thin film transistor substrate 22 and the sense pads 15 436 thereof may also have a shape of 1^^, which can test the red color. (R). Further, the same wire 423 and the sensing pad 433 as in Embodiment 1 can be in a line shape, and the ϋ# type is electrically connected to the signal line in the liquid crystal display panel as a common electrode line. This embodiment is also the same as the embodiment ,, using the circuit board for testing, 20 please refer to FIG. 9 and FIG. 10 at the same time, which is a 3D2G test mode, and includes a connection thin film in the X-axis direction of the circuit board 90. The first set of test pads of the first-test pad 51 of the edge line region 222; the i-line 424 of the i-line 424 of the first test pad 51 of the peripheral line region 222 of the film-pen base 22 425, a wire 426 connecting the first test pad group 513 of the first test pad 51 of the peripheral circuit region 222 of the thin film transistor substrate 22, and a connection with a common electrode line connected to the liquid crystal display panel 20. Test the lead 423 of the pad 5 . This embodiment is the same as the embodiment 在 in the Y-axis direction of the circuit board 90. In this embodiment, via the signal input 5 to the signal input pad 91 in the circuit board 90, it is possible to test whether the thin film transistor in the liquid crystal display panel is short-circuited. The rest is the same as the embodiment. Embodiment 3 This embodiment is substantially the same as the embodiment ,, but the difference is that, referring to FIG. 11A, the test pad 6 本 of the embodiment is formed in a manner of two or two misaligned arrangements, and can be divided into two. Group test mats 601, 602. The test pad 60 itself can be further divided into a first test pad 61 and a second test pad 62, and the first test pad 61 is formed in a staggered arrangement and each of the test pad groups 6〇丨, 6〇2 A test pad 61 is arranged in parallel. The second test pads 62 of each test pad group 6〇1, 6〇2 are arranged in parallel with each other. 15 The test of the probe of the liquid crystal display panel in the present embodiment (as shown in FIG. 11B) and the manner in which the signal is input by the circuit board are the same as those in the embodiment. In addition, after the test, the test pad 6 can be connected to a film, and then the subsequent process is completed to complete the assembly of the liquid crystal display. Embodiment 4 20 This embodiment is substantially the same as Embodiment 2, but the difference is that, referring to FIG. 2, the test pad 7 of the present embodiment has the same first test pad as in Embodiment 2. The second test pad 72 is arranged in parallel with each other. In general, the test pad of the embodiment is arranged in a loop by three first test groups 71, and can be divided into three groups of test pads. Group 200819824 . 701, 702, 703. Further, the probes for testing the liquid crystal display panel in this embodiment can be arranged in the same manner as in Embodiment 2. The circuit board connected to the probe is also the same as in Embodiment 2. 5 Embodiments 5 to 10 Embodiments 5 to 10 can produce 2D4G (Example 5) as shown in FIG. 13A and 3D4G as shown in FIG. 13B according to the arrangement of the test pads in Embodiments 丨4. (Example 6), 4D2G (Example 7) as shown in Fig. 13C, 4D4G (Embodiment 8) as shown in Fig. 13D, 6D2G (Embodiment 10) as shown in Fig. 13E, and Fig. 13F Tests such as 6D4G (Example 10) are shown. Those skilled in the art will be able to make equivalent changes and amplifications, and thus do not limit the embodiments of the present invention. The liquid crystal display panel provided by the present invention and the probe for testing such a liquid crystal display panel reduce the test cost. Moreover, the lines on the display panel of the liquid crystal 15 can be partially on the substrate, the circuit board, and the flexible circuit, instead of the lines on the conventional panel. In addition, the present invention also improves the quality of the liquid crystal display. The above-described embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic diagram of a conventional liquid crystal display test circuit. Figure 2 is a schematic diagram of a test circuit for a liquid crystal display. 15 200819824 The figure is a cross-sectional view of the liquid crystal display panel of the embodiment of the car. 4 is a schematic view of a thin film transistor substrate of the preferred embodiment of the present invention. Fig. 5 is a schematic view of a peripheral wiring region on a thin film transistor substrate of the preferred embodiment of the invention. Figure 6 is a schematic view of the liquid crystal display panel of the preferred embodiment of the present invention. Figure 7 is a schematic view of a probe for testing a liquid crystal display panel of the present invention - a preferred embodiment. Fig. 8 is a schematic view of a panel for testing a liquid crystal display by a circuit board in accordance with the present invention. Figure 9 is a schematic view showing the contact between the peripheral line region on the thin film transistor substrate and the probe in contact therewith in another preferred embodiment of the present invention. Figure 10 is a schematic illustration of a liquid crystal display panel tested by a circuit board in accordance with a preferred embodiment of the present invention. Μ,® U is a schematic view of the peripheral circuit region on the thin film transistor substrate of the preferred embodiment of the present invention and the probe in contact therewith. Figure 12 is a schematic view of a peripheral line region on a thin film transistor substrate in accordance with another preferred embodiment of the present invention. Figure 13 is a schematic diagram of a circuit board test liquid crystal display panel according to another preferred embodiment of the present invention. [Main component symbol description] 11'111'112'113,114,115,32 data line 12,121,122,33 gate line 13,17 data shorting rod 16 200819824 14 gate shorting rod 15,16,18 test Pad 20 Liquid crystal display panel 21 Color filter substrate 22 Thin film transistor substrate 221 Display area 222 Peripheral line area 23 Liquid crystal layer 24 Stop layer 31 Alizarin 34, 34a, 34b, 34c, 50, 60, 70 Test pad 341, 342, 511 ,512,513,601,602,701,702,703 test pad group 35 shorting bar 36 short circuit test pad 40 flexible circuit board 41 thin material 421,422,423,424,425,426 wire 431,432,433,434,435,436 sensing pad 51,61,71 first test pad 52,62,72 second test Pad 90 circuit board 91 signal input pad 17