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TW200815265A - Conveying device and method of electronic element of testing area - Google Patents

Conveying device and method of electronic element of testing area Download PDF

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Publication number
TW200815265A
TW200815265A TW95136020A TW95136020A TW200815265A TW 200815265 A TW200815265 A TW 200815265A TW 95136020 A TW95136020 A TW 95136020A TW 95136020 A TW95136020 A TW 95136020A TW 200815265 A TW200815265 A TW 200815265A
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Taiwan
Prior art keywords
electronic component
transfer
pick
inspection
perform
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TW95136020A
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Chinese (zh)
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TWI290529B (en
Inventor
Ming-Da Xie
Original Assignee
Hon Tech Inc
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Priority to TW95136020A priority Critical patent/TWI290529B/en
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Publication of TWI290529B publication Critical patent/TWI290529B/en
Publication of TW200815265A publication Critical patent/TW200815265A/en

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

A conveying device and method of electronic element of testing area comprises a test station, a fixed feeding carrier disposed at one side of the test station, a fixed collecting carrier mounted at another side of the test station, a first pick-and place apparatus and a second pick-and-place apparatus, wherein the fixed feeding carrier receives a plurality of untested electronic elements so that the first pick-and-place apparatus and the second pick-and-place apparatus can alternately transport the untested electronic elements to the test station, the first pick-and-place apparatus and the second pick-and-place apparatus are respectively provided at the head end thereof with a vertically moving rod having two suckers, and two pulley sets are respectively arranged at a machine frame of the test station for slidably moving in three axial directions. During the testing process, the vertically moving rod can actuate the sucker to precisely put the electronic elements onto the test station, and after finishing said testing process, the first pick-and-place apparatus or the second pick-and-place apparatus will move to the fixed collecting carrier, thereby by using the first pick-and-place apparatus and the second pick-and-place apparatus both capable of moving in three axial directions, the electronic elements can be alternately convey to the test station for testing so as to enhance the testing efficiency.

Description

200815265 九、發明說明: 【發明所屬之技術領域】 -2”其提供—_雜置於_座上方並可作三軸向 替移载至檢測站,並以穩定的水平件輪 檢測作業,_綠製似提升;站執行 載裝置及方法㈠。咐鱗㈣&藥之電子元件移 【先前技術】 其係為台灣專利申請第93110783號 一 Μ裝置(―)』專利案’該檢測裝置包含有測試台 :、=取料機構2 0、3 0及入、出料機構4 〇、5 〇 , ίίί台1〇之兩侧設有第—、二取料機構2 〇、3 0,ΐ取料 橫Γ構及升降結構,各橫移結構係於機 ^ 3 1及橫向螺桿2 2、3 2,而橫向螺 ^ 、3 2由馬達2 3、3 3驅動,-具有螺套2 41、、 41及橫向滑座2 4 2、3 4 2之滑動件2 4、3 4,係取署 於橫向滑執2 1、3 1及橫向螺桿2 2、3 2上,並2 滑座2 4 3' 3 4 3 ’而升降結構係於一底面具吸ί 於说5、3 5側面設有縱向滑執2 5 1、3 5 1,以滑置 件^ 4、34之縱向滑座2 4 3、3 4 3中,該橫移結構 ;料器2 5、3 5之頂面設有一橫向滑座2 5 2、3 5 2, 於-支架26、36之橫向滑執261、3612= 並於該支架2 6、3 6之另面設有二縱向滑座2 6 2、升 ^ 2及-螺套2 6 3、3 6 3 ’以分別組裝麟架之縱向滑執 =7及縱向螺桿2 8、3 8上,而縱向螺桿2 8、3 8由 二達2 9、3 9驅動,進而當各橫移結構之馬達2 3、3 3驅 ^螺桿2 2、3 即帶動滑動件2 4、3 4之橫向滑座 2、3 4 2及取料器2 5、3 5之橫向滑座2 5 2、3 5 2, 5 200815265200815265 IX. Description of the invention: [Technical field to which the invention belongs] -2" provides - _ miscellaneously placed above the _ seat and can be transferred to the inspection station with three axial displacements, and the operation is detected with a stable horizontal wheel, _ The green system is like lifting; the station performs the carrying device and the method (1). The electronic device shifting of the scale (4) & medicine [previous technique] is the patent application of the Taiwan Patent Application No. 93110783 (") "The detection device contains Test bench:, = reclaiming mechanism 2 0, 30 and inlet and outlet mechanisms 4 〇, 5 〇, ί 〇 〇 设有 设有 设有 设有 设有 设有 设有 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第 第The cross-frame structure and the lifting structure, each traverse structure is connected to the machine ^ 3 1 and the transverse screw 2 2, 3 2, and the transverse screw ^ 3, 3 2 is driven by the motor 2 3, 3 3 - has a threaded sleeve 2 41, 41 and the horizontal slide 2 4 2, 3 4 2 of the sliding parts 2 4, 3 4, the department is attached to the lateral sliding 2 1 , 3 1 and the transverse screw 2 2, 3 2, and 2 sliding seat 2 4 3 ' 3 4 3 ' and the lifting structure is attached to a bottom mask. The 5, 3 5 side is provided with a longitudinal sliding 2 5 1 , 3 5 1 to slide the sliding seats ^ 4, 34. , 3 4 3, the horizontal Moving structure; the top surface of the hopper 2 5, 3 5 is provided with a lateral sliding seat 2 5 2, 3 5 2, and the lateral sliding 261, 3612 of the brackets 26, 36 = and the brackets 26, 36 On the other hand, there are two longitudinal slides 2 6 2, 2 ^ 2 and - screw sleeves 2 6 3, 3 6 3 ' to assemble the longitudinal slides of the linings = 7 and the longitudinal screws 28, 38, respectively. The screw 2 8 , 3 8 is driven by two 2 9 , 3 9 , and then the motor 2 3 , 3 3 of each traverse structure drives the screw 2 2 , 3 to drive the sliding seat 2 4 , 3 4 of the lateral sliding seat 2 , 3 4 2 and reclaimer 2 5, 3 5 transverse slide 2 5 2, 3 5 2, 5 200815265

Iff軌21、31及支架26、3 6之橫向滑軌 之:向向?桿2 8、3 8時’即帶動支架2 6、3 6 2 5 2、2 6 2及取料器2 5、3 5之縱向滑執 Μμδ π κ ^ l, 3 3 4 3上作z方向往復位移,另該入料 設載構:?係分別設於測試台10之前、後方,各 34= 5 1之载台結構,用以載送1 C,及-具有Iff rails 21, 31 and the lateral rails of the brackets 26, 36: when the rods 2 8 and 38 are oriented, the brackets 26, 3 6 2 5 2, 2 6 2 and the retractor 2 5 are driven. 3 5 longitudinal sliding Μμδ π κ ^ l, 3 3 4 3 for z-direction reciprocating displacement, and the feeding device is set: the system is set before and after the test bench 10, each 34 = 5 1 Platform structure for carrying 1 C, and - with

吸嘴42伽1之取放結構’用以取放1C;該人料機構40之 一取料機構1上,以載台4 1載送至第 器2 5之吸嘴於# 4 i\ 弟—取料機構2 〇令取料 行測mu、戟σ 4 1上及取1 c,並置人於測試台1 0中進 當 ::立第二取料機構3 0之取料器台上二 料機構4 Q之載台4 1上吸取铜1 C, 料機構5 ⑦3後並取料器2 5横向位移至出 載台51上送出^取料器25下降將1C放置於 XI太〜出在守,弟二取料機構30之取料哭3 5作 構二;時,該 之4Q之载台41上吸附又-待測Ic,者第-&人於入料 進行:广取料機構2 0即可將待測I C置入於測= 、二取_構2。、3。依序忿=中 由於該第—、二取料機構2 Q、3 〇具吸嘴之取料器2 5、 6 200815265 3 5僅能作X-Ζ兩軸向的位移,使 放位置及測試位置無法作χ〜γ— 2 5、3 5於各取 4 1、5 1姆_試台! Q的置微調,因此載台 配設計上都必須具有絕對的位置,於裝 X-Z兩軸向的位移限制下,準葡月、b厂厂态2 5、3 5在 f高精度的製作需求,即造成製財易Ϊ大幅二 較差之水平ί =以品質3 5 3壓抵待測之! C,可能產生 f:有 移:方、差 器,以微s位 執業,此即為本於製作及穩定 【考·^明内】 方法—鎌麻之€子元件_裝置及The pick-up structure of the suction nozzle 42 is used for picking up and dropping 1C; the pick-up mechanism 1 of the human material mechanism 40 is carried by the loading table 4 to the nozzle of the second device 5##i\ - Reclaiming mechanism 2 取 取 取 取 mu mu 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 4 The material 4 4 is loaded with copper 1 C on the stage 4 1 , the material mechanism 5 73 is removed, and the reclaimer 2 5 is laterally displaced to the loading stage 51. The retractor 25 is lowered and the 1C is placed in the XI too~ Shou, brother two reclaiming agency 30 reclaimed cries 3 5 constitutive two; when, the 4Q of the loading platform 41 adsorbed again - to be tested Ic, the first - & people in the feeding: wide reclaiming mechanism 2 0 can put the IC to be tested into the test = 2, take the 2 structure. , 3. According to the order 忿 = in the first - and second take-up mechanism 2 Q, 3 pick-up nozzles 2 5, 6 200815265 3 5 can only be X-Ζ two axial displacement, so that the position and test The location can not be done ~ γ - 2 5, 3 5 in each take 4 1 , 5 1 m _ test bench! Q is fine-tuned, so the design of the stage must have an absolute position. Under the displacement limitation of the XZ two-axis, the production requirements of the high-precision production of the quasi-Greek, b factory, 2 5, 3 5 That is, the level of making money is easy to get worse and worse. ί = The pressure is measured by the quality of 3 5 3! C, may produce f: move: square, difference, practice with micro s, this is the production And stability [test · ^ Ming] method - 镰麻 of the child components _ device and

八G括有^欢/貝]站、位於檢測站一側之固定—处划莽Q八G includes ^欢/贝] station, fixed at the side of the inspection station - 莽Q

9 | ^ ▼' 〆卜 、\第一移載取放器及A二移I 取放裔,其中,該第-移載取放器及第二移載取放 Ϊ係升I条桿独滑執組分別架置於檢測站上方“ 二:別2二軸向的滑移作動,使得進行檢測作業時,第-及弟二移載取放器可作三軸向滑移,而以微調位I的 對、固定式供料載具、固定式收料載具間之各相 子f f的决差,進而達到易於製作及降低製作成本之目的。 ^日巧另-目的赌供—麵測區之電子 ,其中,該第一移載 架檢測站上方之機架,而可分別作三轴向ΐ /月乍動’於執订檢測作業時,升降桿可帶動吸嘴準確於檢測站 7 200815265 正上方移入電子元件,並 =執行檢測作業,達到提升=ί:;的—壓抵電子元 L貝施方式】 較42例進—步之深入瞭解, 類機===機用,該測試分 f供:載具8 1,檢測區8 〇内固定式收料載具 式收料载具8 2、第4载2;^=於站另側之固定 =,?置完測之電子元器ΚίΠΐ ίί^ΐΓΓ 8 4 1 ' 8 5 1 8 3 ί 8 4A^Ztt sV^Z7a9, 4 1^851^ ^#8 42^8 5 2^4; iLti、8 5 3帶動吸嘴8 4 4、8 5 4作三轴向«-γΐ)的 /月移作動’以移載電子元件至檢測站執行檢測作業。 、 於檢圖/本發明迴旋往復式之電子元件移載方法,其 電子元件11帽 ,位於固Μ供料载具8準備取置待檢測之電g 件111 ’请參閱第8圖,當電子元件工工〇完成檢測後,第二 8 200815265 % 移載取放裔8 5將完測之電子元件ii〇蒋截5同a :’同時第一移載取放器84將待檢=之匕:^具 吸取賴至檢泰8 3上,並下顧抿電子元件1 1 .第9圖,於電子元件111執行 迴旋移動至固定式供·具8 1處,由於輸人端,將會 12輸送至固定式供料載具“上,因以 測之電子元件1 1 2,而固定式收料組待檢 1 1 ΐ載二Γ,接著當電子树111完成檢測後,i 時第二移餘放器8 5將待檢測之電 3將g U载取放器8 4及第二移載取放器8 替的f電子兀件移載並執行檢測作業。 輪 明參閱第11圖’本發明直線往復式之電 〇執行檢測作業時,其第 1位於 ,之電子元件110移載至固定式收料載ί FI ΐί出端輸送機觀至收料機構分類放置;“ 巧;準,置下:個由輸入端輸 TL :ΪΚίί吸取完測之電子元件111;請參閱第 於ίϊί :载取放器8 4將待檢測電子元件112吸取 2取:/二Li並壓抵電子元件112執行檢測作業,而第二 【則Γ移?完測之電子元件111至至固定式收 ’ 進而由第一移載取放器8 4及第二移載取放器 9 200815265 8 5交互接替的將電子元件移載並執行檢測作業。 ,發明之第一移載取放器84及第二移載取放器85由 ,因此可以微雜移的方式補償與檢測站、固定 式供料載具、固定式收料載具間之各相對位置_ 到易:製作,低製作成本之效益。 、差進而達 4參閱第14圖,本發明之第一移載取放器8 4及第 取放器8 5由於可作三減的滑移,而於執行測 #了2 端之吸嘴844、8 54可丄檢= μ ^入電子70件,亚且以較佳的水平度,提供平均的下壓力, 知、疋=壓抵電子元件以執行檢猶業,翻提升健品質之。 ^此,本發明不僅可易於製作及降低製作成本,且有效 松測作業品質,實為—㈣實雜及進步性之料,然未 品及遍公開,從而允符發明專财請要件,爰依法提出 【圖式簡單說明】 第1圖·係為台灣專利申請第93110783號『IC檢 利案之配置示意圖。 m—j』辱 第2圖·係為台灣專利申請第9311〇783號『IC檢測裝置 利案第一取料機構之示意圖。 第3圖·係為台灣專利申請第9311〇783號『IC檢 第4圖 第5圖 第6圖 第7圖 第8圖 弟9圖 利案第二取料機構之示意圖。 导 本發明配置於測試分類機之配置示意圖。 本發明之架構圖。 " 本發明移載取放器之示意圖。 本發明迴旋往復式移載之動作示意圖(一)。 本發明迴旋往復式移載之動作示意圖(二)。 十―…本發明迴旋往復式移載之動作示意圖(三)。 =10圖:本發明迴旋往復式移载之動作示意圖(四)。 第11圖·本發明直線往復式移載之動作示意圖(一)。 200815265 第12圖··本發明直線往復式 。,本發明直線往復,部;=3: 弟1 4:圖·本發明移載取放裔下壓執行測試作業之示旁圖 【主要元件符號說明】 〜口 習式部份: 10:測試台 2 0 :第一取料機構 21 :橫向滑轨 2 2 :橫向螺桿 2 3 :馬達 2 4 :滑動件 2 4 1 :螺套 2 4 2 :橫向滑座 2 4 3 :縱向滑座 2 5 :取料器 2 51 :縱向滑軌 2 5 2 :橫向滑座 2 6 :支架 2 6 1 _·橫向滑執 2 6 2 :縱向滑座 2 7 :縱向滑軌 2 8 :縱向螺桿 3 0 :第二取料機構 3 1 :橫向滑軌 3 2 :橫向螺桿 3 4 :滑動件 3 41 :螺套 3 4 2 :橫向滑座 3 5 :取料器 3 51 :縱向滑執 3 5 2 :橫向滑座 3 6 :支架9 | ^ ▼ ' 〆 、 , \ 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 The execution group is placed above the detection station. "Second: Do not use 2 or 2 axial sliding movements, so that the first and second shifting pick-and-placers can be used for triaxial sliding when performing the inspection operation, and the fine adjustment position is performed. The difference between the phase, ff of the pair, the fixed feeding carrier and the fixed receiving vehicle, so as to achieve the purpose of easy production and reduced production cost. The electronic device, wherein the first moving frame detects the frame above the station, and can be respectively used for three-axis ΐ / month ' ' during the binding detection operation, the lifting rod can drive the nozzle to be accurate to the detection station 7 200815265 Moving into the electronic component directly above, and = performing the inspection operation, reaching the upgrade = ί:; - pressing the electronic element L Beishi mode) more in-depth understanding of the 42 cases, class machine == = machine, the test points f for: vehicle 8 1, detection area 8 〇 fixed fixed receiving vehicle type receiving vehicle 8 2, 4th load 2; ^ = fixed on the other side of the station =, ? Κ Πΐ Πΐ Πΐ ΐΓΓ 8 4 1 ' 8 5 1 8 3 ί 8 4A^Ztt sV^Z7a9, 4 1^851^ ^#8 42^8 5 2^4; iLti, 8 5 3 to drive the nozzle 8 4 4 , 8 5 4 for the three-axis «-γΐ) / monthly shift operation 'to transfer the electronic components to the detection station to perform the detection operation., the map / the present invention, the reciprocating electronic component transfer method, the electronic components 11 cap, located in the solid feed vehicle 8 ready to pick up the electrical component to be tested 111 'Please refer to Figure 8, when the electronic component workers complete the test, the second 8 200815265 % transfer to pick up 8 8 The electronic component ii 〇 截 截 截 5 : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : In Fig. 9, the electronic component 111 performs a whirling movement to the stationary supply device 8 1 , and because of the input end, the 12 is transported to the fixed supply carrier "on, because the electronic component 1 1 2 is measured. And the fixed receiving group is to be inspected for 1 1 , and then when the electronic tree 111 completes the detection, the second shifting residual device 8 5 will be the electric 3 to be detected, and the g U will be loaded into the pick-up device 8 4 And the second electron transfer picker 8 for the f electron Transfer member and performs detection operation. Referring to FIG. 11 'When the linear reciprocating electric cymbal of the present invention performs the detecting operation, the first position thereof, the electronic component 110 is transferred to the fixed receiving load ί FI ΐί the end conveyor view to the receiving mechanism classification Placed; "Calculation; Accurate, set: Input TL: ΪΚίί absorbs the measured electronic component 111; see page ίϊί: Loader 8 4 to take the electronic component 112 to be detected 2: / 2 Li is pressed against the electronic component 112 to perform the detecting operation, and the second is then moved to the electronic component 111 to the fixed receiving and then by the first transfer pick-and-placer 8 4 and the second transfer pick-and-placer 9 200815265 8 5 interactively transfer the electronic components and perform the detection operation. The first transfer pick-and-place device 84 and the second transfer pick-and-place device 85 of the invention are used, so that the compensation and detection stations can be micro-mesh , the relative position of the fixed feeding carrier and the fixed receiving vehicle _ to easy: production, low production cost benefits, and further up to 4, see Figure 14, the first transfer pick and place of the present invention The device 8 4 and the first pick-up device 8 5 are capable of performing a three-decreasing slip, and are performing the measurement #2 end Mouth 844, 8 54 can detect μ = μ ^ into 70 pieces of electrons, and provide the average downforce at a better level, knowing, 疋 = pressing the electronic components to perform the inspection of the industry, and improve the quality of the health ^This, the invention can not only be easy to manufacture and reduce the production cost, but also effectively measure the quality of the work, which is - (4) the material of the miscellaneous and progressive, but not the product and the public, so as to allow the invention of special wealth,爰Proposed in accordance with the law [Simple description of the schema] Figure 1 is the layout of the IC patent application No. 93110783. The m-j is insulting the second picture. It is the Taiwan Patent Application No. 9311〇783. Schematic diagram of the first reclaiming mechanism of the IC detection device. Fig. 3 is the Taiwan patent application No. 9311〇783 "IC inspection 4th picture 5th picture 6th picture 7th picture 8th drawing brother 9 Tuli case Schematic diagram of the second reclaiming mechanism. The schematic diagram of the configuration of the present invention is arranged in the test classification machine. The architecture diagram of the present invention. " Schematic diagram of the transfer and pick-and-place device of the present invention. The action of the reciprocating transfer of the present invention (2) Ten-...The schematic diagram of the action of the reciprocating transfer of the present invention (3). Figure 10: Schematic diagram of the action of the reciprocating transfer of the present invention (4). Figure 11: Linear reciprocating transfer of the present invention Schematic diagram of the operation (1) 200815265 Fig. 12······························································ Side view [Key component symbol description] ~ 口习式 part: 10: Test stand 2 0: First reclaim mechanism 21: Horizontal slide 2 2: Transverse screw 2 3 : Motor 2 4 : Slide 2 4 1 : Screw sleeve 2 4 2 : Lateral slide 2 4 3 : Longitudinal slide 2 5 : Reclaimer 2 51 : Longitudinal slide 2 5 2 : Lateral slide 2 6 : Bracket 2 6 1 _·Transverse slip 2 6 2 : longitudinal slide 2 7 : longitudinal slide 2 8 : longitudinal screw 3 0 : second take-up mechanism 3 1 : transverse slide 3 2 : transverse screw 3 4 : slide 3 41 : threaded sleeve 3 4 2 : lateral slide Seat 3 5 : Reclaimer 3 51 : Longitudinal slip 3 5 2 : Lateral slide 3 6 : Bracket

2 5 3 ··下壓吸嘴 2 6 3 :螺套 2 9 :馬達 3 3 :馬達 3 4 3 :縱向滑座 3 5 3 :下壓吸嘴 3 61 :橫向滑軌 3 7 :縱向滑執 4 0 :入料機構 5 0 :出料機構 本發明部份: 6 0 :供料機構 8 0 :檢測區 3 6 2 :縱向滑座 3 8 :縱向螺桿 4 1 :载台 5 1 :載台 7 0 :輸入端輸送機構 3 6 3 :螺套 3 9 :馬達 4 2 :吸嘴 5 2 :吸嘴 11 200815265 81 :供料載具 8 2 :收料載具 8 3 :檢測站 8 4 :第一移載取放器 8 41 :滑執組 8 4 2 :升降桿 8 4 3 :橫向面板 8 4 4 :吸嘴 8 5 :第二移載取放器 8 5 1 :滑軌組 8 5 2 ··升降桿 8 5 3 :橫向面板 8 5 4 :吸嘴 9 0 :輸出端輸送機構 1 0 0 :收料機構 1 2 :電子元件 1 10 :電子元件 111 :電子元件 12 5 3 ··Under pressure nozzle 2 6 3 : Screw sleeve 2 9 : Motor 3 3 : Motor 3 4 3 : Longitudinal slide 3 5 3 : Lower pressure nozzle 3 61 : Horizontal slide 3 7 : Longitudinal slide 4 0 : feeding mechanism 5 0 : discharging mechanism part of the invention: 6 0 : feeding mechanism 8 0 : detecting area 3 6 2 : longitudinal sliding seat 3 8 : longitudinal screw 4 1 : carrying table 5 1 : stage 7 0 : Input conveying mechanism 3 6 3 : Screw sleeve 3 9 : Motor 4 2 : Nozzle 5 2 : Nozzle 11 200815265 81 : Feed carrier 8 2 : Receiving carrier 8 3 : Detection station 8 4 : First transfer picker 8 41 : Slipper set 8 4 2 : Lifting rod 8 4 3 : Horizontal panel 8 4 4 : Nozzle 8 5 : Second transfer picker 8 5 1 : Slide group 8 5 2 ·· Lifting rod 8 5 3 : Horizontal panel 8 5 4 : Nozzle 9 0 : Output end conveying mechanism 1 0 0 : Receiving mechanism 1 2 : Electronic component 1 10 : Electronic component 111 : Electronic component 1

1212

Claims (1)

200815265 十、申請專利範圍: 子元件移載裝置㈠,其主要包括有: 乂松測站:係供待檢測之電子元件移入,以執行電子元 至小一 ”、件的檢測作業; 供料載具·係位於檢測站之一侧,並可承置待檢測之 至、、 電子元件; 收料載具·係位於檢測站之另侧,並可承置完測之 、 子元件; 一移載取放11:係架置於檢_上方之機架,並可作三軸 向的滑移作動,以吸取移載電子元件執行 w一 、 檢測作業; 弟二移载取放器:係架置驗測站上方之機架,並可作三轴 2 向的滑移作動,以吸取移載電子元件執 & 檢測作業。 3 (!_)4=範圍第1項所述之檢測區之電子元件移載裝置 #由亥供料載具係為固定式供料载具。 4 第1項所述之檢測區之電子元件移載展置 .依“ill該,載具係為固定式收料載具。 月1 i乾圍第1項所述之檢測區之電子元件移載裝置 上方)之該第—移載取放11係以滑執組架置於檢測站 .ΐί以,而可作三轴向的滑移作動。 (-)圍?1項所述之檢測區之電子元件移载裝置 上方之機加雜—移載取放讀爲雜組架置於檢测站 • if綠,而可作三軸向的滑移_。 (L)4^1範,1項所述之檢測區之電子元件移載震置 而可將S伽移載取放器係以升降桿頭端裝設吸嘴, 並下_蝴载具間, 13 200815265 7 ,申请專利範圍第6項所述之檢測區之電子元件移載裝置 ϋ吸ίΓ,該第—移載取放器之升降桿頭端係以橫向面板 8 圍第i項所述之檢測區之電子元件移载裝置 而"^將二移載取放器係以升降桿頭端裝設吸嘴, 並下壓二载i之電子元件移載於檢測站及收料載具間, 亚下反电子70件執行測試作業。 9 2 ϋ!1巳圍第8項所述之檢測區之電子元件移載裝置 裝;及/,該第二賴取放11之升降桿頭端細橫向面板 1 0 · &麵測區之電子元件移載方法㈠,其迴旋往復式包括 Α.第二移載,放器位於供料载具處準備取置待檢測之電子 執行檢測業 之Ϊ子元件完成檢測後,第二移載取放器將完 則蔣往^件移載至收料載具放置,而第一移載取放器 c於伽:則之電子元件移載至檢測站執行檢測作業; :器將會同時’第二移載取 子元件·秒動至1枓载具處準備取置下一組待檢測之電 之f子^件完成檢測後,第一移載取放器將完 則將ΐίΓ件移载至收料載具放置’而第二移載取放器 作^待檢測之電子元件移載至檢測站上執行檢測 子元件執行檢測作業的同時’第一移载取 子ί::移動至供料載具處準備取置下一組待檢測之電 .1依申明專利圍第丄〇項所述之檢測區之電子元件移载方 200815265 狀電子元件移 執行檢測作業。f料’侧時下碰抵電子元件以 2 二(申」;專Q 娜之電子元件移载方 載至檢測站執行檢&之電子元件移 執行檢測作業。 料,係_下麵抵電子元件以 入端輸送機具上之待制電子元件係由輪 14 端於$她μ於、3, 收料载具上之完測電子元件係由輸出 15 — 鳊輸运栈構輸运至收料機構分類放 ^種檢_之電子元件輯方法㈠,其直線往復式包括 Α· ί 於檢測站上方待電子元件執行檢測 料i具放置Ϊ移载取放&則將完測之電子元件移載至收 b.當檢測站内之電子元件完 具處’準備取置下-個待:測=;移 而^一移載取放器則移動至檢測座準備吸取完測之電子 元件; C.接著第-移載取放器將下一個待檢測之電子元件吸取移 巧測2執行檢測作業,而第二移載取放器則吸取移 載完測之電子元件至收料載具。 •依申請專利範圍第15項所述之檢測區之電子元件移載方 法(一),其中,該第一移載取放器將待檢測之電子元件吸 取移載至檢測站執行檢測作業時,係同時下壓壓抵 件以執行檢測作業。 一 15 16 200815265 17 8 · ,依申請專繼鮮1 叙檢灌之電 法(;)、:更包含於該供料載具上之待檢測:載方 入端輸送機構輸送放置。 、 兀件係由輪 ㈡專^第丄5項所述之檢 ,更包含於該收料載具上之1i〜件移戴方 _機構輸送至收料機構分類放电疋件係由輪出200815265 X. Patent application scope: Sub-component transfer device (1), which mainly includes: 乂松测站: for the electronic components to be tested to be moved in, to execute the electronic element to the small one, the inspection of the pieces; The system is located on one side of the inspection station and can be placed on the electronic component to be detected. The receiving vehicle is located on the other side of the inspection station and can be placed on the sub-components. Pick and place 11: The frame is placed on the frame above the inspection_, and can be used for three-axis sliding operation to absorb the transfer electronic components to perform w1, inspection operation; The frame above the inspection station can be used for three-axis and two-way sliding operation to absorb the transfer electronic components and the detection operation. 3 (!_) 4=Electronics of the detection area described in the first item of the range The component transfer device # is a fixed feed carrier for the vehicle. 4 The electronic component of the detection zone described in item 1 is transferred. According to "ill, the carrier is a fixed receipt. vehicle. The first-loading pick-and-place 11 of the upper part of the electronic component transfer device of the detection zone described in item 1 of the first paragraph is placed in the inspection station. The slipping action. (-) Around the electronic component transfer device of the detection zone mentioned in the above-mentioned item, the machine-added-loading read-and-release readout is placed in the inspection station • if green, and can be used for three-axis sliding shift_. (L) 4^1fan, the electronic component of the detection zone described in item 1 is placed in a shocking manner, and the S-gly-loaded pick-and-place device can be equipped with a suction nozzle at the head end of the lifting rod, and , 13 200815265 7 , the electronic component transfer device of the detection zone described in claim 6 is sucking, the lifting head end of the first transfer carrier is surrounded by the horizontal panel 8 The electronic component transfer device of the detection area is "^ the second transfer picker is equipped with a suction nozzle at the head end of the lifting rod, and the electronic component of the two-loaded i is transferred to the inspection station and the receiving vehicle In the meantime, 70 pieces of sub-anti-electronics perform test operations. 9 2 ϋ!1 电子 电子 电子 第 第 第 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子The electronic component transfer method (1), the revolving reciprocating type includes a second transfer load, the discharge device is located at the supply carrier, and the electronic component to be detected is prepared to perform the detection. When the device is finished, the Jiang will move to the receiving vehicle, and the first transfer device will be transferred to the gamma: then the electronic components are transferred to the inspection station to perform the testing operation; Second transfer of the sub-components · seconds to 1 枓 at the vehicle is ready to take the next set of electricity to be detected after the completion of the test, the first transfer picker will be finished to transfer the ΐ Γ Γ The receiving carrier is placed while the second transfer picker is used to transfer the electronic component to be detected to the detecting station to perform the detecting sub-component performing the detecting operation while the first transfer carrier ί:: moves to the feeding The vehicle is ready to take the next set of electricity to be tested. 1 The electronic component transfer side of the detection zone according to the claim 0815265 Electronic component shift Performs the inspection operation. f material 'side down and touch the electronic component to 2 2 (Shen); special Q Na electronic component transfer to the test station to perform inspection & electronic component shift to perform the inspection operation. The electronic component to be fabricated on the infeed conveyor is transported by the wheel 14 to the third, and the finished electronic component on the receiving carrier is transported by the output 15 - transport transport to the receiving mechanism. The electronic component editing method (1) of the classification and detection type _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ To receive b. When the electronic components in the inspection station are completed, 'ready to take down' - one to wait: test =; shift and ^ move the pick and place device to move to the test stand ready to absorb the measured electronic components; C. The first-loading pick-and-placer performs the detection operation by taking the next electronic component to be detected, and the second transfer picker picks up the electronic component that has been transferred to the receiving carrier. Electronic component transfer method of detection area according to item 15 of the patent scope (1) Wherein, the first transfer pick-and-place device picks up the electronic component to be detected and transfers it to the detecting station to perform the detecting operation, and simultaneously presses the pressing member to perform the detecting operation. A 15 16 200815265 17 8 · Following the electric method (;) of the fresh 1 inspection and inspection, it is included in the feeding vehicle to be tested: the conveyor feeding mechanism of the loading side is transported. The 兀 is made by the wheel (2) The inspection, which is included in the receiving vehicle, 1i~pieces are worn _the mechanism is transported to the receiving mechanism, and the discharge device is rotated by
TW95136020A 2006-09-28 2006-09-28 Conveying device and method of electronic element of testing area TWI290529B (en)

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