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TW200809169A - Vibrational wave detection method, and vibrational wave detector - Google Patents

Vibrational wave detection method, and vibrational wave detector Download PDF

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Publication number
TW200809169A
TW200809169A TW96123309A TW96123309A TW200809169A TW 200809169 A TW200809169 A TW 200809169A TW 96123309 A TW96123309 A TW 96123309A TW 96123309 A TW96123309 A TW 96123309A TW 200809169 A TW200809169 A TW 200809169A
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Taiwan
Prior art keywords
resonance
vibration wave
resonators
vibration
frequency
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TW96123309A
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Chinese (zh)
Inventor
Shigeru Ando
Nobutaka Ono
Yuya Fujita
Naoki Ikeuchi
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Univ Tokyo
Tokyo Electron Ltd
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Publication of TW200809169A publication Critical patent/TW200809169A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/06Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means
    • G01H11/08Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means using piezoelectric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H13/00Measuring resonant frequency

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Abstract

Provided are an oscillating wave detection method and device capable of obtaining a Hilbert transform pair output as an instantaneous value in real time. The oscillating wave detection method causes an oscillating wave to propagate to a plurality resonance beams (51 to 5m), each resonating to a particular frequency, and detects oscillation of each of the resonance beams (51 to 5m) as an electric signal by using piezoelectric resistors (61 to 6m) arranged in the resonance beams (51 to 5m). The resonance beams (51 to 5m) are arranged so that positions of the respective resonators are arranged in a logarithmic linear form proportional to a logarithm of their resonance frequencies. When N is an integer not smaller than 2, the resonance beams (51 to 5m) are selected by every other N-1 and the outputs of the piezoelectric resistors (61 to 6m) are added so as to output a plurality of signals. More preferably, the N is an integer not smaller than 3 and the resonance beams (51 to 5m) are arranged and the resonance frequencies are set so that the ratio of the resonance frequencies of the resonance beams (51 to 5m) of every other N-1 is constant.

Description

200809169 九、發明說明: 【發明所屬之技術領域】 本發明係關於檢測每振動波頻帶之強度之振動波檢測方 法及裝置。 【先前技術】 ,揭示有檢測每振動波頻 測器。該振動感測器具備 在聲波等振動波之頻率成 之共振頻率之頻率成分共 之共振位準轉換為電信號 在非專利文獻1和非專利文獻2 ▼之強度之共振子陣列型振動感200809169 IX. Description of the Invention: [Technical Field] The present invention relates to a vibration wave detecting method and apparatus for detecting the intensity of each vibration wave band. [Prior Art] discloses the detection of each vibration wave frequency detector. The vibration sensor has a resonance level which is a resonance frequency of a resonance frequency at a frequency of a vibration wave such as a sound wave, and is converted into an electric signal. The resonance sub-array type vibration of the intensity of the non-patent document 1 and the non-patent document 2

共振頻率不同之共振子之排列。 为中’各共振子在自己之共振子 振。該振動感測器將每個共振子 並輸出。 无則之振動感應 ——在共振子支持部附近形成壓阻,將 由共振子之振動(共振)引起之壓阻之電阻值變化藉由惠 貝電橋等出’藉此從共振子中取出 :利文獻2所記載之感測器切換多工器,得到位= 子之惠斯頓電橋輸出信號。 /、&lt; ==船和專利文獻2提出有以共振子陣列型之簡易^ 3=制特定頻帶之增益之方法。例如專利文獻&quot; ;=二在:振子陣列型振動感測器中,並聯物 或改變厂堅阻形狀而變更電阻值,控制特 I22268.doc 200809169 - 希望之位準,藉由調整設在各共振子之壓阻之位置,控制 . 特定頻帶之增益。 非專利文獻 1 : W. Benecke et al·,&quot;A Frequency-Selective, Piezoresistive Silicon Vibration Sensor,” Digest of Technical Papers of TRANSDUCERS *85, pp/105-108 (1985) 非專利文獻 2 : E· Peeters et al·,&quot;Vibration Signature Analysis Sensors for Predictive Diagnostics,” Proceedings • of SPIE *97, vol· 3224, pp. 220-230 (1997) 專利文獻1:日本特開2000-46639號公報 專利文獻2:日本特開2000-46640號公報 【發明内容】 [發明欲解決之技術問題] 在處理振動現象及音響信號之基礎上,將信號表現為複 數,可實現振幅/相位之瞬時檢測及信號之調變與解調等 各種各樣之解析與轉換。以麥克風為代表之先前之音響/ _ 振動感測器係將在各個時刻之音壓等物理量轉換為電信號 之裝置,其輸出為單一之實際信號。一般說來,為將實際 信號轉換為對應之複數信號,必須進行下述之稱為希伯特 轉換之運算。該運算係非因果關係,不能對於寬帶信號即 • 時進行該運算。因此,可實際適用信號之複數表現者限於 如在通信領域使用之窄帶信號。 在解析函數之實部與虛部之間,一般存在如下之希伯考寺 轉換關係。 設虛數單位為j,在複數變數z二x+jy之上半平面, 122268.doc 200809169 正則函數 Φ(ζ)=υ(χ、y)+jv(x,y) 之實數軸上之邊界值 f(X)-U(X,〇),g(x):=r-V(X,0) 之間,在f、g為實數上之可積分函數(f、gGL1(-〇〇、 ))8守’有式(1)所示之關係。 six)Arrangement of resonators with different resonant frequencies. For the middle resonators, they vibrate in their own resonance. The vibration sensor outputs each of the resonators. No vibration induction - a piezoresistive force is formed in the vicinity of the resonator support portion, and a resistance value change of the piezoresistance caused by the vibration (resonance) of the resonator is extracted by the Huibei bridge, thereby taking out from the resonator: The sensor switching multiplexer described in the document 2 obtains the Wheatstone bridge output signal of the bit = sub. /, &lt; == Ship and Patent Document 2 propose a method of making a gain of a specific frequency band by a simple resonance sub-array type. For example, the patent document &quot;== in: vibrator array type vibration sensor, parallel or change the resistance shape of the factory and change the resistance value, control special I22268.doc 200809169 - the level of hope, by adjustment The position of the piezoresistance of the resonator, control. The gain of a specific frequency band. Non-Patent Document 1: W. Benecke et al., &quot;A Frequency-Selective, Piezoresistive Silicon Vibration Sensor," Digest of Technical Papers of TRANSDUCERS *85, pp/105-108 (1985) Non-Patent Document 2: E· Peeters </ br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br> Japanese Laid-Open Patent Publication No. 2000-46640 [Draft of the Invention] [Technical Problem to be Solved by the Invention] On the basis of processing vibration phenomena and acoustic signals, signals are expressed as complex numbers, and instantaneous detection of amplitude/phase and modulation of signals can be realized. Various resolutions and conversions such as demodulation. The previous audio represented by a microphone / _ vibration sensor is a device that converts physical quantities such as sound pressure at various times into electrical signals, and its output is a single actual signal. In general, in order to convert an actual signal into a corresponding complex signal, the following operation called Hibbert conversion must be performed. This operation is non-causal and cannot be performed on wideband signals. Therefore, the complex representation of the actual applicable signal is limited to narrowband signals as used in the communications field. Between the real part and the imaginary part of the analytic function, there is generally the following Hebekao conversion relationship. Let the imaginary unit be j, and the complex variable z 2x+jy above the half plane, 122268.doc 200809169 Regular function Φ(ζ)=υ(χ, y)+jv(x,y) The boundary value on the real axis f(X)-U(X,〇), g(x):=rV(X,0), the integral function of f, g is a real number (f, gGL1(-〇〇, ))8 Keep 'the relationship shown by formula (1). Six)

ν· π 一 οο f(x)= 兀 ρ* ν· f (x+t) t g(x+t) t dt dt (1) 此處’如式(2)所示,ρ·ν·意味著Cauchy之主值。 P’ V’ F〈t)dtJ-:F(t)cit + JY F — 將g稱為f之希伯特轉換(Hilbert transf〇rm),將^和^稱jν· π οο f(x)= 兀ρ* ν· f (x+t) tg(x+t) t dt dt (1) where 'as shown in equation (2), ρ·ν· means The main value of Cauchy. P' V' F<t)dtJ-:F(t)cit + JY F - Let g be the Hibbert transform of f, and ^ and ^

寺轉換對。希伯特轉換係連結解析函數之實部與虛苦 之函數。 &amp;在^數平面上解析物理現象特別是振動現象很便利。一 ^而、&quot;,振動現象具備藉由時間變化之振幅和相位之半 二ίΓ ’ ΐ於歐拉公式eje==cos e+jsin θ,各時刻之瞬* Ϊ之資訊:不充⑽時值把握現象,僅有實部或虛部_ 、— 兄刀,必須知道實部與虛部雙方。 因為貫部與虛部之關係構成希伯特 述g或f之式導】故了猎由j 出另-方。但是,如式⑴所示,由 122268.doc 200809169 式作為(-…)區間之時間積分而表示,故需要某一期間 (在周期函數,至少^周期)之觀測。在先前之振動波檢測 裝置,由於僅能檢測一方之資訊,故無法即時地得到實部 與虛部雙方之資訊。 例如專利文IU所示,藉由與共振子之共振頻率相對應 之壓阻檢測器之偏壓賦予,能夠實現可動態變更之頻率特 t °但是’在先前之方法’振動波檢測之負荷僅限於正負 貫數,無法將希伯特轉換對輸出作為瞬時值即時地獲得。 本發明係鑒於如此之狀況而完成者,其目的在於提供一 種可即時地作為瞬時值獲得希伯特轉換對輸出之振動波檢 測方法及裝置。 [解決問題之技術手段] 本發明之第m點之振動波檢測方法,其係使振動波傳 播至在互不相同之特定頻率共振之複數個共振子,檢測前 述各共振子之振動之振動波檢測方法,其特徵為 排列前述複數個共振子,使各個 ’ 共振子之位置呈與該等 /、振頻率之對數成比例之對數線形, 子設:T以上之整數,输1根選擇前述複數個共振 Γ 對該檢測器之輸出進行加法運算後之複數個信 號0 口 本發明之第2觀點之振動波檢測裝置,其特徵為具備 共振子行,其係將在互不相同 ^ . 特疋頻率共振之複數個 /、振子㈣’使各個共振子之位 去 /、°豕等共振頻率之势 數成比例之對數線形者; 122268.doc 200809169 檢測器,其係檢測出藉由傳播至前述共振子行 所引起之前述各個複數之共振子之振動纟; '動波 複數個輪出合成部,其係將N設為2以上之整數&gt; N-1根選擇前述複數個共振子,對該檢測 谁母隔 法運算者。掏出進行加 [發明效果] 依據本發明之振動波檢測方法及振動波檢測 時地(關於某一斯間之資料,不了即 得希伯特轉換對輸出。 -)作為鮮時值獲 【實施方式】 以下’參照圖式詳細説明本發明之實施形態。另 相同或相當部分標示以同一符號圖中 對象之振動波為聲波之音響感測器為例説二; 圖U系顯不本發明之振動波檢測裝置之感測器本體之— 」之圖。开;ί成於半導體石夕美拓2 ο P今汗 聲波之隔膜2、與隔膜之感測器本體1由接收 隔M2相連接之!根橫 端相連接之終止板4、及於横樑 、榡3之- 共振樑5卜52、... 5m(以下/心#支持之複數(讀)之 m(以下統稱為共振 有部分由半導體矽形成。 則㈣所 橫樑3之寬度在隔膜2側之端部寬度最粗,由此向 余徐變細’在終止板4側之端部變為最細。.在 中,仏表示在第n個共振 ΘΙ 度。又,各共振襟5構成調整;;立置之橫標3之寬 特定頻率共振。 ^長度叙共振子,以使之在 122268.doc -10* 200809169 該等複數之共振樑5,在 地應答振動。 下式(3)表不之共振頻率f選擇性 f = c a Vy (3) 其中,C :實驗性決定之常數 a :各共振樑5之厚度 X ·各共振樑5之長度 γ:材料物質(半導體矽)之揚氏模量 S:材料物質(半導體矽)之密度 由上述(3)式可知,藉由改變共之厚度a或長卢χ 可將其共振頻率f設定為所希望 又 之共振頻率。在本財,所有共振樑5之^ =具!固 她本體!之各共振樑5之:置:二=_ 率之對數成比例稱之為對數:二、振樑5之共㈣ 構成為等間隔地排列。即,相鄰之共_5之共振㈣; 比對於任何共振樑5均為一 &quot;^ ^ 為魚骨形感測器。 ㈣構成之感― :為魚骨形感測器係對數線形結構’所以從橫樑&amp; 二之位置開始’其前端之形狀在任何共振樑5,… 一¥之振動波之行進速度具有與頻率成比例 122268.doc 200809169 與頻率無關而為一定之特徵。 士一成★卩上構成之感測裔本體1,係採用微機械加 ^術在半導體石夕基板20上製作。從隔膜2輸入之振動能 樑3分配至各個共振樑5,在各共振系之機械-電 乱轉換為吸收,轉換為信號能量並取出。 圖⑷采用感測器本體i將各共振襟5之輪出之和予以輸 出之先則之壓阻方式之振動波檢測裝置之一例之電路圖。 ^圖^之電路中,在上側之共振樑5ia〜5咖施加正直流偏 ,,在*下側之共振樑51b〜5mb施加負直流偏壓,各共振標 之電抓在!根信號線上加法運算後輪出。於此,為容易理 解,設成相對之上下共振樑5逆相振動,上下靠6互為逆 相地伸縮。 在圖8中;6· 6又第i之上側共振樑上之壓阻之電阻值為Temple conversion pair. The Hibbert transformation is a function of the real part and the sorrow of the analytic function. &amp; It is convenient to analyze physical phenomena, especially vibration phenomena, on the ^-number plane. A ^,, &quot;, the vibration phenomenon has half the amplitude and phase of the time change by the time of the Euler's formula eje == cos e + jsin θ, the moment of each moment * Ϊ information: not charge (10) The value of the phenomenon, only the real part or the imaginary part _, - brother knife, must know both the real part and the imaginary part. Because the relationship between the oscillating part and the imaginary part constitutes the Hibbert's expression of g or f. Therefore, hunting is performed by j. However, as shown in the equation (1), since the equation is expressed as the time integral of the interval (-...) in the equation (122), it is necessary to observe a certain period (in the period function, at least ^ period). In the conventional vibration wave detecting device, since only one piece of information can be detected, it is impossible to immediately obtain information of both the real part and the imaginary part. For example, as shown in the patent document IU, by applying the bias voltage of the piezoresistive detector corresponding to the resonant frequency of the resonator, it is possible to realize a dynamically changeable frequency t ° but the load of the previous method 'vibration wave detection only Limited to the positive and negative cents, the Hibbert conversion cannot be obtained instantaneously as an instantaneous value. SUMMARY OF THE INVENTION The present invention has been made in view of such circumstances, and an object thereof is to provide a vibration wave detecting method and apparatus which can instantaneously obtain a Hibbert conversion pair output as an instantaneous value. [Means for Solving the Problem] The vibration wave detecting method according to the mth point of the present invention transmits the vibration wave to a plurality of resonators that resonate at specific frequencies different from each other, and detects vibration waves of the vibrations of the respective resonators. The detecting method is characterized in that the plurality of resonators are arranged such that the position of each 'resonator' is a logarithmic line which is proportional to the logarithm of the /, the frequency of the vibration, and the sub-set is an integer greater than T, and one of the inputs selects the plural The resonance wave 复 The signal of the second aspect of the vibration wave detecting device of the second aspect of the present invention is characterized in that the vibration wave detecting device of the second aspect of the present invention has a resonance sub-row, and the system is different from each other. a plurality of frequency resonances /, vibrators (four) 'the logarithmic line that makes the position of each resonator go to the frequency of the resonance frequency such as /, ° ;; 122268.doc 200809169 detector, which is detected by propagating to the foregoing The vibration of the resonator of each of the complex numbers caused by the resonance sub-row; 'A plurality of rounds of the composite part of the moving wave, which sets N to an integer of 2 or more> N-1 selects the plurality of resonances described above , Who the master is detected by calculating method compartment. [Invention Effect] According to the vibration wave detecting method and the vibration wave detecting method of the present invention (the information about a certain sigma is not obtained, the Hibbert conversion is outputted. Modes Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the same or equivalent part, an acoustic sensor in which the vibration wave of the object in the same symbol is used as the acoustic wave is taken as an example; FIG. U is a diagram showing the sensor body of the vibration wave detecting device of the present invention. Open; ί成于半导体石夕美拓2 ο P Today's sweat Sonic diaphragm 2, and the sensor body 1 of the diaphragm is connected by the receiving M2! The terminating plate 4 connected to the transverse end of the root, and the beam, the 榡3 - the resonant beam 5 b 52, ... 5m (the following / heart # support of the complex number (read) m (hereinafter referred to as the resonance is partially The semiconductor crucible is formed. (4) The width of the beam 3 is the thickest at the end of the diaphragm 2 side, and thus becomes thinner at the end portion on the side of the end plate 4. In the middle, 仏 indicates The nth resonance 。. In addition, each resonance 襟5 constitutes an adjustment; the width of the vertical yoke 3 is a specific frequency resonance. ^The length of the resonator is such that it is at 122268.doc -10* 200809169 Beam 5, in response to vibration at the ground. The resonance frequency f of the following equation (3) f selectivity f = ca Vy (3) where C: experimentally determined constant a: thickness of each resonant beam 5 X · each resonant beam Length of 5 γ: Young's modulus of material substance (semiconductor S) S: Density of material substance (semiconductor 矽) is known from the above formula (3), and its resonance frequency can be changed by changing the total thickness a or long χ f is set to the desired resonant frequency. In this wealth, all the resonant beams 5 ^ = have solidified her body! Each of the resonant beams 5: set: two = _ rate pair The number proportional is called the logarithm: two, the common beam of the vibrating beam 5 (four) is arranged at equal intervals. That is, the resonance of the adjacent common_5 (four); is a fish for any resonant beam 5 is &quot;^ ^ for the fish Bone sensor. (4) Sense of composition - : for the fishbone sensor system logarithmic linear structure 'so start from the position of the beam &amp; II' its front end shape in any resonant beam 5, ... a vibration wave The traveling speed has a certain characteristic regardless of the frequency proportional to the frequency 122268.doc 200809169. The sensory body 1 formed by Shi Yicheng is composed of micro-mechanical plus on the semiconductor Shishi substrate 20. The vibration energy beam 3 input from the diaphragm 2 is distributed to each of the resonance beams 5, and the mechanical-electrical disturbance of each resonance system is converted into absorption, converted into signal energy and taken out. Fig. 4 shows the resonance body 5 by using the sensor body i A circuit diagram of an example of a vibration-wave detecting device of a piezoresistive mode in which the sum of the turns is output. ^ In the circuit of Fig. 2, a positive DC bias is applied to the upper resonant beam 5ia to 5, on the lower side of the * The resonant beam 51b~5mb applies a negative DC bias, and each resonance target After the addition, the root signal line is added after the addition operation. Here, for easy understanding, it is set to reverse the phase vibration of the upper and lower resonance beams 5, and the upper and lower sides 6 are mutually reversely stretched and contracted. In Fig. 8, 6·6 The resistance value of the piezoresistance on the upper side resonant beam of the ith

R…⑴,第i之下側共振樑上之壓阻之電阻值為U R,⑴’施加於上下各電阻之-方共通端子之電壓為V〇· V〇’則從另-方共通端子流入運算放大器之假想接地點之 電流以下式(4)表示。 並且 取出。R...(1), the resistance of the piezoresistive force on the lower side resonant beam of the ith is UR, and (1) 'the voltage applied to the common terminal of the upper and lower resistors is V〇·V〇' flows from the other common terminal The current at the imaginary ground point of the operational amplifier is expressed by the following equation (4). And take it out.

NN

NN

V N Σ 〇 SRCt) 2V( ο )(·V N Σ 〇 SRCt) 2V( ο )(·

Ri ) (4) 藉由回授電阻Rf,作為在下式(5)表示之振動電壓 122268.doc 12- 200809169Ri) (4) By applying the resistance Rf as the vibration voltage expressed by the following equation (5) 122268.doc 12- 200809169

NN

^RjCt) ⑸ _ σ成輪出之負荷1可藉由調整電阻Ri而改變,。但是,實 際上藉由製造晶片時之整修等而成固定式。 貝^RjCt) (5) _ σ The rounded load 1 can be changed by adjusting the resistance Ri. However, it is actually fixed by refining when manufacturing a wafer. shell

斤在上述方法,利用輸出與偏壓電壓V〇成比例,可考慮於 母/、振樑5改變偏壓電壓.。圖9係顯示使用複數個偏壓電壓 線之£阻方式之先前之振動波檢測裝置之一例之電路圓。 使用圖9之電路,可按頻率動態地調整增益。若設第i共振 才木之偏壓電壓為±Vi,則輸出電壓v—以下式⑹表示。 1M outIn the above method, the output is proportional to the bias voltage V〇, and it is conceivable that the mother/the vibrating beam 5 changes the bias voltage. Fig. 9 is a circuit diagram showing an example of a prior art vibration wave detecting device using a plurality of bias voltage lines. Using the circuit of Figure 9, the gain can be dynamically adjusted by frequency. If the bias voltage of the ith resonance is ±Vi, the output voltage v is expressed by the following equation (6). 1M out

但疋,由於可通過橫樑3之配線數受限,所以若共振樑$ 數量多,則需要對共振樑5實行分組化之偏壓控制。〃However, since the number of wires that can pass through the beam 3 is limited, if the number of the resonant beams $ is large, it is necessary to perform grouping bias control on the resonant beam 5. 〃

圖9所示之振動波檢測裝置雖然其頻率特性可變,但各 頻率可設定之增益限定為實數。滤波時之增益為實數或純 虛數僅限於脈波(in pulse)應答為對稱或為反對稱之情形。 若在各頻率所設定之增益限定為實數’則無法實現任意之 脈波應答。在圖8或圖9所示之任一振動波檢測裝置,輪出 均限定為實部,無法得到希伯特轉換對之輸出。 (實施形態1) 圖2係顯示使用感測器本體〗之本發明之振動波檢測裝置 之一例之電路圖。在感測器本體丨之各共振樑5之產生變形 部分(橫標3側),形成有堡阻61、62、…6m(以下統稱為屡 阻6)。該等複數個壓阻6並聯連接,該壓阻6之一端與偏壓 122268.doc -13 - 200809169 電壓VG之電源7a相速接。 遷阻6之另一端以N為正攀|,立κ 一、 、 勹止登數,母隔以共通之線輿 運异放大器1 Oa、1 〇b、1 〇cf以下紅γ (以下統稱為運算放大器10)之· 輸入端子連接。即,對央白 對采自Ν之剩餘(模數)相等編號之壓 阻㈣流輸出進行加法運算,分別輸入各自不同之運算 放大裔10。將如此#於,&amp; χτ 冓成%為Ν相加法運法方式。在圖2 中,設Ν為3,將壓阻6之另一媸夂眨 另為母隔3_1=2根與共通之線連 即,壓阻61、64、...與運算放大器1〇a連接,塵阻 62、…與運算放大器⑽連接’隸63、.·.與運 10c連接。 °σ 轉移阻抗型運算放大器10係輸 铷I且抗為〇、輸出阻抗為〇 之電欠電壓轉換放大器。運算放大器1〇之+輸入端子接 地母隔Ν-1根連接之共通之線經由虛擬電阻 電壓-V0之電源7b。 逆狀負 接著説明圖2所示之振動波檢測裝置之作用。設第打個丑 振樑之對數頻率軸上之頻率特性為Fn( Q )。t巾,㈣ 4示對數頻率。因為感測器本體丨具有對數線形結構Μ 2現在全部共振樑之頻率特性使用共通之特性形狀 (Ω),假定為可用式(7)表示。 - ρ(α^ηΔΩ)⑺ 工甲,△ Ω表示相鄰樑之間之共振頻率比之對數。 圖3係模喊性地顯示制器本體1之共振樑5之頻率特性 Fn( Ω )之圖。因為相鄰之共振樑$之共振頻率之比為一 122268.doc -14- 200809169 :,二以在對數頻率上表示之各自之頻率特性h⑻以大 致相同之形狀、相等間隔△Ω排列。 若對該共振樑之輸出仙根進行加法運算,則 η=1,2,.·.,第Ν個輸出之頻率特性可如式所示。 H (Q)The vibration wave detecting device shown in Fig. 9 has a variable frequency characteristic, but the gain that can be set for each frequency is limited to a real number. The gain when filtering is real or pure. The imaginary number is limited to the case where the pulse response is symmetrical or antisymmetric. If the gain set at each frequency is limited to a real number, an arbitrary pulse wave response cannot be achieved. In any of the vibration wave detecting devices shown in Fig. 8 or Fig. 9, the rounding is limited to the real part, and the output of the Hibbert switching pair cannot be obtained. (Embodiment 1) Fig. 2 is a circuit diagram showing an example of a vibration wave detecting device of the present invention using a sensor body. In the deformed portion (the lateral direction 3 side) of each of the resonant beams 5 of the sensor body 堡, the barriers 61, 62, ... 6 m (hereinafter collectively referred to as the repeating resistor 6) are formed. The plurality of piezoresistors 6 are connected in parallel, and one end of the piezoresistive resistor 6 is connected to the power source 7a of the voltage VG of the bias voltage of 122268.doc -13 - 200809169. The other end of the relocation 6 is N as the positive climbing |, the κ one, the 登 登 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The input terminals of the operational amplifier 10) are connected. That is, the current output of the piezoresistive (four) stream, which is equal to the number of the remaining (modulus) of the Ν, is added to the central white, and the respective different operations are input to amplify the genus 10. Put ##, &amp; χτ into % for the Ν addition method. In Fig. 2, let Ν be 3, and the other 压 of the piezoresistive 6 is 3_1=2 and the common line is connected, the piezoresistive 61, 64, ... and the operational amplifier 1〇a Connection, dust resistance 62, ... and the operational amplifier (10) connection 'Li 63, ... and transport 10c connection. The °σ transfer-impedance operational amplifier 10 is an electrical undervoltage conversion amplifier that outputs 铷I and is 〇-resistant and has an output impedance of 〇. The input terminal of the operational amplifier 1〇 is connected to the common ground of the ground-connected -1 connection via the power supply 7b of the virtual resistor voltage -V0. Reverse negative Next, the action of the vibration wave detecting device shown in Fig. 2 will be described. Let the frequency characteristic on the logarithmic frequency axis of the ugly vibration beam be Fn(Q). t towel, (4) 4 shows the logarithmic frequency. Since the sensor body 丨 has a logarithmic linear structure Μ 2 now the frequency characteristics of all the resonant beams use a common characteristic shape (Ω), which is assumed to be expressed by the equation (7). - ρ(α^ηΔΩ)(7) Armor, △ Ω represents the logarithm of the resonance frequency ratio between adjacent beams. Fig. 3 is a view schematically showing the frequency characteristic Fn ( Ω ) of the resonant beam 5 of the maker body 1. Since the ratio of the resonance frequencies of the adjacent resonant beams $ is 122268.doc -14 - 200809169 :, the respective frequency characteristics h(8) expressed on the logarithmic frequency are arranged in substantially the same shape and at equal intervals ΔΩ. If the output root of the resonant beam is added, then η = 1, 2, .., and the frequency characteristics of the first output can be as shown. H (Q)

.n+kN (Q) ~ Σ F(Q -(n+kN) A Q) =F(Q-ηΔΩ)*| δ(Ω—咖⑴⑻ 式中&quot;表示摺疊。又’ 5係狄悅克得他函數。在實際 之感測器本體1(魚骨形感測器),共振樑5之根數有限,、曰 是—以下為了簡單而設與式⑻之k相關之和為無限和 (k - 〇〇、〇〇 ),在最後考察樑之根數有限之影響。 \(c) = f(c)e^^^Ac2 Mc~kAc) k 式中,△ c可如式(10)所示。 在上述假定下’注意周斯“數行之傅立㈣換變為周 期&lt;5函數行,若對兩邊實行傅立葉轉換,則得式(9)。 ⑼.n+kN (Q) ~ Σ F(Q -(n+kN) AQ) =F(Q-ηΔΩ)*| δ(Ω-咖(1)(8) where &quot; means folding. Also '5 Series Diyoke He functions. In the actual sensor body 1 (fishbone sensor), the number of the resonance beam 5 is limited, and 曰 is - the following is simple for the sum of the k of the equation (8) is infinite sum (k - 〇〇, 〇〇), in the end, investigate the influence of the finite number of beams. \(c) = f(c)e^^^Ac2 Mc~kAc) k where △ c can be as in equation (10) Show. Under the above assumptions, 'Focus on the Zhous' number of rows (Four) is changed to the period &lt;5 function line, and if Fourier transform is performed on both sides, then equation (9) is obtained. (9)

2 71 ΝΔΟ (10) 又,hn(c)、f(c)分別係在札⑴)、F(Q)之對數頻率軸上 之傅立葉轉換,可分別表示為如式(n)、式(12)。 122268.doc -15- 200809169 ha(c)f(c)2 71 ΝΔΟ (10) Further, hn(c) and f(c) are Fourier transforms on the logarithmic frequency axes of (1) and F(Q), respectively, which can be expressed as equations (n) and (12, respectively). ). 122268.doc -15- 200809169 ha(c)f(c)

Hn(Q)e-icDdQF(Q)eL dQ (11)(12) 若注意到感測器本體i係對數線形結構,則因為對數頻 率Ω與横樑3之長度方向之位置成比例(共振標5之間隔與 對數頻率Ω之差成比例),所以Ηη(Ω)可看作是橫樑3上之Hn(Q)e-icDdQF(Q)eL dQ (11)(12) If it is noted that the sensor body i is a logarithmic linear structure, since the logarithmic frequency Ω is proportional to the position of the beam 3 in the longitudinal direction (resonance mark) The interval between 5 is proportional to the difference between the logarithmic frequencies Ω, so Ηη(Ω) can be regarded as the beam 3

—種波動。從而’ hn(c)相當於向波動Ηη(Ω)之(空間)頻率 區域之轉換。 巩隹i(c)係以△ C為中心 f(c) =0 (c^o 或 cl2Ac) (13) 此時,式(8)中(5函數之k关1之項為〇, i貝馮ϋ所以僅剩餘ky 之項之貢獻,得式(14)。 =: f(c)dnAilc-^cg (14) (15) 項,依存 ^ Acf(Ac)e^2^^/N, β (c_ 若進行逆傅立葉轉換,則如式(15)。 若注意到依存於Ω之項係 ·△麴 於η之項係稱為e“ 之相位奴轉項,依存 為 之相位旋轉項,則式5) 與頻率盔關而A 〜 )之振幅特性 、平…關而為一定,意味著其 之相移之全通濟波$ η 相-有%為2域 希伯特轉換^ 可知,Η1(Ω)〜ΗΝ(Ω)係則相表現 仗上述之結果可知,控制構造參數,使對數頻率轴上之 122268.doc -16- 200809169 0 頻率特性之傅立葉轉換f(c)成A、黑^ A — 、;乂局滿足式(13)程度之窄帶, • 對於f(C)之振幅巔峰CG,為滿足 〇〇= Δ c=2 7Γ /(Ν Δ Ω ) 而藉由選擇共振頻率比之對數Λ n — a —丄 ^了致△ Ω,可實現猎由N相加 法運算方式之希伯特轉換對輪出。 λ 帛後,若由於考慮共振襟之根數有限之情形之影響,而 假定式(8)之周期5函數行u之範圍為從·KfijK,則可表 ⑩ 現為如式(16)。- a kind of fluctuation. Thus, hn(c) is equivalent to the conversion to the (space) frequency region of the fluctuation Ηη (Ω). Gong Li i(c) is centered on Δ C f(c) =0 (c^o or cl2Ac) (13) At this time, in equation (8) (the function of k of the 5 function is 〇, i shell Feng Wei so only the contribution of the remaining ky item, get the formula (14). =: f(c)dnAilc-^cg (14) (15), dependent ^ Acf(Ac)e^2^^/N, β (c_ If inverse FFT is performed, then (15). If you notice that the term 依 depends on Ω, the term Δ is in the phase of n, which is called the phase rotation term of e, depending on the phase rotation term. Equation 5) The amplitude characteristic with the frequency helmet and A ~ ) is a certain value, which means that the phase shift of the total flux is $ η phase - there is % 2 domain Hibbert conversion ^ know, Η 1 (Ω)~ΗΝ(Ω) is the result of the above. It can be seen that the structural parameters are controlled so that the Fourier transform f(c) of the frequency characteristic of 122268.doc -16-200809169 0 on the logarithmic frequency axis is A, black^ A — ,; the narrow band that satisfies the degree of (13), • For the amplitude peak CG of f(C), by selecting 共振 = Δ c = 2 7 Γ / (Ν Δ Ω ) by selecting the resonance frequency ratio The logarithm Λ n — a — 丄 ^ has caused △ Ω, which can be achieved by the N-phase addition method. After the λ 帛, if the range of the function 5 of the period 5 of the equation (8) is assumed to be from · KfijK due to the influence of the finite number of resonance enthalpy, then Table 10 is now As in formula (16).

Hn(Q) = F(D~nAQ)* f δ(Ω^ΝΔΩ) (χ6) k—κ 該傅立葉轉換為下式(17)。 κ ^ = f (c) ejnAQc· ^ QjkN&amp;QoHn(Q) = F(D~nAQ)* f δ(Ω^ΝΔΩ) (χ6) k—κ This Fourier transform is expressed by the following equation (17). κ ^ = f (c) ejnAQc· ^ QjkN&amp;Qo

k= —K ^ f (c) e531 Δ Ωc · DK (c) (17) • 式中,式(17)之dk(c)以下式(18)表示,其係滿足式(19) 之周期 Δ °^2 π /(ΝΔ Ω ) 之周期函數。k= —K ^ f (c) e531 Δ Ωc · DK (c) (17) • In the formula, dk(c) of the formula (17) is expressed by the following formula (18), which satisfies the period Δ of the formula (19) The periodic function of °^2 π /(ΝΔ Ω ).

Kc)— sin ((K+1/2) 2 π c/ Δ c) (18) tv^— sin (2 π c/ Ac) DO ^ DK(c) K -4 CO =Ac 2 δ (c—kAc) (19) k= — 〇〇 在K為有限之情形,Dk(c)在c==kA c(k為整數)具有高度 122268.doc -17- 200809169 峰值並且,在峰值周邊具有一側△ c/(2K+l)左右 核展P彳之峰值至第1零點為△ c/(2k+i)。藉此,與式 (13)大“目同’ *果式(2〇)成立,則因為藉由乘以⑽,僅 挟持〇Κ⑷中附近,所以與前述相同之討論近似地成 立0 f(c) = 〇 ΔϋKc)— sin ((K+1/2) 2 π c/ Δ c) (18) tv^— sin (2 π c/ Ac) DO ^ DK(c) K -4 CO =Ac 2 δ (c— kAc) (19) k= — 〇〇 In the case where K is finite, Dk(c) has a height of 122268.doc -17- 200809169 at c==kA c (k is an integer) and has one side around the peak △ c / (2K + l) around the peak of P 至 to the first zero point is △ c / (2k + i). Therefore, if the formula (13) is larger than the same, the fruit type (2〇) is established, because by multiplying (10), only the vicinity of 〇Κ(4) is held, so the same discussion as described above approximately holds 0 f(c). ) = 〇Δϋ

Ac (20) &quot;2Κ+Γ ^ 〇 έ 2Δ〇 - 2Κ+1 / 在圖2之振動波檢測裝置之例,㈣,τ以每2冗/3之3相 即時地作為瞬時值獲得希伯特轉換對輸出。從式⑺乃至 Η可知,如每隔Ν·1根選擇之共振樑之共振頻率之比(Ν △ Ω )為一定,則△ Ω亦 』了為不一疋。在△ Ω為一定之情 乂目複數平面上,偏角為等間隔。 又’作為希伯特轉換輪出 ’以亦可不輸出全部N相。例 :5^、、N=4,藉由㈣及2相之輸出,可獲得希伯特轉換 :定=:,如其係對數線形結構自我相似形,則適當 有又共振頻率之間隔,作為㈣,亦可獲得具 K之相位差之2相希伯特轉換對輸出。 一:△: 為一定’即將相鄰之共振樑之共振頻率之比設為 之…二 形,感測器本體1更易於製作,輸出 之處理亦谷易。該情形下,可適當調整心 第3相之輸出㈣與第Μ目之二從弟2相及 y’形’因為偏角每隔&quot;2即不同,所以:第: 弟2相與第4相分別為逆 /、弟3相、 3相)舆虛部(第2相、第4相)之信號—V部⑷相、第 122268.doc -18、 200809169 且 7 pf ηΐι 、Ό从上説明,依據本發明之振動波檢測裝置, 作為瞬時值獲得以&gt;^相表現之希伯特轉換對輸出。 本發明之振動波檢測方法,可在制先前之麥克風及振 感測益之任何場面利用。進而,可在先前不能之如下情 形利用。 乡^於希伯特轉換輸也,可進行時間分解能高之振動、音 響檢測,例如在連續動作之機械瞬時地檢測異常音。又,Ac (20) &quot;2Κ+Γ ^ 〇έ 2Δ〇-2Κ+1 / In the example of the vibration wave detecting device of Fig. 2, (4), τ obtains Heber as an instantaneous value every 2 verbs/3 of 3 phases. Special conversion to output. From equation (7) to Η, it can be seen that if the ratio (Ν Δ Ω ) of the resonance frequency of the resonant beam selected every Ν·1 is constant, Δ Ω is also different. On the complex plane of △ Ω, the angling angle is equal. Also, as a Hibbert conversion round, it is also possible to output all N phases. For example: 5^,, N=4, by the output of (4) and 2 phases, the Hibbert transform can be obtained: ==, if its logarithmic linear structure is self-similar, then there is a proper interval of resonance frequency as (4) A 2-phase Hibbert conversion pair output with a phase difference of K can also be obtained. One: △: It is a certain 'The ratio of the resonance frequency of the adjacent resonant beam is set to... The shape of the sensor body 1 is easier to manufacture, and the processing of the output is also easy. In this case, the output of the third phase of the heart (4) and the second phase of the second phase and the y' shape can be appropriately adjusted because the declination is different every &quot;2, so: 1: brother 2 and 4 The phase is the signal of the inverse part, the 3rd phase, the 3rd phase, the imaginary part (the 2nd phase, the 4th phase) - the V part (4) phase, the 122222.doc -18, 200809169 and 7 pf ηΐι, Ό from the above According to the vibration wave detecting device of the present invention, the Hibbert conversion pair output expressed by &gt; The vibration wave detecting method of the present invention can be utilized in any scene where the previous microphone and vibration sensing are made. Further, it can be utilized in the following cases. In the case of Hibbert conversion, it is possible to perform time-decomposing high-vibration vibration and sound detection, for example, instantaneously detecting abnormal sounds in a continuous motion machine. also,

作為可能性,可實現寬帶AM/FM解調器。並且,可使用Ν 相之冗餘信號檢測雜訊等。 (貫施形態1之變形例) 、圖4顯示在橫樑3兩側設置共振樑5之結構之情形之振動 波檢測裝置之例。在圖4之感測器本體1,橫樑3兩側之共 振樑5具有同一共振頻率,肖置之每-對形成η組共振樑 圖5係顯示使用圖4之感測器本體i之本發明之振動波檢 測裝置之一例之電路圖。在感測器本體i之各共振樑$之變 形產生部分(橫樑3側),形成有壓阻6ι&amp;、6比〜6邮、 (下統稱為屬阻6)。該等複數個壓阻ό並聯連接, 圖5上側之壓阻61a〜6ma 一端與偏壓電壓%之電源乃相連 接。圖5下側之壓阻61b〜6mb之一端與偏壓電壓_v❶之電源 7b相連接。 壓阻6之另一端以正整數,每隔根以共通之線與 運异放大器10之-輸入端子連接。在圖5中,設]^為3,將壓 阻6之另一端每隔3_1=2根與共通之線連接。即,壓阻 122268.doc -19- 200809169 61 bib 、、連异放大器l0a連接,壓阻62a、6孔、… 與運异放大器l〇b連接,壓p且a a 1〇c連接。 1阻63a、㈣、...與運算放大器 運算放大器1〇之+輸入端子接地。每隔μ根連接之輸出 線經由成對之共振樑5nb之録6nb與電㈣連接,所以不 需要虛擬電阻Rd。 在圖5之感測器本體i,成對之共振樑-和地之共振頻 率相同,作為同一相進行加法運算,所以可得到與圖2之 構成相同之結果。在圖5之情形’因為形成上下 動,所以靈敏.度為2倍。 ^ (實施形態2) 圖6係顯示檢測器為電容 測農置之-例之電路圖 ^之本發明之振動波檢 在與各共振樑5之前端部81〜-(以下統稱為前端靖 置= 之半導财基板2。上分別形成有電極9i〜9m(以下統 ^電極9)’以各共振樑5之前端料與之對置之各電極 ,成電谷盗共振樑5之前端部8係位置隨著振動而上下 移動之可動電極。另一方面’在半導體石夕基板別上所形成As a possibility, a broadband AM/FM demodulator can be implemented. Also, you can use the redundant signal of Ν phase to detect noise and so on. (Modification of the first embodiment) FIG. 4 shows an example of a vibration wave detecting device in the case where the resonance beam 5 is provided on both sides of the beam 3. In the sensor body 1 of FIG. 4, the resonant beams 5 on both sides of the beam 3 have the same resonant frequency, and each pair of pairs forms an n-group resonant beam. FIG. 5 shows the invention using the sensor body i of FIG. A circuit diagram of an example of a vibration wave detecting device. In the deformed portion (the side of the beam 3) of each of the resonant beams $ of the sensor body i, a piezoresistive 6 ι &amp; 6 to -6 is formed, (hereinafter collectively referred to as genus 6). The plurality of piezoresistive turns are connected in parallel, and one end of the piezoresistors 61a to 6ma on the upper side of Fig. 5 is connected to a power source of a bias voltage of %. One end of the piezoresistors 61b to 6mb on the lower side of Fig. 5 is connected to the power source 7b of the bias voltage _v❶. The other end of the piezoresistive resistor 6 is connected by a positive integer, and is connected to the input terminal of the operational amplifier 10 by a common line. In Fig. 5, it is assumed that 3 is the same, and the other end of the piezoresistive 6 is connected to the common line every 3_1=2. That is, the piezoresistive 122268.doc -19- 200809169 61 bib, the junction amplifier 10a is connected, the piezoresistive resistors 62a, 6 holes, ... are connected to the operational amplifier l〇b, and the voltage p and a a 1〇c are connected. 1 resistance 63a, (four), ... and the operational amplifier The operational amplifier 1〇 + input terminal is grounded. The output line connected every μ is connected to the electric (4) via the recording 6nb of the pair of resonant beams 5nb, so the dummy resistor Rd is not required. In the sensor body i of Fig. 5, the resonance frequency of the pair of resonance beams and the ground is the same, and the same phase is added, so that the same results as those of Fig. 2 can be obtained. In the case of Fig. 5, since the up and down motion is formed, the sensitivity is twice. ^ (Embodiment 2) FIG. 6 is a circuit diagram showing a case where the detector is a capacitance measuring device. The vibration wave of the present invention is detected at the front end portion 81 of each of the resonant beames 5 (hereinafter referred to as front end setting = The semi-conducting substrate 2 is formed with electrodes 9i to 9m (hereinafter referred to as electrodes 9)', and the electrodes opposite to the front ends of the respective resonant beams 5 are formed to form the front end portion 8 of the electric smashing resonance beam 5. a movable electrode that moves up and down with vibration. On the other hand, it is formed on the semiconductor substrate.

為其位置不移動之固定電極。並且,若共振襟W 特疋頻率振動,則因為其對向電極間之距離變動,所以電 容器之容量亦改變。 所以電 夂複數個電極9並聯連接,與㈣電心之電源7a連接。 之前端部8隸為正整數,每隔叫根以共通之線 ”運异放大㈣之-輸入端子連接。將如此之構成稱為N相 122268.doc •20- 200809169 加法運算方式。圖6中,設N為3,將前端部8每隔3-1=2根 以共通之線連接。即,前端部81、…與運算放大器1^連 接’前端部82、…與運算放大器10b連接,前端部83、.·· 與運算放大器l〇c連接。運算放大器1〇之+輸入端子接地。 每隔Ν'4根連接之共通之線經由虛擬電阻Rd與負電壓-ν〇之 電源7 b連接。A fixed electrode whose position does not move. Further, if the resonance 疋W is particularly vibrating at a frequency, the capacity of the capacitor also changes because the distance between the opposing electrodes fluctuates. Therefore, the plurality of electrodes 9 are connected in parallel and connected to the power source 7a of the (four) core. The front end 8 is a positive integer, and the input terminal is connected by a common line "transportation amplification" (fourth). The composition is called N phase 122268.doc •20- 200809169 Addition method. N is set to 3, and the front end portion 8 is connected by a common line every 3-1=2. That is, the front end portion 81, ... is connected to the operational amplifier 1^, and the front end portion 82 is connected to the operational amplifier 10b. The unit 83, . . . is connected to the operational amplifier l〇c. The input terminal of the operational amplifier 1〇 is grounded. The common line of the '4 connections is connected to the power supply 7 b of the negative voltage -ν〇 via the dummy resistor Rd. .

圖6之振動波檢測裝置與圖2之壓阻6之感測器本體^相 比’除振動波所對應之電阻和電容器之變化之相位不同之 外,與實施形態1完全相同。因而,即使檢測器為電容 态,藉由每隔N-1根進行加法運算,亦可即時地作為瞬時 值獲得希伯特轉換對輸出。 (實施形態2之變形例) 圖7顯示在橫樑3兩側設置共振樑5之構造下檢測器為電 容器之情形之振動波檢測裝置之例。 與實施形態丨所對應之變形例(圖5)一樣,橫樑3兩側之 共振樑5具有同-共振頻率,以對置之每丨對形成^組共振 樑5。在與各共振樑5之前端部81&amp;、8ib〜8ma、(以下 統稱為前端部8)對置位置之半導體矽基板2〇上,分別形成 有電極9 i a、9 i b~9ma、9mb(以下統稱為電極9),以各共振 樑5之丽端部8和與之對置之各電極9構成電容器。 圖7之上側電極91a〜9ma與偏壓電壓%之電源^連接。 7之下側電極91b〜9mb與偏壓電壓_Vq之電源几連接。各 «5之前端部為正整數,每隔根以共通之線與 算放大HH)之·輸人端子連接。在圖7巾,設吻,將前 122268.doc •21 · 200809169 部8每隔3-1=2根以共通之線連接。即,前端部8^、 81b 與運异放大盗10a連接,前端部82a、82b、…與運 算放大IllOb連接,前端部83a、83b、...與運算放大器i〇c 連接。運算放大器10之+輸入端子接地。The vibration wave detecting device of Fig. 6 is identical to the sensor body of the piezoresistive resistor 6 of Fig. 2 except that the phase of the change in the resistance and the capacitor corresponding to the vibration wave is different. Therefore, even if the detector is in a capacitive state, the Herbert transform pair output can be obtained instantaneously as an instantaneous value by performing addition every N-1. (Modification of Second Embodiment) Fig. 7 shows an example of a vibration wave detecting device in the case where the detector is a capacitor in the structure in which the resonant beam 5 is provided on both sides of the beam 3. Similarly to the modification (Fig. 5) corresponding to the embodiment, the resonant beam 5 on both sides of the beam 3 has the same-resonant frequency, and the pair of resonant beams 5 are formed in pairs opposite each other. Electrodes 9 ia, 9 ib~9ma, and 9 mb are formed on the semiconductor cymbal substrate 2 对 at positions opposite to the front end portions 81 &amp; 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 Referring collectively to the electrode 9), a capacitor is formed by the end portion 8 of each of the resonant beams 5 and the respective electrodes 9 opposed thereto. The upper side electrodes 91a to 9ma of Fig. 7 are connected to the power source ^ of the bias voltage %. The lower side electrodes 91b to 9mb are connected to the power source of the bias voltage _Vq. Each of the «5 front ends is a positive integer, and each of the roots is connected to the input terminal by a common line and the amplification HH. In the towel of Figure 7, set the kiss, the first 122268.doc • 21 · 200809169 part 8 every 3-1 = 2 are connected by a common line. That is, the front end portions 8^, 81b are connected to the transport magnifier 10a, the front end portions 82a, 82b, ... are connected to the operational amplifier 110b, and the front end portions 83a, 83b, ... are connected to the operational amplifier i?c. The + input terminal of the operational amplifier 10 is grounded.

圖7之振動波檢測裴置與圖5之壓阻6之感測器本體1相 比,除振動波所對應之電阻和電容器之變化之相位不同以 外,與實施形態i之變形例完全相同。目❿,即使檢測器 為電容器,藉由每隔N·1根實施加法運算,可得到希伯特 轉換對輸出。又’與圖6之一側共振樑5之構成相比,為電 容器之差動輸出。 、如以上説明,依據本發明之振動波檢測裝置,即使在檢 測器為電容器之情形’亦可即時地作為瞬間值獲得希 轉換對輸出。 勒收杈娜裝且〜π T,,以每 2 7Γ /3之3相可獲得希伯特轉換 褥換對輪出。若每隔沁1根選择 之共振樑之共振頻率之比(N △ 〇 1 ΔΩ)為一定,則亦可為 不一定。又,在△ Ω為一定之情 h I ’ Ν相在複數平面上, 偏角為等間隔。又,亦可不給φ π 门不輸出Ν相全部,此等與實施形 恶1亦相同。 此外,前述硬體構成係一例,可杯立 J任思地變更及修正。 本申清基於2006年ό月27曰申1 1771〇〇 , 申印之日本國特願2006- 177199號。在本説‘明書中, 1 771 00^- . 1糸翏妝日本國特願2006- “兄月曰、專利請求範圍和全部圖式而完成者。 [產業之可利用性] 122268.doc -22- 200809169 1發明可利用於檢測聲波頻率之振 【圖式簡單說明】 置#。 圖1係顯示本發明之振動波檢測 例之圖。 t砍測益本體之一 圖2係顯示本發明之振動波檢測裝置之—例之電 圖圖3係模式性地顯㈣❹本體之共振樑之頻率特性之 示在㈣兩側設置共振樑之構造之情形 态本體之例之圖。 :係顯示使用圖4之感測器本體之本發明之振動波檢測 展置之一例之電路圖。 係顯示檢測器為電容器之情形之本“之振㈣檢 測裝置之一例之電路圖。 」7係,在橫樑兩側設置共振樑之構造下檢測器為電 谷裔之鉍形之振動波檢測裝置之例之圖。 n顯示輸出各共振樑之輸出之和㈣阻方式之振動 波才欢/对裝置之一 J列之電路圖。 圖9係顯示使用複數個㈣線之I阻方式之振動波檢測 裝置之一例之電路濁。 【主要元件符號說明】 2 3 4 感測器本體 隔膜 横樑 終止板 122268.doc -23- 200809169The vibration wave detecting means of Fig. 7 is identical to the sensor body 1 of the piezoresistive resistor 6 of Fig. 5 except that the phase of the change of the resistance corresponding to the vibration wave and the capacitor is different, and is completely the same as the modification of the embodiment i. It is seen that even if the detector is a capacitor, the Hubert conversion pair output can be obtained by performing addition every N·1. Further, it is a differential output of the capacitor as compared with the configuration of the one side resonance beam 5 of Fig. 6. As described above, according to the vibration wave detecting device of the present invention, even if the detector is a capacitor, the output of the pair can be obtained instantaneously as an instantaneous value. Retracting the enamel and ~π T, you can get the Hibbert conversion for every 3 7 Γ /3 of 3 phases. If the ratio of the resonance frequency (N Δ 〇 1 ΔΩ) of the resonant beam selected every other one is constant, it may not be necessary. Further, when Δ Ω is constant, h I ′ Ν phase is on the complex plane, and the off-angles are equally spaced. Further, it is also possible not to output the Ν phase to the φ π gate, and the same as the implementation of the sinus 1. In addition, the above-mentioned hardware configuration is an example, and can be changed and corrected. This Shen Qing is based on the 27th of January 2006, 1 1771〇〇, and the Japanese National Patent No. 2006-177199. In the book, '1, 771 00^-. 1 糸翏 日本 日本 2006 - 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 2006 268 268 268 268 268 268 268 268 122 兄 兄 兄 兄 兄 兄 兄 兄 兄 兄 兄 兄 兄 兄 122 122 122 122 122 122 122 -22- 200809169 1 invention can be used to detect the vibration frequency of the sound [simplified description of the drawing]. Figure 1 is a diagram showing the vibration wave detection example of the present invention. The vibration wave detecting device is an electrogram of an example. Fig. 3 is a schematic diagram showing the frequency characteristics of the resonant beam of the body of the 四 (4) 在 在 在 在 在 在 在 : : : : : : : : : : : : : : Fig. 4 is a circuit diagram showing an example of the vibration wave detecting spread of the present invention of the sensor body. A circuit diagram showing an example of the "vibration (four) detecting means of the case where the detector is a capacitor. Fig. 7 is a diagram showing an example of a vibration wave detecting device in which a detector is provided with a resonant beam on both sides of a beam. n shows the sum of the outputs of the output resonant beams. (4) The vibration mode of the resistance mode is one of the devices. Fig. 9 is a view showing an example of a circuit turbidity of an example of a vibration wave detecting device using an I-resistance mode of a plurality of (four) lines. [Main component symbol description] 2 3 4 Sensor body Diaphragm Beam Termination plate 122268.doc -23- 200809169

51、52、53、54、5m、 51a、51b、52a、52b、 5na、5nb、5ma、5mb 共振樑 61、62、63、64、6m、 壓阻 61a、61b、62a、62b、 63a、63b、6ma、6mb 7a、7b 電源 81、82、83、8n、8m、 81a、81b、82a、82b、 83a、83b、8ma、8mb 如端部 91、92、93、9n、9m、 91a、91b、92a、92b、 93a、93b、9ma、9mb 電極 10a 、 10b 、 10c 運算放大器 20 半導體碎基板51, 52, 53, 54, 5m, 51a, 51b, 52a, 52b, 5na, 5nb, 5ma, 5mb resonant beams 61, 62, 63, 64, 6m, piezoresistive 61a, 61b, 62a, 62b, 63a, 63b , 6ma, 6mb 7a, 7b power supplies 81, 82, 83, 8n, 8m, 81a, 81b, 82a, 82b, 83a, 83b, 8ma, 8mb such as ends 91, 92, 93, 9n, 9m, 91a, 91b, 92a, 92b, 93a, 93b, 9ma, 9mb electrodes 10a, 10b, 10c operational amplifier 20 semiconductor chip substrate

I22268.doc -24-I22268.doc -24-

Claims (1)

200809169 十、申請專利範圍: 1 · 一種振動波檢測方法,其係 H肌%狄恃猶芏在互不相同 共振子⑺〜…測前述各4:頻率共振之複數 為·· “振子之振動,其特 排列琢述複數個共振子,使各 笪a拉此* /、振子之位置呈盥^ 專共振頻率之對數成比例之對數線形, 呈…200809169 X. Patent application scope: 1 · A vibration wave detection method, in which the H muscle % Di 恃 恃 芏 芏 互 互 互 ( ( ( ( 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测 测The special arrangement of a plurality of resonators is arranged such that each 笪a pulls this */, and the position of the vibrator is a logarithmic linear shape proportional to the logarithm of the specific resonance frequency, ... 設N為2以上之整數,每隔 , 工^ , 根璉擇前述複數俩 子,輸出對該檢測器之輸出進行 /、. 信號。 忐運异所得之複數$ 2·如請求項!之振動波檢測方法,其中 前述複數個共振子,為使前述複數之共振子之每隔* 述N-i根之前述共振子之共振頻率之比為一定,設定立 排列前述共振子之共振頻率。 3·如請求们之振動波檢測方法,其令前述以3以上之售 數0 4· 一種振動波檢測裝置,其特徵為具備 共振子行(51〜5m),其係將在互不相同之特定頻率共 振之複數個共振子(51〜5m)排列,使各個共振子之位置 呈與其4之共振頻率的對數成比例之對數線形者; 檢測器(61〜6m),其係檢測出藉由傳播至前述共振子 行之振動波而引起之前述複數之共振子分別之振動者; 複數個輸出合成部(l〇a〜l〇c),其係將^^設為二以上之整 數,每·.隔N-1根選擇前述複數個共振子,對該檢測器之 122268.doc 200809169 輸出進行加法運算者。 5.如味求項4之振動波檢測裝置,其中 為使前述複數個共振子之每隔N]根之前 共振頻率之卜袁_令 &amp; 、、子之 比為一疋,則述共振子行係設 之共振頻率排列。 疋則述共振子 6·如凊求項4之振動波檢測裝置, &amp; 數。 /、中則述N為3以上之整Let N be an integer of 2 or more, and select the above two complexes every time, and output the /,. signal to the output of the detector. The plural of the income of the different income $ 2 · such as the request! In the vibration wave detecting method, the plurality of resonators are arranged such that the resonance frequency of the resonators is arranged such that the ratio of the resonance frequencies of the resonators of the N-i roots of the plurality of resonators is constant. 3. The vibration wave detecting method of the requester, wherein the vibration wave detecting device of 3 or more is provided. The vibration wave detecting device is characterized in that it has a resonance sub-row (51 to 5 m), and the system is different from each other. a plurality of resonators (51 to 5 m) of a specific frequency resonance are arranged such that the positions of the respective resonators are logarithmic linear in proportion to the logarithm of the resonance frequency of 4; the detector (61 to 6 m) is detected by a vibration that propagates to the vibration wave of the resonator row and causes the vibration of the plurality of resonators; a plurality of output synthesis sections (l〇a~l〇c), which are set to two or more integers, each The above-mentioned plurality of resonators are selected every N-1, and the output of the detector 122268.doc 200809169 is added. 5. The vibration wave detecting device according to claim 4, wherein the resonance sub-row is performed so that the ratio of the resonance frequency of each of the plurality of resonators before the N-th resonance frequency is one 疋The resonant frequency of the system is arranged.疋 共振 共振 共振 · · · · · · 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动 振动/, in the middle, the N is more than 3 其中别述檢測器為壓阻 八旬述檢測器係電容 7 ·如請求項4之振動波檢測裝置, (61 〜6m) 〇 8·如請求項4之振動波檢測裝置, 性元件(81〜8m、91〜9m)。 122268.docThe detector is a piezoresistive octagonal detector system capacitor. 7. The vibration wave detecting device of claim 4, (61 to 6m) 〇8. The vibration wave detecting device of claim 4, the sexual component (81~ 8m, 91~9m). 122268.doc
TW96123309A 2006-06-27 2007-06-27 Vibrational wave detection method, and vibrational wave detector TW200809169A (en)

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