[go: up one dir, main page]

TWI323340B - Vibrational wave detection method, and vibrational wave detector - Google Patents

Vibrational wave detection method, and vibrational wave detector Download PDF

Info

Publication number
TWI323340B
TWI323340B TW96116915A TW96116915A TWI323340B TW I323340 B TWI323340 B TW I323340B TW 96116915 A TW96116915 A TW 96116915A TW 96116915 A TW96116915 A TW 96116915A TW I323340 B TWI323340 B TW I323340B
Authority
TW
Taiwan
Prior art keywords
resonators
output
vibration wave
frequency
detector
Prior art date
Application number
TW96116915A
Other languages
Chinese (zh)
Other versions
TW200813407A (en
Inventor
Shigeru Ando
Naoki Ikeuchi
Original Assignee
Univ Tokyo
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tokyo, Tokyo Electron Ltd filed Critical Univ Tokyo
Publication of TW200813407A publication Critical patent/TW200813407A/en
Application granted granted Critical
Publication of TWI323340B publication Critical patent/TWI323340B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/06Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means
    • G01H11/08Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means using piezoelectric devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Description

1323340 九、發明說明: 【發明所屬之技術領域】 本發明關於振動纟檢測方法及裝^,該振動&檢測方法 使用共振頻料同之複數個絲器對振動波之各頻帶之強 度進行電性檢測。 【先前技術】 有如下共振器陣列型振動感測器,其排列共振頻率不同 之複數個共振器,使各共振器以特定之共振頻率對於聲波 等振動波選擇性地應答並共振,且將該各共振器之共振位 準轉換為電性仏號後輸出,並對振動波之各頻帶之強度進 行檢測(例如,非專利文獻丨或者非專利文獻2)。 先前之振動感測器中,於共振器之支持部附近形成壓致 電阻(Piezoresist職)’藉由惠斯登電橋等對因共振器之振 動(共振)而引起之壓致電阻之電阻值的變化進行檢測,並 ^共振H輸出電性輸出信號。尤其於非專利文獻2之感測 器中,一面藉由多工器切換各共振器之惠斯登電橋輸出, 一面獲得輸出信號。 提出有藉由共振器陣列型之簡易電路構成,而控制輸入 振動波之特定頻帶之增益的方法(專利文獻丨或專利文獻 2)1例如專利文獻1之技術中,於共振器陣列型之振動感 測器中,使各共振樑中所設定之各壓致電阻並聯連接。藉 由改變施加至該並聯電路之電源電壓,或者,改變壓致電 阻之形狀而改變電阻值,可控制特定頻帶之増益。 又,專利文獻2之技術中,利用畸變之大小與共振樑之 120994.doc 1323340 位置相應而不同’對各共振樑中設定壓致電阻的位置進行 調整,以使各頻帶之輸出信號之位準達到所希望之位準, 從而控制特定頻帶之增益。 非專利文獻 1 : W. Benecke et al·,"a Frequency_Selective, Piezoresistive Silicon Vibration Sensor," Digest of Technical Papers 〇f TRANSDUCERS^855 pp.105-108 (1985) 非專利文獻2 : E. peeters et al,”Vibrati(m Signatui<e1323340 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a vibrating radon detecting method and apparatus for vibrating the intensity of each frequency band of a vibration wave using a resonant frequency material and a plurality of filaments. Sex detection. [Prior Art] There is a resonator array type vibration sensor in which a plurality of resonators having different resonance frequencies are arranged, so that each resonator selectively responds to and resonates with a vibration wave such as a sound wave at a specific resonance frequency, and The resonance level of each resonator is converted into an electrical nickname and output, and the intensity of each frequency band of the vibration wave is detected (for example, Non-Patent Document 2 or Non-Patent Document 2). In the prior vibration sensor, a piezoresistive resistor (Piezoresist) was formed near the support portion of the resonator. The resistance value of the piezoresistive resistor caused by the vibration (resonance) of the resonator by a Wheatstone bridge or the like The change is detected, and the resonance H outputs an electrical output signal. In particular, in the sensor of Non-Patent Document 2, the output of the Wheatstone bridge of each resonator is switched by the multiplexer, and an output signal is obtained. A method of controlling the gain of a specific frequency band of an input vibration wave by a simple circuit configuration of a resonator array type (Patent Document 2 or Patent Document 2) 1 is, for example, a technique of the resonator array type in the technique of Patent Document 1. In the sensor, the respective piezoresistive resistors set in the respective resonant beams are connected in parallel. The benefit of a particular frequency band can be controlled by varying the supply voltage applied to the parallel circuit, or by changing the shape of the voltage resistive resistor to change the resistance value. Further, in the technique of Patent Document 2, the magnitude of the distortion is different from the position of the resonant beam of 120994.doc 1323340. 'The position of the piezoresistive in each resonant beam is adjusted so that the output signal of each frequency band is leveled. The desired level is reached to control the gain of a particular frequency band. Non-Patent Document 1: W. Benecke et al., "a Frequency_Selective, Piezoresistive Silicon Vibration Sensor," Digest of Technical Papers 〇f TRANSDUCERS^855 pp. 105-108 (1985) Non-Patent Document 2: E. peeters et Al," Vibrati (m Signatui<e

Analysis Sensors for Predictive Diagnostics/· Proceedings of SPIEf97, vol. 3224, pp‘ 220-230 (1997) 專利文獻1 .日本專利特開2000-46639號公報 專利文獻2 :日本專利特開2〇〇〇_46640號公報 【發明内容】 [發明所欲解決之問題]Analysis Sensors for Predictive Diagnostics/· Proceedings of SPIEf97, vol. 3224, pp' 220-230 (1997) Patent Document 1. Japanese Patent Laid-Open Publication No. 2000-46639 Patent Document 2: Japanese Patent Laid-Open No. 2-46640 No. [Invention] [The problem to be solved by the invention]

關於對振動現象或聲響信號進行處理方面,將信號表現 為複數,可進行振幅/相位之瞬時檢測或信號之解調變等 各種解析或轉換^麥克風為首之先前之聲響/振動感測 裔,係將各時刻之聲壓等物理量轉換為電性信號之装置, 輸出係單一之即時信號。一般而言…將即抑號轉換 為所對應之複數信號,必須進行下述被稱作希爾伯 之運算。該運算為非因《,無法對寬頻帶信號即 、 運算。因Λ ’對於信號之複數表現之可實際運用而言= 於如於通信領域中進行處理般之窄頻帶信號。 、 解析函數之實部與虛部之間,一般存在如下 轉換之關係(曰本數學會編輯,⑴ 爾伯特 +致予會,.扁輯,岩波數學辭典第3版 120994.doc 1323340Regarding the processing of vibration phenomena or acoustic signals, the signal is expressed as a complex number, and various amplitudes/phases can be detected, or signals can be demodulated, and various kinds of analysis or conversion, such as the previous sound/vibration sensing of the microphone, are used. A device that converts physical quantities such as sound pressure at various times into electrical signals, and outputs a single instantaneous signal. In general, the conversion of the suffix to the corresponding complex signal must be performed as described below. This operation is non-caused, and it is impossible to calculate the wideband signal. Since Λ 'is practical for the complex performance of the signal = a narrow-band signal as processed in the field of communication. Between the real part and the imaginary part of the analytic function, there is generally the following conversion relationship (Editor of the Mathematical Society, (1) Erbert + to the meeting, the flat series, the rock wave mathematical dictionary 3rd edition 120994.doc 1323340

(1985) , 520頁)。 於複變數2 = \+』丫之上半平面(yg〇)上,於正則函數 彡(Z) = U(X、y)+jV(x、y) 之實軸上之邊界值 f(x)=U(x、〇)、g(x)=_v(x、〇) 之間,f、g為實數上之可積分之函數(f、geL1(00、 時,存在如下 [數1] g(x) = -p.v.£ifc±〇dt f(x)工·νΤ£ί^ ⑴ n t 之關係。此處p.V.係表示Cauchy之主值 [數2] 將g稱作f之希爾伯特轉換(Hilbert transform),將f與㈣ 作希爾伯特轉換對。希爾伯特轉換係連接解析函數之實部 與虛部之函數。 對於物理現象、尤其振動現象而言,於複數平面上解析 則較為便利…般而言,振動現象中,藉由歐拉公式 J c〇se+jSlne ’實#與虛部存在—者為另—者之微分之關 如,相對於變位或速度,存在速度或加速度之關 ”。為了根據瞬時值把握現象,僅知道存在其等之關係之 120994.doc 1323340 -者之資訊(例如變位)並不充分,必須知道兩者(例如變位 與速度)。 因實邛與虛部之關係成為希爾伯特轉換對,故藉由上述 g或者f之式可導出另-者,如式⑴所示般表現為卜_) 之區間之積分,必須對某期間(週期函數中至少為】週期)進 行觀測。先前之振動波檢測裝置令,僅可檢測一者之資 訊。若可利用瞬時值檢測實部與虛部兩者之資訊,則可瞬 時把握現象。 例如,如專利文獻丨所示般,藉由與共振樑之共振頻率 相應之壓致電阻檢測器之偏壓電壓賦予,則實現可動態變 更之頻率特性。然而先前之方法中,振動波檢測之負載限 弟J為正負之只數,無法賦予實現任意之脈衝應答所需要之 複數負載。 本發明㈣於上述情況開發而成者,其目的在於提供一 種可賦予任意之複數負載之振動波檢測方法及裝置。 [解決問題之技術手段] 本發明之第1觀點之振動波檢測方法,其特徵在於:其 係將振動波傳播於各自肖不同(特定頻率共振之複數個共 振器,以設在各上述共振器之檢測器檢測伴隨由各上述共 振器之上述頻率而產生之共振的電性輸出者,且 以上述複數個共振器之檢測器共通之頻率將相位不同之 交流偏壓電壓施加至各共振器; 合成上述複數個共振器之檢測器之輸出。 再者,於施加該交流偏壓電壓之上述複數個共振器中的 120994.doc 1323340 至少1個共振器,上述交流偏壓電壓之 尤其,將上述複數個共振器分為複數個不群问針料各 :群共通之振幅與相位之上述交流偏壓電壓 各群所包含之共振器。 王 較好的是,以濾波器抽出上述複數個共振器 合成之輸出的上旁波帶’藉由正交相關檢測輸 轉換對之信號。(1985), 520 pages). On the semi-plane (yg〇) above the complex variable 2 = \+ 丫, the boundary value f(x) on the real axis of the regular function 彡(Z) = U(X, y)+jV(x, y) ) = U (x, 〇), g (x) = _v (x, 〇), f, g is a function of the integral on the real number (f, geL1 (00, when, there is the following [number 1] g (x) = -pv£ifc±〇dt f(x)工·νΤ£ί^ (1) nt relationship. Here pV is the main value of Cauchy [number 2] H is called the Hilbert transform of f (Hilbert transform), f and (4) are Hilbert transform pairs. The Hilbert transform is a function that connects the real and imaginary parts of the analytic function. For physical phenomena, especially vibration phenomena, parsing on a complex plane It is more convenient... Generally speaking, in the vibration phenomenon, the Euler's formula J c〇se+jSlne 'real # and the imaginary part exist—the differential of the other is, as opposed to the displacement or speed, exists "Speed or acceleration". In order to grasp the phenomenon according to the instantaneous value, only know the existence of its relationship 120994.doc 1323340 - the information (such as displacement) is not sufficient, you must know both (such as displacement and speed) Because of reality and imaginary The relationship becomes a Hilbert transform pair, so the above-mentioned g or f can be derived as another, and the integral of the interval expressed as b_) as shown in the formula (1) must be for a certain period (at least in the periodic function) 】Period) observation. The previous vibration wave detection device allows only one information to be detected. If the instantaneous value can be used to detect the information of both the real part and the imaginary part, the phenomenon can be grasped instantaneously. For example, as in the patent literature丨As shown, the frequency characteristic of the voltage-resistance detector corresponding to the resonant frequency of the resonant beam is given, and the dynamically changeable frequency characteristic is realized. However, in the previous method, the load limit of the vibration wave detection is positive and negative. The present invention (4) has been developed in the above-described circumstances, and an object thereof is to provide a vibration wave detecting method and apparatus capable of imparting an arbitrary complex load. A method for detecting a vibration wave according to a first aspect of the present invention is characterized in that the vibration wave is propagated to each other differently (a plurality of resonances of a specific frequency) The resonator detects an electrical output associated with the resonance generated by the respective frequencies of the resonators by a detector provided in each of the resonators, and the phases are different at a frequency common to the detectors of the plurality of resonators An AC bias voltage is applied to each of the resonators; an output of the detector of the plurality of resonators is synthesized. Further, at least one resonator is 120994.doc 1323340 of the plurality of resonators to which the AC bias voltage is applied, In particular, the AC bias voltage divides the plurality of resonators into a plurality of resonators, each of which includes a resonator included in each group of the AC bias voltages having a common amplitude and phase. Preferably, the king extracts the upper sideband of the output synthesized by the plurality of resonators by a filter to detect the signal of the pair by orthogonal correlation detection.

再者’亦刊用無線電將上述複㈣共振^之檢測 合成之輸出傳送至上述濾波器。 本發明之第2觀點之振動波檢測裝置的特徵在於包括: 複數個共振器,其等各自與不同之特定頻率共振; ,檢測器,其檢測伴隨由傳播於上述複數個共振器之振動 波:產生之各上述共振器在上述頻率之共振的電性輸出, 且設在上述複數個共振器各個中; 偏壓施加機構’其以設在上述複數個共振器各個中之檢Furthermore, the output of the detection and synthesis of the above complex (four) resonances is transmitted to the above filter by radio. A vibration wave detecting device according to a second aspect of the present invention is characterized by comprising: a plurality of resonators each resonating with a different specific frequency; and a detector for detecting a vibration wave accompanying propagation from said plurality of resonators: And generating an electrical output of each of the resonators at a resonance of the frequency, and providing each of the plurality of resonators; and applying a biasing mechanism to each of the plurality of resonators

之檢測器所 出希爾伯特 測器共通之頻率將相位不同之交流偏麼電廢施加至各上 共振器;及 輸出口成機構,其合成設在上述複數個共振器各個中之 檢測器之輸出。 再者,以上述偏壓施加機構施加之上述交流偏壓電壓於 上述複數個共振器中的至少1個共振器,具有不同之振 幅。 尤/、’上述偏壓施加機構將上述複數個共振器分為群, 子^各群’將共通之振幅與相位之交流偏壓電壓施加至 I20994.do 丨 各群之共振器。 較好的是包括: 濾波機構,其自以上述輸出合成機構合成 出之合成輸出,對上旁波帶進行濾波後抽出 設在上述複數個共振器各個中;及 一正讀波機構,其對以上述遽波機構抽出之上旁波帶進 仃正交相關檢測,並輸出希爾伯特轉換對之信號。The frequency common to the Hilbert detector of the detector is applied to the upper resonators with different phase AC biases; and the output port forming mechanism is synthesized by the detectors disposed in each of the plurality of resonators The output. Further, the AC bias voltage applied by the bias applying means has at least one of the plurality of resonators having different amplitudes. In particular, the bias applying means divides the plurality of resonators into groups, and the subgroups apply a common alternating current amplitude and phase alternating bias voltage to the resonators of the group I20994.do. Preferably, the method includes: a filtering mechanism that synthesizes the synthesized output synthesized by the output synthesizing mechanism, filters the upper sideband and extracts each of the plurality of resonators; and a positive reading mechanism, the pair The above-mentioned chopping mechanism extracts the above-mentioned adjacent wave band into the quadrature correlation detection, and outputs the Hilbert conversion pair signal.

再者#可包括無線傳送機構,其利用無線電將以上述 輸出合成機構合成之檢測器之輸出的合成輸出傳送至上述 據波機構,上述檢測器設在上述複數個共振器各個中。 較好的是,上述檢測器係壓致電阻。 又’上述檢測器亦可係電容性之元件。 [發明之效果]Further, # may include a wireless transmission mechanism that transmits, by radio, a composite output of the output of the detector synthesized by the output synthesizing mechanism to the trajectory mechanism, wherein the detector is provided in each of the plurality of resonators. Preferably, the detector is a piezoresistive. Further, the above detector may be a capacitive element. [Effects of the Invention]

之檢測器的輸 ’上述檢測器 根據本發明之振動波檢測方法及振動波檢測裝置,可實 現任思之複數負載。並且,增加任意之複合頻率特性可作 為具有實部與虛部之2自由度的RF (Radio Frequency,射 頻)調變信號而讀出、傳送。 【實施方式】 以下,一面參照圖式一面詳細說明本發明之實施形態。 再者,對圖中相同或者相當部分附上相同符號,其說明不 再重複。以下,以將檢測對象之振動波作為聲波之聲響感 測器為例加以說明。 圖1係表示本發明之振動波檢測裝置之感測器本體之一 例的圖。形成於半導體石夕基板20上之感測器本體1包括: 120994.doc U23340 接受輸入聲波之膜片2 ;肖膜片2連接之i個橫樑3 ;與橫標 3之前端連接之終止板4 ;以及於橫樑3之兩側,受到一側 支持之複數(η個)個共振樑51a、51b〜5na、5nb(以下,總稱 為共振樑5),該等所有部分由半導體碎而形成^心之 兩侧之共振樑5具有相同之共振頻率,以相對向為喟,形 成有η組之共振樑5。The detector of the above detector is exemplified by the vibration wave detecting method and the vibration wave detecting device of the present invention. Further, an arbitrary composite frequency characteristic can be added and read and transmitted as an RF (Radio Frequency) modulation signal having two degrees of freedom between the real part and the imaginary part. [Embodiment] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, the same or equivalent parts are attached to the same symbols in the drawings, and the description thereof will not be repeated. Hereinafter, an acoustic sensor that uses a vibration wave to be detected as a sound wave will be described as an example. Fig. 1 is a view showing an example of a sensor body of the vibration wave detecting device of the present invention. The sensor body 1 formed on the semiconductor substrate 20 comprises: 120994.doc U23340 a diaphragm 2 that receives an input sound wave; i beams 3 connected by a Xiao film 2; a termination plate 4 connected to a front end of the banner 3; And on both sides of the beam 3, a plurality of (n) resonant beams 51a, 51b 5 5na, 5nb (hereinafter collectively referred to as a resonant beam 5) supported by one side, all of which are formed by semiconductor shattering The resonance beams 5 on both sides have the same resonance frequency, and the resonance beams 5 of the n groups are formed in the opposite direction.

本實施形態中,為了使數學處理變得簡單而容易理解, 於橫樑3之兩側,使具有相同共振頻率之共振樑成對地配 置。即使共振樑5僅配置於橫樑之—側,亦可獲得相同之 結果。然而,此時,感測器之靈敏度為1/2。 橫樑3之寬度於膜片2端為最粗,自膜片㈣開始隨著向 終止板4側而逐漸變細,且於終止板4端為最細。又,各共 振樑5為共振H ’該共振器以特定㈣共振的方 ^ 到了調整。 a何· 示之共振頻率f而選In the present embodiment, in order to make the mathematical processing simple, it is easy to understand that the resonant beams having the same resonance frequency are arranged in pairs on both sides of the beam 3. Even if the resonant beam 5 is disposed only on the side of the beam, the same result can be obtained. However, at this time, the sensitivity of the sensor is 1/2. The width of the beam 3 is the thickest at the end of the diaphragm 2, and gradually tapers from the side of the diaphragm (4) toward the side of the terminating plate 4, and is the thinnest at the end of the terminating plate 4. Further, each of the resonance beams 5 is a resonance H' which is adjusted by the specific (four) resonance. a? Show the resonance frequency f and choose

s亥等複數個共振樑5以下述(3)式所表 擇性地應答振動。 [數3]A plurality of resonant beams 5 such as shai respond to vibrations in a selective manner by the following formula (3). [Number 3]

CaVY (3) 其中’C:由實驗而決定之常數 a :各共振樑5之厚度 X:各共振樑5之長度 γ:材料物質(半導體矽)之揚氏模量 s:材料物質(半導體矽)之密度 120994.doc •12· 1323340 由上述(3)式可知,藉由改變共振樑5之厚度以者長度 X’可將其共振頻率£設定為預期值。各共振樑5具有固有 之共振頻率。本例中’將所有共振標5之厚度a設為固定, 且使其長度X隨著自右側(膜片2側)向左側(終止板4側)而逐 漸變長,隨著自右側(膜片2侧)向左側(終止板4側),將各 共振樑5S]有地振動之共振頻率自高頻率設定為低頻率。 再者,使用微機械加工技術’將具有以上構成之感測器 本體1製造於半導體石夕基板2〇上。自膜片2輸入之振動能, 通過橫樑3而分配至各個共振樑5,且被各共振系統之機 械-電性轉換器吸收,並轉換為信號能後抽出。 (實施形態1) 圖2係表不使用上述感測器本體丨之本發明之振動波檢測 裝置之一例的電路圖。於感測器本體i之各共振樑5之產生 畸變。卩分(橫樑3侧)’形成有包含多晶矽之壓致電阻6丨&、 61b〜6na、6nb(以下,總稱為壓致電阻6)。該等複數個壓致 電阻6並聯地連接,該壓致電阻6之一端與交流電源7ia、 711)〜71^、7111)(以下,總稱為交流電源7)連接,其中上述交 流電源具有共通之頻率且具有分別不同之振幅與相位而 該壓致電阻6之另一端與運算放大器1〇之一輸入端子連 接。運算放大器10之+輸入端子接地。將相位彼此相反之 交流偏壓電壓施加至對向之共振樑5中。圖2中,以電壓vi 之負號表示相反之相位。 電壓VI〜Vn可為相同。對於相位w〜如而言,至少1個 具有與其他不同之相位。 120994.doc -13- 1323340 其次,就圖2所示之振動波檢測裝置之作用加以說明。 —般而言,電阻體之電阻值R之相對變化率藉由如下式(4) 而表示,其中將電阻體之泊松比設為V,將長度設為丨,將 電阻率設為p。 [數4] 6R (Λ 〇 ,δΐ δρ ,、 Κ 1 ρCaVY (3) where 'C: constant determined by experiment a: thickness of each resonant beam 5 X: length of each resonant beam 5 γ: Young's modulus of material substance (semiconductor s) s: material substance (semiconductor 矽Density 120994.doc • 12· 1323340 From the above formula (3), the resonance frequency £ can be set to an expected value by changing the thickness of the resonant beam 5 by the length X'. Each of the resonant beams 5 has a natural resonant frequency. In this example, 'the thickness a of all the resonance targets 5 is fixed, and the length X is gradually lengthened from the right side (the diaphragm 2 side) to the left side (the end plate 4 side), with the right side (film) On the left side (the side of the end plate 4), the resonance frequency of the vibration of each of the resonant beams 5S] is set from the high frequency to the low frequency. Further, the sensor body 1 having the above configuration is fabricated on a semiconductor substrate 2 using a micromachining technique. The vibration energy input from the diaphragm 2 is distributed to the respective resonant beams 5 through the beam 3, and is absorbed by the mechanical-electrical converter of each resonance system, and converted into signal energy and then extracted. (Embodiment 1) Fig. 2 is a circuit diagram showing an example of a vibration wave detecting device of the present invention which does not use the above-described sensor body 丨. Distortion occurs in each of the resonant beams 5 of the sensor body i. The bismuth (beam 3 side)' is formed with a piezoresistive resistor 6丨&, 61b~6na, 6nb (hereinafter collectively referred to as a piezoresistor 6) containing polycrystalline germanium. The plurality of varistors 6 are connected in parallel, and one end of the varistor 6 is connected to an AC power source 7ia, 711) 71 71, 7111 (hereinafter collectively referred to as an AC power source 7), wherein the AC power source has a common The frequency has a different amplitude and phase, and the other end of the piezoresistive 6 is connected to one of the input terminals of the operational amplifier 1?. The + input terminal of the operational amplifier 10 is grounded. An alternating bias voltage having phases opposite to each other is applied to the opposing resonant beam 5. In Fig. 2, the opposite phase is indicated by the minus sign of the voltage vi. The voltages VI to Vn can be the same. For the phase w~, for example, at least one has a phase different from the others. 120994.doc -13- 1323340 Next, the action of the vibration wave detecting device shown in Fig. 2 will be described. In general, the relative change rate of the resistance value R of the resistor is expressed by the following formula (4), in which the Poisson ratio of the resistor is V, the length is 丨, and the resistivity is p. [Number 4] 6R (Λ 〇 , δ ΐ δρ , , Κ 1 ρ

形成於半導體矽基板20上之壓致電阻6中,主要因崎變 而使電阻率變化,若將壓致電阻係數設為π,將揚氏模量 设為Ε,則壓致電阻之電阻值R之相對變化率可如以下式 (5)而表示。 [數5] 如圖2之振動波檢測裝置,將輸出形態稱作振動波形之In the piezoresistive resistor 6 formed on the semiconductor substrate 20, the resistivity changes mainly due to the change in the susceptibility. If the piezoelectric susceptance coefficient is π and the Young's modulus is Ε, the resistance value of the varistor is The relative change rate of R can be expressed by the following formula (5). [Equation 5] The vibration wave detecting device of Fig. 2 refers to the output form as a vibration waveform.

合成輸出,即,該輸出形態係將各共振樑5之振動輸出作 為波形並加上1個信號線而輸出之輸出形態。此時之感測 器本體1之作用在於,有效地向機械振動之電性信號進行 轉換,並調整基於機械頻率分解之電性信號上之頻率特 性。 圖9係使用感測器本體1表示壓致電阻6之共振樑$之振動 波形之和的輸出形式之一例的電路圖。圖9之電路中向 上側之共振樑51a〜5na中施加正直流偏壓、向下側之共振 樑5lb〜5nb中施加負直流偏壓,將各共振樑5之振動輸^作 120994.doc •14. 1323340 為波形加上1根信號線後輸出。此處,為了易於理解,使 成對之上下共振樑5以逆相而振動,使上下壓致電阻6以彼 此逆相而伸縮。 圖9中,對於第i共振樑5i上之壓致電阻之電阻值,若將 上側設為Ri + SRi(t),將下側設為Ri_SRi⑴,將上下各電阻 之其他共通端子之電壓設為V0、_V0,則流入運算放大器 之假想接地點之電流由以如下式(6)而表示。 [數6]The combined output, that is, the output form is an output form in which the vibration output of each of the resonant beams 5 is a waveform and one signal line is added and output. At this time, the sensor body 1 functions to effectively convert the electrical signal of the mechanical vibration and adjust the frequency characteristics on the electrical signal based on the mechanical frequency decomposition. Fig. 9 is a circuit diagram showing an example of an output form of the sum of the vibration waveforms of the resonant beam $ of the piezoelectric resistor 6 using the sensor body 1. In the circuit of Fig. 9, a positive DC bias is applied to the upper resonant beams 51a to 5na, and a negative DC bias is applied to the lower resonant beams 51lb to 5nb, and the vibration of each resonant beam 5 is transmitted as 120994.doc. 14. 1323340 Adds 1 signal line to the waveform and outputs it. Here, for the sake of easy understanding, the pair of upper and lower resonance beams 5 are vibrated in a reverse phase, and the upper and lower piezoresistors 6 are expanded and contracted in opposite phases. In Fig. 9, for the resistance value of the piezoresistive resistor on the i-th resonant beam 5i, if the upper side is Ri + SRi(t), the lower side is set to Ri_SRi(1), and the voltages of the other common terminals of the upper and lower resistors are set to V0, _V0, the current flowing into the imaginary ground point of the operational amplifier is expressed by the following equation (6). [Number 6]

(6) 並且,藉由反饋電阻Rf,作為如下式(7)表示之振動電 壓而抽出。 [數7](6) Further, the feedback resistor Rf is extracted as the vibration voltage expressed by the following equation (7). [Number 7]

⑺ 實際上 合成輸出之負載Wi藉由調整電阻Ri而可變。然而 製造晶片時之微調等為固定。 考慮利用上述方法中輸出與偏壓電壓¥〇成比例,而針對 各共振樑5改變偏壓電壓。圖i㈣使用複數個偏壓電壓線 之壓致電阻方式之合成輸出之一例的電路圖。使用圖1〇之 電路:可按照頻率動態地調整增益。若將約樑之偏壓電 壓設為土Vi,則輸出電壓v〇ut由如下式⑻而表示。 120994.doc [數8] 、 N v =y oui f 2RfV.) 卜(t)) l ki J 、R; >(7) Actually, the load Wi of the composite output is variable by adjusting the resistance Ri. However, the fine adjustment or the like when manufacturing the wafer is fixed. It is considered that the output voltage is proportional to the bias voltage ¥〇 in the above method, and the bias voltage is changed for each of the resonant beams 5. Figure i (4) is a circuit diagram showing an example of a composite output of a piezoresistive mode using a plurality of bias voltage lines. Use the circuit in Figure 1 to dynamically adjust the gain by frequency. When the bias voltage of the beam is set to soil Vi, the output voltage v〇ut is expressed by the following formula (8). 120994.doc [Number 8], N v =y oui f 2RfV.) Bu(t)) l ki J , R; >

W 其中,因通過橫樑3之配線數,若共振樑5之數量增加 則必須進行將共振樑5分為組之偏壓控制。 曰 圖1〇所示之振動波檢測方法中,頻率特性為可變,但各 頻率中可設定之增益限於實數。頻率濾波時之增益為實數W However, if the number of the resonant beams 5 increases due to the number of wires passing through the beam 3, it is necessary to perform the bias control for grouping the resonant beams 5 into groups.振动 In the vibration wave detection method shown in Fig. 1〇, the frequency characteristics are variable, but the gains that can be set in each frequency are limited to real numbers. The gain during frequency filtering is real

或者虛數則限於脈衝應答為對稱或者反對稱之情形。若各 頻率中所設;t之增纽於實數,則無法實現任意之脈衝應 答。 ’Or the imaginary number is limited to the case where the impulse response is symmetric or antisymmetric. If it is set in each frequency; if the increase of t is in real numbers, then no arbitrary pulse response can be achieved. ’

圖2所示之本發明之振動波檢測裝置中,可實現可變負 載濾波器,該可變負載濾波器實現更普通之頻率應答。如 圖2所不,將第i共振樑5ia及5ib之共振頻率設為仍丨,壓致 電阻之電阻值設為Ri,電阻變化設為SRKt)。將以頻率ω、 振幅為Vi、相位為釤之正弦波交流電壓施加至各壓致電阻 6la之個別端子中。且將相同正弦波交流電壓之逆相電壓 供給至逆相側之壓致電阻6ib中。將正相與逆相之壓致電 阻6之共通端子與轉移阻抗型之運算放大器10之輸入端子 連接。轉移阻抗型之運算放大器10係輸入阻抗為〇、輸出 阻抗為0之電流-電壓轉換放大器。 此時,自第i共振樑5ia及5ib流入放大器之電流為如下式 (9)。 1 [數9] 120994.doc • 16 · 1323340In the vibration wave detecting device of the present invention shown in Fig. 2, a variable load filter which realizes a more general frequency response can be realized. As shown in Fig. 2, the resonance frequencies of the i-th resonance beams 5ia and 5ib are set to 丨, the resistance value of the piezoresistive resistor is set to Ri, and the resistance change is set to SRKt). A sinusoidal alternating voltage having a frequency ω, an amplitude of Vi, and a phase of 钐 is applied to individual terminals of the respective varistors 6la. Further, the reverse phase voltage of the same sinusoidal alternating current voltage is supplied to the piezoresistive resistor 6ib on the reverse phase side. The common terminal of the positive phase and the reverse phase voltage is connected to the input terminal of the operational amplifier 10 of the transfer impedance type. The transfer impedance type operational amplifier 10 is a current-voltage conversion amplifier having an input impedance of 〇 and an output impedance of zero. At this time, the current flowing from the i-th resonant beam 5ia and 5ib into the amplifier is expressed by the following formula (9). 1 [9] 120994.doc • 16 · 1323340

Xc〇s(Qt+^) yc〇s(nt+^) κ* + δ^(〇 R^aR^t) i -R j s -H; cos(Qt + φ. )Fi(t, ω{) (9) 其中’ His2Vi/Ri係調變之增益係數,Fi (t,ω〇ΞδΙϋ⑴/Ri 係共振樑5i之振動時間波形。Fi (t,藉由Fishb〇ne(魚Xc〇s(Qt+^) yc〇s(nt+^) κ* + δ^(〇R^aR^t) i -R js -H; cos(Qt + φ. )Fi(t, ω{) (9 Where 'HisVi/Ri is the gain coefficient of the modulation, Fi (t, ω 〇Ξ δ Ιϋ (1) / Ri is the vibration time waveform of the resonant beam 5i. Fi (t, by Fishb〇ne (fish)

月)構造之感測器本體1之特性,具有附近之較窄頻帶之 光譜分佈8 將Ν設為共振樑5之—對之總數,整個共振樑5之輪出 流之合計波形由如下式(1〇)而表示。 [數 10] gW^-EH.cosiQt + ^F^^) (1〇) 之頻 此處’進而’考慮各共振樑之輸出假定為充分窄 帶,為The characteristics of the sensor body 1 constructed in the month, the spectral distribution 8 having a narrower frequency band in the vicinity is set as the total number of the resonant beam 5, and the total waveform of the round outflow of the entire resonant beam 5 is as follows ( 1〇) and said. [Number 10] gW^-EH.cosiQt + ^F^^) (1〇) The frequency here and further consider that the output of each resonant beam is assumed to be a sufficiently narrow band.

[數 11] [數 12][Number 11] [Number 12]

HjCosifit + ^)= RejHje^e^} s Re{H(ro.)ejiit| 120994.doc •17- (12) 1323340 時,即,F⑻及Η⑻僅正之頻率心〇,㈣零之複數函數 時二則輪出電流可由如下式(13)而表示。此處,虛數單位 以字母j來表不。X ’ Re表示實部,函數符號之右側之* 表示複數共軛(以下相同)。 [數 13]HjCosifit + ^)= RejHje^e^} s Re{H(ro.)ejiit| 120994.doc •17- (12) 1323340, ie, F(8) and Η(8) are only positive frequency heart, (4) zero complex function two Then, the wheel current can be expressed by the following formula (13). Here, the imaginary unit is represented by the letter j. X ′ Re represents the real part, and * on the right side of the function symbol indicates a complex conjugate (the same applies hereinafter). [Number 13]

1 N g( 4 2 F* (Η(ωι)βΐηΐ + ^(ω^β-10*)1 N g( 4 2 F* (Η(ωι)βΐηΐ + ^(ω^β-10*)

与—Ίΐτί0 (FU)eJWt+F*U)e_叫(HU)e^ + H*U)e-Kh)d&) 〜士{eiot J7FU)HU)eiWt& + e-J〇t f F(w)H*(w)eJwtda Jo f% oo + e5〇t| ρ·*(ω)Η(ω)β_Μ(1ω + e-jQt Γ F*U>H*U)eH〇nda) } J〇 =~ "ΓΤ一 ieeie3。1 f FU)H(oOe^do) } 2a 〇) J 〇And —Ίΐτί0 (FU)eJWt+F*U)e_called (HU)e^ + H*U)e-Kh)d&) ~士{eiot J7FU)HU)eiWt& + eJ〇tf F(w) H*(w)eJwtda Jo f% oo + e5〇t| ρ·*(ω)Η(ω)β_Μ(1ω + e-jQt Γ F*U>H*U)eH〇nda) } J〇=~ "ΓΤ一ieeie3.1 f FU)H(oOe^do) } 2a 〇) J 〇

+ Re[^Qt \ F* (ω)Η(ω)ε",α>ιίΙω}} (13)+ Re[^Qt \ F* (ω)Η(ω)ε",α>ιίΙω}} (13)

Jo 式(12)表示,以載波頻率Ω進行調變,並於其上旁波帶 (以下,稱作上旁波帶)而獲得濾波器結果,該濾波器結果 為作為F(co)之逆傅立葉轉換(由F-1表示)之經解析的輸入信 號f⑴' f(t) = F-l{F(co)}Jo Equation (12) indicates that the filter result is obtained by the carrier frequency Ω, and the filter result is obtained by the upper band (hereinafter referred to as the upper side band), and the filter result is the inverse of F(co). The resolved input signal f(1)' f(t) = Fl{F(co)} of the Fourier transform (represented by F-1)

之複合頻率特性Η(ω)的濾波器結果。又,f * (-t)、即F 120994.doc 1323340 * (ω)之逆傅立葉轉換 f * (-1) = F - l{F * (ω)} 之Η(ω)之;慮波器結果’於下旁波帶(以下,稱作下旁波帶) 而獲得。 該過程表示於圖3。圖3係模式性表示頻率分解後之振幅 相位調變之作用的光譜分佈。經頻率分解之輸入信號分別 地乘以固定之複數振幅Hi,獲得僅載波頻率Ω之頻率偏 移。該等之合成為Η(ω)之頻率特性之乘法運算與固定頻率 Ω之載波的調變。例如,某共振樑5中經頻率分解之輸入光 譜分佈A,成為僅載波頻率卩之頻率偏移後之光譜分佈β。 分解並僅以載波頻率Ω而頻率偏移後之光譜合成作為上旁 波帶之光譜分佈而獲得。 該結果與僅將聲響信號f⑴以頻率特性Η(ω)而渡波,其 後以載波頻率Ω而調變者不同。以頻率特性Η(ω)而滤波並 以載波頻率Ω而調變者,蛀為毁鄕 ^接文聲響仏號之負頻率為Η* 之增益變化。與此相對,太 #本發明之方法中,乘以與正頻率 相同之Η(ω)之增益。 圖4表示考慮下旁波帶或·Ω之頻率偏移之合成, 譜分佈。考慮各個旁頻帶成分之含義。載波頻率/ 上載旁:帶)係將所希望之濾、波器特性之輸二= ^者。載波頻率,之左側之成分(τ旁波帶)如以下二The composite frequency characteristic Η(ω) filter result. Also, f * (-t), that is, F 120994.doc 1323340 * (ω) inverse Fourier transform f * (-1) = F - l{F * (ω)} Η (ω); The result is obtained in the lower sideband (hereinafter referred to as the lower sideband). This process is shown in Figure 3. Fig. 3 is a diagram showing the spectral distribution of the effect of amplitude phase modulation after frequency decomposition. The frequency-decomposed input signals are respectively multiplied by a fixed complex amplitude Hi to obtain a frequency offset of only the carrier frequency Ω. These combinations are the multiplication of the frequency characteristics of Η(ω) and the modulation of the carrier of the fixed frequency Ω. For example, the input spectral distribution A decomposed by frequency in a certain resonant beam 5 becomes a spectral distribution β after the frequency shift of only the carrier frequency 卩. The spectral synthesis after decomposition and only the carrier frequency Ω and the frequency offset is obtained as the spectral distribution of the upper sideband. This result differs from the case where only the acoustic signal f(1) is pulsed by the frequency characteristic Η(ω), and then modulated by the carrier frequency Ω. If the frequency characteristic Η(ω) is filtered and modulated by the carrier frequency Ω, it is smashed. The negative frequency of the suffix is the gain change of Η*. In contrast, in the method of the present invention, the gain of Η(ω) which is the same as the positive frequency is multiplied. Figure 4 shows the synthesis, spectral distribution of the frequency offset of the next sideband or Ω. Consider the meaning of each sideband component. Carrier frequency / upload side: band) will be the desired filter, the filter characteristics of the two = ^. Carrier frequency, the component on the left side (τ sideband) is as follows

[數 14J 120994.doc 1323340 #丄 ”(。>)·)卜tdw = eiQt{J:FU)H*u)e ={f (t) *h* (—t) (14) 係頻率應答Η* (c〇)或者脈衝應答h * (_t)之濾波器輸出。 此處,函數之間之符號*表示卷積。式(14)由複數共軛之 逆傅立葉轉換 [數 15] P CX) J〇 Η*(ω)θΐω1ά(ϋ = { Η(ω)βΐω<-ι><1ω}* = h* (-t) 而導出。 可知負頻率區域中,_Ω之左側之成分係所希望之濾波器 特性之輸出之複數共軛,_Ω之右側之成分係上述Η * 0)之 濾波器輸出之複數共輛。再者’若偏壓電壓V〇〜Vn相等, 則振動波檢測裝置之頻率特性平穩。藉由改變偏壓電壓 V0〜Vn ’可改變濾波器特性。 如上所述,上旁波帶與下旁波帶作為信號之含義不同。 共振樑5之經合成之輸出,必須於使上旁波帶與下旁波帶 分離後進行解調。可對合成輸出信號進行直接解調,以載 波頻率Ω而調變,因此可直接利用無線發送。 圖5係表示利用無線之振動波檢測裝置之構成例的方塊 圖。圖5(a)表示感測器側之電路,圖5(b)表示接受側之電 路。如圖5(a)所示,於感測器側,由感測器本體丨調變之信 號利用變壓器11進行阻抗整合,並由放大器12放大後自天 線13S以無線而發送。 圖5(b)所示之接受側,利用天線UR而接受並利用放大 120994.doc 1323340 ΊΙ 14而放大後之信號,由帶通濾波器(BPF)15分為上旁波 帶與下旁波帶。同時,利用PLL(Phase Locked Loop,鎖相 迴路)16等使載波頻率Ω再生。根據載波頻率由移相器 (Phase Shifter)17製作0°與90。之相位之載波頻率,進行經 BPF15分離之上旁波帶(USB:Upper Side Band,上旁波帶) 之正交檢波。USB中,利用乘法器18對〇。與90。之相位之載 波頻率進行乘法運算,通過低通濾波器(L〇w Pass Filter, LPF) 19後獲得檢波輸出。正交相關檢測後之2個信號成為 已設定之複數負載濾波器之輸出之希爾伯特轉換對。即, 自〇°之相位獲得實部之信號,自9〇。之相位獲得虛部之信號。 再者,所施加之交流偏壓電壓並非係正弦波亦可。此係 因為對BPF15進行適當調節,可於抽出上旁波帶時抑制諧 波。交流偏壓電壓可例如為矩形波。 如以上所說明般’根據本發明之振動波檢測裝置,可實 現任意之複數負載。並且,可作為除具有任意之複合頻率 特性之外亦具有實部與虛部之2自由度的RF調變信號而讀 出·傳送。 本發明之振動波檢測方法可用於先前之使用麥克風或振 動感測器之任一情形。進而,亦可用於先前所未出現之如 下情形中。 根據複數波形之特徵抽出,對時間分解能較高之振動 聲響進行檢測。例如,可檢測出連續開動之機器中瞬間出 現之異常音。又,可實現寬頻帶之AM/FM解調器。並且, 不會產生矛盾而可檢測多相輸出信號,因此適用於高精度 120994.doc 1323340 之波形測量。 (實施形態1之變形例) 圖6表示將共振樑5分為群並施加交流偏壓電壓之振動波 檢測裝置之例。若共振樑5之數量增多,則因通過橫樑3之 配線數受到限制,難以向所有共振樑5施加不同相位之交 流偏壓電壓。例如’如圖6所示,將共振樑5分為群,針對 各群,將具有共通之振幅與相位的交流偏I電壓施加至各 群所包含之共振樑5中。[Number 14J 120994.doc 1323340 #丄" (.>)·))tdw = eiQt{J:FU)H*u)e ={f (t) *h* (-t) (14) Frequency response Η* (c〇) or the filter output of the impulse response h * (_t). Here, the symbol * between functions represents convolution. Equation (14) is inverse Fourier transform of complex conjugate [15] P CX J〇Η*(ω)θΐω1ά(ϋ = { Η(ω)βΐω<-ι><1ω}* = h* (-t) is derived. It can be seen that the component of the left side of _Ω is in the negative frequency region. The complex conjugate of the output of the desired filter characteristic, the component on the right side of _Ω is the complex number of the filter outputs of the above Η * 0). Further, if the bias voltages V 〇 VVn are equal, the vibration wave detecting device The frequency characteristics are stable. The filter characteristics can be changed by changing the bias voltages V0 to Vn'. As described above, the upper sideband and the lower sideband have different meanings as signals. The synthesized output of the resonant beam 5 must The upper sideband is separated from the lower sideband and demodulated. The synthesized output signal can be directly demodulated and modulated by the carrier frequency Ω, so that it can be directly transmitted by wireless. A block diagram of a configuration example of a wireless vibration wave detecting device. Fig. 5(a) shows a circuit on the sensor side, and Fig. 5(b) shows a circuit on the receiving side. As shown in Fig. 5(a), the sensor is used. On the side, the signal modulated by the sensor body 利用 is impedance-integrated by the transformer 11, and amplified by the amplifier 12 and transmitted wirelessly from the antenna 13S. The receiving side shown in Fig. 5(b) is received by the antenna UR. The signal amplified by amplifying 120994.doc 1323340 ΊΙ 14 is divided into an upper sideband and a lower sideband by a bandpass filter (BPF) 15. At the same time, a PLL (Phase Locked Loop) 16 is used. The carrier frequency Ω is regenerated. The phase shift frequency of 0° and 90° is made by the phase shifter (Phase Shifter) 17 according to the carrier frequency, and the bypass band is separated by the BPF 15 (USB: Upper Side Band). Orthogonal detection. In USB, multiplier 18 is used to multiply the carrier frequency of 90. The carrier frequency of the phase is multiplied, and the detection output is obtained by a low-pass filter (LPF). The two signals after the correlation detection become the set complex load filter The Hilbert conversion pair is obtained. That is, the phase of the 〇° phase obtains the signal of the real part, and the phase of the imaginary part is obtained from the phase of 9. The applied AC bias voltage is not a sine wave. This is because the BPF 15 is properly adjusted to suppress harmonics when the upper sideband is extracted. The AC bias voltage can be, for example, a rectangular wave. As described above, the vibration wave detecting device according to the present invention can realize any complex load. Further, it can be read and transmitted as an RF modulation signal having two degrees of freedom of the real part and the imaginary part in addition to an arbitrary composite frequency characteristic. The vibration wave detecting method of the present invention can be applied to any of the previous cases in which a microphone or a vibration sensor is used. Further, it can also be used in the case where it has not appeared before. According to the characteristics of the complex waveform, the vibration of the time with high decomposition energy is detected. For example, it is possible to detect an abnormal sound that occurs instantaneously in a continuously activated machine. Also, a wideband AM/FM demodulator can be realized. Moreover, the multi-phase output signal can be detected without contradiction, so it is suitable for waveform measurement with high precision 120994.doc 1323340. (Modification of the first embodiment) Fig. 6 shows an example of a vibration wave detecting device in which the resonance beam 5 is divided into groups and an AC bias voltage is applied. When the number of the resonant beams 5 is increased, the number of wires passing through the beam 3 is limited, and it is difficult to apply an AC bias voltage of a different phase to all of the resonant beams 5. For example, as shown in Fig. 6, the resonant beam 5 is divided into groups, and an AC bias voltage having a common amplitude and phase is applied to the resonant beam 5 included in each group for each group.

圖6之例中’將振幅為V1、相位為“之交流偏壓電壓施 加至共振樑5U與…中。將振幅為_Vl、相位為^之交流 偏壓電塵施加至共振樑51b與52b中。以同樣方式,依次將 相鄰2個共振樑5分為1组,將共通之振幅與相位之交流偏 壓電壓施加至各組中。以此方式, _ 复數負載之振幅與相位 複數負載不會產生變化,於橫樑3之配線 數之限制内可设有多個共振樑5。In the example of Fig. 6, an alternating bias voltage having an amplitude of V1 and a phase is applied to the resonant beams 5U and .... An alternating bias electric dust having an amplitude of _V1 and a phase is applied to the resonant beams 51b and 52b. In the same way, the adjacent two resonant beams 5 are sequentially divided into one group, and the common amplitude and phase AC bias voltages are applied to the respective groups. In this way, the amplitude and phase complex loads of the complex load are _ There is no change, and a plurality of resonant beams 5 may be provided within the limit of the number of wires of the beam 3.

圖6之例令’以相鄰2個共振樑5為!組, 量亦可為-上。又,〗組共振樑5之數量可針::之數 同。進而,並非為相鄰共振樑5,例如 、、,、而不 振襟⑷組,針對各组施加共通之振幅虚相了選擇㈣個共 電壓。分A行接4人 ^相位之父流偏壓 Μ刀為何種組合之群、將何種振幅 電塵施加至每個組中,可根據所 父流偏壓 計。 歿13頻率特性而設 (實施形態2) 圖7係表示檢測器為 電容器之情形時 的本發明 之振動波 120994.doc -22- 1323340 檢測裝置之一例的電路圖。 各共振樑5之前端部81a、81 b〜8na、8nb(以下,绅、稱為 前端部8)所對向之位置之半導體矽基板2〇上,分別形成有 電極91a、91b〜9na、9nb(以下,總稱為電極9),由各共振 樑5之前端部8與其所對向之各電極9構成電容器。共振樑$ 之前端部8係伴隨振動而位置可上下移動之可動電極,另 一方面,形成於半導體矽基板20上之電極9係其位置無法 移動之固定電極。並且’若共振樑5以特定頻率振動則 該對向電極間之距離產生變動,因此,電容器之電容改變。 複數個電極9並聯連接,且與運算放大器1〇之一輸入端 子連接。運算放大器10之+輸入端子接地。共振襟5之前端 部8與具有共通之頻率且振幅與相位分別不同之交流電源 71a、71b〜7na、7nb連接。與圖2之電路相同,對向之共振 樑5中施加有相位彼此相反之交流偏壓電壓。 若特定之共振樑5共振,則 部8萝 則藉由其畸變使共振樑5之前端In the example of Fig. 6, the adjacent two resonant beams 5 are in the group of ?, and the amount may be -. Also, the number of the group of resonant beams 5 can be:: the same number. Further, instead of the adjacent resonant beam 5, for example, the group of the vibrating group (4) is not vibrated, the common amplitude is selected for each group (four) common voltages. The A-line is connected to 4 people. ^The parental bias of the phase. The combination of the file and the amplitude of the dust applied to each group can be based on the parent bias.殁13 Frequency characteristics (Embodiment 2) Fig. 7 is a circuit diagram showing an example of a vibration wave 120994.doc -22- 1323340 detecting device of the present invention when the detector is a capacitor. Electrodes 91a, 91b to 9na, 9nb are formed on the semiconductor cymbal substrate 2 at the positions where the front end portions 81a, 81b to 8na, 8nb (hereinafter, referred to as the distal end portion 8) of the respective resonant beam 5 are opposed to each other. (hereinafter, collectively referred to as electrode 9), a capacitor is formed by the front end portion 8 of each resonant beam 5 and each of the electrodes 9 opposed thereto. The front end portion 8 of the resonant beam $ is a movable electrode that can move up and down with vibration, and on the other hand, the electrode 9 formed on the semiconductor substrate 20 is a fixed electrode whose position cannot be moved. Further, if the resonant beam 5 vibrates at a specific frequency, the distance between the opposing electrodes fluctuates, and therefore the capacitance of the capacitor changes. A plurality of electrodes 9 are connected in parallel and connected to one of the input terminals of the operational amplifier 1A. The + input terminal of the operational amplifier 10 is grounded. The front end portion 8 of the resonance 襟 5 is connected to an AC power source 71a, 71b to 7na, 7nb having a common frequency and having different amplitudes and phases. As in the circuit of Fig. 2, an alternating bias voltage having phases opposite to each other is applied to the opposing resonant beam 5. If the particular resonant beam 5 resonates, then the part 8 is caused by its distortion to make the front end of the resonant beam 5

變, 獲得。 當檢測器為電容器_ ’式(4)〜式〇3)中代替電阻Ri,考 慮電谷之電容Ci之阻抗zi。Change, get. When the detector is replaced by a resistor Ri in the capacitor _ ' (4) to 〇 3), the impedance zi of the capacitance Ci of the electric valley is considered.

Zi = l/(jnCi) ’載波頻率Ω為固定且共 則與電阻時相同可進行 輸出之相位與壓致電阻6 此時,阻抗Zi包含頻率(角頻率), 通,因此,若考慮僅變化, 理。振幅Hi包含虛數j,因此, 120994.doc -23· 1323340 之情形相比改變了 90。,經解調之輸出之實部與虛部替 換。可作為除具有任意之複合頻率特性之外亦具有實部與 虛部之2自由度的RF調變信號而讀出•傳送,此係與檢測Zi = l/(jnCi) 'The carrier frequency Ω is fixed and the same as the resistance can be used to output the phase and the piezoresistive 6 At this time, the impedance Zi contains the frequency (angular frequency), so, if only the change is considered , rational. The amplitude Hi contains an imaginary number j, so the situation of 120994.doc -23· 1323340 is changed by 90. The real and imaginary parts of the demodulated output are replaced. It can be read and transmitted as an RF modulation signal with 2 degrees of freedom between the real part and the imaginary part in addition to any composite frequency characteristic.

Is為電阻時相同。 (實施形態2之變形例) 圖8表示檢測器為電容器時將共振樑5分為群而施加交流 f壓電壓之振動波檢測裝置之例。若共振樑5之數量增 多,則因通過橫樑3之配線數之限制,難以向所有共振樑5 施加相位不同之交流偏壓電壓。 與實施形態1之變形例(圖6)相同,將相鄰2個共振樑5分 為1組,將具有共通之振幅與相位之交流偏壓電壓施加至 各組中。以此方式,複數負載之振幅與相位之自由度減 小,但複數數負載未發生變化,可於橫樑3之配線數之限 制内設置多個共振樑5。 圖8之例中,將相鄰2個共振樑5分為丨組,1組之共振樑5 之數量亦可為3以上。又,丨組共振樑5之數量可針對組而 不同。進而,並非為相鄰共振樑5,例如,亦可選擇每_ 之”振樑5為1組,將共通之振幅與相位之交流偏壓電壓施 至各組中。》為何種組合之群、將何種振幅與相位之交 流偏壓電壓施加至每個組中’可根據所取得之複合頻率特 性而設計。 入如以上所說明,;^據本發明之振動波檢測裝置,即使於 檢測器為電容器時亦可實現任意之複數負冑。並且,可作 為除具有任意之複合頻率特性之外亦具有實部與虛部之2 120994.doc •24- 1323340 自由度的RF調變信號而讀出·傳送。 此外,上述硬體構成係一例,可任意地進行變更及修 正0 本申請案基於2006年5月12曰提出之曰本專利申請案特 願2006-1 33 802。本說明書中參照上述說明書、專利申請 摩巳圍、圖式全體而編入〇 [產業之可利用性]Is is the same as Is. (Modification of Second Embodiment) Fig. 8 shows an example of a vibration wave detecting device that applies an alternating current f voltage to divide the resonant beam 5 into a group when the detector is a capacitor. If the number of the resonant beams 5 is increased, it is difficult to apply an AC bias voltage having a different phase to all of the resonant beams 5 due to the limitation of the number of wires passing through the beam 3. Similarly to the modification of the first embodiment (Fig. 6), the adjacent two resonance beams 5 are divided into one group, and an AC bias voltage having a common amplitude and phase is applied to each group. In this way, the degree of freedom of the amplitude and phase of the complex load is reduced, but the complex load is not changed, and a plurality of resonant beams 5 can be provided within the limit of the number of wires of the beam 3. In the example of Fig. 8, the adjacent two resonant beams 5 are divided into groups of 丨, and the number of the resonant beams 5 of one group may be three or more. Also, the number of the 丨 group resonance beams 5 may differ for the group. Further, instead of the adjacent resonant beam 5, for example, each of the "vibrating beams 5" may be selected as one set, and a common alternating current amplitude and phase alternating bias voltage may be applied to each group. Which amplitude and phase AC bias voltage is applied to each group' can be designed according to the obtained composite frequency characteristics. As described above, the vibration wave detecting device according to the present invention, even in the detector Any complex negative 胄 can also be realized for the capacitor, and can be read as an RF modulation signal with the real and imaginary parts of the 2 120994.doc •24- 1323340 degrees of freedom in addition to any complex frequency characteristics. In addition, the hardware configuration is an example, and can be arbitrarily changed and corrected. The present application is based on Japanese Patent Application No. 2006-1 33 802, filed on May 12, 2006. The above-mentioned manual, patent application, Capricorn, and the whole figure are incorporated into the [industry availability]

本發明之振動波檢測方法及裝置可用於故障診斷裝置、 助聽器、語音識別系統、通信系統等之聲響感測器。 【圖式簡單說明】 圖1係表示本發明之振動波檢測裝置之感測器本體之一 例的圖。 圖2係表示本發明之振動波檢測裝置之一例的電路圖。 圖3係模式性地表示頻率分解後之振幅相位調變之作用 的光譜分佈。The vibration wave detecting method and apparatus of the present invention can be used for an acoustic sensor of a fault diagnostic apparatus, a hearing aid, a voice recognition system, a communication system, or the like. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a view showing an example of a sensor body of a vibration wave detecting device of the present invention. Fig. 2 is a circuit diagram showing an example of a vibration wave detecting device of the present invention. Fig. 3 is a view schematically showing the spectral distribution of the action of amplitude phase modulation after frequency decomposition.

圖4係亦考慮下旁波帶或·ω之頻率偏移之合成信號之光 言眷分佈圖β 圖5(a)、(b)係表不利用無線之振動波檢測裝置之構成例 的方塊圖。 圖係表不將共振樑分為群且施加交流偏壓電壓之振動 波檢測裝置之例的圖。 ® 7係、表示檢測器^ ^ ^ ^ ^ ^ ^ ^ ^ ^ °电合器時之本發明之振動波檢測裝 置之一例的電路圖。 圖8係表示檢測氣带a ^ 揿刃器為電容器時將共振樑分為群並施加交 120994.doc -25- 流偏壓電壓之振動波檢測裝置之例的圖。 圖9係表示壓致電阻之共振樑之振動波形之和的輸出形 式之一例的電路圖。 圖丨〇係表示使用複數個偏壓電壓線之壓致電阻方式之合 成輪出之一例的電路圖。 【主要元件符號說明】 1 2 3 4 10 11 12 > 14 13S、13R 15 16 17 18 19 20 51a ' 51b ' 52a 感測器本體 膜片 橫樑 終止板 運算放大器 變壓器 放大器 天線 帶通濾波器(BPF)Fig. 4 is an optical distribution diagram of a composite signal in which the frequency difference of the sideband or ?ω is also considered. Fig. 5 (a) and (b) show a block diagram showing a configuration example of the wireless vibration wave detecting device. Figure. The figure is a diagram showing an example of a vibration wave detecting device that does not divide the resonance beam into groups and applies an AC bias voltage. ® 7 series, a circuit diagram showing an example of the vibration wave detecting device of the present invention when the detector is ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ °. Fig. 8 is a view showing an example of a vibration wave detecting device which detects a resonance beam into a group and applies a 120994.doc -25-flow bias voltage when the gas band a ^ blade is a capacitor. Fig. 9 is a circuit diagram showing an example of an output form of a sum of vibration waveforms of a resonant beam of a piezoresistive. The figure is a circuit diagram showing an example of a composite wheel of a piezoresistive method using a plurality of bias voltage lines. [Main component symbol description] 1 2 3 4 10 11 12 > 14 13S, 13R 15 16 17 18 19 20 51a ' 51b ' 52a Sensor body diaphragm beam termination plate operational amplifier transformer amplifier antenna bandpass filter (BPF )

PLL 移相器(Phase Shifter) 乘法器 低通濾波器(LPF) 半導體妙基板 52b、共振樑 5ia、5ib、5na、5nb 61a、61b、62a、62b、壓致電阻 6ia、6ib、6na、6nb 120994.doc • 26- 1323340PLL phase shifter (Phase Shifter) multiplier low pass filter (LPF) semiconductor wonderful substrate 52b, resonant beam 5ia, 5ib, 5na, 5nb 61a, 61b, 62a, 62b, piezoresistive 6ia, 6ib, 6na, 6nb 120994 .doc • 26- 1323340

71a、71b、72a、72b、交流電源 7na 、 7nb 81a、81b、82a、82b、前端部 8ia、8ib、8na、8nb 91a、91b、92a、92b、電極 9ia、9ib、9na、9nb 27- 120994.doc71a, 71b, 72a, 72b, AC power source 7na, 7nb 81a, 81b, 82a, 82b, front end portion 8ia, 8ib, 8na, 8nb 91a, 91b, 92a, 92b, electrode 9ia, 9ib, 9na, 9nb 27-120994. Doc

Claims (1)

U23340 十、申請專利範圍·· 〗·:=波檢測方法,其特徵在於:其係將振動波傳播 不同之特定頻率共振之複數個共振器,以設在 述共振器之檢測器檢測各上述共振器之對上述頻率 之,、振所伴隨之電性輸出者,且 以上述複數個共振器之拾 盗之檢測15共通之頻率對每個共振 β相位不同之交流偏壓電壓; 〇成上述複數個共振器之檢測器之輸出。 2 ·如喷求項1之振動波檢測方法,其中 於施加該交流偏磨電壓之上述複數個共振器中的至少 1個共振器,上述交流偏壓電壓之振幅不同。 3.如請求項丨之振動波檢測方法,其中 將上述複數個共振器分為複數個群,針對該各群,對 各群所包含之共振器施加具有共通之振幅與相位之上 交流偏壓電壓。 4 ·如請求項1之振動波檢測方法,其中 以遽波器抽出上述複數個共振器之檢測器所合成之輪 出之上旁波帶,並藉由正交相關檢測輸出希爾伯特轉換 對之信號。 、 5. 如請求項4之振動波檢測方法,其中 利用無線電將上述複數個共振器之檢測器所合成之輪 出傳送至上述渡波器。. 6, 一種振動波檢測裝置,其特徵在於包括: 複數個共振器,纟等各自對不同之特定頻率共振; 120994.doc 檢測器’其設在上述複數個共振器各個上,檢測傳播 至上述複數個共振器之振動波所致之該等共振器各個於 上述頻率之共振所伴隨的電性輸出; 偏I施加機構,其以設在上述複數個共振器各個中之 檢測器共通之頻率’對上述共振器各個施加相位不同之 交流偏壓電壓;及 輸出合成機構,其合成設在上述複數個共振器各個中 之檢測器之輸出。 7·如請求項6之振動波檢測裝置,其中 以上述偏壓施加機構施加之上述交流偏壓電壓於上述 複數個共振器中的至少1個共振器上,具有不同之振 幅。 8. 如請求項6之振動波檢測裝置,其中 上述偏壓施加機構將上述複數個共振器分為群,針對 該各群’對各群之共振器施加共通之振幅與相位之交流 偏壓電壓。 11_ 9. 如請求項6之振動波檢測裝置,其中包括: 慮波機構’其自以上述輸出合成機構合成之檢測器之 輸出的合成輸出,濾波抽出上旁波帶,上述檢測器設在 上述複數個共振器各個中;及 正交檢波機構’其對以上述濾波機構所抽出之上旁波 帶進行正交相關檢測,而輸出希爾伯特轉換對之信號。 10·如請求項9之振動波檢測裝置,其中具備無線傳送機 構’其將以上述輸出合成機構合成之檢測器之輸出的合 120994.doc 1323340 成輸出以無線方式傳送至上述濾波機構,上述檢測器設 在上述複數個共振器各個中。 11. 如請求項6之振動波檢測裝置,其中 上述檢測器係壓致電阻。 12. 如請求項6之振動波檢測裝置,其中 上述檢測器係電容性之元件。U23340 X. Patent application scope ····:= Wave detection method, which is characterized in that it is a plurality of resonators that propagate vibration waves at different specific frequencies, and detects each of the resonances by a detector provided in the resonator The AC bias voltage of the above-mentioned frequency, the electrical output accompanied by the vibration, and the frequency common to the detection 15 of the plurality of resonators for each resonance β phase; The output of the detector of the resonator. 2. The vibration wave detecting method according to claim 1, wherein at least one of the plurality of resonators to which the AC biasing voltage is applied has a different amplitude of the AC bias voltage. 3. The vibration wave detecting method according to claim 1, wherein the plurality of resonators are divided into a plurality of groups, and for each of the groups, a common amplitude and a phase upper AC bias are applied to the resonators included in each group. Voltage. 4. The vibration wave detecting method according to claim 1, wherein the upper sideband of the rounds synthesized by the detector of the plurality of resonators is extracted by a chopper, and the Hilbert transform is outputted by orthogonal correlation detection. The signal to it. 5. The vibration wave detecting method of claim 4, wherein the round of the synthesis of the detectors of the plurality of resonators is transmitted to the ferrite by radio. 6. A vibration wave detecting device, comprising: a plurality of resonators, each of which resonates at a different specific frequency; 120994.doc detectors are disposed on each of the plurality of resonators, and the detection propagates to the above An electrical output accompanying the resonance of each of the resonators at the frequency caused by the vibration waves of the plurality of resonators; and a bias I application mechanism having a frequency common to the detectors provided in each of the plurality of resonators' An AC bias voltage having a different phase is applied to each of the resonators; and an output synthesizing mechanism that synthesizes an output of the detector provided in each of the plurality of resonators. The vibration wave detecting device according to claim 6, wherein the AC bias voltage applied by the bias applying means has a different amplitude on at least one of the plurality of resonators. 8. The vibration wave detecting device of claim 6, wherein the bias applying means divides the plurality of resonators into groups, and applies common amplitude and phase AC bias voltages to the groups of the resonators of the respective groups. . 11. The vibration wave detecting device of claim 6, comprising: a wave-splitting mechanism 'synthesizing output from the output of the detector synthesized by the output synthesizing mechanism, filtering and extracting the upper sideband, the detector being set above And a plurality of resonators; and a quadrature detection mechanism that performs orthogonal correlation detection on the upper sideband extracted by the filtering mechanism, and outputs a signal of the Hilbert conversion pair. 10. The vibration wave detecting device according to claim 9, wherein the wireless transmission mechanism is configured to wirelessly transmit the output to the filter mechanism by outputting 120994.doc 1323340 of the output of the detector synthesized by the output synthesizing mechanism. The device is provided in each of the plurality of resonators. 11. The vibration wave detecting device of claim 6, wherein the detector is a piezoresistive resistor. 12. The vibration wave detecting device of claim 6, wherein the detector is a capacitive element. 120994.doc120994.doc
TW96116915A 2006-05-12 2007-05-11 Vibrational wave detection method, and vibrational wave detector TWI323340B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006133802A JP4539920B2 (en) 2006-05-12 2006-05-12 Vibration wave detection method and apparatus

Publications (2)

Publication Number Publication Date
TW200813407A TW200813407A (en) 2008-03-16
TWI323340B true TWI323340B (en) 2010-04-11

Family

ID=38693850

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96116915A TWI323340B (en) 2006-05-12 2007-05-11 Vibrational wave detection method, and vibrational wave detector

Country Status (3)

Country Link
JP (1) JP4539920B2 (en)
TW (1) TWI323340B (en)
WO (1) WO2007132756A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8803403B2 (en) 2011-12-07 2014-08-12 Industrial Technology Research Institute Inter-digital bulk acoustic resonator

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI426786B (en) * 2009-12-31 2014-02-11 Fan En Yueh Voice receiver and electronic device using the same
TW201237233A (en) * 2011-03-07 2012-09-16 Wei-Yan Lin Method and apparatus for judging bridge status
DE102012204357A1 (en) * 2012-03-20 2013-09-26 Siemens Aktiengesellschaft Sensor arrangement for detecting sound emissions of object, used in industrial plant, has detecting unit to detect the sum of electrical currents flown through the respective first electrode elements as measurement signal
JP7030331B2 (en) * 2018-03-28 2022-03-07 リバーエレテック株式会社 AE sensor element and AE sensor
TWI681371B (en) * 2018-03-31 2020-01-01 鈺紳科技股份有限公司 Vibration and sound wave integrated sensing system and method
CN110793620B (en) * 2019-11-28 2024-01-26 长安大学 Noise detection device and detection method
KR102827125B1 (en) 2020-09-17 2025-07-03 삼성전자주식회사 Sensor interface comprising resonator and differential amplifier

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS582640U (en) * 1981-06-30 1983-01-08 日本精密測器株式会社 Vibrating piece type frequency meter
JP3348686B2 (en) * 1998-05-22 2002-11-20 住友金属工業株式会社 Vibration wave detection method and device
JP3348687B2 (en) * 1998-05-22 2002-11-20 住友金属工業株式会社 Vibration wave detection method and device
JP3251555B2 (en) * 1998-12-10 2002-01-28 科学技術振興事業団 Signal analyzer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8803403B2 (en) 2011-12-07 2014-08-12 Industrial Technology Research Institute Inter-digital bulk acoustic resonator

Also Published As

Publication number Publication date
TW200813407A (en) 2008-03-16
WO2007132756A1 (en) 2007-11-22
JP4539920B2 (en) 2010-09-08
JP2007303995A (en) 2007-11-22

Similar Documents

Publication Publication Date Title
TWI323340B (en) Vibrational wave detection method, and vibrational wave detector
TWI243238B (en) Oscillatory wave detection method and device
Yang et al. A piezoelectric AlN MEMS hydrophone with high sensitivity and low noise density
CN102301746B (en) acoustic transducer
CN102067442B (en) MEMS resonator for filtering and mixing
TW201112080A (en) Touch sensitive device
Spetzler et al. Influence of the piezoelectric material on the signal and noise of magnetoelectric magnetic field sensors based on the delta-E effect
Sezen et al. Passive wireless MEMS microphones for biomedical applications
Zhang et al. Design and analysis of a multiple sensor units vector hydrophone
Wang et al. Standing wave performance test of IDT-SAW transducer prepared by silk-screen printing
WO2008001798A1 (en) Oscillating wave detection method and device
Lani et al. Capacitive micromachined ultrasonic transducer arrays as tunable acoustic metamaterials
Gualdino et al. Study of the out-of-plane vibrational modes in thin-film amorphous silicon micromechanical disk resonators
Lakestani et al. Broadening the bandwidth of piezoelectric transducers by means of transmission lines
Pandya et al. Impulse modelled response of a 300 MHz ST-quartz SAW device for sensor specific applications
CN107421655B (en) An even-order Lamb wave generator and temperature detection system
Sayed Ahmed et al. Electrode pattern definition in ultrasound power transfer systems
Fan et al. Theoretical optimizations of acoustic wave gas sensors with high conductivity sensitivities
Filipiak et al. Surface acoustic waves for the detection of small vibrations
JP5154304B2 (en) Device measurement device
CN104573346A (en) Method for analyzing equivalent noise pressure of piezoelectric type hydrophone
JP6428016B2 (en) Digital signal processing circuit
CN111781270A (en) A differential phase detection circuit system for surface acoustic wave gas sensor
JP6653916B2 (en) Phase detection circuit and surface acoustic wave sensor
TW550387B (en) The real time spectrum analyzer

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees