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TW200711009A - Semiconductor package fabrication - Google Patents

Semiconductor package fabrication

Info

Publication number
TW200711009A
TW200711009A TW095107222A TW95107222A TW200711009A TW 200711009 A TW200711009 A TW 200711009A TW 095107222 A TW095107222 A TW 095107222A TW 95107222 A TW95107222 A TW 95107222A TW 200711009 A TW200711009 A TW 200711009A
Authority
TW
Taiwan
Prior art keywords
semiconductor package
package fabrication
drop
demand
fabrication
Prior art date
Application number
TW095107222A
Other languages
English (en)
Other versions
TWI304234B (en
Inventor
Martin Standing
Mark Pavier
Robert J Clarke
Andrew Sawle
Kenneth Mccartney
Original Assignee
Int Rectifier Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Rectifier Corp filed Critical Int Rectifier Corp
Publication of TW200711009A publication Critical patent/TW200711009A/zh
Application granted granted Critical
Publication of TWI304234B publication Critical patent/TWI304234B/zh

Links

Classifications

    • H10W70/041—
    • H10W46/00—
    • H10W70/093—
    • H10W70/098—
    • H10W72/0113—
    • H10W72/20—
    • H10W72/30—
    • H10W72/60—
    • H10W90/00—
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H05K3/1241—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/24—Reinforcing the conductive pattern
    • H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
    • H10W46/401—
    • H10W46/607—
    • H10W72/01331—
    • H10W72/07251—
    • H10W72/073—
    • H10W72/07331—
    • H10W72/251—
    • H10W72/29—
    • H10W72/325—
    • H10W72/352—
    • H10W72/354—
    • H10W72/926—
    • H10W72/932—
    • H10W90/10—

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Die Bonding (AREA)
TW095107222A 2005-03-04 2006-03-03 Semiconductor package fabrication TWI304234B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US65860705P 2005-03-04 2005-03-04
US11/367,725 US7402507B2 (en) 2005-03-04 2006-03-03 Semiconductor package fabrication

Publications (2)

Publication Number Publication Date
TW200711009A true TW200711009A (en) 2007-03-16
TWI304234B TWI304234B (en) 2008-12-11

Family

ID=36953930

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095107222A TWI304234B (en) 2005-03-04 2006-03-03 Semiconductor package fabrication

Country Status (5)

Country Link
US (1) US7402507B2 (zh)
CN (1) CN101238562B (zh)
DE (1) DE112006000505B4 (zh)
TW (1) TWI304234B (zh)
WO (1) WO2006096639A2 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI751009B (zh) * 2021-01-27 2021-12-21 鴻鎵科技股份有限公司 雙電晶體的封裝結構

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US7524701B2 (en) * 2005-04-20 2009-04-28 International Rectifier Corporation Chip-scale package
US7230333B2 (en) * 2005-04-21 2007-06-12 International Rectifier Corporation Semiconductor package
US7348656B2 (en) * 2005-09-22 2008-03-25 International Rectifier Corp. Power semiconductor device with integrated passive component
US8017978B2 (en) * 2006-03-10 2011-09-13 International Rectifier Corporation Hybrid semiconductor device
US20070215997A1 (en) * 2006-03-17 2007-09-20 Martin Standing Chip-scale package
US7884030B1 (en) 2006-04-21 2011-02-08 Advanced Micro Devices, Inc. and Spansion LLC Gap-filling with uniform properties
US8362617B2 (en) * 2008-05-01 2013-01-29 Infineon Technologies Ag Semiconductor device
US7982292B2 (en) * 2008-08-25 2011-07-19 Infineon Technologies Ag Semiconductor device
US8447547B2 (en) * 2009-06-17 2013-05-21 Qualcomm Incorporated Static noise margin estimation
JP5588666B2 (ja) 2009-12-22 2014-09-10 矢崎総業株式会社 混成回路
CN102019264A (zh) * 2010-11-30 2011-04-20 沈阳芯源微电子设备有限公司 一种超微雾化喷涂方法
JP2012253125A (ja) * 2011-06-01 2012-12-20 Sumitomo Electric Ind Ltd 半導体装置及び配線基板
DE102011086687A1 (de) 2011-11-21 2013-05-23 Robert Bosch Gmbh Verfahren zum Kontaktieren eines Halbleiters und Kontaktanordnung für einen Halbleiter
WO2014065080A1 (ja) 2012-10-23 2014-05-01 富士電機株式会社 半導体装置およびその製造方法
US11176635B2 (en) 2013-01-25 2021-11-16 Cyberoptics Corporation Automatic programming of solder paste inspection system
US9099441B2 (en) * 2013-02-05 2015-08-04 Infineon Technologies Austria Ag Power transistor arrangement and method for manufacturing the same
US9743527B2 (en) * 2013-08-09 2017-08-22 CyberOptics Corporaiton Stencil programming and inspection using solder paste inspection system
US9323880B2 (en) 2014-05-28 2016-04-26 GE Intelligent Platforms, Inc Apparatus and method for file translation
US9437492B2 (en) 2014-09-29 2016-09-06 Freescale Semiconductor, Inc. Substrate for alternative semiconductor die configurations
US9892997B2 (en) * 2016-04-19 2018-02-13 Infineon Technologies Americas Corp. Adaptable molded leadframe package and related method
JP6995743B2 (ja) 2016-04-28 2022-01-17 デンカ株式会社 セラミック回路基板及びその製造方法
CN107978576B (zh) 2016-10-21 2023-07-28 恩智浦美国有限公司 封装半导体器件的衬底互连结构
CN111343756A (zh) * 2020-04-23 2020-06-26 北京模电半导体有限公司 恒流控制器封装器件及驱动装置

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US4124411A (en) * 1976-09-02 1978-11-07 U.S. Philips Corporation Method of providing a layer of solid material on a substrate in which liquid from which the solid material can be formed, is spread over the substrate surface
USH445H (en) * 1985-11-29 1988-03-01 American Telephone and Telegraph Company, AT&T Technologies, Incorporated Method of forming light emitting device with direct contact lens
US5773359A (en) * 1995-12-26 1998-06-30 Motorola, Inc. Interconnect system and method of fabrication
US6114187A (en) * 1997-01-11 2000-09-05 Microfab Technologies, Inc. Method for preparing a chip scale package and product produced by the method
KR100219806B1 (ko) * 1997-05-27 1999-09-01 윤종용 반도체장치의 플립 칩 실장형 솔더 범프의 제조방법, 이에 따라 제조되는 솔더범프 및 그 분석방법
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI751009B (zh) * 2021-01-27 2021-12-21 鴻鎵科技股份有限公司 雙電晶體的封裝結構

Also Published As

Publication number Publication date
DE112006000505B4 (de) 2017-07-20
CN101238562A (zh) 2008-08-06
TWI304234B (en) 2008-12-11
DE112006000505T5 (de) 2008-01-17
WO2006096639A2 (en) 2006-09-14
US20060205112A1 (en) 2006-09-14
US7402507B2 (en) 2008-07-22
WO2006096639A3 (en) 2008-05-02
CN101238562B (zh) 2010-09-29

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees