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TW200617375A - Method and device for inspecting defect of glass plate - Google Patents

Method and device for inspecting defect of glass plate

Info

Publication number
TW200617375A
TW200617375A TW094123784A TW94123784A TW200617375A TW 200617375 A TW200617375 A TW 200617375A TW 094123784 A TW094123784 A TW 094123784A TW 94123784 A TW94123784 A TW 94123784A TW 200617375 A TW200617375 A TW 200617375A
Authority
TW
Taiwan
Prior art keywords
scattered light
reflected
defect
detected
image pickup
Prior art date
Application number
TW094123784A
Other languages
English (en)
Inventor
Hidehito Tani
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of TW200617375A publication Critical patent/TW200617375A/zh

Links

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Textile Engineering (AREA)
  • Probability & Statistics with Applications (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
TW094123784A 2004-07-20 2005-07-13 Method and device for inspecting defect of glass plate TW200617375A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004211605A JP2006030067A (ja) 2004-07-20 2004-07-20 ガラス板の欠点検査方法及びその装置

Publications (1)

Publication Number Publication Date
TW200617375A true TW200617375A (en) 2006-06-01

Family

ID=35896599

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094123784A TW200617375A (en) 2004-07-20 2005-07-13 Method and device for inspecting defect of glass plate

Country Status (3)

Country Link
JP (1) JP2006030067A (zh)
KR (1) KR20060053847A (zh)
TW (1) TW200617375A (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4503643B2 (ja) * 2007-12-06 2010-07-14 本田技研工業株式会社 金属ベルトの検査装置
JP4611404B2 (ja) * 2008-06-04 2011-01-12 本田技研工業株式会社 ベルト検査装置
DE102008057131B4 (de) 2007-12-06 2013-05-29 Honda Motor Co., Ltd. Riemenprüfvorrichtung
JP5100371B2 (ja) * 2007-12-28 2012-12-19 株式会社山梨技術工房 ウェハ周縁端の異物検査方法、及び異物検査装置
JP4980443B2 (ja) * 2010-04-21 2012-07-18 本田技研工業株式会社 金属ベルト端部の表面の傷を検査する検査方法
WO2011155294A1 (ja) * 2010-06-09 2011-12-15 シャープ株式会社 基板処理装置、基板搬送装置および打痕検出装置
JP5741893B2 (ja) * 2010-09-03 2015-07-01 株式会社ジェイテクト カムシャフト装置
JP5734104B2 (ja) * 2011-06-06 2015-06-10 倉敷紡績株式会社 ボトル缶の口金部検査装置
JP5562911B2 (ja) * 2011-07-20 2014-07-30 本田技研工業株式会社 ベルト検査装置
JP6296499B2 (ja) * 2014-08-11 2018-03-20 株式会社 東京ウエルズ 透明基板の外観検査装置および外観検査方法
CN111465842A (zh) * 2018-04-10 2020-07-28 日本电气硝子株式会社 玻璃板、玻璃板的制造方法以及端面检查方法
CN118641479B (zh) * 2024-08-15 2025-01-24 杭州利珀科技有限公司 一种硅片崩边缺陷视觉检测装置、方法及系统

Also Published As

Publication number Publication date
KR20060053847A (ko) 2006-05-22
JP2006030067A (ja) 2006-02-02

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