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TR201817920U4 - Görüntü yakalama si̇stemi̇ ve görüntü yakalam si̇stemi̇ne sahi̇p kali̇te i̇nceleme si̇stemi̇ - Google Patents

Görüntü yakalama si̇stemi̇ ve görüntü yakalam si̇stemi̇ne sahi̇p kali̇te i̇nceleme si̇stemi̇ Download PDF

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Publication number
TR201817920U4
TR201817920U4 TR2018/17920U TR201817920U TR201817920U4 TR 201817920 U4 TR201817920 U4 TR 201817920U4 TR 2018/17920 U TR2018/17920 U TR 2018/17920U TR 201817920 U TR201817920 U TR 201817920U TR 201817920 U4 TR201817920 U4 TR 201817920U4
Authority
TR
Turkey
Prior art keywords
image capture
capture system
field
angle
reference plane
Prior art date
Application number
TR2018/17920U
Other languages
English (en)
Inventor
Richard Matthieu
Pilloud Francis
Original Assignee
Bobst Mex Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bobst Mex Sa filed Critical Bobst Mex Sa
Publication of TR201817920U4 publication Critical patent/TR201817920U4/tr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G01N2021/8825—Separate detection of dark field and bright field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917—Paper, also ondulated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Bir lineer görüş alanını (20) yakalanması için uyarlanan bir hat kamerası (12), bir karanlık alan aydınlatıcı (14) ve görüş alanını (20) aydınlatan bir parlak alan aydınlatıcıyı (16) içeren bir görüntü yakalama sistemi olup, burada bileşenler, görüntülerin yakalandığı görüş alanı (20) üzerinden geçen tabaka elemanlarının (4) yüzeyine dikey olan bir referans düzlemine (M) göre, hat kamerasının (12) optik düzleminin, referans düzlemine (M) göre yaklaşık 10° ila 30°, tercihen 20° bir açı (?) ile düzenlendiği, karanlık alan aydınlatmanın (14) optik düzleminin, referans düzlemine (M) göre yaklaşık olarak 30° ila 60°, tercihen 45° bir açıda (ß) düzenlendiği ve parlak alan aydınlatıcının (16) optik düzleminin, referans düzlemine (M) göre yaklaşık olarak 20° ila 40°, tercihen 30° bir açıda (?) düzenlendiği, parlak alan aydınlatıcının (16), 50° ve 110°, tercihen 80° ve 90° arasında bir açılma açısına sahip olduğu şekilde düzenlenmektedir.
TR2018/17920U 2016-05-30 2017-05-17 Görüntü yakalama si̇stemi̇ ve görüntü yakalam si̇stemi̇ne sahi̇p kali̇te i̇nceleme si̇stemi̇ TR201817920U4 (tr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE202016102851.5U DE202016102851U1 (de) 2016-05-30 2016-05-30 Bildaufnahmesystem und Qualitätskontrollstation mit Bildaufnahmesystem

Publications (1)

Publication Number Publication Date
TR201817920U4 true TR201817920U4 (tr) 2021-05-21

Family

ID=56852912

Family Applications (1)

Application Number Title Priority Date Filing Date
TR2018/17920U TR201817920U4 (tr) 2016-05-30 2017-05-17 Görüntü yakalama si̇stemi̇ ve görüntü yakalam si̇stemi̇ne sahi̇p kali̇te i̇nceleme si̇stemi̇

Country Status (9)

Country Link
CN (1) CN209589870U (tr)
AT (1) AT16584U1 (tr)
CZ (1) CZ32481U1 (tr)
DE (1) DE202016102851U1 (tr)
ES (1) ES1224499Y (tr)
PL (1) PL127953U1 (tr)
SK (1) SK9053Y1 (tr)
TR (1) TR201817920U4 (tr)
WO (1) WO2017207114A1 (tr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022113313A1 (de) 2022-05-25 2023-11-30 Mb Automation Gmbh & Co. Kg Vorrichtung und verfahren zum sensorbasierten inspizieren eines objekts
DE102024116943A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
DE102024116942A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur automatischen optischen Inspektion eines entlang einer Transportstrecke bewegten bahnförmigen oder bogenförmigen mindestens eine Beschichtung aufweisenden Produktes
DE102024116944A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
WO2025261964A1 (de) 2024-06-17 2025-12-26 Koenig & Bauer Ag Vorrichtung zur inspektion einer oberfläche eines eine beschichtung auf einem trägersubstrat aufweisenden produktes, inspektionssystem mit einer solchen vorrichtung sowie maschine
CN118670274B (zh) * 2024-08-22 2024-10-25 山东泓邦工具有限公司 一种五金工具生产尺寸检测装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
JP3686329B2 (ja) * 2000-08-22 2005-08-24 シーシーエス株式会社 表面検査用照明装置及び表面検査装置
US20050122509A1 (en) * 2002-07-18 2005-06-09 Leica Microsystems Semiconductor Gmbh Apparatus for wafer inspection
DE102004004761A1 (de) * 2004-01-30 2005-09-08 Leica Microsystems Semiconductor Gmbh Vorrichtung und Verfahren zur Inspektion eines Wafers
DE102007007828B4 (de) * 2007-02-16 2011-02-24 Bst International Gmbh Verfahren und Vorrichtung zum Beleuchten eines Druckbildes auf einer Materialbahn
JP5806808B2 (ja) * 2010-08-18 2015-11-10 倉敷紡績株式会社 撮像光学検査装置
DE102011113670A1 (de) * 2011-09-20 2013-03-21 Schott Ag Beleuchtungsvorrichtung, Inspektionsvorrichtung und Inspektionsverfahren für die optische Prüfung eines Objekts

Also Published As

Publication number Publication date
WO2017207114A1 (en) 2017-12-07
DE202016102851U1 (de) 2016-08-11
ES1224499U (es) 2019-02-06
CN209589870U (zh) 2019-11-05
SK9053Y1 (sk) 2021-02-24
SK501342018U1 (sk) 2020-11-03
PL127953U1 (pl) 2019-07-29
ES1224499Y (es) 2019-04-26
AT16584U1 (de) 2020-02-15
CZ32481U1 (cs) 2019-01-22

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