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RU2002113768A - Способ и устройство для неразрушающего определения в реальном времени остаточных напряжений с использованием технологии оптической голографической интерферометрии - Google Patents

Способ и устройство для неразрушающего определения в реальном времени остаточных напряжений с использованием технологии оптической голографической интерферометрии

Info

Publication number
RU2002113768A
RU2002113768A RU2002113768/28A RU2002113768A RU2002113768A RU 2002113768 A RU2002113768 A RU 2002113768A RU 2002113768/28 A RU2002113768/28 A RU 2002113768/28A RU 2002113768 A RU2002113768 A RU 2002113768A RU 2002113768 A RU2002113768 A RU 2002113768A
Authority
RU
Russia
Prior art keywords
residual stresses
studied
area
supply electrode
current
Prior art date
Application number
RU2002113768/28A
Other languages
English (en)
Russian (ru)
Inventor
Йон Петтер ФЬЕЛДСТАД (NO)
Йон Петтер ФЬЕЛДСТАД
Ирина Евгеньевна ФЬЕЛДСТАД (NO)
Ирина Евгеньевна ФЬЕЛДСТАД
Леонид Михайлович ЛОБАНОВ (UA)
Леонид Михайлович Лобанов
В чеслав Автономович ПИВТОРАК (UA)
Вячеслав Автономович ПИВТОРАК
Николай Георгиевич Кувшинский (UA)
Николай Георгиевич КУВШИНСКИЙ
Сергей Гаврилович АНДРЮЩЕНКО (UA)
Сергей Гаврилович АНДРЮЩЕНКО
Владимир Петрович Кушнирук (UA)
Владимир Петрович Кушнирук
Владимир Петрович ЛОГИНОВ (UA)
Владимир Петрович Логинов
Петр Дмитриевич Кротенко (UA)
Петр Дмитриевич КРОТЕНКО
Валерий Александрович ПАВЛОВ (UA)
Валерий Александрович Павлов
Original Assignee
Холотек Ас (No)
Холотек Ас
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from NO995312A external-priority patent/NO995312D0/no
Application filed by Холотек Ас (No), Холотек Ас filed Critical Холотек Ас (No)
Publication of RU2002113768A publication Critical patent/RU2002113768A/ru

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
RU2002113768/28A 1999-10-29 2000-10-19 Способ и устройство для неразрушающего определения в реальном времени остаточных напряжений с использованием технологии оптической голографической интерферометрии RU2002113768A (ru)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
NO995312A NO995312D0 (no) 1999-10-29 1999-10-29 FremgangsmÕte og anordning for ikke-destruktiv bestemmelse av restspenninger i objekter ved hjelp av holografisk interferometrisk teknikk
NO19995312 1999-10-29
NO20002601A NO20002601L (no) 1999-10-29 2000-05-19 Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk
NO20002601 2000-05-19

Publications (1)

Publication Number Publication Date
RU2002113768A true RU2002113768A (ru) 2004-01-27

Family

ID=26649010

Family Applications (1)

Application Number Title Priority Date Filing Date
RU2002113768/28A RU2002113768A (ru) 1999-10-29 2000-10-19 Способ и устройство для неразрушающего определения в реальном времени остаточных напряжений с использованием технологии оптической голографической интерферометрии

Country Status (7)

Country Link
EP (1) EP1226403A1 (no)
JP (1) JP4623907B2 (no)
CN (1) CN1270160C (no)
AU (1) AU1312001A (no)
NO (1) NO20002601L (no)
RU (1) RU2002113768A (no)
WO (1) WO2001031289A1 (no)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2523073C1 (ru) * 2013-03-21 2014-07-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Устройство для определения механических напряжений на поверхности металлической конструкции путем введения фиксированного количества теплоты

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NO20005376L (no) * 2000-10-25 2002-04-26 Holo Tech As Fremgangsmåte og innretning for ikke-destruktive målinger av egenspenninger i plane og ikke-plane objekter
SE0300666D0 (sv) * 2003-03-10 2003-03-10 Faahraeus Holographic Technolo Stress measurement
JP4328349B2 (ja) 2006-11-29 2009-09-09 株式会社日立製作所 残留応力測定方法及び装置
JP2009014606A (ja) * 2007-07-06 2009-01-22 Hitachi Ltd 残留応力測定装置及び残留応力測定方法
JP4488060B2 (ja) * 2007-11-14 2010-06-23 富士ゼロックス株式会社 成形不能部検出装置、成形不能部検出システム、成形不能部検出プログラムおよび成形不能部検出方法
JP5356894B2 (ja) * 2009-04-06 2013-12-04 ポリプラスチックス株式会社 残留応力算出方法及び残留応力分布導出方法
GB201117343D0 (en) * 2011-10-07 2011-11-23 Airbus Uk Ltd Method and apparatus for measuring residual stresses in a component
CN102865948A (zh) * 2012-09-27 2013-01-09 辽宁忠旺集团有限公司 一种铝合金薄板对接焊焊接残余应力测定方法
EP3149767A4 (en) * 2014-05-29 2018-01-24 Brown University Optical system and methods for the determination of stress in a substrate
CN104697467B (zh) * 2015-02-12 2017-05-24 中北大学 基于线激光扫描的焊缝外观形状及表面缺陷检测方法
CN108181032B (zh) * 2017-12-21 2020-11-03 重庆市铜梁区华亿来铝材加工厂 一种残余应力检测方法
US10837761B1 (en) * 2019-04-30 2020-11-17 The Boeing Company Component heating sub-systems and methods for laser shearography testing systems
CN111982374B (zh) * 2020-08-04 2025-04-04 溧阳卓越新材料科技有限公司 一种铝塑膜冲壳残留应力在线检测方法

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US4249423A (en) * 1979-05-11 1981-02-10 General Electric Company Semi-nondestructive residual stress measurement
JPS61501046A (ja) * 1984-01-05 1986-05-22 インダストリアル　ホログラフイツクス　インコ−ポレ−テツド 二重露光式干渉測定非破壊試験を行う装置
SU1758419A1 (ru) 1990-05-30 1992-08-30 Институт Физико-Технических Проблем Севера Со Ан Ссср Способ определени остаточных напр жений
JPH04186106A (ja) * 1990-11-21 1992-07-02 Kowa Co 光学測定方法および装置
JPH04223208A (ja) * 1990-12-25 1992-08-13 Nippon Telegr & Teleph Corp <Ntt> 実時間変形・形状解析方法及び装置
US5432595A (en) * 1993-07-13 1995-07-11 Pechersky; Martin J. Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison
WO1995010023A1 (en) * 1993-10-05 1995-04-13 Kabushikigaisya Hutech Non-destructive inspection method for mechanical behaviour of article
US6040900A (en) * 1996-07-01 2000-03-21 Cybernet Systems Corporation Compact fiber-optic electronic laser speckle pattern shearography
US5920017A (en) * 1997-10-30 1999-07-06 Westinghouse Savannah River Company Thermal input control and enhancement for laser based residual stress measurements using liquid temperature indicating coatings

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2523073C1 (ru) * 2013-03-21 2014-07-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Устройство для определения механических напряжений на поверхности металлической конструкции путем введения фиксированного количества теплоты

Also Published As

Publication number Publication date
CN1415066A (zh) 2003-04-30
EP1226403A1 (en) 2002-07-31
JP2003514247A (ja) 2003-04-15
CN1270160C (zh) 2006-08-16
NO20002601D0 (no) 2000-05-19
JP4623907B2 (ja) 2011-02-02
NO20002601L (no) 2001-04-30
WO2001031289A1 (en) 2001-05-03
AU1312001A (en) 2001-05-08

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