KR102126836B1 - 절연 검사 방법 및 절연 검사 장치 - Google Patents
절연 검사 방법 및 절연 검사 장치 Download PDFInfo
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- KR102126836B1 KR102126836B1 KR1020157023953A KR20157023953A KR102126836B1 KR 102126836 B1 KR102126836 B1 KR 102126836B1 KR 1020157023953 A KR1020157023953 A KR 1020157023953A KR 20157023953 A KR20157023953 A KR 20157023953A KR 102126836 B1 KR102126836 B1 KR 102126836B1
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- South Korea
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- inspection
- current
- potential difference
- wiring pattern
- insulation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Electromagnetism (AREA)
Abstract
Description
도 2는 본 발명에 따른 절연 검사 장치의 동작을 나타내는 일 실시 형태를 도시하는 도면이다.
도 3은 본 발명에 따른 검사 대상간의 전압 변화를 나타내는 그래프이다.
2: 전원 장치
3: 전압 검출 장치
5: 전류 제어부
6: 제어 장치
Claims (4)
- 기판에 형성되는 복수의 배선 패턴으로부터 선택되는 검사 대상인 배선 패턴의 절연 검사를 행하는 절연 검사 장치로서,
상기 복수의 배선 패턴으로부터 검사 대상인 배선 패턴을 제1 검사부로서 선출하고, 상기 제1 검사부 이외의 검사 대상인 배선 패턴을 제2 검사부로서 선출하는 선출 장치와,
상기 제1 검사부와 상기 제2 검사부 사이에 미리 결정된 전위차를 설정하기 위해서, 상기 제1 검사부와 상기 제2 검사부에 전기적으로 각각 접속되어 전력을 공급하는 전원 장치와,
상기 제1 검사부와 제2 검사부 사이의 전위차를 검출하는 전압 검출 장치와,
상기 전압 검출 장치가 검출하는 상기 전위차에 기초하여, 전압 강하의 발생을 검출한 경우에, 상기 기판을 불량품으로서 판정하는 판정 장치를 구비하고,
상기 전원 장치는 상기 전원 장치로부터의 전류를 제어하여, 미리 정해진 제한 전류 이상의 전류가 흐르지 않도록 제한하는 전류 제어부를 포함하고,
상기 전류 제어부는 상기 제1 검사부와 제2 검사부 사이의 전위차가 상기 미리 결정된 전위차로 될 때까지의 상기 제한 전류인 제1 전류가, 상기 미리 결정된 전위차에 도달한 후의 상기 제한 전류인 제2 전류보다 커지도록 제어하는, 절연 검사 장치. - 제1항에 있어서,
상기 전류 제어부는 상기 제1 전류와 상기 제2 전류를, 0mA 내지 30mA의 범위로 제어하는, 절연 검사 장치. - 제1항 또는 제2항에 있어서,
상기 전류 제어부는 상기 제1 전류를 상기 제2 전류의 5배 내지 30배로 제어하는, 절연 검사 장치. - 기판에 형성되는 복수의 배선 패턴으로부터 선택되는 검사 대상인 배선 패턴의 절연 검사를 행하는 절연 검사 방법으로서,
상기 복수의 배선 패턴으로부터 검사 대상인 배선 패턴을 제1 검사부로서 선출하고, 상기 제1 검사부 이외의 검사 대상인 배선 패턴을 제2 검사부로서 선출하는 공정과,
상기 검사 대상간에 상기 절연 검사를 행하기 위한 미리 결정된 전위차가 되도록 전력을 공급하는 공정과,
상기 검사 대상간에 상기 전력이 공급될 때의 상기 검사 대상간의 전위차를 검출하는 공정과,
상기 검출되는 전위차를 기초로, 전압 강하의 발생을 검출한 경우에 상기 검사 대상간의 절연 상태를 불량으로 판정하는 공정과,
상기 검사 대상간에 상기 미리 결정된 전위차가 설정될 때에, 상기 미리 결정된 전위차에 도달할 때까지 공급되는 전류 값이 제1 전류 이상이 되지 않도록 제한하고, 상기 전위차에 도달한 후에 공급되는 전류 값이 제2 전류 이상이 되지 않도록 제한하고, 상기 제1 전류는 상기 제2 전류보다 커지도록 제어하는 공정
을 포함하는 절연 검사 방법.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013055987A JP6221281B2 (ja) | 2013-03-19 | 2013-03-19 | 絶縁検査方法及び絶縁検査装置 |
| JPJP-P-2013-055987 | 2013-03-19 | ||
| PCT/JP2014/001555 WO2014148050A1 (en) | 2013-03-19 | 2014-03-18 | Insulation inspection method and insulation inspection apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150131007A KR20150131007A (ko) | 2015-11-24 |
| KR102126836B1 true KR102126836B1 (ko) | 2020-06-25 |
Family
ID=51579747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020157023953A Active KR102126836B1 (ko) | 2013-03-19 | 2014-03-18 | 절연 검사 방법 및 절연 검사 장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10197616B2 (ko) |
| JP (1) | JP6221281B2 (ko) |
| KR (1) | KR102126836B1 (ko) |
| CN (1) | CN105190329B (ko) |
| TW (1) | TWI516774B (ko) |
| WO (1) | WO2014148050A1 (ko) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI498571B (zh) * | 2013-03-29 | 2015-09-01 | Nidec Read Corp | 絕緣檢測裝置及絕緣檢測方法 |
| KR102184669B1 (ko) * | 2018-11-05 | 2020-12-01 | 한국로봇융합연구원 | 신호 배선의 다중화 및 단선감지에 의한 다중 배선 간 전환 제어방법 및 시스템 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008089485A (ja) * | 2006-10-04 | 2008-04-17 | Nidec-Read Corp | 絶縁検査装置及び絶縁検査方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS546046A (en) | 1977-06-16 | 1979-01-17 | Toray Ind Inc | Acrylonitrile polymer compsition |
| JPH0827307B2 (ja) * | 1987-12-26 | 1996-03-21 | 富士通株式会社 | プリント配線板の試験装置 |
| JP3546046B2 (ja) * | 2001-09-26 | 2004-07-21 | 日本電産リード株式会社 | 回路基板の絶縁検査装置及び絶縁検査方法 |
| JP4368704B2 (ja) * | 2004-03-12 | 2009-11-18 | 三井金属鉱業株式会社 | 電子部品実装用プリント配線板の電気検査方法および電気検査装置ならびにコンピュータ読み取り可能な記録媒体 |
| JP2008128678A (ja) * | 2006-11-16 | 2008-06-05 | Nidec-Read Corp | 絶縁検査装置及び絶縁検査方法 |
| JP2011002417A (ja) * | 2009-06-22 | 2011-01-06 | Jx Nippon Oil & Energy Corp | 絶縁抵抗測定装置及び絶縁抵抗測定方法 |
| JP5438542B2 (ja) * | 2010-02-15 | 2014-03-12 | 矢崎総業株式会社 | 電圧検出装置 |
| JP5507363B2 (ja) * | 2010-07-02 | 2014-05-28 | 日置電機株式会社 | 回路基板検査装置および回路基板検査方法 |
| CN202631671U (zh) * | 2012-01-05 | 2012-12-26 | 深圳创维数字技术股份有限公司 | 一种pcb板测试设备 |
| CN102798759A (zh) * | 2012-03-22 | 2012-11-28 | 上海信锦电子系统集成有限公司 | 一种绝缘电阻测试系统 |
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2013
- 2013-03-19 JP JP2013055987A patent/JP6221281B2/ja active Active
-
2014
- 2014-03-18 US US14/777,747 patent/US10197616B2/en active Active
- 2014-03-18 CN CN201480015915.8A patent/CN105190329B/zh active Active
- 2014-03-18 TW TW103110041A patent/TWI516774B/zh active
- 2014-03-18 WO PCT/JP2014/001555 patent/WO2014148050A1/en not_active Ceased
- 2014-03-18 KR KR1020157023953A patent/KR102126836B1/ko active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008089485A (ja) * | 2006-10-04 | 2008-04-17 | Nidec-Read Corp | 絶縁検査装置及び絶縁検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6221281B2 (ja) | 2017-11-01 |
| KR20150131007A (ko) | 2015-11-24 |
| US20160178690A1 (en) | 2016-06-23 |
| JP2014181977A (ja) | 2014-09-29 |
| TWI516774B (zh) | 2016-01-11 |
| CN105190329B (zh) | 2018-07-31 |
| WO2014148050A1 (en) | 2014-09-25 |
| CN105190329A (zh) | 2015-12-23 |
| TW201437651A (zh) | 2014-10-01 |
| US10197616B2 (en) | 2019-02-05 |
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