KR100676818B1 - 패널검사장치 - Google Patents
패널검사장치 Download PDFInfo
- Publication number
- KR100676818B1 KR100676818B1 KR1020040097984A KR20040097984A KR100676818B1 KR 100676818 B1 KR100676818 B1 KR 100676818B1 KR 1020040097984 A KR1020040097984 A KR 1020040097984A KR 20040097984 A KR20040097984 A KR 20040097984A KR 100676818 B1 KR100676818 B1 KR 100676818B1
- Authority
- KR
- South Korea
- Prior art keywords
- panel
- mask
- support
- pinboard
- centering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Nonlinear Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Crystallography & Structural Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (8)
- 패널을 검사하기 위한 패널검사장치에 있어서,상기 패널을 지지하는 센터링유닛과;상기 센터링유닛에 지지된 상기 패널의 배면으로 광을 공급하는 백라이트와;상기 패널에 대해 이동가능하게 마련되며, 상기 패널의 액티브영역이 노출되도록 상기 패널의 가장자리인 테두리영역을 커버하는 마스크와;상기 패널에 대해 이동가능하게 마련되며, 상기 패널에 전기적인 신호를 인가하도록 상기 패널의 전극과 접촉가능하게 마련된 핀보드와;상기 패널의 전방에 마련되며, 상기 마스크에 의해 커버된 상기 패널의 액티브영역 및 상기 마스크의 이동에 의해 노출된 상기 패널의 전체면 중 어느 하나를 촬영하는 촬영부를 포함하고,상기 마스크는 상기 패널의 전면 테두리영역과 접촉가능하게 마련된 것을 특징으로 하는 패널검사장치.
- 제1항에 있어서,상기 센터링유닛은 상기 패널을 상기 마스크와 상기 핀보드 및 상기 촬영부 중 적어도 하나의 중심에 위치하도록 지지하는 것을 특징으로 하는 패널검사장치.
- 제2항에 있어서,상기 센터링유닛은,상기 패널의 양측면과 접촉가능하게 마련된 적어도 한 쌍의 센터링부재와,상기 한 쌍의 센터링부재가 상기 패널에 접촉하여 지지하도록 상기 한 쌍의 센터링부재를 이동하는 센터링부재구동부를 포함하는 것을 특징으로 하는 패널검사장치.
- 제1항에 있어서,상기 패널의 전방에 마련되어 상기 패널의 전면으로 광을 공급하는 프론트라이트를 더 포함하는 것을 특징으로 하는 패널검사장치.
- 제4항에 있어서,상기 백라이트에 대해 이동가능하게 상기 패널의 전방에 마련된 지지대를 더 포함하며,상기 지지대는 상기 프론트라이트를 지지하며, 상기 마스크 및 상기 핀보드를 이동가능하게 지지하는 것을 특징으로 하는 패널검사장치.
- 제5항에 있어서,상기 지지대에 대해 상기 마스크 및 상기 핀보드를 일체로 이동하도록 지지하는 마스크구동부를 더 포함하며,상기 마스크구동부는 상기 마스크 및 상기 핀보드를 상기 지지대의 판면에 기립한 방향으로 이동시키는 제1구동부와, 상기 마스크 및 상기 핀보드를 상기 지지대의 판면과 나란한 방향으로 이동시키는 제2구동부를 포함하는 것을 특징으로 하는 패널검사장치.
- 삭제
- 제1항에 있어서,상기 백라이트 및 상기 패널 사이에 마련된 보호판을 더 포함하는 것을 특징으로 하는 패널검사장치.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020040097984A KR100676818B1 (ko) | 2004-11-26 | 2004-11-26 | 패널검사장치 |
| JP2005187153A JP4031491B2 (ja) | 2004-11-26 | 2005-06-27 | パネル検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020040097984A KR100676818B1 (ko) | 2004-11-26 | 2004-11-26 | 패널검사장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20060058937A KR20060058937A (ko) | 2006-06-01 |
| KR100676818B1 true KR100676818B1 (ko) | 2007-01-31 |
Family
ID=36632305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040097984A Expired - Fee Related KR100676818B1 (ko) | 2004-11-26 | 2004-11-26 | 패널검사장치 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP4031491B2 (ko) |
| KR (1) | KR100676818B1 (ko) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103698918A (zh) * | 2013-12-30 | 2014-04-02 | 京东方科技集团股份有限公司 | 直下式背光模组测试装置 |
| CN104019961B (zh) | 2014-05-29 | 2017-03-08 | 京东方光科技有限公司 | 一种背光源检测设备 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000337999A (ja) * | 1999-05-27 | 2000-12-08 | Minato Electronics Inc | マスク板を用いた表示素子の自動画質検査方法及び装置 |
| JP2003194669A (ja) * | 2001-12-27 | 2003-07-09 | Seiko Epson Corp | 液晶装置の検査方法及び検査装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63246795A (ja) * | 1987-04-01 | 1988-10-13 | 日本電信電話株式会社 | 表示試験装置 |
| JPH0783794A (ja) * | 1993-09-14 | 1995-03-31 | Hitachi Electron Eng Co Ltd | 大型液晶パネルの位置決め機構 |
| JPH0936208A (ja) * | 1995-07-14 | 1997-02-07 | Tokyo Electron Ltd | 検査装置 |
| JP4254085B2 (ja) * | 2001-08-28 | 2009-04-15 | 株式会社日立プラントテクノロジー | 液晶パネル基板の検査装置及び検査方法 |
| JP2004287368A (ja) * | 2003-01-27 | 2004-10-14 | Tokyo Electron Ltd | 検査装置 |
-
2004
- 2004-11-26 KR KR1020040097984A patent/KR100676818B1/ko not_active Expired - Fee Related
-
2005
- 2005-06-27 JP JP2005187153A patent/JP4031491B2/ja not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000337999A (ja) * | 1999-05-27 | 2000-12-08 | Minato Electronics Inc | マスク板を用いた表示素子の自動画質検査方法及び装置 |
| JP2003194669A (ja) * | 2001-12-27 | 2003-07-09 | Seiko Epson Corp | 液晶装置の検査方法及び検査装置 |
Non-Patent Citations (2)
| Title |
|---|
| 12337999 |
| 15194669 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4031491B2 (ja) | 2008-01-09 |
| KR20060058937A (ko) | 2006-06-01 |
| JP2006153844A (ja) | 2006-06-15 |
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