JPH012004A - Ultra-narrowband optical multilayer film - Google Patents
Ultra-narrowband optical multilayer filmInfo
- Publication number
- JPH012004A JPH012004A JP62-158258A JP15825887A JPH012004A JP H012004 A JPH012004 A JP H012004A JP 15825887 A JP15825887 A JP 15825887A JP H012004 A JPH012004 A JP H012004A
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- Prior art keywords
- refractive index
- film
- index thin
- optical multilayer
- ultra
- Prior art date
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Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔技術分野〕
この発明は、特定波長の光を選択的に透過あるいは反射
する光学多層膜に関するものである。Detailed Description of the Invention [Technical Field] The present invention relates to an optical multilayer film that selectively transmits or reflects light of a specific wavelength.
特定波長の光を選択的に透過あるいは反射する光学多層
膜1は、第7図(a)にみるように、目的とする光の波
長(λ)の1/4の厚みを有する高屈折率薄膜H#と、
同じ厚みを有する低屈折率薄膜L#とを、基板2上に交
互に積層することで形成されている。The optical multilayer film 1 that selectively transmits or reflects light of a specific wavelength is a high refractive index thin film having a thickness of 1/4 of the wavelength (λ) of the target light, as shown in FIG. 7(a). H# and
It is formed by alternately stacking low refractive index thin films L# having the same thickness on the substrate 2.
しかし、このような光学多層膜では、帯域幅や反射率等
の特性を自由に制御することが難しい。However, in such an optical multilayer film, it is difficult to freely control characteristics such as bandwidth and reflectance.
また、目的とする波長のピークにおける帯域幅が、第7
図(b)にみるように広く、急峻なピークを得ることが
できない、と言う問題もある。特に、帯域幅(半値幅)
を150nm以下にすることは、従来の光学多層膜では
不可能に近い。Also, the bandwidth at the peak of the target wavelength is the 7th
Another problem is that it is not possible to obtain a wide and steep peak as shown in Figure (b). In particular, the bandwidth (half width)
It is nearly impossible to reduce the thickness to 150 nm or less with conventional optical multilayer films.
この発明は、上記事情に鑑みてなされたものであって、
帯域幅や反射率の設定をより大きな範囲で行うことがで
き、かつ、帯域幅を従来になく狭くすることのできる超
狭帯域光学多層膜を提供することを目的としている。This invention was made in view of the above circumstances, and
The object of the present invention is to provide an ultra-narrowband optical multilayer film in which the bandwidth and reflectance can be set over a wider range, and the bandwidth can be made narrower than ever before.
上記目的を達成するため、この発明は、基板表面に高屈
折率薄膜と低屈折率薄膜とが交互に積層された光学多層
膜であって、前記高屈折率薄膜の膜厚が低屈折率薄膜の
膜厚よりも厚く、全薄膜の平均膜厚の2倍近傍の波長の
光に対する強い選択的光学特性を有することを特徴とす
る超狭帯域光学多層膜を要旨としている。To achieve the above object, the present invention provides an optical multilayer film in which high refractive index thin films and low refractive index thin films are alternately laminated on the surface of a substrate, wherein the film thickness of the high refractive index thin film is that of the low refractive index thin film. The gist of this paper is an ultra-narrow band optical multilayer film characterized by having a strong selective optical property for light with a wavelength that is thicker than the average film thickness of the entire thin film and approximately twice the average film thickness of the entire thin film.
以下に、この発明の詳細な説明する。The present invention will be explained in detail below.
第1図(a)にみるように、この発明の超狭帯域光学多
層膜1は、基板2表面に、高屈折率薄y!Hと低屈折率
薄膜りとを交互に積層形成してなるものであるが、この
点は、従来のものとかわらない。As shown in FIG. 1(a), the ultra-narrow band optical multilayer film 1 of the present invention has a high refractive index thin film 1 on the surface of the substrate 2. Although it is formed by alternately laminating H and low refractive index thin films, this point is the same as the conventional one.
各薄膜14.Lの材料としても、従来と同様の化合物を
使用することができる。Each thin film 14. As the material for L, the same compounds as conventional ones can be used.
たとえば、高屈折率薄膜Hとしては、Ti0t−、Ce
O□、ZrO*、ZnS % VzOs等の、屈折率n
が2.0〜2゜6程度の物質による薄膜が使用される。For example, as the high refractive index thin film H, Ti0t-, Ce
Refractive index n of O□, ZrO*, ZnS % VzOs, etc.
A thin film made of a substance with a diameter of about 2.0 to 2.6 is used.
低屈折率薄膜りとしては、CaFt−、MgFz、5i
ft、Aim’s等の、屈折率nが1.3〜1.6程度
の物質による薄膜が使用される。As a low refractive index thin film, CaFt-, MgFz, 5i
A thin film made of a material having a refractive index n of about 1.3 to 1.6, such as ft, Aim's, etc., is used.
そして、以上のような化合物の組み合わせ、および各薄
膜H,Lの膜厚を後述のように選んでやれば、必要とす
る波長の光を反射あるいは透過させることができるよう
になるのである。If the combination of the above compounds and the thickness of each of the thin films H and L are selected as described below, it becomes possible to reflect or transmit light of the required wavelength.
以上のような各薄膜H,Lを形成する方法は、この発明
では特に限定されず、通常と同様の方法が採用される。The method of forming each of the thin films H and L as described above is not particularly limited in this invention, and the same method as usual may be employed.
たとえば、抵抗加熱による真空蒸着法、電子ビーム加熱
による蒸着法、スパッタリング法、イオンブレーティン
グ法等の物理的蒸着法や、CVD法等の化学的蒸着法等
を使用することができるのである。For example, a physical vapor deposition method such as a vacuum evaporation method using resistance heating, an evaporation method using electron beam heating, a sputtering method, an ion blating method, or a chemical vapor deposition method such as a CVD method can be used.
これらの方法によるWl#膜の形成にあたっては、基板
を室温以上に加熱するようであってもよい。In forming the Wl# film by these methods, the substrate may be heated above room temperature.
一般に、基板温度が高ければ高い程、形成される薄膜の
硬度は高くなり、その耐久性も向上するからである。し
かしながら、あまり基板温度が高すぎると、作業性や生
産性が悪くなる恐れがある。Generally, the higher the substrate temperature, the higher the hardness of the formed thin film and the better its durability. However, if the substrate temperature is too high, workability and productivity may deteriorate.
したがって、基板温度は、形成する薄膜の種類やその製
法にもよるが、室温〜350℃程度であることが好まし
い。Therefore, the substrate temperature is preferably about room temperature to 350° C., although it depends on the type of thin film to be formed and its manufacturing method.
また、この発明では、焼成により上記物質となる有機金
属化合物の溶液を基板表面に塗布し焼成する方法を採用
することもできる。Further, in the present invention, a method may be adopted in which a solution of an organometallic compound that becomes the above-mentioned substance upon firing is applied to the surface of the substrate and then fired.
この発明の超狭帯域光学多層膜は、上記のような両溝膜
H,Lのうち、高屈折率薄膜Hの膜厚が、低屈折率W/
#膜りの膜厚よりも厚いことを特徴とする。In the ultra-narrow band optical multilayer film of the present invention, of the double-groove films H and L as described above, the film thickness of the high refractive index thin film H is the low refractive index W/
#It is characterized by being thicker than the film thickness.
このように、高屈折率薄膜Hの膜厚が、低屈折率薄膜り
の膜厚よりも厚くなっていると、第1図(b)に示した
ように、その吸収特性のλ/2の位置に、極めて帯域幅
の狭い、強い選択性を有するピークが得られる。ピーク
の形状(帯域幅や強度等)は、両溝膜H,Lを構成する
材料の組み合わせや、その膜厚比、層数等の条件によっ
て違うが、帯域幅く半値幅)50〜60nw+程度、透
過率lO〜30%と言う、これまでにない、極めて選択
性の強い、急峻なものとすることができる。In this way, if the film thickness of the high refractive index thin film H is thicker than the film thickness of the low refractive index thin film, as shown in Figure 1(b), the absorption characteristic of λ/2 will change. A peak with extremely narrow bandwidth and strong selectivity is obtained at the position. The shape of the peak (bandwidth, intensity, etc.) varies depending on the combination of materials composing the double-groove films H and L, their film thickness ratio, number of layers, etc., but the peak shape (bandwidth, half-width) is about 50 to 60 nw+. , the transmittance is 10 to 30%, which is unprecedented, extremely selective, and steep.
このような急峻なピークは、第7図(b)に示した従来
の吸収特性のうち、波長λのピークよりも波長の短い領
域に存在していた、さざ波状の成分(リップル)のうち
の、一つの成分が大きくなったものである。Such a steep peak is due to the ripple-like component (ripple) that exists in the wavelength region shorter than the peak of wavelength λ in the conventional absorption characteristics shown in Figure 7(b). , one component is larger.
この現象は、両溝膜H,Lの膜厚に差をつけると、各界
面で発生する反射波の位相に変化が起こり、干渉によっ
て、このλ/2の成分の反射が強化されるために発生す
ると考えられる。This phenomenon occurs because when the film thicknesses of both groove films H and L are different, the phase of the reflected waves generated at each interface changes, and the reflection of this λ/2 component is strengthened due to interference. It is thought that this will occur.
この現象は、両溝膜の膜厚比や材料によって影響される
ため、発生波長を厳密に理論より算出することは困難で
あるが、基本的には全薄膜の平均値の2倍近傍、すなわ
ち、従来で言うところの波長λのピーク(全薄膜の平均
値の4倍の波長の成分)の半分の波長(λ/2)近傍の
成分に発生する。This phenomenon is affected by the film thickness ratio and material of both groove films, so it is difficult to calculate the generation wavelength strictly theoretically, but basically it is around twice the average value of all thin films, that is. , occurs at a component near half the wavelength (λ/2) of the conventionally termed peak of wavelength λ (component with a wavelength four times the average value of all thin films).
一方、波長λの従来のピークも、第1図(b)にみるよ
うに、存在しない訳でなく、従来同様に存在するから、
この発明の超狭帯域光学多層膜は、結局、二つのピーク
をあわせ持つものとなる。On the other hand, as shown in Fig. 1(b), the conventional peak at wavelength λ does not exist, but exists in the same way as before.
The ultra-narrow band optical multilayer film of this invention ultimately has two peaks.
波長λ/2におけるピークの形状(帯域幅、強度等)は
、前述したように、両溝膜H,Lを構成する材料の組み
合わせや、その膜厚比、層数等の条件によって種々制御
することができる。As mentioned above, the shape of the peak at wavelength λ/2 (bandwidth, intensity, etc.) can be controlled in various ways depending on conditions such as the combination of materials constituting the double-groove films H and L, their film thickness ratio, and the number of layers. be able to.
たとえば、高屈折率薄膜HとしてTiOxを、低屈折率
薄膜りとして5iftを、それぞれ、使用し、合計の層
数を10層、高屈折率薄膜Hの膜厚を350nm、低屈
折率薄膜りの膜厚を250no+とすると、透過率25
〜30%、帯域幅(半値幅)50〜60nmのピークを
、波長600nmの位置に得ることができる。For example, TiOx is used as the high refractive index thin film H, 5ift is used as the low refractive index thin film, the total number of layers is 10, the film thickness of the high refractive index thin film H is 350 nm, and the low refractive index thin film is If the film thickness is 250no+, the transmittance is 25
~30%, a peak with a bandwidth (half width) of 50 to 60 nm can be obtained at a wavelength of 600 nm.
一例として、第2図に、高屈折率薄膜HとしてTiOx
を、低屈折率薄膜りとして5iftを、それぞれ、使用
し、合計の層数を6〜18層に変化させた際の光学特性
を示す。図にみるように、合計の層数を6層から増やし
て行くと、波長λ/2 (−600nm近傍)にあるピ
ークの透過率を徐々に小さ(する(反射率を増大する)
ことができるようになる。これを、より判り易く、ピー
ク頂点の透過率のみであられすと、第4図のようになる
。As an example, in FIG. 2, TiOx is used as a high refractive index thin film H.
The following shows optical properties when the total number of layers is changed from 6 to 18 using 5ift as a low refractive index thin film. As shown in the figure, as the total number of layers is increased from 6, the transmittance of the peak at wavelength λ/2 (near -600 nm) is gradually decreased (increases the reflectance).
You will be able to do this. This can be more clearly understood by looking only at the transmittance at the peak apex, as shown in Fig. 4.
高屈折率薄膜Hと低屈折率薄膜りとの膜厚差は、前述し
たように、この発明における重要な因子であるが、高屈
折率薄膜Hの膜厚が、低屈折率薄膜りの膜厚よりも厚く
なっていれば、その比は特に限定されず、両溝膜の膜厚
比H:L=11近辺まで有効である。しかし、両者の比
H:Lが3:l近辺からそれ以上になると、かえって、
両者の膜厚が同じである従来のものと特性が近くなって
しまう。したがって、膜厚比H:Lは、1.1=1〜2
:lの範囲内であることが好ましい。As mentioned above, the difference in thickness between the high refractive index thin film H and the low refractive index thin film H is an important factor in this invention. The ratio is not particularly limited as long as it is thicker than the film thickness, and it is effective up to the film thickness ratio of both groove films H:L=11. However, when the ratio H:L of both increases from around 3:l to more than that, on the contrary,
The characteristics will be similar to the conventional one in which both film thicknesses are the same. Therefore, the film thickness ratio H:L is 1.1=1~2
: It is preferable that it is within the range of l.
また、膜厚比H:Lは、上記範囲の中でも、1゜1:1
〜1.5:1の範囲内であることが、より好ましい。Also, the film thickness ratio H:L is within the above range, 1°1:1.
More preferably, the ratio is within the range of 1.5:1.
両溝膜H,Lの膜厚比と、光学特性の関係を第3図に示
す。図にみるように、両溝膜HSLの膜厚が同じである
もの(,1:1)では、波長λ/2(=500nm近傍
)に特徴的なピークは見られない。その前後の成分と同
じくさざ波の一つがあるだけである。これに対し、両者
の膜厚比をH:L=t、i:1にしたこの発明の超狭帯
域光学多層膜では、このλ/2の成分が急成長し、急峻
なピークを示す。両者の膜厚比をさらに大きくすると、
ピークはさらに大きくなり、その頂点の透過率は、H:
L=1.5:1のとき20%にもなるのである。これを
、より判り易く、ピーク頂点の透過率のみであられすと
、第5図のようになる。FIG. 3 shows the relationship between the film thickness ratio of both groove films H and L and optical characteristics. As shown in the figure, when both groove films HSL have the same thickness (1:1), no characteristic peak is observed at wavelength λ/2 (near 500 nm). Just like the components before and after it, there is only one ripple. On the other hand, in the ultra-narrow band optical multilayer film of the present invention in which the film thickness ratio of both is H:L=t, i:1, this λ/2 component grows rapidly and shows a steep peak. If the ratio of both film thicknesses is further increased,
The peak becomes even larger, and the transmittance at the apex becomes H:
When L=1.5:1, it becomes 20%. This can be more easily understood by looking at only the transmittance at the peak apex, as shown in Figure 5.
なお、この際、ピークの帯域幅も、ピークが大きくなる
につれて拡がるが、第3図にみるように、それでも、半
値幅で1100nを超えるものではない。つまり、急峻
なピークが維持されるのである。At this time, the bandwidth of the peak also widens as the peak becomes larger, but as shown in FIG. 3, the half-width still does not exceed 1100n. In other words, a steep peak is maintained.
高屈折率薄膜Hと低屈折率薄膜りの基板上における配列
は、この発明では特に限定されないが、第6図(a)に
みるように、最表層を低屈折率薄膜とし、その膜厚を他
の低屈折率薄膜のほぼ1/2とすることが好ましい。こ
のように両溝IQH,Lを配置すると、第6図(b)に
みるように、ピーク以外の、透過帯の分光特性をよりフ
ラ・7トにすることができるようになるからである。The arrangement of the high refractive index thin film H and the low refractive index thin film H on the substrate is not particularly limited in this invention, but as shown in FIG. 6(a), the outermost layer is a low refractive index thin film, and the film thickness is It is preferable that the refractive index is approximately 1/2 that of other low refractive index thin films. This is because by arranging both grooves IQH and L in this manner, the spectral characteristics of the transmission band other than the peak can be made more flat, as shown in FIG. 6(b).
以上のような、この発明の超狭帯域光学多層膜は、必要
外の波長の光を透過し、それ以外の必要とする光を反射
するミラー(いわゆる、グイクロイックミラー)や、必
要外の波長の光をカットする、照明用色温度変換フィル
タ、光学機器用フィルタ等のフィルタとして用いること
ができる。As described above, the ultra-narrowband optical multilayer film of the present invention can be used as a mirror (so-called gicchroic mirror) that transmits light of unnecessary wavelengths and reflects other necessary light, It can be used as a color temperature conversion filter for illumination, a filter for optical equipment, etc. that cuts light of different wavelengths.
つぎに、この発明の実施例について説明する。Next, embodiments of the invention will be described.
(実施例1)
高屈折率薄膜Hとして厚み350nmのTiOx膜を、
低屈折率薄膜りとして厚み250nmの5ins膜を、
それぞれ使用し、これらを交互に9層積層したあと、最
上層に透過帯の分光特性をフラットにするため厚み12
5nmの5ift膜を積層して、第6図(alにみる層
構成の超狭帯域光学多層膜を得た。このものは、第6図
(blにみるように、波長550n+mに、帯域幅(半
値幅)50r+ll+と言う極めて急峻なピークを有し
ており、単色ミラーとして使用することができた。(Example 1) A TiOx film with a thickness of 350 nm was used as the high refractive index thin film H.
A 5ins film with a thickness of 250nm is used as a low refractive index thin film.
After stacking 9 layers alternately, the top layer has a thickness of 12 mm to flatten the spectral characteristics of the transmission band.
A 5 nm thick 5ift film was laminated to obtain an ultra-narrow band optical multilayer film with the layer structure shown in Figure 6 (al). It had an extremely steep peak of 50r+ll+ (half width), and could be used as a monochromatic mirror.
(実施例2)
上記実施例1と同じ層構成の超狭帯域光学多層膜をフィ
ルタとして使用したところ、放射成分より緑色光成分の
みを取り除いて色温度を調整でき、明るい赤色光を透過
するものが得られた。(Example 2) When an ultra-narrow band optical multilayer film with the same layer structure as in Example 1 was used as a filter, the color temperature could be adjusted by removing only the green light component from the radiation component, and bright red light could be transmitted. was gotten.
この発明の超狭帯域光学多層膜は、以上のようであり、
基板表面に高屈折率Wi膜と低屈折率薄膜とが交互に積
層された光学多層膜であうで、前記高屈折率薄膜の膜厚
が低屈折率薄膜の膜厚よりも厚く、全薄膜の平均膜厚の
2倍近傍の波長の光に対する強い選択的光学特性を有す
るた゛め、帯域幅や反射率の設定をより大きな範囲で行
うことができ、かつ、帯域幅を従来になく狭(すること
のできるものとなる。The ultra-narrow band optical multilayer film of this invention is as described above,
It is an optical multilayer film in which a high refractive index Wi film and a low refractive index thin film are alternately laminated on the substrate surface, and the film thickness of the high refractive index thin film is thicker than the film thickness of the low refractive index thin film, and the average thickness of all the thin films is Because it has strong selective optical properties for light with a wavelength around twice the film thickness, it is possible to set the bandwidth and reflectance over a wider range, and it is also possible to narrow the bandwidth more than ever before. Become what you can.
第1図(alはこの発明の超狭帯域光学多層膜の層構成
の一例を説明する層構成図、第1図(b)はこの層構成
における光学特性の一例をあられすグラフ、第2図は多
層膜の層数と光学特性の関係をあられすグラフ、第3図
は高低両屈折率薄膜の膜厚比と光学特性の関係をあられ
すグラフ、第4図は多層膜の層数とピーク頂点の透過率
との関係をあられすグラフ、第5図は膜厚比とピーク頂
点の透過率との関係をあられすグラフ、第6図(alは
最表層の低屈折率薄膜の膜厚をその他の低屈折率薄膜の
1/2とした実施例の層構成を説明する層構成図、第6
図(b)はこの層構成における光学特性の一例をあられ
すグラフ、第7図(7k)は従来の光学多層膜の層構成
の一例を説明する層構成図、第7図(blはこの層構成
における光学特性の一例をあられすグラフである。
2・・・基板 H・・・高屈折率薄膜 L・・・低屈折
率薄ll11・・・超狭帯域光学多層膜
代理人 弁理士 松 本 武 彦
第1図
(b)
i 長 [nm)
82図
第3図
壇 長 (前]
第4図
第5図
JIIJl比(高/低)
第6図
(b)
波 長 〔nm〕
第7図
<a)
之
(b)
壌 長 (n)
手続補正書(自発
昭和63年 2月24日FIG. 1 (Al is a layer configuration diagram explaining an example of the layer configuration of the ultra-narrow band optical multilayer film of the present invention, FIG. 1(b) is a graph showing an example of the optical characteristics in this layer configuration, and FIG. 2 Figure 3 is a graph showing the relationship between the number of layers in a multilayer film and optical properties, Figure 3 is a graph showing the relationship between the film thickness ratio and optical properties of a thin film with both high and low refractive indexes, and Figure 4 is a graph showing the relationship between the number of layers in a multilayer film and its peak. Figure 5 is a graph showing the relationship between the transmittance at the peak and Figure 6 is a graph showing the relationship between the film thickness ratio and the transmittance at the peak. Layer structure diagram explaining the layer structure of an example with 1/2 of other low refractive index thin films, No. 6
Figure (b) is a graph showing an example of the optical characteristics of this layer configuration, Figure 7 (7k) is a layer configuration diagram explaining an example of the layer configuration of a conventional optical multilayer film, and Figure 7 (bl is a graph of this layer). This is a graph showing an example of the optical properties of the configuration. 2...Substrate H...High refractive index thin film L...Low refractive index thin ll11... Ultra-narrow band optical multilayer film Agent Patent attorney Matsumoto Takehiko Figure 1 (b) i length [nm] Figure 82 Figure 3 Length (front) Figure 4 Figure 5 JIIJl ratio (high/low) Figure 6 (b) Wavelength [nm] Figure 7 <a) (b) Yang Cho (n) Procedural amendment (spontaneous February 24, 1986)
Claims (5)
に積層された光学多層膜であって、前記高屈折率薄膜の
膜厚が低屈折率薄膜の膜厚よりも厚く、全薄膜の平均膜
厚の2倍近傍の波長の光に対する強い選択的光学特性を
有することを特徴とする超狭帯域光学多層膜。(1) An optical multilayer film in which high refractive index thin films and low refractive index thin films are alternately laminated on the surface of a substrate, wherein the film thickness of the high refractive index thin film is thicker than the film thickness of the low refractive index thin film, and An ultra-narrow band optical multilayer film characterized by having strong selective optical properties for light having a wavelength approximately twice the average film thickness of the thin film.
比H:Lが、1.1:1〜2:1の範囲内である特許請
求の範囲第1項記載の超狭帯域光学多層膜。(2) The film thickness ratio H:L of the high refractive index thin film (H) and the low refractive index thin film (L) is within the range of 1.1:1 to 2:1. Ultra-narrowband optical multilayer film.
屈折率薄膜のほぼ1/2である特許請求の範囲第1項ま
たは第2項記載の超狭帯域光学多層膜。(3) The ultra-narrow band optical multilayer film according to claim 1 or 2, wherein the outermost layer is a low refractive index thin film, and the film thickness is approximately 1/2 that of other low refractive index thin films.
を反射するミラーに用いられている特許請求の範囲第1
項から第3項までのいずれかに記載の超狭帯域光学多層
膜。(4) Claim 1 used for a mirror that transmits light of unnecessary wavelengths and reflects light of necessary wavelengths.
The ultra-narrow band optical multilayer film according to any one of items 1 to 3.
れている特許請求の範囲第1項から第3項までのいずれ
かに記載の超狭帯域光学多層膜。(5) The ultra-narrow band optical multilayer film according to any one of claims 1 to 3, which is used in a filter that cuts light of unnecessary wavelengths.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62158258A JPH077129B2 (en) | 1987-06-25 | 1987-06-25 | Ultra narrow band optical multilayer film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62158258A JPH077129B2 (en) | 1987-06-25 | 1987-06-25 | Ultra narrow band optical multilayer film |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPS642004A JPS642004A (en) | 1989-01-06 |
| JPH012004A true JPH012004A (en) | 1989-01-06 |
| JPH077129B2 JPH077129B2 (en) | 1995-01-30 |
Family
ID=15667690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62158258A Expired - Fee Related JPH077129B2 (en) | 1987-06-25 | 1987-06-25 | Ultra narrow band optical multilayer film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH077129B2 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003270725A (en) | 2002-03-14 | 2003-09-25 | Sony Corp | Projection screen and method of manufacturing the same |
| JP4111011B2 (en) * | 2002-03-14 | 2008-07-02 | ソニー株式会社 | Projection screen |
| JP4122010B2 (en) * | 2004-11-12 | 2008-07-23 | 東海光学株式会社 | Infrared light emitter / receiver |
| KR100921202B1 (en) * | 2004-11-04 | 2009-10-13 | 삼성전자주식회사 | Apparatus and method of space time frequency block code |
| CN101057341B (en) * | 2004-11-12 | 2010-12-29 | 东海光学株式会社 | Infrared ray transmission cover |
| KR100720108B1 (en) * | 2005-10-24 | 2007-05-21 | 한국과학기술원 | Method for producing PVA fiber composite mortar for self-charging |
| CN119209015B (en) * | 2024-09-10 | 2025-12-02 | 同济大学 | A thin film structure for energy flow modulation based on multilayer films |
| CN119064334A (en) * | 2024-11-04 | 2024-12-03 | 浙江大学杭州国际科创中心 | Fluorescence detection mechanism |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5039561A (en) * | 1973-08-10 | 1975-04-11 | ||
| JPS6086505A (en) * | 1983-10-18 | 1985-05-16 | Dainippon Printing Co Ltd | color separation filter |
| EP0215371A3 (en) * | 1985-09-17 | 1989-01-04 | Siemens Aktiengesellschaft | Edge interference filters for a wavelength division multiplexing optical communication system |
| JPS62213283A (en) * | 1986-03-14 | 1987-09-19 | Seiko Epson Corp | Solar cell |
-
1987
- 1987-06-25 JP JP62158258A patent/JPH077129B2/en not_active Expired - Fee Related
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