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JPH08264817A - Method of manufacturing thin film solar cell - Google Patents

Method of manufacturing thin film solar cell

Info

Publication number
JPH08264817A
JPH08264817A JP7068143A JP6814395A JPH08264817A JP H08264817 A JPH08264817 A JP H08264817A JP 7068143 A JP7068143 A JP 7068143A JP 6814395 A JP6814395 A JP 6814395A JP H08264817 A JPH08264817 A JP H08264817A
Authority
JP
Japan
Prior art keywords
film
semiconductor film
solar cell
thin
glass substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7068143A
Other languages
Japanese (ja)
Other versions
JP3313259B2 (en
Inventor
Yoshitatsu Kawama
吉竜 川間
Satoshi Arimoto
智 有本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP06814395A priority Critical patent/JP3313259B2/en
Publication of JPH08264817A publication Critical patent/JPH08264817A/en
Application granted granted Critical
Publication of JP3313259B2 publication Critical patent/JP3313259B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Photovoltaic Devices (AREA)

Abstract

PURPOSE: To provide a method of manufacturing a thin film solar cell capable of achieving high efficiency neither contaminating the surface of a semiconductor film nor roughening the surface of a glass substrate. CONSTITUTION: The method is composed of the three steps as follows; the first step (e) of coating a glass substrate 9 with a semiconductor film 1 to be a formed generating layer, the second step (f) of forming a film 20 on the surface of the semiconductor film 1 as if covering through holes 4 in the semiconductor film 1 and the third step of removing the film 20 excluding the through hole parts for surface processing the semiconductor film 1 to form electrodes. Through these procedures, the surface is previously protected by a resistant film to processing solution not to make the processing solution used in said steps decompose or resolve a bonding agent or glass so that the method of manufacturing high efficient thin film solar cell neither contaminating the surface of semiconductor film 1 nor roughening the surface of the glass substrate 9 may be provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、薄膜太陽電池の製造
方法に関し、特に製造過程における半導体膜の電極形成
面およびガラス基板表面の汚染を抑制する方法に関する
ものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a thin film solar cell, and more particularly to a method for suppressing contamination of the electrode forming surface of a semiconductor film and the surface of a glass substrate during the manufacturing process.

【0002】[0002]

【従来の技術】図9,図10は、従来の薄膜太陽電池の
製造方法を製造工程に従って説明するための模式図であ
る。1はp型の例えばシリコンからなる半導体膜、2は
例えばシリコン酸化膜からなる剥離層、3は表面が剥離
層2で覆われた例えばシリコンからなる基板であり、剥
離層2の表面に半導体膜1が形成される。
2. Description of the Related Art FIGS. 9 and 10 are schematic views for explaining a conventional method for manufacturing a thin film solar cell in accordance with manufacturing steps. Reference numeral 1 is a p-type semiconductor film made of, for example, silicon, 2 is a release layer made of, for example, a silicon oxide film, 3 is a substrate made of, for example, silicon having a surface covered with the release layer 2, and a semiconductor film is provided on the surface of the release layer 2. 1 is formed.

【0003】4は半導体膜1に設けられた貫通穴であっ
て半導体膜1の表面より剥離層2にエッチング液を浸漬
させるために設けられている。5は半導体膜1を覆う例
えばPOCl3を用いたリン拡散により形成したn型の不純
物拡散層、6は不純物拡散層5を覆う例えばシリコン窒
化膜よりなる反射防止膜である。
Reference numeral 4 denotes a through hole provided in the semiconductor film 1 so as to allow the release layer 2 to be dipped with an etching solution from the surface of the semiconductor film 1. Reference numeral 5 is an n-type impurity diffusion layer formed by phosphorus diffusion using POCl3 for covering the semiconductor film 1, and reference numeral 6 is an antireflection film made of, for example, a silicon nitride film covering the impurity diffusion layer 5.

【0004】図10において、7は例えば蒸着やスパッ
タにより不純物拡散層5上に形成した銀やアルミからな
る第1の電極、8は第1の電極と同様に銀やアルミから
なる第2の電極であって半導体1上に形成されている。
9はガラス基板、10は例えば透明のシリコン樹脂から
なる接着剤であってガラス基板9の裏面と半導体膜1の
反射防止膜6の成膜した面とを接着する。
In FIG. 10, 7 is a first electrode made of silver or aluminum formed on the impurity diffusion layer 5 by vapor deposition or sputtering, and 8 is a second electrode made of silver or aluminum like the first electrode. And is formed on the semiconductor 1.
Reference numeral 9 is a glass substrate, and 10 is an adhesive made of, for example, transparent silicon resin, which adheres the back surface of the glass substrate 9 and the surface of the semiconductor film 1 on which the antireflection film 6 is formed.

【0005】次に、従来の薄膜太陽電池の製造方法を図
9の(a)〜(d),図10の(e)〜(g)に沿って
説明する。先ず、図9(a)に示すように、半導体膜1
を剥離層2で表面が覆われた基板3の上に形成する。次
に、図9(b)に示すように、半導体膜1の表面側より
半導体膜1を貫く貫通穴4を形成し、図9(c)に示す
ように基板3を剥離層2のみを除去しえるエッチング液
に浸漬し半導体膜1を基板3から分離する。ここで、エ
ッチング液は例えば弗化水素酸とする。
Next, a conventional method for manufacturing a thin film solar cell will be described with reference to FIGS. 9 (a) to 9 (d) and FIGS. 10 (e) to 10 (g). First, as shown in FIG. 9A, the semiconductor film 1
Is formed on the substrate 3 whose surface is covered with the peeling layer 2. Next, as shown in FIG. 9B, a through hole 4 penetrating the semiconductor film 1 is formed from the front surface side of the semiconductor film 1, and as shown in FIG. 9C, the substrate 3 is removed by removing only the peeling layer 2. The semiconductor film 1 is separated from the substrate 3 by immersing it in a suitable etching solution. Here, the etching solution is, for example, hydrofluoric acid.

【0006】次に、図9(d)に示すように、半導体膜
1の表層に不純物拡散層5,反射防止膜6を順次成膜し
た後に、図10(e)に示すように、半導体膜1をガラ
ス基板9に接着剤10により貼り付ける。そして、図1
0(f)に示すように、反射防止膜6を写真製版及びC
F4を用いたドライエッチング等によりパターニングし
た後に反射防止膜6をマスクにして不純物拡散層5を半
導体膜1よりエッチング除去する。ここで、用いるエッ
チング液は例えば水酸化カリウム水溶液とする。
Next, as shown in FIG. 9D, after the impurity diffusion layer 5 and the antireflection film 6 are sequentially formed on the surface layer of the semiconductor film 1, as shown in FIG. 1 is attached to the glass substrate 9 with an adhesive 10. And FIG.
As shown in 0 (f), the antireflection film 6 is formed by photoengraving and C
After patterning by dry etching or the like using F4, the impurity diffusion layer 5 is removed by etching from the semiconductor film 1 using the antireflection film 6 as a mask. The etching liquid used here is, for example, an aqueous potassium hydroxide solution.

【0007】不純物拡散層5をエッチング除去した後
に、図10(g)に示すように、貫通穴4の周囲の反射
防止膜6をドライエッチング等により除去して不純物拡
散層5に第1の電極7を、半導体膜1に第2の電極8を
形成する。ここで電極7及び8は、例えば金属被膜を蒸
着やスパッタにより不純物拡散層5や半導体膜1全面に
形成した後、金属被膜を写真製版などで所望の形状にパ
ターニングすることにより得ることができる。
After removing the impurity diffusion layer 5 by etching, as shown in FIG. 10G, the antireflection film 6 around the through hole 4 is removed by dry etching or the like to form the first electrode on the impurity diffusion layer 5. 7 and the second electrode 8 is formed on the semiconductor film 1. Here, the electrodes 7 and 8 can be obtained, for example, by forming a metal coating on the entire surface of the impurity diffusion layer 5 or the semiconductor film 1 by vapor deposition or sputtering and then patterning the metal coating into a desired shape by photolithography.

【0008】[0008]

【発明が解決しようとする課題】従来の薄膜太陽電池の
製造方法は、以上のように成されているので、工程中に
貫通穴から露出する接着剤が例えば弗化水素酸及び水酸
化カリウム水溶液等のエッチング液に直接さらされるた
め、接着剤が変質,溶解し半導体膜表面が汚染されるこ
とがあり、結果的に不純物拡散層のパターニング不良や
電極のコンタクト不良が発生してて品質が低下するとい
った問題点があった。
Since the conventional method for manufacturing a thin film solar cell is performed as described above, the adhesive exposed from the through hole during the process is, for example, hydrofluoric acid and potassium hydroxide aqueous solution. Since it is directly exposed to etching liquid such as, the adhesive may be altered or dissolved to contaminate the surface of the semiconductor film, resulting in defective patterning of the impurity diffusion layer or defective contact of the electrode, resulting in poor quality. There was a problem that

【0009】また、反射防止膜を半導体膜の周囲に成膜
するため電極形成時には不純物拡散層の除去に加えて反
射防止膜の除去が必要となり製造過程が複雑化するとい
う問題点があった。
Further, since the antireflection film is formed around the semiconductor film, it is necessary to remove the antireflection film in addition to the removal of the impurity diffusion layer at the time of forming the electrode, which complicates the manufacturing process.

【0010】更に、製造過程においてガラス基板の表面
がエッチング液により白濁等の表面荒れを起こしたりガ
ラス基板が変形すことがあるため、入射光の乱反射の発
生により入射光量が減少して太陽電池の発電効率が低下
するという問題点があった。
Furthermore, during the manufacturing process, the surface of the glass substrate may be roughened by the etching solution such as clouding or the glass substrate may be deformed, so that the diffused reflection of the incident light reduces the amount of incident light and the solar cell There is a problem that the power generation efficiency decreases.

【0011】この発明は、以上のような問題点を解決す
るためになされたもので、製造過程において電極形成面
及びガラス基板の光入射面を汚染およびガラス基板が変
形することのない薄膜太陽電池の製造方法を提供するこ
とを目的とする。
The present invention has been made to solve the above problems, and a thin film solar cell which does not contaminate the electrode forming surface and the light incident surface of the glass substrate and does not deform the glass substrate in the manufacturing process. It aims at providing the manufacturing method of.

【0012】[0012]

【課題を解決するための手段】請求項1の発明にかかる
薄膜太陽電池の製造方法は、基板上の剥離層上に半導体
膜を形成する工程と、この半導体膜に設けられた貫通穴
を通し、前記剥離層を除去することで前記半導体膜を前
記基板より分離する工程と、この分離した半導体の表層
に不純物拡散層、反射防止膜を順に成膜する工程と、成
膜された半導体膜をガラス基板に被着する工程と、前記
貫通穴を覆うように半導体膜の表面に被膜を形成する工
程と、前記貫通穴部分以外の被膜を除去して前記半導体
膜の表面を電極形成のための表面処理を行う工程とを有
するものである。
According to a first aspect of the present invention, there is provided a method of manufacturing a thin film solar cell, which comprises a step of forming a semiconductor film on a peeling layer on a substrate, and a through hole provided in the semiconductor film. A step of separating the semiconductor film from the substrate by removing the peeling layer, a step of sequentially forming an impurity diffusion layer and an antireflection film on the surface layer of the separated semiconductor, and a step of forming the formed semiconductor film. A step of adhering to the glass substrate, a step of forming a film on the surface of the semiconductor film so as to cover the through hole, and a step of removing the film other than the through hole portion to form the surface of the semiconductor film for forming an electrode. And a step of performing a surface treatment.

【0013】請求項2の発明にかかる薄膜太陽電池の製
造方法は、請求項1の発明の薄膜太陽電池の製造方法に
おいて貫通穴を覆う被膜にスパッタ,蒸着法等で形成し
た金属薄膜を用いたものである。
The method of manufacturing a thin-film solar cell according to the invention of claim 2 uses a metal thin film formed by sputtering, vapor deposition or the like on the film covering the through hole in the method of manufacturing the thin-film solar cell of the invention of claim 1. It is a thing.

【0014】請求項3の発明にかかる薄膜太陽電池の製
造方法は、請求項2の発明の薄膜太陽電池の製造方法に
おいて貫通穴を覆う金属薄膜に少なくとも銀,チタン,
アルミの何れかもしくは各々を組合せて用いたものであ
る。
A method of manufacturing a thin-film solar cell according to a third aspect of the present invention is the method of manufacturing a thin-film solar cell according to the second aspect of the invention, in which the metal thin film covering the through hole has at least silver, titanium,
Any one of aluminum or a combination of each is used.

【0015】請求項4の発明にかかる薄膜太陽電池の製
造方法は、請求項2の発明の薄膜太陽電池の製造方法に
おいて貫通穴を覆う被膜に金属を主成分とした印刷ペー
ストを用いたものである。
A method of manufacturing a thin-film solar cell according to a fourth aspect of the present invention is the method of manufacturing a thin-film solar cell according to the second aspect of the present invention, in which a printing paste containing a metal as a main component is used as a coating for covering the through hole. is there.

【0016】請求項5の発明にかかる薄膜太陽電池の製
造方法は、請求項4の発明の薄膜太陽電池の製造方法に
おいて貫通穴を覆う印刷ペーストに、少なくとも銀,ア
ルミの何れかもしくは各々を組合せて用いたものであ
る。
According to a fifth aspect of the present invention, there is provided a method for producing a thin-film solar cell according to the fourth aspect, wherein the printing paste covering the through holes is combined with at least one of silver and aluminum or each of them. It was used.

【0017】請求項6の発明にかかる薄膜太陽電池の製
造方法は、請求項1の発明の薄膜太陽電池の製造方法に
おいて貫通穴を覆う被膜にコールタール系の印刷レジス
トを用いたものである。
According to a sixth aspect of the present invention, there is provided a method for producing a thin film solar cell in which the coating film for covering the through hole is made of a coal tar printing resist.

【0018】請求項7の発明にかかる薄膜太陽電池の製
造方法は、請求項1の発明の薄膜太陽電池の製造方法に
おいて半導体膜のガラス基板への被着面に反射防止膜を
成膜するものである。
A method of manufacturing a thin-film solar cell according to a seventh aspect of the present invention is the method of manufacturing a thin-film solar cell according to the first aspect of the invention, in which an antireflection film is formed on the surface of the semiconductor film adhered to the glass substrate. Is.

【0019】請求項8の発明にかかる薄膜太陽電池の製
造方法は、基板上の剥離層上に半導体膜を形成する工程
と、この半導体膜に設けられた貫通穴を通し、前記剥離
層を除去することで前記半導体膜を前記基板より分離す
る工程と、この分離した半導体膜の表層に不純物拡散層
を成膜する工程と、成膜された半導体膜を被膜を形成し
たガラス基板に被着する工程と、前記半導体膜の表面を
電極形成のための表面処理を行う工程と、前記反射防止
膜の表面に形成した被膜を除去する工程とを有するもの
である。
According to an eighth aspect of the present invention, there is provided a method for manufacturing a thin film solar cell, wherein a step of forming a semiconductor film on a peeling layer on a substrate and a through hole formed in the semiconductor film are passed through to remove the peeling layer. By doing so, a step of separating the semiconductor film from the substrate, a step of forming an impurity diffusion layer on a surface layer of the separated semiconductor film, and a step of depositing the formed semiconductor film on a glass substrate having a film formed thereon The method includes a step, a step of subjecting the surface of the semiconductor film to a surface treatment for forming an electrode, and a step of removing the coating film formed on the surface of the antireflection film.

【0020】請求項9の発明にかかる薄膜太陽電池の製
造方法は、基板上の剥離層上に半導体膜を形成する工程
と、この半導体膜に設けられた貫通穴を通し、前記剥離
層を除去することで前記半導体膜を前記基板より分離す
る工程と、この分離した半導体膜の表層に不純物拡散層
を成膜する工程と、成膜された半導体膜を光入射面が被
膜で覆われたガラス基板に被着する工程と、前記貫通穴
を覆うように半導体膜の表面に被膜を形成する工程と、
前記貫通穴部分以外の被膜を除去して前記半導体膜の表
面を電極形成のための表面処理を行う工程と、前記ガラ
ス基板の光入射面に覆われた被膜を除去する工程とを有
するものである。
According to a ninth aspect of the present invention, there is provided a method of manufacturing a thin film solar cell, wherein a step of forming a semiconductor film on a peeling layer on a substrate and a through hole formed in the semiconductor film are passed through to remove the peeling layer. By separating the semiconductor film from the substrate, a step of forming an impurity diffusion layer on the surface layer of the separated semiconductor film, a glass whose light incident surface is covered with a film of the formed semiconductor film A step of adhering to the substrate, a step of forming a film on the surface of the semiconductor film so as to cover the through hole,
And a step of performing a surface treatment for forming an electrode on the surface of the semiconductor film by removing the coating other than the through hole portion, and a step of removing the coating covered by the light incident surface of the glass substrate. is there.

【0021】請求項10の発明にかかる薄膜太陽電池の
製造方法は、請求項8または9の発明の薄膜太陽電池の
製造方法においてガラス基板を覆う被膜にスパッタ,蒸
着法等で形成した金属薄膜を用いるものである。
According to a tenth aspect of the present invention, there is provided a method for producing a thin film solar cell according to the eighth or ninth aspect of the present invention, in which the metal thin film formed by sputtering, vapor deposition or the like is formed on the film covering the glass substrate. It is used.

【0022】請求項11の発明にかかる薄膜太陽電池の
製造方法は、請求項10の発明の薄膜太陽電池の製造方
法においてガラス基板を覆う1種類以上の金属薄膜に少
なくとも銀を用いるものである。
The method of manufacturing a thin-film solar cell according to the invention of claim 11 is the method of manufacturing a thin-film solar cell according to the invention of claim 10, wherein at least silver is used for at least one kind of metal thin film covering the glass substrate.

【0023】請求項12の発明にかかる薄膜太陽電池の
製造方法は、請求項8または9の発明の薄膜太陽電池の
製造方法においてガラス基板の表面に予め反射防止膜を
形成し、その上から被膜で覆うものである。
According to a twelfth aspect of the present invention, there is provided a method for producing a thin film solar cell according to the eighth or ninth aspect, wherein an antireflection film is previously formed on the surface of the glass substrate and a film is formed thereon. Is to be covered with.

【0024】請求項13の発明にかかる薄膜太陽電池の
製造方法は、請求項12の発明の薄膜太陽電池の製造方
法において反射防止膜の上から覆う被膜にスパッタ,蒸
着法等で形成した金属薄膜を用いるものである。
A method of manufacturing a thin-film solar cell according to a thirteenth aspect of the present invention is the method of manufacturing a thin-film solar cell according to the twelfth aspect of the invention, in which a metal thin film formed by sputtering, vapor deposition, or the like on the coating covering the antireflection film from above. Is used.

【0025】請求項14の発明にかかる薄膜太陽電池の
製造方法は、請求項13の発明の薄膜太陽電池の製造方
法において反射防止膜の上から覆う1種類以上の金属薄
膜に少なくとも銀を用いるものである。
According to a fourteenth aspect of the present invention, there is provided a method for producing a thin film solar cell according to the thirteenth aspect, wherein at least silver is used for at least one kind of metal thin film covering the antireflection film. Is.

【0026】[0026]

【作用】請求項1の発明における薄膜太陽電池の製造方
法は、貫通穴を被膜で覆った後に半導体膜の表面を電極
形成のために表面処理行うため、貫通穴を通して接着剤
が表面処理用の液剤に触れて変質したり溶け出すことが
ない。
In the method of manufacturing a thin-film solar cell according to the invention of claim 1, since the surface of the semiconductor film is surface-treated for forming an electrode after the through-hole is covered with a film, the adhesive is used for surface-treating through the through-hole. Do not touch the liquid agent to alter or melt it.

【0027】請求項2の発明における薄膜太陽電池の製
造方法は、貫通穴を覆う被膜を金属被膜とすることで被
膜を電極形成用の配線パターンに適用できる。
In the method of manufacturing a thin-film solar cell according to the second aspect of the present invention, the coating film covering the through holes can be applied to the wiring pattern for electrode formation by using a metal coating film.

【0028】請求項3の発明における薄膜太陽電池の製
造方法は、貫通穴を覆う金属被膜の材質を銀、チタン、
アルミのいずれか1つ、或いはこれら金属の組み合わせ
とすることで、金属被膜が表面処理用の液剤で腐食した
り電極形成用の他金属との接触性が損なわれない配線パ
ターンを半導体膜表面に形成できる。
In the method of manufacturing a thin-film solar cell according to the third aspect of the invention, the material of the metal film covering the through hole is silver, titanium,
By using any one of aluminum or a combination of these metals, a wiring pattern is formed on the surface of the semiconductor film so that the metal film is not corroded by the surface treatment solution or the contact property with other metal for electrode formation is not impaired. Can be formed.

【0029】請求項4の発明における薄膜太陽電池の製
造方法は、貫通穴を覆う金属被膜に導電性の印刷ペース
トを用いることで被膜形成工程が簡略化される。
In the method for manufacturing a thin-film solar cell according to the invention of claim 4, the film forming step is simplified by using a conductive printing paste for the metal film covering the through holes.

【0030】請求項5の発明における薄膜太陽電池の製
造方法は、配線ペーストに、少なくとも銀、アルミの何
れかもしくは各々を組み合わせて用いることで、被膜形
成工程が簡略化されると共に、表面処理用の液剤で腐食
したり電極形成用の他金属との接触性が損なわれない配
線パターンを半導体膜表面に形成できる。
In the method for manufacturing a thin-film solar cell according to the invention of claim 5, the wiring paste is used in combination with at least one of silver and aluminum, or each of them is used in combination to simplify the film forming step and to perform surface treatment. It is possible to form a wiring pattern on the surface of the semiconductor film, which is not corroded by the liquid agent and does not impair the contact with other metals for forming electrodes.

【0031】請求項6の発明における薄膜太陽電池の製
造方法は、貫通穴を覆う被膜にコールタール系の印刷レ
ジストを用いることで被膜形成工程が簡略化と共に、貫
通穴をより密閉できるため接着剤の変質或いは溶解を抑
制できる。
In the method of manufacturing a thin-film solar cell according to the invention of claim 6, the coating film forming step is simplified by using a coal tar-based printing resist for the coating film covering the through hole, and the through hole can be sealed more tightly. It is possible to suppress alteration or dissolution of the.

【0032】請求項7の発明における薄膜太陽電池の製
造方法は、半導体膜のガラス基板への被着面に反射防止
膜を形成することで、半導体膜の電極形成面における被
膜除去工程が減縮されと共に、半導体膜への成膜工程が
削減できる。
In the method for manufacturing a thin-film solar cell according to the invention of claim 7, an antireflection film is formed on the surface of the semiconductor film on which the glass substrate is adhered, so that the film removing step on the electrode formation surface of the semiconductor film is reduced. At the same time, the number of steps for forming a semiconductor film can be reduced.

【0033】請求項8の発明における薄膜太陽電池の製
造方法は、露出するガラス基板を予め被膜で覆うこと
で、ガラス基板を表面処理用の液剤に直接ふれさせない
ため入射光を減少させるガラス基板表面の変形を抑制す
る。
In the method of manufacturing a thin-film solar cell according to the invention of claim 8, the exposed glass substrate is covered with a film in advance, so that the glass substrate is not directly exposed to the liquid agent for surface treatment, so that the incident light is reduced. Suppress the deformation of.

【0034】請求項9の発明における薄膜太陽電池の製
造方法は、貫通穴を被膜で覆った後に半導体膜の表面を
電極形成のために表面処理行なうことで、貫通穴を通し
て接着剤が表面処理用の液剤に溶け出すことを抑制で
き、また露出するガラス基板を予め被膜で覆うことで、
ガラス基板を表面処理用の液剤に直接ふれさせないため
入射光を減少させるガラス基板表面の変形を抑制する。
In the method for manufacturing a thin-film solar cell according to the invention of claim 9, the surface of the semiconductor film is subjected to a surface treatment for forming an electrode after the through hole is covered with a film, and the adhesive is used for surface treatment through the through hole. Can be suppressed from dissolving in the liquid agent of, and by covering the exposed glass substrate with a film in advance,
Since the glass substrate is not directly exposed to the liquid agent for surface treatment, deformation of the glass substrate surface that reduces incident light is suppressed.

【0035】請求項10の発明における薄膜太陽電池の
製造方法は、ガラス基板の光入射面を半導体膜の表面処
理用の液剤で剥離しない金属被膜で覆ったため、薄膜太
陽電池の製造工程でガラス基板の光入射面を半導体膜の
表面処理用の液剤で白濁等の表面荒れを起こすことが抑
制される。
In the method of manufacturing a thin film solar cell according to the invention of claim 10, since the light incident surface of the glass substrate is covered with a metal film which does not peel off with a liquid agent for surface treatment of the semiconductor film, the glass substrate is manufactured in the manufacturing process of the thin film solar cell. It is possible to suppress surface roughness such as white turbidity on the light incident surface of the liquid agent for surface treatment of the semiconductor film.

【0036】請求項11の発明における薄膜太陽電池の
製造方法は、ガラス基板の光入射面に蒸着する金属被膜
に少なくともを銀を使用することで表面処理中にはガラ
ス基板の光入射面を汚染より保護し、表面処理終了後に
は硝酸を用いることで容易に金属被膜を除去することが
できる。
In the method of manufacturing a thin-film solar cell according to the invention of claim 11, the light incident surface of the glass substrate is contaminated during the surface treatment by using at least silver for the metal film deposited on the light incident surface of the glass substrate. The metal film can be easily removed by further protecting and using nitric acid after the surface treatment.

【0037】請求項12の発明における薄膜太陽電池の
製造方法は、ガラス基板の表面に予め反射防止膜を形成
した後に、その上を被膜で覆うことで半導体膜への成膜
工程がなくなり、熱ストレスによる悪影響を回避でき
る。
In the method of manufacturing a thin film solar cell according to the invention of claim 12, after forming an antireflection film on the surface of a glass substrate in advance, by covering it with a film, the step of forming a film on a semiconductor film is eliminated, and the heat treatment is performed. The adverse effects of stress can be avoided.

【0038】請求項13の発明における薄膜太陽電池の
製造方法は、ガラス基板の光入射面に形成した反射防止
膜を金属被膜で覆ったため、薄膜太陽電池の製造工程で
反射防止膜を半導体膜の表面処理用の液剤で白濁等の表
面荒れを起こし、入射光を乱反射させることが抑制され
る。
In the method of manufacturing a thin film solar cell according to the invention of claim 13, since the antireflection film formed on the light incident surface of the glass substrate is covered with a metal film, the antireflection film of the semiconductor film is formed in the manufacturing process of the thin film solar cell. It is possible to prevent the surface treatment liquid agent from causing surface roughness such as white turbidity and irregularly reflecting incident light.

【0039】請求項14の発明における薄膜太陽電池の
製造方法は、反射防止膜に蒸着する金属被膜に少なくと
もを銀を使用することで表面処理中には反射防止膜を汚
染より保護し、表面処理終了後には硝酸を用いることで
容易に金属被膜を除去することができる。
In the method for producing a thin film solar cell according to the invention of claim 14, the antireflection film is protected from contamination during the surface treatment by using at least silver for the metal film deposited on the antireflection film, and the surface treatment is carried out. After the completion, the nitric acid can be used to easily remove the metal coating.

【0040】[0040]

【実施例】【Example】

実施例1.以下、この発明の一実施例による薄膜太陽電
池の製造方法について、図に従って説明する。図1〜図
3は、この発明の一実施例による薄膜太陽電池の製造方
法を、その工程に従って説明するための模式図である。
図に用いる略号1〜10は、従来例の図9、図10と同
一であり、図3の(i)において20は例えばチタン,
銀の順にスパッタまたは蒸着で形成した金属薄膜よりな
る被膜である。
Example 1. Hereinafter, a method for manufacturing a thin film solar cell according to an embodiment of the present invention will be described with reference to the drawings. 1 to 3 are schematic views for explaining a method of manufacturing a thin film solar cell according to an embodiment of the present invention in accordance with the steps.
The abbreviations 1 to 10 used in the drawings are the same as those in FIGS. 9 and 10 of the conventional example, and in FIG.
It is a film made of a metal thin film formed by sputtering or vapor deposition in the order of silver.

【0041】図1(a)に示すように、半導体膜1を剥
離層2で表面が覆われた基板3の上に形成する。次に、
図1(b)に示すように、半導体膜1の表面側より半導
体膜1を貫く貫通穴4を形成した後に、図1(c)に示
すように、剥離層2のみを除去しえるエッチング液に浸
漬し半導体膜1を基板3から分離する。ここで、エッチ
ング液は例えば弗化水素酸とする。次に、図1(d)に
示すように、半導体膜1の表層に不純物拡散層5、反射
防止膜6を順次成膜する。
As shown in FIG. 1A, the semiconductor film 1 is formed on the substrate 3 whose surface is covered with the peeling layer 2. next,
As shown in FIG. 1 (b), after forming a through hole 4 penetrating the semiconductor film 1 from the surface side of the semiconductor film 1, as shown in FIG. 1 (c), an etching solution capable of removing only the peeling layer 2 is formed. And the semiconductor film 1 is separated from the substrate 3. Here, the etching solution is, for example, hydrofluoric acid. Next, as shown in FIG. 1D, the impurity diffusion layer 5 and the antireflection film 6 are sequentially formed on the surface layer of the semiconductor film 1.

【0042】成膜が完了したならば、図2(e)に示す
ように、半導体膜1をガラス基板9に接着剤10により
貼り付け、図2(f)に示すように、反射防止膜6上に
被膜20を成膜する。そして、被膜20を例えば写真製
版などによりパターニングした上で貫通穴4から露出し
ている接着剤10を含む周辺部上を除き、被膜20を除
去する。
When the film formation is completed, the semiconductor film 1 is attached to the glass substrate 9 with the adhesive 10 as shown in FIG. 2 (e), and the antireflection film 6 is provided as shown in FIG. 2 (f). A film 20 is formed on top. Then, the coating 20 is patterned by, for example, photolithography, and then the coating 20 is removed except for the peripheral portion including the adhesive 10 exposed from the through hole 4.

【0043】次に写真製版によりパターニングした上か
ら、反射防止膜6に対しCF4を用いたドライエッチン
グあるいは熱リン酸等のエッチングを用い、図2(g)
に示すような形状を得る。この状態で、例えば水酸化カ
リウム水溶液で不純物拡散層5をエッチングした後、再
びCF4を用いたドライエッチングで反射防止膜6を除
去し図1(h)の形状を得る。
Next, after patterning by photolithography, dry etching using CF4 or etching with hot phosphoric acid or the like is applied to the antireflection film 6 as shown in FIG.
Obtain the shape as shown in. In this state, the impurity diffusion layer 5 is etched with, for example, an aqueous potassium hydroxide solution, and then the antireflection film 6 is removed by dry etching using CF4 again to obtain the shape shown in FIG.

【0044】不純物拡散層5および反射防止膜6のパタ
ーニングが終了したならば、図3(i)に示すように、
第1の電極7,第2の電極8を順次形成する。ここで電
極7及び8は、例えば蒸着やスパッタにより全面に形成
した後、写真製版などで所望の形状にパターニングする
ことにより得ることができる。
When the patterning of the impurity diffusion layer 5 and the antireflection film 6 is completed, as shown in FIG.
The first electrode 7 and the second electrode 8 are sequentially formed. Here, the electrodes 7 and 8 can be obtained, for example, by forming them on the entire surface by vapor deposition or sputtering and then patterning them into a desired shape by photolithography.

【0045】以上のように、貫通穴4から露出する接着
剤10を予め被膜20で覆うことで、接着剤10が弗化
水素酸及び水酸化カリウム水溶液に直接触れる状態を無
くし、半導体膜表面やガラス基板表面の汚染源である接
着剤10の変質,溶解を抑制することができる。
As described above, by covering the adhesive 10 exposed from the through holes 4 with the coating film 20 in advance, it is possible to eliminate the state where the adhesive 10 directly contacts the hydrofluoric acid and potassium hydroxide aqueous solution, and It is possible to suppress alteration and dissolution of the adhesive 10, which is a pollution source on the surface of the glass substrate.

【0046】実施例2.上記、実施例1では反射防止膜
6上にスパッタリング或いは蒸着で金属被膜を成膜した
が、金属被膜に代わって、例えば銀,またはアルミを主
成分とする印刷ペーストを用いてい被膜を形成しても良
い。この結果、被膜の製造工程が簡略化されると共に、
パターニングが容易となる。
Example 2. In the first embodiment, the metal film is formed on the antireflection film 6 by sputtering or vapor deposition. However, instead of the metal film, a film is formed by using a printing paste containing silver or aluminum as a main component. Is also good. As a result, the manufacturing process of the coating is simplified and
Patterning becomes easy.

【0047】実施例3.上記、実施例1,2では金属性
の被膜を形成したが、被膜に例えばコールタール系の印
刷ペーストを用いても良い。この結果、被膜の製造工程
がより簡略化される。
Example 3. Although the metallic coating is formed in the above-described Examples 1 and 2, for example, a coal tar printing paste may be used for the coating. As a result, the manufacturing process of the coating is further simplified.

【0048】実施例4.上記、実施例1〜3では反射防
止膜を半導体膜の全周に形成したが、半導体膜のパター
ン形成面への反射防止膜形成を避けることで、除膜処理
過程が簡略化されうる。以下、この発明の一実施例によ
る薄膜太陽電池の製造方法について、図に従って説明す
る。 図4〜図5は、この発明の一実施例による薄膜太
陽電池の製造方法を、その工程に従って説明するための
模式図である。
Example 4. Although the antireflection film is formed on the entire circumference of the semiconductor film in Examples 1 to 3 above, the film removal treatment process can be simplified by avoiding the formation of the antireflection film on the pattern formation surface of the semiconductor film. Hereinafter, a method for manufacturing a thin film solar cell according to an embodiment of the present invention will be described with reference to the drawings. 4 to 5 are schematic views for explaining a method of manufacturing a thin film solar cell according to an embodiment of the present invention in accordance with the steps.

【0049】図4(a)に示すように、半導体膜1の表
面に不純物拡散層5を形成し、続けてガラス基板9に被
着される片面のみに反射防止膜6を成膜する。次に、図
4(b)に示すように、半導体膜1の反射防止膜6側を
ガラス基板9に接着剤10により貼り付ける。
As shown in FIG. 4A, the impurity diffusion layer 5 is formed on the surface of the semiconductor film 1, and then the antireflection film 6 is formed only on one surface of the glass substrate 9. Next, as shown in FIG. 4B, the antireflection film 6 side of the semiconductor film 1 is attached to the glass substrate 9 with the adhesive 10.

【0050】次に、図4(c)に示すように、半導体膜
1上の不純物拡散層6上に被膜20を成膜し、貫通穴4
から露出している接着剤10を含め所望の電極パターン
が残るように被膜20を除去する。ここで、被膜20は
例えばチタン,銀の順にスパッタもしくは蒸着で形成し
た金属薄膜とする。被膜の形成後、図4(d)に示すよ
うに、被膜20をマスクにして不純物拡散層5をエッチ
ング除去する。ここで、用いるエッチング液は例えば水
酸化カリウム水溶液とする。
Next, as shown in FIG. 4C, a film 20 is formed on the impurity diffusion layer 6 on the semiconductor film 1, and the through hole 4 is formed.
The coating 20 is removed so that the desired electrode pattern including the adhesive 10 exposed from the area remains. Here, the coating film 20 is, for example, a metal thin film formed by sputtering or vapor deposition in the order of titanium and silver. After the film is formed, as shown in FIG. 4D, the impurity diffusion layer 5 is removed by etching using the film 20 as a mask. The etching liquid used here is, for example, an aqueous potassium hydroxide solution.

【0051】次に、図5(e)に示すように、第2の電
極8を形成する。ここで電極8は、例えば蒸着やスパッ
タにより全面に形成した後、写真製版などで所望の形状
にパターニングすることにより得ることができる。以上
のように、貫通穴4から露出する接着剤10を予め被膜
20で覆い、被膜20をそのまま電極として用いること
で、実施例1と同様に接着剤10が弗化水素酸及び水酸
化カリウム水溶液に直接触れる状態を無くし、半導体膜
表面やガラス基板表面の汚染源である接着剤10の変
質,溶解を抑制することができる。
Next, as shown in FIG. 5E, the second electrode 8 is formed. Here, the electrode 8 can be obtained, for example, by forming it on the entire surface by vapor deposition or sputtering and then patterning it into a desired shape by photolithography. As described above, by covering the adhesive 10 exposed from the through holes 4 with the coating film 20 in advance and using the coating film 20 as an electrode as it is, the adhesive 10 can be used as the hydrofluoric acid and potassium hydroxide aqueous solution as in Example 1. It is possible to prevent the state where the adhesive 10 is directly touched, and to suppress the deterioration and dissolution of the adhesive 10, which is a contamination source on the surface of the semiconductor film or the surface of the glass substrate.

【0052】実施例5.上記、実施例4では不純物拡散
層上にスパッタリング或いは蒸着で金属被膜を成膜した
が、金属被膜に代わって、例えば銀,またはアルミを主
成分とする印刷ペーストを用いてい被膜を形成しても良
い。この結果、被膜の製造工程が簡略化されると共に、
パターニングが容易となる。
Example 5. Although the metal film is formed on the impurity diffusion layer by sputtering or vapor deposition in the fourth embodiment, the film may be formed by using a printing paste containing silver or aluminum as a main component instead of the metal film. good. As a result, the manufacturing process of the coating is simplified and
Patterning becomes easy.

【0053】実施例6.上記、実施例1〜5では半導体
膜の電極形成面が接着剤で汚染されるのを抑制する方法
を説明したが、本実施例では半導体膜に被着されたガラ
ス基板の変形をを抑制する薄膜太陽電池の製造方法につ
いて、図に従って説明する。
Example 6. Although the methods for suppressing the contamination of the electrode formation surface of the semiconductor film with the adhesive have been described in Examples 1 to 5 above, the present example suppresses the deformation of the glass substrate adhered to the semiconductor film. A method for manufacturing a thin film solar cell will be described with reference to the drawings.

【0054】図6は、この発明の一実施例による薄膜太
陽電池の製造方法を示し、その工程に従って説明するた
めの模式図である。図において用いてる略号は、実施例
1の図1と同一のものであり、30は例えばスパッタも
しくは蒸着で形成した銀薄膜からなる被膜である。
FIG. 6 is a schematic diagram showing a method of manufacturing a thin film solar cell according to an embodiment of the present invention, and explaining the steps. The abbreviations used in the figure are the same as those in FIG. 1 of Example 1, and 30 is a film made of a silver thin film formed by, for example, sputtering or vapor deposition.

【0055】図6(a)に示すように、予めガラス基板
9の片面に被膜30を形成して図6(b)に示すよう
に、半導体膜1をガラス基板9の被膜30の無い側に接
着剤10により貼り付ける。次に、図6(c)に示すよ
うに、反射防止膜6を写真製版及びドライエッチング等
によりパターニングした後に反射防止膜6をマスクにし
て不純物拡散層5をエッチング除去する。ここで、用い
るエッチング液は水酸化カリウム水溶液とする。
As shown in FIG. 6A, a coating film 30 is formed on one surface of the glass substrate 9 in advance, and as shown in FIG. 6B, the semiconductor film 1 is formed on the side of the glass substrate 9 where the coating film 30 is not provided. Stick with the adhesive 10. Next, as shown in FIG. 6C, the antireflection film 6 is patterned by photolithography and dry etching, and then the impurity diffusion layer 5 is removed by etching using the antireflection film 6 as a mask. The etching solution used here is an aqueous potassium hydroxide solution.

【0056】次に、図6(d)に示すように、反射防止
膜6を除去後第1の電極7,第2の電極8を順次形成
し、ガラス基板9表面の被膜30を除去する。ここで電
極7及び8は、例えば蒸着やスパッタにより全面に形成
した後、写真製版などで所望の形状にパターニングする
ことにより得ることができる。また、被膜30の除去に
は例えば硝酸を用いる。
Next, as shown in FIG. 6D, the antireflection film 6 is removed, the first electrode 7 and the second electrode 8 are sequentially formed, and the coating film 30 on the surface of the glass substrate 9 is removed. Here, the electrodes 7 and 8 can be obtained, for example, by forming them on the entire surface by vapor deposition or sputtering and then patterning them into a desired shape by photolithography. Further, nitric acid, for example, is used to remove the coating film 30.

【0057】以上のように、露出するガラス基板9を予
め被膜30で覆うことで、ガラス基板9を弗化水素酸及
び水酸化カリウム水溶液に直接触れさせず、入射光を減
少させるガラス基板9表面の変形を抑制することができ
る。
As described above, by covering the exposed glass substrate 9 with the coating film 30 in advance, the glass substrate 9 surface which reduces incident light without directly contacting the glass substrate 9 with the hydrofluoric acid and potassium hydroxide aqueous solution. Can be suppressed.

【0058】実施例7.上記、実施例6では半導体膜1
の全周に不純物拡散層5を介して反射防止膜6を形成
し、この半導体膜1をガラス基板9に被着する場合につ
いて説明したが、ガラス基板9の光入射面に反射防止膜
6を形成した後に、金属被30を形成しても良い。以
下、この発明の一実施例による薄膜太陽電池の製造方法
について、図に従って説明する。
Example 7. As described above, in Example 6, the semiconductor film 1
Although the case where the antireflection film 6 is formed on the entire circumference of the glass substrate 9 via the impurity diffusion layer 5 and the semiconductor film 1 is adhered to the glass substrate 9, the antireflection film 6 is formed on the light incident surface of the glass substrate 9. The metal cover 30 may be formed after the formation. Hereinafter, a method for manufacturing a thin film solar cell according to an embodiment of the present invention will be described with reference to the drawings.

【0059】図7〜図8は、この発明の一実施例による
薄膜太陽電池の製造方法を、その工程に従って説明する
ための模式図である。図において用いる略号は、実施例
6の図3と同一のものを示す。
7 to 8 are schematic views for explaining a method of manufacturing a thin film solar cell according to an embodiment of the present invention in accordance with the steps thereof. The abbreviations used in the figure are the same as those in FIG. 3 of the sixth embodiment.

【0060】図7(a)に示すように、半導体膜1の表
面に不純物拡散層5を例えばPOCl3によるリン拡散によ
り形成する。次に、図7(b)に示すように、予めガラ
ス基板9の片面に反射防止膜6及び被膜30を順次形成
しておく。ここで、反射防止膜6は例えばフッ化マグネ
シウム膜とする。そして、図7(c)に示すように、半
導体膜1をガラス基板9の被膜30の無い側に接着剤1
0により貼り付ける。
As shown in FIG. 7A, an impurity diffusion layer 5 is formed on the surface of the semiconductor film 1 by phosphorus diffusion using POCl3, for example. Next, as shown in FIG. 7B, the antireflection film 6 and the coating film 30 are sequentially formed on one surface of the glass substrate 9 in advance. Here, the antireflection film 6 is, for example, a magnesium fluoride film. Then, as shown in FIG. 7C, the semiconductor film 1 is attached to the side of the glass substrate 9 on which the coating film 30 is not provided with the adhesive 1
Paste with 0.

【0061】次に、図7(d)に示すように、不純物拡
散層5をエッチング除去する。ここで、用いるエッチン
グ液は例えば水酸化カリウム水溶液とする。更に、図7
(e)に示すように、第1の電極7,第2の電極8を順
次形成後、ガラス基板9表面の被膜30を除去する。こ
こで電極7及び8は、例えば蒸着やスパッタにより全面
に形成した後、写真製版などで所望の形状にパターニン
グすることにより得ることができる。また、被膜30の
除去には例えば硝酸を用いる。
Next, as shown in FIG. 7D, the impurity diffusion layer 5 is removed by etching. The etching liquid used here is, for example, an aqueous potassium hydroxide solution. Furthermore, FIG.
As shown in (e), after the first electrode 7 and the second electrode 8 are sequentially formed, the coating film 30 on the surface of the glass substrate 9 is removed. Here, the electrodes 7 and 8 can be obtained, for example, by forming them on the entire surface by vapor deposition or sputtering and then patterning them into a desired shape by photolithography. Further, nitric acid, for example, is used to remove the coating film 30.

【0062】以上のように、露出するガラス基板9を予
め被膜30で覆うことで、ガラス基板9を弗化水素酸及
び水酸化カリウム水溶液に直接触れさせず、入射光を減
少させるガラス基板9表面の変形を抑制することができ
る。また、ガラス基板9に予め反射防止膜6を形成して
おくことで、半導体膜1への成膜工程が無くなり、熱ス
トレスによる悪影響を回避できる。
As described above, by covering the exposed glass substrate 9 with the coating film 30 in advance, the glass substrate 9 is prevented from being directly contacted with the hydrofluoric acid and potassium hydroxide aqueous solution, and the incident light is reduced. Can be suppressed. Further, by forming the antireflection film 6 on the glass substrate 9 in advance, the step of forming the film on the semiconductor film 1 is eliminated, and the adverse effect of thermal stress can be avoided.

【0063】実施例8.上記、実施例1〜5に示した薄
膜太陽電池の製造方法は貫通穴4から露出する接着剤1
0を被膜で覆う製造方法であり、実施例6,7に示した
ガラス基板表面を被膜で覆って薄膜太陽電池を製造する
方法を説明したものである。従って、銀等の金属薄膜で
片面を覆ったガラス基板を用いて実施例1〜5のプロセ
スを実施することことで、半導体膜の電極形成面及びガ
ラス基板の光入射面の汚染およびガラス基板の変形を抑
制できる高品質で高効率の薄膜太陽電池の製造方法を提
供できることは無論である。
Example 8. In the method for manufacturing the thin-film solar cell described in Examples 1 to 5, the adhesive 1 exposed from the through hole 4 is used.
0 is a method of manufacturing a thin film solar cell by covering the surface of the glass substrate shown in Examples 6 and 7 with a film. Therefore, by carrying out the processes of Examples 1 to 5 using a glass substrate whose one surface is covered with a metal thin film such as silver, contamination of the electrode formation surface of the semiconductor film and the light incident surface of the glass substrate and the glass substrate It is needless to say that it is possible to provide a high-quality and highly efficient thin-film solar cell manufacturing method capable of suppressing deformation.

【0064】[0064]

【発明の効果】請求項1の発明によれば、基板上の剥離
層上に半導体膜を形成する工程と、この半導体膜に設け
られた貫通穴を通し、前記剥離層を除去することで前記
半導体膜を前記基板より分離する工程と、この分離した
半導体の表層に不純物拡散層、反射防止膜を順に成膜す
る工程と、成膜された半導体膜をガラス基板に被着する
工程と、前記貫通穴を覆うように前記半導体膜の表面に
被膜を形成する工程と、前記貫通穴部分以外の被膜を除
去して前記半導体膜の表面を電極形成のための表面処理
を行う工程とを有したので、貫通穴を被膜で覆った後に
半導体膜の表面を電極形成のために表面処理行うため、
貫通穴を通して接着剤が表面処理用の液剤に溶け出すこ
とがない半導体膜の表面を汚染せず高品質の薄膜太陽電
池を製作できるという効果がある。
According to the invention of claim 1, the step of forming a semiconductor film on the release layer on the substrate and the removal of the release layer through the through holes provided in the semiconductor film A step of separating the semiconductor film from the substrate, a step of sequentially forming an impurity diffusion layer and an antireflection film on the surface layer of the separated semiconductor, a step of depositing the formed semiconductor film on a glass substrate, The method has a step of forming a film on the surface of the semiconductor film so as to cover the through hole, and a step of removing the film other than the through hole portion and subjecting the surface of the semiconductor film to a surface treatment for forming an electrode. Therefore, since the surface of the semiconductor film is subjected to a surface treatment for forming an electrode after covering the through hole with a film,
There is an effect that a high quality thin film solar cell can be manufactured without contaminating the surface of the semiconductor film in which the adhesive does not dissolve into the surface treatment liquid through the through hole.

【0065】請求項2の発明によれば、請求項1の発明
の薄膜太陽電池の製造方法において貫通穴を覆う被膜に
スパッタ,蒸着法等で形成した金属薄膜を用いたもの
で、請求項1の効果に加えて、貫通穴を覆う被膜を金属
被膜とすることで被膜を電極形成用の配線パターンに適
用できるためパターニングの設計が容易になるという効
果がある。
According to the invention of claim 2, in the method of manufacturing a thin film solar cell of the invention of claim 1, a metal thin film formed by sputtering, vapor deposition or the like is used for the coating film covering the through holes. In addition to the effect of (3), since the film covering the through hole is a metal film, the film can be applied to the wiring pattern for electrode formation, the patterning design can be facilitated.

【0066】請求項3の発明によれば、請求項2の発明
の薄膜太陽電池の製造方法において貫通穴を覆う金属薄
膜に少なくとも銀,チタン,アルミの何れかもしくは各
々を組合せて用いたので、請求項2の効果に加えて、貫
通穴を覆う金属被膜の材質を銀、チタン、アルミのいず
れか1つ、或いはこれら金属の組み合わせとすること
で、表面処理用の液剤で腐食したり電極形成用の他金属
との接触性が損なわれない配線パターンを半導体膜表面
に形成できる高品質の薄膜太陽電池を製作できるという
効果がある。
According to the invention of claim 3, in the method of manufacturing a thin film solar cell of claim 2, at least one of silver, titanium and aluminum or a combination thereof is used for the metal thin film covering the through hole. In addition to the effect of claim 2, when the material of the metal coating for covering the through hole is one of silver, titanium, aluminum, or a combination of these metals, it is corroded by a liquid agent for surface treatment or an electrode is formed. There is an effect that it is possible to manufacture a high quality thin film solar cell capable of forming a wiring pattern on the surface of a semiconductor film without impairing the contact property with other metals for use.

【0067】請求項4の発明によれば、請求項2の発明
の薄膜太陽電池の製造方法において貫通穴を覆う被膜に
金属を主成分とした印刷ペーストを用いたので、請求項
2の効果に加えて、貫通穴を覆う金属被膜に導電性の印
刷ペーストを用いることで被膜形成工程が簡略化される
という効果がある
According to the invention of claim 4, in the method of manufacturing a thin-film solar cell of the invention of claim 2, a printing paste containing a metal as a main component is used for the coating film covering the through holes. In addition, the use of a conductive printing paste for the metal film covering the through holes has the effect of simplifying the film forming process.

【0068】請求項5の発明によれば、請求項4の発明
の薄膜太陽電池の製造方法において貫通穴を覆う印刷ペ
ーストに、少なくとも銀,アルミの何れかもしくは各々
を組合せて用いたので、請求項4の効果に加えて、 配
線ペーストに、少なくとも銀、アルミの何れかもしくは
各々を組み合わせて用いることで、表面処理用の液剤で
腐食したり電極形成用の他金属との接触性が損なわれな
い配線パターンを半導体膜表面に形成できるため高品質
の薄膜太陽電池を製作できるという効果がある。
According to the invention of claim 5, since at least one of silver and aluminum or a combination thereof is used in the printing paste for covering the through hole in the method for manufacturing a thin film solar cell of the invention of claim 4, In addition to the effect of item 4, when at least one of silver and aluminum or a combination thereof is used in the wiring paste, corrosion is caused by the liquid agent for surface treatment and contact with other metals for electrode formation is impaired. Since there is no wiring pattern formed on the surface of the semiconductor film, there is an effect that a high quality thin film solar cell can be manufactured.

【0069】請求項6の発明によれば、請求項1の発明
の薄膜太陽電池の製造方法において貫通穴を覆う被膜に
コールタール系の印刷レジストを用いたので、請求項1
の効果に加えて、被膜形成工程が簡略化と共に、貫通穴
をより密閉できるため接着剤の変質或いは溶解を充分に
抑制できるという効果がある。
According to the invention of claim 6, in the method of manufacturing a thin-film solar cell of the invention of claim 1, a coal tar printing resist is used for the coating film covering the through holes.
In addition to the above effect, there is an effect that the film forming step is simplified and the through hole can be more closed, so that the deterioration or dissolution of the adhesive agent can be sufficiently suppressed.

【0070】請求項7の発明によれば、請求項1の発明
の薄膜太陽電池の製造方法において半導体膜のガラス基
板への被着面に反射防止膜を成膜するようにしたので、
請求項1の効果に加えて、半導体膜のガラス基板の被着
面に反射防止膜を形成することで、半導体膜の電極形成
面における被膜除去工程が減縮されと共に、半導体膜へ
の成膜工程が削減できるという効果がある。
According to the invention of claim 7, in the method for manufacturing a thin film solar cell of the invention of claim 1, the antireflection film is formed on the surface of the semiconductor film adhered to the glass substrate.
In addition to the effect of claim 1, by forming an antireflection film on the surface of the semiconductor film on which the glass substrate is adhered, the film removing step on the electrode forming surface of the semiconductor film is reduced and the film forming step on the semiconductor film is performed. Is effective.

【0071】請求項8の発明によれば、基板上の剥離層
上に半導体膜を形成する工程と、この半導体膜に設けら
れた貫通穴を通し、前記剥離層を除去することで前記半
導体膜を前記基板より分離する工程と、この分離した半
導体膜の表層に不純物拡散層を成膜する工程と、成膜さ
れた半導体膜を被膜を形成したガラス基板に被着する工
程と、前記半導体膜の表面を電極形成のための表面処理
を行う工程と、前記反射防止膜の表面に形成した被膜を
除去する工程とを有したので、露出するガラス基板を予
め被膜で覆うことで、ガラス基板を表面処理用の液剤に
直接ふれさせず、入射光を減少させるガラス基板表面の
変形を抑制することができるという効果がある。
According to the invention of claim 8, the step of forming a semiconductor film on the release layer on the substrate and the removal of the release layer through the through-holes provided in the semiconductor film removes the semiconductor film. From the substrate, a step of forming an impurity diffusion layer on the surface layer of the separated semiconductor film, a step of applying the formed semiconductor film to a glass substrate having a film formed thereon, and the semiconductor film Since it has a step of performing a surface treatment for the surface of the electrode for forming an electrode, and a step of removing the coating film formed on the surface of the antireflection film, by covering the exposed glass substrate with the coating film in advance, There is an effect that deformation of the surface of the glass substrate that reduces incident light can be suppressed without directly touching the surface treatment liquid agent.

【0072】請求項9の発明によれば、基板上の剥離層
上に半導体膜を形成する工程と、この半導体膜に設けら
れた貫通穴を通し、前記剥離層を除去することで前記半
導体膜を前記基板より分離する工程と、この分離した半
導体膜の表層に不純物拡散層を成膜する工程と、成膜さ
れた半導体膜を光入射面が被膜で覆われたガラス基板に
被着する工程と、半導体膜の表面を前記貫通穴を覆うよ
うに被膜を形成する工程と、前記貫通穴部分以外の被膜
を除去して前記半導体膜の表面を電極形成のための表面
処理を行う工程と、前記ガラス基板の光入射面に覆われ
た被膜を除去する工程とを有したので、貫通穴を被膜で
覆った後に半導体膜の表面を電極形成のために表面処理
行うため、貫通穴を通して接着剤が表面処理用の液剤に
溶け出すことを抑制でき、また露出するガラス基板を予
め被膜で覆うことで、ガラス基板を表面処理用の液剤に
直接ふれさせず、入射光を減少させるガラス基板表面の
変形を抑制できるという効果がある。
According to the invention of claim 9, the step of forming a semiconductor film on the peeling layer on the substrate, and the peeling layer is removed through the through hole provided in the semiconductor film to remove the semiconductor film. From the substrate, a step of forming an impurity diffusion layer on the surface of the separated semiconductor film, and a step of depositing the formed semiconductor film on a glass substrate whose light incident surface is covered with a film. A step of forming a film on the surface of the semiconductor film so as to cover the through hole, a step of removing the film other than the through hole portion and performing a surface treatment for forming an electrode on the surface of the semiconductor film, Since the step of removing the coating film covered with the light incident surface of the glass substrate is performed, the surface of the semiconductor film is subjected to a surface treatment for electrode formation after the through hole is covered with the coating film. From being dissolved in the surface treatment liquid. Can also by covering in advance by coating a glass substrate to be exposed, not exposed directly to the glass substrate in liquid for surface treatment, there is an effect that the deformation of the glass substrate surface can be suppressed to reduce the incident light.

【0073】請求項10の発明によれば、請求項8また
は9の発明の薄膜太陽電池の製造方法においてガラス基
板を覆う被膜にスパッタ,蒸着法等で形成した金属薄膜
を用いたので、請求項8または9の効果に加えて、ガラ
ス基板の光入射面を半導体膜の表面処理用の液剤で剥離
しない金属被膜で覆ったため、薄膜太陽電池の製造工程
でガラス基板の光入射面を半導体膜の表面処理用の液剤
で白濁等の表面荒れを起こすことが抑制できるという効
果がある。
According to the invention of claim 10, in the method of manufacturing a thin-film solar cell according to claim 8 or 9, a metal thin film formed by sputtering, vapor deposition or the like is used as a film covering a glass substrate. In addition to the effect of 8 or 9, since the light incident surface of the glass substrate is covered with a metal film that does not peel off with the liquid agent for surface treatment of the semiconductor film, the light incident surface of the glass substrate is covered with the semiconductor film in the manufacturing process of the thin film solar cell. There is an effect that it is possible to prevent the surface treatment liquid agent from causing surface roughness such as clouding.

【0074】請求項11の発明によれば、請求項10の
発明の薄膜太陽電池の製造方法においてガラス基板を覆
う1種類以上の金属薄膜に少なくとも銀を用いので、請
求項10の効果に加えて、ガラス基板の光入射面に蒸着
する金属被膜に少なくともを銀を使用することで表面処
理中にはガラス基板の光入射面を汚染より保護し、表面
処理終了後には硝酸を用いることで容易に金属被膜を除
去することができるという効果がある。
According to the invention of claim 11, since at least silver is used for at least one kind of metal thin film covering the glass substrate in the method for manufacturing a thin film solar cell of the invention of claim 10, in addition to the effect of claim 10. , By using at least silver for the metal coating deposited on the light incident surface of the glass substrate to protect the light incident surface of the glass substrate from contamination during the surface treatment, it is easy to use nitric acid after the surface treatment. There is an effect that the metal film can be removed.

【0075】請求項12の発明によれば、請求項8また
は9の発明の薄膜太陽電池の製造方法においてガラス基
板の表面に予め反射防止膜を形成し、その上から被膜で
覆うようにしたので、請求項8または9の効果に加え
て、ガラス基板の表面に予め反射防止膜を形成した後
に、その上を被膜で覆うことで半導体膜への成膜工程が
なくなり、熱ストレスによる悪影響を回避できるという
効果がある。
According to the invention of claim 12, in the method for manufacturing a thin film solar cell according to claim 8 or 9, an antireflection film is formed on the surface of the glass substrate in advance, and the antireflection film is covered with a film from above. In addition to the effect according to claim 8 or 9, in addition to forming an antireflection film on the surface of the glass substrate in advance, by covering it with a film, the film forming step on the semiconductor film is eliminated, and the adverse effect of thermal stress is avoided. The effect is that you can do it.

【0076】請求項13の発明によれば、請求項12の
発明の薄膜太陽電池の製造方法において反射防止膜の上
から覆う被膜にスパッタ,蒸着法等で形成した金属薄膜
を用いたので、請求項12の効果に加えて、ガラス基板
の光入射面に形成した反射防止膜を金属被膜で覆ったた
め、薄膜太陽電池の製造工程で反射防止膜を半導体膜の
表面処理用の液剤で白濁等の表面荒れを起こし、入射光
を乱反射させることが抑制できるという効果がある。
According to the thirteenth aspect of the present invention, in the method of manufacturing a thin-film solar cell according to the twelfth aspect of the invention, a metal thin film formed by sputtering, vapor deposition or the like is used as the coating covering the antireflection film from above. In addition to the effect of item 12, since the antireflection film formed on the light incident surface of the glass substrate is covered with the metal coating, the antireflection film is not clouded by the liquid agent for the surface treatment of the semiconductor film in the manufacturing process of the thin film solar cell. There is an effect that it is possible to suppress surface roughness and irregular reflection of incident light.

【0077】請求項14の発明によれば、請求項13の
発明の薄膜太陽電池の製造方法において反射防止膜の上
から覆う1種類以上の金属薄膜に少なくとも銀を用いた
ので、請求項13の効果に加えて、反射防止膜に蒸着す
る金属被膜に少なくともを銀を使用することで表面処理
中には反射防止膜を汚染より保護し、表面処理終了後に
は硝酸を用いることで容易に金属被膜を除去することが
できるという効果がある。
According to the fourteenth aspect of the invention, since at least silver is used for at least one kind of metal thin film covering the antireflection film from above in the method of manufacturing a thin film solar cell of the thirteenth aspect, the thirteenth aspect of the invention is described. In addition to the effect, by using at least silver for the metal film deposited on the antireflection film, the antireflection film is protected from contamination during the surface treatment, and nitric acid is used after the surface treatment to facilitate the metal coating. The effect is that can be removed.

【図面の簡単な説明】[Brief description of drawings]

【図1】 この発明の実施例1〜3による薄膜太陽電池
の製造方法を説明するための模式図である。
FIG. 1 is a schematic diagram for explaining a method for manufacturing a thin film solar cell according to Examples 1 to 3 of the present invention.

【図2】 この発明の実施例1〜3による薄膜太陽電池
の製造方法を説明するための模式図である。
FIG. 2 is a schematic diagram for explaining a method for manufacturing a thin film solar cell according to Examples 1 to 3 of the present invention.

【図3】 この発明の実施例1〜3による薄膜太陽電池
の製造方法を説明するための模式図である。
FIG. 3 is a schematic diagram for explaining a method for manufacturing a thin film solar cell according to Examples 1 to 3 of the present invention.

【図4】 この発明の実施例4,5による薄膜太陽電池
の製造方法を説明するための模式図である。
FIG. 4 is a schematic diagram for explaining a method for manufacturing a thin film solar cell according to Examples 4 and 5 of the present invention.

【図5】 この発明の実施例4,5による薄膜太陽電池
の製造方法を説明するための模式図である。
FIG. 5 is a schematic diagram for explaining a method for manufacturing a thin film solar cell according to Examples 4 and 5 of the present invention.

【図6】 この発明の実施例6による薄膜太陽電池の製
造方法を説明するための模式図である。
FIG. 6 is a schematic diagram for explaining a method for manufacturing a thin-film solar cell according to Example 6 of the present invention.

【図7】 この発明の実施例7による薄膜太陽電池の製
造方法を説明するための模式図である。
FIG. 7 is a schematic diagram for explaining a method for manufacturing a thin-film solar cell according to Example 7 of the present invention.

【図8】 この発明の実施例7による薄膜太陽電池の製
造方法を説明するための模式図である。
FIG. 8 is a schematic diagram for explaining a method for manufacturing a thin-film solar cell according to Example 7 of the present invention.

【図9】 従来の薄膜太陽電池の製造方法を説明するた
めの模式図である。
FIG. 9 is a schematic view for explaining a conventional method for manufacturing a thin film solar cell.

【図10】 従来の薄膜太陽電池の製造方法を説明する
ための模式図である。
FIG. 10 is a schematic diagram for explaining a conventional method for manufacturing a thin film solar cell.

【符号の説明】[Explanation of symbols]

1 半導体膜、2 剥離層、3 基板、4 貫通穴、5
不純物拡散層、6 反射防止膜、7 第1の電極、8
第2の電極、9 ガラス基板、10 接着剤、20
被膜、30 被膜。
1 semiconductor film, 2 release layer, 3 substrate, 4 through hole, 5
Impurity diffusion layer, 6 Antireflection film, 7 First electrode, 8
Second electrode, 9 glass substrate, 10 adhesive, 20
Coating, 30 coatings.

Claims (14)

【特許請求の範囲】[Claims] 【請求項1】 基板上の剥離層に半導体膜を形成する工
程と、 この半導体膜に設けられた貫通穴を通し、前記剥離層を
除去することで前記半導体膜を前記基板より分離する工
程と、 この分離した半導体膜の表層に不純物拡散層、反射防止
膜を順に成膜する工程と、 成膜された半導体膜をガラス基板に被着する工程と、 前記貫通穴を覆うように前記半導体膜の表面に被膜を形
成する工程と、 前記貫通穴部分以外の被膜を除去して前記半導体膜の表
面を電極形成のための表面処理を行う工程とを有するこ
とを特徴とする薄膜太陽電池の製造方法。
1. A step of forming a semiconductor film in a peeling layer on a substrate, and a step of separating the semiconductor film from the substrate by removing the peeling layer through a through hole provided in the semiconductor film. A step of sequentially forming an impurity diffusion layer and an antireflection film on a surface layer of the separated semiconductor film, a step of depositing the formed semiconductor film on a glass substrate, and the semiconductor film so as to cover the through hole. And a step of forming a coating on the surface of the semiconductor film, and a step of removing the coating other than the through-hole portion and subjecting the surface of the semiconductor film to a surface treatment for forming an electrode. Method.
【請求項2】 半導体膜の表面を覆う被膜にスパッタ,
蒸着法等で形成した金属薄膜を用いることを特徴とする
特許請求の範囲1項に記載の薄膜太陽電池の製造方法。
2. A sputtering method for coating a film covering a surface of a semiconductor film,
The method for producing a thin film solar cell according to claim 1, wherein a metal thin film formed by a vapor deposition method or the like is used.
【請求項3】 金属薄膜に少なくとも銀,チタン,アル
ミの何れかもしくは各々を組合せて用いることを特徴と
する特許請求の範囲2項に記載の薄膜太陽電池の製造方
法。
3. The method for producing a thin-film solar cell according to claim 2, wherein at least one of silver, titanium, and aluminum or a combination thereof is used for the metal thin film.
【請求項4】 被膜に金属を主成分とした印刷ペースト
を用いることを特徴とする特許請求の範囲2項に記載の
薄膜太陽電池の製造方法。
4. The method for producing a thin-film solar cell according to claim 2, wherein a printing paste containing a metal as a main component is used for the coating.
【請求項5】 印刷ペーストに、少なくとも銀,アルミ
の何れかもしくは各々を組合せて用いることを特徴とす
る特許請求の範囲4項に記載の薄膜太陽電池の製造方
法。
5. The method for producing a thin film solar cell according to claim 4, wherein at least one of silver and aluminum or a combination thereof is used in the printing paste.
【請求項6】 被膜にコールタール系の印刷レジストを
用いることを特徴とする特許請求の範囲1項に記載の薄
膜太陽電池の製造方法。
6. The method for producing a thin-film solar cell according to claim 1, wherein a coating resist of coal tar type is used for the film.
【請求項7】 半導体膜のガラス基板への被着面に反射
防止膜を成膜することを特徴とする特許請求の範囲1項
に記載の薄膜太陽電池の製造方法。
7. The method for producing a thin film solar cell according to claim 1, wherein an antireflection film is formed on the surface of the semiconductor film on which the glass substrate is adhered.
【請求項8】 基板上の剥離層上に半導体膜を形成する
工程と、 この半導体膜に設けられた貫通穴を通し、前記剥離層を
除去することで前記半導体膜を前記基板より分離する工
程と、 この分離した半導体膜の表層に不純物拡散層を成膜する
工程と、 成膜された半導体膜を、光入射面に被膜を形成したガラ
ス基板に被着する工程と、 前記半導体膜の表面を電極形成のための表面処理を行う
工程と、 前記光入射面に形成した被膜を除去する工程とを有する
ことを特徴とする薄膜太陽電池の製造方法。
8. A step of forming a semiconductor film on a peeling layer on a substrate, and a step of separating the semiconductor film from the substrate by removing the peeling layer through a through hole provided in the semiconductor film. A step of forming an impurity diffusion layer on the surface layer of the separated semiconductor film, a step of depositing the formed semiconductor film on a glass substrate having a light incident surface, and a surface of the semiconductor film. And a step of removing the coating film formed on the light incident surface, and a method of manufacturing a thin-film solar cell.
【請求項9】 基板上の剥離層上に半導体膜を形成する
工程と、 この半導体膜に設けられた貫通穴を通し、前記剥離層を
除去することで前記半導体膜を前記基板より分離する工
程と、 この分離した半導体膜の表層に不純物拡散層を成膜する
工程と、 成膜された半導体膜を光入射面が被膜で覆われたガラス
基板に被着する工程と、 半導体膜の表面を前記貫通穴を覆うように被膜を形成す
る工程と、 前記貫通穴部分以外の被膜を除去して前記半導体膜の表
面を電極形成のための表面処理を行う工程と、 前記ガラス基板の光入射面に覆われた被膜を除去する工
程とを有することを特徴とする薄膜太陽電池の製造方
法。
9. A step of forming a semiconductor film on a peeling layer on a substrate, and a step of separating the semiconductor film from the substrate by removing the peeling layer through a through hole provided in the semiconductor film. And a step of forming an impurity diffusion layer on the surface layer of the separated semiconductor film, a step of depositing the formed semiconductor film on a glass substrate whose light-incident surface is covered with a film, and a step of covering the surface of the semiconductor film. A step of forming a film so as to cover the through hole, a step of removing the film other than the through hole portion and performing a surface treatment for forming an electrode on the surface of the semiconductor film, and a light incident surface of the glass substrate And a step of removing the coating film covered with the thin film solar cell.
【請求項10】 ガラス基板を覆う被膜にスパッタ,蒸
着法等で形成した金属薄膜を用いることを特徴とする特
許請求の範囲8または9項に記載の薄膜太陽電池の製造
方法。
10. The method for producing a thin film solar cell according to claim 8, wherein a metal thin film formed by sputtering, vapor deposition or the like is used as a coating film covering the glass substrate.
【請求項11】 ガラス基板を覆う1種類以上の金属薄
膜に少なくとも銀を用いることを特徴とする特許請求の
範囲10項に記載の薄膜太陽電池の製造方法。
11. The method of manufacturing a thin-film solar cell according to claim 10, wherein at least silver is used in at least one kind of metal thin film that covers the glass substrate.
【請求項12】 ガラス基板の光入射面に予め反射防止
膜を形成し、その膜上を被膜で覆うことを特徴とする特
許請求の範囲8または9項に記載の薄膜太陽電池の製造
方法。
12. The method for manufacturing a thin-film solar cell according to claim 8 or 9, wherein an antireflection film is previously formed on the light incident surface of the glass substrate, and the film is covered with a film.
【請求項13】 反射防止膜の上を覆う被膜にスパッ
タ,蒸着法等で形成した金属薄膜を用いることを特徴と
する特許請求の範囲12項に記載の薄膜太陽電池の製造
方法。
13. The method for producing a thin-film solar cell according to claim 12, wherein a metal thin film formed by sputtering, vapor deposition or the like is used as a film covering the antireflection film.
【請求項14】 反射防止膜の上を覆う1種類以上の金
属薄膜に少なくとも銀を用いることを特徴とする特許請
求の範囲13項に記載の薄膜太陽電池の製造方法。
14. The method for manufacturing a thin-film solar cell according to claim 13, wherein at least silver is used for at least one kind of metal thin film covering the antireflection film.
JP06814395A 1995-03-27 1995-03-27 Manufacturing method of thin film solar cell Expired - Fee Related JP3313259B2 (en)

Priority Applications (1)

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Application Number Priority Date Filing Date Title
JP06814395A JP3313259B2 (en) 1995-03-27 1995-03-27 Manufacturing method of thin film solar cell

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JPH08264817A true JPH08264817A (en) 1996-10-11
JP3313259B2 JP3313259B2 (en) 2002-08-12

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011517136A (en) * 2008-04-15 2011-05-26 リニューアブル・エナジー・コーポレーション・エーエスエー Fabrication method for wafer-based solar panels
WO2012005318A1 (en) * 2010-07-08 2012-01-12 ソニーケミカル&インフォメーションデバイス株式会社 Solar cell module and method for manufacturing solar cell module

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011517136A (en) * 2008-04-15 2011-05-26 リニューアブル・エナジー・コーポレーション・エーエスエー Fabrication method for wafer-based solar panels
US8753957B2 (en) 2008-04-15 2014-06-17 Rec Solar Pte. Ltd. Method for production of wafer based solar panels
US10147830B2 (en) 2008-04-15 2018-12-04 Rec Solar Pte. Ltd. Method for production of wafer based solar panels
WO2012005318A1 (en) * 2010-07-08 2012-01-12 ソニーケミカル&インフォメーションデバイス株式会社 Solar cell module and method for manufacturing solar cell module
JP2012019078A (en) * 2010-07-08 2012-01-26 Sony Chemical & Information Device Corp Solar cell module, method of manufacturing the same

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