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JPH08181449A - Connection electrode for electronic circuit board and manufacturing method thereof - Google Patents

Connection electrode for electronic circuit board and manufacturing method thereof

Info

Publication number
JPH08181449A
JPH08181449A JP31990194A JP31990194A JPH08181449A JP H08181449 A JPH08181449 A JP H08181449A JP 31990194 A JP31990194 A JP 31990194A JP 31990194 A JP31990194 A JP 31990194A JP H08181449 A JPH08181449 A JP H08181449A
Authority
JP
Japan
Prior art keywords
connection electrode
brazing material
connection
circuit board
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31990194A
Other languages
Japanese (ja)
Inventor
Masakazu Ishino
正和 石野
Takashi Inoue
隆史 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP31990194A priority Critical patent/JPH08181449A/en
Publication of JPH08181449A publication Critical patent/JPH08181449A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【目的】 初期的に電気回路基板の接続電極の金属面間
に段差等による非接触部分があっても、ろう材を介して
信頼性の高い電気的接続が得られる電子回路基板の接続
電極とその製造方法の提供。 【構成】 電子回路基板の接続電極は、基板上にて、ろ
う材と濡れ性の悪い材料でろう材と濡れ性の良い材料の
表面を被い、その一部に開口を設けると共に、その表面
をろう材で被い、更に基板間を接着するための接着材の
うち、接続電極面上の接着層のみ除去されてパッド部の
窓明けが形成されてなる構成であり、一方、接続電極の
製造方法は、ろう材と濡れ性の良い材料、悪い材料の順
に成膜した複合膜表面の一部に開口を設け、該開口を該
開口径より大きい径のろう材で覆って接続電極を形成
し、接続電極面上の接着層のみを、次工程の加熱圧着前
に予め除去してパッド部の窓明けを行う構成。
(57) [Abstract] [Purpose] An electronic device that can obtain a highly reliable electrical connection through a brazing material even if there is a non-contact portion due to a step or the like between the metal surfaces of the connection electrodes of the electric circuit board initially. A connection electrode for a circuit board and a method for manufacturing the same. [Composition] A connecting electrode of an electronic circuit board covers a surface of a material having good wettability with a brazing material and a material having good wettability with a brazing material on the substrate, and an opening is provided in a part thereof and the surface thereof is provided. Is covered with a brazing material, and further, among the adhesives for adhering between the substrates, only the adhesive layer on the connection electrode surface is removed to form a window opening of the pad portion. The manufacturing method is to form a connection electrode by forming an opening in a part of the surface of a composite film formed by depositing a brazing material, a material having good wettability and a material having poor wettability, and covering the opening with a brazing material having a diameter larger than the opening diameter. Then, only the adhesive layer on the connection electrode surface is removed in advance before the thermocompression bonding in the next step to open the window of the pad portion.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電子回路基板の接続電極
とその製造方法に係り、特に、初期的に電気回路基板の
接続電極の金属面間に段差等による非接触部分があって
も、ろう材を介して信頼性の高い電気的接続が得られる
とともに、従来の接着剤による接続不良を解消するのに
好適な電子回路基板の接続電極とその製造方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a connecting electrode for an electronic circuit board and a method for manufacturing the connecting electrode, and in particular, even if there is a non-contact portion due to a step or the like between the metal surfaces of the connecting electrode of the electric circuit board initially. The present invention relates to a connection electrode of an electronic circuit board suitable for obtaining a highly reliable electrical connection through a brazing material and eliminating a connection failure due to a conventional adhesive, and a manufacturing method thereof.

【0002】[0002]

【従来の技術】従来、多層配線基板を製造する方法とし
ては、ポリイミドシート上に配線パターンを形成し、こ
の配線パターンを形成したポリイミドシートに接着剤を
塗布し、この接着剤を塗布したポリイミドシートの多数
枚を基板上に積層して加圧加熱状態で一体化する方法
(例えば、特開平4−162589号公報)が用いられ
ていた。本方法は、シート間を接続する方法として、ポ
リイミドシートの両面に金を用いた配線パターンを形成
し、この上に0.1μm程度のポリイミド前駆体ワニス
を塗布して加熱圧着していた。
2. Description of the Related Art Conventionally, as a method of manufacturing a multilayer wiring board, a wiring pattern is formed on a polyimide sheet, an adhesive is applied to the polyimide sheet on which the wiring pattern is formed, and the polyimide sheet coated with the adhesive is used. A method of laminating a large number of the above on a substrate and integrating them under pressure and heating (for example, JP-A-4-162589) has been used. In this method, as a method for connecting the sheets, a wiring pattern using gold was formed on both surfaces of the polyimide sheet, and a polyimide precursor varnish of about 0.1 μm was applied on the wiring pattern, and thermocompression bonding was performed.

【0003】この方法は金と金の固相拡散でポリイミド
シート上の接続電極が電気的に接続されることを期待し
たものであり、接続に必要な温度は350℃以上が必要
であり、かつ固相拡散を確実に行なうためには金の表面
を清浄にして接触加圧することが必要であった。
This method is expected to electrically connect the connection electrodes on the polyimide sheet by solid-phase diffusion of gold and gold, and the temperature required for the connection must be 350 ° C. or higher, and In order to ensure solid-phase diffusion, it was necessary to clean the surface of gold and apply contact pressure.

【0004】[0004]

【発明が解決しようとする課題】しかし、前記特開平4
−162589号公報に示すような方法を用いると、次
ぎの2点により接続の確実性が損なわれる場合があっ
た。その第1の点は、シート間を接着するためのポリイ
ミド前駆体ワニスを0.1μm塗布した上から加熱圧着
し、ポリイミド前駆体ワニスが流動により金表面から排
除できることを期待しているが、この方法ではポリイミ
ドワニスを接続電極面から確実に排除することは困難で
あり、ポリイミドワニスの一部が電極間に挟まって接続
不良になる場合がある。第2の点は、大規模な回路基板
を製造しようとした場合には接続点数が1万点以上にも
なり、加圧力を大きくしても全点が確実に接触すること
は難しく、金属の相互拡散よる接続を全点で確実に行う
ことは困難であった。
However, the above-mentioned Japanese Unexamined Patent Application Publication No.
When the method as disclosed in Japanese Patent Laid-Open No. 162589/1989 is used, the reliability of the connection may be impaired due to the following two points. The first point is that it is expected that the polyimide precursor varnish for adhering between the sheets is applied by 0.1 μm and then thermocompression-bonded, and the polyimide precursor varnish can be removed from the gold surface by flow. With the method, it is difficult to reliably remove the polyimide varnish from the surface of the connection electrode, and a part of the polyimide varnish may be sandwiched between the electrodes, resulting in poor connection. The second point is that when trying to manufacture a large-scale circuit board, the number of connection points becomes 10,000 or more, and it is difficult for all points to make reliable contact even if the applied pressure is increased. It was difficult to make connections by mutual diffusion reliably at all points.

【0005】また、接着剤の厚さを0.1μm程度の厚
さに限定すると、配線導体の段差接着材で平滑にするこ
とはできない。例えば、配線導体の厚さが5μm以上あ
る場合に段差を平滑にするためには、導体層厚さ以上の
接着層厚さが必要とされる。このため、このような場合
には、加圧により接着剤が接続電極面から排除できるこ
とを期待するのはほとんど不可能で、接続不良の原因に
なる場合がある。以上の理由により従来の方法ではシー
ト間の接続電極を電気的に確実に接続することは困難で
あった。
Further, if the thickness of the adhesive is limited to about 0.1 μm, it is not possible to make it smooth with the step adhesive of the wiring conductor. For example, when the wiring conductor has a thickness of 5 μm or more, an adhesive layer thickness equal to or larger than the conductor layer thickness is required to smooth the step. Therefore, in such a case, it is almost impossible to expect that the adhesive can be removed from the connection electrode surface by pressurization, which may cause a connection failure. For the above reasons, it has been difficult to reliably electrically connect the connection electrodes between the sheets by the conventional method.

【0006】本発明は、上記従来技術の問題点に鑑み、
初期的に電気回路基板の接続電極の金属面間に段差等に
よる非接触部分があっても、ろう材を介して信頼性の高
い電気的接続が得られるとともに、従来の接着剤による
接続不良を解消し、しかも接着層の厚さ寸法が従来より
格段に厚いものまで使用可能になる電気回路基板の接続
電極構造を提供することを目的とする。
The present invention has been made in view of the above problems of the prior art.
Even if there is a non-contact part due to a step or the like between the metal surfaces of the connection electrodes of the electric circuit board initially, a reliable electrical connection can be obtained through the brazing material, and a connection failure due to the conventional adhesive can be prevented. It is an object of the present invention to provide a connection electrode structure of an electric circuit board which can be solved and can be used even if the thickness of the adhesive layer is significantly thicker than in the past.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、本発明の電子回路基板の接続電極は、電気回路パタ
ーンを有する複数枚の基板が接着層を介して積層され、
該各基板の電極間の電気的接続が基板の加熱圧着により
行われる電子回路基板の接続電極において、基板面に、
所定の接続電極径に形成されたろう材と濡れ性の良い電
導性材料と、該濡れ性の良い電導性材料表面を覆う中心
部に開口を設けたろう材と濡れ性の悪い電導性材料とか
らなる複合膜と、該複合膜上に所定の厚さにめっきされ
たろう材とにより形成された接続電極が、基板間を接着
積層する前記接着層のうち、接続電極面上の接着層のみ
除去されてパッド部の窓明けが形成されてなる構成にし
たものである。
In order to achieve the above object, the connection electrode of the electronic circuit board of the present invention has a plurality of boards having an electric circuit pattern laminated through an adhesive layer,
In the connection electrodes of the electronic circuit board in which the electrical connection between the electrodes of each board is performed by thermocompression bonding of the board, on the board surface,
Consists of a brazing material having a predetermined connection electrode diameter and a conductive material having good wettability, a brazing material having an opening in the central portion covering the surface of the conductive material having good wettability, and a conductive material having poor wettability The connection electrode formed by the composite film and the brazing material plated on the composite film to a predetermined thickness has a structure in which only the adhesive layer on the connection electrode surface is removed from the adhesive layers for adhesively laminating the substrates. This is a structure in which the opening of the window of the pad portion is formed.

【0008】そして、上記電子回路基板の接続電極の製
造方法は、電気回路パターンを有する複数枚の基板が接
着層を介して積層され、該各基板の電極間の電気的接続
が基板の加熱圧着により行われる電子回路基板の接続電
極の製造方法において、(i)基板上に、ろう材と濡れ
性の良い材料、悪い材料の順に、いずれも電導性材料か
らなる複合膜を成膜し、(ii)該成膜した複合膜表面に
レジストパターンを形成し、前記ろう材と濡れ性の悪い
材料を部分的にエッチング除去して接続電極が形成され
る位置の中心部に開口を設け、(iii)前記レジストを
除去後、該除去した面の前記開口上に、前記ろう材と濡
れ性の悪い材料の表面にまたがるように、前記開口径よ
り大きくかつ開口と相似で、形成される接続電極の径相
当の開口を有するレジストパターンを新たに形成し、該
レジストパターンをめっきマスクとしてろう材を電気め
っきにより所定の膜厚にめっきし、(iv)前記新たに形
成したレジストパターンを除去し、前記めっきしたろう
材をマスクとして前記複合膜をエッチング除去して接続
電極を形成し、(v)該形成した接続電極および基板表
面に接着層を塗布して乾燥した後、接続電極面上の接着
層のみを、次工程の加熱圧着前に予め除去してパッド部
の窓明けを行う構成にしたものである。
In the method of manufacturing the connection electrodes of the electronic circuit board, a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and the electrical connection between the electrodes of each board is performed by thermocompression bonding of the boards. In the method for producing a connection electrode of an electronic circuit board performed according to (i), a composite film made of a conductive material is formed on a substrate in the order of a material having good wettability with a brazing material and a material having poor wettability, ( ii) A resist pattern is formed on the surface of the formed composite film, a material having poor wettability with the brazing material is partially removed by etching, and an opening is provided at the center of a position where a connection electrode is formed. ) After removing the resist, a connection electrode formed on the removed surface of the removed surface is larger than the opening diameter and similar to the opening so as to straddle the surface of the material having poor wettability with the brazing material. A lens with an opening corresponding to the diameter Stroke pattern is newly formed, and the brazing material is plated to a predetermined thickness by electroplating using the resist pattern as a plating mask. (Iv) The newly formed resist pattern is removed, and the plated brazing material is masked. As a result, the composite film is removed by etching to form a connection electrode, and (v) an adhesive layer is applied to the formed connection electrode and substrate surface and dried, and then only the adhesive layer on the connection electrode surface is subjected to the next step. Before heating and pressure bonding, the pad is opened beforehand to open the window of the pad.

【0009】また、本発明の他の電子回路基板の接続電
極は、電気回路パターンを有する複数枚の基板が接着層
を介して積層され、該各基板の電極間の電気的接続が基
板の加熱圧着により行われる電子回路基板の接続電極に
おいて、基板面に、ろう材と濡れ性の良い電導性材料に
て形成された接続電極と、該接続電極上面を除いて形成
された基板間の接着およびろう材の濡れ広がり防止用の
絶縁材料からなる接着層と、前記接続電極上に前記接着
層の表面にまたがるように、前記接続電極の径より大き
い径に形成されたろう材とにより形成されてなる構成に
したものである。
Further, in the connection electrode of another electronic circuit board of the present invention, a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and the electrical connection between the electrodes of each board is performed by heating the board. In a connection electrode of an electronic circuit board, which is performed by pressure bonding, a connection electrode formed of a conductive material having a good wettability with a brazing material on a substrate surface, and adhesion between the substrate formed excluding the connection electrode upper surface and An adhesive layer made of an insulating material for preventing the wetting and spreading of the brazing material, and a brazing material formed on the connection electrode so as to have a diameter larger than the diameter of the connection electrode so as to extend over the surface of the adhesion layer. It is configured.

【0010】そして、上記本発明の他の電子回路基板の
接続電極の製造方法は、電気回路パターンを有する複数
枚の基板が接着層を介して積層され、該各基板の電極間
の電気的接続が基板の加熱圧着により行われる電子回路
基板の接続電極の製造方法において、(i)基板上に、
該基板との接着性を向上させるための材料、ろう材と濡
れ性の良い材料の順に、いずれも電導性材料からなる複
合膜を成膜し、(ii)該成膜した複合膜表面に接続電極
となる形状のレジストのみを残して他のレジストを除去
したレジストパターンを形成し、(iii)該形成したレ
ジストパターンを介して前記複合膜をエッチングした
後、前記レジストパターンを除去して接続電極を形成
し、(iv)該形成した接続電極および基板の表面に、基
板間の接着およびろう材の濡れ広がり防止用の絶縁材料
からなる接着層を形成した後、接続電極面上の接着層の
みを除去してパッド部の窓明けを行い、(v)前記接続
電極上に、前記接着層の表面にまたがるように、接続電
極の径より大きい径のメタルマスクを重ねてろう材を形
成する構成にしたものである。
Further, in the above-mentioned method for manufacturing a connecting electrode of an electronic circuit board according to the present invention, a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and the electric connection between the electrodes of each board is made. In the method for manufacturing a connection electrode of an electronic circuit board, which is performed by thermocompression bonding of the board, (i) on the board,
A composite film made of an electrically conductive material is formed in the order of a material for improving the adhesiveness to the substrate, a brazing material and a material having good wettability, and (ii) connecting to the surface of the formed composite film. A resist pattern is formed by removing the other resist leaving only the resist in the shape of the electrode, and (iii) the composite film is etched through the formed resist pattern, and then the resist pattern is removed to form a connection electrode. And (iv) after forming an adhesive layer made of an insulating material for adhesion between the substrates and preventing the wetting and spreading of the brazing material on the surfaces of the formed connection electrode and substrate, only the adhesive layer on the connection electrode surface Is removed to open the pad portion, and (v) a brazing material is formed on the connection electrode by overlapping a metal mask having a diameter larger than that of the connection electrode so as to extend over the surface of the adhesive layer. The one You.

【0011】そして、前記接着層を、前記接続電極にお
けるろう材の融点より高い流動開始温度を有する接着材
料にするとよい。
The adhesive layer may be an adhesive material having a flow starting temperature higher than the melting point of the brazing material in the connection electrode.

【0012】また、前記ろう材の融点の範囲を、200
℃以上400℃以下にすることが好ましく、さらに、前
記本発明の他の電子回路基板の接続電極とその製造方法
においては、ろう材の形成を、蒸着、無電解めっき、印
刷のいずれかの手段により行うとよい。
Further, the range of the melting point of the brazing material is 200
It is preferable that the temperature is not lower than 400 ° C. and not higher than 400 ° C. Further, in the connection electrode of the other electronic circuit board of the present invention and the manufacturing method thereof, the brazing material is formed by any one of vapor deposition, electroless plating and printing. Should be done by.

【0013】[0013]

【作用】上記構成としたことにより、接続電極のある部
分は、レーザ光照射等によりポリイミド前駆体ワニスが
除去され、接続電極の表面はポリイミドのない清浄面を
得ることができるため、後工程にて基板を重ねて加熱し
た場合に、ろう材が互いに拡散し易くなる。
With the above structure, the polyimide precursor varnish is removed by laser light irradiation or the like at the portion where the connection electrode is present, and a clean surface free of polyimide can be obtained on the surface of the connection electrode. When the substrates are stacked and heated, the brazing materials are likely to diffuse into each other.

【0014】このため、基板上に形成された接続電極お
よび接着層を、接続電極が上下一対になるように相対さ
せてろう材の融点以上の温度に加熱すると、ろう材と濡
れ性の悪い材料表面に供給されていたろう材が、弾かれ
るように接続電極中央部のろう材と濡れ性の良い電導性
材料部分に集まり、ろう材層の厚さを増加させ、上下の
接続電極間が、前記上下一対に相対させただけの初期の
段階には接触していなかった状態から、溶融したろう材
を介して互いに接触した状態になる。この接触状態で上
下基板を互いに圧着するとともに温度を下げると、上下
の基板は相対する接続電極がろう材を介して確実に接続
された状態で積層され、基板上のすべての接続電極の電
気的接続を得ることが可能になる。
For this reason, when the connection electrodes and the adhesive layer formed on the substrate are opposed to each other so that the connection electrodes are vertically paired and heated to a temperature higher than the melting point of the brazing material, a material having poor wettability with the brazing material. The brazing material supplied to the surface gathers in the brazing material in the central part of the connecting electrode and the conductive material part with good wettability so as to be repelled, increasing the thickness of the brazing material layer, and between the upper and lower connecting electrodes, The state where they are not in contact with each other in the initial stage of just making them face each other in a pair of upper and lower sides is changed to the state where they are in contact with each other through the molten brazing material. When the upper and lower substrates are pressure-bonded to each other and the temperature is lowered in this contact state, the upper and lower substrates are laminated with the connecting electrodes facing each other securely connected through the brazing material, and electrical connection of all the connecting electrodes on the substrate is performed. It will be possible to get a connection.

【0015】[0015]

【実施例】本発明の第1の実施例を図1ないし図4を参
照して説明する。図1は接続電極の形成プロセス説明
図、図2は図1に示す接続電極を多数個使用して多層の
電子回路基板を形成した例を示す図、図3は図1にて形
成される接続電極の加熱前と加熱後の形状変化説明用の
側面および平面を示す図、図4は図2に示す電子回路基
板にLSIと入出力端子を取り付けて回路モジュールと
した例を示す斜視図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of the present invention will be described with reference to FIGS. FIG. 1 is an explanatory view of a connection electrode forming process, FIG. 2 is a view showing an example of forming a multilayer electronic circuit board by using a large number of connection electrodes shown in FIG. 1, and FIG. 3 is a connection formed in FIG. FIG. 4 is a view showing a side surface and a plane for explaining the shape change of the electrode before and after heating, and FIG. 4 is a perspective view showing an example in which an LSI and an input / output terminal are attached to the electronic circuit board shown in FIG. 2 to form a circuit module. .

【0016】図1において、図1(a)はポリイミドシ
ート(以下、単に基板という)101上に、下層Cr1
02、Cu層103および上層Cr104のCr/Cu
/Cr複合膜を、0.05μm/5μm/0.05μmの
厚さでスパッタ成膜した状態を示す。図1(b)は図1
(a)に示す上層Cr104上にレジスト105を塗布
し、露光、現像により部分的に該レジストを除去した
後、レジスト105を用いて上層Cr104を部分的に
エッチング除去して開口を設けた状態を示す。
In FIG. 1, FIG. 1A shows a lower layer Cr1 on a polyimide sheet (hereinafter, simply referred to as a substrate) 101.
02, Cu layer 103 and Cr / Cu in the upper Cr 104
The / Cr composite film is sputter-deposited in a thickness of 0.05 μm / 5 μm / 0.05 μm. 1 (b) is shown in FIG.
A state in which a resist 105 is applied onto the upper layer Cr 104 shown in (a) and the resist is partially removed by exposure and development, and then the upper layer Cr 104 is partially removed by etching using the resist 105 Show.

【0017】つぎに、図1(b)に示すレジスト105
を除去した後、該除去した面に新たに図1(c)に示す
ようにレジスト106を塗布し、露光、現像により図1
(b)の工程にて上層Cr104をエッチング除去した
開口と相似で、かつ該開口の面積よりも大きな面積、す
なわち、接続電極の径に相当する面積のレジスト106
を除去する。そして、このレジスト106をめっきマス
クとしてろう材107を電気めっき法により供給し、例
えば20μmの均一な厚さにめっきする。
Next, the resist 105 shown in FIG.
After removing the resist, a resist 106 is newly applied to the removed surface as shown in FIG.
The resist 106 having an area similar to the opening from which the upper layer Cr 104 is removed by etching in the step (b) and larger than the area of the opening, that is, an area corresponding to the diameter of the connection electrode.
Is removed. Then, using the resist 106 as a plating mask, the brazing filler metal 107 is supplied by an electroplating method to plate to a uniform thickness of, for example, 20 μm.

【0018】ついで、図1(c)に示すレジスト106
を除去し、ろう材107をマスクとして上層Cr10
4、Cu層103および下層Cr102をエッチング除
去し、図1(d)に示す接続電極109を形成する。
Next, the resist 106 shown in FIG.
Is removed, and the upper layer Cr10 is formed using the brazing material 107 as a mask.
4, the Cu layer 103 and the lower layer Cr 102 are removed by etching to form the connection electrode 109 shown in FIG.

【0019】つぎに、図1(d)に示す基板101およ
び接続電極109の表面に、ポリイミド前駆体ワニスか
らなる基板間の接着層108を塗布して乾燥し、接続電
極109面上のポリイミド前駆体ワニス108のみを次
工程の加熱圧着前に予め除去して、接続電極109面上
にポリイミド前駆体ワニス108の残存しない清浄なパ
ッド部の窓明けを行い、図1(e)に示す状態を形成す
る。ここで、接続電極109上のポリイミド前駆体ワニ
ス108の除去は、例えばレーザ光照射により行われ
る。
Next, the adhesive layer 108 between the substrates made of a polyimide precursor varnish is applied to the surfaces of the substrate 101 and the connecting electrode 109 shown in FIG. Only the body varnish 108 is removed in advance before the thermocompression bonding in the next step, and a clean pad portion where the polyimide precursor varnish 108 does not remain is opened on the surface of the connection electrode 109, and the state shown in FIG. Form. Here, the removal of the polyimide precursor varnish 108 on the connection electrode 109 is performed by, for example, laser light irradiation.

【0020】そして、図1(e)に示す基板101上に
形成された接続電極109および接着層108を、接続
電極109が上下一対になるように相対させて後述する
所定の温度で加熱する。この加熱により上記プロセスに
より形成された接続電極109は、ろう材107が後述
する作用により中央部に集まって該ろう材107の厚さ
を増加させ、上下の接続電極109が、前記上下一対に
相対させただけの初期の段階には接触していなかった状
態から、図1(f)に示すように、溶融したろう材10
7を介して互いに接触した状態になる。この接触状態で
上下基板101を互いに圧着するとともに温度を下げる
と、上下の基板101は相対する接続電極109がろう
材107を介して確実に接続された状態で積層される。
Then, the connection electrodes 109 and the adhesive layer 108 formed on the substrate 101 shown in FIG. 1 (e) are opposed to each other so that the connection electrodes 109 form a pair, and are heated at a predetermined temperature described later. The connecting electrodes 109 formed by the above process by this heating gather in the central portion of the brazing filler metal 107 due to the action to be described later to increase the thickness of the brazing filler metal 107, and the upper and lower connecting electrodes 109 are opposed to the upper and lower pair. As shown in FIG. 1 (f), the molten brazing filler metal 10
7 are in contact with each other. When the upper and lower substrates 101 are pressure-bonded to each other and the temperature is lowered in this contact state, the upper and lower substrates 101 are laminated in a state where the opposing connection electrodes 109 are securely connected via the brazing material 107.

【0021】上記図1に示すプロセスは、接続電極10
9の一対のみを拡大して説明したものであるが、多層配
線基板には接続電極109が各層に多数個使用されるの
が普通であり、実際には図1(e)に示す状態の多数個
の接続電極を多層同時に加熱圧着して図1(f)に示す
状態に積層される。積層された電子回路基板の1例を図
2に示す。図2において、201は基板、208は接着
層、209は接続電極である。
In the process shown in FIG. 1, the connecting electrode 10 is used.
Although only one pair of 9 is enlarged and described, it is common that a multi-layer wiring board has a large number of connection electrodes 109 in each layer. In reality, a large number of connection electrodes 109 are provided in the state shown in FIG. The individual connection electrodes are multilayered by thermocompression bonding at the same time and laminated in the state shown in FIG. An example of laminated electronic circuit boards is shown in FIG. In FIG. 2, 201 is a substrate, 208 is an adhesive layer, and 209 is a connection electrode.

【0022】上記実施例において、基板101にポリイ
ミドシートを用いたが、基板材料としてはこのほかにガ
ラスエポキシ基板、セラミクス基板、シリコンウエハ等
を用いても良い。また、接続電極109の下地膜として
Cr/Cu/Crの積層膜を用いたが、基板101直上
の下層Cr102は基板101との接着強度を確保する
ために用いたものであり必ずしも必要ではなく、Ti等
のように基板101との接着強度を維持できるものであ
れば使用できる。
Although a polyimide sheet is used for the substrate 101 in the above-mentioned embodiment, a glass epoxy substrate, a ceramics substrate, a silicon wafer or the like may be used as the substrate material. Further, a Cr / Cu / Cr laminated film is used as a base film of the connection electrode 109, but the lower layer Cr 102 immediately above the substrate 101 is used to secure the adhesive strength with the substrate 101 and is not always necessary. Any material that can maintain the adhesive strength with the substrate 101 such as Ti can be used.

【0023】つぎに、上記実施例において接続電極10
9の下地膜の第二層目としてCu層103を用いたが、
これはろう材107と良く濡れ、かつ接続強度を確保す
るための材料であり、Cu以外にNi等を使用してもよ
い。ここで、ろう材107と濡れ性の良い材料とは、表
面に強固な酸化膜を作らず、かつ、ろう材107と合金
化できる材料を意味している。また、下地膜の第三層目
は、電気めっきでろう材107を供給できるめっき電極
となり、かつ、ろう材107の濡れ広がりを抑制するた
めろう材107と濡れを生じない材料であることが必要
である。このような材料として最適なものは現状ではC
rであるが、アルミニウム、ステンレス等の金属も使用
可能である。
Next, in the above embodiment, the connection electrode 10
Although the Cu layer 103 was used as the second layer of the base film of No. 9,
This is a material that is well wetted with the brazing material 107 and secures the connection strength, and Ni or the like may be used instead of Cu. Here, the brazing material 107 and the material having good wettability means a material that does not form a strong oxide film on the surface and can be alloyed with the brazing material 107. Further, the third layer of the base film needs to be a material that does not wet the brazing material 107 in order to serve as a plating electrode capable of supplying the brazing material 107 by electroplating and to prevent the wetting and spreading of the brazing material 107. Is. At present, the most suitable material as such a material is C
Although it is r, metals such as aluminum and stainless steel can also be used.

【0024】また、基板間の接着層108として熱可塑
性のポリイミド樹脂を用いたが、用途によってはエポキ
シ樹脂やアクリル樹脂等の接着剤も用いることができ
る。ただし、基板を加熱圧着する場合に、ろう材107
の融点より低い温度で接着層108の流動が始まると、
ろう付けが完成する前に接着剤が接続電極109間に進
入して接合不良が発生するので、接着剤の種類はろう材
107の融点との関係で選択する必要がある。即ち、接
着剤の流動開始温度(目安としてはガラス転移温度を用
いても良い)は、接続電極109におけるろう材107
の融点より高いことが必要である。1例として、基板1
01の耐熱性は、基板101の外部に搭載する電子部品
の接続にろう材107として62Sn−38Pbの共晶
合金を用いるとすると、200℃以上が必要である。ま
た、基板101を構成する有機材料の耐熱性は400℃
以下の場合がほとんどであるため、ろう材107として
は接続電極109と強固な接続が可能で融点の範囲が2
00℃以上、400℃以下であることが必要である。従
って、前記図1(e)に示す状態における加熱温度は、
200℃以上、400℃以下の範囲で選択される。
Although a thermoplastic polyimide resin is used as the adhesive layer 108 between the substrates, an adhesive such as an epoxy resin or an acrylic resin may be used depending on the application. However, when the substrate is thermocompression bonded, the brazing material 107
When the flow of the adhesive layer 108 starts at a temperature lower than the melting point of
Before the brazing is completed, the adhesive enters between the connection electrodes 109 to cause defective bonding, and therefore the type of the adhesive needs to be selected in relation to the melting point of the brazing material 107. That is, the flow starting temperature of the adhesive (the glass transition temperature may be used as a guide) is the brazing material 107 in the connection electrode 109.
Above the melting point of. As an example, the substrate 1
When the eutectic alloy of 62Sn-38Pb is used as the brazing material 107 for connecting the electronic components mounted outside the substrate 101, the heat resistance of 01 is required to be 200 ° C. or higher. The heat resistance of the organic material forming the substrate 101 is 400 ° C.
Since most of the cases below are possible, the brazing filler metal 107 can be firmly connected to the connection electrode 109 and has a melting point range of 2 or less.
It is necessary that the temperature is not lower than 00 ° C and not higher than 400 ° C. Therefore, the heating temperature in the state shown in FIG.
It is selected in the range of 200 ° C or higher and 400 ° C or lower.

【0025】上記条件を満たす材料として、96.5S
n−3.5Ag合金(融点:221℃)、100Sn
(融点:232℃)、20Sn−80Au(融点:28
0℃)、100Pb(融点:327℃)等の材料が使用
できる。
A material satisfying the above conditions is 96.5S.
n-3.5Ag alloy (melting point: 221 ° C), 100Sn
(Melting point: 232 ° C.), 20Sn-80Au (melting point: 28
Materials such as 0 ° C.) and 100 Pb (melting point: 327 ° C.) can be used.

【0026】また、前記接続電極109上の接着層10
8の除去方法としては、ポリイミド前駆体ワニスを塗布
後に接続電極109表面にレーザを照射して分解除去す
る方法が最も有用であるが、このほかに感光性の材料を
用いて現像する方法、ドライエッチングによる方法、印
刷により必要個所のみ接着剤を供給する方法も用いるこ
とができる。そして、接着剤の供給方法としてはワニス
の塗布が有用であるが、接着剤を予めシート状に成形し
ておき、これを挾んで接着する方法も用いることができ
る。
The adhesive layer 10 on the connection electrode 109 is also provided.
As the removing method of 8, the method of irradiating the surface of the connection electrode 109 with a laser to decompose and remove it after applying the polyimide precursor varnish is most useful. In addition to this, a method of developing using a photosensitive material, a dry method It is also possible to use a method by etching or a method in which an adhesive is supplied only at a necessary portion by printing. As a method of supplying the adhesive, application of varnish is useful, but a method of forming the adhesive into a sheet shape in advance and sandwiching and bonding the same can also be used.

【0027】つぎに、図3を参照して前記図1(f)に
示すろう材107の加熱前と加熱後の形状変化について
説明する。図中、図1と同符号のものは同じものを示
す。
Next, the change in shape of the brazing filler metal 107 shown in FIG. 1 (f) before and after heating will be described with reference to FIG. In the figure, the same symbols as those in FIG. 1 indicate the same components.

【0028】接続電極の構造として、ろう材107と濡
れ性のある層、すなわちCu層103の電極径をdと
し、ろう材107と濡れ性のない層、すなわち上層Cr
104の径をそのn倍のndとすると、面積の比はn2
倍となる。いま、濡れ性のない上層Cr104の上面全
体を、図3(a)に示すように厚さtのろう材107の
層で覆い、該ろう材107の温度をその融点まで上昇さ
せると、ろう材107が溶けて濡れ性のない上層Cr1
04上におけるろう材107は、表面張力によって弾か
れたように濡れ性のあるCu層103の電極径d部に引
き寄せられ、該電極中央部に集められる。その結果、ろ
う材107の厚さは、もともと電極径d部にあったもの
と前記電極中央部に集められたものとにより増加し、そ
の形状が図3(b)に示すように前記表面張力によりほ
ぼ球形状となる。この球形状の高さHは、平均的にはH
=n2tとなる。
In the structure of the connecting electrode, the layer having wettability with the brazing material 107, that is, the electrode diameter of the Cu layer 103 is d, and the layer having no wettability with the brazing material 107, that is, the upper layer Cr.
Assuming that the diameter of 104 is n times that of n, the area ratio is n 2
Double. Now, as shown in FIG. 3A, the entire upper surface of the upper layer Cr 104 having no wettability is covered with a layer of a brazing filler metal 107 having a thickness t, and the temperature of the brazing filler metal 107 is raised to its melting point. Upper layer Cr1 which melts 107 and has no wettability
The brazing material 107 on 04 is attracted to the electrode diameter d portion of the Cu layer 103 that is wettable as if it was repelled by the surface tension, and is collected in the central portion of the electrode. As a result, the thickness of the brazing filler metal 107 increases depending on what was originally in the electrode diameter d portion and what was gathered in the electrode central portion, and its shape has the surface tension as shown in FIG. 3 (b). To make it almost spherical. The height H of this spherical shape is H on average.
= N 2 t.

【0029】1例として、d=100μm、n=2、t
=20μmの場合には、加熱前の電極高さに比べて加熱
後は電極の高さが約60μm隆起することになり、ほぼ
球形状に形成された電極の高さHは約80μmになる。
従って、本寸法例の電極を2個相対して接続する場合に
は、加熱後に電極の高さが上下約60μm隆起すること
を考慮して電極間の隙間が最大120μmあっても接続
が可能になる。
As an example, d = 100 μm, n = 2, t
In the case of = 20 μm, the height of the electrode after heating is about 60 μm higher than that before heating, and the height H of the electrode formed in a substantially spherical shape is about 80 μm.
Therefore, when two electrodes of this dimension example are connected to each other, it is possible to connect even if the gap between the electrodes is 120 μm at maximum, considering that the height of the electrodes rises up and down by about 60 μm after heating. Become.

【0030】このように接続電極間に120μm程度の
隙間が生じていても、ろう材107の融点以上の加熱圧
着により、表面から接着層108を除去された接続電極
109上のろう材107は、該ろう材107の表面張力
により厚さ寸法を自動的に増し、単に基板を積層した初
期の段階には十分な接触をしていなかった接続電極対
を、溶融したろう材107で接触させ、該両者間の電気
的接続を確実にする。このため、従来の接続電極構造に
おいて、基板を何層も重ねて多数の電極を接続する場合
に、パターンの凹凸、段差等により必ずしも全電極を密
着できず、接続不良の発生原因となっていた問題点を解
消することが可能になった。
Even if a gap of about 120 μm is formed between the connecting electrodes, the brazing material 107 on the connecting electrode 109 from which the adhesive layer 108 has been removed from the surface by thermocompression bonding above the melting point of the brazing material 107, The thickness dimension is automatically increased by the surface tension of the brazing filler metal 107, and the connecting electrode pair, which was not in sufficient contact at the initial stage of simply laminating the substrates, is contacted with the molten brazing filler metal 107, Ensure electrical connection between the two. Therefore, in the conventional connection electrode structure, when a large number of layers of substrates are connected to connect a large number of electrodes, it is not always possible to adhere all the electrodes due to the unevenness of the pattern, steps, etc., causing a connection failure. It became possible to solve the problem.

【0031】なお、電極径dの比nと、ろう材107の
厚さtとを適宜選択することにより、接続できる接続電
極間の隙間寸法は任意に変化させることが可能である。
By appropriately selecting the ratio n of the electrode diameter d and the thickness t of the brazing filler metal 107, it is possible to arbitrarily change the size of the gap between the connectable connecting electrodes.

【0032】図4に上記第1の実施例に係る接続電極構
造を適用した回路モジュールの1例を示す。図におい
て、10はLSI、11は前記図2に示す回路基板で、
回路基板11上に複数のLSI10をはんだ接合13を
介して搭載している。12は回路基板11の裏面に設け
られた入出力ピンで、該入出力ピン12を介して外部回
路と接続される構成である。
FIG. 4 shows an example of a circuit module to which the connection electrode structure according to the first embodiment is applied. In the figure, 10 is an LSI, 11 is the circuit board shown in FIG.
A plurality of LSIs 10 are mounted on a circuit board 11 via solder joints 13. Reference numeral 12 is an input / output pin provided on the back surface of the circuit board 11, and is configured to be connected to an external circuit via the input / output pin 12.

【0033】つぎに、図5を参照して本発明の第2の実
施例を説明する。図5は、ろう材の供給に蒸着法を用い
た場合の接続電極の形成プロセス説明図である。
Next, a second embodiment of the present invention will be described with reference to FIG. FIG. 5 is an explanatory diagram of a process of forming a connection electrode when a vapor deposition method is used to supply the brazing material.

【0034】前記第1の実施例においては、ろう材の供
給に電気めっき法を用いているために、ろう材の濡れ拡
がりを抑制するための材料として電導性材料が必要とさ
れた。しかし、ろう材の供給には、前記電気めっき法の
ほかに無電解めっき法、蒸着法、印刷法等を用いる方法
があり、これらの方法を使用した場合には、ろう材の濡
れ拡がりを抑制するための材料として絶縁材料の使用も
可能となる。本第2の実施例においてはろう材の供給に
蒸着法を用いた例を示す。
In the first embodiment, since the electroplating method is used to supply the brazing material, the conductive material is required as the material for suppressing the wetting and spreading of the brazing material. However, in addition to the electroplating method, there are methods for supplying the brazing material, such as electroless plating method, vapor deposition method, and printing method. When these methods are used, the wetting and spreading of the brazing material is suppressed. It is also possible to use an insulating material as a material for this. In the second embodiment, an example in which a vapor deposition method is used for supplying the brazing material will be shown.

【0035】図5において、図5(a)はポリイミドか
らなる基板301上に、Cr層302およびNi層30
3のCr/Ni複合膜をスパッタ成膜した状態を示す。
図5(b)は図5(a)に示すNi層303上にレジス
トを塗布し、露光、現像により接続電極となる形状のレ
ジスト305を残して他のレジストを除去した状態を示
す。
In FIG. 5, FIG. 5A shows a Cr layer 302 and a Ni layer 30 on a substrate 301 made of polyimide.
3 shows a state in which the Cr / Ni composite film of No. 3 is formed by sputtering.
FIG. 5B shows a state in which a resist is applied on the Ni layer 303 shown in FIG. 5A, the resist 305 having a shape to be a connection electrode is left by exposure and development, and the other resist is removed.

【0036】つぎに、図5(b)に示すレジスト305
を用いてNi層303とCr層302をエッチングし、
該エッチング後、レジスト305を除去して図5(c)
に示す接続電極309を、例えば円形状に形成する。
Next, the resist 305 shown in FIG.
Is used to etch the Ni layer 303 and the Cr layer 302,
After the etching, the resist 305 is removed to remove the resist, as shown in FIG.
The connection electrode 309 shown in is formed in, for example, a circular shape.

【0037】ついで、図5(c)に示す基板301およ
び接続電極309の表面に、ポリイミド前駆体ワニスか
らなる基板間の接着層およびろう材の濡れ広がり防止層
となる接着層308を塗布して乾燥し、接続電極309
上のポリイミド前駆体ワニスのみを除去してパッド部の
窓明けを行い、図5(d)に示す状態を形成する。ここ
で、接続電極309上のポリイミド前駆体ワニスの除去
は、例えばレーザ光照射により行われる。
Then, an adhesive layer between the substrates made of a polyimide precursor varnish and an adhesive layer 308 serving as a wetting and spreading preventing layer for the brazing material are applied to the surfaces of the substrate 301 and the connection electrode 309 shown in FIG. 5C. Dry and connect electrode 309
Only the upper polyimide precursor varnish is removed and the window of the pad portion is opened to form the state shown in FIG. Here, the removal of the polyimide precursor varnish on the connection electrode 309 is performed by laser light irradiation, for example.

【0038】つぎに、図5(d)に示す接続電極309
の表面に、該接続電極309よりも大きい径のメタルマ
スクを重ねてろう材307を蒸着し、図5(e)に示す
状態を形成する。
Next, the connection electrode 309 shown in FIG.
A metal mask having a diameter larger than that of the connection electrode 309 is superposed on the surface of, and a brazing material 307 is vapor-deposited to form the state shown in FIG.

【0039】ついで、図5(e)に示す状態に形成され
た基板301、接続電極309および接着層308を、
接続電極309が上下一対になるように相対させて所定
の温度で加熱する。ここで、前記の如くろう材307の
径を接続電極309の径より大きくしているため、前記
加熱により接続電極309の径よりはみ出している部分
のろう材307は、溶融して表面張力によって濡れ性の
あるNi層303上に引き寄せられ、もともとNi層3
03上にあったものと表面張力によって引き寄せられた
ものとにより、接続電極309上のろう材307の厚さ
を増加させる。このため、前記上下一対に相対させた当
初には接触していなかった接続電極309上のろう材3
07が、図5(f)に示すように、接続電極309上部
で上下一体化し、金属接合の状態になる。そして、同時
に接着層308も溶融される。この状態で上下基板30
1を互いに圧着するとともに温度を下げると、上下の基
板301は、相対する接続電極309がろう材307を
介して確実に接続された状態で、接着層308を介して
積層される。
Then, the substrate 301, the connection electrode 309 and the adhesive layer 308 formed in the state shown in FIG.
The connection electrodes 309 are opposed to each other so as to form a pair and are heated at a predetermined temperature. Here, since the diameter of the brazing filler metal 307 is made larger than the diameter of the connecting electrode 309 as described above, the portion of the brazing filler metal 307 protruding from the diameter of the connecting electrode 309 due to the heating is melted and wet by the surface tension. Which is attracted onto the Ni layer 303 having the property of
03 and those attracted by the surface tension increase the thickness of the brazing material 307 on the connection electrode 309. Therefore, the brazing material 3 on the connection electrode 309 that was not in contact with the pair of upper and lower parts at the beginning is not in contact with each other.
As shown in FIG. 5 (f), 07 is vertically integrated at the upper part of the connection electrode 309, and is in a metal-bonded state. At the same time, the adhesive layer 308 is also melted. The upper and lower substrates 30 in this state
When 1s are pressure-bonded to each other and the temperature is lowered, the upper and lower substrates 301 are laminated via the adhesive layer 308 in a state where the opposing connection electrodes 309 are surely connected via the brazing material 307.

【0040】上記図5に示すプロセスは、前記図1に示
すプロセスと同様に接続電極309の一対のみを拡大し
て説明したものであり、実際には多数個の接続電極を多
層同時に加熱圧着して多層配線基板を形成する。
The process shown in FIG. 5 is described by enlarging only one pair of the connection electrodes 309 similarly to the process shown in FIG. 1, and in practice, a large number of connection electrodes are simultaneously heat-pressed in multiple layers. To form a multilayer wiring board.

【0041】上記第2の実施例において、基板301に
ポリイミドシートのほかにガラスエポキシ基板、セラミ
クス基板、シリコンウエハ等を用いても良いこと、ま
た、接続電極309の下地膜としてCr/Niの複合膜
を用いたが、基板301直上のCr層302は基板30
1との接着強度を確保するために用いたもので必ずしも
必要ではなく、そして、Ti等のように基板301との
接着強度を維持できるものであれば使用可能であるこ
と、さらに、基板間の接着層308として熱可塑性のポ
リイミド樹脂のほかに、用途によってはエポキシ樹脂や
アクリル樹脂等の接着剤も用いることができること等
は、前記第1の実施例と同様である。
In the second embodiment, a glass epoxy substrate, a ceramics substrate, a silicon wafer or the like may be used for the substrate 301 in addition to the polyimide sheet, and a Cr / Ni composite film is used as a base film of the connection electrode 309. Although a film is used, the Cr layer 302 directly on the substrate 301 is the substrate 30.
It is used to secure the adhesive strength with the substrate 1 and is not always necessary, and it can be used as long as it can maintain the adhesive strength with the substrate 301 such as Ti. As with the first embodiment, as the adhesive layer 308, an adhesive such as an epoxy resin or an acrylic resin can be used in addition to the thermoplastic polyimide resin depending on the application.

【0042】そして、接着剤の種類も、前記第1の実施
例と同様に、ろう材307の融点との関係で選択する必
要があり、接着剤の流動開始温度(目安としてはガラス
転移温度を用いても良い)は、接続電極309における
ろう材307の融点より高いことが必要であることか
ら、図5(e)に示す状態の加熱温度についても、前記
第1の実施例と同じく200℃以上、400℃以下の範
囲で選択される。
As with the first embodiment, it is necessary to select the type of adhesive in relation to the melting point of the brazing filler metal 307, and the flow starting temperature of the adhesive (as a guide, the glass transition temperature is set). (Which may be used) is required to be higher than the melting point of the brazing filler metal 307 in the connection electrode 309. Therefore, the heating temperature in the state shown in FIG. 5E is 200 ° C. as in the first embodiment. As mentioned above, it is selected in the range of 400 ° C. or lower.

【0043】また、前記図5(e)に示すろう材307
の径は、電子回路基板におけるパターンの凹凸、段差等
に応じて接続電極309の径より大きくすればよく、該
両者の径の比を選択することにより接続電極間の間隔を
任意に変化させて接触させることができ、たとえ電子回
路基板において接続電極間に非接触部分があっても、該
非接触部分の電気的接続も確実に得られることになり、
従来の接続不良発生の原因となっていた問題点を解消す
ることが可能になった。
The brazing material 307 shown in FIG.
The diameter may be larger than the diameter of the connection electrode 309 according to the unevenness of the pattern, the step, etc. on the electronic circuit board, and the interval between the connection electrodes can be arbitrarily changed by selecting the ratio of the two diameters. It is possible to make contact, and even if there is a non-contact portion between the connection electrodes in the electronic circuit board, electrical connection of the non-contact portion can be surely obtained.
It has become possible to solve the problems that were the cause of the conventional connection failure.

【0044】[0044]

【発明の効果】以上説明したように本発明は、初期的に
電気回路基板の接続電極の金属面間に段差等による非接
触部分があっても、ろう材に温度を加えることにより信
頼性の高い電気的接続が得られるとともに、各基板間の
接着剤が該各基板を加熱圧着する以前に予め接続電極表
面より確実に除去されることにより、従来の接続電極間
に残存した接着剤による接続不良を解消し、しかも接着
層の厚さ寸法が従来より格段に厚いものまで使用可能に
なる効果を奏する。
As described above, according to the present invention, even if there is a non-contact portion due to a step or the like between the metal surfaces of the connection electrodes of the electric circuit board at the beginning, reliability is improved by applying a temperature to the brazing material. A high electrical connection is obtained, and the adhesive between the substrates is surely removed from the surface of the connection electrodes before the thermocompression bonding of the substrates. This has the effect of eliminating defects and enabling the use of adhesive layers having a significantly thicker thickness than before.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例の接続電極の形成プロセ
ス説明図である。
FIG. 1 is an explanatory diagram of a process of forming a connection electrode according to a first embodiment of the present invention.

【図2】図1に示す接続電極を多数個使用して多層の電
子回路基板を形成した例を示す図である。
FIG. 2 is a diagram showing an example in which a multilayer electronic circuit board is formed by using a large number of connection electrodes shown in FIG.

【図3】図1にて形成される接続電極の加熱前と加熱後
の形状変化説明用の側面および平面を示す図である。
3A and 3B are diagrams showing a side surface and a plane for explaining a change in shape of a connection electrode formed in FIG. 1 before and after heating.

【図4】図2に示す電子回路基板にLSIと入出力端子
を取り付けて回路モジュールとした例を示す斜視図であ
る。
4 is a perspective view showing an example in which an LSI and input / output terminals are attached to the electronic circuit board shown in FIG. 2 to form a circuit module.

【図5】本発明の第2の実施例の接続電極の形成プロセ
ス説明図である。
FIG. 5 is an explanatory diagram of a process of forming a connection electrode according to the second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

101、201、301…基板、102…下層Cr、1
03…Cu層、104…上層Cr、105、106、3
05…レジスト、107…ろう材、108、208、3
08…接着層、109、209…接続電極、302…C
r層、303…Ni層、307…ろう材、309…接続
電極、10…LSI、11…回路基板、12…入出力ピ
ン、13…はんだ接合。
101, 201, 301 ... Substrate, 102 ... Lower layer Cr, 1
03 ... Cu layer, 104 ... Upper layer Cr, 105, 106, 3
05 ... Resist, 107 ... Brazing material, 108, 208, 3
08 ... Adhesive layer, 109, 209 ... Connection electrode, 302 ... C
r layer, 303 ... Ni layer, 307 ... brazing material, 309 ... connection electrode, 10 ... LSI, 11 ... circuit board, 12 ... input / output pin, 13 ... solder joint.

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 電気回路パターンを有する複数枚の基板
が接着層を介して積層され、該各基板の電極間の電気的
接続が基板の加熱圧着により行われる電子回路基板の接
続電極において、基板面に、所定の接続電極径に形成さ
れたろう材と濡れ性の良い電導性材料と、該濡れ性の良
い電導性材料表面を覆う中心部に開口を設けたろう材と
濡れ性の悪い電導性材料とからなる複合膜と、該複合膜
上に所定の厚さにめっきされたろう材とにより形成され
た接続電極が、基板間を接着積層する前記接着層のう
ち、接続電極面上の接着層のみ除去されてパッド部の窓
明けが形成されてなることを特徴とする電子回路基板の
接続電極。
1. A connection electrode of an electronic circuit board, wherein a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and the electric connection between the electrodes of each board is performed by thermocompression bonding of the boards. A conductive material having good wettability with a brazing material having a predetermined connection electrode diameter, a brazing material having an opening in the center covering the surface of the conductive material having good wettability, and a conductive material having poor wettability A connecting electrode formed of a composite film consisting of and a brazing material plated to a predetermined thickness on the composite film, of the adhesive layers for bonding and laminating between substrates, only the adhesive layer on the connecting electrode surface. A connection electrode of an electronic circuit board, wherein the connection electrode of the electronic circuit board is formed by removing a window opening of a pad portion.
【請求項2】 電気回路パターンを有する複数枚の基板
が接着層を介して積層され、該各基板の電極間の電気的
接続が基板の加熱圧着により行われる電子回路基板の接
続電極の製造方法において、(i)基板上に、ろう材と
濡れ性の良い材料、悪い材料の順に、いずれも電導性材
料からなる複合膜を成膜し、(ii)該成膜した複合膜表
面にレジストパターンを形成し、前記ろう材と濡れ性の
悪い材料を部分的にエッチング除去して接続電極が形成
される位置の中心部に開口を設け、(iii)前記レジス
トを除去後、該除去した面の前記開口上に、前記ろう材
と濡れ性の悪い材料の表面にまたがるように、前記開口
径より大きくかつ開口と相似で、形成される接続電極の
径相当の開口を有するレジストパターンを新たに形成
し、該レジストパターンをめっきマスクとしてろう材を
電気めっきにより所定の膜厚にめっきし、(iv)前記新
たに形成したレジストパターンを除去し、前記めっきし
たろう材をマスクとして前記複合膜をエッチング除去し
て接続電極を形成し、(v)該形成した接続電極および
基板表面に接着層を塗布して乾燥した後、接続電極面上
の接着層のみを、次工程の加熱圧着前に予め除去してパ
ッド部の窓明けを行うことを特徴とする電子回路基板の
接続電極の製造方法。
2. A method of manufacturing a connection electrode of an electronic circuit board, wherein a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and the electric connection between the electrodes of each board is performed by thermocompression bonding of the boards. In (i), a composite film made of a conductive material is formed on a substrate in the order of a material having good wettability with a brazing material and a material having poor wettability, and (ii) a resist pattern on the surface of the formed composite film. To form an opening in the central portion of the position where the connection electrode is formed by partially etching away the material having poor wettability with the brazing material, and (iii) removing the resist and then removing the surface of the removed surface. A resist pattern is newly formed on the opening, which has an opening larger than the opening diameter and similar to the opening and having a diameter corresponding to the diameter of the connection electrode so as to extend over the surface of the material having poor wettability with the brazing material. And the resist pattern The brazing material is plated by electroplating to a predetermined thickness as a plating mask, (iv) the newly formed resist pattern is removed, and the composite film is etched away using the plated brazing material as a mask to form a connection electrode. After forming and (v) applying an adhesive layer to the surface of the connecting electrode and the substrate thus formed and drying, only the adhesive layer on the surface of the connecting electrode is removed in advance before the thermocompression bonding in the next step, and the window of the pad portion is formed. A method of manufacturing a connection electrode of an electronic circuit board, characterized by performing the dawn.
【請求項3】 電気回路パターンを有する複数枚の基板
が接着層を介して積層され、該各基板の電極間の電気的
接続が基板の加熱圧着により行われる電子回路基板の接
続電極において、基板面に、ろう材と濡れ性の良い電導
性材料にて円形状に形成された接続電極と、該接続電極
上面を除いて形成された基板間の接着およびろう材の濡
れ広がり防止用の絶縁材料からなる接着層と、前記接続
電極上に前記接着層の表面にまたがるように、前記接続
電極の径より大きい径に形成されたろう材とにより形成
されてなることを特徴とする電子回路基板の接続電極。
3. A connection electrode of an electronic circuit board, wherein a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and the electric connection between the electrodes of each board is performed by thermocompression bonding of the boards. A circular connecting electrode made of an electrically conductive material having good wettability with the brazing material, and an insulating material for preventing adhesion and adhesion between the substrates formed excluding the upper surface of the connecting electrode and preventing the wetting and spreading of the brazing material. A connection of an electronic circuit board, which is formed by an adhesive layer formed of and a brazing material formed on the connection electrode so as to extend over the surface of the adhesion layer and has a diameter larger than the diameter of the connection electrode. electrode.
【請求項4】 電気回路パターンを有する複数枚の基板
が接着層を介して積層され、該各基板の電極間の電気的
接続が基板の加熱圧着により行われる電子回路基板の接
続電極の製造方法において、(i)基板上に、該基板と
の接着性を向上させるための材料、ろう材と濡れ性の良
い材料の順に、いずれも電導性材料からなる複合膜を成
膜し、(ii)該成膜した複合膜表面に接続電極となる形
状のレジストのみを残して他のレジストを除去したレジ
ストパターンを形成し、(iii)該形成したレジストパ
ターンを介して前記複合膜をエッチングした後、前記レ
ジストパターンを除去して接続電極を形成し、(iv)該
形成した接続電極および基板の表面に、基板間の接着お
よびろう材の濡れ広がり防止用の絶縁材料からなる接着
層を形成した後、接続電極面上の接着層のみを除去して
パッド部の窓明けを行い、(v)前記接続電極上に、前
記接着層の表面にまたがるように、接続電極の径より大
きい径のメタルマスクを重ねてろう材を形成したことを
特徴とする電子回路基板の接続電極の製造方法。
4. A method for manufacturing a connection electrode of an electronic circuit board, wherein a plurality of boards having an electric circuit pattern are laminated via an adhesive layer, and electrical connection between the electrodes of each board is performed by thermocompression bonding of the boards. In (i), a composite film made of a conductive material is formed on the substrate in the order of a material for improving the adhesiveness with the substrate and a material having good wettability with the brazing material, and (ii) On the surface of the formed composite film, a resist pattern is formed by removing the other resist while leaving only the resist in the shape of the connection electrode, and (iii) after etching the composite film through the formed resist pattern, After removing the resist pattern to form connection electrodes, (iv) after forming an adhesion layer made of an insulating material for adhesion between the substrates and prevention of wetting and spreading of the brazing material on the surfaces of the formed connection electrodes and the substrate , Connection Only the adhesive layer on the pole surface is removed to open the pad window, and (v) a metal mask having a diameter larger than the diameter of the connection electrode is laid over the connection electrode so as to extend over the surface of the adhesion layer. A method of manufacturing a connecting electrode of an electronic circuit board, characterized in that a brazing material is formed.
【請求項5】 前記接着層が、前記接続電極におけるろ
う材の融点より高い流動開始温度を有する接着材料から
なる請求項1、2、3または4記載の電子回路基板の接
続電極とその製造方法。
5. The connection electrode for an electronic circuit board according to claim 1, 2, 3 or 4, and a method for manufacturing the connection electrode, wherein the adhesion layer is made of an adhesion material having a flow starting temperature higher than a melting point of a brazing material in the connection electrode. .
【請求項6】 前記ろう材の融点の範囲が、200℃以
上400℃以下である請求項1、2、3または4記載の
電子回路基板の接続電極とその製造方法。
6. The connection electrode for an electronic circuit board according to claim 1, 2, 3 or 4, and a method for manufacturing the same, wherein a melting point range of the brazing material is 200 ° C. or higher and 400 ° C. or lower.
【請求項7】 前記ろう材の形成が、蒸着、無電解めっ
き、印刷のいずれかの手段により行われる請求項3また
は4記載の電子回路基板の接続電極とその製造方法。
7. A connection electrode for an electronic circuit board according to claim 3, wherein the brazing material is formed by any one of vapor deposition, electroless plating, and printing, and a method of manufacturing the same.
JP31990194A 1994-12-22 1994-12-22 Connection electrode for electronic circuit board and manufacturing method thereof Pending JPH08181449A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31990194A JPH08181449A (en) 1994-12-22 1994-12-22 Connection electrode for electronic circuit board and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31990194A JPH08181449A (en) 1994-12-22 1994-12-22 Connection electrode for electronic circuit board and manufacturing method thereof

Publications (1)

Publication Number Publication Date
JPH08181449A true JPH08181449A (en) 1996-07-12

Family

ID=18115503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31990194A Pending JPH08181449A (en) 1994-12-22 1994-12-22 Connection electrode for electronic circuit board and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JPH08181449A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005216668A (en) * 2004-01-29 2005-08-11 Sii Micro Parts Ltd Electrochemical cell
JP2011258566A (en) * 2011-08-03 2011-12-22 Seiko Instruments Inc Electrochemical cell
CN109526142A (en) * 2018-11-30 2019-03-26 中国科学院深圳先进技术研究院 A kind of connection method of chip and circuit board

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005216668A (en) * 2004-01-29 2005-08-11 Sii Micro Parts Ltd Electrochemical cell
JP2011258566A (en) * 2011-08-03 2011-12-22 Seiko Instruments Inc Electrochemical cell
CN109526142A (en) * 2018-11-30 2019-03-26 中国科学院深圳先进技术研究院 A kind of connection method of chip and circuit board
CN109526142B (en) * 2018-11-30 2021-07-13 中国科学院深圳先进技术研究院 A kind of connection method of chip and circuit board

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