JPH0625685B2 - Flow sensor - Google Patents
Flow sensorInfo
- Publication number
- JPH0625685B2 JPH0625685B2 JP1275017A JP27501789A JPH0625685B2 JP H0625685 B2 JPH0625685 B2 JP H0625685B2 JP 1275017 A JP1275017 A JP 1275017A JP 27501789 A JP27501789 A JP 27501789A JP H0625685 B2 JPH0625685 B2 JP H0625685B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- flow sensor
- measuring resistance
- temperature measuring
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Measuring Volume Flow (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、極めて微少な気体の流速を検出するフローセ
ンサに関するものである。TECHNICAL FIELD The present invention relates to a flow sensor for detecting an extremely minute flow velocity of gas.
第4図は従来のマイクロブリツジフローセンサを示す斜
視図である。同図において、半導体基台1の中央部には
異方性エツチングにより左右の開口2,3を連通する貫
通孔4が形成されており、この貫通孔4の上部には半導
体基台1からブリツジ状に空間的に隔離され、結果的に
半導体基台1から熱的に絶縁された橋絡部5が形成され
ている。この橋絡部5の表面には、薄膜のヒータエレメ
ント7とそれを挾む薄膜の測温抵抗エレメント8,9と
が配列して形成されている。また、半導体基台1上の角
部には薄膜の周囲測温抵抗エレメント10が形成されて
いる。FIG. 4 is a perspective view showing a conventional micro-bridge flow sensor. In the figure, a through hole 4 that connects the left and right openings 2 and 3 is formed in the center of the semiconductor base 1 by anisotropic etching. Above the through hole 4, the through hole 4 from the semiconductor base 1 is bridged. Bridge portions 5 that are spatially separated from each other and are thermally insulated from the semiconductor base 1 are formed. A thin film heater element 7 and thin film temperature measuring resistance elements 8 and 9 sandwiching the thin film heater element 7 are arranged on the surface of the bridging portion 5. Further, a thin film ambient temperature measuring resistance element 10 is formed at a corner of the semiconductor base 1.
また、第5図(a),(b)は第4図に示すマイクロブリツジ
フローセンサの動作を示す説明図である。ここで、同図
(a)は各エレメントの温度分布を示し、同図(b)は第4図
のIVB−IVB′線断面を示している。なお、6は熱伝導
率の低い材料からなる保護膜である。5 (a) and 5 (b) are explanatory views showing the operation of the micro-bridge flow sensor shown in FIG. Where the figure
(a) shows the temperature distribution of each element, and (b) shows the section taken along the line IVB-IVB 'in FIG. Incidentally, 6 is a protective film made of a material having a low thermal conductivity.
さて、ヒータエレメント7を周囲温度よりもある一定の
高い温度th4,th5(例えば、63℃:周囲温度基準)で
制御すると、測温抵抗エレメント8,9の温度t6,t
7(例えば、35℃:周囲温度基準)は第5図(a)に示す
ようにヒータエレメント7の温度th4,th5を中心として
略対称となる。このとき、例えば第4図に示す矢印11
の方向からの気体が移動すると、上流側の測温抵抗エレ
メント8は冷却されΔT6だけ降温する。一方、下流側の
測温抵抗エレメント9は気体の流れを媒体としてヒータ
エレメント7からの熱伝導が促進され、温度がΔT7だけ
昇温するために温度差が生じる。そこで、ヒータエレメ
ント8,9をホイートストンブリツジ回路に組み込むこ
とにより、温度差を電圧に変換でき、流速に応じた電圧
出力が得られ、第6図に示すように気体の流速を検出す
ることができる。Now, if the heater element 7 is controlled at a certain temperature t h4 , t h5 higher than the ambient temperature (for example, 63 ° C .: ambient temperature reference), the temperature t 6 , t of the temperature measuring resistance elements 8, 9 is t 6 .
7 (for example, 35 ° C .: ambient temperature reference) is substantially symmetrical with respect to the temperatures t h4 and t h5 of the heater element 7 as shown in FIG. 5 (a). At this time, for example, the arrow 11 shown in FIG.
When the gas from the direction of moves, the temperature measuring resistance element 8 on the upstream side is cooled and the temperature is lowered by ΔT 6 . On the other hand, in the temperature-measuring resistance element 9 on the downstream side, heat conduction from the heater element 7 is promoted by using the flow of gas as a medium, and the temperature rises by ΔT 7, resulting in a temperature difference. Therefore, by incorporating the heater elements 8 and 9 into the Wheatstone bridge circuit, the temperature difference can be converted into a voltage, a voltage output corresponding to the flow velocity can be obtained, and the gas flow velocity can be detected as shown in FIG. it can.
このように従来のマイクロブリツジフローセンサは、薄
膜技術および異方性エツチング技術により形成された極
めて熱容量の小さい薄膜橋絡構造を有するもので、応答
速度が極めて速く、高感度,低消費電力であり、しかも
量産性が良いなどの優れた特徴を有している。As described above, the conventional micro-bridge flow sensor has a thin film bridging structure having an extremely small heat capacity formed by the thin film technology and the anisotropic etching technology, and has an extremely fast response speed, high sensitivity and low power consumption It also has excellent features such as good mass productivity.
しかしながら、従来のマイクロブリツジフローセンサ
は、第7図に示すようにスリツト状の中央開口12を有
して2つの橋絡部5a,5bを形成し、この中央開口1
2を挾んでヒータエレメント7を形成するとともにその
外側部に測温抵抗エレメント8,9を形成する構造を有
し、矢印11から移動する気体の流れによつて生じるヒ
ータエレメント7の加熱による温度分布の乱れを測温抵
抗エレメント8,9の抵抗値の変化により検出している
が、この測温抵抗エレメント8,9が温度変化の高い部
位のみに配設しているので、抵抗値変化が流速に比例す
ることから、流速が減少すると、例えば平均流速10cm/s
ec程度の低流速域での流速を計測することが困難となる
という問題があつた。However, the conventional micro-bridge flow sensor has a slit-shaped central opening 12 as shown in FIG. 7 to form two bridging portions 5a and 5b.
2 has a structure in which the heater element 7 is sandwiched between the two and the temperature measuring resistance elements 8 and 9 are formed on the outer side thereof, and the temperature distribution due to the heating of the heater element 7 generated by the flow of the gas moving from the arrow 11 Is detected by the change in the resistance value of the temperature measuring resistance elements 8 and 9, but since the temperature measuring resistance elements 8 and 9 are arranged only in the portion where the temperature change is high, the change in the resistance value is caused by the flow velocity. Therefore, when the flow velocity decreases, for example, the average flow velocity is 10 cm / s.
There was a problem that it became difficult to measure the flow velocity in the low flow velocity region of about ec.
このような課題を解決するために本発明は、基台の表面
に少なくとも2組の橋絡部を設け、かつ各橋絡部の表面
に気体が流れる上流から下流に向つて第1の側温抵抗
体,発熱体,第2の測温抵抗体を順次配列して設けると
ともに各第1の側温抵抗体,各発熱体,各第2の測温抵
抗体同志が直列接続される構成を有している。In order to solve such a problem, the present invention provides at least two sets of bridging portions on the surface of a base, and the first lateral temperature is directed from the upstream side to the downstream side where gas flows on the surface of each bridging portion. The resistor, the heating element, and the second resistance temperature element are arranged in sequence, and each first side resistance temperature element, each heating element, and each second resistance temperature element are connected in series. is doing.
本発明においては、各測温抵抗体が直列接続されること
により、気体の流量に対する抵抗値変化が増大するの
で、流量に比例する温度変化分が積算されて出力される
ことになる。In the present invention, the resistance change with respect to the flow rate of the gas is increased by connecting the resistance temperature detectors in series, so that the temperature change proportional to the flow rate is integrated and output.
以下、図面を用いて本発明の実施例を詳細に説明する。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
第1図は本発明によるフローセンサーの一実施例を示す
平面図であり、前述の図と同一部分には同一符号を付し
てある。同図において、半導体基台1の中央部上面に
は、異方性エツチングにより気体の流れる矢印11方向
に沿つてそれぞれ流入開口21,22および流出開口3
1,32を連通する2組の貫通孔41,42が形成され
ており、これらの貫通孔41,42の上部には半導体基
台1からブリツジ状に空間的に離隔され、結果的に半導
体基台1から熱的に絶縁されたそれぞれ橋絡部51,5
2が形成されている。これらの各橋絡部51,52の表
面には、図示しないが保護膜に挾持されてそれぞれ薄膜
パターンからなるヒータエレメント71,72と、それ
らの両端側にそれぞれ薄膜パターンからなる上流測温抵
抗エレメント81,82および下流側測温抵抗エレメン
ト91,92とが配列されてそれぞれ第1のフローセン
サ部131と第2のフローセンサ部132とからなるツイン
ブリツジ構造を有して構成されている。そして、各橋絡
部51,52上に形成されたそれぞれ上流側測温抵抗エ
レメント81,82はパターン接続部8aを介して直列
接続され、外部回路接続用電極端子8b,8c間に接続
され、また、ヒータエレメント71,72は周囲測温抵
抗エレメント10とともにパターン接続部7a,7bを
介して直列接続され、外部回路接続用電極端子7c,7
d間に接続され、さらに下流側測温抵抗エレメント
91,92も同様にパターン接続部9aを介して直列接
続され、外部回路接続用電極端子9b,9c間に接続さ
れている。FIG. 1 is a plan view showing an embodiment of a flow sensor according to the present invention, and the same parts as those in the above-mentioned drawings are designated by the same reference numerals. In the figure, on the upper surface of the central portion of the semiconductor base 1, inflow openings 2 1 , 2 2 and outflow openings 3 are formed along the direction of the arrow 11 through which gas flows by anisotropic etching.
1, 3 2 communicating with two pairs of through holes 4 1, 4 2 are formed, spatially separated from the semiconductor base 1 in Buritsuji form the top of the through holes 4 1, 4 2, As a result, the bridging portions 5 1 , 5 which are thermally insulated from the semiconductor base 1 , respectively.
2 is formed. On the surface of each of these bridging portions 5 1 and 5 2 , although not shown, heater elements 7 1 and 7 2 each of which is sandwiched by a protective film and each of which is a thin film pattern, and upstream of each of which is a thin film pattern are formed on both ends thereof. A twin bridge structure having the temperature measuring resistance elements 8 1 and 8 2 and the downstream side temperature measuring resistance elements 9 1 and 9 2 arranged to have a first flow sensor unit 13 1 and a second flow sensor unit 13 2 respectively is provided. It is configured to have. The upstream temperature measuring resistance elements 8 1 and 8 2 formed on the bridging portions 5 1 and 5 2 are connected in series via the pattern connecting portion 8a, and are connected between the external circuit connecting electrode terminals 8b and 8c. The heater elements 7 1 and 7 2 are connected in series with the ambient temperature measuring resistance element 10 via the pattern connecting portions 7 a and 7 b, and the external circuit connecting electrode terminals 7 c and 7 are connected.
Similarly, the downstream temperature measuring resistance elements 9 1 and 9 2 are also connected in series via the pattern connecting portion 9a, and are connected between the external circuit connecting electrode terminals 9b and 9c.
このような構成によると、上流側温抵抗エレメント
81,82が直列接続されて抵抗値変化の大きい1組の
上流側測温抵抗エレメントが構成され、また、下流側測
温抵抗エレメント91,92が直列接続されて抵抗値変
化の大きい1組の下流側測温抵抗エレメントが構成され
ることになり、第2図に示すようにその抵抗値変化特性
IIはシングルブリツジ構造(第4参照)の抵抗値変化特
性Iの約2倍となる。したがつて第1のフローセンサ部
131,第2のフローセンサ部132の流量Fに対する各温
度差をΔT1,ΔT2とすると、流量Fに比例する温度
変化分が積算され、その感度S2は(ΔT1+ΔT2)
/Fとなり、シングルブリツジ構造(S1=ΔT1/
F)の約2倍の感度が得られる。According to such a configuration, the upstream temperature resistance elements 8 1 and 8 2 are connected in series to configure one set of upstream temperature resistance elements having a large resistance change, and the downstream temperature resistance elements 9 1 , 9 2 will be a set of downstream-side temperature measuring resistance element having a large series connected with the resistance value change is configured, the resistance value variation characteristic as shown in FIG. 2
II is about twice the resistance change characteristic I of the single bridge structure (see the fourth example). Therefore, the first flow sensor section
Assuming that each temperature difference between the flow rate F of 13 1 and the second flow sensor section 13 2 is ΔT 1 and ΔT 2 , the temperature change proportional to the flow rate F is integrated, and its sensitivity S 2 is (ΔT 1 + ΔT 2 )
/ F and the single bridge structure (S 1 = ΔT 1 /
About twice the sensitivity of F) is obtained.
第3図は本発明によるフローセンサの他の実施例を示す
平面図であり、前述の図と同一部分には同一符号を付し
てある。同図において、第1図と異なる点は、半導体基
台1の上面には第1のフローセンサ部131,第2のフロ
ーセンサ部132とほぼ同等構成からなる第3のフローセ
ンサ部133が設けられてトリプルプリツジ構造を有して
構成されている。即ち、同図において、23は流入開
口、33は流出開口、43は貫通孔、53は橋絡部、7
3はヒータエレメント、83は上流側測温抵抗エレメン
ト、93は下流側測温抵抗エレメントであり、上流側測
温抵抗エレメント81,82,83はそれぞれパターン
接続部8a,8dを介して電極端子8b,8c間に直列
接続され、また、ヒータエレント71,72,73は周
囲測温抵抗エレメント10とともにパターン接続部7a,
7b,7e,を介して電極端子7c,7d間に直列接続
され、さらに下流側測温抵抗エレメント91,92,9
3も同様にパターン接続部9a,9dを介して電極端子
9b,9c間に直列接続されている。FIG. 3 is a plan view showing another embodiment of the flow sensor according to the present invention, and the same parts as those in the above-mentioned drawings are designated by the same reference numerals. In the figure, the difference from FIG. 1 is that the upper surface of the semiconductor base 1 has a third flow sensor section 13 having a configuration substantially similar to that of the first flow sensor section 13 1 and the second flow sensor section 13 2. 3 is provided and has a triple pledget structure. That is, in the figure, 2 3 is an inflow opening, 3 3 is an outflow opening, 4 3 is a through hole, 5 3 is a bridge portion, 7
3 is a heater element, 8 3 is an upstream side temperature measuring resistance element, 9 3 is a downstream side temperature measuring resistance element, and the upstream side temperature measuring resistance elements 8 1 , 8 2 , 8 3 have pattern connecting portions 8a, 8d, respectively. Is connected in series between the electrode terminals 8b and 8c, and the heater elements 7 1 , 7 2 and 7 3 together with the ambient temperature measuring resistance element 10 are connected to the pattern connecting portion 7a,
It is connected in series between the electrode terminals 7c and 7d via 7b and 7e, and is further connected to the downstream temperature measuring resistance elements 9 1 , 9 2 and 9
Similarly, 3 is also connected in series between the electrode terminals 9b and 9c via the pattern connecting portions 9a and 9d.
このような構成においても、上流側測温抵抗エレメント
81,82,83の直列接続および下流側測温抵抗エレ
ント91,92,93の直列接続により、それぞれ抵抗
値変化の大きい上流側測温抵抗エレメントおよび下流側
測温抵抗エレメントが構成されることになり、第2図に
示すようにその抵抗値変化特性IIIはシングルブリツジ
構造の抵抗値変化特性Iの約3倍となる。したがつて第
1のフローセンサ部131,第2のフローセンサ部132,
第3のフローセンサ部133の流量Fに対する各温度差を
ΔT1,ΔT2,ΔT3とすると、流量Fに比例する温
度変化分が積算され、その感度S3は(ΔT1+ΔT2
+ΔT3)/Fとなり、シングルブリツジ構造の約3倍
の感度が得られる。Even in such a configuration, the resistance change is large due to the series connection of the upstream side temperature measuring resistance elements 8 1 , 8 2 and 8 3 and the series connection of the downstream side temperature measuring resistance elements E 1 , 9 2 and 9 3. The upstream temperature-measuring resistance element and the downstream temperature-measuring resistance element are configured, and as shown in FIG. 2, the resistance value change characteristic III is about three times the resistance value change characteristic I of the single bridge structure. Become. Therefore, the first flow sensor unit 13 1 , the second flow sensor unit 13 2 ,
If the respective temperature differences with respect to the flow rate F of the third flow sensor unit 13 3 are ΔT 1 , ΔT 2 and ΔT 3 , the temperature change proportional to the flow rate F is integrated and its sensitivity S 3 is (ΔT 1 + ΔT 2
+ ΔT 3 ) / F, which is about three times as sensitive as the single bridge structure.
また、前述した構成によると、半導体基台1上に複数組
の薄膜橋絡構造および第1の測温抵抗体,発熱体,第2
の測温抵抗体を設けたことにより、従来構造では本実施
例と同等の抵抗体長を有するためには半導体基台の形状
が大きくなりすぎて強度上の問題があつたのに対して強
度上の問題がなくなり、しかも抵抗体面積も広くとるこ
とができる。Further, according to the above-mentioned configuration, a plurality of thin film bridging structures, the first resistance temperature detector, the heating element, and the second heating element are provided on the semiconductor base 1.
Due to the provision of the temperature-measuring-resistor, the conventional structure has the same resistance length as that of the present embodiment, but the shape of the semiconductor base becomes too large, which causes a problem in strength. Is eliminated, and the resistor area can be increased.
なお、前述した実施例においては、マイクロブリツジ構
造について説明したが、本発明はこれに限定されるもの
ではなく、ダイヤフラム構造に適用しても同様の効果が
得られることは勿論である。Although the micro-bridge structure has been described in the above-described embodiments, the present invention is not limited to this, and it is needless to say that the same effect can be obtained even when applied to a diaphragm structure.
以上説明したように本発明によれば、各測温抵抗体が直
列接続されることにより、気体の流量に対する抵抗値変
化が増大するので、流量に比例する温度変化分が積算さ
れて出力され、したがつて低流量域における温度変化が
検出でき、感度向上効果が得られる。As described above, according to the present invention, by connecting the resistance temperature detectors in series, the resistance value change with respect to the flow rate of the gas increases, so the temperature change amount proportional to the flow rate is integrated and output, Therefore, the temperature change in the low flow rate region can be detected, and the sensitivity improving effect can be obtained.
第1図は本発明によるフローセンサの一実施例を示す平
面図、第2図はフローセンサ部の累積数と抵抗値の変化
との関係を示す図、第3図は本発明によるフローセンサ
の他の実施例を示す平面図、第4図は従来のフローセン
サを示す斜視図、第5図(a),(b)は第4図に示すフロー
センサの動作を示す説明図、第6図は電圧出力に対する
流速の関係を示す特性図、第7図は従来のフローセンサ
の検出部の構成を示す要部拡大平面図である。 1……半導体基台、21,22,23,31,32,3
3……開口、41,42,43……貫通孔、51,
52,53……橋絡部、71,72,73……ヒータエ
レメント、81,82,83……上流側測温抵抗エレメ
ント、91,92,93……下流側測温抵抗エレメン
ト、10……周囲測温抵抗エレメント、131……第1の
フローセンサ部、132……第2のフローセンサ部、133
……第3のフローセンサ部。FIG. 1 is a plan view showing an embodiment of a flow sensor according to the present invention, FIG. 2 is a view showing the relationship between the cumulative number of flow sensor units and changes in resistance value, and FIG. 3 is a flow sensor according to the present invention. FIG. 4 is a plan view showing another embodiment, FIG. 4 is a perspective view showing a conventional flow sensor, FIGS. 5 (a) and 5 (b) are explanatory views showing the operation of the flow sensor shown in FIG. 4, and FIG. FIG. 7 is a characteristic diagram showing the relationship of the flow velocity with respect to the voltage output, and FIG. 1 ... Semiconductor base 2 1 , 2 2 , 2 3 , 3 1 , 3 2 , 3
3 ... Aperture 4 1 , 4 2 , 4 3 ... Through hole 5 1 ,
5 2 , 5 3 ...... Bridge portion, 7 1 , 7 2 , 7, 3 ... Heater element, 8 1 , 8 2 , 8 3 ...... Upstream temperature measuring resistance element, 9 1 , 9 2 , 9, 3 ... ... Downstream temperature measuring resistance element, 10 ... Ambient temperature measuring resistance element, 13 1 ... 1st flow sensor section, 13 2 ... 2nd flow sensor section, 13 3
...... Third flow sensor unit.
Claims (1)
の薄膜橋絡構造を設け、かつ前記各橋絡構造の上流から
下流に向かって第1の測温抵抗体,発熱体,第2の測温
抵抗体を順次配列して設けるとともに前記各第1の測温
抵抗体,各発熱体,各第2の測温抵抗体同志を互いに直
列接続させたことを特徴とするフローセンサ。1. At least two sets of thin film bridging structures in which gas flows are provided on the upper surface of a base, and a first resistance temperature detector, a heating element, and a second thermometer are arranged from upstream to downstream of each bridging structure. 1. The flow sensor, wherein the resistance temperature detectors are sequentially arranged and the first resistance temperature detectors, the heating elements, and the second resistance temperature detectors are connected in series to each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1275017A JPH0625685B2 (en) | 1989-10-24 | 1989-10-24 | Flow sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1275017A JPH0625685B2 (en) | 1989-10-24 | 1989-10-24 | Flow sensor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03137521A JPH03137521A (en) | 1991-06-12 |
| JPH0625685B2 true JPH0625685B2 (en) | 1994-04-06 |
Family
ID=17549720
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1275017A Expired - Lifetime JPH0625685B2 (en) | 1989-10-24 | 1989-10-24 | Flow sensor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0625685B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3484372B2 (en) * | 1999-06-10 | 2004-01-06 | 三菱電機株式会社 | Thermal flow sensor |
-
1989
- 1989-10-24 JP JP1275017A patent/JPH0625685B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03137521A (en) | 1991-06-12 |
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