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JPH06236893A - Manufacture of tft liquid crystal display - Google Patents

Manufacture of tft liquid crystal display

Info

Publication number
JPH06236893A
JPH06236893A JP33470292A JP33470292A JPH06236893A JP H06236893 A JPH06236893 A JP H06236893A JP 33470292 A JP33470292 A JP 33470292A JP 33470292 A JP33470292 A JP 33470292A JP H06236893 A JPH06236893 A JP H06236893A
Authority
JP
Japan
Prior art keywords
layer
film
liquid crystal
crystal display
layer film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33470292A
Other languages
Japanese (ja)
Inventor
Koji Matsunaga
永 浩 二 松
Jun Kuwata
田 純 桑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP33470292A priority Critical patent/JPH06236893A/en
Publication of JPH06236893A publication Critical patent/JPH06236893A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Thin Film Transistor (AREA)

Abstract

(57)【要約】 【目的】 TFT液晶表示装置のソース・ドレイン電極
の主材料にA1を用いた時、A1の上の最上層膜がポジ
型感光性樹脂の現像時のITOとの電食反応を抑制し、
エッチング形状が順テーパーのソース・ドレイン電極を
得る。 【構成】 TFT液晶表示装置のソース・ドレイン電極
となる中間層膜8を、互いに同一種類の最上層膜9と最
下層膜7とともに三層積層膜として製膜し、この三層積
層膜上にポジ型の感光性樹脂10を塗布して所定のパタ
ーンを形成し、最上層膜9のみを選択的にエッチング
し、続いて中間層膜8のみを選択的にエッチングし、ポ
ジ型の感光性樹脂10を除去した後、最下層膜7をエッ
チングすることによりソース・ドレイン電極を形成す
る。
(57) [Abstract] [Purpose] When A1 is used as the main material of the source / drain electrodes of a TFT liquid crystal display device, the uppermost layer film on A1 is electrolytically corroded with ITO during development of a positive photosensitive resin. Suppress the reaction,
A source / drain electrode whose etching shape is a forward taper is obtained. [Structure] An intermediate layer film 8 serving as a source / drain electrode of a TFT liquid crystal display device is formed as a three-layer laminated film together with an uppermost layer film 9 and a lowermost layer film 7 of the same kind, and is formed on this three-layer laminated film. A positive photosensitive resin 10 is applied to form a predetermined pattern, only the uppermost layer film 9 is selectively etched, and then only the intermediate layer film 8 is selectively etched. After removing 10, the lowermost layer film 7 is etched to form source / drain electrodes.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、TFT液晶表示装置の
製造方法、特にソース・ドレイン電極の形成方法に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a TFT liquid crystal display device, and more particularly to a method of forming source / drain electrodes.

【0002】[0002]

【従来の技術】近年、TFT液晶表示装置に対して大型
化の要求が強くなっており、ソース・ドレイン電極の配
線抵抗の低抵抗化が求められている。従来のTFT液晶
表示装置のソース・ドレイン電極には、CrやTi等が
単層で用いられていたが、CrやTiでは抵抗率が数1
0〜数100μΩ・cmと大きく、より低抵抗率の金属
を用いる必要がある。低抵抗率の金属としてはAu、A
g、AlやCuが挙げられるが、コスト・取り扱いの容
易さからAlが最適である。また、Alの場合、下地の
a−Si層およびゲート電極とのオーミックコンタクト
性が悪いため、通常バリアメタルとしてCrやTiを用
い、Al/CrあるいはAl/Tiの積層膜で用いる必
要がある。
2. Description of the Related Art In recent years, there has been a strong demand for a TFT liquid crystal display device having a large size, and it has been required to reduce the wiring resistance of the source / drain electrodes. The source / drain electrodes of a conventional TFT liquid crystal display device are made of Cr, Ti, etc. in a single layer, but Cr or Ti has a resistivity of several 1
It is necessary to use a metal having a large resistivity of 0 to several 100 μΩ · cm and a lower resistivity. Au, A as the low-resistivity metal
Although g, Al, and Cu are mentioned, Al is most suitable because of cost and ease of handling. Further, in the case of Al, since ohmic contact with the underlying a-Si layer and the gate electrode is poor, it is usually necessary to use Cr or Ti as a barrier metal and use it in a laminated film of Al / Cr or Al / Ti.

【0003】一方、TFT液晶表示装置を作成する上に
おいて重要な技術であるフォトリソグラフにおいては、
パターン精度および作業安全の面からポジ型の感光性樹
脂が主に用いられている。
On the other hand, in photolithography, which is an important technique for producing a TFT liquid crystal display device,
A positive photosensitive resin is mainly used from the viewpoint of pattern accuracy and work safety.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、Alの
パターン形成時にポジ型の感光性樹脂を用いると、現像
時に現像液にAlが溶解するため、画素電極材料である
ITO(錫添加酸化インジウム)と電食反応を起こし、
ITOが溶解するという問題が発生する。ネガ型の感光
性樹脂を用いることによりこの問題は解決できるが、前
述したようにフォトリソグラフィではネガ型からポジ型
に移行しており、ネガ型の感光性樹脂を用いることは根
本的な解決策にはならない。
However, when a positive type photosensitive resin is used for forming an Al pattern, Al dissolves in a developing solution at the time of development, so that ITO (tin-containing indium oxide) which is a pixel electrode material is used. Causes an electrolytic corrosion reaction,
The problem that ITO dissolves occurs. This problem can be solved by using a negative-type photosensitive resin, but as described above, in photolithography, the negative type has been changed to a positive type, and the use of a negative-type photosensitive resin is a fundamental solution. It doesn't.

【0005】本発明は、このような従来の課題を解決す
るものであり、画素電極材料であるITOと電食反応を
起こすことなく、ポジ型の感光性樹脂を用いてソース・
ドレイン電極を形成することのできるTFT液晶表示装
置の製造方法を提供することを目的とするものである。
The present invention is intended to solve such a conventional problem, in which a positive type photosensitive resin is used as a source material without causing electrolytic corrosion reaction with ITO which is a pixel electrode material.
It is an object of the present invention to provide a method for manufacturing a TFT liquid crystal display device capable of forming a drain electrode.

【0006】[0006]

【課題を解決するための手段】本発明は、上記目的を達
成するために、中間層を有して最上層と最下層が同一材
料からなる導電性薄膜の三層積層膜を製膜し、この三層
積層膜上にポジ型の感光性樹脂を塗布して所定のパター
ンを形成し、最上層のみを選択的にエッチングし、続い
て中間層のみを選択的にエッチングし、ポジ型の感光性
樹脂を除去した後、中間層上の最上層と最下層とを同時
にエッチングすることにより、ソース・ドレイン電極を
形成するようにしたものである。
In order to achieve the above-mentioned object, the present invention forms a three-layer laminated film of conductive thin films having an intermediate layer and an uppermost layer and a lowermost layer made of the same material, A positive type photosensitive resin is applied on this three-layer laminated film to form a predetermined pattern, and only the uppermost layer is selectively etched, and then only the intermediate layer is selectively etched. After removing the resin, the uppermost layer and the lowermost layer on the intermediate layer are simultaneously etched to form the source / drain electrodes.

【0007】[0007]

【作用】本発明は、上記方法により、TFT液晶表示装
置のソース・ドレイン電極の主材料にAlを用いた時、
Alの上の最上層膜がポジ型感光性樹脂の現像時のIT
Oとの電食反応を抑制し、さらに中間層であるAlのエ
ッチング後にポジ型感光性樹脂を除去し、最下層と中間
層の上に残った最上層とを同時にエッチングすることに
より、エッチング形状が順テーパーのソース・ドレイン
電極を得ることができる。
According to the present invention, when Al is used as the main material of the source / drain electrodes of the TFT liquid crystal display device by the above method,
The uppermost layer film on Al is IT when developing a positive photosensitive resin.
The etching shape is controlled by suppressing the electrolytic corrosion reaction with O, removing the positive photosensitive resin after etching the intermediate layer Al, and simultaneously etching the lowermost layer and the uppermost layer remaining on the intermediate layer. It is possible to obtain a source / drain electrode having a forward taper.

【0008】[0008]

【実施例】以下、本発明の一実施例について、図1およ
び図2を参照しながら説明する。図において、1は透光
性の絶縁性基板、2はゲート電極、3は層間絶縁膜、4
は半導体層、5はオーミックコンタクト層、6は画素電
極、7は最下層膜、8はソース・ドレイン電極となる中
間層膜、9は最上層膜、10はポジ型の感光性樹脂、1
1はソース・ドレイン電極である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS. In the figure, 1 is a translucent insulating substrate, 2 is a gate electrode, 3 is an interlayer insulating film, 4
Is a semiconductor layer, 5 is an ohmic contact layer, 6 is a pixel electrode, 7 is a lowermost layer film, 8 is an intermediate layer film serving as source / drain electrodes, 9 is an uppermost layer film, 10 is a positive photosensitive resin, 1
Reference numeral 1 is a source / drain electrode.

【0009】次に、上記構成のTFT液晶表示装置の製
造方法について説明する。透光性の絶縁性基板1とし
て、コーニング社の7059ガラス基板を用いた。ガラ
ス基板上に、DCスパッタリング法によりAl薄膜を1
50nmの膜厚で製膜し、所定パターンをウェットエッ
チング法により形成してゲート電極2を得た。そして、
層間絶縁膜3として、プラズマCVD法により基板温度
350°Cで窒化シリコン膜を400nm、半導体層4
としてa−Si膜を50nm、オーミックコンタクト層
5としてn+ 型a−Si膜を50nmの厚みで連続的に
製膜した。そして、a−Si膜4とn+ 型a−Si膜5
を島状にパターン形成した。その後、ITO薄膜をDC
スパッタリング法により100nmの膜厚で製膜し、所
定パターンをウェットエッチング法により形成して画素
電極6とした(図a)。
Next, a method of manufacturing the TFT liquid crystal display device having the above structure will be described. As the translucent insulating substrate 1, a 7059 glass substrate manufactured by Corning Incorporated was used. 1 Al thin film on glass substrate by DC sputtering method
A film having a film thickness of 50 nm was formed and a predetermined pattern was formed by a wet etching method to obtain a gate electrode 2. And
As the interlayer insulating film 3, a silicon nitride film having a thickness of 400 nm is formed at a substrate temperature of 350 ° C. by a plasma CVD method, and a semiconductor layer 4
As the a-Si film and the ohmic contact layer 5 as the n + -type a-Si film with a thickness of 50 nm. Then, the a-Si film 4 and the n + type a-Si film 5
Were patterned into islands. After that, the ITO thin film is DC
A film having a thickness of 100 nm was formed by a sputtering method, and a predetermined pattern was formed by a wet etching method to form a pixel electrode 6 (FIG. A).

【0010】引き続き、最下層膜7としてTi薄膜を5
0nm、中間層膜8としてAl薄膜を300nm、そし
て最上層膜9としてTi薄膜を500nmの膜厚でDC
スパッタリング法により連続製膜した(図b)。そし
て、ポジ型の感光性樹脂10を塗布し、所定のパターン
を形成し(図c)、最上層膜9のTi薄膜をドライエッ
チング法によりエッチングガスにCl2 、BCl3 およ
びSF6 の混合ガスで選択的にエッチングした(図
d)。
Subsequently, a Ti thin film 5 is formed as the lowermost layer film 7.
0 nm, 300 nm Al thin film as the intermediate layer film 8 and 500 nm thick Ti thin film as the uppermost layer film 9 in DC.
A continuous film was formed by the sputtering method (Fig. B). Then, a positive photosensitive resin 10 is applied to form a predetermined pattern (FIG. C), and the Ti thin film of the uppermost layer film 9 is used as an etching gas by a dry etching method by using a mixed gas of Cl 2 , BCl 3 and SF 6 . It was selectively etched at (Fig. D).

【0011】続いて、中間層膜8のAl薄膜をウェット
エッチング法によりエッチング液にリン酸と硝酸の混合
液で選択的にエッチングした(図e)。その後、ポジ型
の感光性樹脂10を除去し(図f)、中間層膜8上の最
上層膜9と最下層膜7のTi薄膜とをドライエッチング
法により、エッチングガスにCl2 、BCl3 およびS
6 の混合ガスで選択的にエッチングし(図g)、ソー
ス・ドレイン電極11を形成した。
Then, the Al thin film of the intermediate layer film 8 was selectively etched by a wet etching method with a mixed solution of phosphoric acid and nitric acid as an etching solution (FIG. 6E). After that, the positive photosensitive resin 10 is removed (FIG. F), and the uppermost layer film 9 on the intermediate layer film 8 and the Ti thin film of the lowermost layer film 7 are dry etched by using Cl 2 and BCl 3 as etching gas. And S
The source / drain electrodes 11 were formed by selectively etching with a mixed gas of F 6 (FIG. G).

【0012】以上のようにして、ソース・ドレイン電極
11を形成したところ、ポジ型の感光性樹脂の現象時に
ITOとの電食反応を制御でき、しかも、エッチング後
の断面形状も順テーパーの望ましい形状を得ることがで
きた。
When the source / drain electrodes 11 are formed as described above, it is possible to control the electrolytic corrosion reaction with ITO during the phenomenon of the positive type photosensitive resin, and it is desirable that the sectional shape after etching is also a forward taper. The shape could be obtained.

【0013】なお、最上層膜9のエッチングはウェット
エッチングでもよいが、中間層膜8をエッチングしない
エッチング液(例えば、Ti薄膜の場合は、EDTA、
過酸化水素水およびアンモニアの混合液)を用いる必要
がある。
The etching of the uppermost layer film 9 may be wet etching, but an etching solution that does not etch the intermediate layer film 8 (for example, EDTA in the case of a Ti thin film,
It is necessary to use a mixed solution of hydrogen peroxide water and ammonia).

【0014】[0014]

【発明の効果】本発明は、上記実施例から明らかなよう
に、TFT液晶表皮装置のソース・ドレイン電極を、中
間層を有して最上層と最下層が同一材料からなる導電性
薄膜の三層積層膜を製膜し、この三層積層膜上にポジ型
の感光性樹脂を塗布して所定のパターンを形成し、最上
層のみを選択的にエッチングし、続いて中間層のみ選択
的にエッチングし、ポジ型の感光性樹脂を除去した後、
中間層上の最上層と最下層とを同時にエッチングしてソ
ース・ドレイン電極を形成するようにしたので、次の二
つの効果が得られる。
According to the present invention, as is apparent from the above-described embodiments, the source / drain electrodes of the TFT liquid crystal skin device have three layers of conductive thin films having the intermediate layer and the uppermost layer and the lowermost layer made of the same material. A three-layer laminated film is formed, a positive type photosensitive resin is applied on this three-layer laminated film to form a predetermined pattern, only the uppermost layer is selectively etched, and then only the intermediate layer is selectively etched. After etching and removing the positive photosensitive resin,
Since the uppermost layer and the lowermost layer on the intermediate layer are simultaneously etched to form the source / drain electrodes, the following two effects can be obtained.

【0015】一つは、ソース・ドレイン電極にAlを使
用する場合、ポジ型の感光性樹脂を用いたパターンを形
成時に画素電極であるITOとの電食反応を制御でき
る。二つめは、最下層エッチング時に最上層も同時にエ
ッチングできるためエッチングの断面形状を順テーパー
にすることができる。
First, when Al is used for the source / drain electrodes, it is possible to control the electrolytic corrosion reaction with ITO, which is a pixel electrode, when forming a pattern using a positive photosensitive resin. Second, since the uppermost layer can be etched at the same time when the lowermost layer is etched, the sectional shape of the etching can be a forward taper.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)〜(d)本発明の一実施例におけるTF
T液晶表示装置の製造工程を示す断面構造図
1 (a) to (d) TF in one embodiment of the present invention
Sectional structural drawing showing manufacturing process of T liquid crystal display device

【図2】(e)〜(g)本発明の一実施例におけるTF
T液晶表示装置の製造工程の続きを示す断面構造図
2 (e) to (g) TF in one embodiment of the present invention
Sectional structural drawing showing the continuation of the manufacturing process of the T liquid crystal display device.

【符号の説明】[Explanation of symbols]

1 透光性の絶縁性基板 2 ゲート電極 3 層間絶縁膜 4 半導体層 5 オーミックコンタクト層 6 画素電極 7 最下層膜 8 中間層膜 9 最上層膜 10 ポジ型の感光性樹脂 11 ソース・ドレイン電極 1 Translucent Insulating Substrate 2 Gate Electrode 3 Interlayer Insulating Film 4 Semiconductor Layer 5 Ohmic Contact Layer 6 Pixel Electrode 7 Bottom Layer Film 8 Intermediate Layer Film 9 Top Layer Film 10 Positive Photosensitive Resin 11 Source / Drain Electrodes

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 ゲート電極、層間絶縁膜、半導体層、オ
ーミックコンタクト層および画素電極が形成された透光
性の絶縁性基板上に、中間層を有して最上層と最下層が
同一材料からなる導電性薄膜の三層積層膜を製膜し、前
記三層積層膜上にポジ型の感光性樹脂を塗布して所定の
パターンを形成し、前記最上層のみを選択的にエッチン
グし、続いて中間層のみを選択的にエッチングし、前記
ポジ型の感光性樹脂を除去した後、中間層上の最上層と
露出された最下層とを同時にエッチングすることによ
り、ソース・ドレイン電極を形成することを特徴とする
TFT液晶表示装置の製造方法。
1. A translucent insulating substrate on which a gate electrode, an interlayer insulating film, a semiconductor layer, an ohmic contact layer, and a pixel electrode are formed, and an intermediate layer having an uppermost layer and a lowermost layer made of the same material. Forming a three-layer laminated film of a conductive thin film which is formed, applying a positive photosensitive resin on the three-layer laminated film to form a predetermined pattern, selectively etching only the uppermost layer, Then, only the intermediate layer is selectively etched to remove the positive photosensitive resin, and then the uppermost layer on the intermediate layer and the exposed lowermost layer are simultaneously etched to form source / drain electrodes. A method for manufacturing a TFT liquid crystal display device, comprising:
【請求項2】 三層積層膜の中間層がAlを主成分とす
る薄膜からなることを特徴とする請求項1記載のTFT
液晶表示装置の製造方法。
2. The TFT according to claim 1, wherein the intermediate layer of the three-layer laminated film is a thin film containing Al as a main component.
Liquid crystal display device manufacturing method.
【請求項3】 三層積層膜の最上層と最下層がTiまた
はMoを主成分とする薄膜からなることを特徴とする請
求項1または2記載のTFT液晶表示装置の製造方法。
3. The method of manufacturing a TFT liquid crystal display device according to claim 1, wherein the uppermost layer and the lowermost layer of the three-layer laminated film are thin films containing Ti or Mo as a main component.
JP33470292A 1992-12-15 1992-12-15 Manufacture of tft liquid crystal display Pending JPH06236893A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33470292A JPH06236893A (en) 1992-12-15 1992-12-15 Manufacture of tft liquid crystal display

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33470292A JPH06236893A (en) 1992-12-15 1992-12-15 Manufacture of tft liquid crystal display

Publications (1)

Publication Number Publication Date
JPH06236893A true JPH06236893A (en) 1994-08-23

Family

ID=18280263

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33470292A Pending JPH06236893A (en) 1992-12-15 1992-12-15 Manufacture of tft liquid crystal display

Country Status (1)

Country Link
JP (1) JPH06236893A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6387600B1 (en) 1999-08-25 2002-05-14 Micron Technology, Inc. Protective layer during lithography and etch
WO2003087921A3 (en) * 2002-04-08 2004-01-22 Samsung Electronics Co Ltd Liquid crystal display device
KR100590925B1 (en) * 1999-07-30 2006-06-19 비오이 하이디스 테크놀로지 주식회사 Method of manufacturing thin film transistor-liquid crystal display device
US7825515B2 (en) 2007-09-12 2010-11-02 Mitsubishi Electric Corporation Semiconductor device, display device, and method of manufacturing semiconductor device
USRE41927E1 (en) * 2001-02-12 2010-11-16 Samsung Electronics Co., Ltd. TFT LCD device having multi-layered pixel electrodes
US8546804B2 (en) 2010-11-05 2013-10-01 Mitsubishi Electric Corporation Semiconductor device including a region containing nitrogen at an interface and display device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100590925B1 (en) * 1999-07-30 2006-06-19 비오이 하이디스 테크놀로지 주식회사 Method of manufacturing thin film transistor-liquid crystal display device
US6387600B1 (en) 1999-08-25 2002-05-14 Micron Technology, Inc. Protective layer during lithography and etch
US6548227B2 (en) 1999-08-25 2003-04-15 Micron Technology, Inc. Protective layer for corrosion prevention during lithography and etch
US6759181B2 (en) 1999-08-25 2004-07-06 Micron Technology, Inc. Protective layer for corrosion prevention during lithography and etch
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