JP5675099B2 - イオンソース - Google Patents
イオンソース Download PDFInfo
- Publication number
- JP5675099B2 JP5675099B2 JP2009520038A JP2009520038A JP5675099B2 JP 5675099 B2 JP5675099 B2 JP 5675099B2 JP 2009520038 A JP2009520038 A JP 2009520038A JP 2009520038 A JP2009520038 A JP 2009520038A JP 5675099 B2 JP5675099 B2 JP 5675099B2
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/16—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation
- H01J27/18—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation with an applied axial magnetic field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/022—Details
- H01J27/024—Extraction optics, e.g. grids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/047—Changing particle velocity
- H01J2237/0473—Changing particle velocity accelerating
- H01J2237/04735—Changing particle velocity accelerating with electrostatic means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/083—Beam forming
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Electron Sources, Ion Sources (AREA)
- Particle Accelerators (AREA)
Description
Claims (15)
- プラズマを収容するためのかつイオンのための出口を有するチャンバと、プラズマからイオン流を引き出しかつある特定の方向のビームの形にイオンを形成するための、前記出口に取り付けられているアクセラレータとを含むイオンソースであって、
前記アクセラレータは、互いに間隔が開けられた概ね互いに平行な、前記方向において順序付けられた第1、第2、第3及び第4グリッドを含み、
前記第2のグリッドから前記第4のグリッドが第1及び第2の組の支持物によって配置されており、
前記第2の組の支持物が前記第2のグリッドおよび第4のグリッドを支持しかつ前記第1の組の支持物が前記第3のグリッドを支持する、
イオンソース。 - 前記第1の組の支持物は前記第3のグリッドおよび第4のグリッドを支持する請求項1に記載のソース。
- 前記第2の組の前記支持物の少なくとも1つは、前記出口またはその延長部分を画定するチャンバの壁から前記第2のグリッドに延びる絶縁体を含む請求項1または2に記載のソース。
- 前記第2の組の前記支持物の少なくとも1つは、前記第2のグリッドから前記第4のグリッドに延びる絶縁体を含む請求項1から3のいずれか一項に記載のソース。
- 前記第1の組の前記支持物の少なくとも1つは、前記出口またはその延長部分を画定するチャンバの壁から前記第3のグリッドに延びる絶縁体を含む請求項1から4のいずれか一項に記載のソース。
- 前記第1の組の前記支持物の少なくとも1つは、前記第3のグリッドから前記第4のグリッドに延びる絶縁体を含む請求項1から5のいずれか一項に記載のソース。
- 前記絶縁体はスパッタシャドウを生じさせるための形成物を含む請求項3から6のいずれか一項に記載のソース。
- 前記出口またはその延長部分を画定するチャンバの壁またはその延長部分は絶縁体を受け入れるための少なくとも1つの凹みを含む請求項3から7のいずれか一項に記載のソース。
- 前記第1のグリッドは、1つの軸線を中心とした方向に凹状または凸状のプロファイルを有するように機械的にプレストレスが付与されている請求項1から8のいずれか一項に記載のソース。
- 前記第1のグリッドは概ね長方形であり、かつ、前記1つの軸線は前記長方形の縦軸線である請求項9に記載のソース。
- 前記グリッドは前記縦軸線の付近において凹状または凸状である請求項9に記載のソース。
- 前記グリッドの周縁部に近接した前記グリッドの開口部の少なくとも幾つかが、前記グリッドの中央区域内に配置されている前記開口部よりも開口面積が小さい請求項1から11のいずれか一項に記載のソース。
- 前記グリッドの開口部の開口面積は、プラズマ体積内の設計された局所プラズマ密度に比例している請求項1から11のいずれか一項に記載のソース。
- 複数のプラズマ発生器を含む請求項1から13のいずれか一項に記載のソース。
- 前記チャンバは細長く、かつ、前記プラズマ発生器は前記チャンバの長さに沿って配置されている請求項14に記載のソース。
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83242806P | 2006-07-20 | 2006-07-20 | |
| US60/832,428 | 2006-07-20 | ||
| GB0614501.5 | 2006-07-21 | ||
| GB0614501A GB0614501D0 (en) | 2006-07-21 | 2006-07-21 | Ion sources |
| PCT/GB2007/002614 WO2008009898A1 (en) | 2006-07-20 | 2007-07-12 | Ion sources |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009545102A JP2009545102A (ja) | 2009-12-17 |
| JP5675099B2 true JP5675099B2 (ja) | 2015-02-25 |
Family
ID=38543850
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009520038A Active JP5675099B2 (ja) | 2006-07-20 | 2007-07-12 | イオンソース |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8354652B2 (ja) |
| EP (1) | EP2044608B1 (ja) |
| JP (1) | JP5675099B2 (ja) |
| CN (1) | CN101490789B (ja) |
| WO (1) | WO2008009898A1 (ja) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008022181B4 (de) | 2008-05-05 | 2019-05-02 | Arianegroup Gmbh | Ionentriebwerk |
| GB0921791D0 (en) | 2009-12-14 | 2010-01-27 | Aviza Technologies Ltd | Ion beam source |
| US8968535B2 (en) * | 2009-12-14 | 2015-03-03 | Spp Process Technology Systems Uk Limited | Ion beam source |
| JP5380263B2 (ja) * | 2009-12-15 | 2014-01-08 | キヤノンアネルバ株式会社 | イオンビーム発生器 |
| CN103154310B (zh) * | 2010-10-05 | 2016-08-03 | 威科仪器有限公司 | 离子束系统、用于推进多个离子子束的设备以及相关方法 |
| US20130015757A1 (en) * | 2011-07-11 | 2013-01-17 | Hariharakeshava Sarpangala Hegde | Multi-grid assembly in plasma source system and methods for improving same |
| CN106835022A (zh) * | 2017-03-31 | 2017-06-13 | 上海伟钊光学科技股份有限公司 | 双曲线回转面栅网板离子源 |
| RU2660677C1 (ru) * | 2017-11-27 | 2018-07-09 | Федеральное государственное бюджетное научное учреждение "Федеральный исследовательский центр Институт прикладной физики Российской академии наук" (ИПФ РАН) | Сильноточный источник пучков ионов на основе плазмы электронно-циклотронного резонансного разряда, удерживаемой в открытой магнитной ловушке |
| CN111322214B (zh) * | 2020-02-13 | 2021-11-16 | 哈尔滨工业大学 | 一种会切场低推力射频离子推力器 |
| CN112696329B (zh) * | 2020-12-14 | 2022-06-10 | 兰州空间技术物理研究所 | 一种离子推力器栅极绝缘连接结构及装配方法 |
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-
2007
- 2007-07-12 JP JP2009520038A patent/JP5675099B2/ja active Active
- 2007-07-12 CN CN2007800274847A patent/CN101490789B/zh active Active
- 2007-07-12 WO PCT/GB2007/002614 patent/WO2008009898A1/en not_active Ceased
- 2007-07-12 EP EP07766199A patent/EP2044608B1/en active Active
- 2007-07-12 US US12/309,460 patent/US8354652B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009545102A (ja) | 2009-12-17 |
| EP2044608B1 (en) | 2012-05-02 |
| CN101490789B (zh) | 2011-04-13 |
| WO2008009898A1 (en) | 2008-01-24 |
| US8354652B2 (en) | 2013-01-15 |
| EP2044608A1 (en) | 2009-04-08 |
| US20090309042A1 (en) | 2009-12-17 |
| CN101490789A (zh) | 2009-07-22 |
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