JP4444111B2 - 表示装置の製造方法 - Google Patents
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- JP4444111B2 JP4444111B2 JP2004539100A JP2004539100A JP4444111B2 JP 4444111 B2 JP4444111 B2 JP 4444111B2 JP 2004539100 A JP2004539100 A JP 2004539100A JP 2004539100 A JP2004539100 A JP 2004539100A JP 4444111 B2 JP4444111 B2 JP 4444111B2
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- FHCPAXDKURNIOZ-UHFFFAOYSA-N tetrathiafulvalene Chemical compound S1C=CSC1=C1SC=CS1 FHCPAXDKURNIOZ-UHFFFAOYSA-N 0.000 description 2
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- MIOPJNTWMNEORI-GMSGAONNSA-N (S)-camphorsulfonic acid Chemical compound C1C[C@@]2(CS(O)(=O)=O)C(=O)C[C@@H]1C2(C)C MIOPJNTWMNEORI-GMSGAONNSA-N 0.000 description 1
- YMMGRPLNZPTZBS-UHFFFAOYSA-N 2,3-dihydrothieno[2,3-b][1,4]dioxine Chemical compound O1CCOC2=C1C=CS2 YMMGRPLNZPTZBS-UHFFFAOYSA-N 0.000 description 1
- OGGKVJMNFFSDEV-UHFFFAOYSA-N 3-methyl-n-[4-[4-(n-(3-methylphenyl)anilino)phenyl]phenyl]-n-phenylaniline Chemical group CC1=CC=CC(N(C=2C=CC=CC=2)C=2C=CC(=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)=C1 OGGKVJMNFFSDEV-UHFFFAOYSA-N 0.000 description 1
- 229910004261 CaF 2 Inorganic materials 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910017911 MgIn Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
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- 239000002019 doping agent Substances 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
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- 125000001165 hydrophobic group Chemical group 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical group [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
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- 229910052709 silver Inorganic materials 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- DZLFLBLQUQXARW-UHFFFAOYSA-N tetrabutylammonium Chemical compound CCCC[N+](CCCC)(CCCC)CCCC DZLFLBLQUQXARW-UHFFFAOYSA-N 0.000 description 1
- CBXCPBUEXACCNR-UHFFFAOYSA-N tetraethylammonium Chemical compound CC[N+](CC)(CC)CC CBXCPBUEXACCNR-UHFFFAOYSA-N 0.000 description 1
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/122—Pixel-defining structures or layers, e.g. banks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/191—Deposition of organic active material characterised by provisions for the orientation or alignment of the layer to be deposited
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/17—Carrier injection layers
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroluminescent Light Sources (AREA)
Description
Y.ヤング等、アプライド・フィジックス・レターズ、第64巻、1245頁、1994年 S.A. カーター等、 アプライド・フィジックス・レターズ、第70巻、2067頁、1987年
本発明の表示装置の製造方法の概念図をその断面を示しつつ工程順に図1(A)〜(F)に示す。図1(A)において、基板101上に第1電極102を有し、前記第1電極102を囲む形で絶縁体隔壁103を設けたものが示されている。
基板上に、電子注入電極として作用する金属(例としてAlLi合金やMgAg合金等)を真空蒸着法やEB法で成膜する。次にドナーを含む溶液を湿式塗布する。ドナーとしては、アルキルアンモニウムイオン(例えばテトラエチルアンモニウム、テトラブチルアンモニウム等)、またはテトラチアフルバレン(以下「TTF」と記す)が好ましい。最後に前記ドナーを含む導電性高分子を湿式塗布する。前記導電性高分子は、ポリ(アニリン)、ポリ(ピロール)等が好ましい。
102 第1電極
103 絶縁体隔壁
104 アクセプタを含む溶液の層
105 有機導電体層
106 電界発光層
107 第2電極
Claims (11)
- 絶縁表面上に第1電極を形成し、
前記第1電極を囲み、かつ前記第1電極の表面より上方に突出した絶縁体隔壁を形成し、
前記絶縁体隔壁および前記第1電極の上に、アクセプタを含む溶液または分散液を湿式塗布し、
前記溶液または分散液を湿式塗布した後に、前記絶縁体隔壁および前記第1電極と、水とを接触させ、
前記絶縁体隔壁および前記第1電極の上に、前記アクセプタを含む有機導電体層を湿式塗布により形成し、
前記有機導電体層の上に、有機化合物を含む発光層を形成し、
前記発光層の上に第2電極を形成することを特徴とする表示装置の製造方法。 - 請求項1において、
前記アクセプタは、スルホン酸基を有する有機化合物であることを特徴とする表示装置の製造方法。 - 請求項1または2において、
前記アクセプタを含む溶液または分散液の濃度は、1wt%以上5wt%以下であることを特徴とする表示装置の製造方法。 - 請求項1乃至3のいずれか一項において、
前記有機導電体層は、高分子化合物に前記アクセプタがドーピングされた物質からなることを特徴とする表示装置の製造方法。 - 絶縁表面上に第1電極を形成し、
前記第1電極を囲み、かつ前記第1電極の表面より上方に突出した絶縁体隔壁を形成し、
前記絶縁体隔壁および前記第1電極の上に、ドナーを含む溶液または分散液を湿式塗布し、
前記絶縁体隔壁および前記第1電極の上に、前記ドナーを含む有機導電体層を湿式塗布により形成し、
前記有機導電体層の上に、有機化合物を含む発光層を形成し、
前記発光層の上に第2電極を形成することを特徴とする表示装置の製造方法。 - 請求項5において、
前記ドナーを含む溶液または分散液の濃度は、1wt%以上5wt%以下であることを特徴とする表示装置の製造方法。 - 請求項5または6において、
前記有機導電体層は、高分子化合物に前記ドナーがドーピングされた物質からなることを特徴とする表示装置の製造方法。 - 請求項1乃至7のいずれか一項において、
前記第1電極を有する画素を複数有し、
前記複数の画素はマトリクス状に配置されていることを特徴とする表示装置の製造方法。 - 請求項1乃至8のいずれか一項において、
前記発光層は電界発光層であることを特徴とする表示装置の製造方法。 - 請求項1乃至9のいずれか一項において、
データ信号ラインと、走査信号ラインと、前記データ信号ライン、前記走査信号ラインおよび前記第1電極に接続された非線形素子と、を形成することを特徴とする表示装置の製造方法。 - 請求項10において、
前記非線形素子は、互いに接続された薄膜トランジスタとキャパシタ、または薄膜トランジスタと前記薄膜トランジスタの寄生のキャパシタを有することを特徴とする表示装置の製造方法。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002374155 | 2002-12-25 | ||
| JP2002374155 | 2002-12-25 | ||
| PCT/JP2003/016352 WO2004060025A1 (ja) | 2002-12-25 | 2003-12-19 | 表示装置の製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006336597A Division JP4444267B2 (ja) | 2002-12-25 | 2006-12-14 | 表示装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2004060025A1 JPWO2004060025A1 (ja) | 2006-05-11 |
| JP4444111B2 true JP4444111B2 (ja) | 2010-03-31 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004539100A Expired - Fee Related JP4444111B2 (ja) | 2002-12-25 | 2003-12-19 | 表示装置の製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7112113B2 (ja) |
| JP (1) | JP4444111B2 (ja) |
| CN (1) | CN100508678C (ja) |
| AU (1) | AU2003289445A1 (ja) |
| WO (1) | WO2004060025A1 (ja) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7112113B2 (en) * | 2002-12-25 | 2006-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of display device |
| JP2005317676A (ja) * | 2004-04-27 | 2005-11-10 | Sony Corp | 半導体発光素子、半導体発光装置及び半導体発光素子の製造方法 |
| US7470604B2 (en) * | 2004-10-08 | 2008-12-30 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing display device |
| KR101182435B1 (ko) * | 2005-02-03 | 2012-09-12 | 삼성디스플레이 주식회사 | 전도성 고분자 패턴막 및 이를 패터닝 하는 방법 그리고 이를 이용하는 유기전계 발광소자 및 그 제조방법 |
| JP4745062B2 (ja) * | 2005-06-02 | 2011-08-10 | 三星モバイルディスプレイ株式會社 | 平板表示装置及びその製造方法 |
| CN100482016C (zh) * | 2005-08-16 | 2009-04-22 | 中华映管股份有限公司 | 有机电致发光元件及其制造方法 |
| US7635947B2 (en) | 2005-08-29 | 2009-12-22 | Chunghwa Picture Tubes, Ltd. | Organic electro-luminescence device comprising uniform thickness light-emitting layer |
| EP1808913A1 (en) * | 2006-01-17 | 2007-07-18 | Nederlandse Organisatie voor Toegepast-Natuuurwetenschappelijk Onderzoek TNO | A stamp for preparing a structured layer for use in an organic opto-electric device and a method for preparing such a stamp |
| KR101485926B1 (ko) * | 2007-02-02 | 2015-02-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 기억장치 |
| KR100813854B1 (ko) * | 2007-04-23 | 2008-03-17 | 삼성에스디아이 주식회사 | 유기 발광 소자 및 그 제조방법 |
| JP5096849B2 (ja) * | 2007-09-13 | 2012-12-12 | 株式会社Sokudo | 基板処理装置および基板処理方法 |
| JP5417732B2 (ja) * | 2008-03-31 | 2014-02-19 | 住友化学株式会社 | 親液撥液パターンの形成方法および有機エレクトロルミネッセンス素子の製造方法 |
| JP4770896B2 (ja) * | 2008-09-08 | 2011-09-14 | カシオ計算機株式会社 | 発光装置及び発光装置の製造方法 |
| US20100051993A1 (en) * | 2008-09-03 | 2010-03-04 | Casio Computer Co., Ltd. | Light emitting apparatus and manufacturing method thereof |
| KR102503687B1 (ko) * | 2009-07-03 | 2023-02-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
| CN103299712B (zh) * | 2011-01-18 | 2016-01-27 | 夏普株式会社 | 被成膜基板和有机el显示装置 |
| TWI691588B (zh) * | 2014-12-09 | 2020-04-21 | 日商三井化學股份有限公司 | 有機el元件用面密封材及其硬化物 |
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| US7112113B2 (en) | 2002-12-25 | 2006-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of display device |
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2003
- 2003-12-17 US US10/736,543 patent/US7112113B2/en not_active Expired - Fee Related
- 2003-12-19 CN CNB2003801076351A patent/CN100508678C/zh not_active Expired - Fee Related
- 2003-12-19 AU AU2003289445A patent/AU2003289445A1/en not_active Abandoned
- 2003-12-19 WO PCT/JP2003/016352 patent/WO2004060025A1/ja not_active Ceased
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| WO2004060025A1 (ja) | 2004-07-15 |
| US20040253368A1 (en) | 2004-12-16 |
| CN1732718A (zh) | 2006-02-08 |
| US20070054582A1 (en) | 2007-03-08 |
| US7112113B2 (en) | 2006-09-26 |
| AU2003289445A1 (en) | 2004-07-22 |
| CN100508678C (zh) | 2009-07-01 |
| JPWO2004060025A1 (ja) | 2006-05-11 |
| US8337940B2 (en) | 2012-12-25 |
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