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JP2019028043A - Voltage abnormality detector - Google Patents

Voltage abnormality detector Download PDF

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JP2019028043A
JP2019028043A JP2017151224A JP2017151224A JP2019028043A JP 2019028043 A JP2019028043 A JP 2019028043A JP 2017151224 A JP2017151224 A JP 2017151224A JP 2017151224 A JP2017151224 A JP 2017151224A JP 2019028043 A JP2019028043 A JP 2019028043A
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voltage
phase
detection device
fpga
abnormality detection
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JP6866800B2 (en
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慶 長谷川
Kei Hasegawa
慶 長谷川
敏明 鵜飼
Toshiaki Ukai
敏明 鵜飼
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Brother Industries Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16576Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold

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  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Emergency Protection Circuit Devices (AREA)

Abstract

【課題】電源異常を精度良く検出できる電圧異常検出装置を提供する。【解決手段】電圧異常検出装置は、交流電圧の異常を検出する。電圧異常検出装置は、交流電圧を複数の相に分圧する基準回路、周波数毎に定義した基準情報を、交流電圧の信号線に接続する回路構成毎に対応付けたテーブルを記憶した記憶部を備える。FPGAは、回路構成を特定可能な指示を受け付け、受け付けた指示が特定する回路構成に対応する周波数毎の基準情報を決定する(S11)。FPGAは、分圧した複数の相の夫々の周波数を特定する(S17)。FPGAは、特定した周波数に対応する基準情報を特定する(S19)。FPGAは、特定した基準情報と交流電圧との関係に応じ、交流電圧に異常があるか否か判定する(S23、S25)。【選択図】図5A voltage abnormality detection device capable of accurately detecting a power supply abnormality is provided. A voltage abnormality detection device detects an abnormality of an AC voltage. The voltage abnormality detection device includes a reference circuit that divides an AC voltage into a plurality of phases, and a storage unit that stores a table in which reference information defined for each frequency is associated with each circuit configuration connected to a signal line of the AC voltage. . The FPGA receives an instruction capable of specifying a circuit configuration, and determines reference information for each frequency corresponding to the circuit configuration specified by the received instruction (S11). The FPGA specifies the frequency of each of the divided phases (S17). The FPGA specifies reference information corresponding to the specified frequency (S19). The FPGA determines whether there is an abnormality in the AC voltage according to the relationship between the specified reference information and the AC voltage (S23, S25). [Selection diagram] FIG.

Description

本発明は、電圧異常検出装置に関する。   The present invention relates to a voltage abnormality detection device.

特許文献1は、三相交流電圧の異常を検出する電圧異常検出装置を開示する。電圧異常検出装置は、三相交流電圧のR相、S相、T相の夫々についてデューティ比を検知する。電圧異常検出装置は、検知したデューティ比を所定閾値と比較し、過電圧又は電圧低下が発生しているか判定する。電圧異常検出装置は、判断結果を表示装置に表示する。   Patent Document 1 discloses a voltage abnormality detection device that detects an abnormality in a three-phase AC voltage. The voltage abnormality detection device detects the duty ratio for each of the R phase, S phase, and T phase of the three-phase AC voltage. The voltage abnormality detection device compares the detected duty ratio with a predetermined threshold value and determines whether an overvoltage or a voltage drop has occurred. The voltage abnormality detection device displays the determination result on the display device.

特許第6070139号公報Japanese Patent No. 6070139

三相交流電圧の信号線に設けたローパスフィルタ及びバイパスコンデンサの影響により、三相交流電圧の周波数の変動に応じ、デューティ比が変動する。故に、電圧異常検出装置は、周波数の変動に依らず共通の閾値でデューティ比を判定した時、過電圧又は電圧低下の発生を精度良く判定できない時があるという問題点がある。   Due to the influence of the low-pass filter and the bypass capacitor provided on the signal line of the three-phase AC voltage, the duty ratio varies according to the variation of the frequency of the three-phase AC voltage. Therefore, the voltage abnormality detection device has a problem that when the duty ratio is determined with a common threshold regardless of the fluctuation of the frequency, the occurrence of an overvoltage or a voltage drop cannot be accurately determined.

本発明の目的は、電源異常を精度良く検出できる電圧異常検出装置を提供することである。   An object of the present invention is to provide a voltage abnormality detection device that can accurately detect a power supply abnormality.

本発明に係る電圧異常検出装置は、交流電圧の異常を検出する電圧異常検出装置であって、前記交流電圧を複数の相に分圧する分圧手段と、周波数毎に定義した基準情報を、前記交流電圧の信号線に接続する回路構成毎に対応付けたテーブルを記憶した記憶部と、前記回路構成を特定可能な指示を受け付け、受け付けた前記指示が特定する前記回路構成に対応する前記周波数毎の前記基準情報を決定する決定手段と、前記分圧手段により分圧した前記複数の相の夫々の周波数を特定する第一特定手段と、前記第一特定手段により特定した前記周波数に対応する前記基準情報を、前記決定手段により決定した前記周波数毎の前記基準情報に基づいて特定する第二特定手段と、前記第二特定手段により特定した前記基準情報と前記交流電圧との関係に応じ、前記交流電圧に異常があるか否か判定する判定手段とを備えたことを特徴とする。   The voltage abnormality detection device according to the present invention is a voltage abnormality detection device that detects an abnormality of an alternating voltage, the voltage dividing means for dividing the alternating voltage into a plurality of phases, and the reference information defined for each frequency, A storage unit storing a table associated with each circuit configuration connected to the signal line of the AC voltage, and an instruction that can specify the circuit configuration, and each frequency corresponding to the circuit configuration specified by the received instruction Determining means for determining the reference information, first specifying means for specifying each frequency of the plurality of phases divided by the voltage dividing means, and the frequency corresponding to the frequency specified by the first specifying means A second specifying unit that specifies reference information based on the reference information for each frequency determined by the determining unit, and a relationship between the reference information specified by the second specifying unit and the AC voltage. In response, characterized by comprising a whether determination means wherein there is an abnormality in the alternating voltage.

電圧異常検出装置は、交流電圧の信号線に接続する回路構成に応じた基準情報を、周波数に対応付けてテーブルに格納し、記憶部に記憶する。電圧異常検出装置は、交流電圧の各相の周波数を特定し、対応する基準情報をテーブルに基づいて特定する。電圧異常検出装置は、特定した基準情報と交流電圧との関係に応じ、交流電圧に異常があるか判定する。該時、電圧異常検出装置は、信号線に接続する回路構成に応じて交流電圧の周波数が変動する時も、変動した周波数に対応する基準情報に基づいて、交流電圧に異常があるかを判定できる。故に、電圧異常検出装置は、交流電圧に異常があるかを精度良く検出できる。   The voltage abnormality detection device stores reference information corresponding to the circuit configuration connected to the AC voltage signal line in a table in association with the frequency and stores the reference information in a storage unit. The voltage abnormality detection device specifies the frequency of each phase of the AC voltage and specifies the corresponding reference information based on the table. The voltage abnormality detection device determines whether there is an abnormality in the AC voltage according to the relationship between the specified reference information and the AC voltage. At this time, the voltage abnormality detection device determines whether there is an abnormality in the AC voltage based on the reference information corresponding to the changed frequency even when the frequency of the AC voltage varies according to the circuit configuration connected to the signal line. it can. Therefore, the voltage abnormality detection device can accurately detect whether there is an abnormality in the AC voltage.

本発明において、前記交流電圧は三相交流電圧であり、前記分圧手段は、前記三相交流電圧を、R相、S相、T相に分圧してもよい。該時、電圧異常検出装置は、三相交流電圧に異常があるかを、R相、S相、T相の夫々の交流電圧に基づいて精度良く判定できる。   In the present invention, the AC voltage may be a three-phase AC voltage, and the voltage dividing unit may divide the three-phase AC voltage into an R phase, an S phase, and a T phase. At this time, the voltage abnormality detection device can accurately determine whether there is an abnormality in the three-phase AC voltage based on the AC voltages of the R phase, the S phase, and the T phase.

本発明において前記判定手段は、前記分圧手段により分圧したR相、S相、T相のうち二相以上のデューティ比が、前記基準情報が示す第一閾値より大きい時、前記交流電圧に異常があると判定してもよい。該時、電圧異常検出装置は、交流電圧の過電圧を精度良く判定できる。   In the present invention, when the duty ratio of two or more phases of the R phase, S phase, and T phase divided by the voltage dividing unit is larger than the first threshold value indicated by the reference information, the determination unit determines the AC voltage. It may be determined that there is an abnormality. At this time, the voltage abnormality detection device can accurately determine the overvoltage of the AC voltage.

本発明において、前記判定手段は、前記分圧手段により分圧したR相、S相、T相の夫々のデューティ比と、前記基準情報が示す第一閾値とを繰り返し比較し、R相、S相、T相のうち何れかの相のデューティ比が前記第一閾値より所定回数以上連続して大きい時、前記交流電圧に異常があると判定してもよい。該時、電圧異常検出装置は、交流電圧の過電圧を精度良く判定できる。   In the present invention, the determination means repeatedly compares the duty ratios of the R phase, S phase, and T phase divided by the voltage dividing means with the first threshold indicated by the reference information, When the duty ratio of any one of the phase and the T phase is continuously greater than the first threshold by a predetermined number of times, it may be determined that the AC voltage is abnormal. At this time, the voltage abnormality detection device can accurately determine the overvoltage of the AC voltage.

本発明において、前記分圧手段により分圧したR相、S相、T相の夫々の、他の二相のうち電圧が小さい相との電位差が所定電圧以上の時にパルス信号を出力するパルス出力手段を更に備え、前記判定手段は、前記分圧手段により分圧したR相、S相、T相に対応するパルス信号のうち二相以上のパルス信号を、前記パルス出力手段が所定時間以上しない時、前記交流電圧に異常があると判定してもよい。該時、電圧異常検出装置は、交流電圧の電圧低下を精度良く判定できる。   In the present invention, a pulse output that outputs a pulse signal when the potential difference between the other two phases of the R phase, S phase, and T phase divided by the voltage dividing means is greater than or equal to a predetermined voltage. And the determination means is configured to prevent the pulse output means from outputting a pulse signal of two or more phases among the pulse signals corresponding to the R phase, S phase, and T phase divided by the voltage dividing means for a predetermined time or more. It may be determined that the AC voltage is abnormal. At this time, the voltage abnormality detection device can accurately determine the voltage drop of the AC voltage.

本発明において、前記判定手段は、前記分圧手段により分圧したR相、S相、T相の夫々のデューティ比と、前記基準情報が示す第二閾値とを繰り返し比較し、R相、S相、T相のデューティ比が、前記第二閾値より所定回数以上連続して小さい時、前記交流電圧に異常があると判定してもよい。該時、電圧異常検出装置は、交流電圧の電圧低下を精度良く判定できる。   In the present invention, the determination unit repeatedly compares the duty ratios of the R phase, S phase, and T phase divided by the voltage dividing unit with the second threshold value indicated by the reference information, When the duty ratio of the phase and the T phase is continuously smaller than the second threshold by a predetermined number of times, it may be determined that the AC voltage is abnormal. At this time, the voltage abnormality detection device can accurately determine the voltage drop of the AC voltage.

本発明において、前記所定回数が、前記第一特定手段により特定した前記周波数毎に応じて相違してもよい。該時、電圧異常検出装置は、交流電圧に異常があるかの判定が終了する迄の時間を均一化できる。   In the present invention, the predetermined number of times may differ depending on the frequency specified by the first specifying means. At this time, the voltage abnormality detection device can equalize the time until the determination of whether there is an abnormality in the AC voltage is completed.

本発明において、前記判定手段による判定結果を出力する結果出力手段を更に備えてもよい。該時、電圧異常検出装置は、電圧異常の発生を外部に通知できる。   In the present invention, a result output means for outputting a determination result by the determination means may be further provided. At this time, the voltage abnormality detection device can notify the outside of the occurrence of the voltage abnormality.

数値制御装置1と工作機械2の電気的構成を示すブロック図。1 is a block diagram showing an electrical configuration of a numerical control device 1 and a machine tool 2. FIG. 電圧異常検出回路15の回路図。The circuit diagram of the voltage abnormality detection circuit 15. FIG. RST相を各基準相とした時のパルス概念図と三相入力の電圧波形図。The pulse conceptual diagram when using RST phase as each reference phase, and the voltage waveform diagram of a three-phase input. 閾値テーブル14Aを示す図。The figure which shows the threshold value table 14A. メイン処理の流れ図。The flowchart of the main process. パルス周期とパルス幅の説明図。Explanatory drawing of a pulse period and a pulse width. 第一判定処理の流れ図。The flowchart of a 1st determination process. 第二判定処理の流れ図。The flowchart of a 2nd determination process.

以下、本発明の一実施形態を図面を参照して説明する。図1に示す数値制御装置1は本発明の電圧異常検出装置の一例である。数値制御装置1は工作機械2を制御しテーブル(図示略)上面に保持したワークの切削加工を行う。   Hereinafter, an embodiment of the present invention will be described with reference to the drawings. A numerical control device 1 shown in FIG. 1 is an example of a voltage abnormality detection device of the present invention. The numerical control device 1 controls the machine tool 2 to cut a workpiece held on the upper surface of a table (not shown).

<工作機械2の概要>
図1を参照し、工作機械2の構成を簡単に説明する。工作機械2の左右方向、前後方向、上下方向は、夫々X軸方向、Y軸方向、Z軸方向である。工作機械2は図示しない主軸機構、主軸移動機構、工具交換装置等を備える。主軸機構は主軸モータ32を備え、工具を装着した主軸を回転する。主軸移動機構は、Z軸モータ31、X軸モータ33、Y軸モータ34を備え、テーブル上面に支持したワークに対し相対的に主軸をXYZの各軸方向に夫々移動する。
<Overview of machine tool 2>
The configuration of the machine tool 2 will be briefly described with reference to FIG. The left-right direction, the front-rear direction, and the vertical direction of the machine tool 2 are an X-axis direction, a Y-axis direction, and a Z-axis direction, respectively. The machine tool 2 includes a spindle mechanism, a spindle moving mechanism, a tool changer, and the like (not shown). The spindle mechanism includes a spindle motor 32 and rotates the spindle on which a tool is mounted. The main shaft moving mechanism includes a Z-axis motor 31, an X-axis motor 33, and a Y-axis motor 34, and moves the main shaft in each of the XYZ directions relative to the workpiece supported on the table upper surface.

工具交換装置はマガジンモータ35を備え、複数の工具を保持する工具マガジン(図示略)を駆動し、主軸に装着した工具を他の工具と交換する。工作機械2は操作パネル(図示略)を更に備える。操作パネルは入力装置17と表示装置18を備える。入力装置17は各種入力、設定等を行う為の機器である。表示装置18は各種表示画面、設定画面に加え、後述する通知情報等を表示する。通知情報は過電圧又は電圧低下の状態を含む。入力装置17と表示装置18は数値制御装置1の入出力部16に接続する。   The tool changer includes a magazine motor 35, drives a tool magazine (not shown) that holds a plurality of tools, and exchanges a tool mounted on the spindle with another tool. The machine tool 2 further includes an operation panel (not shown). The operation panel includes an input device 17 and a display device 18. The input device 17 is a device for performing various inputs and settings. In addition to various display screens and setting screens, the display device 18 displays notification information and the like described later. The notification information includes an overvoltage or voltage drop state. The input device 17 and the display device 18 are connected to the input / output unit 16 of the numerical controller 1.

Z軸モータ31はエンコーダ41を備える。主軸モータ32はエンコーダ42を備える。X軸モータ33はエンコーダ43を備える。Y軸モータ34はエンコーダ44を備える。マガジンモータ35はエンコーダ45を備える。エンコーダ41〜45は数値制御装置1の駆動回路21〜25に各々接続する。   The Z-axis motor 31 includes an encoder 41. The spindle motor 32 includes an encoder 42. The X-axis motor 33 includes an encoder 43. The Y-axis motor 34 includes an encoder 44. The magazine motor 35 includes an encoder 45. The encoders 41 to 45 are connected to the drive circuits 21 to 25 of the numerical controller 1, respectively.

<数値制御装置1の概要>
図1を参照し、数値制御装置1の電気的構成を説明する。数値制御装置1は、CPU11、ROM12、RAM13、不揮発性記憶装置14、電圧異常検出回路15、入出力部16、駆動回路21〜25等を備え、三相交流電源19を駆動源とする。CPU11は数値制御装置1を統括制御する。ROM12は各種プログラムを記憶する。RAM13は各種処理実行中の各種データを一時的に記憶する。不揮発性記憶装置14は作業者が入力装置17で入力して登録した複数のNCプログラムを記憶する。NCプログラムは各種制御指令を含む複数のブロックで構成し、工作機械2の軸移動、工具交換等を含む各種動作をブロック単位で制御するものである。又、不揮発性記憶装置14は後述の閾値テーブル14A(図4参照)を記憶する。
<Outline of Numerical Control Device 1>
The electrical configuration of the numerical control device 1 will be described with reference to FIG. The numerical control device 1 includes a CPU 11, a ROM 12, a RAM 13, a nonvolatile storage device 14, a voltage abnormality detection circuit 15, an input / output unit 16, drive circuits 21 to 25, and the like, and uses a three-phase AC power source 19 as a drive source. The CPU 11 performs overall control of the numerical control device 1. The ROM 12 stores various programs. The RAM 13 temporarily stores various data during execution of various processes. The non-volatile storage device 14 stores a plurality of NC programs registered by the operator using the input device 17. The NC program is composed of a plurality of blocks including various control commands, and controls various operations including axis movement of the machine tool 2, tool change, and the like in units of blocks. The nonvolatile storage device 14 stores a threshold table 14A (see FIG. 4) described later.

電圧異常検出回路15は三相交流電源19が供給する三相交流電圧の異常の有無を検出する。駆動回路21はZ軸モータ31とエンコーダ41に接続する。駆動回路22は主軸モータ32とエンコーダ42に接続する。駆動回路23はX軸モータ33とエンコーダ43に接続する。駆動回路24はY軸モータ34とエンコーダ44に接続する。駆動回路25はマガジンモータ35とエンコーダ45に接続する。駆動回路21〜25はCPU11から指令信号を受け、対応する各モータ31〜35に駆動電流を夫々出力する。駆動回路21〜25はエンコーダ41〜45からフィードバック信号を受け、位置と速度のフィードバック制御を行う。入出力部16は入力装置17と表示装置18に夫々接続する。   The voltage abnormality detection circuit 15 detects the presence or absence of abnormality in the three-phase AC voltage supplied from the three-phase AC power source 19. The drive circuit 21 is connected to the Z-axis motor 31 and the encoder 41. The drive circuit 22 is connected to the spindle motor 32 and the encoder 42. The drive circuit 23 is connected to the X-axis motor 33 and the encoder 43. The drive circuit 24 is connected to the Y-axis motor 34 and the encoder 44. The drive circuit 25 is connected to the magazine motor 35 and the encoder 45. The drive circuits 21 to 25 receive command signals from the CPU 11 and output drive currents to the corresponding motors 31 to 35, respectively. The drive circuits 21 to 25 receive feedback signals from the encoders 41 to 45 and perform feedback control of position and speed. The input / output unit 16 is connected to the input device 17 and the display device 18, respectively.

使用者は複数のNCプログラムの中から一のNCプログラムを入力装置17で選択可能である。CPU11は選択したNCプログラムを表示装置18に表示する。CPU11は表示装置18に表示したNCプログラムに基づき、工作機械2の動作を制御する。   The user can select one NC program from among a plurality of NC programs with the input device 17. The CPU 11 displays the selected NC program on the display device 18. The CPU 11 controls the operation of the machine tool 2 based on the NC program displayed on the display device 18.

図2を参照し、三相交流電源19を説明する。三相交流電源19は電流又は電圧の位相を互いにずらした三系統の単相交流を組み合わせた交流電源であり、例えば200Vの交流電圧を供給する。第一相はR相、第二相はS相、第三相はT相である。図2に示す三相交流電源19はΔ結線(デルタ結線)である。Δ結線は三相各相を相電圧が加わる向きに接続し閉回路とする結線である。三相交流電源19はΔ結線の他にY結線又はV結線でもよい。   The three-phase AC power source 19 will be described with reference to FIG. The three-phase AC power source 19 is an AC power source combining three systems of single-phase AC with the current or voltage phases shifted from each other, and supplies an AC voltage of 200 V, for example. The first phase is the R phase, the second phase is the S phase, and the third phase is the T phase. The three-phase AC power source 19 shown in FIG. 2 has a Δ connection (delta connection). The Δ connection is a connection in which the three phases are connected in the direction in which the phase voltage is applied to form a closed circuit. The three-phase AC power source 19 may be a Y connection or a V connection in addition to the Δ connection.

<電圧異常検出回路15>
図2を参照し、電圧異常検出回路15の構成を説明する。電圧異常検出回路15は三相交流電源19が供給する交流電圧の異常を検出する。電圧異常検出回路15は、R相基準回路51、S相基準回路52、T相基準回路53、FPGA55を備える(以下総称する場合は基準回路51〜53と称す)。
<Voltage abnormality detection circuit 15>
The configuration of the voltage abnormality detection circuit 15 will be described with reference to FIG. The voltage abnormality detection circuit 15 detects an abnormality in the AC voltage supplied from the three-phase AC power source 19. The voltage abnormality detection circuit 15 includes an R-phase reference circuit 51, an S-phase reference circuit 52, a T-phase reference circuit 53, and an FPGA 55 (hereinafter collectively referred to as reference circuits 51 to 53).

R相基準回路51は、三相交流電源19が出力する三相交流電圧を分圧し、R相を基準として、他のS相とT相のうち低い方との電位差が所定電圧以上になった時にパルスを出力する。S相基準回路52は、三相交流電源19が出力する三相交流電圧を分圧し、S相を基準として、他のR相とT相のうち低い方との電位差が所定電圧以上になった時にパルスを出力する。T相基準回路53は、三相交流電源19が出力する三相交流電圧を分圧し、T相を基準として、他のR相とS相のうち低い方との電位差が所定電圧以上になった時にパルスを出力する。FPGA55は、後述するメイン処理(図5参照)を実行する。メイン処理は基準回路51〜53が出力したパルスを解析し、電圧異常の発生の有無を判定する。   The R-phase reference circuit 51 divides the three-phase AC voltage output from the three-phase AC power source 19, and the potential difference between the other S phase and the lower one of the T phases becomes a predetermined voltage or more with the R phase as a reference. Sometimes outputs a pulse. The S-phase reference circuit 52 divides the three-phase AC voltage output from the three-phase AC power source 19, and the potential difference between the other R phase and the lower one of the T phases becomes a predetermined voltage or more with the S phase as a reference. Sometimes outputs a pulse. The T-phase reference circuit 53 divides the three-phase AC voltage output from the three-phase AC power supply 19, and the potential difference between the other R phase and the lower one of the S phases becomes a predetermined voltage or more with the T phase as a reference. Sometimes outputs a pulse. The FPGA 55 executes main processing (see FIG. 5) described later. The main process analyzes the pulse output from the reference circuits 51 to 53 and determines whether or not a voltage abnormality has occurred.

図2を参照し、R相基準回路51の構成を説明する。R相基準回路51は、抵抗61,62、シャントレギュレータ63、フォトカプラ64、バイパスコンデンサ65等を備える。抵抗61,62は、三相交流電源19が出力する三相交流電圧をR相、S相、T相に夫々分圧する。バイパスコンデンサ65は、抵抗62に対して並列に接続する。バイパスコンデンサ65は、分圧したR相の電圧の信号線に接続し、R相の電圧の変動を抑制する。シャントレギュレータ63は、R相基準で他のS相とT相のうち低い方との電位差が所定電圧以上になるとONする。シャントレギュレータ63がONすると、フォトカプラ64は点灯し且つパルスをFPGA55に出力する。シャントレギュレータ63はR相基準で他のS相とT相のうち低い方との電位差が所定電圧未満になるとOFFする。シャントレギュレータ63がOFFすると、フォトカプラ64は消灯する。   The configuration of the R-phase reference circuit 51 will be described with reference to FIG. The R-phase reference circuit 51 includes resistors 61 and 62, a shunt regulator 63, a photocoupler 64, a bypass capacitor 65, and the like. The resistors 61 and 62 divide the three-phase AC voltage output from the three-phase AC power source 19 into an R phase, an S phase, and a T phase, respectively. The bypass capacitor 65 is connected in parallel with the resistor 62. The bypass capacitor 65 is connected to the divided R-phase voltage signal line to suppress fluctuations in the R-phase voltage. The shunt regulator 63 is turned on when the potential difference between the other S phase and the lower one of the T phases on the R phase basis becomes a predetermined voltage or more. When the shunt regulator 63 is turned on, the photocoupler 64 lights up and outputs a pulse to the FPGA 55. The shunt regulator 63 is turned off when the potential difference between the other S phase and the lower T phase is less than a predetermined voltage on the R phase basis. When the shunt regulator 63 is turned off, the photocoupler 64 is turned off.

S相基準回路52は、抵抗71,72、シャントレギュレータ73、フォトカプラ74、バイパスコンデンサ75等を備える。抵抗71,72は、三相交流電源19が出力する三相交流電圧をR相、S相、T相に夫々分圧する。バイパスコンデンサ75は、抵抗72に対して並列に接続する。バイパスコンデンサ75は、分圧したS相の電圧の信号線に接続し、S相の電圧の変動を抑制する。シャントレギュレータ73は、S相基準で他のR相とT相のうち低い方との電位差が所定電圧以上になるとONする。シャントレギュレータ73がONすると、フォトカプラ74は点灯し且つパルスをFPGA55に出力する。シャントレギュレータ73は、S相基準で他のR相とT相のうち低い方との電位差が所定電圧未満になるとOFFする。シャントレギュレータ73がOFFすると、フォトカプラ74は消灯する。   The S-phase reference circuit 52 includes resistors 71 and 72, a shunt regulator 73, a photocoupler 74, a bypass capacitor 75, and the like. The resistors 71 and 72 divide the three-phase AC voltage output from the three-phase AC power source 19 into an R phase, an S phase, and a T phase, respectively. The bypass capacitor 75 is connected in parallel with the resistor 72. The bypass capacitor 75 is connected to the divided S-phase voltage signal line and suppresses fluctuations in the S-phase voltage. The shunt regulator 73 is turned on when the potential difference between the other R phase and the lower one of the T phases on the S phase basis becomes a predetermined voltage or more. When the shunt regulator 73 is turned on, the photocoupler 74 is lit and outputs a pulse to the FPGA 55. The shunt regulator 73 is turned off when the potential difference between the other R phase and the lower one of the T phases is less than a predetermined voltage based on the S phase. When the shunt regulator 73 is turned off, the photocoupler 74 is turned off.

T相基準回路53は、抵抗81,82、シャントレギュレータ83、フォトカプラ84、バイパスコンデンサ85等を備える。抵抗81,82は、三相交流電源19が出力する三相交流電圧をR相、S相、T相に夫々分圧する。バイパスコンデンサ85は、抵抗82に対して並列に接続する。バイパスコンデンサ85は、分圧したT相の電圧の信号線に接続し、T相の電圧の変動を抑制する。シャントレギュレータ83は、T相基準で他のR相とS相のうち低い方との電位差が所定電圧以上になるとONする。シャントレギュレータ83がONすると、フォトカプラ84は点灯し且つパルスをFPGA55に出力する。シャントレギュレータ83は、T相基準で他のR相とS相のうち低い方との電位差が所定電圧未満になるとOFFする。シャントレギュレータ83がOFFすると、フォトカプラ84は消灯する。   The T-phase reference circuit 53 includes resistors 81 and 82, a shunt regulator 83, a photocoupler 84, a bypass capacitor 85, and the like. The resistors 81 and 82 divide the three-phase AC voltage output from the three-phase AC power source 19 into an R phase, an S phase, and a T phase, respectively. The bypass capacitor 85 is connected in parallel with the resistor 82. The bypass capacitor 85 is connected to the divided T-phase voltage signal line to suppress fluctuations in the T-phase voltage. The shunt regulator 83 is turned on when the potential difference between the other R phase and the lower one of the S phases is equal to or higher than a predetermined voltage on the T phase basis. When the shunt regulator 83 is turned on, the photocoupler 84 is turned on and a pulse is output to the FPGA 55. The shunt regulator 83 is turned off when the potential difference between the other R phase and the lower one of the S phases is less than a predetermined voltage on the T phase basis. When the shunt regulator 83 is turned off, the photocoupler 84 is turned off.

図2,図3を参照し、R相基準回路51の作用を説明する。図3の最下段の波形は、RSTの三相を入力した電圧曲線である。各電圧曲線は何れもsinカーブであって120度ずつ位相がずれている。図3の上側三つの波形は、上から順にR相基準、S相基準、T相基準とした場合の各パルス波形の概念図である。各概念図は説明が分かり易いように、電位差が所定電圧以上(例えば152.5V以上)のパルス波形を示す。電位差が所定電圧未満の場合、パルス電圧は零とする。   The operation of the R-phase reference circuit 51 will be described with reference to FIGS. The waveform at the bottom of FIG. 3 is a voltage curve in which three phases of RST are input. Each voltage curve is a sin curve, and the phase is shifted by 120 degrees. The upper three waveforms in FIG. 3 are conceptual diagrams of each pulse waveform when the R phase reference, the S phase reference, and the T phase reference are set in order from the top. Each conceptual diagram shows a pulse waveform having a potential difference of a predetermined voltage or more (for example, 152.5 V or more) for easy understanding. When the potential difference is less than a predetermined voltage, the pulse voltage is zero.

上述の通り、R相基準回路51は、R相基準で、他のS相とT相のうち低い方とR相との電位差が所定電圧以上になった時にパルスを出力する。例えば図3に示す二点鎖線で囲んだ枠内に着目して説明する。t1では、S相の方がT相より電圧が低く、R相とS相の電位差は同じである。S相の方がT相より電圧が低い場合、図2に示すように、R相基準回路51では点線の矢印Aの方向に電圧がかかる。t1を過ぎると、R相とS相との間に電位差が徐々に生じ、t2で所定電圧以上に達する。シャントレギュレータ63はONする。シャントレギュレータ63のK端子(カソード端子)とA端子(アノード端子)との間に電流が流れる。フォトカプラ64は点灯し、FPGA55にパルスを出力する。パルスはt2から上昇して一定値に達する。R相とS相の電位差は徐々に小さくなる。   As described above, the R-phase reference circuit 51 outputs a pulse when the potential difference between the lower of the other S-phase and T-phase and the R-phase is equal to or higher than a predetermined voltage on the R-phase basis. For example, the description will be made by paying attention to a frame surrounded by a two-dot chain line shown in FIG. At t1, the voltage of the S phase is lower than that of the T phase, and the potential difference between the R phase and the S phase is the same. When the voltage in the S phase is lower than that in the T phase, the voltage is applied in the direction of the dotted arrow A in the R phase reference circuit 51 as shown in FIG. After t1, a potential difference is gradually generated between the R phase and the S phase, and reaches a predetermined voltage or more at t2. The shunt regulator 63 is turned on. A current flows between the K terminal (cathode terminal) and the A terminal (anode terminal) of the shunt regulator 63. The photocoupler 64 is lit and outputs a pulse to the FPGA 55. The pulse rises from t2 and reaches a certain value. The potential difference between the R phase and the S phase gradually decreases.

t3でS相とT相は逆転する。パルスはt3で少し低下する。t3を過ぎると、T相の方がS相より電圧が低くなるので、図2に示すように、R相基準回路51では二点鎖線の矢印Bの方向に電圧がかかる。t3を過ぎると、R相とT相との間に所定電圧以上の電位差が生じるので、パルスは再上昇して一定値に達する。R相とT相の電位差は徐々に小さくなり、t4で所定電圧未満となる。シャントレギュレータ63はOFFする。フォトカプラ64は消灯する。パルスはt4で零となる。R相基準回路51が出力するパルスはt2〜t4までの波形を一定周期毎に繰り返す。   At t3, the S phase and the T phase are reversed. The pulse drops slightly at t3. After t3, the voltage in the T phase is lower than that in the S phase, so that the voltage is applied in the direction of the two-dot chain line arrow B in the R phase reference circuit 51 as shown in FIG. After t3, a potential difference of a predetermined voltage or more is generated between the R phase and the T phase, so that the pulse rises again and reaches a constant value. The potential difference between the R phase and the T phase gradually decreases and becomes less than a predetermined voltage at t4. The shunt regulator 63 is turned off. The photocoupler 64 is turned off. The pulse becomes zero at t4. The pulse output from the R-phase reference circuit 51 repeats the waveform from t2 to t4 at regular intervals.

S相基準回路52とT相基準回路53はR相基準回路51と同様に動作する。図3に示すように、S相とT相の各パルス波形は、R相のパルス波形に対して位相がずれている。R相のパルス、S相のパルス、T相のパルスは、RSTの相順でFPGA55に各々出力する。FPGA55は、基準回路51〜53が出力した各パルスに基づいてメイン処理を実行する。   The S phase reference circuit 52 and the T phase reference circuit 53 operate in the same manner as the R phase reference circuit 51. As shown in FIG. 3, the S-phase and T-phase pulse waveforms are out of phase with the R-phase pulse waveform. The R-phase pulse, S-phase pulse, and T-phase pulse are each output to the FPGA 55 in the RST phase order. The FPGA 55 executes main processing based on each pulse output from the reference circuits 51 to 53.

<閾値テーブル14A>
図4は、不揮発性記憶装置14に記憶した閾値テーブル14Aを示す。閾値テーブル14Aは、後述のメイン処理で過電圧を検出する為の第一閾値と、後述のメイン処理で電圧低下を検出する為の第二閾値を格納する。第一閾値と第二閾値は、複数の周波数範囲の夫々に対応づけてある。複数の周波数範囲は、三相交流電源19の基準電圧である50Hz又は60Hzを含む範囲(図中太線枠)を基準とし、夫々5Hz毎の範囲を規定する。
<Threshold table 14A>
FIG. 4 shows the threshold table 14 </ b> A stored in the nonvolatile storage device 14. The threshold value table 14A stores a first threshold value for detecting an overvoltage in a main process described later and a second threshold value for detecting a voltage drop in a main process described later. The first threshold value and the second threshold value are associated with each of a plurality of frequency ranges. The plurality of frequency ranges are based on a range including 50 Hz or 60 Hz, which is the reference voltage of the three-phase AC power supply 19, (thick line frame in the figure), and each frequency range is defined by 5 Hz.

更に、第一閾値と第二閾値は、バイパスコンデンサ65、75、85(図2参照)のパラメータに応じた条件(第一条件〜第三条件、以下、「回路条件」と称す)の夫々に対応付けてある。回路条件は例えば、バイパスコンデンサ65、75、85の周波数特性(カットオフ周波数)等である。以下、第i条件(iは1〜3の何れか)に対応する第一閾値と第二閾値を夫々、「第一閾値(i)」「第二閾値(i)」と称す。   Further, the first threshold value and the second threshold value are set according to conditions (first condition to third condition, hereinafter referred to as “circuit conditions”) according to the parameters of the bypass capacitors 65, 75, and 85 (see FIG. 2). It is associated. The circuit conditions are, for example, frequency characteristics (cut-off frequency) of the bypass capacitors 65, 75, and 85. Hereinafter, the first threshold value and the second threshold value corresponding to the i-th condition (i is any one of 1 to 3) are referred to as “first threshold value (i)” and “second threshold value (i)”, respectively.

<メイン処理>
図5を参照し、メイン処理を説明する。メイン処理はFPGA55が実行する。FPGA55は、第一閾値と第二閾値を決定する為の回路条件(第i条件)を特定可能な指示を受け付ける(S11)。例えばFPGA55は、入力装置17を介して回路条件を直接的に受け付けてもよい。又例えばFPGA55は、非図示の設定スイッチ(ディップスイッチ等)の設定情報を受け付けることで、回路条件を間接的に受け付けてもよい。FPGA55は、設定スイッチの設定情報を、回路条件を特定可能な指示として受け付け、回路条件を特定してもよい。FPGA55は、受け付けた回路条件に対応する第一閾値(i)と第二閾値(i)を、閾値テーブル14Aに基づいて決定する(S11)。
<Main processing>
The main process will be described with reference to FIG. The main process is executed by the FPGA 55. The FPGA 55 receives an instruction that can specify a circuit condition (i-th condition) for determining the first threshold value and the second threshold value (S11). For example, the FPGA 55 may accept the circuit conditions directly via the input device 17. Further, for example, the FPGA 55 may receive circuit conditions indirectly by receiving setting information of a setting switch (not shown) (such as a dip switch). The FPGA 55 may receive the setting information of the setting switch as an instruction that can specify the circuit condition, and specify the circuit condition. The FPGA 55 determines the first threshold value (i) and the second threshold value (i) corresponding to the received circuit condition based on the threshold value table 14A (S11).

FPGA55は、RST相のパルス情報を受信する(S13)。パルス情報は、R相基準回路51、S相基準回路52、T相基準回路53が夫々出力するパルスの情報である。次に、FPGA55は、パルス情報に基づきパルス幅とパルス周期を相毎に測定する(S15)。図6に示すように、パルスは一定周期毎に繰り返す。t7はパルスが基準電圧から立ち上がる時間である。基準電圧は例えば152.5Vの一定電圧である。t8はパルスが最高電圧に達した時間である。t9はパルスが最高電圧から下がり始める時間である。t10はパルスが基準電圧まで下がった時間である。t11は次のパルスが基準電圧から立ち上がる時間である。パルス幅はt7〜t10までの時間である。パルス周期はt7〜t11までの時間である。なおパルス幅はt8〜t9までの時間としてもよい。   The FPGA 55 receives the RST phase pulse information (S13). The pulse information is information on pulses output from the R-phase reference circuit 51, the S-phase reference circuit 52, and the T-phase reference circuit 53, respectively. Next, the FPGA 55 measures the pulse width and the pulse period for each phase based on the pulse information (S15). As shown in FIG. 6, the pulse repeats at regular intervals. t7 is the time for the pulse to rise from the reference voltage. The reference voltage is a constant voltage of 152.5V, for example. t8 is the time when the pulse reaches the maximum voltage. t9 is the time when the pulse starts to drop from the maximum voltage. t10 is the time when the pulse drops to the reference voltage. t11 is the time when the next pulse rises from the reference voltage. The pulse width is the time from t7 to t10. The pulse period is the time from t7 to t11. The pulse width may be a time from t8 to t9.

図5に示すように、FPGA55は、相毎に測定したパルス周期に基づき、三相交流電源19の周波数を相毎に算出する(S17)。FPGA55は、閾値テーブル14Aの複数の周波数範囲のうち算出した周波数を含む周波数範囲を、相毎に特定する。FPGA55は、S11により決定した第一閾値(i)と第二閾値(i)のうち、特定した周波数範囲に対応する第一閾値(i)(「第一閾値Th1」と称す)と第二閾値(i)(「第二閾値Th2」と称す)を、相毎に特定する(S19)。FPGA55は、RSTの各相について、パルス周期に対するパルス幅の割合をデューティ比として算出する(S21)。   As shown in FIG. 5, the FPGA 55 calculates the frequency of the three-phase AC power source 19 for each phase based on the pulse period measured for each phase (S17). The FPGA 55 specifies, for each phase, a frequency range including the calculated frequency among the plurality of frequency ranges in the threshold table 14A. The FPGA 55 includes a first threshold value (i) (referred to as “first threshold value Th1”) and a second threshold value corresponding to the specified frequency range among the first threshold value (i) and the second threshold value (i) determined in S11. (I) (referred to as “second threshold Th2”) is specified for each phase (S19). The FPGA 55 calculates the ratio of the pulse width to the pulse period as the duty ratio for each phase of RST (S21).

FPGA55は、過電圧発生の有無を判定する為に第一判定処理(図7参照)を実行する(S23)。図7を参照し、第一判定処理を説明する。FPGA55は、二相以上のデューティ比が第一閾値Th1より大きいか判定する(S41)。FPGA55は、二相以上のデューティ比が第一閾値Th1より大きいと判定した時(S41:YES)、交流電圧に過電圧が発生したと判定する(S45)。FPGA55は、第一判定処理を終了し、処理をメイン処理(図5参照)に戻す。FPGA55は、二相以上のデューティ比が第一閾値より大きくないと判定した時(S41:NO)、処理をS43に進める。FPGA55は、三相のうち何れかの相のデューティ比が三回連続して第一閾値Th1より大きくなったか判定する(S43)。FPGA55は、三相のうち何れかの相のデューティ比が三回連続して第一閾値Th1より大きくなっていないと判定した時(S43:NO)、第一判定処理を終了し、処理をメイン処理(図5参照)に戻す。   The FPGA 55 executes a first determination process (see FIG. 7) to determine whether or not an overvoltage has occurred (S23). The first determination process will be described with reference to FIG. The FPGA 55 determines whether the duty ratio of two or more phases is greater than the first threshold Th1 (S41). When the FPGA 55 determines that the duty ratio of two or more phases is greater than the first threshold Th1 (S41: YES), the FPGA 55 determines that an overvoltage has occurred in the AC voltage (S45). The FPGA 55 ends the first determination process and returns the process to the main process (see FIG. 5). When the FPGA 55 determines that the duty ratio of two or more phases is not greater than the first threshold value (S41: NO), the process proceeds to S43. The FPGA 55 determines whether the duty ratio of any one of the three phases is greater than the first threshold value Th1 for three consecutive times (S43). When the FPGA 55 determines that the duty ratio of any one of the three phases is not continuously greater than the first threshold value Th1 (S43: NO), the FPGA 55 ends the first determination process, and the main process is performed. Return to processing (see FIG. 5).

図5に示すように、FPGA55は、第一判定処理(S23)の終了後、電圧低下発生の有無を判定する為に第二判定処理(図8参照)を実行する(S25)。図8を参照し、第二判定処理を説明する。FPGA55は、基準回路51〜53のうち二相以上の基準回路が50ms以上継続してパルスを出力していないか判定する(S61)。FPGA55は、二相以上の基準回路が50ms以上継続してパルスを出力していないと判定した時(S61:YES)、交流電圧に電圧低下が発生したと判定する(S71)。FPGA55は、第二判定処理を終了し、処理をメイン処理(図5参照)に戻す。FPGA55は、二相以上の基準回路が50ms以内にパルスを出力したと判定した時(S61:NO)、処理をS63に進める。   As shown in FIG. 5, the FPGA 55 executes a second determination process (see FIG. 8) in order to determine whether or not a voltage drop has occurred after the first determination process (S23) is completed (S25). The second determination process will be described with reference to FIG. The FPGA 55 determines whether a reference circuit of two or more phases among the reference circuits 51 to 53 continues to output a pulse for 50 ms or more (S61). The FPGA 55 determines that a voltage drop has occurred in the AC voltage (S71) when it is determined that the reference circuit of two or more phases continues to output no pulse for 50 ms or longer (S61: YES). The FPGA 55 ends the second determination process and returns the process to the main process (see FIG. 5). When the FPGA 55 determines that the reference circuit of two or more phases has output a pulse within 50 ms (S61: NO), the FPGA 55 advances the process to S63.

FPGA55は、S17(図6参照)の処理により算出した各相の周波数が、60Hzより50Hzに近いか判定する(S63)。FPGA55は、50Hzに近いと判定した時(S63:YES)、処理をS65に進める。FPGA55は、三相の全てのデューティ比が三回連続して第二閾値Th2より小さくなったか判定する(S65)。FPGA55は、三相の全てのデューティ比が三回連続して第二閾値Th2より小さくなっていないと判定した時(S65:NO)、第二判定処理を終了し、処理をメイン処理(図5参照)に戻す。   The FPGA 55 determines whether the frequency of each phase calculated by the process of S17 (see FIG. 6) is closer to 50 Hz than 60 Hz (S63). When the FPGA 55 determines that the frequency is close to 50 Hz (S63: YES), the process proceeds to S65. The FPGA 55 determines whether all the duty ratios of the three phases have become smaller than the second threshold value Th2 continuously three times (S65). When the FPGA 55 determines that all the three-phase duty ratios are not continuously smaller than the second threshold Th2 three times (S65: NO), the FPGA 55 ends the second determination process, and the process is the main process (FIG. 5). Return to).

一方、FPGA55は、各相の周波数が50Hzより60Hzに近いと判定した時(S63:NO)、処理をS67に進める。FPGA55は、三相の全てのデューティ比が四回連続して第二閾値Th2より小さくなったか判定する(S67)。FPGA55は、三相の全てのデューティ比が四回連続して第二閾値Th2より小さくなっていないと判定した時(S67:NO)、第二判定処理を終了し、処理をメイン処理(図5参照)に戻す。   On the other hand, when the FPGA 55 determines that the frequency of each phase is closer to 60 Hz than 50 Hz (S63: NO), the process proceeds to S67. The FPGA 55 determines whether all the duty ratios of the three phases have become smaller than the second threshold Th2 continuously four times (S67). When the FPGA 55 determines that all three-phase duty ratios are not continuously smaller than the second threshold Th2 four times (S67: NO), the FPGA 55 ends the second determination process, and the process is the main process (FIG. 5). Return to).

図5に示すように、FPGA55は、第二判定処理(S25)の終了後、第一判定処理(S23)及び第二判定処理(S25)により、交流電圧に過電圧と電圧低下との少なくとも一方が発生したか判定する(S27)。FPGA55は、交流電圧に過電圧と電圧低下が何れも発生していないと判定した時(S27:NO)、処理をS13に戻す。FPGA55は、S13〜S25の処理を繰り返す。   As shown in FIG. 5, after the second determination process (S25) is completed, the FPGA 55 determines that at least one of the overvoltage and the voltage drop is included in the AC voltage by the first determination process (S23) and the second determination process (S25). It is determined whether it has occurred (S27). When the FPGA 55 determines that neither an overvoltage nor a voltage drop has occurred in the AC voltage (S27: NO), the FPGA 55 returns the process to S13. The FPGA 55 repeats the processes of S13 to S25.

FPGA55は、図7に示す第一判定処理(S23)を繰り返し、三相のうち何れかの相のデューティ比が三回連続して第一閾値Th1より大きくなったと判定した時(S43:YES)、交流電圧に過電圧が発生したと判定する(S45)。FPGA55は、第一判定処理を終了し、処理をメイン処理(図5参照)に戻す。   When the FPGA 55 repeats the first determination process (S23) shown in FIG. 7 and determines that the duty ratio of any one of the three phases is continuously greater than the first threshold value Th1 (S43: YES). Then, it is determined that an overvoltage has occurred in the AC voltage (S45). The FPGA 55 ends the first determination process and returns the process to the main process (see FIG. 5).

FPGA55は、図8に示す第二判定処理(S25)を繰り返し、S17(図6参照)の処理により算出した周波数が60Hzより50Hzに近く(S63:YES)、且つ三相の全てのデューティ比が三回連続して第二閾値Th2より小さくなったと判定した時(S65:YES)、交流電圧に電圧低下が発生したと判定する(S71)。FPGA55は、第二判定処理を終了し、処理をメイン処理(図5参照)に戻す。又、FPGA55は、S17の処理により算出した周波数が50Hzより60Hzに近く(S63:NO)、且つ三相の全てのデューティ比が四回連続して第二閾値Th2より小さくなったと判定した時(S67:YES)、交流電圧に電圧低下が発生したと判定する(S71)。FPGA55は、第二判定処理を終了し、処理をメイン処理(図5参照)に戻す。   The FPGA 55 repeats the second determination process (S25) shown in FIG. 8, the frequency calculated by the process of S17 (see FIG. 6) is closer to 50 Hz than 60 Hz (S63: YES), and all three-phase duty ratios are When it is determined that the voltage is smaller than the second threshold value Th2 for three consecutive times (S65: YES), it is determined that a voltage drop has occurred in the AC voltage (S71). The FPGA 55 ends the second determination process and returns the process to the main process (see FIG. 5). Further, the FPGA 55 determines that the frequency calculated by the process of S17 is closer to 60 Hz than 50 Hz (S63: NO), and that all three-phase duty ratios are continuously smaller than the second threshold Th2 four times ( S67: YES), it is determined that a voltage drop has occurred in the AC voltage (S71). The FPGA 55 ends the second determination process and returns the process to the main process (see FIG. 5).

図5に示すように、FPGA55は、第一判定処理(S23)及び第二判定処理(S25)により、交流電圧に過電圧と電圧低下との少なくとも一方が発生したと判定した時(S27:YES)、処理をS29に進める。FPGA55は、判定結果をCPU11に出力する(S29)。CPU11は出力した判定結果に基づき、過電圧、電圧低下の発生を通知する通知情報を表示装置18に表示する。FPGA55は、メイン処理を終了する。   As shown in FIG. 5, when the FPGA 55 determines that at least one of an overvoltage and a voltage drop has occurred in the AC voltage through the first determination process (S23) and the second determination process (S25) (S27: YES). The process proceeds to S29. The FPGA 55 outputs the determination result to the CPU 11 (S29). The CPU 11 displays notification information for notifying the occurrence of overvoltage and voltage drop on the display device 18 based on the output determination result. The FPGA 55 ends the main process.

<本実施形態の作用、効果>
電圧異常検出回路15は、三相交流電源19の各相の電圧の信号線に設けた抵抗62、72、82に並列に接続するバイパスコンデンサ65、75、85を有する。数値制御装置1の不揮発性記憶装置14は、バイパスコンデンサ65、75、85の回路条件(第i条件)毎の第一閾値(i)と第二閾値(i)を、複数の周波数範囲に対応付けて格納した閾値テーブル14Aを記憶する。数値制御装置1は、回路条件を直接的又は間接的に受け付け、受け付けた回路条件に対応する第一閾値(i)と第二閾値(i)を、閾値テーブル14Aに基づいて決定する(S11)。数値制御装置1は、三相交流電圧の各相(R相、S相、T相)の周波数を特定し(S17)、対応する第一閾値Th1と第二閾値Th2を、閾値テーブル14Aに基づいて特定する(S19)。数値制御装置1は、特定した第一閾値Th1と第二閾値Th2と、三相交流電圧のデューティ比との関係に応じ、三相交流電圧に過電圧と電圧低下が生じているか判定する(S23、S25)。該時、数値制御装置1は、バイパスコンデンサ65、75、85の回路条件に応じて三相交流電圧の周波数が変動する時も、変動した周波数に対応する第一閾値Th1と第二閾値Th2に基づいて、三相交流電圧に異常があるかを判定できる。故に、数値制御装置1は、三相交流電圧に異常があるかを精度良く検出できる。
<Operation and effect of this embodiment>
The voltage abnormality detection circuit 15 includes bypass capacitors 65, 75, 85 connected in parallel to resistors 62, 72, 82 provided on the voltage signal lines of each phase of the three-phase AC power supply 19. The nonvolatile memory device 14 of the numerical controller 1 corresponds to the first threshold value (i) and the second threshold value (i) for each circuit condition (i-th condition) of the bypass capacitors 65, 75, and 85 in a plurality of frequency ranges. The threshold value table 14A stored with this information is stored. The numerical controller 1 accepts the circuit condition directly or indirectly, and determines the first threshold value (i) and the second threshold value (i) corresponding to the accepted circuit condition based on the threshold value table 14A (S11). . The numerical control device 1 specifies the frequency of each phase (R phase, S phase, T phase) of the three-phase AC voltage (S17), and the corresponding first threshold value Th1 and second threshold value Th2 are based on the threshold value table 14A. (S19). The numerical controller 1 determines whether an overvoltage and a voltage drop have occurred in the three-phase AC voltage according to the relationship between the specified first threshold Th1 and second threshold Th2 and the duty ratio of the three-phase AC voltage (S23, S25). At this time, when the frequency of the three-phase AC voltage varies according to the circuit conditions of the bypass capacitors 65, 75, and 85, the numerical controller 1 sets the first threshold Th1 and the second threshold Th2 corresponding to the varied frequencies. Based on this, it can be determined whether the three-phase AC voltage is abnormal. Therefore, the numerical controller 1 can accurately detect whether the three-phase AC voltage is abnormal.

三相交流電源19は三相(R相、S相、T相)の交流電源である。基準回路51〜53は、三相交流電圧をR相、S相、T相に分圧する。故に、数値制御装置1は、三相交流電源19の電圧に異常があるかを、各相の電圧に基づいて精度良く判定できる。   The three-phase AC power source 19 is a three-phase (R phase, S phase, T phase) AC power source. Reference circuits 51 to 53 divide the three-phase AC voltage into an R phase, an S phase, and a T phase. Therefore, the numerical controller 1 can accurately determine whether there is an abnormality in the voltage of the three-phase AC power supply 19 based on the voltage of each phase.

数値制御装置1は、基準回路51〜53により分圧したR相、S相、T相のうち二相以上のデューティ比が第一閾値Th1より大きい時(S41:YES)、交流電圧に過電圧が発生したと判定する(S45)。該時、数値制御装置1は、交流電圧の過電圧を精度良く判定できる。数値制御装置1は、三相のうち二相以上のデューティ比が第一閾値Th1より大きくない時(S41:NO)、且つ、三相のうち何れかの相のデューティ比が第一閾値Th1より三回以上連続して大きい時(S43:YES)、交流電圧に過電圧が発生したと判定する(S45)。該時、数値制御装置1は、交流電圧の過電圧を更に精度良く判定できる。   When the duty ratio of two or more of the R phase, S phase, and T phase divided by the reference circuits 51 to 53 is greater than the first threshold Th1 (S41: YES), the numerical controller 1 has an overvoltage in the AC voltage. It is determined that it has occurred (S45). At this time, the numerical controller 1 can accurately determine the overvoltage of the AC voltage. When the duty ratio of two or more of the three phases is not greater than the first threshold Th1 (S41: NO), the numerical control device 1 has a duty ratio of any of the three phases greater than the first threshold Th1. When it is continuously greater than three times (S43: YES), it is determined that an overvoltage has occurred in the AC voltage (S45). At this time, the numerical controller 1 can determine the overvoltage of the AC voltage with higher accuracy.

基準回路51〜53は、分圧したR相、S相、T相の夫々の、他の二相のうち電圧が小さい相との電位差が所定電圧以上の時、パルス信号を出力する。数値制御装置1は、三相に対応するパルス信号のうち二相以上のパルス信号が基準回路51〜53から50ms以上送信しない時(S61:YES)、交流電圧に電圧低下が発生したと判定する(S71)。該時、数値制御装置1は、交流電圧の電圧低下を精度良く判定できる。数値制御装置1は二相以上の基準回路が50ms以内にパルスを出力したと判定した時(S61:NO)、且つ、三相のデューティ比が第二閾値Th2より所定回数(三回又は四回)以上連続して小さい時(S65:YES、S67:YES)、交流電圧に電圧低下が発生したと判定する(S71)。該時、数値制御装置1は、交流電圧の電圧低下を更に精度良く判定できる。   The reference circuits 51 to 53 output a pulse signal when the potential difference between the divided R-phase, S-phase, and T-phase and the other two phases with a smaller voltage is equal to or higher than a predetermined voltage. The numerical controller 1 determines that a voltage drop has occurred in the AC voltage when a pulse signal of two or more phases among pulse signals corresponding to three phases is not transmitted from the reference circuits 51 to 53 for 50 ms or more (S61: YES). (S71). At this time, the numerical controller 1 can accurately determine the voltage drop of the AC voltage. When the numerical controller 1 determines that the reference circuit of two or more phases has output a pulse within 50 ms (S61: NO), and the three-phase duty ratio is a predetermined number of times (three or four times) from the second threshold Th2. ) When continuously small (S65: YES, S67: YES), it is determined that a voltage drop has occurred in the AC voltage (S71). At this time, the numerical controller 1 can determine the voltage drop of the AC voltage with higher accuracy.

数値制御装置1は、交流電圧の各相の周波数が60Hzよりも50Hzに近い時(S63:YES)、且つ三相の全てのデューティ比が三回連続して第二閾値Th2より小さい時(S65:YES)、交流電圧に異常があると判定する(S71)。数値制御装置1は交流電圧の各相の周波数が50Hzより60Hzに近い時(S63:NO)、且つ三相の全てのデューティ比が四回連続して第二閾値Th2より小さい時(S67:YES)、交流電圧に異常があると判定する(S71)。つまり、数値制御装置1は、交流電圧の各相の周波数が相対的に大きい程、第二閾値Th2と比較する回数を多くする。尚、上記方法による判定が終了する迄の時間は、周波数の逆数と、第二閾値Th2との比較回数とを乗算した値に対応する。故に、数値制御装置1は、交流電圧に異常があるかの判定が終了する迄の時間を、交流電圧の各相の周波数に依らず均一化できる。   When the frequency of each phase of the AC voltage is closer to 50 Hz than 60 Hz (S63: YES), the numerical control device 1 is when the duty ratio of all three phases is three times consecutively smaller than the second threshold Th2 (S65). : YES), it is determined that the AC voltage is abnormal (S71). When the frequency of each phase of the AC voltage is closer to 60 Hz than 50 Hz (S63: NO), and the numerical control device 1 is when all three-phase duty ratios are continuously four times smaller than the second threshold Th2 (S67: YES) ), It is determined that the AC voltage is abnormal (S71). That is, the numerical controller 1 increases the number of comparisons with the second threshold Th2 as the frequency of each phase of the AC voltage is relatively large. The time until the determination by the above method is completed corresponds to a value obtained by multiplying the reciprocal of the frequency by the number of comparisons with the second threshold Th2. Therefore, the numerical control apparatus 1 can equalize the time until the determination of whether there is an abnormality in the AC voltage is completed regardless of the frequency of each phase of the AC voltage.

FPGA55は、交流電圧に過電圧と電圧低下が発生したかの判定結果を、CPU11に出力する(S29)。CPU11は、出力した判定結果に基づき、過電圧、電圧低下の発生を通知する通知情報を表示装置18に表示する。該時、数値制御装置1は、電圧異常の発生を外部に通知できる。   The FPGA 55 outputs a determination result as to whether an overvoltage and a voltage drop have occurred in the AC voltage to the CPU 11 (S29). The CPU 11 displays notification information for notifying the occurrence of overvoltage and voltage drop on the display device 18 based on the output determination result. At this time, the numerical controller 1 can notify the outside of the occurrence of the voltage abnormality.

<変形例>
本発明は上記実施形態に限らない。数値制御装置1は三相交流電圧の異常を検出したが、二相交流電圧の異常を検出してもよいし、三相以上の交流電圧の異常を検出してもよい。数値制御装置1は、各基準回路51〜53のフォトカプラ64,74,84の代わりに、他の受光素子デバイス(例えば光MOSFET)を備えてもよい。CPU11は、FPGA55が出力した判定結果に基づき、工作機械2の動作を停止してもよい。FPGA55は、パルス幅とパルス周期からデューティ比を算出したが、パルス幅のみで過電圧又は電圧低下を判定してもよい。閾値テーブル14Aは、分圧した電圧の最大値の第一閾値と第二閾値を記憶してもよい。FPGA55は、デューティ比の代わりに電圧の最大電圧を第一閾値と第二閾値と比較することにより、過電圧と電圧低下の発生を判定してもよい。上記実施形態は、本発明の電圧異常検出装置の一実施形態として数値制御装置1を説明したが、数値制御装置1とは独立した電圧異常検出装置であってもよい。第一判定処理及び第二判定処理における各種パラメータ(三回、四回、50ms等)は一例であれ、変更可能である。
<Modification>
The present invention is not limited to the above embodiment. Although the numerical control device 1 detects the abnormality of the three-phase AC voltage, it may detect the abnormality of the two-phase AC voltage or may detect the abnormality of the AC voltage of three or more phases. The numerical controller 1 may include other light receiving element devices (for example, optical MOSFETs) instead of the photocouplers 64, 74, and 84 of the reference circuits 51 to 53. The CPU 11 may stop the operation of the machine tool 2 based on the determination result output by the FPGA 55. The FPGA 55 calculates the duty ratio from the pulse width and the pulse period, but may determine overvoltage or voltage drop only by the pulse width. The threshold value table 14A may store a first threshold value and a second threshold value that are the maximum values of the divided voltages. The FPGA 55 may determine the occurrence of overvoltage and voltage drop by comparing the maximum voltage of the voltage with the first threshold value and the second threshold value instead of the duty ratio. In the above embodiment, the numerical control device 1 has been described as an embodiment of the voltage abnormality detection device of the present invention, but a voltage abnormality detection device independent of the numerical control device 1 may be used. Various parameters (three times, four times, 50 ms, etc.) in the first determination process and the second determination process can be changed even if they are examples.

閾値テーブル14Aは、バイパスコンデンサ65、75、85のパラメータに応じた回路条件(第i条件)に第一閾値(i)と第二閾値(i)を対応付け、周波数範囲毎に格納した。閾値テーブル14Aは、バイパスコンデンサ65、75、85のパラメータと異なる回路条件に第一閾値(i)と第二閾値(i)を対応付けてもよい。例えば基準回路51〜53は、分圧した電圧の変動を抑制するローパスフィルタ及びハイパスフィルタを備えてもよい。閾値テーブル14Aは、該ローパスフィルタ及びハイパスフィルタの周波数特性を、回路条件として第一閾値(i)と第二閾値(i)を対応付けてもよい。   In the threshold value table 14A, the first threshold value (i) and the second threshold value (i) are associated with the circuit condition (i-th condition) according to the parameters of the bypass capacitors 65, 75, and 85, and stored for each frequency range. The threshold value table 14A may associate the first threshold value (i) and the second threshold value (i) with circuit conditions different from the parameters of the bypass capacitors 65, 75, and 85. For example, the reference circuits 51 to 53 may include a low-pass filter and a high-pass filter that suppress fluctuations in the divided voltage. The threshold value table 14A may associate the first threshold value (i) and the second threshold value (i) with the frequency characteristics of the low-pass filter and the high-pass filter as circuit conditions.

FPGA55は、三相のうち二相以上のデューティ比が第一閾値Th1より大きい時(S41:YES)のみ、交流電圧に異常があると判定してもよい(S45)。該時、FPGA55は、S43の処理を実行しなくてもよい。FPGA55は、三相のうち何れかの相のデューティ比が第一閾値Th1より三回以上連続して大きい時(S43:YES)のみ、交流電圧に異常があると判定してもよい(S45)。該時、FPGA55は、S41の処理を実行しなくてもよい。   The FPGA 55 may determine that the AC voltage is abnormal only when the duty ratio of two or more of the three phases is greater than the first threshold Th1 (S41: YES) (S45). At this time, the FPGA 55 may not execute the process of S43. The FPGA 55 may determine that the AC voltage is abnormal only when the duty ratio of any one of the three phases is continuously larger than the first threshold Th1 three times or more (S43: YES) (S45). . At this time, the FPGA 55 may not execute the process of S41.

FPGA55は、基準回路51〜53が二相以上のパルス信号を50ms以上出力しない時(S61:YES)のみ、交流電圧に電圧低下が発生したと判定してもよい(S71)。該時、FPGA55は、S65、S67の処理を実行しなくてもよい。FPGA55は、三相のデューティ比が第二閾値Th2より所定回数(三回又は四回)以上連続して小さい時(S65:YES、S67:YES)のみ、交流電圧に電圧低下が発生したと判定してもよい(S71)。該時、FPGA55は、S61の処理を実行しなくてもよい。   The FPGA 55 may determine that a voltage drop has occurred in the AC voltage only when the reference circuits 51 to 53 do not output a pulse signal of two or more phases for 50 ms or longer (S61: YES) (S71). At this time, the FPGA 55 does not have to execute the processes of S65 and S67. The FPGA 55 determines that a voltage drop has occurred in the AC voltage only when the three-phase duty ratio is continuously smaller than the second threshold Th2 by a predetermined number of times (three times or four times) (S65: YES, S67: YES). (S71). At this time, the FPGA 55 may not execute the process of S61.

FPGA55は、S65又はS67の処理による判定時の判定回数を同一としてもよい。即ち、FPGA55は、交流電圧の各相の周波数に依らず、三相の全てのデューティ比が第二閾値Th2より小さくなる時の判定回数を共通としてもよい。   The FPGA 55 may set the same number of determinations at the time of determination by the process of S65 or S67. That is, the FPGA 55 may use the same number of determinations when all the three-phase duty ratios are smaller than the second threshold Th2 regardless of the frequency of each phase of the AC voltage.

<その他>
基準回路51〜53は本発明の分圧手段とパルス出力手段の一例である。第一閾値と第二閾値は本発明の基準情報の一例である。閾値テーブル14Aを記憶する不揮発性記憶装置14は本発明の「記憶部」の一例である。S11の処理を実行するFPGA55は、本発明の決定手段の一例である。S17の処理を実行するFPGA55は、本発明の第一特定手段の一例である。S19の処理を実行するFPGA55は、本発明の第二特定手段の一例である。S23、S25の処理を実行するFPGA55は、本発明の判定手段の一例である。S29の処理を行うFPGA55は、本発明の結果出力手段の一例である。
<Others>
The reference circuits 51 to 53 are an example of voltage dividing means and pulse output means of the present invention. The first threshold value and the second threshold value are examples of the reference information of the present invention. The nonvolatile storage device 14 that stores the threshold value table 14A is an example of the “storage unit” in the present invention. The FPGA 55 that executes the process of S11 is an example of a determination unit of the present invention. The FPGA 55 that executes the process of S17 is an example of a first specifying unit of the present invention. The FPGA 55 that executes the process of S19 is an example of the second specifying means of the present invention. The FPGA 55 that executes the processes of S23 and S25 is an example of a determination unit of the present invention. The FPGA 55 that performs the process of S29 is an example of a result output unit of the present invention.

14 :不揮発性記憶装置
14A :閾値テーブル
15 :電圧異常検出回路
19 :三相交流電源
51、52、53 :基準回路
55 :FPGA
65、75、85 :バイパスコンデンサ
14: Nonvolatile memory device 14A: Threshold table 15: Voltage abnormality detection circuit 19: Three-phase AC power supplies 51, 52, 53: Reference circuit 55: FPGA
65, 75, 85: Bypass capacitor

Claims (8)

交流電圧の異常を検出する電圧異常検出装置であって、
前記交流電圧を複数の相に分圧する分圧手段と、
周波数毎に定義した基準情報を、前記交流電圧の信号線に接続する回路構成毎に対応付けたテーブルを記憶した記憶部と、
前記回路構成を特定可能な指示を受け付け、受け付けた前記指示が特定する前記回路構成に対応する前記周波数毎の前記基準情報を決定する決定手段と、
前記分圧手段により分圧した前記複数の相の夫々の周波数を特定する第一特定手段と、
前記第一特定手段により特定した前記周波数に対応する前記基準情報を、前記決定手段により決定した前記周波数毎の前記基準情報に基づいて特定する第二特定手段と、
前記第二特定手段により特定した前記基準情報と前記交流電圧との関係に応じ、前記交流電圧に異常があるか否か判定する判定手段と
を備えたことを特徴とする電圧異常検出装置。
A voltage abnormality detection device for detecting an abnormality in an AC voltage,
Voltage dividing means for dividing the AC voltage into a plurality of phases;
A storage unit storing a table in which reference information defined for each frequency is associated with each circuit configuration connected to the signal line of the AC voltage;
A determination unit that receives an instruction capable of specifying the circuit configuration, and determines the reference information for each frequency corresponding to the circuit configuration specified by the received instruction;
First specifying means for specifying each frequency of the plurality of phases divided by the voltage dividing means;
Second specifying means for specifying the reference information corresponding to the frequency specified by the first specifying means based on the reference information for each frequency determined by the determining means;
A voltage abnormality detection device comprising: a determination unit that determines whether or not the AC voltage is abnormal in accordance with a relationship between the reference information specified by the second specification unit and the AC voltage.
前記交流電圧は三相交流電圧であり、
前記分圧手段は、前記三相交流電圧を、R相、S相、T相に分圧することを特徴とする請求項1に記載の電圧異常検出装置。
The AC voltage is a three-phase AC voltage,
2. The voltage abnormality detection device according to claim 1, wherein the voltage dividing unit divides the three-phase AC voltage into an R phase, an S phase, and a T phase.
前記判定手段は、前記分圧手段により分圧したR相、S相、T相のうち二相以上のデューティ比が、前記基準情報が示す第一閾値より大きい時、前記交流電圧に異常があると判定することを特徴とする請求項2に記載の電圧異常検出装置。   The determination means has an abnormality in the AC voltage when a duty ratio of two or more of the R phase, S phase, and T phase divided by the voltage dividing means is larger than a first threshold value indicated by the reference information. The voltage abnormality detection device according to claim 2, wherein the voltage abnormality detection device is determined. 前記判定手段は、
前記分圧手段により分圧したR相、S相、T相の夫々のデューティ比と、前記基準情報が示す第一閾値とを繰り返し比較し、
R相、S相、T相のうち何れかの相のデューティ比が前記第一閾値より所定回数以上連続して大きい時、前記交流電圧に異常があると判定することを特徴とする請求項2に記載の電圧異常検出装置。
The determination means includes
The R, S, and T phase duty ratios divided by the voltage dividing means are repeatedly compared with the first threshold indicated by the reference information,
3. The AC voltage is determined to be abnormal when a duty ratio of any one of an R phase, an S phase, and a T phase is continuously greater than the first threshold by a predetermined number of times or more. The voltage abnormality detection apparatus described in 1.
前記分圧手段により分圧したR相、S相、T相の夫々の、他の二相のうち電圧が小さい相との電位差が所定電圧以上の時にパルス信号を出力するパルス出力手段を更に備え、
前記判定手段は、前記分圧手段により分圧したR相、S相、T相に対応するパルス信号のうち二相以上のパルス信号を、前記パルス出力手段が所定時間以上しない時、前記交流電圧に異常があると判定することを特徴とする請求項2に記載の電圧異常検出装置。
Pulse output means is further provided for outputting a pulse signal when the potential difference between each of the R phase, S phase, and T phase divided by the voltage dividing means and the other two phases with a smaller voltage is a predetermined voltage or more. ,
When the pulse output means does not exceed the predetermined time for the pulse signal of two or more phases among the pulse signals corresponding to the R phase, S phase, and T phase divided by the voltage dividing means, The voltage abnormality detection device according to claim 2, wherein the abnormality is determined to be abnormal.
前記判定手段は、
前記分圧手段により分圧したR相、S相、T相の夫々のデューティ比と、前記基準情報が示す第二閾値とを繰り返し比較し、
R相、S相、T相のデューティ比が、前記第二閾値より所定回数以上連続して小さい時、前記交流電圧に異常があると判定することを特徴とする請求項2に記載の電圧異常検出装置。
The determination means includes
The duty ratio of each of the R phase, S phase, and T phase divided by the voltage dividing means is repeatedly compared with the second threshold value indicated by the reference information,
3. The voltage abnormality according to claim 2, wherein when the duty ratio of the R phase, the S phase, and the T phase is continuously smaller than the second threshold by a predetermined number of times or more, it is determined that the AC voltage is abnormal. Detection device.
前記所定回数が、前記第一特定手段により特定した前記周波数毎に応じて相違することを特徴とする請求項6に記載の電圧異常検出装置。   The voltage abnormality detection device according to claim 6, wherein the predetermined number of times differs depending on the frequency specified by the first specifying unit. 前記判定手段による判定結果を出力する結果出力手段を更に備えたことを特徴とする請求項1から7の何れかに記載の電圧異常検出装置。   The voltage abnormality detection device according to claim 1, further comprising a result output unit that outputs a determination result by the determination unit.
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09308083A (en) * 1996-05-13 1997-11-28 Hitachi Ltd Phase interruption detection circuit
JP2001258151A (en) * 2000-03-08 2001-09-21 Yaskawa Electric Corp Power supply voltage abnormality detection circuit and method
US20070041136A1 (en) * 2003-05-15 2007-02-22 Abb Oy Phase failure detector and a device comprising the same
JP2012078241A (en) * 2010-10-04 2012-04-19 Yokogawa Electric Corp Instantaneous voltage drop detector and semiconductor testing device
JP2014066566A (en) * 2012-09-25 2014-04-17 Fuji Electric Co Ltd Open-phase detection device
JP2014117089A (en) * 2012-12-11 2014-06-26 Brother Ind Ltd Voltage abnormality detection device
US20160308582A1 (en) * 2013-12-10 2016-10-20 Sew-Eurodrive Gmbh & Co. Kg System for transmitting power and data

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4915982B2 (en) * 2005-09-01 2012-04-11 株式会社リコー Power supply control method and heater control device
JP4757021B2 (en) * 2005-12-28 2011-08-24 オリンパス株式会社 Position detection system
CN101408565B (en) * 2008-10-31 2010-07-07 江苏省电力公司常州供电公司 35KV power distribution station internal and external over voltage monitoring method based on voltage mutual inductor sampling
JP5341842B2 (en) * 2010-08-31 2013-11-13 日立オートモティブシステムズ株式会社 Power supply circuit and power conversion device
WO2013035183A1 (en) * 2011-09-08 2013-03-14 日立ビークルエナジー株式会社 Battery system monitoring device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09308083A (en) * 1996-05-13 1997-11-28 Hitachi Ltd Phase interruption detection circuit
JP2001258151A (en) * 2000-03-08 2001-09-21 Yaskawa Electric Corp Power supply voltage abnormality detection circuit and method
US20070041136A1 (en) * 2003-05-15 2007-02-22 Abb Oy Phase failure detector and a device comprising the same
JP2012078241A (en) * 2010-10-04 2012-04-19 Yokogawa Electric Corp Instantaneous voltage drop detector and semiconductor testing device
JP2014066566A (en) * 2012-09-25 2014-04-17 Fuji Electric Co Ltd Open-phase detection device
JP2014117089A (en) * 2012-12-11 2014-06-26 Brother Ind Ltd Voltage abnormality detection device
US20160308582A1 (en) * 2013-12-10 2016-10-20 Sew-Eurodrive Gmbh & Co. Kg System for transmitting power and data

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