JP2011248983A - Semiconductor device and selection method of optical disk apparatus - Google Patents

Abstract

To select an optical disc apparatus that contributes to adjustment of a write strategy that does not require analysis of reproduction quality or the like to determine whether or not the adjusted write strategy can be applied to each optical disc apparatus, and that does not require optimization for each optical disc apparatus. To do.
A semiconductor device (4) mounted on an optical disc device (10) for controlling writing and reading of data to and from the optical disc (1) evaluates reproduction quality based on data read from the optical disc. Evaluation data is generated, and the evaluation data corresponding to a plurality of other optical disk devices is input. Then, the semiconductor device discriminates an optical disc device deviating from the target evaluation quality based on the inputted evaluation data, and selects a candidate optical disc device for adjusting the write strategy based on the discrimination result. Execute the process for
[Selection] Figure 1

Description

  The present invention relates to an optical disk device, and more particularly to a technique for adjusting a write strategy of an optical disk device, and, for example, a technology effective when applied to a semiconductor device for selecting an optical disk device and an optical disk device selection method. About.

  A commercially available DVD-R (Digital Versatile Disc-Recordable), DVD-RW (Digital Versatile Disc-ReWritable), or other such rewritable or rewritable optical disc is irradiated with laser light on the recording surface of the disc. As a result, a heat change occurs in the optical recording medium and information is recorded. At this time, the laser beam is modulated by a recording pulse having a time width corresponding to the information to be recorded, and a recording mark having a length corresponding to the information to be recorded is formed on the optical disc. A method of controlling the modulation waveform of the laser for recording the recording mark is called a write strategy, and the optical disc apparatus holds an optimal write strategy according to the specifications of the medium and the recording double speed.

  The optimum write strategy for each medium in each optical disc apparatus is adjusted using, for example, an evaluation apparatus described in Patent Document 1. In Patent Document 1, in an optical disk recording waveform generator that outputs a recording waveform corresponding to a mark length to an optical disk recording head that records a pulse width modulated mark, a recording waveform of a writing optical disk is generated, a reproduction signal is measured, In addition, an evaluation apparatus capable of automatically analyzing an optimum recording waveform is disclosed.

  However, when the write strategy adjusted by the evaluation apparatus described in Patent Document 1 is applied as it is to the optical disk apparatus, the optical disk apparatus records poor quality depending on the use environment such as the assembly accuracy and temperature of the components of the optical disk apparatus. There is a possibility that a recording mark which cannot be reproduced is formed. As techniques for solving this, there are disclosures in Patent Documents 2 to 5 below.

  The technique described in Patent Document 2 is as follows. First, before starting the first data recording on the loaded optical disk, the optical disk apparatus executes an OPC (Optimum Power Control) using the strategy data registered in the memory in the optical disk apparatus to obtain an appropriate recording power. . Next, the optical disc apparatus obtains an appropriate recording power by executing OPC using the standard strategy data recorded on the optical disc. Then, the optical disc apparatus performs trial writing at a power lower by α% than the appropriate recording power to detect the reproduction jitter, compares the two detected reproduction jitters, and adopts the strategy with the better characteristics.

  The technique described in Patent Document 3 is as follows. A controller in the optical disc apparatus records test data on a PCA (Power Calibration Area) of the optical disc, and calculates rise jitter (pit jitter) and fall jitter (land jitter) of a reproduction signal of the test data. When the calculated rising jitter is larger than the falling jitter by a predetermined value or more, it is determined that the irradiation energy of the 3T pulse is excessive, the pulse width of the 3T pulse is reduced, and the falling jitter is larger than the rising jitter. If it exceeds a predetermined value, it is determined that the irradiation energy of the 3T pulse is insufficient, and the pulse width of the 3T pulse is increased.

  The technique described in Patent Document 4 is as follows. A system controller in the optical disc apparatus executes test data trial writing with various write strategies using the test area of the optical disc, and selects the optimum write strategy by evaluating the reproduction signal quality of the test data. At this time, the system controller obtains a minimum error rate Eb for each write strategy, a recording power range We for obtaining a threshold error rate, a recording power Pmb for obtaining a target beta (β), and a minimum error rate. In accordance with the evaluation value Hst calculated based on the recording power Peb, the write strategy for obtaining the minimum evaluation value Hst is set as the optimum write strategy.

  The technique described in Patent Document 5 is as follows. The optical disk device detects the jitter of the reproduction signal obtained from the recording data of the optical disk, and adjusts a parameter with a relatively small influence on the jitter among the write strategy parameters when the jitter exceeds a predetermined threshold. By doing so, writing to the recording medium is performed.

JP 2002-208136 A JP 2006-338724 A Japanese Patent Laid-Open No. 2003-208716 JP 2007-287229 A JP 2008-299892 A

  Prior to the present invention, the present inventor is mounted on a multi-drive type optical disk device that enables recording of optical disks of a plurality of standards such as CD (Compact Disc), DVD (Digital Versatile Disc), and BD (Blu-ray Disc). He was engaged in research and development of large-scale integrated circuits (LSIs) for signal processing. At the beginning of this research and development, the inventor studied the background techniques described in Patent Documents 1 to 5, and as a result, thought that there was room for improvement in the following points.

  First, conventionally, it is determined whether or not a write strategy adjusted by a specific optical disc device can be applied to each optical disc device by analyzing reproduction quality and the read strategy is readjusted as necessary. Etc. In order to do this, it is necessary to use an evaluation apparatus or the like described in the above-mentioned Patent Document 1, and the work load is heavy, and it takes time to adjust the write strategy.

  Secondly, in the techniques of Patent Documents 2 to 5, it is necessary to optimize the write strategy in which each optical disk device is stored in advance when data is written to the optical disk. For this reason, it takes time to perform measurement for quality evaluation using a pre-stored write strategy and adjustment of the write strategy, and there is a possibility that the time from mounting to the start of data writing may increase.

  SUMMARY OF THE INVENTION An object of the present invention is to provide an optical disc that contributes to adjustment of a write strategy that does not require analysis of reproduction quality or the like as to whether or not the adjusted write strategy can be applied to each optical disc device, and that does not require optimization for each optical disc device. It is to select a device.

  The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

  The following is a brief description of an outline of typical inventions disclosed in the present application.

  That is, a semiconductor device that is mounted on an optical disc device and controls writing and reading of data to and from the optical disc generates evaluation data for evaluating reproduction quality based on data read from the optical disc, The evaluation data corresponding to a plurality of optical disk devices is input. Then, the semiconductor device discriminates an optical disc device deviating from the target evaluation quality based on the inputted evaluation data, and selects a candidate optical disc device for adjusting the write strategy based on the discrimination result. Execute the process for

  The effects obtained by the representative ones of the inventions disclosed in the present application will be briefly described as follows.

  In other words, the semiconductor device does not need to analyze the reproduction quality or the like as to whether or not the adjusted write strategy can be applied to each optical disc device, and contributes to the adjustment of the write strategy that does not require optimization for each optical disc device. A device can be selected.

FIG. 1 is a block diagram showing an example of the configuration of the optical disc apparatus 10 according to the first embodiment. FIG. 2 is an explanatory diagram showing an example of recorded contents of an evaluation disk created for quality evaluation of an optical disk device. FIG. 3 is an explanatory diagram showing an example of the β margin of the optical disc apparatus 10 according to the first embodiment. FIG. 4 is an explanatory diagram for selecting an optical disk device for adjusting write strategy. FIG. 5 is a flowchart showing an example of the flow of selection processing of the write strategy adjusting optical disc apparatus according to the first embodiment. FIG. 6 is an explanatory diagram showing an example of a method of reproducing the evaluation disk 400 and recording a measurement result. FIG. 7 is a flowchart showing an example of the operation flow in step 31. FIG. 8 is a flowchart showing an example of the operation flow in step 32. FIG. 9 is a flowchart showing an example of the operation flow in step 33. FIG. 10 is a flowchart showing an example of the operation flow in step 34. FIG. 11 is a flowchart showing an example of the flow of processing for selecting an optical disc device for write strategy adjustment according to the second embodiment. FIG. 12 is a flowchart showing an example of the flow of processing for selecting an optical disc apparatus for write strategy adjustment according to the third embodiment. FIG. 13 is a flowchart showing an example of the operation flow in step 41. FIG. 14 is a flowchart showing an example of the operation flow in step 42. FIG. 15 is a flowchart showing an example of the operation flow in step 43. FIG. 16 is a flowchart showing an example of the operation flow in step 44. FIG. 17 is a flowchart showing an example of the reproduction operation of the optical disc 1 by the optical disc apparatus 10. FIG. 18 is a flowchart showing an example of the recording operation of the optical disc 1 by the optical disc apparatus 10.

1. First, an outline of a typical embodiment of the invention disclosed in the present application will be described. Reference numerals in the drawings referred to in parentheses in the outline description of the representative embodiments merely exemplify what are included in the concept of the components to which the reference numerals are attached.

[1] (Semiconductor device for optical disk device that executes selection of optical disk device for adjusting write strategy based on reproduction quality)
A semiconductor device (4, 4_1 to 4_n) according to a representative embodiment of the present invention is a semiconductor device that is mounted on an optical disc device and controls writing and reading of data with respect to the optical disc (1). The semiconductor device measures a data processing control unit (43) that performs data processing for the control, information indicating reproduction quality based on data read from the optical disc (1, 400), and beta, A measurement unit (42) for generating evaluation data for evaluating reproduction quality is included. The data processing control unit inputs the evaluation data corresponding to a plurality of other optical disk devices, determines an optical disk device deviating from a target evaluation quality based on the input evaluation data, and based on the determination result Then, a process for selecting a candidate optical disk device for adjusting the write strategy is executed.

  According to this, since the semiconductor device can discriminate an optical disc device deviating from the target evaluation quality among a plurality of optical disc devices, such an optical disc device is selected as a candidate for an optical disc device for adjusting a write strategy. Can be excluded. Thus, an optical disk device that adjusts the write strategy may be selected from optical disk devices that do not deviate from the target evaluation quality. Then, by adjusting the write strategy with the selected optical disk device, a write strategy with the required accuracy can be obtained, so it is not necessary to determine whether it can be applied to each optical disk device. Application to this optical disc apparatus also eliminates the need for optimization for each optical disc apparatus, and contributes to shortening the time required for adjusting the write strategy. Further, since the semiconductor device performs the selection, it is not necessary to use an evaluation device or the like when adjusting the write strategy.

[2] (Details of exclusion process based on beta)
In the semiconductor device according to Item 1, the data processing control unit calculates an average value of beta based on the evaluation data generated corresponding to the plurality of optical disc devices, and uses the calculated average value of beta as a reference Discriminating an optical disc apparatus that is in a beta that deviates from the predetermined range determined as.

  Thus, by calculating the average value of beta of the plurality of optical disk devices, it is possible to grasp the average reproduction quality of the plurality of optical disk devices. Thereby, it becomes possible to easily discriminate an optical disc device deviating from the average reproduction quality.

[3] (Information indicating playback quality is jitter)
In the semiconductor device of Item 2, the information indicating the reproduction quality is a jitter representing a phase shift width of a signal related to the read data.

[4] (Details of jitter-based exclusion processing)
In the semiconductor device according to Item 3, the data processing control unit calculates an average value of the jitter based on the evaluation data generated corresponding to the plurality of optical disc devices, and calculates the average value of the jitter. The optical disc apparatus having the jitter deviating from a predetermined range determined based on the above is discriminated.

  Thus, by calculating the average value of the jitter of the plurality of optical disk devices, it is possible to grasp the average reproduction quality of the plurality of optical disk devices. Thereby, it becomes possible to easily discriminate an optical disc device deviating from the average reproduction quality.

[5] (Details of exclusion processing based on β margin based on jitter)
In the semiconductor device according to item 3 or item 4, the data processing control unit is less than or equal to jitter (Jt) that is a reproduction quality target based on the evaluation data generated corresponding to the plurality of optical disk devices. A margin (β margin) representing a range of beta in which jitter can be obtained is calculated, and an optical disc apparatus having a margin smaller than a predetermined threshold is determined.

  Thus, by using the margin, the reproduction quality of the optical disc apparatus can be quantitatively expressed. Thereby, it becomes possible to easily discriminate an optical disc apparatus deviating from the target reproduction quality.

[6] (Reproduction quality information is PI error)
In the semiconductor device according to Item 2, the information indicating the reproduction quality is a PI error value of the read data.

[7] (Details of exclusion process based on PI error)
In the semiconductor device of Item 6, the data processing control unit calculates an average value of PI error values based on the evaluation data generated corresponding to the plurality of optical disk devices, and calculates the calculated PI error value. An optical disc apparatus having a PI error value deviating from a predetermined range determined on the basis of the average value is determined.

  Thus, by calculating the average value of the PI error values of the plurality of optical disk devices, it is possible to grasp the average reproduction quality of the plurality of optical disk devices. Thereby, it becomes possible to easily discriminate an optical disc device deviating from the average reproduction quality.

[8] (Details of exclusion process based on β margin based on PI error)
In the semiconductor device according to Item 6 or 7, the data processing control unit calculates a margin indicating a range of beta that can take a PI error value that is equal to or less than a PI error value that is a target of reproduction quality, and the margin An optical disc apparatus whose degree is smaller than a predetermined threshold is determined.

  According to this, similarly to the item 5, it is possible to easily discriminate an optical disc apparatus deviating from the target reproduction quality.

[9] (Details of candidate selection process based on discrimination result)
In the semiconductor device according to item 5 or 8, the data processing control unit excludes the discriminated optical disc device from the candidates, and selects the candidate optical disc devices in order of increasing margin among the optical disc devices not excluded. To do.

  As described above, an optical disc suitable for generating a write strategy applicable to a plurality of other optical disc devices can be selected by selecting an optical disc device having a small margin from optical disc devices having an average reproduction quality. It becomes possible to do.

[10] (Distinguished at all recording speeds)
In the semiconductor device of Item 9, the evaluation data generated corresponding to the plurality of optical disk devices is generated for each recording speed, and the data processing control unit executes the determination for each recording speed, and includes at least one The discriminated optical disc apparatus at the recording speed is excluded.

  Thus, by performing the determination for each recording speed of the optical disk device, it is possible to more accurately exclude the optical disk device that deviates from the target reproduction quality.

[11] (Selected at all recording speeds)
In the semiconductor device according to Item 10, the data processing control unit calculates an average value of the margins at all the recording speeds of the optical disk devices that are not excluded, and the candidate optical disk devices in order of increasing calculated average value. Is selected.

  In this way, by using the average value of the margin for each recording speed of the optical disc apparatus, it becomes possible to select an optical disc suitable for generating a write strategy with higher accuracy.

[12] (Distinction at one recording speed)
In the semiconductor device according to any one of Items 1 to 9, the evaluation data generated corresponding to the plurality of optical disk devices is data generated at a specific recording speed.

  Thus, by using the evaluation data at a specific recording speed without using the evaluation data for each recording speed of the optical disc apparatus, the time required for selecting the optical disc apparatus is greatly reduced. It becomes possible.

[13] (Optical disk drive selection method for adjusting write strategy)
An optical disk device selection method according to a representative embodiment of the present invention is an optical disk device selection method for selecting an optical disk device for adjusting a write strategy from a plurality of optical disk devices. In the optical disk apparatus selection method, each of the optical disk apparatuses reproduces an evaluation disk on which data for measuring the reproduction quality of the optical disk apparatus is recorded according to the laser power, and measures information indicating the reproduction quality and beta. And first processing (S31, S41) for generating evaluation data including measurement results. Further, in the optical disk device selection method, a specific optical disk device or a specific program processing device among the plurality of optical disk devices inputs each evaluation data generated by the first processing, and the input evaluation data And a second process (S32 to S35, S42 to S45) for selecting an optical disk device for adjusting the write strategy based on the second process. The second process is a third process (S32 to S34, which excludes an optical disk device deviating from a target evaluation quality from candidates for an optical disk device for adjusting the write strategy based on the input evaluation data. S42 to S44). Further, the second process includes a fourth process (S35, S45) for selecting an optical disk device for adjusting the write strategy from the optical disk devices not excluded in the third process.

  According to this, it is possible to perform a process of excluding an optical disk device that deviates from the target evaluation quality among a plurality of optical disk devices from candidates for optical strategy devices for write strategy adjustment by various processing devices. Thus, similarly to the item 1, the write strategy adjusted by the optical disc device selected from the optical disc devices not deviating from the target evaluation quality is applied to other optical disc devices, so that the optimum for each optical disc device is achieved. This contributes to shortening the time required to adjust the write strategy.

[14] (Details of exclusion process based on beta)
In the optical disk device selection method according to item 13, the third process calculates an average value of beta at a predetermined laser power based on the input evaluation data, and is a predetermined value determined based on the calculated average value of beta. Including a fifth process (S33, S43) for excluding an optical disc apparatus that is in a deviating from the above range from the candidates.

  According to this, similarly to the item 2, it becomes possible to easily discriminate an optical disc device deviating from the average reproduction quality.

[15] (Information indicating playback quality is jitter)
In the optical disk device selection method according to item 13, the information indicating the reproduction quality is a jitter representing a phase shift of a signal related to the read data.

[16] (Details of jitter-based exclusion processing)
In the optical disk device selection method according to item 15, the third process calculates an average value of jitter at a predetermined laser power based on the input evaluation data, and the predetermined value is determined based on the calculated average value of jitter. Including a sixth process (S32, S42) for excluding the optical disk apparatus having the jitter deviating from the above range from the candidates.

  According to this, similarly to the item 4, it is possible to easily discriminate an optical disc apparatus deviating from the average reproduction quality.

[17] (Details of exclusion processing based on β margin based on jitter)
In the optical disk device selection method according to item 15 or 16, the third process calculates a margin indicating a range of beta that can take jitter that is equal to or less than a jitter targeted for reproduction quality based on the input evaluation data. And a seventh process (S34, S44) of excluding the optical disk apparatus having the calculated margin less than a predetermined threshold from the candidates.

  According to this, similarly to the item 5, it is possible to easily discriminate an optical disc apparatus deviating from the target reproduction quality.

[18] (Information indicating playback quality is PI error)
In the optical disk device selection method according to item 14, the information indicating the reproduction quality is a PI error value related to the read data.

[19] (Details of exclusion process based on PI error)
In the optical disk device selection method according to Item 18, the third process calculates an average value of the PI error values at a predetermined laser power based on the input evaluation data, and calculates the average value of the calculated PI error values. Including a sixth process (S32, S42) for excluding an optical disc apparatus having a PI error value deviating from a predetermined range determined on the basis of the above as candidates.

  According to this, similarly to the item 7, it becomes possible to easily discriminate an optical disc device deviating from the average reproduction quality.

[20] (Details of exclusion process based on β margin based on PI error)
20. In the optical disk device selection method according to item 18 or 19, the third process includes a margin representing a beta range in which a PI error value that is less than or equal to a reproduction quality target value can be obtained based on the input evaluation data. And a seventh process (S34, S44) of calculating the degree and excluding the optical disc apparatus whose calculated margin is smaller than a predetermined threshold from the candidates.

  According to this, similarly to the item 17, it is possible to easily discriminate an optical disc apparatus deviating from the target reproduction quality.

[21] (Details of candidate selection process based on discrimination result)
In the optical disk device selection method according to Item 17 or 20, the fourth process includes an eighth process (S35) of selecting the candidate optical disk devices in descending order of the margin among the optical disk devices not excluded in the third process. , S45).

  According to this, similarly to the item 9, it is possible to select an optical disc suitable for generating a write strategy applicable to a plurality of other optical disc apparatuses.

2. Details of Embodiments Embodiments will be further described in detail.

<< Embodiment 1 >>
<Configuration of optical disk device>
FIG. 1 is a block diagram showing an example of the configuration of the optical disc apparatus according to the first embodiment.

  An optical disk device 10 shown in FIG. 1 includes a spindle motor 2 that rotationally drives an attachable / detachable optical disk 1, an optical pickup 3, and a semiconductor device that controls signal writing and reading on the optical disk and performs signal processing (hereinafter referred to as an optical disk device 10). (Also referred to as “signal processing LSI”).

  The optical disc 1 is an optical disc that is recorded / reproduced by the optical disc device 10 and is not particularly limited, and is, for example, an optical disc such as a CD, a DVD, or a BD.

  The spindle motor 2 rotates the optical disc 1 at a predetermined rotational speed by controlling the rotation of the motor by a motor control signal 101 from the signal processing LSI 4.

  The optical pickup 3 is controlled by a position control signal 102 from the signal processing LSI 4 so that the optical disk 1 can be moved in the radial direction and moved to a predetermined position for recording / reproducing. The optical pickup 3 includes a semiconductor laser and outputs a laser pulse from the semiconductor laser. The laser pulse is controlled by a laser pulse control signal 103 from the signal processing LSI 4, and the optical pickup 3 irradiates the surface of the optical disc 1 with a laser pulse for recording or reproducing data on the optical disc 1. Further, the optical pickup 3 has a light receiving portion for receiving the reflected light of the laser pulse. The light receiving unit receives reflected light that is reflected from the surface of the optical disc 1 by the laser pulse emitted from the semiconductor laser, converts the reflected light into an electric signal 104, and outputs the electric signal 104 to the signal processing LSI 4.

  The signal processing LSI 4 includes an analog front-end circuit (AFE: Analog Front End) 41, a signal quality measurement circuit 42, a microcontroller 43, a memory unit 44, a position control circuit 45, a laser pulse control circuit 46, and a motor control circuit 47. Have. The signal processing LSI 4 is not particularly limited, but is formed on a single semiconductor substrate such as single crystal silicon by a known CMOS integrated circuit manufacturing technique.

  The memory unit 44 is a storage device having a storage area in which data is read and written by the microcontroller 43. The storage area of the memory unit 44 stores software such as a program for controlling reproduction and recording of an optical disc and a program for selecting a write strategy adjustment optical disc device to be described later. Further, the storage area stores data such as a calculation result by the microcontroller 43 and a measurement result related to reproduction quality using an evaluation disk described later. The memory unit 44 includes, for example, a volatile memory such as a synchronous dynamic memory (SDRAM) and a nonvolatile memory such as a flash memory.

  The microcontroller 43 controls the overall operation of the optical disc apparatus 10 by controlling each functional unit in the signal processing LSI 4. The microcontroller 43 is, for example, a CPU or a CPU core, and controls the operation of the optical disc apparatus 10 according to a program stored in the memory unit 44.

  Here, the operation of the microcomputer 43 and each functional unit in the signal processing LSI 4 will be described by taking as an example the case of reproducing / recording an optical disc.

<Playback of optical disc>
FIG. 17 is a flowchart showing an example of the reproducing operation of the optical disc 1 by the optical disc apparatus 10.

  Here, a case will be described as an example in which an evaluation disc created for quality evaluation of an optical disc apparatus, which will be described later, is reproduced.

  First, the microcontroller 43 outputs a motor control instruction 109 so that a predetermined reproduction speed is obtained, and the motor control circuit 47 executes control of the motor rotation speed during reproduction (S101). At this time, based on the motor control instruction 109, the motor control circuit 47 outputs the motor control signal 101 so as to achieve a predetermined reproduction speed, and controls the rotational speed of the spindle motor 2. After the spindle motor 2 reaches the desired number of rotations, the microcontroller 43 moves the optical pickup 3 to an area where data for performing signal quality evaluation of the evaluation disk is recorded. A position control instruction 107 is output to the control circuit 45, and the optical pickup position is controlled (S102). At this time, the position control circuit 45 outputs the position control signal 102 to the optical pickup 3 based on the position control instruction 107 so that the optical pickup 3 moves to the desired area.

  When the position control processing of the optical pickup 3 in step S102 is completed, the microcontroller 43 executes reproduction of the evaluation disk (S103). Specifically, the microcontroller 43 first outputs a laser pulse control instruction 108 to the laser pulse control circuit 46 so as to read data from the area of the evaluation disk. Upon receiving the instruction 108, the laser pulse control circuit 46 outputs the laser pulse control signal 103 to the optical pickup 3 so as to output a laser pulse corresponding to the laser power specified by the instruction 108. The optical pickup 3 irradiates the evaluation disk with a laser corresponding to the laser pulse control signal 103, receives the reflected light, converts it into an electrical signal 104, and outputs it to the AFE 41. The AFE 41 performs analog signal processing such as amplification on the received electrical signal 104 to generate the analog signal 105 and outputs the analog signal 105 to the signal quality measurement circuit 42. The signal quality measurement circuit 42 that has received the analog signal 105 measures parameters representing the reproduction quality of the optical disk device, such as beta (β), edge shift amount, and jitter, and outputs the measurement result 106 to the microcontroller 43. To do. The microcontroller 43 stores the measurement result 106 in the memory unit 44 and ends the reproduction operation.

<Recording optical disc>
FIG. 18 is a flowchart showing an example of the recording operation of the optical disc 1 by the optical disc apparatus 10.

  Here, a case where data for reproduction quality evaluation is recorded on the evaluation disk will be described as an example.

  First, the microcontroller 43 determines a write strategy (S201). The write strategy is, for example, a standard write strategy generated for each recording speed in accordance with the type of the optical disc, and is stored in the memory unit 44 in advance.

  In step 201, after the write strategy is determined, the microcontroller 43 outputs the motor control instruction 109 so as to achieve a predetermined recording speed, and the motor control circuit 47 controls the motor rotation speed during recording. Execute (S202). At this time, the motor control circuit 47 outputs the motor control signal 101 based on the motor control instruction 109 so as to achieve a predetermined recording speed, and controls the rotational speed of the spindle motor 2. After the spindle motor 2 reaches the desired rotation speed, the microcontroller 43 stores the data for evaluating the reproduction quality so that the optical pickup 3 moves to a predetermined area. 43 outputs the position control instruction 107 to the position control circuit 45, and executes control of the optical pickup position (S203). At this time, the position control circuit 45 outputs the position control signal 102 to the optical pickup 3 based on the position control instruction 107 so that the optical pickup 3 moves to the desired area.

  In step 203, when the movement of the optical pickup 3 to a desired position is completed, the microcontroller 43 records random data as evaluation data on the evaluation disk (S204). Specifically, the microcontroller 43 outputs the laser pulse control instruction 108 to the laser pulse control circuit 46 so as to execute data recording according to the write strategy determined in step 201. The laser pulse control circuit 46 outputs the laser pulse control signal 103 corresponding to the instruction 108 to the optical pickup 3. The optical pickup 3 irradiates the evaluation disk with a laser corresponding to the laser pulse control signal 103, recording at a predetermined size is performed at a predetermined address position on the evaluation disk, and the recording operation ends.

<Selection method of optical disk device for write strategy adjustment>
The microcontroller 43 further selects an optical disk apparatus for adjusting a write strategy capable of absorbing assembly accuracy and adjustment variations in the manufacturing stage of the optical disk apparatus 10 in addition to the above-described optical disk reproduction and recording control. Execute the process. In this process, based on the measurement results such as beta and jitter described above and the parameters representing the reproduction quality calculated based on the measurement results, optical disc device candidates for write strategy adjustment are selected from a plurality of optical disc devices. Select. Before describing a specific method for the selection process, an evaluation disk used for measuring beta and the like of the optical disk device 10 and parameters for quantifying and expressing the reproduction quality of the optical disk device will be described.

(1) Evaluation Disk FIG. 2 is an explanatory diagram showing an example of recorded contents of an evaluation disk created for performing quality evaluation of an optical disk device.

  The evaluation disk is an optical disk on which a recording mark is formed when the laser power of the optical disk device is changed, and the recording mark is formed at every recording speed. The evaluation disk is created by using an optical disk device capable of designating laser power for recording, a predetermined write strategy, and an optical disk. The write strategy used here is a write strategy that can form a recording mark that is equal to or less than the target jitter Jt representing a certain reproduction quality. For example, as shown in FIG. 2, the evaluation disk has a uniform interval within a range of ± 20% based on a laser power during recording (hereinafter referred to as “optimum laser power”) at which the jitter is lowest. It is created by forming a recording mark at the recording laser power of 15 points set in (1). The formation of the recording mark is performed at all the recording double speeds for adjusting the write strategy. The range of the recording laser power change and the number of recording points are not limited to this.

(2) β Margin FIG. 3 is an explanatory diagram showing an example of parameters for quantifying and expressing the reproduction quality of the optical disc apparatus 10 according to the first embodiment.

  A characteristic 300 shown in FIG. 3 shows a relation between beta (β) and jitter measured by reproducing data at one recording speed on the evaluation disk. In the characteristic 300, a parameter representing a range of beta in which jitter can be taken below the target jitter Jt described above is a margin (hereinafter referred to as “β margin”) 301, and in the first embodiment, reproduction of the optical disc apparatus is performed. It is defined as one of the parameters that quantitatively indicate quality.

<Selection method of optical disk device for write strategy adjustment>
A method for selecting an optical disk device for adjusting write strategy will be described in detail.

  FIG. 4 is an explanatory diagram of a method for selecting an optical disk device for write strategy adjustment.

  In the following description, as shown in FIG. 4, a case where an optical disc for write strategy adjustment is selected from n (n is a natural number) optical disc apparatuses 10_1 to 10_n is taken as an example.

  FIG. 5 is a flowchart showing an example of a process flow from selection of a write strategy adjustment optical disk device candidate to write strategy adjustment. The process up to the adjustment of the write strategy will be described with reference to FIG. The detailed contents in each processing step will be described later.

  First, each of the plurality of optical disk devices 10_1 to 10_n reproduces all data recorded on the evaluation disk, measures jitter and beta at each recording speed, and records the measurement results on the evaluation disk. At this time, the last optical disk apparatus (hereinafter referred to as “evaluation optical disk apparatus”) that performs the measurement using the evaluation disk is stored in the memory unit 44 of the signal processing LSI 4 of the evaluation disk. The measurement results of all the optical disk devices 10 that have been recorded are stored (S31).

  Next, the microcontroller 43 in the evaluation optical disk device 10 deviates from the average characteristic of jitter of all the optical disk devices 10 as a population based on all measurement results stored in the memory unit 44. A process of excluding the optical disc device 10 that is being used from the candidates for the optical disc device for write strategy adjustment is executed (S32). After the process of step 32, the microcontroller 43 of the evaluation optical disc apparatus determines from the average characteristics of beta of all the optical disc apparatuses to be a population based on all the measurement results stored in the memory unit 44. A process of excluding the deviating optical disk device from the optical disk device candidates for write strategy adjustment is executed (S33). Further, the microcontroller 43 of the evaluation optical disk device calculates β margins of all the optical disk devices serving as a population based on all measurement results stored in the memory unit 44, and β is smaller than a predetermined value. A process of excluding the optical disk apparatus that is a margin from the optical disk apparatus candidates for write strategy adjustment is executed (S34). Then, the microcontroller 43 of the evaluation optical disk apparatus selects the optical disk apparatus in order from the smallest β margin for the optical disk apparatuses that are not excluded in the processing of steps 32 to 34, and candidates for the optical disk apparatus for write strategy adjustment. (S35). Finally, the optical disc apparatus selected as the candidate adjusts the write strategy. If the data recorded on the basis of the write strategy adjusted with the optical disc apparatus satisfies a predetermined recording quality, the optical disc apparatus is determined as an optical disc apparatus for write strategy adjustment (S36). .

  Hereinafter, each processing step will be described in detail.

<Playback of all recorded data and reading of playback results (step 31)>
The process in step 31 will be described with reference to FIGS.

  FIG. 6 is an explanatory diagram showing an example of the method of reproducing the evaluation disk and recording the measurement result in the step 31.

  In step 31 in FIG. 5, each of the optical disk devices 10_1 to 10_n reproduces the data recorded on the evaluation disk 400 in order from the optical disk device 10_1 as shown in FIG. Jitter and beta are measured every time, and the measurement result is recorded on the evaluation disk 400. Then, as shown in FIG. 6B, the optical disk device 10_n that finally played back the evaluation disk 400 reads the measurement results of all the optical disk devices recorded on the evaluation disk 400, Stored in the memory unit 44.

  FIG. 7 is a flowchart showing an example of the operation flow in step 31.

  First, an evaluation disk is loaded into one optical disk device (S3101). For example, as described above, the evaluation disk 400 is loaded into the optical disk device 10_1. The optical disc device 10_1 reproduces all the data recorded on the evaluation disc 400 at each recording speed, and measures the jitter and beta of all the data (S3102). Then, the optical disc device 10_1 records the measurement result on the evaluation disc 400 (S3103). The processes in steps 3101 to 3103 are executed until all the optical disc apparatuses 10_1 to 10_n are completed (S3104). For example, as shown in FIG. 6A, when the processing of steps 3101 to 3103 is completed in the optical disc apparatus 10_1, the same processing is executed in the optical disc apparatus 10_2. As described above, all the optical disc apparatuses of the optical discs 10_1 to 10_n sequentially execute the reproduction of the evaluation disc 400 and the recording of the measurement results. When the reproduction of the above data and the recording of the measurement result are completed in all the optical disk devices, the optical disk device 10_n that is finally reproduced and measured is used as the evaluation optical disk device, and is recorded on the evaluation disk 400. The measurement results of all the optical disk devices are read and stored in the memory unit 44 (S3105).

  The process of step 31 is completed by the above process. In the above description, the optical disk apparatus that is the evaluation optical disk apparatus is the optical disk apparatus 10_n that has finally performed the evaluation evaluation of the evaluation disk from the viewpoint of improving the efficiency of the processing procedure, but is not limited thereto. The optical disc apparatus may be used.

<Exclusion processing of optical disk device due to jitter (step 32)>
Step 32 in FIG. 5 will be described in detail with reference to FIG.

  FIG. 8 is a flowchart showing an example of the operation flow in step 32.

  The evaluation optical disk device 10_n having stored the measurement results of all the optical disk devices in the memory unit 44 in step 31 executes processing for excluding the optical disk device due to jitter. First, the microcontroller 43 of the evaluation optical disk device 10_n reads the jitter value at a predetermined recording speed in the measurement results of all the optical disk devices 10_1 to 10_n from the memory unit 44 (S3201). For example, the microcontroller 43 reads out a measurement value of jitter at 1 × recording speed out of all measurement results. Then, the microcontroller 43 calculates the average jitter value of all the optical disk devices as a population based on the read jitter value (S3202). Specifically, the microcontroller 43 obtains an average value of jitter using a jitter value related to recording data with a predetermined laser power. Although not particularly limited, for example, an average value of jitter of all optical disc apparatuses is calculated using a measured value of jitter related to the data recorded with the optimum laser power shown in FIG.

  Next, the microcontroller 43 discriminates an optical disk device deviating from a predetermined range determined based on the calculated average value of jitter (S3203). The predetermined range determined on the basis of the average value of jitter is not particularly limited, but is a range separated by a predetermined ratio with the average value of jitter as a center. Here, for example, the jitter is within a range of ± 2% from the average value of the jitter. The predetermined ratio is not limited to the above “± 2%”. Specific processing in step 3203 is as follows. The microcontroller 43 excludes the optical disk apparatus having the most distant jitter characteristic from the optical disk apparatuses having a jitter value outside the predetermined range. Here, for example, an optical disk apparatus having a jitter value that is 2% or more away from the average value as an absolute value is excluded, and an optical disk apparatus having a jitter characteristic that is the most distant among the excluded objects is excluded. The

  After step 3203, the microcontroller 43 of the evaluation optical disc apparatus determines whether there is an optical disc apparatus excluded in step 3203 due to the exclusion processing due to jitter (S3204). When there is an excluded optical disk device, the microcontroller 43 recalculates the average value of the jitter using the measurement result of the population of the remaining optical disk devices excluding the excluded optical disk device ( S3202). Then, the microcontroller 43 has the characteristic of the jitter farthest from the optical disk apparatus having a jitter value more than a predetermined value from the calculated average jitter value in the population of the remaining optical disk apparatuses. The device is excluded (S3203). Then, the presence / absence of the excluded optical disk device is determined again (S3204). In this way, by repeatedly executing the process of excluding one optical disk device that deviates from the average reproduction quality of the optical disk device one by one, the average reproduction quality based on the jitter values of the plurality of optical disk devices 10_1 to 10_n is obtained. It is possible to accurately grasp an optical disc apparatus having characteristics deviating from the average reproduction quality, and to efficiently exclude.

  In step 3204, if there is no optical disk device to be excluded and the exclusion process has not been executed, the microcontroller 43 determines whether or not the exclusion process has been executed at all the recording speeds. (S3205). If the exclusion process is not executed at all the recording double speeds, the process proceeds to step 3201, and the jitter value at the next recording double speed is read and the above-described exclusion process is executed (S3201 to S3205). After executing the exclusion process at all the recording speeds, the exclusion process of the optical disc apparatus due to a series of jitters ends.

<Exclusion processing of optical disk device by beta (step 33)>
Step 33 in FIG. 5 will be described in detail with reference to FIG.

  FIG. 9 is a flowchart showing an example of the operation flow in step 33.

  The microcontroller 43 executes the process of excluding the optical disk apparatus due to jitter in the step 32, and then executes the process of excluding the optical disk apparatus by beta.

  First, the beta at a predetermined recording speed in the measurement results of all the optical disk devices 10_1 to 10_n is read from the memory unit 44 (S3301). For example, the microcontroller 43 reads the measured value of beta at 1 × recording speed out of all the measurement results. Based on the read beta, the microcontroller 43 calculates the average value of the betas of all the optical disk devices that are the population (S3302). Specifically, the microcontroller 43 obtains an average value of beta using a beta value related to recording data with a predetermined laser power. For example, similarly to the above-described jitter exclusion process, the beta values of all the optical disc apparatuses 10_1 to 10_n are calculated using the beta related to the data recorded with the optimum laser power shown in FIG.

  Next, the microcontroller 43 discriminates an optical disk device deviating from a predetermined range determined based on the calculated average value of beta (S3303). The predetermined range determined on the basis of the average value of the beta is not particularly limited, but is a range separated from the average value of the beta by a predetermined ratio as an absolute value. Here, for example, a beta range of ± 1% from the average value of the jitter is used. The predetermined ratio is not limited to the above “± 1%”. Specific processing in step 3303 is as follows. The microcontroller 43 excludes an optical disk device having a beta characteristic that is farthest from optical disk devices having a beta value outside the predetermined range. Here, for example, an optical disk apparatus having a beta value that is 1% or more away from the average value as an absolute value is excluded, and an optical disk apparatus having a beta characteristic that is farthest among the excluded objects is excluded. . Hereinafter, the predetermined ratio value (1%) is referred to as a beta threshold.

  After step 3303, the microcontroller 43 of the evaluation optical disk apparatus determines whether or not there is an optical disk apparatus excluded in step 3303 due to the exclusion process by beta (S3304). If there is an excluded optical disk device, the microcontroller 43 recalculates the average value of beta from the measurement result of the population of the remaining optical disk devices excluding the excluded optical disk device (S3302). Then, the microcontroller 43 determines the characteristic of the beta farthest from the optical disc apparatus having a beta value that is a predetermined value or more away from the calculated average value of beta from the population of the remaining optical disk apparatuses. The optical disk device possessed is excluded (S3303). Then, the presence / absence of the excluded optical disk device is determined again (S3304). In this way, by repeatedly executing the process of excluding one optical disk device that deviates from the average reproduction quality of the optical disk device one by one, the average reproduction quality based on the beta of the plurality of optical disk devices 10_1 to 10_n can be accurately obtained. In addition, it is possible to efficiently exclude an optical disc apparatus having characteristics that deviate from the average reproduction quality.

  In step 3304, if there is no optical disk device to be excluded and the exclusion process has not been executed, the microcontroller 43 determines whether or not the exclusion process has been executed at all the recording speeds. (S3305). If the exclusion process is not executed at all the recording double speeds, the process proceeds to step 3301, the beta value at the next recording double speed is read, and the above-described exclusion process is executed (S3301 to S3305). After executing the exclusion process at all the recording speeds, the series of beta exclusion processes for the optical disc apparatus is completed.

<Optical Disc Device Exclusion Processing by β Margin (Step 34)>
Step 34 in FIG. 5 will be described in detail with reference to FIG.

  FIG. 10 is a flowchart showing an example of the operation flow in step 34.

  The micro controller 43 executes the process of excluding the optical disk apparatus by beta in the step 33, and then, for the optical disk apparatus that has not been excluded in the excluding processes of the above step 32 and step 33, the microcontroller 43 Perform exclusion process.

  First, the microcontroller 43 of the evaluation optical disk device 10_n selects one of the optical disk devices that calculate the β margin from the optical disk devices that were not excluded in the exclusion process in the above-described step 32 and step 33. The measurement result of the optical disk device is read (S3401). Next, the microcontroller 43 calculates a β margin for each recording speed based on the read measurement result (S3402). Then, if there is a β margin that is equal to or less than a predetermined threshold at any recording speed, the microcontroller 43 excludes the optical disk device from the optical disk device candidates for write strategy adjustment (S3403). The predetermined threshold value of the β margin (hereinafter also referred to as “β margin threshold value”) may be set to a value that is at least four times the beta threshold value used in step 33. Here, for example, an optical disc apparatus in which the β margin threshold is 6% and the β margin is less than 6% at any recording speed is excluded.

  Next, the microcontroller 43 determines whether or not the exclusion process of step 3403 has been performed for all of the optical disk devices that were not excluded in steps 32 and 33 (S3404). If all of the optical disk devices that have not been excluded are not subjected to the exclusion process of step 3403, the process proceeds to step 3401, and the optical disk device that has not been subjected to the exclusion process of the optical disk device by the β margin is replaced with step 3401. Exclusion processing of ~ 3403 is executed. On the other hand, when the exclusion process of step 3403 is performed for all the optical disk apparatuses that are not excluded, the process of excluding the optical disk apparatus by the β margin ends.

<Selection of Candidate Optical Disk Device for Write Strategy Adjustment (Step 35)>
After executing the process of excluding the optical disk apparatus by β margin in the above-described step 34, the microcontroller 43 executes a process of selecting optical disk apparatus candidates for write strategy adjustment from the remaining optical disk apparatuses. Specifically, the microcontroller 43 calculates the average value of the β margin for each optical disc using the β margin for all the recording speeds calculated in step 34. The microcontroller 43 selects an optical disc device for write strategy adjustment in ascending order of the calculated average value of β margin. Here, the reason why the optical disk devices are selected in ascending order rather than in ascending order of the average value of the β margin is from the viewpoint of selecting an optical disk device that can generate a write strategy that can be applied to other optical disk devices. By selecting according to such a criterion, it becomes possible to select an optical disc apparatus suitable for adjusting the write strategy more accurately.

<Adjustment of Write Strategy by Optical Strategy Device for Write Strategy Adjustment (Step 36)>
The optical disc apparatus selected as the optical strategy apparatus for the write strategy adjustment in the above-described step 35 performs the write strategy adjustment at all the recording double speeds. The write strategy is adjusted by, for example, forming a recording mark on a predetermined optical disk by the same method as the recording process shown in FIG. 18, and then using the recording mark formed by the same method as the reproducing process shown in FIG. The data is reproduced, and the write strategy is adjusted based on the measurement result of the signal quality of the reproduced signal. If the recording of data using the adjusted write strategy by the optical disc apparatus satisfies the evaluation quality that results in jitter lower than the target jitter, the optical disc apparatus is determined as the write strategy adjusting optical disc apparatus. . Here, the optical disk apparatus for adjusting the write strategy may be one optical disk apparatus having the smallest average value of β margin as described above, or by selecting the required number of optical disk apparatuses in order of decreasing average value of β margin. The write strategy may be adjusted, and the optical disk apparatus having the best evaluation quality may be determined as the write strategy adjusting optical disk apparatus.

  As described above, according to the first embodiment, an optical disc device having an evaluation quality that does not deviate in the population is selected from a plurality of optical disc devices, and the selected optical disc device has a write strategy having a required accuracy. Perform the adjustment. This makes it possible to generate a write strategy that can be applied to other optical disk apparatuses in the population, so that it is not necessary to optimize the write strategy for each optical disk apparatus, and the time required for adjusting the write strategy is reduced. Contribute to In addition, since a write strategy with the required accuracy can be obtained, by applying the write strategy to other optical disk devices, optimization for each optical disk device becomes unnecessary, and the time required for adjusting the write strategy can be shortened. To contribute. In addition, since the semiconductor device selects the optical disk device for adjusting the write strategy, it is not necessary to use an evaluation device or the like when adjusting the write strategy, and the work load can be reduced.

<< Embodiment 2 >>
FIG. 11 shows another method of selecting an optical disc device for write strategy adjustment by the optical disc device 10 according to the second embodiment.

  As described above, since the β margin represents the characteristic of jitter with respect to beta, the evaluation quality related to the jitter of the optical disc apparatus can be known by calculating the β margin. Further, in the first embodiment, the optical disc apparatus to be excluded by the jitter-based exclusion process (step 32 in FIG. 5) is excluded by the optical disk apparatus exclusion process by the β margin (step 34 in FIG. 5). Or, there is a high possibility that the optical disk device candidate for the write strategy adjustment is not selected as a candidate by the selection process (step 35 in FIG. 5). Therefore, the selection method according to the second embodiment is a selection method in which the exclusion processing based on jitter (step 32 in FIG. 5) is omitted and the other processing is the same as the processing according to the first embodiment. According to the selection method according to the second embodiment, it is possible to select an optical disk device for write strategy adjustment with the same degree of accuracy as in the first embodiment, and it is possible to reduce the time required for the selection process.

<< Embodiment 3 >>
In the selection method of the optical disk device according to the first embodiment, the optical disk device is selected using the measurement results at all the recording double speeds measured using the evaluation disk. However, in the selection method according to the third embodiment, The optical disk apparatus is selected using the measurement result at a specific recording speed.

  FIG. 12 shows a method of selecting an optical disk device for write strategy adjustment by the optical disk device 10 according to the third embodiment. A large flow up to the adjustment of the write strategy will be described with reference to FIG. The detailed contents in each processing step will be described later.

  First, as in the first embodiment, each of the optical disk devices 10_1 to 10_n measures jitter and beta using the evaluation disk 400, and records the measurement result on the evaluation disk 400. At this time, the recording data to be reproduced / measured is recording data at a specific recording speed. Although not particularly limited, the specific recording speed is, for example, the maximum recording speed in the specifications of the optical disc apparatuses 10_1 to 10_n. As in the case of the first embodiment, the evaluation optical disk device 10_n stores the measurement results of all the optical disk devices 10 stored in the evaluation disk in the memory unit 44 of the signal processing LSI 4 thereof. (S41).

  Next, as in the first embodiment, the microcontroller 43 in the evaluation optical disk device 10_n performs the jitter exclusion process and the beta exclusion process based on all the measurement results stored in the memory unit 44. Processing and exclusion processing using the β margin are executed (S42 to S44). Then, candidate optical disk devices are selected from the optical disk devices not excluded in steps 42 to 44 (S45), and the write strategy is adjusted in the selected optical disk device as in the first embodiment ( S36).

  Hereinafter, each processing step in FIG. 12 will be described in detail.

<Reproduction of Recorded Data at One Recording Speed and Sharing of Reproduction Results (Step 41)>
FIG. 13 is a flowchart showing an example of the operation flow in step 41.

  As shown in FIG. 13, first, an evaluation disk is loaded into one optical disk device (S3101). For example, as in Embodiment 1, the evaluation disk 400 is first loaded into the optical disk device 10_1. The optical disc apparatus 10_1 reproduces recording data at a predetermined recording speed recorded on the loaded evaluation disc, measures jitter and beta (S4102), and records the measurement result on the evaluation disc 400 (S3103). . Then, the remaining optical disc devices 10_2 to 10_n are similarly measured, and the optical disc device 10_n that has performed the last measurement stores the measurement results of all the optical disc devices 10_1 to 10_n in the memory unit 44 (S3104 to S3104). S3105).

<Exclusion processing of optical disk device due to jitter (step 42)>
Step 42 in FIG. 12 will be described in detail with reference to FIG.

  FIG. 14 is a flowchart showing an example of the operation flow in step 42.

  The evaluation optical disk device 10_n that stores the measurement results at the predetermined recording speed of all the optical disk devices in step 41 executes the process of excluding the optical disk device due to jitter, as in the first embodiment. First, the microcontroller 43 of the evaluation optical disk device 10_n reads jitter at a predetermined recording speed of all optical disk devices from the memory unit 44 (S4201). For example, the microcontroller 43 reads the jitter of all the optical disk devices at the maximum recording speed. Then, the microcontroller 43 calculates an average value based on the read jitter by the same method as in the first embodiment, and executes an exclusion process using jitter until there is no optical disk device to be excluded (S3202). S3204). As a result, as in the first embodiment, it is possible to efficiently exclude an optical disc apparatus having characteristics deviating from the average reproduction quality based on jitter.

<Exclusion processing of optical disk device by beta (step 42)>
Step 43 in FIG. 12 will be described in detail with reference to FIG.

  FIG. 15 is a flowchart showing an example of the operation flow in step 43.

  The evaluation optical disk device 10_n that has executed the jitter exclusion process in step 42 executes the beta optical disk exclusion process, as in the first embodiment. First, the microcontroller 43 of the evaluation optical disk device 10_n reads beta at a predetermined recording speed of all the optical disk devices from the memory unit 44 (S4301). For example, the microcontroller 43 reads the betas of all the optical disk devices at the maximum recording speed. Then, the microcontroller 43 calculates an average value based on the read beta by the same method as in the first embodiment, and executes the exclusion process by beta until there is no optical disk device to be excluded (S3302). S3204). As a result, as in the first embodiment, it is possible to efficiently exclude optical disc apparatuses having characteristics deviating from the average reproduction quality based on beta.

<Optical Disc Device Exclusion Processing by β Margin (Step 44)>
Step 44 in FIG. 12 will be described in detail with reference to FIG.

  FIG. 16 is a flowchart showing an example of the operation flow in step 44.

  The micro controller 43 executes the process of excluding the optical disk apparatus by beta in the step 43, and then, for the optical disk apparatus that has not been excluded in the excluding processes of the above-described step 42 and step 43, the microcontroller 43 Perform exclusion process.

  First, the microcontroller 43 of the evaluation optical disk device 10_n selects one of the optical disk devices that calculate the β margin from the optical disk devices that were not excluded in the exclusion process in the above-described step 42 and step 43. The measurement result of the optical disk device is read (S3401). Next, the microcontroller 43 calculates a β margin based on the read measurement result (S4402). Then, the microcontroller 43 performs a process of excluding an optical disk device having a β margin equal to or less than the β margin threshold from the candidates for the optical disk device for write strategy adjustment by the same method as in the first embodiment. The process is executed for all optical disc apparatuses that are not excluded in the exclusion process in step 43 (S3403).

<Selection of Optical Strategy Device for Write Strategy Adjustment (Step 45)>
After executing the process of excluding the optical disk apparatus by the β margin in the above-described step 44, the microcontroller 43 executes a process of selecting an optical disk apparatus for write strategy adjustment from among the remaining optical disk apparatuses as candidates. Specifically, the microcontroller 43 selects an optical disk device for write strategy adjustment in ascending order of β margin at the predetermined recording speed calculated in step 44. As a result, as in the first embodiment, it is possible to select an optical disc apparatus suitable for adjusting the write strategy more accurately.

  By using the optical disk device selected by the above processing, the write strategy adjustment is executed by the same method as in the first embodiment, and the evaluation quality is confirmed to determine the write strategy adjustment optical disk device. .

  As described above, according to the third embodiment, a write strategy applicable to a plurality of optical disk devices can be generated, as in the first embodiment. Therefore, it is not necessary to optimize the write strategy for each optical disk device, and the write strategy is eliminated. Contributes to shortening the time required for adjustment. Further, by using the measurement result of one recording double speed in the exclusion process, the selection accuracy is not greatly reduced as compared with the selection method according to the first embodiment using all the measurement results of the recording double speed. The processing time required for the process can be greatly reduced.

<< Embodiment 4 >>
In the selection method of the optical disk device according to the first to third embodiments, jitter is used as one of the indexes representing the evaluation quality of the optical disk device. However, in the selection method according to the fourth embodiment, PI (Parity) is used instead of jitter. (Inner) The optical disc apparatus is selected using the error value. The PI error value is, for example, the number of internal code parity errors per ECC block.

  Specifically, in the fourth embodiment, each optical disk device records the PI error value together with the beta as a measurement result on the evaluation disk. The value of the PI error to be recorded is calculated based on the reproduction result of the evaluation disk by the microcontroller 43 in each optical disk device, for example.

  Further, the β margin in the fourth embodiment is calculated not from the value calculated from the jitter characteristic with respect to beta as shown in FIG. 3, but from the characteristic of the PI error value with respect to beta. The characteristic of the PI error value with respect to the beta is a characteristic curve similar to the characteristic 300 shown in FIG. Therefore, in the fourth embodiment, a target PI error value is used as a reference instead of the target jitter Jt that is used as a reference in calculating the β margin in the first to third embodiments. That is, in the selection method according to the fourth embodiment, a beta range that can take a PI error value that is equal to or less than the target PI error value is calculated as a β margin. The target PI error value is, for example, a value of 280 or less which is a standard value of PI error.

  A write strategy applicable to a plurality of optical disc apparatuses can be selected by selecting a write strategy adjusting optical disc apparatus by the same method as in the first to third embodiments using the PI error value instead of jitter as described above. And the same effects as those of the first to third embodiments can be obtained.

  Although the invention made by the present inventor has been specifically described based on the embodiments, it is needless to say that the present invention is not limited thereto and can be variously modified without departing from the gist thereof.

  For example, the signal processing LSI 4 is not limited to a single-chip semiconductor device, and each circuit such as the AFE 41 and the microcontroller 43 is formed of a separate semiconductor chip, and the SIP ( It may be configured in the form of System in Package) or MCM (Multi-chip Module).

  In the first to fourth embodiments, the case where the measurement results such as jitter and beta by the respective optical disk devices are recorded in the unrecorded area of the evaluation disk 400 is shown as an example. However, the present invention is not limited to this. May be connected to the program processing device, and the measurement result may be stored in a storage device of the program processing device. The program processing device is, for example, a PC (Personal Computer).

  Further, in the first to fourth embodiments, the program processing device can execute the exclusion processing and the selection processing instead of the signal processing LSI 4 so that the write strategy adjustment optical disc device can be selected. . For example, in FIG. 5, the program processing device acquires the measurement result of each optical disc device in step 31, and then the program processing device executes the processing of step 32 to step 35. According to this, similarly to the case where the signal processing LSI 4 performs, the program processing device can select an optical disc device for write strategy adjustment, which contributes to shortening the time required for write strategy adjustment.

10, 10_1 to 10_n Optical disk apparatus 1 Optical disk 2 Spindle motor 3 Optical pickup 4, 4_1 to 4_n Signal processing LSI
41 AFE (Analog Front End Circuit)
42 Signal Quality Measurement Circuit 43 Microcontroller 44 Memory Unit 45 Position Control Circuit 46 Laser Pulse Control Circuit 47 Motor Control Circuit 101 Motor Control Signal 102 Position Control Signal 103 Racer Pulse Control Signal 104 Electric Signal 105 Analog Signal 106 Measurement Result 107 Position Control Instruction 108 Laser pulse control instruction 109 Motor control instruction 300 Jitter vs. beta characteristic 301 β margin 400 Evaluation disk

Claims (21)

A semiconductor device mounted on an optical disc device for controlling writing and reading of data to and from the optical disc,
The semiconductor device includes a data processing control unit that executes data processing for the control;
A measurement unit that measures reproduction quality based on data read from the optical disc and measures beta and generates evaluation data for evaluating the reproduction quality;
The data processing control unit inputs the evaluation data corresponding to a plurality of other optical disk devices, determines an optical disk device deviating from a target evaluation quality based on the input evaluation data, and based on the determination result A semiconductor device that executes processing for selecting an optical disc device that is a candidate for adjusting the write strategy.   The data processing control unit calculates an average value of beta based on the evaluation data generated corresponding to the plurality of optical disc devices, and a predetermined range determined based on the calculated average value of beta The semiconductor device according to claim 1, wherein an optical disk device that is a beta deviating from the above is discriminated.   The semiconductor device according to claim 2, wherein the information indicating the reproduction quality is a jitter representing a phase shift width of a signal related to the read data.   The data processing control unit calculates an average value of the jitter based on the evaluation data generated corresponding to the plurality of optical disc apparatuses, and is determined based on the calculated average value of the jitter 4. The semiconductor device according to claim 3, wherein an optical disk device having the jitter deviating from the range is discriminated.   The data processing control unit calculates a margin indicating a range of beta that can take jitter that is equal to or less than a target jitter of reproduction quality based on the evaluation data generated for the plurality of optical disk devices. 5. The semiconductor device according to claim 3, wherein an optical disk device having a margin less than a predetermined threshold is determined.   The semiconductor device according to claim 2, wherein the information indicating the reproduction quality is a PI error value of the read data.   The data processing control unit calculates an average value of PI error values based on the evaluation data generated corresponding to the plurality of optical disc devices, and uses the calculated average value of PI error values as a reference The semiconductor device according to claim 6, wherein an optical disk device having a PI error value deviating from the determined predetermined range is determined.   The data processing control unit calculates a margin indicating a range of beta that can take a PI error value that is equal to or less than a PI error value that is a reproduction quality target, and the margin is a value smaller than a predetermined threshold value. 8. The semiconductor device according to claim 6, wherein a certain optical disk device is discriminated.   9. The data processing control unit according to claim 5 or 8, wherein the data processing control unit excludes the discriminated optical disc device from the candidates, and selects the candidate optical disc devices in order of increasing margin among optical disc devices that are not excluded. Semiconductor device. The evaluation data generated corresponding to the plurality of optical disk devices is generated for each recording speed,
The semiconductor device according to claim 9, wherein the data processing control unit executes the determination for each recording speed, and excludes the determined optical disk device at at least one recording speed.   11. The data processing control unit calculates an average value of the margins at all the recording speeds of the optical disk devices that are not excluded, and selects the candidate optical disk devices in ascending order of the calculated average value. The semiconductor device described.   The semiconductor device according to claim 9, wherein the evaluation data generated corresponding to the plurality of optical disk devices is data generated at a specific recording speed. An optical disk device selection method for selecting an optical disk device for adjusting a write strategy from a plurality of optical disk devices,
Each of the optical disk apparatuses reproduces an evaluation disk on which data for measuring the reproduction quality of the optical disk apparatus is recorded according to the laser power, measures information indicating the reproduction quality and beta, and includes an evaluation result. A first process for generating data;
A specific optical disk device or a specific program processing device among the plurality of optical disk devices inputs each evaluation data generated by the first processing, and adjusts a write strategy based on the input evaluation data A second process of selecting an optical disk device,
The second process includes, based on the input evaluation data, a third process of excluding an optical disk device deviating from a target evaluation quality from optical disk device candidates for adjusting the write strategy;
And a fourth process for selecting an optical disk apparatus for adjusting the write strategy from among the optical disk apparatuses not excluded in the third process.   The third process calculates an average value of beta at a predetermined laser power based on the input evaluation data, and the optical disc is a beta that deviates from a predetermined range determined based on the calculated average value of beta The optical disk apparatus selection method according to claim 13, further comprising: a fifth process of excluding an apparatus from the candidates.   15. The optical disk device selection method according to claim 14, wherein the information indicating the reproduction quality is jitter representing a phase shift of a signal related to the read data.   The third process calculates an average value of jitter at a predetermined laser power based on the input evaluation data, and is an optical disc that deviates from a predetermined range determined based on the calculated average value of jitter. The optical disk apparatus selection method according to claim 15, further comprising: a sixth process of excluding an apparatus from the candidates.   The third process calculates a margin representing a range of beta that can take jitter that is equal to or less than a jitter targeted for reproduction quality based on the input evaluation data, and the calculated margin is a predetermined threshold value. The optical disk apparatus selection method according to claim 15 or 16, further comprising: a seventh process of excluding an optical disk apparatus having a smaller value from the candidates.   15. The optical disk device selection method according to claim 14, wherein the information indicating the reproduction quality is a PI error value related to the read data.   The third process calculates an average value of the PI error values at a predetermined laser power based on the input evaluation data, and a predetermined range determined based on the calculated average value of PI errors The optical disk apparatus selection method according to claim 18, further comprising: a sixth process of excluding an optical disk apparatus having a PI error value deviating from the candidate from the candidates.   The third process calculates a margin indicating a range of beta that can take a PI error value that is equal to or less than a target value of reproduction quality based on the input evaluation data, and the calculated margin is predetermined. The optical disk apparatus selection method according to claim 18 or 19, further comprising: a seventh process of excluding an optical disk apparatus having a value smaller than the threshold value from the candidates.   21. The optical disk device selection according to claim 17 or 20, wherein the fourth process includes an eighth process of selecting the candidate optical disk devices in order of increasing margin, among optical disk devices not excluded in the third process. Method.

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