JP2011045950A - Working device for glass substrate, method of working glass substrate, glass substrate for magnetic disk or glass substrate for photomask manufactured by the method, and method of repeatedly working glass substrate - Google Patents
Working device for glass substrate, method of working glass substrate, glass substrate for magnetic disk or glass substrate for photomask manufactured by the method, and method of repeatedly working glass substrate Download PDFInfo
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Abstract
Description
本発明は、ガラス基板の加工装置、ガラス基板の加工製造方法、その方法により製造された磁気ディスク用ガラス基板またはフォトマスク用ガラス基板、及び繰り返しガラス基板を加工する方法に関する。 The present invention relates to a glass substrate processing apparatus, a glass substrate processing and manufacturing method, a magnetic disk glass substrate or a photomask glass substrate manufactured by the method, and a method of repeatedly processing a glass substrate.
近年ガラス基板は、従来の用途を越えて種々の産業分野において用いられ、例えば、種々の電子デバイスにおいては、用途に応じたガラス基板が用いられている。 In recent years, glass substrates have been used in various industrial fields beyond conventional applications. For example, glass substrates according to applications are used in various electronic devices.
例えば、パーソナルコンピュータ(PC)などには、外部記憶装置としてハードディスクドライブ(HDD)などが設けられている。通常、このハードディスクドライブには、コンピュータ用ストレージなどとして知られた磁気ディスクが搭載されている。この磁気ディスクは、例えばアルミニウム系合金基板などのような適宜の基板上に、磁性層等が成膜された構成のものである。 For example, a personal computer (PC) or the like is provided with a hard disk drive (HDD) or the like as an external storage device. Usually, this hard disk drive is equipped with a magnetic disk known as computer storage. This magnetic disk has a structure in which a magnetic layer or the like is formed on an appropriate substrate such as an aluminum alloy substrate.
近年、磁気ディスク用の基板には、脆弱な金属基板に代わって、高強度、かつ、高剛性な材料であるガラス基板が多用されてきている。また、サーバー用途としての磁気ディスク用基板としてガラス基板が注目されてきている。 In recent years, a glass substrate, which is a high-strength and high-rigidity material, has been widely used as a magnetic disk substrate in place of a fragile metal substrate. Further, glass substrates have attracted attention as magnetic disk substrates for server applications.
このようなガラス基板を製造するための加工装置としては図5に例示するような加工部100を有する両面加工装置が用いられる。この加工部100は、それぞれ所定の回転比率で回転駆動されるインターナルギヤ101とサンギヤ102を有するキャリア装着部と、このキャリア装着部を挟んで互いに逆回転駆動される金属製の上定盤103及び下定盤104とを有する。キャリア装着部には、インターナルギヤ101及びサンギヤ102と噛合する複数のキャリア107が装着されている。このキャリア107は自らの中心を軸に自転し、かつサンギヤ102を軸に公転する遊星歯車運動し、この遊星歯車運動によりキャリア107に装着されたガラス基板105の両面が上定盤103及び下定盤104との摩擦で同時に加工される。 As a processing apparatus for manufacturing such a glass substrate, a double-sided processing apparatus having a processing unit 100 as illustrated in FIG. 5 is used. The processing unit 100 includes a carrier mounting unit having an internal gear 101 and a sun gear 102 that are driven to rotate at a predetermined rotation ratio, and a metal upper surface plate 103 that is driven to rotate in reverse with the carrier mounting unit interposed therebetween. And a lower surface plate 104. A plurality of carriers 107 that mesh with the internal gear 101 and the sun gear 102 are mounted on the carrier mounting portion. The carrier 107 rotates on its own axis and rotates in a planetary gear that revolves around the sun gear 102. By this planetary gear movement, both surfaces of the glass substrate 105 mounted on the carrier 107 are the upper surface plate 103 and the lower surface plate. It is processed at the same time by friction with 104.
この両面加工装置は3.0μm以上の大きな砥粒と硬い上下定盤103、104を用いて速い加工速度で平坦度を矯正するラップ工程と2.0μm以下の小さな砥粒とウレタン製研磨パッドが貼られた上下定盤103、104を用いてラップ工程よりも遅い加工速度で鏡面加工する研磨工程に使用される。 This double-sided processing machine has a lapping process for correcting the flatness at a high processing speed using large abrasive grains of 3.0 μm or more and hard upper and lower surface plates 103, 104, small abrasive grains of 2.0 μm or less, and a urethane polishing pad. It is used in a polishing process in which mirror processing is performed at a processing speed slower than the lapping process using the attached upper and lower surface plates 103 and 104.
しかしながらこの両面加工装置においては、スラリーもしくはクーラントに異物が混入しガラス基板表面に傷が発生するという問題があった。この異物は上下定盤103、104の磨耗屑であったり、ギアの磨耗屑、スラリーもしくはクーラントの供給経路上に設けられた汲み上げポンプなど装置から発塵する金属屑であったりする。 However, this double-sided processing apparatus has a problem in that foreign matter is mixed into the slurry or coolant and the surface of the glass substrate is damaged. This foreign matter may be wear debris on the upper and lower surface plates 103 and 104, or wear debris from the gear, metal debris generated from a device such as a pumping pump provided on the supply path of slurry or coolant.
特にガラス基板が硬い定盤もしくは硬質研磨パッドに直接接触するラップ工程では異物が混入した際に10μm以上の亀裂深さをもった傷が発生しやすく、加工中に割れが発生したり、後の研磨工程で傷が除去できず、最終検査段階で不良と判定されてしまう場合があった。そこで特許文献1及び2では、循環経路内にマグネットストレーナを配置して異物を除去する方法が提案されている。 In particular, in the lapping process in which the glass substrate is in direct contact with a hard surface plate or a hard polishing pad, a flaw having a crack depth of 10 μm or more is likely to occur when foreign matter is mixed in, and cracks may occur during processing. In some cases, scratches could not be removed in the polishing process, and it was determined to be defective at the final inspection stage. Therefore, Patent Documents 1 and 2 propose a method of removing a foreign substance by arranging a magnet strainer in a circulation path.
しかしながら、特許文献1及び2に記載の循環経路内にマグネットストレーナを配置する方法では金属製ギアの磨耗屑、金属定盤の磨耗屑が磁石に多量に付着し、使用後直ぐに捕集効率の低下、配管の詰まりが発生し取り除くことが困難であった。また磁石が直接水を主たる分散媒とするスラリーまたはクーラントに触れるため磁石自身が容易に変質し、磁力の低下も発生するため継続的な運用が困難であった。 However, in the method of disposing a magnet strainer in the circulation path described in Patent Documents 1 and 2, a large amount of metal gear wear debris and metal surface plate wear debris adhere to the magnet, and the collection efficiency decreases immediately after use. The pipes were clogged and difficult to remove. In addition, since the magnet directly touches the slurry or coolant containing water as the main dispersion medium, the magnet itself easily changes in quality and the magnetic force decreases, making continuous operation difficult.
そこで、本発明は、上記した事情に鑑み、金属異物を除去することによりガラス基板の傷の発生を低減できるガラス基板の加工装置、ガラス基板の加工方法、その方法により製造された磁気ディスク用ガラス基板またはフォトマスク用ガラス基板、及び繰り返しガラス基板を加工する方法を提供することを目的とする。 Therefore, in view of the circumstances described above, the present invention provides a glass substrate processing apparatus, a glass substrate processing method, and a magnetic disk glass manufactured by the method, which can reduce the occurrence of scratches on the glass substrate by removing metallic foreign objects. It is an object of the present invention to provide a method for processing a substrate or a glass substrate for a photomask and a glass substrate repeatedly.
本発明は、上定盤と下定盤との間に保持したガラス基板をスラリーまたはクーラントを供給しながら加工するガラス基板の加工装置であって、前記スラリーまたは前記クーラントが循環する循環経路中に剥離可能な被覆材で被覆された磁石を備えたことを特徴とするガラス基板の加工装置を提供する。
また、前記加工装置において、前記被覆材は樹脂であることが好ましく、さらに前記樹脂がポリエチレン、ポリ塩化ビニリデン、ポリプロピレン、ポリフッ化ビニリデン、ポリ塩化ビニル、ポリビニルアルコール、ポリエチレンテレフタラート、ポリトリメチレンテレフタラート、ポリブチレンテレフタラートおよびポリアクリルからなる群から選ばれる1種以上の樹脂であることが好ましい。
また、前記加工装置において、前記磁石が永久磁石であることが好ましい。
また、前記加工装置において、前記永久磁石の磁束密度が1000ガウス以上、14000ガウス以下であることが好ましく、さらに9000ガウス以上、14000ガウス以下であることが好ましい。
また、前記加工装置において、スラリーがシリカ砥粒、セリア砥粒、アルミナ砥粒、ジルコニア砥粒、炭化ケイ素砥粒、ダイヤモンド砥粒のいずれかを含み水を分散媒とするスラリーであることが好ましい。
また、前記加工装置が前記ガラス基板の上下面を同時に加工可能な両面加工装置であることが好ましい。
また、前記加工装置において、前記上定盤と前記下定盤が鋳鉄からなることが好ましい。
The present invention is a glass substrate processing apparatus for processing a glass substrate held between an upper surface plate and a lower surface plate while supplying slurry or coolant, and is peeled off in a circulation path through which the slurry or the coolant circulates. There is provided a glass substrate processing apparatus comprising a magnet coated with a possible covering material.
In the processing apparatus, the coating material is preferably a resin, and the resin is polyethylene, polyvinylidene chloride, polypropylene, polyvinylidene fluoride, polyvinyl chloride, polyvinyl alcohol, polyethylene terephthalate, polytrimethylene terephthalate. It is preferably one or more resins selected from the group consisting of polybutylene terephthalate and polyacryl.
Moreover, in the said processing apparatus, it is preferable that the said magnet is a permanent magnet.
Moreover, in the said processing apparatus, it is preferable that the magnetic flux density of the said permanent magnet is 1000 gauss or more and 14000 gauss or less, Furthermore, it is preferable that it is 9000 gauss or more and 14000 gauss or less.
Moreover, in the said processing apparatus, it is preferable that a slurry is a slurry which contains any one of a silica abrasive grain, a ceria abrasive grain, an alumina abrasive grain, a zirconia abrasive grain, a silicon carbide abrasive grain, and a diamond abrasive grain, and uses water as a dispersion medium. .
Moreover, it is preferable that the said processing apparatus is a double-sided processing apparatus which can process the upper and lower surfaces of the said glass substrate simultaneously.
Moreover, in the said processing apparatus, it is preferable that the said upper surface plate and the said lower surface plate consist of cast iron.
また、本発明は、上定盤と下定盤との間にガラス基板を保持してスラリーまたはクーラントを供給しながらガラス基板を加工するガラス基板の加工方法であって、
剥離可能な被覆材で被覆された磁石が配設された循環経路を循環するスラリーまたはクーラントを前記上定盤と前記下定盤との間に供給することを特徴とするガラス基板の加工方法を提供する。
また、前記加工方法において、前記被覆材は樹脂であることが好ましく、さらに前記樹脂がポリエチレン、ポリ塩化ビニリデン、ポリプロピレン、ポリフッ化ビニリデン、ポリ塩化ビニル、ポリビニルアルコール、ポリエチレンテレフタラート、ポリトリメチレンテレフタラート、ポリブチレンテレフタラートおよびポリアクリルからなる群から選ばれる1種以上の樹脂であることが好ましい。
また、前記加工方法において、前記磁石が永久磁石であることが好ましい。
また、前記加工方法において、前記永久磁石の磁束密度が1000ガウス以上、14000ガウス以下であることが好ましく、さらに9000ガウス以上、14000ガウス以下であることが好ましい。
また、前記加工方法において、前記スラリーがシリカ砥粒、セリア砥粒、アルミナ砥粒、ジルコニア砥粒、炭化ケイ素砥粒、ダイヤモンド砥粒のいずれかを含み水を分散媒とするスラリーであることが好ましい。
また、前記加工方法において、前記ガラス基板の上下面を同時に加工することが好ましい。
また、前記上定盤と前記下定盤が鋳鉄からなることが好ましい。
Further, the present invention is a glass substrate processing method for processing a glass substrate while supplying a slurry or a coolant while holding the glass substrate between an upper surface plate and a lower surface plate,
Provided is a method for processing a glass substrate, characterized in that a slurry or coolant circulating through a circulation path provided with a magnet coated with a peelable coating material is supplied between the upper surface plate and the lower surface plate. To do.
In the processing method, the coating material is preferably a resin, and the resin is polyethylene, polyvinylidene chloride, polypropylene, polyvinylidene fluoride, polyvinyl chloride, polyvinyl alcohol, polyethylene terephthalate, polytrimethylene terephthalate. It is preferably one or more resins selected from the group consisting of polybutylene terephthalate and polyacryl.
In the processing method, the magnet is preferably a permanent magnet.
In the processing method, the magnetic flux density of the permanent magnet is preferably 1000 gauss or more and 14000 gauss or less, more preferably 9000 gauss or more and 14000 gauss or less.
Further, in the processing method, the slurry is a slurry containing any one of silica abrasive grains, ceria abrasive grains, alumina abrasive grains, zirconia abrasive grains, silicon carbide abrasive grains, and diamond abrasive grains and using water as a dispersion medium. preferable.
Moreover, in the said processing method, it is preferable to process the upper and lower surfaces of the said glass substrate simultaneously.
Moreover, it is preferable that the said upper surface plate and the said lower surface plate consist of cast iron.
また、本発明は、前記加工方法を用いて繰り返しガラス基板を加工する方法であって、前記加工方法を用いてガラス基板を加工した後に、磁性異物が付着した前記被覆材を磁石から剥離し、磁性異物が付着していない剥離可能な被覆材でその磁石を被覆し、この剥離可能な被覆材で被覆された磁石を用いて前記加工方法によりガラス基板を加工することを特徴とする繰り返しガラス基板を加工する方法を提供する。 Further, the present invention is a method of repeatedly processing a glass substrate using the processing method, after processing the glass substrate using the processing method, after peeling the coating material adhered with magnetic foreign matter from the magnet, A repetitive glass substrate characterized in that the magnet is coated with a peelable coating material to which no magnetic foreign matter is attached, and the glass substrate is processed by the processing method using the magnet coated with the peelable coating material. Provide a method of processing.
また、本発明は、前記加工方法を用いて製造された磁気ディスク用ガラス基板またはフォトマスク用ガラス基板を提供する。 Moreover, this invention provides the glass substrate for magnetic discs or the glass substrate for photomasks manufactured using the said processing method.
本発明のガラス基板の加工装置、ガラス基板の加工方法、及び繰り返しガラス基板を加工する方法によれば樹脂を剥がすだけで容易に磁性異物を除去することが可能で、異物の捕集効率の低下や配管の発生を減少させる事ができる。また磁石が直接スラリーまたはクーラントに触れる事がないので酸化による変質や、磁力の低下も発生しない。よって効率的かつ継続的に磁性異物の除去が可能になる。 According to the glass substrate processing apparatus, the glass substrate processing method, and the method of repeatedly processing a glass substrate of the present invention, magnetic foreign matters can be easily removed simply by removing the resin, and the foreign matter collecting efficiency is reduced. And the occurrence of piping can be reduced. In addition, since the magnet does not directly contact the slurry or coolant, neither alteration due to oxidation nor reduction in magnetic force occurs. Therefore, the magnetic foreign matter can be removed efficiently and continuously.
以下、本発明の加工装置の一実施形態について、図面を参照しながら詳細に説明する。以下の説明において加工装置としてガラス基板の上下面を同時に加工できる両面加工装置を例示する。 Hereinafter, an embodiment of a processing apparatus of the present invention will be described in detail with reference to the drawings. In the following description, a double-sided processing apparatus capable of simultaneously processing the upper and lower surfaces of a glass substrate will be exemplified as a processing apparatus.
両面加工装置10は、図5で示したように、それぞれ所定の回転比率で回転駆動されるインターナルギヤ101とサンギヤ102を有するキャリア装着部と、このキャリア装着部を挟んで互いに逆回転駆動され鋳鉄等の金属からなる上定盤103及び下定盤104とを有する加工部100を備えて構成され、キャリア装着部には、インターナルギヤ101及びサンギヤ102と噛合する複数のキャリア107が装着されている。このキャリア107は自らの中心を軸に自転し、かつサンギヤ102を軸に公転する遊星歯車運動し、この遊星歯車運動によりキャリア107に装着されて、上定盤103と下定盤104との間に保持されたガラス基板105の両面が上定盤103及び下定盤104との摩擦で同時に加工される。 As shown in FIG. 5, the double-sided processing apparatus 10 is driven in reverse rotation with respect to each other with a carrier mounting portion having an internal gear 101 and a sun gear 102 that are driven to rotate at a predetermined rotation ratio, and the carrier mounting portion. A processing unit 100 having an upper surface plate 103 and a lower surface plate 104 made of a metal such as cast iron is provided, and a plurality of carriers 107 meshing with the internal gear 101 and the sun gear 102 are mounted on the carrier mounting portion. Yes. The carrier 107 rotates on the center of its own axis and moves in a planetary gear that revolves around the sun gear 102. The carrier 107 is attached to the carrier 107 by this planetary gear movement, and is interposed between the upper surface plate 103 and the lower surface plate 104. Both surfaces of the held glass substrate 105 are simultaneously processed by friction with the upper surface plate 103 and the lower surface plate 104.
上下定盤103、104は、上下定盤103、104間に供給される砥粒を含むスラリーによりガラス基板105の両面を加工するか、若しくは、砥粒を含有するセラミックもしくは樹脂が上下定盤103、104に固定され、水を主たる成分とするクーラントを供給しながらガラス基板105の両面を加工する。 The upper and lower surface plates 103 and 104 are formed by processing both surfaces of the glass substrate 105 with slurry containing abrasive grains supplied between the upper and lower surface plates 103 or 104, or ceramic or resin containing abrasive grains is used for the upper and lower surface plates 103. , 104, and both surfaces of the glass substrate 105 are processed while supplying a coolant mainly composed of water.
図1及び図2に示すように、上下定盤103、104の左下方には、スラリー又はクーラントを貯留する貯留室11が設けられ、貯留室11に貯留したスラリー又はクーラントは汲み上げポンプ12により第1配管13を通って上下定盤103、104間に供給され、上下定盤103、104間に供給されたスラリー又はクーラントは第2配管14を通って貯留室11に排出され、両面加工装置10内をスラリー又はクーラントが循環するように構成されている。なお、貯留室11には貯留したスラリー又はクーラントを攪拌する攪拌翼15が設けられている。 As shown in FIGS. 1 and 2, a storage chamber 11 for storing slurry or coolant is provided at the lower left of the upper and lower surface plates 103 and 104, and the slurry or coolant stored in the storage chamber 11 is pumped by a pumping pump 12. The slurry or coolant supplied between the upper and lower surface plates 103 and 104 through one pipe 13 and discharged between the upper and lower surface plates 103 and 104 is discharged to the storage chamber 11 through the second pipe 14, and the double-side processing apparatus 10. The slurry or coolant is configured to circulate inside. The storage chamber 11 is provided with a stirring blade 15 for stirring the stored slurry or coolant.
ここで、スラリー又はクーラントの循環経路上、本実施形態では、貯留室11と第2配管14との接続部に、剥離可能な樹脂18により被覆された永久磁石16がかご17内に配設されている。なお、この被覆はスラリーまたはクーラントが永久磁石16に直接接触しないようにする。また、被覆材として樹脂18を例示したがこれに限定されず、非磁性且つ防水性を有し、且つ、剥離可能な任意の被覆材を用いることができる。また、被覆材はフィルム状、袋状など剥離可能であればその形態を問わない。樹脂18としては、ポリエチレン、ポリプロピレン、ポリ塩化ビニリデン、ポリフッ化ビニリデン、ポリ塩化ビニル、ポリビニルアルコール、ポリエチレンテレフタラート、ポリトリメチレンテレフタラート、ポリブチレンテレフタラート、ポリアクリル等を用いることができる。また、磁石は永久磁石に限らず、電磁石を用いてもよい。また、スラリー又はクーラントの循環経路上であれば、貯留室11と第2配管14との接続部に限定されず、第1配管13中、第2配管14中、貯留室11中など任意の場所に配設することができる。 Here, on the circulation path of the slurry or coolant, in this embodiment, a permanent magnet 16 covered with a peelable resin 18 is disposed in the car 17 at the connecting portion between the storage chamber 11 and the second pipe 14. ing. This coating prevents the slurry or coolant from contacting the permanent magnet 16 directly. Moreover, although resin 18 was illustrated as a coating | covering material, it is not limited to this, Arbitrary coating | covering materials which are non-magnetic and waterproof and can be peeled can be used. The covering material may be in any form as long as it can be peeled off, such as a film or bag. Examples of the resin 18 include polyethylene, polypropylene, polyvinylidene chloride, polyvinylidene fluoride, polyvinyl chloride, polyvinyl alcohol, polyethylene terephthalate, polytrimethylene terephthalate, polybutylene terephthalate, and polyacryl. The magnet is not limited to a permanent magnet, and an electromagnet may be used. Moreover, as long as it is on the circulation path | route of a slurry or coolant, it is not limited to the connection part of the storage chamber 11 and the 2nd piping 14, Arbitrary places, such as in the 1st piping 13, the 2nd piping 14, and the storage chamber 11 Can be arranged.
永久磁石は、ネオジウム磁石、フェライト磁石など公知の永久磁石を用いることができ、1000ガウス以上、14000ガウス以下であることが好ましく、9000ガウス以上、14000ガウス以下であることが更に好ましい。 As the permanent magnet, a known permanent magnet such as a neodymium magnet or a ferrite magnet can be used. The permanent magnet is preferably 1000 gauss or more and 14000 gauss or less, more preferably 9000 gauss or more and 14000 gauss or less.
このように構成された本実施形態の両面加工装置10においては、貯留室11に貯留したスラリー又はクーラントを供給しながらガラス基板105のラッピング、研磨などを行なうことができる。
このとき、循環するスラリー又はクーラントは貯留室11と第2配管14との接続部に配設され樹脂18により被覆された永久磁石16近傍を通過するため、スラリー又はクーラント内に混入した金属屑が永久磁石16の磁力により樹脂18表面に付着する。そして、定期的に、又は、金属屑が溜まったときに随時樹脂18を剥がして交換することにより、スラリー又はクーラント内に混入した金属屑が除去され、スラリー又はクーラント内に金属屑が混入することによりガラス基板105に発生する傷を低減することができる。
In the double-sided processing apparatus 10 of the present embodiment configured as described above, the glass substrate 105 can be lapped and polished while supplying the slurry or coolant stored in the storage chamber 11.
At this time, since the circulating slurry or coolant passes through the vicinity of the permanent magnet 16 disposed at the connection portion between the storage chamber 11 and the second pipe 14 and covered with the resin 18, the metal scrap mixed in the slurry or coolant is removed. It adheres to the surface of the resin 18 by the magnetic force of the permanent magnet 16. Then, the metal waste mixed in the slurry or the coolant is removed by peeling or replacing the resin 18 at regular intervals or when the metal waste accumulates, and the metal waste is mixed in the slurry or the coolant. Thus, scratches generated on the glass substrate 105 can be reduced.
続いて、本発明のガラス基板の製造方法の一実施形態について図3のフローチャートを参照しながら説明する。本実施形態のガラス基板105の製造方法は、
(1)形状加工工程(S1)と、
(2)ラップ工程(S2)と、
(3)第1洗浄工程(S3)と、
(4)第1ポリッシング工程(S4)と、
(5)第2洗浄工程(S5)と、
(6)第2ポリッシング工程(S6)と、
(7)第3洗浄工程(S7)と、を有している。
Next, an embodiment of the glass substrate manufacturing method of the present invention will be described with reference to the flowchart of FIG. The manufacturing method of the glass substrate 105 of this embodiment is as follows.
(1) Shape processing step (S1);
(2) Lapping step (S2);
(3) a first cleaning step (S3);
(4) first polishing step (S4);
(5) a second cleaning step (S5);
(6) Second polishing step (S6);
(7) a third cleaning step (S7).
形状加工工程(S1)は、円形のガラス基板105(例えばφ65mmのガラス基板)を準備する工程であって、矩形の板ガラスの中央に貫通孔(内孔)を形成し、円形のガラスに加工する切り出し工程と、切り出した円形のガラスのエッジ(主表面と貫通孔を形成する内周端面との交線及び主表面と外周端面との交点)に面取り処理を施す面取り工程と、内周および外周を鏡面に研磨する工程とを有する。ここで、主表面とは、ガラス基板105の表面及び裏面を含めた環状部分をいう。 The shape processing step (S1) is a step of preparing a circular glass substrate 105 (for example, a glass substrate having a diameter of 65 mm), and a through hole (inner hole) is formed at the center of a rectangular plate glass and processed into a circular glass. Cutting step, chamfering step of chamfering the cut circular glass edge (intersection line between main surface and inner peripheral end surface forming through-hole and intersection point of main surface and outer peripheral end surface), inner periphery and outer periphery Polishing to a mirror surface. Here, the main surface refers to an annular portion including the front surface and the back surface of the glass substrate 105.
ラップ工程(S2)は両面加工装置10でガラス基板105の厚みを最終製品厚みの110%以下(最終板厚が635μmの場合には699μm以下、最終板厚が800μmの場合には880μm以下)まで整える研削工程を有する。 In the lapping step (S2), the thickness of the glass substrate 105 is reduced to 110% or less of the final product thickness with the double-sided processing apparatus 10 (699 μm or less when the final plate thickness is 635 μm, 880 μm or less when the final plate thickness is 800 μm). It has a grinding process to prepare.
具体的にはラップ工程(S2)では、遊離砥粒ラップの場合は平均粒径が3.0μm〜40μmであるアルミナ砥粒、ジルコニア砥粒、炭化珪素砥粒、ダイヤモンド砥粒のいずれかを含有する水を主たる分散媒とするスラリーを供給しながら金属定盤、例えば鋳鉄定盤を用いて研削する。固定砥粒ラップの場合は平均粒径が3.0μm〜40μmであるアルミナ砥粒、ジルコニア砥粒、炭化珪素砥粒、ダイヤモンド砥粒のいずれかを含有するセラミックもしくは樹脂が両面加工装置10の上下定盤103、104に固定され、水を主たる成分とするクーラントを流しながらガラス基板105の上下面が研削される。 Specifically, in the lapping step (S2), in the case of loose abrasive lapping, any one of alumina abrasive grains, zirconia abrasive grains, silicon carbide abrasive grains, and diamond abrasive grains having an average particle diameter of 3.0 μm to 40 μm is contained. Grinding is performed using a metal surface plate, for example, a cast iron surface plate, while supplying a slurry having water as a main dispersion medium. In the case of a fixed abrasive wrap, ceramic or resin containing any one of alumina abrasive grains, zirconia abrasive grains, silicon carbide abrasive grains, and diamond abrasive grains having an average particle diameter of 3.0 μm to 40 μm is formed on the upper and lower sides of the double-side processing apparatus 10. The upper and lower surfaces of the glass substrate 105 are ground while flowing a coolant which is fixed to the surface plates 103 and 104 and mainly contains water.
続いて、第1洗浄工程(S3)において、ラップ工程(S2)を終えたガラス基板105を洗浄する。例えば、水、洗剤、強酸もしくは強アルカリを用いた超音波洗浄を行う。 Subsequently, in the first cleaning step (S3), the glass substrate 105 that has finished the lapping step (S2) is cleaned. For example, ultrasonic cleaning using water, detergent, strong acid or strong alkali is performed.
第1ポリッシング工程(S4)では、両面加工装置10でセリアスラリーを供給しながらガラス基板105の主表面を研磨処理することで、ラップ工程において板状ガラスの主表面に形成されていた微細な凹凸形状を低減させ鏡面化された主表面を得ることができる。より具体的には平均粒径0.1μm〜2.0μmのセリア砥粒を水に分散させたセリアスラリーを用い上下定盤103、104に硬質発泡ウレタンパッドやスエード状ウレタンパッドを貼り付けた両面加工装置10を用いてガラス基板105を研磨し鏡面加工を行う。 In the first polishing step (S4), the main surface of the glass substrate 105 is polished while the ceria slurry is supplied by the double-sided processing apparatus 10, so that fine irregularities formed on the main surface of the sheet glass in the lapping step The shape can be reduced to obtain a mirrored main surface. More specifically, both surfaces of a hard foamed urethane pad or a suede-like urethane pad attached to the upper and lower surface plates 103 and 104 using ceria slurry in which ceria abrasive grains having an average particle size of 0.1 μm to 2.0 μm are dispersed in water. The glass substrate 105 is polished using the processing apparatus 10 to perform mirror finishing.
続いて、第2洗浄工程(S5)において、第1ポリッシング工程(S4)を終えたガラス基板を洗浄する。例えば、水、洗剤、強酸もしくは強アルカリを用いた超音波洗浄を行う。 Subsequently, in the second cleaning step (S5), the glass substrate after the first polishing step (S4) is cleaned. For example, ultrasonic cleaning using water, detergent, strong acid or strong alkali is performed.
第2ポリッシング工程(S6)では、両面加工装置10にシリカスラリーを供給しながらガラス基板105の主表面を研磨処理することで、主表面の算術平均粗さ(Ra)を0.3nm以下に整える。より具体的には平均粒径0.005μm〜0.1μmのコロイダルシリカ砥粒を水に分散させたシリカスラリーを用い上下定盤103、104にスエード状ウレタンパッドを貼り付けた両面加工装置10を用いてガラス基板105を研磨し粗さを整える。 In the second polishing step (S6), the main surface of the glass substrate 105 is polished while supplying silica slurry to the double-sided processing apparatus 10, thereby adjusting the arithmetic average roughness (Ra) of the main surface to 0.3 nm or less. . More specifically, the double-sided processing apparatus 10 in which a suede-like urethane pad is attached to the upper and lower surface plates 103 and 104 using a silica slurry in which colloidal silica abrasive grains having an average particle diameter of 0.005 μm to 0.1 μm are dispersed in water. The glass substrate 105 is polished to adjust the roughness.
続いて、第3洗浄工程(S7)において、第2ポリッシング工程(S6)を終えたガラス基板105を洗浄する。例えば、水、洗剤、強酸もしくは強アルカリを用いた超音波洗浄を行う。 Subsequently, in the third cleaning step (S7), the glass substrate 105 after the second polishing step (S6) is cleaned. For example, ultrasonic cleaning using water, detergent, strong acid or strong alkali is performed.
ここで、(S1)〜(S7)の一連のガラス基板105の加工方法を所定回数繰り返した後、永久磁石16を被覆する樹脂18を剥がして再度新たな樹脂18で被覆することにより樹脂18の交換がなされ、吸着した金属屑が樹脂18とともに排除される。 Here, after a series of processing methods of the glass substrate 105 of (S1) to (S7) are repeated a predetermined number of times, the resin 18 that covers the permanent magnet 16 is peeled off, and then the resin 18 is coated again with a new resin 18. Exchange is performed, and the adhering metal waste is removed together with the resin 18.
このように、両面加工装置10を繰り返し使用中に樹脂18を交換することで、容易に磁性異物を清掃することが可能で、異物の捕集効率の低下や配管の詰まりを発生させることがない。また永久磁石18が直接スラリー又はクーラントに触れることがないので酸化による変質や、磁力の低下も発生しない。よって効率的かつ継続的に磁性異物の除去が可能になる。 In this way, by replacing the resin 18 during repeated use of the double-sided processing apparatus 10, it is possible to easily clean the magnetic foreign matter without causing a decrease in foreign matter collection efficiency and clogging of piping. . Further, since the permanent magnet 18 does not directly contact the slurry or the coolant, neither alteration due to oxidation nor reduction in magnetic force occurs. Therefore, the magnetic foreign matter can be removed efficiently and continuously.
なお、本発明におけるガラス基板の製造方法はこのようなものに限定されず、少なくとも1回のラップ工程又はポリッシング工程を備えていればよく、追加の形状加工工程、主表面のポリッシング工程、洗浄工程、強化工程などを備えていてもよい。 In addition, the manufacturing method of the glass substrate in this invention is not limited to such a thing, What is necessary is just to provide the lapping process or polishing process of at least 1 time, an additional shape processing process, the polishing process of a main surface, a washing process Further, a strengthening process or the like may be provided.
また、本発明のガラス基板の製造方法は、いずれのスラリー、クーラントを用いるガラス加工装置に用いる事もできるが、特にガラス基板の上下面同時に加工可能な両面加工装置10では片面の加工装置に比して加工抵抗が高くギアや上下定盤103、104から異物が発生しやすくなるためより好適に用いられる。 In addition, the glass substrate manufacturing method of the present invention can be used in any slurry and coolant glass processing apparatus, but the double-sided processing apparatus 10 capable of simultaneously processing the upper and lower surfaces of the glass substrate is particularly compared with a single-sided processing apparatus. Therefore, since the processing resistance is high and foreign matters are likely to be generated from the gears and the upper and lower surface plates 103 and 104, they are more preferably used.
また、本発明のガラス基板の製造方法は、いずれの砥粒、いずれの材質の上下定盤103、104を用いたガラスの加工装置に用いる事も出来る。ガラス基板をアルミナ砥粒または炭化珪素砥粒のいずれかを含むスラリーを用い鋳鉄定盤で挟んでラップ加工を施す両面加工装置ではより鋳鉄定盤の磨耗が激しく大量の金属磨耗屑が発生するため好適に用いられる。 Moreover, the manufacturing method of the glass substrate of this invention can also be used for the glass processing apparatus using the upper and lower surface plates 103 and 104 of any abrasive grain and any material. In a double-sided processing machine that uses a slurry containing either alumina abrasive grains or silicon carbide abrasive grains and lapping with a cast iron platen, the cast iron platen wears more severely and a large amount of metal wear debris is generated. Preferably used.
また本発明のガラス基板の加工装置及び製造方法は磁気ディスク用、フォトマスク用、液晶テレビ用、平面レンズ用いずれのガラス基板の製造にも用いる事が出来るがより好適には微小な欠点が性能に影響する磁気ディスク用、フォトマスク用ガラス基板の製造に好的に用いられる。 In addition, the glass substrate processing apparatus and manufacturing method of the present invention can be used for manufacturing glass substrates for magnetic disks, photomasks, liquid crystal televisions, and flat lenses. It is preferably used for the production of glass substrates for magnetic disks and photomasks that affect the magnetic field.
以下、本実施例及び比較例を挙げることにより、本発明を具体的に説明する。なお、本発明は、これら実施例の構成に限定されるものではない。
[磁性異物捕集性能確認試験]
磁性異物の捕集性能を確認するために大型の両面加工装置(22B:22インチのキャリアを搭載可能な両面加工装置)を用いて以下の磁性異物捕集性能確認試験を行った。試験には直径2.5インチ、厚み約800μmの磁気ディスク用ガラス基板を用意した。またスラリーには平均径7μm程度のアルミナ砥粒を水に分散させたスラリーを用い、上下定盤は溝加工が施された鋳鉄定盤を用いた。加工圧力は7kPaとし、厚みが670μm程度になるようラップ加工を行った。
Hereinafter, the present invention will be specifically described by giving examples and comparative examples. In addition, this invention is not limited to the structure of these Examples.
[Magnetic foreign matter collection performance confirmation test]
In order to confirm the collection performance of the magnetic foreign matter, the following magnetic foreign matter collection performance confirmation test was performed using a large double-sided processing device (22B: a double-sided processing device capable of mounting a 22-inch carrier). For the test, a glass substrate for a magnetic disk having a diameter of 2.5 inches and a thickness of about 800 μm was prepared. The slurry used was a slurry in which alumina abrasive grains having an average diameter of about 7 μm were dispersed in water, and the upper and lower surface plates were cast iron surface plates with grooves. Lapping was performed so that the processing pressure was 7 kPa and the thickness was about 670 μm.
またラップ加工を行った基板は次に洗浄が実施された後、セリアスラリーによる研磨が実施され厚みが640μm程度の鏡面加工された基板となった。その後再度洗浄が実施され、シリカスラリーによる研磨で粗さが整えられた後、最終洗浄が実施された。最終洗浄が終わった後、全ての基板は欠点検査が実施された。なお、この一連の加工工程を以下、1バッチと呼ぶ。 The lapped substrate was then cleaned and then polished with ceria slurry to give a mirror-finished substrate having a thickness of about 640 μm. Thereafter, cleaning was performed again, and after the roughness was adjusted by polishing with silica slurry, final cleaning was performed. After the final cleaning, all substrates were inspected for defects. This series of processing steps is hereinafter referred to as one batch.
実施例1においては、図2に示すように貯留室11と第2配管14との接続部に市販のポリ塩化ビニリデンフィルムで包んだ9000ガウスのネオジウム磁石を配した。比較例1においては上記と同じ場所に樹脂で被覆しない9000ガウスのネオジウム磁石を配した以外は実施例1と同様の条件とした。実施例2においては実施例1と同じ場所にポリ塩化ビニリデンフィルムで被覆した1300ガウスのフェライト磁石を配した以外は実施例1と同様の条件とした。比較例2においては循環経路上に磁石を配置しなかった以外は実施例1と同様の条件とした。 In Example 1, as shown in FIG. 2, a 9000 Gauss neodymium magnet wrapped with a commercially available polyvinylidene chloride film was disposed at the connecting portion between the storage chamber 11 and the second pipe 14. In Comparative Example 1, the same conditions as in Example 1 were used except that a 9000 Gauss neodymium magnet not coated with resin was placed in the same place as above. In Example 2, the same conditions as in Example 1 were used except that a 1300 gauss ferrite magnet coated with a polyvinylidene chloride film was disposed at the same place as in Example 1. In Comparative Example 2, the conditions were the same as in Example 1 except that no magnet was disposed on the circulation path.
実施例1および2については20バッチ加工後毎に磁石のポリ塩化ビニリデンフィルムを交換し、その付着磁性異物を乾燥させ重量も測定した。比較例1については20バッチ加工後毎に磁石を水で洗浄し、洗浄で落ちた付着磁性異物を乾燥させ重量を測定した。ラップ工程に於ける磁性異物捕集性能確認試験の結果を表1に示す。 In Examples 1 and 2, the magnet polyvinylidene chloride film was replaced every 20 batches after processing, the adhered magnetic foreign matter was dried, and the weight was also measured. For Comparative Example 1, the magnet was washed with water every 20 batches after processing, and the adhered magnetic foreign matter dropped by washing was dried and the weight was measured. Table 1 shows the results of the magnetic foreign matter collecting performance confirmation test in the lapping process.
実施例1のネオジウム磁石をポリ塩化ビニリデンフィルムで被覆した場合は継続的に20g程度の磁性異物が除去可能であった。比較例1では実施例1に比べ磁石に付着した磁性異物が除去できないため、次第に磁性異物が磁石に付着しにくくなり、41バッチ以降はほとんど磁性異物を除去する事ができなかった。実施例2ではネオジウム磁石に比べ磁性異物付着量は少なかったが、実施例1と同様に安定的に継続して磁性異物を除去する事が可能であった。 When the neodymium magnet of Example 1 was covered with a polyvinylidene chloride film, about 20 g of magnetic foreign matters could be removed continuously. In Comparative Example 1, the magnetic foreign matter adhering to the magnet could not be removed as compared with Example 1, so that the magnetic foreign matter gradually became difficult to adhere to the magnet, and the magnetic foreign matter could hardly be removed after 41 batches. In Example 2, the amount of adhered magnetic foreign matter was smaller than that of the neodymium magnet, but it was possible to remove magnetic foreign matter stably and continuously as in Example 1.
表2には実施例1、2、比較例1、2における最終的な傷発生率を示す。傷発生率は、検査したガラス基板の総数のうち傷が検出されたガラス基板の数を表わしている。 Table 2 shows final scratch occurrence rates in Examples 1 and 2 and Comparative Examples 1 and 2. The scratch occurrence rate represents the number of glass substrates on which scratches have been detected out of the total number of glass substrates examined.
実施例1では磁石をポリ塩化ビニリデンフィルムで被覆しない比較利1に比べて0.8%傷発生率が低減した。実施例2では比較例1に比べて0.3%傷発生率が低減した。 In Example 1, the scratch occurrence rate was reduced by 0.8% compared to Comparative Example 1 in which the magnet was not covered with the polyvinylidene chloride film. In Example 2, the scratch occurrence rate was reduced by 0.3% compared to Comparative Example 1.
図4には実施例1で確認された付着物の電子顕微鏡写真の一例を示す。実施例1ではこのような傷要因となる磁性異物を効率的かつ継続的に除去する事が可能である。 FIG. 4 shows an example of an electron micrograph of the deposit confirmed in Example 1. In the first embodiment, it is possible to efficiently and continuously remove such magnetic foreign substances that cause such scratches.
以上の結果から、本発明によれば樹脂を剥がして交換するだけで容易に磁性異物を清掃することが可能で、異物の捕集効率の低下や配管の詰まりを発生させる事がない。また磁石が直接スラリーまたはクーラントに触れる事がないので酸化による変質や、磁力の低下も発生しない。よって効率的かつ継続的に磁性異物の除去が可能になる。 From the above results, according to the present invention, it is possible to easily clean the magnetic foreign matter by simply peeling off and replacing the resin, and the foreign matter collecting efficiency is not lowered and the piping is not clogged. In addition, since the magnet does not directly contact the slurry or coolant, neither alteration due to oxidation nor reduction in magnetic force occurs. Therefore, the magnetic foreign matter can be removed efficiently and continuously.
なお、本発明は上述した実施形態に何ら限定されるものではなく、その要旨を逸脱しない範囲において種々の形態で実施し得るものである。 The present invention is not limited to the embodiment described above, and can be implemented in various forms without departing from the gist of the present invention.
10 両面加工装置(加工装置)
16 永久磁石(磁石)
18 樹脂(被覆材)
103 上定盤
104 下定盤
105 ガラス基板
10 Double-sided processing equipment (processing equipment)
16 Permanent magnet (magnet)
18 Resin (coating material)
103 Upper surface plate 104 Lower surface plate 105 Glass substrate
Claims (20)
剥離可能な被覆材で被覆された磁石が配設された循環経路を循環するスラリーまたはクーラントを前記上定盤と前記下定盤との間に供給することを特徴とするガラス基板の加工方法。 A glass substrate processing method for processing a glass substrate while supplying a slurry or coolant while holding the glass substrate between an upper surface plate and a lower surface plate,
A method for processing a glass substrate, comprising supplying a slurry or coolant circulating through a circulation path in which a magnet coated with a peelable coating material is disposed between the upper surface plate and the lower surface plate.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015045847A (en) * | 2013-07-29 | 2015-03-12 | Hoya株式会社 | Substrate manufacturing method, mask blank substrate manufacturing method, mask blank manufacturing method, transfer mask manufacturing method, and substrate manufacturing apparatus |
| CN113523973A (en) * | 2021-08-06 | 2021-10-22 | 刘利华 | Digital creative technology display screen protection glass polishing device |
| CN113843667A (en) * | 2020-09-21 | 2021-12-28 | 湖南宏成金属制品有限公司 | Nonrust steel pipe grinding device |
| CN116197815A (en) * | 2022-09-01 | 2023-06-02 | 福建晶安光电有限公司 | Grinding rust-proof system |
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| JPS63283862A (en) * | 1987-05-15 | 1988-11-21 | Shintou Bureetaa Kk | Polishing method and device therefor |
| JPH0838932A (en) * | 1994-07-29 | 1996-02-13 | Tokyo Gas Co Ltd | Metal chip removing device |
| JPH11114826A (en) * | 1997-10-13 | 1999-04-27 | Sagami Opt:Kk | Polishing device for glass substrate for magnetic recording medium |
| JP2004141824A (en) * | 2002-10-28 | 2004-05-20 | Nikko Materials Co Ltd | Method of recovering valuable metals such as platinum |
| JP2006099944A (en) * | 2004-08-30 | 2006-04-13 | Showa Denko Kk | Manufacturing methods of substrate for magnetic disk and of magnetic disk |
| JP2006198751A (en) * | 2005-01-24 | 2006-08-03 | Showa Denko Kk | Method for manufacturing substrate for magnetic disk and polishing device |
| JP2007207393A (en) * | 2006-02-06 | 2007-08-16 | Hoya Corp | Method for manufacturing glass substrate for magnetic disk, glass substrate for magnetic disk, and method for manufacturing magnetic disk |
| JP2008188710A (en) * | 2007-02-05 | 2008-08-21 | Furukawa Electric Co Ltd:The | Manufacturing method of glass substrate |
-
2009
- 2009-08-26 JP JP2009195478A patent/JP5446601B2/en not_active Expired - Fee Related
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2010
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Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63283862A (en) * | 1987-05-15 | 1988-11-21 | Shintou Bureetaa Kk | Polishing method and device therefor |
| JPH0838932A (en) * | 1994-07-29 | 1996-02-13 | Tokyo Gas Co Ltd | Metal chip removing device |
| JPH11114826A (en) * | 1997-10-13 | 1999-04-27 | Sagami Opt:Kk | Polishing device for glass substrate for magnetic recording medium |
| JP2004141824A (en) * | 2002-10-28 | 2004-05-20 | Nikko Materials Co Ltd | Method of recovering valuable metals such as platinum |
| JP2006099944A (en) * | 2004-08-30 | 2006-04-13 | Showa Denko Kk | Manufacturing methods of substrate for magnetic disk and of magnetic disk |
| JP2006198751A (en) * | 2005-01-24 | 2006-08-03 | Showa Denko Kk | Method for manufacturing substrate for magnetic disk and polishing device |
| JP2007207393A (en) * | 2006-02-06 | 2007-08-16 | Hoya Corp | Method for manufacturing glass substrate for magnetic disk, glass substrate for magnetic disk, and method for manufacturing magnetic disk |
| JP2008188710A (en) * | 2007-02-05 | 2008-08-21 | Furukawa Electric Co Ltd:The | Manufacturing method of glass substrate |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015045847A (en) * | 2013-07-29 | 2015-03-12 | Hoya株式会社 | Substrate manufacturing method, mask blank substrate manufacturing method, mask blank manufacturing method, transfer mask manufacturing method, and substrate manufacturing apparatus |
| CN113843667A (en) * | 2020-09-21 | 2021-12-28 | 湖南宏成金属制品有限公司 | Nonrust steel pipe grinding device |
| CN113523973A (en) * | 2021-08-06 | 2021-10-22 | 刘利华 | Digital creative technology display screen protection glass polishing device |
| CN113523973B (en) * | 2021-08-06 | 2023-11-03 | 西咸新区秦汉新城新丝路数字文化科技有限公司 | Digital creative technology display screen protection glass polishing device |
| CN116197815A (en) * | 2022-09-01 | 2023-06-02 | 福建晶安光电有限公司 | Grinding rust-proof system |
Also Published As
| Publication number | Publication date |
|---|---|
| MY158509A (en) | 2016-10-14 |
| JP5446601B2 (en) | 2014-03-19 |
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