JP2010091341A - Device for testing led - Google Patents

Abstract

It is possible to test a large number of LEDs in a plurality of times and reduce the time and labor required for the test.
A test apparatus includes a support body 30 having a plurality of first light paths that allow light emitted from an LED 12 to enter from below and pass upward, and disposed above the support body. The cover 32 having a second light path extending in the left-right direction above the first light path is sequentially opposed to the upper end of the light guide as the shutter 34 moves in the left-right direction. And a reflecting mirror 36 disposed in the second light path so as to be movable in the left-right direction, and directs light that has passed through the light guide in the left-right direction in the second light path. And an actuator that moves the shutter and the reflecting mirror in the left-right direction, and a light receiver 40 that receives the light reflected by the reflecting mirror and traveling through the second optical path.
[Selection] Figure 4

Description

  The present invention relates to an apparatus for testing a plurality of LEDs (light emitting diodes), and more particularly to an apparatus for inspecting, ie, testing, a plurality of LEDs provided on a substrate such as an LED wafer.

  Various devices for testing whether or not an LED generates correct light have been proposed (see Patent Documents 1, 2, 3, etc.).

  However, any of the above prior arts is merely an optical device having a structure that guides light emitted from one LED to a light receiver by an optical system, so that the LEDs can be tested one by one. Only. For this reason, when testing a plurality of LEDs provided on an LED substrate such as an LED wafer or a wiring substrate, the test must be performed for each LED, and the test requires time and labor.

  In order to solve the above-mentioned problem, it is conceivable to test a plurality of LEDs provided on the LED substrate simultaneously or divided into a plurality of times using a plurality of optical devices as described above. However, such devices require the same number of optical systems and light receivers as the number of LEDs that can be tested at one time, which complicates the device and makes it expensive.

Further, since the size of the optical system and the light receiver when viewed in a plan view is very large compared to that of the LED, the optical system must be made in a complicated shape, so that the apparatus becomes complicated and expensive.
JP 2006-234497 A JP 2006-30153 A Japanese Patent No. 31008646

  An object of the present invention is to reduce the time and labor required for testing by allowing a large number of LEDs to be tested multiple times without increasing the complexity and cost of the apparatus.

  The test apparatus according to the present invention includes a plurality of first light paths extending in the up-down direction and arranged in alignment in the left-right direction, each having an upper end portion and a lower end portion thereof directed upward and downward, respectively. A support provided with a plurality of first light paths that allow light emitted from the LED to enter from below and pass upward, and a cover disposed on the upper side of the support. A cover having a second light path extending in the left-right direction above the first light path, and releasably blocking light passing through the first light path from reaching the second light path. Further, the shutter is disposed between the support and the cover so as to be movable in the left-right direction, and has an opening that sequentially faces the upper end of the light guide as the shutter moves in the left-right direction. Left and right in the shutter and the second light path A reflecting mirror arranged to be movable in a direction, the reflecting mirror directing the light that has passed through the light guide in the left-right direction in the second light path; and the shutter and the reflecting mirror are moved in the left-right direction An actuator to be moved; and a light receiver that receives light reflected by the reflecting mirror and traveling in the second optical path.

  Furthermore, the cylindrical light-shielding part which can be elastically deformed arrange | positioned at the lower end of each 1st optical path can be included. The light shielding portion communicates with the corresponding first light path to prevent external light from entering the corresponding first light path.

  The test apparatus according to the present invention further includes a contact provided for each of the first light paths, and a needle tip of the contact is pierced into a lower end portion of the corresponding first light path. A contact can be included.

  The test apparatus according to the present invention can further include a wiring board disposed below the support. In this case, the contact may be arranged on the wiring board so as to be in contact with the electrode of the LED.

  Each first light path may be formed by a cylindrical light guide having an interior space that penetrates the support body in the vertical direction and opens to the second light path and downward. The portion of the inner space at the lower end of the light guide may have a truncated cone shape or truncated pyramid shape in which the cross-sectional area perpendicular to the axis of the light guide is smaller toward the lower end side.

  The support may include a support base and a support block disposed on the support base, the cover may be disposed on the support block, and the shutter may be disposed on the support base. You may arrange | position between the said covers.

  The shutter may include a plate-like member having the opening, and the second light path includes a groove that opens to the side of the plurality of first light paths arranged in the row. it can. Further, the reflecting mirror may be attached to the shutter.

  For example, when a plurality of LEDs are arranged in a row on the LED substrate, the test apparatus and the LED substrate are maintained so that the moving direction (left-right direction) of the shutter and reflecting mirror matches the LED arrangement direction. The

  In the above state, when the LED is turned on and the shutter and the reflecting mirror are moved in the left-right direction, the shutter sequentially connects the first light path to the second light path to reflect the light from the LED to the reflecting mirror. The first light path is sequentially switched to the second light path so as to sequentially enter the light. Thereby, since the reflecting mirror sequentially switches the light directed in the second light path, the order of the light incident on the light receiver is sequentially switched in the order of the LED arrangement.

  In plan view, when the size of the first light path and the light receiver is larger than that of the LED, the shutter and the reflecting mirror sequentially move the light from every other LED to the light receiver in one movement. Each time the shutter and the reflecting mirror are moved once, the LED facing the first light path is switched so that the relative position between the first light path and the LED is displaced.

  As described above, according to the present invention, since the light guided to the light receiver is sequentially switched by the shutter by moving the shutter in the left-right direction, a large number of LEDs can be tested in multiple times, Moreover, the same number of light paths and light receivers as the number of LEDs that can be tested at one time are not required.

  As a result, according to the present invention, the apparatus is simplified and inexpensive, and the time and labor required for the test are significantly reduced.

  [Explanation of terms]

  In the present invention, in FIG. 2, the vertical direction (Z direction) is referred to as the vertical direction, the horizontal direction is referred to as the horizontal direction (X direction), and the direction perpendicular to the paper surface (Y direction) is referred to as the front-rear direction. However, these directions differ depending on the posture in which the LED substrate is arranged in the test apparatus.

  Therefore, in the above direction, the plane (XY plane) including the left and right direction (X direction) and the front and rear direction (Y direction) is inclined with respect to the horizontal plane and the horizontal plane in accordance with the posture of the LED substrate at the time of the test by the test apparatus. It is determined to be in any one of the inclined plane and the vertical plane perpendicular to the horizontal plane.

  [Example of test apparatus]

  Referring to FIGS. 1 to 5, the test apparatus 10 uses a substrate in which a large number of LEDs 12 are arranged in a matrix on an LED substrate 14 such as an LED wafer as an inspected object 16, and the LEDs 12 are arranged multiple times for each column. It is applied to the equipment to test separately.

  The LED board 14 has a large number of LEDs 12 arranged in a matrix as shown in FIG. 7 in an LED region 18 indicated by hatching in FIG. FIG. 7 only shows a 3 × 6 LED array, but actually more LEDs 12 are arranged on the LED substrate 14.

  As shown in FIGS. 5, 7, and 8, each LED 12 has the light emitting unit 20, the positive electrode 22, and the negative electrode 24 in a state where the electrodes 22 and 24 are located on both sides of the light emitting unit 20. , And is disposed on the LED substrate 14 on the lower surface of the base portion 26.

  Referring to FIGS. 1 to 5 again, the test apparatus 10 is disposed so as to be movable in the left-right direction between the support 30, the cover 32 disposed above the support 30, and the support 30 and the cover 32. The plate-shaped shutter 34, the reflecting mirror 36 that directs the light from the LED 12 to one side in the left-right direction (the right side in FIGS. 1 and 2), and the shutter 34 and the reflecting mirror 36 are moved in the left-right direction. An actuator 38 to be moved, a light receiver 40 that receives light reflected by the reflecting mirror 36, a wiring substrate 42 disposed below the support 30, and a wiring substrate 42 that can come into contact with the electrodes 22 and 24 of the LED 12. And a plurality of pairs of contacts 44 disposed on the lower surface of the contact.

  The wiring board 42, the support base 46, and the support block 48 are detachably coupled by a plurality of screw members such as bolts. Further, the support 30, cover 32, shutter 34, reflecting mirror 36, actuator 38, light receiver 40, wiring board 42, contact 44 and the like constitute a test head.

  The support 30 includes a plate-like or frame-like support base 46 disposed on the wiring substrate 42 and a support block 48 disposed on the support base 46, and a prober ( It is removably attached to a frame (not shown) of the handling device by appropriate means such as a bolt.

  The support 30 includes a plurality of first light paths 50 extending in the vertical direction. The first light paths 50 are arranged in one row aligned in the left-right direction. The cover 32 has a second light path 52 extending in the left-right direction above the first light path 50. Both light paths 50 and 52 are communicated with each other via the shutter 34.

  The arrangement pitch of the first light paths 50 in the left-right direction is a value that allows the LEDs 12 in the region 18 shown in FIG. 6 to be tested in a plurality of times for each column, that is, an integral multiple of the arrangement pitch of the LEDs 12 in the column direction. Value. In the illustrated example, only four first light paths 50 are shown, but actually, more LEDs 12 are provided in a row.

  Each first optical path 50 passes through the support base 46, the support block 48, and the wiring board 42 in the vertical direction, and opens to the second optical path 52 side (upper side) and the inspection object 16 side (lower side). It is formed by a cylindrical light guide having an internal space.

  Each first light path 50, that is, the light guide, has its upper end and lower end directed upward and downward, respectively, and allows light emitted from the LED 12 to enter from below and pass upward. However, it prevents external light from entering the internal space.

  The inner space portion 50a (see FIG. 5) of the lower end portion of each first light path 50 (light guide) has a cross-sectional area (vertical cross-sectional area) perpendicular to the axis of each first light path 50 at the lower end side. It has a truncated cone shape or truncated pyramid shape that becomes smaller, and protrudes downward from the wiring board 42.

  A bellows-shaped light shielding portion 54 (see FIG. 5) is provided at the lower end of each first light path 50. When the corresponding contactor 44 is pressed against the corresponding electrode 22 or 24, the light shielding unit 54 is pressed by another LED 12 to prevent external light from entering the first light path 50.

  The cover 32 has an inverted U-shaped longitudinal section so as to form a second passage 52 that is an inverted U-shaped groove that opens downward and extends in the left-right direction. It attaches to the support block 48 by suitable means, such as. The cover 32 has a pair of step portions 56 extending in the left-right direction with an interval in the front-rear direction inside the lower end portion thereof. Each step 56 is directed inward and downward.

  The left end of the second passage 52 is closed. On the other hand, the right end of the second passage 52 is communicated with the light receiver 40 and closed by the light receiver 40 so that the light from each LED 12 enters the light receiver 40.

  In the illustrated example, the cover 32 closes the upper part of the space between the pair of plate members 32a attached to the support block 48 so as to extend in parallel in the left-right direction with an interval in the front-rear direction, and the plate members 32a. Thus, the other plate member 32b attached to the upper part of the plate member 32a forms an inverted U-shaped second passage 52, and the closing block 32c is on the left side of the second passage 52. The end of is closed.

  The shutter 34 has a narrow plate-like shape with a narrow width, and each edge portion in the width direction is received by the step portion 56 of the cover 32 so that it can move in the left-right direction. Is located between.

  The shutter 34 has an opening 58 that sequentially faces the upper end of the first light path 50 as the shutter 34 moves in the left-right direction. Therefore, the shutter 34 releasably blocks the light passing through the first optical path 50 from reaching the second optical path 52 as it moves in the left-right direction.

  The reflecting mirror 36 is disposed in the second light path 52 so as to be movable in the left-right direction, and the light that has passed through the first light path 50 and the opening 58 of the shutter 34 is left and right in the second light path 52. The holder 60 is attached to the reflecting mirror 34 so as to be directed toward the direction light receiver 40 and to be movable integrally with the reflecting mirror 34.

  In the illustrated example, the actuator 38 is a linear motor that uses a mover 62 and a stator 64 that supports the mover 62. The movable element 62 is coupled to the holder 60 with a coupling tool 66 so as to move the shutter 34 and the reflecting mirror 36 in the left-right direction via the holder 60. The stator 64 is mounted on the support block 48 so as to extend in the left-right direction. However, a moving mechanism other than a linear motor may be used.

  Although not shown, the cover 32 has a long slot in one plate member 32a that allows the coupler 66 to move in the left-right direction as the mover 62 moves in the left-right direction. . The long hole is covered with a suitable cover such as a rubber sheet so as to prevent external light from entering the first light path 52.

  The light receiver 40 is a known light detection device such as an altimeter that detects at least the hue (wavelength, period, etc.) and intensity (lightness) of the received light, and receives light passing through the second light path 52. The cover 32 is detachably attached to the end of the cover 32.

  The wiring board 42 has a plurality of wirings (not shown), each of which is a part of a wiring pattern, and has an attachment land (not shown) electrically connected to each wiring on the lower surface. This is a general probe substrate in which a contact 44 is attached to a land in a cantilever shape.

  A connector 68 is attached to the upper surface of the wiring board 42. The connector 68 includes a plurality of terminals that are electrically connected to the wiring of the wiring board 42, and penetrates the support base 46 and the support block 48 in the vertical direction to expose the terminals upward. The connector 68 is used to connect the test apparatus 10 to a tester electrical circuit (not shown).

  In the illustrated example, the contactors 44 are needle-type probes made of fine metal wires, and are provided in pairs for each of the first optical paths 50. The contact 44 of each first light path 50 is pierced inward from the corresponding side with the corresponding light-shielding portion 54 at the tip, so that the needle tip can contact the electrode 22 or 24 of the LED 12. .

  [Test method using test equipment]

  In the inspected object 16, the array direction of the LEDs 12 is the moving direction of the shutter 34 and the reflecting mirror 36, and the needle tip of the contact 44 corresponding to the first optical path 50 located at the leftmost end of the shutter 34 is one row. The electrodes 22 and 24 of the LED 12 located at the leftmost end of the LED 12 are arranged in the test apparatus 10 in a state where the electrodes 22 and 24 can be pressed against the needle tip of the contactor 44.

  In the above state, the lower end of each first light path 50 is opposed to the predetermined LED 12, and the needle tip of the contact 44 corresponding to each first light path 50 is in contact with the electrodes 22 and 24 of the predetermined LED 12 and the contact. It is relatively pressed against the 44 needle tips.

  In the above state, as shown by the solid line in FIG. 4, the shutter 34 positions the opening 58 at the upper end of the first optical path 50 positioned at the leftmost end, and the first optical path 50 is moved to the second position. The other first light path 50 is closed at the upper end thereof. In such a state, the LED 12 located at the leftmost end is energized, and the LED 12 emits light.

  The light from the LED 12 located at the leftmost end reaches the second optical path 52 through the light shielding portion 54, the first optical path 50 and the opening 58, and the second optical path 52 is transferred to the light receiver 40 by the reflecting mirror 36. It is directed and finally enters the light receiver 40.

  The light receiver 40 generates signals corresponding to the hue and intensity of the received light and outputs the signals to the above-described electric circuit. The electric signal from the light receiver 40 is input to an electric circuit and used to determine whether or not the corresponding LED 12 generates light having the correct hue and intensity based on the electric signal.

  When the test on the leftmost LED 12 is completed, the shutter 34 is moved to the right by the arrangement pitch of the first light path 50. As a result, the first light path 50 located second from the left is communicated with the second light path 52 through the opening 48, so that the LED 12 facing the first light path 50 is energized. Then, the light from the LED 12 is received by the light receiver 40.

  Thereafter, the shutter 34 is moved to the right by the arrangement pitch of the first light path 50 so that the next first light path 50 communicates with the second light path 52 through the opening 58. The LED 12 facing the next first light path 50 is energized, the light from the LED 12 is received by the light receiver 40, and the test of whether the LED 12 is correct or not is repeated. The position of the shutter 34 when the shutter 34 is moved to the right by the arrangement pitch of the LEDs 12 is indicated by a broken line in FIG.

  After the light passing through all the first light paths 50 is received by the light receiver 40, if there is an undetermined LED in the LEDs 12 aligned in a row, the first light path 50 located at the leftmost position is the most. The test object 16 enters the first light path 50 in a state where the electrodes 22 and 24 of the LED 12 and the needle tip of the contactor 44 are separated from each other so as to allow the light of the undetermined LED 12 located at the left end to pass. In contrast, the electrodes 22 and 24 of the LED 12 and the needle tip of the contact 44 are pressed relatively.

  In the above-described position, the LED 12 located at the leftmost end of the unjudged state is energized, the light from the LED 12 is guided to the light receiver 40, and the test of the LED 12 is performed, and the shutter 34 passes through the first light path. The process of moving the test by 50 arrangement pitches is repeated.

  When the test of all the LEDs 12 in one row is completed, the test object 16 is in a state where the electrodes 22 and 24 of the LED 12 and the needle tip of the contact 44 are separated from each other for the test of the LED 12 in the next row. It moves to the front-back direction with respect to the 1st optical path 50, and said each process is performed.

  The determination of whether each LED 12 is correct or not may be performed after signals corresponding to the hue and intensity of light from all the LEDs 12 are taken into the electric circuit. In addition, the LED 12 may be energized only when the LED light is guided to the light receiver 40, or the light of all the LEDs 12 in which the needle tips of the contacts 44 are pressed against the electrodes 22 and 24 may be used. You may do it all the way to the light receiver.

  By moving the shutter 34 once in the left-right direction, the number of first light paths 50 that can sequentially switch the light from the LEDs 12 of an integral number of the arrangement pitch of the LEDs 12 in the column direction to the light receiver 40. May be provided.

  Alternatively, the first light paths 50 may be provided in such a number that the light from all the LEDs 12 arranged in a row can be sequentially switched and guided to the light receiver 40 only by moving the shutter 34 once in the left-right direction. Good.

  Furthermore, as shown in FIGS. 6 and 7, when the LEDs 12 are arranged in a plurality of rows in the front-rear direction in a plane parallel to the LED substrate 14, a plurality of the first first as described above is also provided in the front-rear direction. You may provide the row | line | column of the optical path 12 in multiple rows.

  [Other Examples of Test Apparatus]

  As shown in FIG. 10, the electrical connection device 80 shown in FIG. 9 has the light emitting part 20 and the positive (or negative) electrode 22 (or 24) on the upper surface of the base part 26, and is negative (or positive). ) Of the LED 82 having the electrode 24 (or 22) on the lower surface of the base portion 26.

  The test apparatus 80 is configured in the same manner as the test apparatus 10 shown in FIGS. 1 to 5 except that one contact 44 is used for each first light path portion 50. For this reason, each LCD 82 is tested in the same manner as the LED 12 shown in FIG. 8 except that the current is passed through the contact 44 and the LED substrate 14.

  The present invention is applicable not only to the LEDs 12 and 82 having the above-described shape, but also to the LEDs having other shapes such as the Sona Aera LED on the same or different side arrows and the lower surface of the base portion 26. Can do.

  The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit described in the claims.

It is a top view which shows one Example of the testing apparatus concerning this invention. It is a front view of the test apparatus shown in FIG. It is a right view of the test apparatus shown in FIG. FIG. 4 is a cross-sectional view taken along line 4-4 in FIG. It is an expanded sectional view which shows the relationship between the lower end part of a 1st light path, and LED. It is a perspective view which shows one Example of the LED board tested with the test apparatus shown in FIG. It is a perspective view which shows a part of LED array arrange | positioned at the LED board shown in FIG. It is a top view which shows one Example of one LED in the LED array shown in FIG. It is sectional drawing of the same kind as FIG. 5 which shows one Example of the testing apparatus which concerns on this invention. It is a top view which shows one Example of LED tested by the testing apparatus shown in FIG.

Explanation of symbols

10,80 Test device 12,82 LED
DESCRIPTION OF SYMBOLS 14 LED board 16 Test object 18 LED area 20 Light emission part 22,24 Electrode 26 Base part 30 Support body 32 Cover 34 Shutter 36 Reflection mirror 38 Actuator 40 Light receiver 42 Wiring board 44 Contact 46 Support base 48 Support block 50, 52 First and second light paths 50a Lower end portion of light guide 54 Light-shielding portion 56 Step portion 58 Shutter opening 60 Holder 62 Movable element 64 Stator 66 Coupler 68 Connector

Claims (9)

A plurality of first light paths arranged in the left-right direction and extending in the up-down direction, each having its upper end and lower end directed upward and downward, respectively, and light emitted by the LED Comprising a plurality of first light paths that allow light to enter from below and pass upward;
A cover disposed on the upper side of the support, the cover having a second light path extending in the left-right direction above the first light path;
The shutter is disposed between the support and the cover so as to be movable in the left-right direction so as to releasably block light passing through the first light path from reaching the second light path. A shutter having an opening that sequentially faces the upper end of the light guide as the shutter moves in the left-right direction;
A reflecting mirror arranged to be movable in the left-right direction in the second light path, the reflecting mirror for directing the light that has passed through the light guide in the left-right direction in the second light path;
An actuator for moving the shutter and the reflecting mirror in the left-right direction;
And a light receiver that receives light reflected by the reflecting mirror and traveling in the second light path.   Furthermore, it includes an elastically deformable cylindrical light-shielding portion disposed at the lower end of each first light path, and the light-shielding part communicates with the corresponding first light path so that external light corresponds to the first light path. The LED test apparatus according to claim 1, wherein the LED test apparatus prevents entry into one light path.   Furthermore, it is a contact provided for every said 1st optical path, Comprising: The contact with which the needle | hook tip of the said contact was pierced by the lower end part of the corresponding 1st optical path part, It contains. 3. The LED test apparatus according to any one of 1 and 2.   The LED testing apparatus according to claim 3, further comprising a wiring board disposed below the support, wherein the contact is disposed on the wiring board so as to be in contact with an electrode of the LED.   Each first light path is formed by a cylindrical light guide having an inner space that penetrates the support body in the vertical direction and opens to the second light path and downward. 5. The portion of the inner space at the lower end of the light guide has a truncated cone shape or a truncated pyramid shape in which a cross-sectional area perpendicular to the axis of the light guide is smaller toward the lower end side. The LED test apparatus according to 1.   The support includes a support base and a support block disposed on the support base, the cover is disposed on the support block, and the shutter is disposed between the support base and the cover. The LED testing device according to claim 1, wherein the LED testing device is used.   The LED testing apparatus according to claim 1, wherein the shutter includes a plate-like member having the opening.   The LED test apparatus according to claim 1, wherein the second light path includes a groove that opens to a side of the plurality of first light paths arranged in the row.   The LED test apparatus according to claim 1, wherein the reflecting mirror is attached to the shutter.

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