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JP2009180549A - Contact pin - Google Patents

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Publication number
JP2009180549A
JP2009180549A JP2008017942A JP2008017942A JP2009180549A JP 2009180549 A JP2009180549 A JP 2009180549A JP 2008017942 A JP2008017942 A JP 2008017942A JP 2008017942 A JP2008017942 A JP 2008017942A JP 2009180549 A JP2009180549 A JP 2009180549A
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Prior art keywords
contact pin
electronic component
contact
lead
tester
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Hidekazu Iwasaki
秀和 岩崎
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Renesas Technology Corp
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Renesas Technology Corp
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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To obtain a contact pin of which the area of contact with a plane lead of an electronic component can be adjustd easily. <P>SOLUTION: When electrical characteristics of the electronic component 12 are tested by using a tester 11, the tester 11 is electrically connected with the plane lead 13 of the electronic component 12 by the contact pin 14. The tip part of the contact pin 14, which comes into contact with the plane lead 13 of the electronic component 12, is cylindrical ins shape. One or a plurality of notches 15 are formed in the end face of contact with the plane lead 13 of the electronic component 12. The notch 15 is rectangular, as viewed from the lateral side of the contact pin 14. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、電子部品の電気的特性試験を行うテスタと電子部品の平面リードとを電気的に接続するためのコンタクトピンに関し、特に電子部品の平面リードとの接触面積を容易に調整することができるコンタクトピンに関するものである。   The present invention relates to a contact pin for electrically connecting a tester for conducting an electrical characteristic test of an electronic component and a planar lead of the electronic component, and in particular, the contact area between the planar lead of the electronic component can be easily adjusted. It relates to a contact pin that can be used.

テスタを用いてＱＦＰ（Quad Flat Package）などの電子部品の電気的特性試験を行う際に、テスタと電子部品の平面リードとを電気的に接続するためにコンタクトピンが用いられる。   When performing an electrical characteristic test of an electronic component such as a QFP (Quad Flat Package) using a tester, a contact pin is used to electrically connect the tester and the planar lead of the electronic component.

図４は、馬蹄形板ばねコンタクトピンを用いて電気的特性試験を行う様子を示す側面図であり、図５は斜視図、図６は平面図である。テスタ１１と電子部品１２の平面リード１３とを電気的に接続するコンタクトピンとして、馬蹄形板ばねコンタクトピン１００を用いている。馬蹄形板ばねコンタクトピン１００は、平面リード１３に対する接触力が強いためコンタクト性が良い。また、ワイピングが低いため、半田くず発生による外観不良を防ぐことができる。しかし、テスタ１１から平面リード１３までの電気的線長が長くなるため、高周波特性が劣化する。また、打痕が強すぎて、外観不良になるケースがある。   FIG. 4 is a side view showing an electrical property test using a horseshoe-shaped leaf spring contact pin, FIG. 5 is a perspective view, and FIG. 6 is a plan view. A horseshoe-shaped leaf spring contact pin 100 is used as a contact pin for electrically connecting the tester 11 and the planar lead 13 of the electronic component 12. Since the horseshoe-shaped leaf spring contact pin 100 has a strong contact force with respect to the planar lead 13, the contact property is good. Further, since the wiping is low, it is possible to prevent appearance defects due to the generation of solder scraps. However, since the electrical line length from the tester 11 to the flat lead 13 becomes long, the high frequency characteristics deteriorate. In addition, there are cases where the impression is too strong and the appearance is poor.

図７は、先端がクラウン形状の垂直プローブを用いて電気的特性試験を行う様子を示す側面図である。コンタクトピンとして、先端がクラウン形状の垂直プローブ１０１を用いている（例えば、特許文献１の図４参照）。このような垂直プローブ１０１であれば、テスタ１１から平面リード１３までの電気的線長が短いため、高周波特性が良好である。また、先端がクラウン形状であるため、平面リード１３に点接触し、打痕が小さい。   FIG. 7 is a side view showing a state in which an electrical characteristic test is performed using a vertical probe having a crown at the tip. As the contact pin, a vertical probe 101 having a crown-shaped tip is used (see, for example, FIG. 4 of Patent Document 1). With such a vertical probe 101, the electrical line length from the tester 11 to the planar lead 13 is short, so that the high frequency characteristics are good. In addition, since the tip is crown-shaped, it makes point contact with the flat lead 13 and the dent is small.

特開２００３−２３４１６１号公報JP 2003-234161 A

従来の垂直プローブ１０１の先端部は尖っているため、磨耗が激しかった。また、位置ずれにより垂直プローブ１０１の先端部の一点だけが平面リード１３のエッジに接触すると、半田くずが発生するという問題があった。このような問題を解消するために、電子部品１２の平面リード１３との接触面積を調整する必要がある。   Since the tip of the conventional vertical probe 101 was sharp, the wear was severe. Further, when only one point of the tip of the vertical probe 101 comes into contact with the edge of the flat lead 13 due to the displacement, there is a problem that solder scraps are generated. In order to solve such a problem, it is necessary to adjust the contact area of the electronic component 12 with the planar lead 13.

しかし、電子部品１２の平面リード１３との接触端面に形成された切り欠き１０２が三角形であるため、電子部品１２の平面リード１３との接触面積は切り欠き１０２の深さによって大きく変動してしまう。従って、切り欠き１０２を形成する際に、その深さを厳密に調整しなければならない。また、垂直プローブ１０１の先端が磨耗するに伴って接触面積が大きく変動してしまう。よって、従来の垂直プローブ１０１は、電子部品１２の平面リード１３との接触面積を調整するのが困難であった。   However, since the notch 102 formed on the contact end surface of the electronic component 12 with the flat lead 13 is a triangle, the contact area of the electronic component 12 with the flat lead 13 greatly varies depending on the depth of the cutout 102. . Therefore, when forming the notch 102, the depth must be adjusted strictly. Further, as the tip of the vertical probe 101 is worn, the contact area greatly varies. Therefore, it is difficult for the conventional vertical probe 101 to adjust the contact area of the electronic component 12 with the planar lead 13.

本発明は、上述のような課題を解決するためになされたもので、その目的は、電子部品の平面リードとの接触面積を容易に調整することができるコンタクトピンを得るものである。   The present invention has been made to solve the above-described problems, and an object of the present invention is to obtain a contact pin that can easily adjust the contact area of the electronic component with the planar lead.

本発明の一実施例に係るコンタクトピンは、電子部品の電気的特性試験を行うテスタと電子部品の平面リードとを電気的に接続するためのコンタクトピンであって、電子部品の平面リードと接触する先端部が円筒状であり、電子部品の平面リードとの接触端面に１個又は複数個の切り欠きが形成されており、切り欠きはコンタクトピンの側面から見ると矩形である。   A contact pin according to an embodiment of the present invention is a contact pin for electrically connecting a tester for performing an electrical characteristic test of an electronic component and a planar lead of the electronic component, and is in contact with the planar lead of the electronic component. The leading end portion is cylindrical, and one or a plurality of cutouts are formed on the contact end surface with the flat lead of the electronic component, and the cutouts are rectangular when viewed from the side surface of the contact pin.

この実施例によれば、電子部品の平面リードとの接触面積を容易に調整することができる。   According to this embodiment, the contact area of the electronic component with the planar lead can be easily adjusted.

図１は、本発明の実施の形態に係るコンタクトピンを用いて電気的特性試験を行う様子を示す側面図である。テスタ１１を用いて電子部品１２の電気的特性試験を行う際に、テスタ１１と電子部品１２の平面リード１３とをコンタクトピン１４により電気的に接続している。コンタクトピン１４は、テスタ１１に接続された部分１４ａと、電子部品１２の平面リード１３と接触する部分１４ｂと、両者を接続するバネ１４ｃとを有する。   FIG. 1 is a side view showing a state in which an electrical characteristic test is performed using a contact pin according to an embodiment of the present invention. When performing an electrical characteristic test of the electronic component 12 using the tester 11, the tester 11 and the planar lead 13 of the electronic component 12 are electrically connected by the contact pins 14. The contact pin 14 includes a portion 14 a connected to the tester 11, a portion 14 b that contacts the planar lead 13 of the electronic component 12, and a spring 14 c that connects the two.

図２は、本発明の実施の形態に係るコンタクトピンの先端部を示す斜視図である。図示のように、電子部品１２の平面リード１３と接触するコンタクトピン１４の先端部は円筒状である。そして、電子部品１２の平面リード１３との接触端面に４個の切り欠き１５が形成されている。この切り欠き１５はコンタクトピン１４の側面から見ると矩形である。そして、切り欠き１５の側壁は平面リード１３との接触端面に対して垂直であり、切り欠き１５の幅は一定である。また、コンタクトピン１４の直径は０．２５ｍｍであり、４個の矩形の切り欠き１５により分離された１つ１つの先端部の長さは０．０４ｍｍである。   FIG. 2 is a perspective view showing the tip of the contact pin according to the embodiment of the present invention. As illustrated, the tip of the contact pin 14 that contacts the planar lead 13 of the electronic component 12 is cylindrical. Then, four notches 15 are formed on the contact end surface of the electronic component 12 with the flat lead 13. The notch 15 is rectangular when viewed from the side of the contact pin 14. The side wall of the notch 15 is perpendicular to the contact end surface with the flat lead 13, and the width of the notch 15 is constant. The contact pin 14 has a diameter of 0.25 mm, and the length of each tip portion separated by the four rectangular cutouts 15 is 0.04 mm.

図３は、本発明の実施の形態に係るコンタクトピンの先端部を拡大した断面図である。コンタクトピン１４の先端部の幅は０．０５ｍｍである。なお、耐久性を向上させるために、コンタクトピン１４の先端部を曲面加工処理（Ｒ加工）することが好ましい。   FIG. 3 is an enlarged cross-sectional view of the tip of the contact pin according to the embodiment of the present invention. The width of the tip of the contact pin 14 is 0.05 mm. In addition, in order to improve durability, it is preferable to subject the front-end | tip part of the contact pin 14 to a curved surface process (R process).

上記のように、電子部品１２の平面リード１３との接触端面に形成された切り欠き１５が矩形であるため、電子部品１２の平面リード１３との接触面積は切り欠き１５の深さによって変動しない。従って、切り欠き１５を形成する際に、その深さを厳密に調整する必要はない。また、コンタクトピン１４の先端部が磨耗しても接触面積は変動しない。よって、本実施の形態に係るコンタクトピン１４は、電子部品１２の平面リード１３との接触面積を容易に調整することができる。   As described above, since the notch 15 formed on the contact end surface of the electronic component 12 with the planar lead 13 is rectangular, the contact area of the electronic component 12 with the planar lead 13 does not vary depending on the depth of the notch 15. . Therefore, when forming the notch 15, it is not necessary to adjust the depth strictly. Further, even if the tip of the contact pin 14 is worn, the contact area does not change. Therefore, the contact pin 14 according to the present embodiment can easily adjust the contact area between the electronic component 12 and the planar lead 13.

ここで、例えば、本実施の形態に係るコンタクトピン１４の接触面積／押圧力を、実績のある馬蹄形板ばねコンタクトピンと同じにする場合について説明する。まず、馬蹄形板ばねコンタクトピンの接触面積は、図６に示すように０．１ｍｍ×０．２ｍｍである。従って、馬蹄形板ばねコンタクトピンの接触面積／押圧力＝０．１ｍｍ×０．２ｍｍ／７５ｇ＝２．６７×１０−４（ｍｍ２／ｇ）である。 Here, for example, a case where the contact area / pressing force of the contact pin 14 according to the present embodiment is the same as that of a proven horseshoe-shaped leaf spring contact pin will be described. First, the contact area of the horseshoe-shaped leaf spring contact pin is 0.1 mm × 0.2 mm as shown in FIG. Therefore, the contact area / pressing force of the horseshoe-shaped leaf spring contact pin = 0.1 mm × 0.2 mm / 75 g = 2.67 × 10 −4 (mm 2 / g).

一方、本実施の形態に係るコンタクトピン１４において、４個の矩形の切り欠き１５により分離された先端部の２箇所が電子部品１２の平面リード１３と接触すると仮定する。そして、４個の矩形の切り欠き１５により分離された１つ１つの先端部の長さを０．０４ｍｍ、コンタクトピン１４の先端部の幅を０．０５ｍｍとすると、コンタクトピン１４の接触面積は０．０５ｍｍ×０．０８ｍｍである。従って、コンタクトピン１４の接触面積／押圧力＝０．０５ｍｍ×０．０８ｍｍ／１５ｇ＝２．６７×１０−４（ｍｍ２／ｇ）となり、馬蹄形板ばねコンタクトピンと同じになる。 On the other hand, in the contact pin 14 according to the present embodiment, it is assumed that two portions of the tip portion separated by the four rectangular cutouts 15 are in contact with the planar lead 13 of the electronic component 12. If the length of each tip portion separated by the four rectangular cutouts 15 is 0.04 mm and the width of the tip portion of the contact pin 14 is 0.05 mm, the contact area of the contact pin 14 is It is 0.05 mm x 0.08 mm. Accordingly, the contact area / pressing force of the contact pin 14 is 0.05 mm × 0.08 mm / 15 g = 2.67 × 10 −4 (mm 2 / g), which is the same as the horseshoe-shaped leaf spring contact pin.

このように、接触面積／押圧力が所望の値となるように、矩形の切り欠き１５により分離されたコンタクトピン１４の先端部の長さと幅を設計すればよい。   Thus, the length and width of the tip of the contact pin 14 separated by the rectangular notch 15 may be designed so that the contact area / pressing force becomes a desired value.

なお、上記の例では矩形の切り欠き１５は４個であったが、これに限らず１個又は複数個であればよい。ただし、４個の切り欠き１５であれば、コンタクトピン１４の先端部を、歯の断面が矩形をした砥石などで縦方向と横方向に２回削ることで容易に作ることができる。コンタクトピン１４と電子部品１２の平面リード１３との接触面積は、この砥石の断面の歯幅を決定するにより調整される。   In the above example, there are four rectangular cutouts 15. However, the present invention is not limited to this, and it may be one or more. However, if the four cutouts 15 are used, the tip of the contact pin 14 can be easily made by cutting twice in the vertical and horizontal directions with a grindstone having a rectangular tooth cross section. The contact area between the contact pin 14 and the flat lead 13 of the electronic component 12 is adjusted by determining the tooth width of the cross section of the grindstone.

本発明の実施の形態に係るコンタクトピンを用いて電気的特性試験を行う様子を示す側面図である。It is a side view which shows a mode that an electrical property test is performed using the contact pin which concerns on embodiment of this invention. 本発明の実施の形態に係るコンタクトピンの先端部を示す斜視図である。It is a perspective view which shows the front-end | tip part of the contact pin which concerns on embodiment of this invention. 本発明の実施の形態に係るコンタクトピンの先端部を拡大した断面図である。It is sectional drawing to which the front-end | tip part of the contact pin which concerns on embodiment of this invention was expanded. 馬蹄形板ばねコンタクトピンを用いて電気的特性試験を行う様子を示す側面図であり、It is a side view showing a state of performing an electrical characteristic test using a horseshoe-shaped leaf spring contact pin, 馬蹄形板ばねコンタクトピンを用いて電気的特性試験を行う様子を示す斜視図である。It is a perspective view which shows a mode that an electrical property test is performed using a horseshoe-shaped leaf | plate spring contact pin. 馬蹄形板ばねコンタクトピンを用いて電気的特性試験を行う様子を示す平面図である。It is a top view which shows a mode that an electrical property test is performed using a horseshoe-shaped leaf | plate spring contact pin. 先端がクラウン形状の垂直プローブを用いて電気的特性試験を行う様子を示す側面図である。It is a side view which shows a mode that an electrical property test is performed using the perpendicular | vertical probe whose front-end | tip is a crown shape.

符号の説明Explanation of symbols

１１ テスタ
１２ 電子部品
１３ 平面リード
１４ コンタクトピン
１５ 矩形の切り欠き 11 Tester 12 Electronic Component 13 Planar Lead 14 Contact Pin 15 Rectangular Notch

Claims (3)

電子部品の電気的特性試験を行うテスタと前記電子部品の平面リードとを電気的に接続するためのコンタクトピンであって、
前記電子部品の平面リードと接触する先端部が円筒状であり、
前記電子部品の平面リードとの接触端面に１個又は複数個の切り欠きが形成されており、
前記切り欠きは前記コンタクトピンの側面から見ると矩形であることを特徴とするコンタクトピン。 A contact pin for electrically connecting a tester for conducting an electrical property test of an electronic component and a planar lead of the electronic component,
The tip portion that contacts the planar lead of the electronic component is cylindrical,
One or more notches are formed on the contact end surface of the electronic component with the flat lead,
The contact pin, wherein the notch is rectangular when viewed from a side surface of the contact pin. 電子部品の電気的特性試験を行うテスタと前記電子部品の平面リードとを電気的に接続するためのコンタクトピンであって、
前記電子部品の平面リードと接触する先端部が円筒状であり、
前記電子部品の平面リードとの接触端面に複数の切り欠きが形成されており、
前記複数の切り欠きは２個ずつのペアをなし、各ペアの切り欠きは対向して設けられ、前記コンタクトピンの側面から見ると矩形であることを特徴とするコンタクトピン。 A contact pin for electrically connecting a tester for conducting an electrical property test of an electronic component and a planar lead of the electronic component,
The tip portion that contacts the planar lead of the electronic component is cylindrical,
A plurality of notches are formed on the contact end surface with the planar lead of the electronic component,
2. The contact pin according to claim 1, wherein the plurality of notches form two pairs, and the notches of each pair are provided facing each other and are rectangular when viewed from the side of the contact pin. 前記切り欠きは４個であることを特徴とする請求項１に記載のコンタクトピン。   The contact pin according to claim 1, wherein the number of the notches is four.
JP2008017942A 2008-01-29 2008-01-29 Contact pin Pending JP2009180549A (en)

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