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JP2007056280A - Deposited film forming method and apparatus - Google Patents

Deposited film forming method and apparatus Download PDF

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JP2007056280A
JP2007056280A JP2005239748A JP2005239748A JP2007056280A JP 2007056280 A JP2007056280 A JP 2007056280A JP 2005239748 A JP2005239748 A JP 2005239748A JP 2005239748 A JP2005239748 A JP 2005239748A JP 2007056280 A JP2007056280 A JP 2007056280A
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cylindrical
transfer
deposited film
film forming
forming apparatus
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Hiroyuki Katagiri
宏之 片桐
Toshiyasu Shirasago
寿康 白砂
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Canon Inc
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Abstract

【課題】画像欠陥の少ない堆積膜を形成することができる搬送装置、堆積膜形成方法及び装置を提供する。
【解決手段】円筒状基体を減圧可能な搬送容器に格納する手段、格納された前記搬送容器内を真空排気する手段、前記搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、前記搬送容器内に格納された前記円筒状基体を前記堆積膜形成装置内に設置する手段を具備した真空搬送装置において、前記搬送容器内に第1のアーム及び間隔が可変である第2のアームを有する事を特徴とする。
【選択図】 図1
A transport apparatus, a deposition film forming method, and an apparatus capable of forming a deposited film with few image defects are provided.
Means for storing a cylindrical substrate in a depressurized transfer container, means for evacuating the stored transfer container, means for moving a transfer machine including the transfer container onto a deposited film forming apparatus, In the vacuum transfer apparatus having means for installing the cylindrical substrate stored in the transfer container in the deposited film forming apparatus, a first arm and a second arm having a variable interval in the transfer container It is characterized by having.
[Selection] Figure 1

Description

本発明は、基体上に堆積膜、とりわけ機能性堆積膜、殊に半導体デバイス、電子写真感光体、画像入力用のラインセンサー、撮像デバイス、光起電力素子等に用いられるアモルファス状或いは多結晶状等の非単結晶状の堆積膜を利用した光受容部材を形成するのに適したプラズマCVD法による堆積膜形成方法及び装置に関するものである。   The present invention provides a deposited film on a substrate, especially a functional deposited film, particularly an amorphous or polycrystalline film used for semiconductor devices, electrophotographic photosensitive members, line sensors for image input, imaging devices, photovoltaic elements, and the like. The present invention relates to a method and apparatus for forming a deposited film by plasma CVD suitable for forming a light receiving member using a non-single crystalline deposited film.

従来、半導体デバイス、電子写真用感光体デバイス、画像入力用ラインセンサー、撮像デバイス、光起電力デバイス、その他各種エレクトロニクス素子、光学素子等に用いる素子部材として、アモルファスシリコン、例えば水素及び/又はハロゲン(例えば弗素、塩素等)で補償されたアモルファスシリコン(以下“a−Si”と略記す。)等のアモルファス材料(本発明においてアモルファスとは非単結晶であることを示す)で構成された半導体等用の堆積膜が提案され、その中のいくつかは実用に付されている。   Conventionally, as an element member used for a semiconductor device, an electrophotographic photoreceptor device, an image input line sensor, an imaging device, a photovoltaic device, other various electronic elements, optical elements, etc., amorphous silicon such as hydrogen and / or halogen ( For example, a semiconductor composed of an amorphous material (hereinafter, “amorphous” indicates non-single crystal) in the present invention, such as amorphous silicon (hereinafter abbreviated as “a-Si”) compensated with fluorine, chlorine, etc. Deposition films have been proposed, some of which have been put to practical use.

こうした堆積膜を連続して生産可能なシステムは各種提案されており、特にその搬送システムは多種多様で、その用途に応じて各種提案されている。   Various systems capable of continuously producing such deposited films have been proposed, and in particular, there are a wide variety of transport systems, and various proposals have been made according to the application.

堆積膜形成前の搬送と堆積膜形成後の搬送手段を分離する事により、堆積膜形成前にダスト等が基板に付着するのを防止を目的とし、搬送機を用いた一連の堆積膜形成装置も提案されている(例えば、特許文献1参照)。   A series of deposition film forming devices using a conveyor to prevent dust and the like from adhering to the substrate before the deposition film is formed by separating the transportation before the deposition film is formed and the transportation means after the deposition film is formed. Has also been proposed (see, for example, Patent Document 1).

ここで、図6に、従来の堆積膜形成装置において搬送容器内に円筒状基板の格納する手段の一例を示す模式的断面図を示す。   FIG. 6 is a schematic cross-sectional view showing an example of means for storing the cylindrical substrate in the transfer container in the conventional deposited film forming apparatus.

搬送容器601内には、搬送アーム603が介在している。円筒状基体609は、基板ホルダー610に装着されており、円筒状基体609の上には円筒状補助部材608が、同じく基板ホルダー610に装着されている。   A transfer arm 603 is interposed in the transfer container 601. The cylindrical substrate 609 is mounted on the substrate holder 610, and a cylindrical auxiliary member 608 is mounted on the substrate holder 610 on the cylindrical substrate 609.

搬送アーム603は基板ホルダー610の上端部を掴み、搬送容器601内に引き上げ格納する。
特許第2907404号公報
The transfer arm 603 grasps the upper end portion of the substrate holder 610 and lifts and stores it in the transfer container 601.
Japanese Patent No. 2907404

このような従来の半導体製造方法および装置により、ある程度実用的な画像特性と電子写真特を持つ方法および装置を得ることが可能となった。しかし、電子写真用感光体のように大面積で比較的厚い堆積膜が要求される製品等において、形成する堆積膜の電子写真特性を如何に均一にできるのかが求められ、更に近年、デジタル化、カラー化に伴い、それに加えより高画質で画像欠陥が極少の堆積膜を要求されるようになってきた。そのため装置構成や層構成も多様化し更なる質の高い堆積膜の形成が要求されている。   With such a conventional semiconductor manufacturing method and apparatus, it has become possible to obtain a method and apparatus having practical image characteristics and electrophotographic characteristics to some extent. However, in products that require a relatively thick deposited film with a large area, such as an electrophotographic photoreceptor, there is a demand for how uniform the electrophotographic characteristics of the deposited film to be formed can be. With colorization, in addition to this, a deposited film with higher image quality and minimal image defects has been required. For this reason, the apparatus configuration and the layer configuration are diversified, and the formation of a higher quality deposited film is required.

しかしながら、これら上述した従来の堆積膜形成装置では、電子写真用感光体のように比較的大面積で厚い堆積膜が要求される製品を製造する場合、生産の効率化を上げる意味でも、電子写真感光体用の円筒状基体を真空搬送するシステムが必要となってくる。円筒状基体を搬送する為には、円筒状基体ホルダーに円筒状基体をセッティングし、セッティングされた円筒状基体ホルダーを真空搬送可能に構成された搬送機によりチャックし真空搬送機内に格納した後、堆積膜形成装置上に移動し、真空搬送機を堆積膜形成装置にドッキングさせ、真空搬送機内に格納されている円筒状基体ホルダーを、堆積膜形成装置内にセッティングする。   However, in these conventional deposited film forming apparatuses described above, when manufacturing a product requiring a relatively large area and a thick deposited film, such as an electrophotographic photoreceptor, electrophotography is also used in order to increase production efficiency. There is a need for a system for vacuum-transporting a cylindrical substrate for a photoreceptor. In order to transport the cylindrical substrate, the cylindrical substrate holder is set in a cylindrical substrate holder, and the set cylindrical substrate holder is chucked by a conveyor configured to be capable of vacuum conveyance and stored in the vacuum conveyor. Move to the deposited film forming apparatus, dock the vacuum transfer machine to the deposited film forming apparatus, and set the cylindrical substrate holder stored in the vacuum carried machine in the deposited film forming apparatus.

こうした円筒状基体の円筒状基体ホルダーへのセッティング時には、クリーンルーム等のクリーンな環境下で、人手により円筒状基体ホルダーを円筒状基体に挿入装着される。その際に円筒状基体ホルダーと円筒状基体の擦れにより発塵を引き起こす場合や、円筒状基体が装着された円筒状基体ホルダーを真空搬送する際に振動等で発塵を引き起こす場合などにより、堆積膜形成前の円筒状基体表面上に付着し付着物を基点とし堆積膜が異常成長する事により画像欠陥悪化の要因になり得る場合があった。   When setting such a cylindrical substrate to the cylindrical substrate holder, the cylindrical substrate holder is manually inserted into and mounted on the cylindrical substrate in a clean environment such as a clean room. In this case, the dust is generated due to friction between the cylindrical substrate holder and the cylindrical substrate, or when the cylindrical substrate holder with the cylindrical substrate is caused to generate dust due to vibration or the like when being transported in vacuum. In some cases, the deposited film grows abnormally on the surface of the cylindrical substrate before the film is formed, and can cause image defect deterioration.

また堆積膜形成後には、円筒状基体以外に堆積した膜を次の堆積膜形成に備えクリーニング処理される。堆積膜形成装置内は堆積膜形成時に使用した円筒状基体ホルダーの替わりに、同一形状の支持部材を堆積膜形成装置内に設置し堆積膜形成装置内をクリーニング処理する。一方堆積膜形成時に使用した円筒状基体ホルダーはサンドブラスト処理等により表面の堆積膜を除去するクリーニング処理が施される。このブラスト処理ではガラスのビーズ等によりブラスト処理され、処理後の円筒状基体ホルダーは水洗後乾燥させ再度堆積膜形成用の円筒状基体ホルダーとして使用される。この際にガラスの破片やアルミ片等の水洗等で落としきれなかったものが基板のセッティング時に振動や、擦れ等で脱落し円筒状基体表面に付着してしまう場合もあった。その結果、それらを起点とした堆積膜の異常成長を引き起こし画像欠陥悪化の要因になり得る場合があった。   After the deposited film is formed, a film deposited other than the cylindrical substrate is subjected to a cleaning process in preparation for the next deposited film formation. In the deposited film forming apparatus, instead of the cylindrical substrate holder used for forming the deposited film, a support member having the same shape is installed in the deposited film forming apparatus to clean the inside of the deposited film forming apparatus. On the other hand, the cylindrical substrate holder used for forming the deposited film is subjected to a cleaning process for removing the deposited film on the surface by a sandblast process or the like. In this blasting treatment, blasting is performed with glass beads or the like, and the cylindrical substrate holder after the treatment is washed with water and dried to be used again as a cylindrical substrate holder for forming a deposited film. At this time, glass fragments or aluminum pieces that could not be removed by washing or the like were sometimes dropped due to vibration or rubbing during substrate setting and adhered to the cylindrical substrate surface. As a result, abnormal growth of the deposited film starting from them may be caused, which may be a cause of image defect deterioration.

そこで、本発明は円筒状基板を組み上げる際の人的発塵を抑制し、サンドブラスト処理面積を低減し、真空搬送時の振動等を減少させることで、画像欠陥の原因の1つである堆積膜の異常成長を減少させることができる搬送装置、堆積膜形成装置および堆積膜形成方法を提供することを目的とする。   Therefore, the present invention suppresses human dust generation when assembling a cylindrical substrate, reduces the sandblasting area, and reduces vibrations during vacuum transfer, thereby causing a deposited film that is one of the causes of image defects. An object of the present invention is to provide a transfer apparatus, a deposited film forming apparatus, and a deposited film forming method capable of reducing abnormal growth of the film.

上記目的を達成するため、本発明の真空搬送装置及び方法、また堆積膜形成装置及び方法は、
円筒状基体を減圧可能な搬送容器に格納する手段、格納された搬送容器内を真空排気する手段、搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、搬送容器内に格納された円筒状基体を堆積膜形成装置内に設置する手段を具備した真空搬送装置において、搬送容器内に第1のアーム及び間隔が可変である第2のアームを有する事を特徴とする。
In order to achieve the above object, a vacuum transfer apparatus and method and a deposited film forming apparatus and method of the present invention include:
Means for storing the cylindrical substrate in a depressurized transfer container, means for evacuating the stored transfer container, means for moving the transfer machine equipped with the transfer container onto the deposited film forming apparatus, stored in the transfer container The vacuum transfer apparatus having means for installing the cylindrical substrate in the deposited film forming apparatus is characterized in that the transfer container has a first arm and a second arm whose interval is variable.

円筒状基体の同軸上に円筒状補助部材を載置する手段、円筒状基体を搬送容器内の第1のアーム及び間隔が可変である第2のアームにて減圧可能な搬送容器に格納する手段、格納された搬送容器内を真空排気する手段、搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、搬送容器内に格納された円筒状基体を堆積膜形成装置内に設置する手段を具備した真空搬送装置を用い、堆積膜形成装置内に設置された円筒状基体を回転する手段、複数原料ガス導入管から、堆積膜形成装置内に原料ガスを導入する手段、堆積膜形成装置内を排気する手段、円筒基体を加熱する手段、放電エネルギーにより原料ガスを励起する手段、円筒状基体上に堆積膜を形成手段を有する事を特徴とする。   Means for placing a cylindrical auxiliary member on the same axis as the cylindrical base, and means for storing the cylindrical base in a transport container that can be depressurized by a first arm and a second arm having a variable interval in the transport container. , Means for evacuating the stored transfer container, means for moving the transfer machine provided with the transfer container onto the deposition film forming apparatus, and installing the cylindrical substrate stored in the transfer container in the deposition film forming apparatus Means for rotating a cylindrical substrate installed in the deposited film forming apparatus, means for introducing a source gas into the deposited film forming apparatus from a plurality of source gas introduction pipes, and deposited film formation The apparatus has means for exhausting the inside of the apparatus, means for heating the cylindrical substrate, means for exciting the source gas by discharge energy, and means for forming a deposited film on the cylindrical substrate.

円筒状基体の同軸上に円筒状補助部材を載置し、円筒状基体を減圧可能な搬送容器に格納し、格納された搬送容器内を真空排気し、搬送容器を具備した搬送機を堆積膜形成装置上に移動させ、搬送容器内に格納された円筒状基体を堆積膜形成装置内に設置する真空搬送方法において、円筒状基体の同軸上に載置された円筒状基体及び円筒状補助部材を搬送容器内に格納する際には搬送容器内の第1の搬送アームにより円筒状補助部材を搬送容器内に格納後、搬送容器内の第2の搬送アームにより円筒状基体を格納すると共に、堆積膜形成装置内に円筒状基体を設置する際には、搬送容器内の第2の搬送アームにより堆積膜形成装置に円筒状基体を設置後に円筒状補助部材を搬送容器内の第1の搬送アームにより堆積膜形成装置内の円筒状基体と同軸上に載置する事を特徴とする。   A cylindrical auxiliary member is placed on the same axis of the cylindrical substrate, the cylindrical substrate is stored in a depressurized transfer container, the inside of the stored transfer container is evacuated, and a transfer machine equipped with the transfer container is deposited. A cylindrical substrate and a cylindrical auxiliary member placed on the same axis as a cylindrical substrate in a vacuum transfer method in which a cylindrical substrate stored in a transfer container is moved into a deposition apparatus and placed in a deposited film forming apparatus. When the cylindrical auxiliary member is stored in the transfer container by the first transfer arm in the transfer container, the cylindrical substrate is stored in the second transfer arm in the transfer container. When the cylindrical substrate is installed in the deposited film forming apparatus, the cylindrical auxiliary member is placed in the first transport in the transport container after the cylindrical substrate is installed in the deposited film forming apparatus by the second transport arm in the transport container. Cylindrical substrate in the deposited film forming apparatus by the arm , Characterized in that it is placed on the same axis.

円筒状基体の同軸上に載置された円筒状基体及び円筒状補助部材を搬送容器内に格納する際には搬送容器内の第1の搬送アームにより円筒状補助部材を搬送容器内に格納後、搬送容器内の第2の搬送アームにより円筒状基体を格納すると共に、堆積膜形成装置内に円筒状基体を設置する際には、搬送容器内の第2の搬送アームにより堆積膜形成装置に円筒状基体を設置後に円筒状補助部材を搬送容器内の第1の搬送アームにより堆積膜形成装置内の円筒状基体と同軸上に載置する真空搬送方法を用い、堆積膜形成装置内に円筒状基体上を設置し、円筒状支持体を回転可能し、複数の原料ガス導入管から、堆積膜形成装置内に原料ガスを導入し、堆積膜形成装置内を排気し、円筒基体を加熱し、放電エネルギーにより前記原料ガスを励起しプラズマCVD法により堆積膜を形成する事を特徴とする。   When storing the cylindrical substrate and the cylindrical auxiliary member placed coaxially with the cylindrical substrate in the transfer container, the cylindrical auxiliary member is stored in the transfer container by the first transfer arm in the transfer container. The cylindrical substrate is stored by the second transfer arm in the transfer container, and when the cylindrical substrate is installed in the deposition film forming apparatus, the second transfer arm in the transfer container is used for the deposition film forming apparatus. After the cylindrical substrate is installed, a cylindrical auxiliary member is placed in the deposited film forming apparatus by using a vacuum conveying method in which the cylindrical auxiliary member is placed coaxially with the cylindrical substrate in the deposited film forming apparatus by the first transfer arm in the transfer container. The cylindrical substrate can be rotated, the cylindrical support can be rotated, the source gas is introduced into the deposited film forming apparatus from a plurality of source gas introduction pipes, the inside of the deposited film forming apparatus is exhausted, and the cylindrical substrate is heated. The source gas is excited by discharge energy And forming a deposited film by Ma CVD method.

円筒状支持部材の同軸上に円筒状基体を載置する手段、円筒状基体の同軸上に円筒状補助部材を載置する手段を有する事を特徴とする。   It is characterized by having means for placing a cylindrical substrate on the same axis of the cylindrical support member, and means for placing a cylindrical auxiliary member on the same axis of the cylindrical substrate.

円筒状支持部材の同軸上に円筒状基体を載置する手段、円筒状基体の同軸上に円筒状補助部材を載置する手段、円筒状基体を搬送容器内の第1のアーム及び間隔が可変である第2のアームにて減圧可能な搬送容器に格納する手段、格納された搬送容器内を真空排気する手段、搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、搬送容器内に格納された円筒状基体を堆積膜形成装置内に設置する手段を具備した真空搬送装置を用い、堆積膜形成装置内に設置された円筒状基体を回転する手段、複数原料ガス導入管から、堆積膜形成装置内に原料ガスを導入する手段、堆積膜形成装置内を排気する手段、円筒基体を加熱する手段、放電エネルギーにより原料ガスを励起する手段、円筒状基体上に堆積膜を形成手段を有する事を特徴とする。   Means for placing the cylindrical base on the same axis of the cylindrical support member, means for placing the cylindrical auxiliary member on the same axis of the cylindrical base, and the first arm in the transport container and the interval of the cylindrical base are variable. Means for storing in a transport container that can be depressurized by the second arm, means for evacuating the stored transport container, means for moving a transport machine equipped with the transport container onto the deposited film forming apparatus, transport container A means for rotating the cylindrical substrate installed in the deposition film forming apparatus, a plurality of source gas introduction pipes using a vacuum transfer device having a means for installing the cylindrical substrate stored in the deposition film forming apparatus; , Means for introducing the source gas into the deposited film forming apparatus, means for exhausting the inside of the deposited film forming apparatus, means for heating the cylindrical substrate, means for exciting the source gas with discharge energy, and forming a deposited film on the cylindrical substrate Characterized by having means To.

円筒状支持部材の同軸上に円筒状基体、円筒状補助部材の順で載置し、円筒状基体を減圧可能な搬送容器に格納し、格納された前記搬送容器内を真空排気し、搬送容器を具備した搬送機を堆積膜形成装置上に移動させ、搬送容器内に格納された円筒状基体を堆積膜形成装置内に設置する真空搬送方法において、円筒状支持部材の同軸上に円筒状基体、円筒状補助部材の順で載置された状態の円筒上支持部材および円筒状基体及び円筒状補助部材を搬送容器内に格納する際には搬送容器内の第1の搬送アームにより円筒状補助部材を搬送容器内に格納後に搬送容器内の第2の搬送アームにより円筒状基体及び円筒状支持部材を格納すると共に、堆積膜形成装置内に円筒状基体を設置する時には搬送容器内の第2の搬送アームにより堆積膜形成装置に円筒状基体及び円筒状支持部材を設置後に円筒状補助部材を搬送機内の第1の搬送アームにより堆積膜形成装置内の円筒状基体と同軸上に載置する事を特徴とする。   A cylindrical base and a cylindrical auxiliary member are placed in this order on the same axis of the cylindrical support member, the cylindrical base is stored in a transport container that can be depressurized, and the stored transport container is evacuated and transported. In a vacuum transfer method in which a transporting machine having a cylindrical structure is moved onto a deposition film forming apparatus, and a cylindrical substrate stored in a transport container is installed in the deposition film forming apparatus, the cylindrical support is coaxial with a cylindrical support member. When the cylindrical support member, the cylindrical base member, and the cylindrical auxiliary member that are placed in the order of the cylindrical auxiliary member are stored in the transfer container, the cylindrical support is provided by the first transfer arm in the transfer container. After the member is stored in the transfer container, the cylindrical substrate and the cylindrical support member are stored by the second transfer arm in the transfer container. When the cylindrical substrate is installed in the deposition film forming apparatus, the second transfer arm in the transfer container is used. Deposited film forming equipment by the transfer arm Characterized in that it placed on the cylindrical substrate and the cylindrical support member disposed after the cylindrical auxiliary member the first cylindrical body coaxially deposited film forming the device by the transfer arm of the transfer machine to.

円筒状支持部材の同軸上に円筒状基体、円筒状補助部材の順で載置された状態の円筒上支持部材および円筒状基体及び円筒状補助部材を搬送容器内に格納する際には搬送容器内の第1の搬送アームにより円筒状補助部材を搬送容器内に格納後に搬送容器内の第2の搬送アームにより円筒状基体及び円筒状支持部材を格納すると共に、堆積膜形成装置内に円筒状基体を設置する時には搬送容器内の第2の搬送アームにより堆積膜形成装置に円筒状基体及び円筒状支持部材を設置後に円筒状補助部材を搬送機内の第1の搬送アームにより堆積膜形成装置内の円筒状基体と同軸上に載置する真空搬送方法を用い、堆積膜形成装置内に円筒状基体上を設置し、円筒状支持体を回転可能し、複数の原料ガス導入管から、堆積膜形成装置内に原料ガスを導入し、堆積膜形成装置内を排気し、円筒基体を加熱し、放電エネルギーにより原料ガスを励起しプラズマCVD法により堆積膜を形成する事を特徴とする。   When storing the cylindrical upper support member, the cylindrical base member, and the cylindrical auxiliary member on the same axis of the cylindrical support member in the order of the cylindrical base member and the cylindrical auxiliary member, After the cylindrical auxiliary member is stored in the transfer container by the first transfer arm, the cylindrical substrate and the cylindrical support member are stored by the second transfer arm in the transfer container, and cylindrical in the deposited film forming apparatus. When the substrate is installed, the cylindrical substrate and the cylindrical support member are set in the deposited film forming apparatus by the second transfer arm in the transfer container, and then the cylindrical auxiliary member is placed in the deposited film forming apparatus by the first transfer arm in the transfer machine. Using a vacuum transfer method that is placed coaxially with the cylindrical substrate, and installed on the cylindrical substrate in the deposition film forming apparatus, the cylindrical support can be rotated, and the deposited film is formed from a plurality of source gas introduction pipes. Introduce raw material gas into the forming device And, evacuating the deposition film forming the device, heating the cylindrical substrate, and forming a deposited film by a material gas excited plasma CVD by discharge energy.

本発明によれば、円筒状基体を支持していた円筒状基体ホルダーを無くした事により、円筒状基体ホルダーと円筒状基体との接触や擦れによる発塵を抑制できる事が可能となった結果、アルミニウムの金属粉や円筒状基体ホルダーをブラスト処理する際に使用するガラスビーズ等のダストを低減する事が可能となり円筒状基体ホルダー起因で発生していた画像欠陥を大幅に低減する事が可能となった。   According to the present invention, by eliminating the cylindrical substrate holder that supported the cylindrical substrate, it is possible to suppress dust generation due to contact and rubbing between the cylindrical substrate holder and the cylindrical substrate. It is possible to reduce dust such as glass beads used when blasting aluminum metal powder and cylindrical substrate holder, and it is possible to greatly reduce image defects caused by cylindrical substrate holder. It became.

また円筒状基体ホルダーを無くす事により、従来は円筒状基体ホルダーの内面よりヒータを用いて円筒状基体を間接的に昇温させていたを、円筒状基体ホルダーを無くす事によりヒータからの熱伝達の効率化が図れ昇温速度のアップと少電力化が可能となった。   In addition, by eliminating the cylindrical substrate holder, the temperature of the cylindrical substrate has been raised indirectly by using a heater from the inner surface of the cylindrical substrate holder. However, heat transfer from the heater is eliminated by eliminating the cylindrical substrate holder. As a result, it has become possible to increase the heating rate and reduce power consumption.

また予期せぬ効果としてヒータからの熱伝達の効率化が図れた結果、今まで熱が逃げや易くなっていた部分の温度の落ち込みが是正された結果、電子写真特性のムラが良化した。   As an unexpected effect, the efficiency of heat transfer from the heater was improved. As a result, the temperature drop in the part where heat had been easily escaped was corrected. As a result, the unevenness of the electrophotographic characteristics was improved.

以下、本発明の具体的な実施形態について、図面を参照して説明する。   Hereinafter, specific embodiments of the present invention will be described with reference to the drawings.

(第1の実施形態)
図1は、本実施形態で用いるRF帯の高周波電源を用いたRFプラズマCVD法による感光体の堆積製造装置システムの一例を模式的に示した図で、投入エリア124、搬送システム101、堆積膜形成装置102により構成されている。投入エリア124はプレフィルター、ヘパフィルターを用いJIS規格B9920で示されるクラス3のクリーン環境に設定された所謂クリーンルームである。125は外環境とのクリーンルームの壁を示している。また投入エリア124には、組み上げられた円筒状基体及び、円筒状補助部材の上には搬送容器103がドッキングし、搬送容器103内を真空引き可能にする為、真空排気ライン及び排気装置(不図示)が取り付けられたゲート弁130が設置されている。
(First embodiment)
FIG. 1 is a diagram schematically showing an example of a photoreceptor deposition manufacturing apparatus system by RF plasma CVD using an RF band high-frequency power source used in this embodiment, and includes an input area 124, a transport system 101, and a deposited film. The forming apparatus 102 is configured. The input area 124 is a so-called clean room set in a class 3 clean environment shown in JIS standard B9920 using a pre-filter and a hepa filter. Reference numeral 125 denotes a clean room wall with the outside environment. In addition, in the charging area 124, the transport container 103 is docked on the assembled cylindrical base and the cylindrical auxiliary member, so that the inside of the transport container 103 can be evacuated. A gate valve 130 to which (shown) is attached is installed.

図2には円筒状基体及び、円筒状補助部材及び円筒状支持部材を無人で組み上げる機構を模式的に示している。また図3は図1に示した搬送システムにおける円筒状基体及び円筒状補助部材を搬送する時の搬送アームの動きを模式的に示す平面図である。この時図3には搬送アームの動きをStepを追って説明しており、円筒状基体を搬送容器内に格納する時にはStep1から順にStep4に進んで行くことを、また円筒状基体を反応容器より設置する場合には格納時とは逆にStep4から順にStep1に進んで行くことを示している。   FIG. 2 schematically shows a mechanism for automatically assembling the cylindrical base, the cylindrical auxiliary member, and the cylindrical support member. FIG. 3 is a plan view schematically showing the movement of the transfer arm when transferring the cylindrical base and the cylindrical auxiliary member in the transfer system shown in FIG. At this time, FIG. 3 illustrates the movement of the transfer arm in a step-by-step manner. When the cylindrical substrate is stored in the transfer container, the process proceeds from Step 1 to Step 4 in sequence, and the cylindrical substrate is installed from the reaction container. In this case, it is shown that the process proceeds from Step 4 to Step 1 in reverse order from the time of storage.

本発明において円筒状基体207と円筒状補助部材208を各々個別の搬送容器に格納し搬送する方法もあるが、その場合には各部材を個別に格納する為の搬送容器103が部材点数分だけ台数が必要となり設備投資が膨大となると共に円筒状基体207と円筒状補助部材208を設置する為には、各部材を格納した搬送容器103を、堆積膜形成装置102とドッキングし、搬送容器と堆積膜形成装置間を真空排気し、堆積膜形成装置に設置すると言う事を、円筒状基体207と円筒状補助部材208が堆積膜形成装置内に設置されるまで繰り返し行わなければならず搬送タクトが大幅に延びる等の弊害が発生するため、同じ搬送容器内にて多数の部品を一度に搬送する装置および方法が最適である。   In the present invention, there is a method of storing and transporting the cylindrical base body 207 and the cylindrical auxiliary member 208 in individual transport containers, but in that case, the transport container 103 for storing each member individually is the same as the number of members. In order to install a cylindrical substrate 207 and a cylindrical auxiliary member 208, the number of units is required and the capital investment is enormous, and the transfer container 103 storing each member is docked with the deposited film forming apparatus 102, and the transfer container and The evacuation between the deposited film forming apparatuses and the installation in the deposited film forming apparatus must be repeated until the cylindrical substrate 207 and the cylindrical auxiliary member 208 are installed in the deposited film forming apparatus. Therefore, an apparatus and a method for conveying a large number of parts at the same time in the same conveyance container are optimal.

以上のように構成された堆積膜形成システムを用いて円筒状基体を搬送し堆積膜形成装置に設置する手順及び、堆積膜形成装置を用いて堆積膜を形成する方法の手順の一例について説明する。   An example of a procedure for transporting a cylindrical substrate using the deposited film forming system configured as described above and setting it in the deposited film forming apparatus and an example of a procedure for forming a deposited film using the deposited film forming apparatus will be described. .

図2(a)において、洗浄装置(不図示)により円筒状基体207表面を洗浄し図1に示すクリーンルーム124内に搬入される、同時に円筒状基体207とは異なる輸送手段(不図示)より表面のブラスト処理を施しクリーニング処理された円筒状補助部材208が同じくクリーンルーム124内に搬入される。円筒状基体207と円筒状補助部材208は組み上げ位置まで輸送機構(不図示)により輸送される。輸送が完了した円筒状基体207および円筒状補助部材208は、自動組み上げ装置213により円筒状補助部材208が円筒状基体207の同軸上に載置される。自動組み上げ装置213(a)は、ベース216、昇降コラム217、アーム214、チャック215により構成されている。ホルダーを組み上げる手順としては、まず昇降コラム217、アーム214を駆動させてチャック215を円筒状補助部材208上まで移動させ、円筒状補助部材208の内面をチャックし上昇させる。次に同じく昇降コラム217、アーム214を駆動させ、チャック215でチャックした円筒状補助部材208を円筒状基体207の同軸上まで移動させ、円筒状基体207上に載置する。次に組み上がった基板を搬送機内に格納する為の位置まで移動機構(不図示)により移動させる。以上で円筒状基板及び円筒状補助部材を搬送容器内に格納する準備が完了する。   In FIG. 2A, the surface of the cylindrical base 207 is cleaned by a cleaning device (not shown) and carried into the clean room 124 shown in FIG. 1, and the surface is simultaneously transported from a transport means (not shown) different from the cylindrical base 207. The cylindrical auxiliary member 208 that has been subjected to the blasting process and cleaned is carried into the clean room 124 as well. The cylindrical base body 207 and the cylindrical auxiliary member 208 are transported to the assembly position by a transport mechanism (not shown). The cylindrical base member 207 and the cylindrical auxiliary member 208 that have been transported are placed on the same axis as the cylindrical base member 207 by the automatic assembling apparatus 213. The automatic assembly device 213 (a) includes a base 216, a lifting column 217, an arm 214, and a chuck 215. As a procedure for assembling the holder, first, the lifting column 217 and the arm 214 are driven to move the chuck 215 onto the cylindrical auxiliary member 208, and the inner surface of the cylindrical auxiliary member 208 is chucked and raised. Next, the lifting column 217 and the arm 214 are similarly driven, and the cylindrical auxiliary member 208 chucked by the chuck 215 is moved to the same axis as the cylindrical base 207 and placed on the cylindrical base 207. Next, the assembled substrate is moved by a moving mechanism (not shown) to a position for storing in the transfer machine. The preparation for storing the cylindrical substrate and the cylindrical auxiliary member in the transfer container is thus completed.

次に組み上がった基板を搬送容器103内に格納する手順を図3を用いて説明する。図3において、搬送容器301内には第1のアーム302と第2のアーム303が設けられている。先ず搬送容器301内をリーク用のN等の不活性ガスにより大気圧に戻しゲート弁305が開放される。 Next, a procedure for storing the assembled substrate in the transfer container 103 will be described with reference to FIG. In FIG. 3, a first arm 302 and a second arm 303 are provided in the transport container 301. First, the inside of the transfer container 301 is returned to atmospheric pressure with an inert gas such as N 2 for leakage, and the gate valve 305 is opened.

次いで搬送容器301が下降しゲート弁305と図1で示すゲート弁130がドッキングする。ドッキング後に図1に示すゲート弁130が開放された後に、Step1で第2のアーム303が、第1のアーム302が下降する軌道を確保するために、左右に開く。   Next, the transfer container 301 is lowered and the gate valve 305 and the gate valve 130 shown in FIG. 1 are docked. After the gate valve 130 shown in FIG. 1 is opened after docking, in Step 1, the second arm 303 opens to the left and right to secure a trajectory for the first arm 302 to descend.

次に第1のアーム302が下降し円筒状補助部材308をチャックする。Step2では第1のアームでチャックした円筒状補助部材302を搬送容器301内に引き上げる。Step3では円筒状補助部材308が引き上げ完了した時点で、左右に開いていた第2のアーム303を閉じ、下降し、円筒状基体307の内面をチャックする。Step4ではチャックした円筒状基体307を搬送容器301内に引き上げられ格納が完了し格納Stepが終了する。   Next, the first arm 302 is lowered to chuck the cylindrical auxiliary member 308. In Step 2, the cylindrical auxiliary member 302 chucked by the first arm is pulled up into the transport container 301. In Step 3, when the cylindrical auxiliary member 308 is completely pulled up, the second arm 303 that has been opened to the left and right is closed and lowered to chuck the inner surface of the cylindrical base body 307. In Step 4, the chucked cylindrical base body 307 is pulled up into the transport container 301 to complete the storage, and the storage Step ends.

その後、ゲート弁305は開放のまま図1に示すゲート弁130を閉じ、基板が格納された搬送容器301内は、真空排気ライン及び排気装置(不図示)により搬送容器301内を真空に引き上げる。真空に引き上げられた後にゲート弁305を閉じ真空保持が完了する。その後ゲート弁305と図1に示すゲート弁130間を大気開放した後、ゲート弁305と図1に示すゲート弁130を搬送容器305を上昇させる事で解除し搬送可能となる。   Thereafter, the gate valve 305 shown in FIG. 1 is closed while the gate valve 305 is open, and the inside of the transfer container 301 in which the substrate is stored is pulled up to a vacuum by a vacuum exhaust line and an exhaust device (not shown). After the vacuum is pulled up, the gate valve 305 is closed to complete the vacuum holding. Thereafter, the space between the gate valve 305 and the gate valve 130 shown in FIG. 1 is opened to the atmosphere, and then the gate valve 305 and the gate valve 130 shown in FIG.

搬送可能となった円筒状基体307及び円筒状補助部材308は搬送システム101により堆積膜形成装置102上に移動する。この時反応容器113内は堆積膜形成装置102に設けられた排気装置(不図示)を用いて真空に排気されている。移動した搬送容器103は、堆積膜形成装置102上に設けられたゲートバルブ111に下降しドッキングする。ドッキング後、搬送容器のゲート弁105と堆積膜形成装置のゲート弁111間をゲート間を排気する排気ポンプ(不図示)により真空引きされる。搬送容器103及びゲート弁105と111間及び反応容器113内が全て同圧になった時点でゲート弁105とゲート弁111を開ける。   The cylindrical substrate 307 and the cylindrical auxiliary member 308 that can be transferred are moved onto the deposited film forming apparatus 102 by the transfer system 101. At this time, the inside of the reaction vessel 113 is evacuated to a vacuum using an exhaust device (not shown) provided in the deposited film forming apparatus 102. The transferred transport container 103 is lowered to the gate valve 111 provided on the deposited film forming apparatus 102 and docked. After docking, the gate valve 105 of the transfer container and the gate valve 111 of the deposited film forming apparatus are evacuated by an exhaust pump (not shown) that exhausts between the gates. The gate valve 105 and the gate valve 111 are opened when the transfer container 103 and the gate valves 105 and 111 and the reaction container 113 all have the same pressure.

次に基板を堆積膜形成装置102内の受台116に設置する。この時の円筒状基板307及び円筒状補助部材308の設置手順としては前述でしめした円筒状基板307及び円筒状補助部材308を引き上げる時のStep進行(Step1→Step4)と逆のStep進行(Step4→Step1)で逆の動作により受台116に設置される。円筒状基体307及び円筒状補助部材308が設置されたら第1、第2アームが搬送容器内に格納され、ゲート弁105、111が閉じた後に、ゲート弁105、111間を大気圧に戻し、堆積膜形成装置102と搬送容器103を分離する。以上で円筒状基体307、207及び円筒所補助部材308、207の堆積膜形成装置への設置が完了する所となる。   Next, the substrate is placed on a cradle 116 in the deposited film forming apparatus 102. As the installation procedure of the cylindrical substrate 307 and the cylindrical auxiliary member 308 at this time, the step progression (Step 1 → Step 4) opposite to the step progression (Step 1 → Step 4) when the cylindrical substrate 307 and the cylindrical auxiliary member 308 shown above are pulled up is performed. → In Step 1), the cradle 116 is installed in the reverse operation. When the cylindrical base 307 and the cylindrical auxiliary member 308 are installed, the first and second arms are stored in the transfer container, and after the gate valves 105 and 111 are closed, the gate valves 105 and 111 are returned to atmospheric pressure, The deposited film forming apparatus 102 and the transfer container 103 are separated. The cylindrical bases 307 and 207 and the cylindrical auxiliary members 308 and 207 are thus completely installed in the deposited film forming apparatus.

図1における堆積膜形成装置102には、ゲートバルブ111、上面絶縁碍子112、反応容器113、下部絶縁碍子114、複数の原料ガス導入管120、ベースプレート115、排気ライン121、高周波電源123、マッチングボックス122で構成され、反応容器113内には、円筒状基体設置台116、円筒状基体117、円筒状補助部材118が搬送システム101により搬入設置される。   1 includes a gate valve 111, an upper insulator 112, a reaction vessel 113, a lower insulator 114, a plurality of source gas introduction pipes 120, a base plate 115, an exhaust line 121, a high frequency power source 123, a matching box. 122, a cylindrical substrate mounting table 116, a cylindrical substrate 117, and a cylindrical auxiliary member 118 are carried into the reaction vessel 113 by the transfer system 101.

反応容器113内には複数の原料ガス導入管120が設置されている。複数の原料ガス導入管120は、円筒状基体117と、反応容器113の側壁との間に配置され、円筒状基体112の外周面と略同心となる1つの円周上に、円筒状基体117を取り囲むようにして配置されている。複数の原料ガス導入管120には原料ガスの流量を調整するためのマスフローコントローラ(不図示)を介在したミキシング(不図示)と、原料ガス流入バルブ(不図示)とを具備している。   A plurality of source gas introduction pipes 120 are installed in the reaction vessel 113. The plurality of source gas introduction pipes 120 are disposed between the cylindrical substrate 117 and the side wall of the reaction vessel 113, and on one circumference that is substantially concentric with the outer peripheral surface of the cylindrical substrate 112, the cylindrical substrate 117. It is arranged so as to surround. The plurality of source gas introduction pipes 120 are provided with mixing (not shown) with a mass flow controller (not shown) for adjusting the flow rate of the source gas, and a source gas inflow valve (not shown).

原料ガスの吹き出し方向は反応容器113の内壁に対し接線方向に吹き出している。吹き出す穴数は特に制限は無いが両接線方向である2方向が最適である。また反応容器113の側壁には高周波マッチングボックス122を介して高周波電源123が接続されている。   The source gas is blown out in a tangential direction with respect to the inner wall of the reaction vessel 113. The number of holes to be blown out is not particularly limited, but two directions which are both tangential directions are optimal. A high frequency power source 123 is connected to the side wall of the reaction vessel 113 via a high frequency matching box 122.

さらに反応容器113の下部には円筒状基体117を回転させるためのモータが動力伝達系(不図示)を介し円筒状基体設置台116を介して円筒状基体117が回転可能となっている。   Further, at the lower part of the reaction vessel 113, a motor for rotating the cylindrical substrate 117 can rotate the cylindrical substrate 117 via a cylindrical substrate mounting table 116 via a power transmission system (not shown).

また反応容器113には排気口121が接続されている。この排気口は排気装置(不図示)と連通し反応容器113内をバラトロン等の圧力検出器(不図示)を見ながら一定の圧力に保つように構成されている。   An exhaust port 121 is connected to the reaction vessel 113. This exhaust port communicates with an exhaust device (not shown) and is configured to maintain a constant pressure in the reaction vessel 113 while looking at a pressure detector (not shown) such as Baratron.

なお反応容器113は上碍子112、下碍子114にて反応容器113及びアースと絶縁されている。   The reaction vessel 113 is insulated from the reaction vessel 113 and the ground by the upper insulator 112 and the lower insulator 114.

円筒状基体117は、使用目的に応じた材質を有するものであればよい。円筒状基体117の材質としては、例えば、銅、アルミニウム、金、銀、白金、鉛、ニッケル、コバルト、鉄、クロム、モリブデン、チタン、ステンレス等が、電気伝導率が良好であるため好適であるが、加工性や製造コストを考慮して、アルミニウムが最適である。また、円筒状基体117を形成するアルミニウムとしては、例えばAl−Mg系合金、A−Mn系合金のいずれかを用いることが好ましい。   The cylindrical substrate 117 may be any material having a material corresponding to the purpose of use. As the material of the cylindrical substrate 117, for example, copper, aluminum, gold, silver, platinum, lead, nickel, cobalt, iron, chromium, molybdenum, titanium, stainless steel, and the like are preferable because of their good electrical conductivity. However, aluminum is optimal in consideration of workability and manufacturing cost. Moreover, as aluminum which forms the cylindrical base | substrate 117, it is preferable to use either an Al-Mg type alloy or an A-Mn type alloy, for example.

加熱用ヒータ129は、円筒状基体117の内部に設けられている。加熱用ヒータ129は、真空中で使用可能である発熱体であればよく、具体的にはシース状ヒータ、板状ヒータ、セラミックヒータ、カーボンヒータ等の電気抵抗発熱体や、ハロゲンランプ、赤外線ランプ等の熱放射ランプ発熱体や、液体、気体等を熱媒とした熱交換手段による発熱体等が対象として挙げられる。加熱用ヒータ129の表面材料としては、ステンレス、ニッケル、アルミニウム、銅等の金属類や、セラミック、耐熱性高分子樹脂等を使用することができる。   The heating heater 129 is provided inside the cylindrical base body 117. The heating heater 129 may be a heating element that can be used in a vacuum. Specifically, an electric resistance heating element such as a sheath heater, a plate heater, a ceramic heater, a carbon heater, a halogen lamp, an infrared lamp, or the like. Examples of the heat radiation lamp heating element such as a heat radiation lamp and the like, and a heating element by heat exchange means using a liquid, gas, or the like as a heat medium, are examples. As the surface material of the heater 129, metals such as stainless steel, nickel, aluminum, and copper, ceramics, heat resistant polymer resins, and the like can be used.

以上のように構成された堆積膜形成装置を用いて堆積膜を形成する方法の手順の一例について以下説明する。   An example of a procedure of a method for forming a deposited film using the deposited film forming apparatus configured as described above will be described below.

まず、反応容器113内を排気装置(不図示)により排気する。続いて応容器113内に複数の原料ガス導入管120を介して、円筒状基体117の加熱に必要な原料ガス、例えばAr、He等のガスを供給し、排気装置を用いて反応容器113内を所定の圧力になるように圧力検出器128を見ながら調整する。次に、所定の圧力になった後、加熱用ヒータ129に通電し、温度コントローラ(不図示)にて、円筒状基体113の温度を200[℃]〜450[℃]程度、より好ましくは250[℃]〜350[℃]程度の所望の温度に制御する。   First, the inside of the reaction vessel 113 is exhausted by an exhaust device (not shown). Subsequently, a source gas necessary for heating the cylindrical substrate 117, for example, a gas such as Ar or He, is supplied into the reaction vessel 113 via a plurality of source gas introduction pipes 120, and the reaction vessel 113 is filled with an exhaust device. Is adjusted to a predetermined pressure while looking at the pressure detector 128. Next, after reaching a predetermined pressure, the heater 129 is energized, and the temperature of the cylindrical substrate 113 is set to about 200 [° C.] to 450 [° C.], more preferably 250 by a temperature controller (not shown). Control to a desired temperature of about [° C.] to 350 [° C.].

以上の手順によって堆積膜を形成する準備が完了した後、円筒状基体117上に光導電層の形成を行う。すなわち、加熱用の原料ガスと堆積膜形成用の原料ガスをミキシング(不図示)を介して入れ替え、堆積膜形成用の原料ガスが所望の流量になるように調整する。次いで反応容器113内が13.3[mPa]〜1330[Pa]程度の所望の圧力になるように圧力検出器128を確認しながら排気装置を調整する。   After the preparation for forming the deposited film is completed by the above procedure, a photoconductive layer is formed on the cylindrical substrate 117. That is, the source gas for heating and the source gas for forming the deposited film are exchanged via mixing (not shown), and the source gas for forming the deposited film is adjusted to have a desired flow rate. Next, the exhaust device is adjusted while checking the pressure detector 128 so that the inside of the reaction vessel 113 has a desired pressure of about 13.3 [mPa] to 1330 [Pa].

反応容器113内の圧力が安定した後、高周波電源123を所望の電力に設定して、例えば周波数13.56[MHz]のRF電源を用いて、高周波電力を高周波マッチングボックス122を介して反応容器113に供給することで、高周波グロー放電を生起させる。   After the pressure in the reaction vessel 113 is stabilized, the high frequency power source 123 is set to a desired power, and the high frequency power is supplied to the reaction vessel via the high frequency matching box 122 using, for example, an RF power source having a frequency of 13.56 [MHz]. By supplying to 113, a high frequency glow discharge is caused.

この放電エネルギーによって、反応容器113内に導入された原料ガスが分解され、円筒状基体117上に所望のシリコン原子を主成分とする堆積膜が形成される。   By this discharge energy, the raw material gas introduced into the reaction vessel 113 is decomposed, and a deposited film containing a desired silicon atom as a main component is formed on the cylindrical substrate 117.

均一な堆積膜を形成するために、堆積膜を形成するのと同時期、あるいは円筒状基体117を加熱する段階で、モータ(不図示)を回転させ1[rpm]〜10[rpm]程度、例えば1[rpm]の回転速度で回転させる。こうすることで、円筒状基体117の周方向に均一な堆積膜が形成される。   In order to form a uniform deposited film, at the same time as the deposited film is formed, or at the stage where the cylindrical substrate 117 is heated, a motor (not shown) is rotated to about 1 [rpm] to 10 [rpm], For example, it is rotated at a rotational speed of 1 [rpm]. By doing so, a uniform deposited film is formed in the circumferential direction of the cylindrical substrate 117.

次に、堆積膜が形成された後、原料ガスおよび高周波電力の供給を停止し、反応容器113内を排気する。その後、反応容器113および複数の原料ガス導入管120内をパージガス、例えばAr等の不活性ガスおよびNの少なくとも一方を用いてパージ処理を行う。パージ処理完了後、円筒状基体117および円筒状補助部材118を搬送容器103と同じ構成をした搬送容器104を用いて反応容器113内から取り出す。 Next, after the deposited film is formed, the supply of the source gas and the high frequency power is stopped, and the inside of the reaction vessel 113 is exhausted. Thereafter, the inside of the reaction vessel 113 and the plurality of source gas introduction pipes 120 is purged using a purge gas, for example, at least one of an inert gas such as Ar and N 2 . After the purge process is completed, the cylindrical substrate 117 and the cylindrical auxiliary member 118 are taken out from the reaction container 113 using the transport container 104 having the same configuration as the transport container 103.

搬送容器104にて円筒状基体117および円筒状補助部材118を取り出す手順としては、搬送容器104を搬送システム101によって堆積膜形成装置102上に移動する。この時搬送容器104内は予め別の場所にて真空排気され真空保持された状態である。移動した搬送容器104は、堆積膜形成装置102上に設けられたゲートバルブ111に下降しドッキングする。ドッキング後、搬送容器のゲート弁105と堆積膜形成装置のゲート弁111間をゲート間を排気する排気ポンプ(不図示)により真空引きされる。搬送容器104及びゲート弁105と111間及び反応容器113内が全て同圧になった時点でゲート弁105とゲート弁111を開ける。その後は図3に示すStep1→Step4の進行方向で円筒状基体117および円筒状補助部材118を取り出し、搬送容器104内に格納する。格納後はゲート弁105、111が閉じた後に、ゲート弁105、111間を大気圧に戻し、堆積膜形成装置102と搬送容器104を分離し堆積膜形成装置102から円筒状基体117および円筒状補助部材118が取り出される。取り出された円筒状基体117および円筒状補助部材118は所定の排出台(不図示)に搬送システム101により搬送される。その後搬送容器104内をN等の不活性ガスにより大気に戻されゲート弁105が開放される。大気開放された反応容器104内に格納されている円筒状基体117および円筒状補助部材118は図3に示すStep4→1の進行方法で排出台に設置される。円筒状基体117及び円筒状補助部材118が設置されたら第1、第2アームが搬送容器内に格納され、円筒状基体117及び円筒状補助部材118の排出が完了する。 As a procedure for taking out the cylindrical substrate 117 and the cylindrical auxiliary member 118 in the transfer container 104, the transfer container 104 is moved onto the deposited film forming apparatus 102 by the transfer system 101. At this time, the inside of the transfer container 104 is evacuated and held in advance in another place. The transferred transport container 104 is lowered to the gate valve 111 provided on the deposited film forming apparatus 102 and docked. After docking, the gate valve 105 of the transfer container and the gate valve 111 of the deposited film forming apparatus are evacuated by an exhaust pump (not shown) that exhausts between the gates. When the transfer container 104 and the gate valves 105 and 111 and the reaction container 113 are all at the same pressure, the gate valve 105 and the gate valve 111 are opened. Thereafter, the cylindrical base 117 and the cylindrical auxiliary member 118 are taken out in the advancing direction from Step 1 to Step 4 shown in FIG. After the storage, after the gate valves 105 and 111 are closed, the pressure between the gate valves 105 and 111 is returned to the atmospheric pressure, the deposited film forming apparatus 102 and the transfer container 104 are separated, and the cylindrical substrate 117 and the cylindrical shape are separated from the deposited film forming apparatus 102. The auxiliary member 118 is taken out. The cylindrical base member 117 and the cylindrical auxiliary member 118 thus taken out are transported by the transport system 101 to a predetermined discharge table (not shown). Thereafter, the inside of the transfer container 104 is returned to the atmosphere by an inert gas such as N 2 and the gate valve 105 is opened. The cylindrical base member 117 and the cylindrical auxiliary member 118 housed in the reaction vessel 104 opened to the atmosphere are installed on the discharge table by the step 4 → 1 progression method shown in FIG. When the cylindrical base 117 and the cylindrical auxiliary member 118 are installed, the first and second arms are stored in the transfer container, and the discharge of the cylindrical base 117 and the cylindrical auxiliary member 118 is completed.

その次に、堆積したポリシラン等の副生成物をクリーニング処理を行う。その時の手順としては、円筒状基体117および円筒状補助部材118の排出が終了した搬送容器104を用い、円筒状基体117および円筒状補助部材118と同一形状をしたクリーニング用の支持基体(不図示)を堆積膜形成装置102内に設置する。設置手順としては図3のStep1〜Step4の進行手順でクリーニング用の支持基体を搬送容器104、301内に格納する。格納後はゲート弁105、305を閉じ搬送容器104、301内を大気圧の状態のまま堆積膜形成装置102に搬送システム101によって堆積膜形成装置102上に移動する。移動後に堆積膜形成装置102上に設けられたゲートバルブ111に下降しドッキングする。ドッキング後、搬送容器のゲート弁105、305のみを開放し堆積膜形成装置のゲート弁111間をゲート間を排気する排気ポンプ(不図示)により真空引きされる。搬送容器104及び反応容器113内が同圧になった時点でゲート弁111を開ける。その後は図3に示すStep4→Step1の進行手順でクリーニング用の支持基体を設置する。設置後は搬送容器104内の第1、第2アームが搬送容器内に格納され、ゲート弁105、111が閉じた後に、ゲート弁105、111間を大気圧に戻し、堆積膜形成装置102と搬送容器103を分離しクリーニング用の支持基体の堆積膜形成装置内への設置が完了する。   Next, the deposited by-product such as polysilane is subjected to a cleaning process. As a procedure at that time, a carrier 104 for which the cylindrical base 117 and the cylindrical auxiliary member 118 have been discharged is used, and a cleaning support base (not shown) having the same shape as the cylindrical base 117 and the cylindrical auxiliary member 118 is used. ) In the deposited film forming apparatus 102. As an installation procedure, the supporting substrate for cleaning is stored in the transport containers 104 and 301 in the procedure of Step 1 to Step 4 in FIG. After storage, the gate valves 105 and 305 are closed, and the inside of the transfer containers 104 and 301 is moved to the deposited film forming apparatus 102 by the transfer system 101 to the deposited film forming apparatus 102 while maintaining the atmospheric pressure. After the movement, it is lowered to the gate valve 111 provided on the deposited film forming apparatus 102 and docked. After docking, only the gate valves 105 and 305 of the transfer container are opened, and the gate valve 111 of the deposited film forming apparatus is evacuated by an exhaust pump (not shown) that exhausts between the gates. The gate valve 111 is opened when the inside of the transfer container 104 and the reaction container 113 becomes the same pressure. After that, the cleaning support substrate is set in the procedure of Step 4 → Step 1 shown in FIG. After installation, the first and second arms in the transfer container 104 are stored in the transfer container, and after the gate valves 105 and 111 are closed, the pressure between the gate valves 105 and 111 is returned to atmospheric pressure, and the deposited film forming apparatus 102 and The transfer container 103 is separated, and the installation of the cleaning support substrate in the deposited film forming apparatus is completed.

次に排気装置(不図示)により反応容器113内を排気し複数の原料ガス導入管120を介して反応容器113内のクリーニング処理に必要な原料ガスを供給し排気装置(不図示)を用い反応容器113内を所定の圧力になるように圧力検出器128を見ながら調整する。反応容器113内の圧力が安定した後、高周波電源123を所望の電力に設定して、例えば周波数13.56[MHz]のRF電源を用いて、高周波電力を高周波マッチングボックス122を介して反応容器113に供給して高周波グロー放電を生起させる。この放電エネルギーによって反応容器113内に導入されたクリーニング用の原料ガスが分解され反応容器113内がクリーニング処理される。   Next, the inside of the reaction vessel 113 is evacuated by an exhaust device (not shown), the raw material gas necessary for the cleaning process in the reaction vessel 113 is supplied via a plurality of raw material gas introduction pipes 120, and the reaction is performed using the exhaust device (not shown). The inside of the container 113 is adjusted while looking at the pressure detector 128 so as to become a predetermined pressure. After the pressure in the reaction vessel 113 is stabilized, the high frequency power source 123 is set to a desired power, and the high frequency power is supplied to the reaction vessel via the high frequency matching box 122 using, for example, an RF power source having a frequency of 13.56 [MHz]. The high frequency glow discharge is caused to be supplied to 113. With this discharge energy, the cleaning source gas introduced into the reaction vessel 113 is decomposed and the inside of the reaction vessel 113 is cleaned.

次に、クリーニング処理後に高周波電力の供給を停止し反応容器113内を排気装置(不図示)により排気する。その後反応容器113および原料ガス導入管120内をパージガス、例えばAr等の不活性ガスおよびNの少なくとも一方を用いてパージ処理を行う。パージ処理完了後、クリーニング用の支持基体を搬送容器104を用いて堆積膜形成終了後の円筒状基体117および円筒状補助部材118の取り出し手順と同様の方法にてクリーニング用の支持基体が搬送機104により堆積膜形成装置101内より取り出される。取り出されたクリーニング用の支持基体はクリーニング用の支持基体設置場所で搬送され設置される。 Next, the supply of high-frequency power is stopped after the cleaning process, and the reaction vessel 113 is exhausted by an exhaust device (not shown). Thereafter, the inside of the reaction vessel 113 and the source gas introduction pipe 120 is purged using a purge gas, for example, at least one of an inert gas such as Ar and N 2 . After completion of the purging process, the cleaning support substrate is transferred to the carrier by a method similar to the procedure for removing the cylindrical substrate 117 and the cylindrical auxiliary member 118 after the deposition film formation is completed using the transfer container 104. It is taken out from the deposited film forming apparatus 101 by 104. The taken-out cleaning support substrate is transported and installed at the cleaning support substrate installation location.

本実施形態において、原料ガスの吹き出し方向は反応容器113の内壁に対し接線方向に吹き出している。吹き出す穴数は特に制限は無いが両接線方向である2方向が有効である。   In the present embodiment, the blowing direction of the source gas is blown tangential to the inner wall of the reaction vessel 113. The number of holes to be blown out is not particularly limited, but two directions which are both tangential directions are effective.

これについては以下のように考える。特に原料ガスの供給量は一定で原料ガス導入管の本数を減らす場合や、原料ガス導入管の本数は同じで原料ガスの供給量を増やす場合などは原料ガス導入管に供給された原料ガスの吹き出し圧力が高くなる。その場合原料ガスの吹き出し方向が円筒状基体側に向いていると原料ガス導入管より直接円筒状基体にダスト等を吹き付けたり、逆に原料ガスの吹き出し方向が反応容器側に向いていると反応容器の内壁からダスト等を巻き上げたりと、何れも円筒状基体に付着し堆積膜の異常成長の原因となる場合がある。その為、原料ガスの吹き出し方向を反応容器の接線方向に設定する事により原料ガス導入管の本数や原料ガスの供給量によらず堆積膜の異常成長を抑えることが出来ると考えられる。   This is considered as follows. In particular, when the supply amount of source gas is constant and the number of source gas introduction pipes is reduced, or when the number of source gas introduction pipes is the same and the supply amount of source gas is increased, the amount of source gas supplied to the source gas introduction pipe is reduced. The blowing pressure increases. In that case, if the blowing direction of the source gas is directed to the cylindrical substrate side, dust or the like is blown directly onto the cylindrical substrate from the source gas introduction pipe, or conversely, the reaction is caused if the blowing direction of the source gas is directed to the reaction vessel side. When dust or the like is wound up from the inner wall of the container, both may adhere to the cylindrical substrate and cause abnormal growth of the deposited film. Therefore, it is considered that the abnormal growth of the deposited film can be suppressed by setting the blowing direction of the source gas to the tangential direction of the reaction vessel regardless of the number of source gas introduction pipes and the supply amount of the source gas.

(第2の実施形態)
円筒状基体と同軸上で、円筒状基体の下部に円筒状支持部材409を設けた場合の搬送システムにおける、一例の搬送アームの動きを図4に示す。この時図4において円筒状基体を搬送容器内に格納する時にはStep1から順にStep4に進んで行くことを、また円筒状基体を反応容器より設置する場合には格納時とは逆にStep4から順にStep1に進んで行くことを示している。
(Second Embodiment)
FIG. 4 shows an example of the movement of the transfer arm in the transfer system in the case where the cylindrical support member 409 is provided on the lower side of the cylindrical base and coaxial with the cylindrical base. At this time, when the cylindrical substrate is stored in the transfer container in FIG. 4, the process proceeds from Step 1 to Step 4 in order, and when the cylindrical substrate is installed from the reaction container, Step 1 is sequentially performed from Step 4 contrary to the storage. Show that you are going to go.

本実施の形態を用いる利点としては、円筒状基体407の外径寸法や、長さが変更になった時にでも、一度は図1における堆積膜形成装置102の反応容器113内に設けられた円筒状基板受台116を円筒状支持部材409を設置可能な形状に変更する必要があるが、それ以降は円筒状支持部材409の形状を変更するだけで、円筒状基板407の外径寸法に係わらず堆積膜形成装置内に設けられた円筒状基板受台116を円筒状基板407の形状が変更する毎に装置を解体し交換する必要が無くなるというメリットを持っている。   The advantage of using this embodiment is that the cylinder provided in the reaction vessel 113 of the deposited film forming apparatus 102 in FIG. 1 once even when the outer diameter or length of the cylindrical substrate 407 is changed. Although it is necessary to change the shape of the cylindrical substrate support 116 to a shape in which the cylindrical support member 409 can be installed, only the shape of the cylindrical support member 409 is changed thereafter, and the outer diameter of the cylindrical substrate 407 is affected. First, there is an advantage that it is not necessary to disassemble and replace the cylindrical substrate cradle 116 provided in the deposited film forming apparatus every time the shape of the cylindrical substrate 407 is changed.

第2の実施形態と第1の実施形態の相違点は第2のアームが円筒状基体407だけ保持するのでは無く円筒状基体407の下部にある円筒状支持部材409を同時に保持し円筒状基体407と共に搬送可能で点である。   The difference between the second embodiment and the first embodiment is that the second arm does not hold only the cylindrical base 407 but also holds the cylindrical support member 409 at the bottom of the cylindrical base 407 at the same time. 407 is a point that can be conveyed.

図2(b)において、円筒状基体207、円筒状補助部材208および、円筒状支持部材209を自動で組み上げる時の手順としては、円筒状基体207と同軸上に円筒状補助部材208を載置する手順は第1の実施形態と同じであるが、第2の実施形態では円筒状基体207と同軸上に円筒状補助部材208を載置する前に、円筒状支持部材209の同軸上に円筒状基体207を載置する工程が組み込まれる。その他の構成およびこれらの装置を用いた場合の堆積膜形成方法は同様である。   In FIG. 2B, as a procedure for automatically assembling the cylindrical base 207, the cylindrical auxiliary member 208, and the cylindrical support member 209, the cylindrical auxiliary member 208 is placed coaxially with the cylindrical base 207. The procedure to do is the same as in the first embodiment, but in the second embodiment, before the cylindrical auxiliary member 208 is placed on the same axis as the cylindrical base body 207, the cylindrical support member 209 is arranged on the same axis. A step of mounting the substrate 207 is incorporated. Other configurations and the deposited film forming method when these apparatuses are used are the same.

(第3の実施形態)
円筒状基体を積み重ねる場合の一例として円筒状基体707−1と707−2を積み重ねた搬送システムにおける搬送アームの動きを模式的に図7に示す。この場合円筒状基体を積み重ねる場合には不安定な状態になりやすいので円筒状基体707−1と707−2同士を接続させる中子719を介在させると共に円筒状基体707−2の下部には第2の実施形態で示した円筒状支持部材709を設置した。
(Third embodiment)
FIG. 7 schematically shows the movement of the transfer arm in the transfer system in which the cylindrical substrates 707-1 and 707-2 are stacked as an example of stacking cylindrical substrates. In this case, when the cylindrical bases are stacked, an unstable state is likely to be caused. The cylindrical support member 709 shown in the second embodiment was installed.

図2(c)において円筒状基体207−1と中子219および円筒状基体207−2、円筒状補助部材208、円筒状支持部材209を搬送容器内に格納する前に自動で組み上げる手順としては円筒状基体207−2を円筒状支持部材209の同軸上に載置し、次に中子219を円筒状基体207−2の同軸上で円筒状基体207−2の内面に挿入設置し、次に円筒状207−2の同軸上に円筒状基体207−1を中子210に挿入する形で円筒状基体207−2の上に載置するその後、円筒状補助部材208を円筒状基体207−1の同軸上に載置し組み上げが完了する所となる。   As a procedure for automatically assembling the cylindrical base body 207-1, the core 219, the cylindrical base body 207-2, the cylindrical auxiliary member 208, and the cylindrical support member 209 in FIG. The cylindrical base 207-2 is placed on the same axis as the cylindrical support member 209, and then the core 219 is inserted on the inner face of the cylindrical base 207-2 on the same axis as the cylindrical base 207-2. Then, the cylindrical base member 207-1 is placed on the cylindrical base member 207-2 so as to be inserted into the core 210 on the same axis as the cylindrical shape 207-2, and then the cylindrical auxiliary member 208 is placed on the cylindrical base member 207-. 1 is placed on the same axis and the assembly is completed.

本実施形態は円筒状基体が2本縦に積み重なっているので図1において堆積膜形成装置102は反応容器113および原料ガス導入管120、加熱用ヒータ129等の部品は長くなっているが、それ以外の基本的構成及び堆積膜形成方法は第2の実施形態と同様である。   In this embodiment, since two cylindrical substrates are stacked vertically, the deposition film forming apparatus 102 in FIG. 1 has longer components such as the reaction vessel 113, the source gas introduction pipe 120, the heater 129, etc. Other than this, the basic configuration and the deposited film forming method are the same as those in the second embodiment.

以上の各実施形態において、堆積膜形成時に使用される原料ガスとしては、シラン(SiH)、ジシラン(Si)、四フッ化珪素(SiF)、六フッ化二珪素(Si)等のアモルファスシリコン形成用の原料ガス、またはそれらの混合ガスを用いても有効である。希釈ガスとしては、水素(H)、アルゴン(Ar)、ヘリウム(He)等を用いても有効である。また、堆積膜のバンドギャップ幅を変化させる等の特性改善ガスとして、窒素(N)、アンモニア(NH)等の窒素原子を含むもの、酸素(O)、一酸化窒素(NO)、二酸化窒素(NO)、酸化二窒素(NO)、一酸化炭素(CO)、二酸化炭素(CO)等酸素原子を含むもの、メータン(CH)、エタン(C)、エチレン(C)、アセチレン(C)、プロパン(C)等の炭化水素、四フッ化ゲルマニウム(GeF)、フッ化窒素(NF)等のフッ素化合物またはこれらの混合ガスを併用しても有効である。 In each of the above embodiments, the source gas used when forming the deposited film is silane (SiH 4 ), disilane (Si 2 H 6 ), silicon tetrafluoride (SiF 4 ), or disilicon hexafluoride (Si 2). It is also effective to use a raw material gas for forming amorphous silicon such as F 6 ) or a mixed gas thereof. It is effective to use hydrogen (H 2 ), argon (Ar), helium (He) or the like as the dilution gas. Further, as a characteristic improving gas for changing the band gap width of the deposited film, a gas containing nitrogen atoms such as nitrogen (N 2 ), ammonia (NH 3 ), oxygen (O 2 ), nitrogen monoxide (NO), Nitrogen dioxide (NO 2 ), dinitrogen oxide (N 2 O), carbon monoxide (CO), carbon dioxide (CO 2 ) and other oxygen atoms, methane (CH 4 ), ethane (C 2 H 6 ), Fluorine compounds such as hydrocarbons such as ethylene (C 2 H 4 ), acetylene (C 2 H 2 ), propane (C 3 H 8 ), germanium tetrafluoride (GeF 4 ), and nitrogen fluoride (NF 3 ), or these It is also effective to use a mixed gas of

また、ドーピング処理を目的として、ジボラン(B)、フッ化硼素(BF)、ホスフィン(PH)等のドーパントガスを同時に放電空間に導入しても同様に有効である。 For the purpose of doping treatment, it is also effective to introduce a dopant gas such as diborane (B 2 H 6 ), boron fluoride (BF 3 ), or phosphine (PH 3 ) into the discharge space at the same time.

クリーニング処理時に使用するクリーニング性ガスとしては、例えばCF、CF/O、SF、ClF(三フッ化塩素)等が挙げられるが、本実施形態では、クリーニング時間を短縮する面から有効であるClF(三フッ化塩素)が用いられている。また、本実施形態においては、クリーニング性ガスの濃度を調整するためにも、希釈用の不活性ガスを用いて濃度の調整を行うことが有効であり、導入される不活性ガスとして、例えばHe、Ne、Arが挙げられるが、Arを用いることが好ましい。 Examples of the cleaning gas used during the cleaning process include CF 4 , CF 4 / O 2 , SF 6 , and ClF 3 (chlorine trifluoride). In this embodiment, the cleaning time is shortened. Effective ClF 3 (chlorine trifluoride) is used. In the present embodiment, it is effective to adjust the concentration by using an inert gas for dilution in order to adjust the concentration of the cleaning gas. As the inert gas to be introduced, for example, He , Ne, and Ar, and Ar is preferably used.

以上のように構成された本発明に係る堆積膜形成装置及び方法によれば、従来用いられていた、基板ホルダーを無くし、必要最小限の部品点数にて円筒状基体を搬送可能にする事により、円筒状基体上に堆積膜を形成際に堆積膜の異常成長の原因となるダスト等の影響を低減させる事ができ、その結果、画像結果の少ない良質な堆積膜を形成する事が可能となった。   According to the deposited film forming apparatus and method of the present invention configured as described above, the conventionally used substrate holder is eliminated, and the cylindrical substrate can be transported with the minimum number of components. When the deposited film is formed on the cylindrical substrate, it is possible to reduce the influence of dust or the like that causes abnormal growth of the deposited film, and as a result, it is possible to form a high-quality deposited film with few image results. became.

以下、実験例および実施例により、本発明をさらに詳細に説明する。   Hereinafter, the present invention will be described in more detail with reference to experimental examples and examples.

(実施例1)
本実施例では、図2(a)に示す自動組み上げ装置を用い、円筒状基板207と円筒状補助部材208を同軸上に組み上げた後、図3に示す搬送容器内に格納する手段を用いた図1で示される101の搬送システムにて円筒状基体207及び円筒状補助部材208を搬送容器103内に格納し、堆積膜形成装置102内に設置し、アルミニウムよりなる直径80mm、長さ358mm、肉厚3mmの円筒状基体117上に、表1に示す条件で図8に示す層構成のアモルファスシリコン堆積膜(以下、電子写真感光体と略記する)の形成を行った。図8中の符号801は円筒状基体を示し、符号802は下部阻止層(第1層)、符号803は第1の光導電層(第2層)、符号804は第2の光導電層(第3層)、符号805は表面層(第4層)をそれぞれ示す。
Example 1
In this embodiment, the automatic assembling apparatus shown in FIG. 2A is used, and after the cylindrical substrate 207 and the cylindrical auxiliary member 208 are assembled on the same axis, the means for storing them in the transport container shown in FIG. 3 is used. The cylindrical base 207 and the cylindrical auxiliary member 208 are stored in the transfer container 103 in the transfer system 101 shown in FIG. 1 and installed in the deposited film forming apparatus 102. The diameter of the aluminum is 80 mm, the length is 358 mm, On the cylindrical substrate 117 having a thickness of 3 mm, an amorphous silicon deposited film (hereinafter abbreviated as an electrophotographic photosensitive member) having a layer structure shown in FIG. 8 was formed under the conditions shown in Table 1. In FIG. 8, reference numeral 801 denotes a cylindrical substrate, reference numeral 802 denotes a lower blocking layer (first layer), reference numeral 803 denotes a first photoconductive layer (second layer), and reference numeral 804 denotes a second photoconductive layer ( Reference numeral 805 denotes a surface layer (fourth layer).

なお、以下の各実施例および各比較例では電子写真感光体を形成した。   In each of the following examples and comparative examples, an electrophotographic photosensitive member was formed.

本実施例によって作成された電子写真感光体に関して一連の評価を実施した結果を表2に示す。   Table 2 shows the results of a series of evaluations on the electrophotographic photosensitive member produced in this example.

(実施例2)
本実施例では、図2(b)に示す自動組み上げ装置を用い、円筒状基板207と円筒状補助部材208及び円筒状支持部材209を同軸上に組み上げた後、図4に示す搬送容器401内に格納する手段を用い図1で示される101の搬送システムにて、円筒状基板207及び円筒状補助部材208及び円筒状支持部材209を搬送容器403内に格納し、堆積膜形成装置102内に設置し、実施例1と同様のアルミニウム基板を用い実施例1と同様の方法にて電子写真感光体の形成を行った。本実施例によって作成された電子写真感光体に関して一連の評価を実施した結果を実施例1と共に表2に示す。
(Example 2)
In the present embodiment, the automatic assembly apparatus shown in FIG. 2B is used, and after the cylindrical substrate 207, the cylindrical auxiliary member 208, and the cylindrical support member 209 are assembled on the same axis, the inside of the transfer container 401 shown in FIG. 1 is used to store the cylindrical substrate 207, the cylindrical auxiliary member 208, and the cylindrical support member 209 in the transfer container 403, and in the deposited film forming apparatus 102 in the transfer system 101 shown in FIG. Then, an electrophotographic photosensitive member was formed by the same method as in Example 1 using the same aluminum substrate as in Example 1. Table 2 shows the results of a series of evaluations performed on the electrophotographic photosensitive member produced in this example together with Example 1.

(比較例1)
本比較例では、人の手作業により、基体ホルダーと円筒状基体を組み上げ、図6に示す搬送容器内に格納する手段を用いて円筒状基体および円筒状補助部材を基板ホルダーに装着させたものを格納し、図1で示される101の搬送システムを用い、円筒状基体を堆積膜形成装置内に設置する従来の搬送システムを用いた以外は実施例1と同様の方法にて電子写真感光体を作成し、実施例1と同様の方法にて評価を行った。
(Comparative Example 1)
In this comparative example, the base holder and the cylindrical base are assembled by manual work, and the cylindrical base and the cylindrical auxiliary member are mounted on the substrate holder using the means for storing in the transport container shown in FIG. The electrophotographic photosensitive member is stored in the same manner as in Example 1 except that the conventional conveyance system in which the cylindrical substrate is installed in the deposited film forming apparatus is used by using the conveyance system 101 shown in FIG. Was prepared and evaluated in the same manner as in Example 1.

(比較例2)
本比較例では、実施例1で示す円筒状基体207及び円筒状補助部材208を図10に示す様に円筒状基体207を格納する為の搬送容器103−1、及び円筒状補助部材208を格納する為の搬送容器103−2と個別に格納する搬送容器を持ち搬送する搬送システムにて搬送を行った以外は実施例1と同様の方法にて電子写真感光体の形成を行った。但し図10において円筒状基体207の搬送容器103−1と円筒状補助部材の搬送容器103−2は回転可能な構成になっている。以上の搬送システムを用い、実施例1と同様の方法にて電子写真感光体を作成し下記の一連の評価を行った。その結果を実施例1と共に示す。
(Comparative Example 2)
In this comparative example, the cylindrical base body 207 and the cylindrical auxiliary member 208 shown in the first embodiment are stored in the transfer container 103-1 for storing the cylindrical base body 207 and the cylindrical auxiliary member 208 as shown in FIG. The electrophotographic photosensitive member was formed in the same manner as in Example 1 except that the transfer was carried out by a transfer system having a transfer container 103-2 and a transfer container separately stored. However, in FIG. 10, the transport container 103-1 of the cylindrical base 207 and the transport container 103-2 of the cylindrical auxiliary member are configured to be rotatable. Using the above transport system, an electrophotographic photosensitive member was prepared in the same manner as in Example 1, and the following series of evaluations were performed. The results are shown together with Example 1.

(実施例3)
本実施例では図2(c)に示す自動組み上げ装置を用い2つの円筒状基体207−1、207−2と円筒状補助部材208と中子219と円筒状支持部材209を組み上げた後に、図7に示す搬送容器内に格納する手段を用いた、図1で示される101の搬送システムを用い円筒状基体207−1、207−2と円筒状補助部材208と中子219と円筒状支持部材209を搬送容器内に格納し、堆積膜形成装置102内に設置し、実施例1と同様の方法にて電子写真感光体の形成を行った。
(Example 3)
In this embodiment, after the two cylindrical substrates 207-1 and 207-2, the cylindrical auxiliary member 208, the core 219, and the cylindrical support member 209 are assembled using the automatic assembly apparatus shown in FIG. The cylindrical bases 207-1 and 207-2, the cylindrical auxiliary member 208, the core 219, and the cylindrical support member using the transfer system 101 shown in FIG. 209 was stored in a transfer container, installed in the deposited film forming apparatus 102, and an electrophotographic photosensitive member was formed in the same manner as in Example 1.

但し搬送に用いられる搬送容器および電子写真感光体形成に用いられる堆積膜形成装置は円筒状基体を積み重ねられているので、長手方向に延長された部品を用いた以外は図1に示す堆積膜形成装置と同様の方法にて電子写真感光体の形成を行った。   However, since the transport container used for transport and the deposited film forming apparatus used for forming the electrophotographic photosensitive member are stacked with a cylindrical substrate, the deposited film formation shown in FIG. 1 is used except that components extending in the longitudinal direction are used. An electrophotographic photosensitive member was formed by the same method as the apparatus.

(実施例4)
本実施例では、図1に示す堆積膜形成システムの堆積膜形成装置102に、図5に示す様に反応ガスの排気手段が反応容器の側面に形成された装置501を用いた以外は図2(a)に示す自動組み上げ装置を用い、円筒状基板207と円筒状補助部材208を同軸上に組み上げた後、図3に示す搬送容器301内に格納する手段を用い図1で示される101の搬送システムにて円筒状基板207及び円筒状補助部材208を搬送容器301内に格納し堆積膜形成装置501内に設置し実施例1と同様のアルミニウム基板を用いた。
Example 4
In the present embodiment, the apparatus 501 except that the apparatus 501 in which the reaction gas exhaust means is formed on the side surface of the reaction vessel as shown in FIG. 5 is used for the film formation apparatus 102 of the system for forming a film shown in FIG. After the cylindrical substrate 207 and the cylindrical auxiliary member 208 are assembled on the same axis using the automatic assembly apparatus shown in (a), the unit 101 shown in FIG. 1 is stored using means for storing in the transfer container 301 shown in FIG. In the transfer system, the cylindrical substrate 207 and the cylindrical auxiliary member 208 were stored in the transfer container 301 and installed in the deposited film forming apparatus 501, and the same aluminum substrate as in Example 1 was used.

Figure 2007056280
Figure 2007056280

(電子写真特性の評価方法)
図9に電子写真感光体特性を評価する複写機の概略図を示した。図9において時計周りに回転する電子写真感光体901の周辺には、主帯電器902、電位センサー903、現像器904、転写帯電器905(a)、分離帯電器905(b)、クリーニングローラー906及びクリーニングブレード907を具備したクリーナー910、前露光908などが配設されている。潜像形成用露光900としては主帯電器902、電位センサー903間に設けられている。
(Evaluation method of electrophotographic characteristics)
FIG. 9 shows a schematic diagram of a copying machine for evaluating the characteristics of an electrophotographic photosensitive member. In FIG. 9, there are a main charger 902, a potential sensor 903, a developing device 904, a transfer charger 905 (a), a separation charger 905 (b), and a cleaning roller 906 around the electrophotographic photosensitive member 901 that rotates clockwise. In addition, a cleaner 910 having a cleaning blade 907, a pre-exposure 908, and the like are disposed. The latent image forming exposure 900 is provided between the main charger 902 and the potential sensor 903.

電子写真感光体特性を測定する際には、現像器904及びクリーナー910を取り外し、現像器904の代わりに電子写真感光体の軸方向及び周方向の電子写真特性を測定できる電位プローブ(不図示)を装着し電子写真感光体の電子写真特性を測定する。また画像形成時には、電位プローブを取り外し現像器904及びクリーナー910を装着し画像形成を行う。   When measuring the characteristics of the electrophotographic photosensitive member, the developing device 904 and the cleaner 910 are removed, and a potential probe (not shown) capable of measuring the axial and circumferential electrophotographic properties of the electrophotographic photosensitive member instead of the developing device 904. And measure the electrophotographic characteristics of the electrophotographic photosensitive member. Further, at the time of image formation, the potential probe is removed and the developing device 904 and the cleaner 910 are attached to perform image formation.

この様に構成された電子写真プロセスを用い電子写真特性及び画像の評価を下記に示す基準で行った。   The electrophotographic characteristics and images were evaluated using the electrophotographic process configured as described above according to the following criteria.

・『Vd軸むら/Vd周方向むら』の評価
プロセススピード265mm/sec、前露光(波長680nmのLED)光量4μJ/cmの条件にて、電子写真感光体が数回転した時の周方向の電位を測定し電子写真感光体の軸方法における中位置の表面電位の周方向電位の平均値が450V(暗電位)になるように帯電器の電流値を調整した後、測定プローブを電子写真感光体の端部より軸方向に関して中位置と同様に周方向電位の平均値を5点測定し、その5点の最大値−最小値の値をVd軸ムラとして評価した。また同時に各点において測定している周方向電位の最大値−最小値を周方向むらとし、各点の周方向むらの最大値をVd周方向むらとして下記に示す基準で評価した。
・ Evaluation of “Vd-axis unevenness / Vd circumferential unevenness” The circumferential direction when the electrophotographic photosensitive member is rotated several times under the conditions of a process speed of 265 mm / sec, pre-exposure (LED with a wavelength of 680 nm) and a light amount of 4 μJ / cm 2 . After measuring the potential and adjusting the current value of the charger so that the average value of the circumferential potential of the surface potential at the middle position in the axial method of the electrophotographic photosensitive member is 450 V (dark potential), the measuring probe is electrophotographic photosensitive. The average value of the circumferential potential was measured at five points similarly to the middle position in the axial direction from the end of the body, and the maximum value-minimum value of the five points was evaluated as Vd axis unevenness. At the same time, the maximum value-minimum value of the circumferential potential measured at each point was regarded as the unevenness in the circumferential direction, and the maximum value of the circumferential unevenness at each point was evaluated as the unevenness in the Vd circumferential direction.

ただし、この時、比較例1で作成された結果を100%とし相対的な評価を行った。
◎ ・・・70%以下
○ ・・・70〜80%
△ ・・・80〜100%
However, at this time, relative evaluation was performed with the result created in Comparative Example 1 as 100%.
◎ 70% or less ○ ・ ・ ・ 70-80%
△ 80-100%

・『Vh軸むら/Vh周方向むら』の評価
上記Vd軸むらと同じ手順で電子写真感光体の軸方法における中位置の表面電位の周方向電位の平均値が450V(暗電位)になるように帯電器の電流値を調整した後、像露光(波長660nmのレーザ)を照射し像露光光源の光量を調整して、表面電位の周方向電位の平均値が200V(明電位)となるようにした後、測定プローブを電子写真感光体の端部より軸方向に関して中位置と同様に周方向電位の平均値を5点測定し、その5点の最大値−最小値の値をVh軸ムラとして評価した。
Evaluation of “Vh-axis unevenness / Vh circumferential unevenness” The average value of the circumferential potential of the surface potential at the middle position in the axial method of the electrophotographic photosensitive member is 450 V (dark potential) in the same procedure as the above-described Vd-axis unevenness. After adjusting the current value of the charger, image exposure (laser with a wavelength of 660 nm) is irradiated to adjust the amount of light of the image exposure light source so that the average value of the surface potential in the circumferential direction becomes 200 V (bright potential). After that, the measurement probe measured the average value of the circumferential potential at five points from the end of the electrophotographic photosensitive member in the axial direction in the same manner as the middle position. As evaluated.

また同時に各点において測定している周方向電位の最大値−最小値を周方向むらとし、各点の周方向むらの最大値をVh周方向むらとして下記に示す基準で評価した。   At the same time, the maximum value-minimum value of the circumferential potential measured at each point was set as the unevenness in the circumferential direction, and the maximum value of the unevenness in the circumferential direction at each point was evaluated as the unevenness in the Vh circumferential direction.

ただし、この時、比較例1で作成された結果を100%とし相対的な評価を行った。
◎ ・・・70%以下
○ ・・・70〜80%
△ ・・・80〜100%
However, at this time, relative evaluation was performed with the result created in Comparative Example 1 being 100%.
◎ 70% or less ○ ・ ・ ・ 70-80%
△ 80-100%

・『Vl軸むら/Vl周方向むら』の評価
上記Vh軸むらと同じ手順で電子写真感光体の軸方法における中位置の表面電位の周方向電位の平均値が450V(暗電位)になるように帯電器の電流値を調整した後、像露光(波長660nmのレーザ)を照射し像露光光源の光量を調整して、表面電位の周方向電位の平均値が50V(明電位)となるようにした後、測定プローブを電子写真感光体の端部より軸方向に関して中位置と同様に周方向電位の平均値を5点測定し、その5点の最大値−最小値の値をVl軸ムラとして評価した。
・ Evaluation of “Vl axis unevenness / Vl circumferential unevenness” The average value of the circumferential potential of the surface potential at the middle position in the axial method of the electrophotographic photosensitive member becomes 450 V (dark potential) by the same procedure as the above Vh axis unevenness. After adjusting the current value of the charger, the image exposure (laser with a wavelength of 660 nm) is irradiated to adjust the amount of light of the image exposure light source so that the average value of the circumferential potential of the surface potential becomes 50 V (bright potential). After that, the measurement probe measured the average value of the circumferential potential at five points in the same way as the middle position from the end of the electrophotographic photosensitive member in the axial direction. As evaluated.

また同時に各点において測定している周方向電位の最大値−最小値を周方向むらとし、各点の周方向むらの最大値をVl周方向むらとして下記に示す基準で評価した。   At the same time, the maximum value-minimum value of the circumferential potential measured at each point was regarded as the unevenness in the circumferential direction, and the maximum value of the circumferential unevenness at each point was evaluated as the Vl circumferential unevenness, and the following criteria were evaluated.

ただし、この時、比較例1で作成された結果を100%とし相対的な評価を行った。
◎ ・・・70%以下
○ ・・・70〜80%
△ ・・・80〜100%
However, at this time, relative evaluation was performed with the result created in Comparative Example 1 being 100%.
◎ 70% or less ○ ・ ・ ・ 70-80%
△ 80-100%

(画像特性の評価方法)
・『画像欠陥』の評価
図9に示す複写機の概略図を用い、現像器904及びクリーナー910、作成した電子写真感光体を設置しA3サイズのべた黒原稿を複写して得られた画像を観察し、電子写真感光体1周分当たりの、直径0.10mm以上の白ポチの個数を数えた、得られた結果は、比較例1での値を100%とした場合の相対比較でランク付けを行った。
☆ ・・・0%以上20%未満
◎ ・・・20%以上50%未満
○ ・・・50%以上80%未満
△ ・・・80%以上105%未満
× ・・・105%以上
(Evaluation method of image characteristics)
・ Evaluation of “Image Defect” Using the schematic diagram of the copying machine shown in FIG. 9, an image obtained by copying a solid black document of A3 size by installing the developing unit 904, the cleaner 910, and the electrophotographic photosensitive member prepared is used. Observing and counting the number of white spots with a diameter of 0.10 mm or more per round of the electrophotographic photosensitive member, the obtained results are ranked by relative comparison when the value in Comparative Example 1 is 100%. I did.
☆ ... 0% or more and less than 20% ◎ ... 20% or more and less than 50% ○ ... 50% or more and less than 80% △ ... 80% or more and less than 105% × ... 105% or more

(総合評価)
☆ ・・・優秀
◎ ・・・非常に良好
○ ・・・良好
(Comprehensive evaluation)
☆ ・ ・ ・ Excellent ◎ ・ ・ ・ Very good ○ ・ ・ ・ Good

Figure 2007056280
Figure 2007056280

表2より明らかに円筒状基体の本数や装置構成を変化させた何れの場合においても良好な結果が得られた。   As apparent from Table 2, good results were obtained in any case where the number of cylindrical substrates and the apparatus configuration were changed.

・タクトタイム
実施例1で示す円筒状基体及び円筒状補助部材を搬送容器内に格納する工程が開始された時間から、電子写真感光体を作成し、排出されるまでのタクトを100とした時に、同じく電子写真感光体を作成し、排出されるまでの時間を相対評価した結果を示す。
-Tact time From the time when the process of storing the cylindrical substrate and the cylindrical auxiliary member shown in Example 1 into the transport container is started, the tact time until the electrophotographic photosensitive member is created and discharged is set to 100 Similarly, the results of relative evaluation of the time until the electrophotographic photosensitive member was prepared and discharged are shown.

・投資コスト
実施例1で示す装置を作成する時に要する投資コストを100とした時に、比較例2で示す様に部品を個別に搬送した場合に要する投資コストを相対評価した結果を示す。
Investment Cost The result of relative evaluation of the investment cost required when parts are individually conveyed as shown in Comparative Example 2 when the investment cost required when creating the apparatus shown in Example 1 is 100 is shown.

・総合評価
下記の基準により総合評価を行った。
低コストで作成でき、量産性に優れている・・・○
コストも高く、量産性に不向きである ・・・△
・ Comprehensive evaluation Comprehensive evaluation was performed according to the following criteria.
Can be created at low cost and has excellent mass productivity ...
High cost and unsuitable for mass production

Figure 2007056280
Figure 2007056280

表3より明らかに、各部材を個別に搬送するとタクトタイムは大幅に延びると共に、投資コスト増大する結果となった。   As is apparent from Table 3, when each member is individually conveyed, the tact time is greatly extended and the investment cost is increased.

本発明の第1の実施形態における堆積膜形成システムの構成を模式的に示した図である。It is the figure which showed typically the structure of the deposited film formation system in the 1st Embodiment of this invention. 本発明の第1の実施形態における搬送システムにおいて、円筒状基体と円筒状補助部材を組み上げる装置構成を模式的に示した図である。It is the figure which showed typically the apparatus structure which assembles a cylindrical base | substrate and a cylindrical auxiliary member in the conveyance system in the 1st Embodiment of this invention. 本発明の第2の実施形態における搬送システムにおいて、円筒状支持部材を円筒状基体の下に設けた場合の、円筒状補助部材と円筒状基体と円筒状支持部材とを組み上げる装置構成を模式的に示した図である。In the transfer system according to the second embodiment of the present invention, the apparatus configuration for assembling the cylindrical auxiliary member, the cylindrical substrate, and the cylindrical support member when the cylindrical support member is provided below the cylindrical substrate is schematically shown. It is the figure shown in. 本発明の第3の実施形態における搬送システムにおいて、円筒状基体を2段に積み重ね円筒状支持部材を下側の円筒状基体の下に設けた場合の、円筒状補助部材と円筒状基体と円筒状支持部材とを組み上げる装置構成を模式的に示した図である。In the transfer system according to the third embodiment of the present invention, a cylindrical auxiliary member, a cylindrical substrate, and a cylinder when the cylindrical substrates are stacked in two stages and a cylindrical support member is provided under the lower cylindrical substrate. It is the figure which showed typically the apparatus structure which assembles a shape support member. 本発明の第1の実施形態における搬送システムの搬送機の第1、第2アームの動きを模式的に示した図である。It is the figure which showed typically the motion of the 1st, 2nd arm of the conveyance machine of the conveyance system in the 1st Embodiment of this invention. 本発明の第2の実施形態における搬送システムの搬送機の第1、第2アームの動きを模式的に示した図である。It is the figure which showed typically the motion of the 1st, 2nd arm of the conveying machine of the conveying system in the 2nd Embodiment of this invention. 本発明の第4の実施形態における、排気手段が反応容器の側面部に設けられた堆積膜形成装置の一例の模式的な断面図である。It is typical sectional drawing of an example of the deposited film formation apparatus with which the exhaust means was provided in the side part of the reaction container in the 4th Embodiment of this invention. 従来の搬送システムの搬送機のアームの動きを模式的に示した図である。It is the figure which showed typically the motion of the arm of the conveying machine of the conventional conveying system. 本発明の第3の実施形態における搬送システムの搬送機の第1、第2アームの動きを模式的に示した図である。It is the figure which showed typically the motion of the 1st, 2nd arm of the conveying machine of the conveying system in the 3rd Embodiment of this invention. 電子写真感光体の層構成を模式的に示した図である。It is the figure which showed typically the layer structure of the electrophotographic photoreceptor. 電子写真感光体特性を評価する複写機の概略図である。2 is a schematic view of a copying machine for evaluating electrophotographic photosensitive member characteristics. FIG. 円筒状補助部材と円筒状基体を個別に搬送する際に使用する搬送システムの概略図である。It is the schematic of the conveyance system used when conveying a cylindrical auxiliary member and a cylindrical base | substrate separately.

符号の説明Explanation of symbols

101 本発明で示す搬送システム
102 本発明で示す堆積膜形成装置
103、301、401、601、701 円筒状基板搬入用搬送容器
103−1 円筒状基体のみの搬送容器
103−2 円筒状補助部材のみの搬送容器
104−1 堆積膜形成後の円筒状基板のみ排出及びクリーニング用円筒状基体のみ排出/搬入用搬送容器
104−2 堆積膜形成後の円筒状補助部材のみ排出及びクリーニング用円筒状補助部材のみ排出/搬入用搬送容器
104 堆積膜形成後の円筒状基板排出及びクリーニング支持排出/搬入用搬送容器
105、130、111、305、405、511、604、704 ゲートバルブ
110 投入台
117、207、207−1、207−2、307、407、517、609、707−1、707−2 円筒状基体
118、208、308、408、518、708 円筒状補助部材
209、409、709 円筒状支持部材
124 本発明で示すクリーンルーム内の投入アリア
126 搬送レール
127 堆積膜形成装置設置床
210 円筒状補助部材用搬送及び設置台
211 円筒状基体用搬送及び設置台
212 円筒状支持部材搬送及び設置台
216 自動組み上げ装置ベース台
218 中子搬送及び設置台
219、710 中子
302、402、702 第1の搬送アーム
303、403、703 第2の搬送アーム
121、521 排気ライン
603 従来例で示した搬送アーム
101 Conveying system 102 according to the present invention Deposited film forming apparatus 103, 301, 401, 601, 701 according to the present invention Cylindrical substrate carrying transport container 103-1 Conveying container 103-2 with only a cylindrical substrate Only a cylindrical auxiliary member Transport container 104-1 Discharge only cylindrical substrate after deposition film formation and discharge / carrying transport container 104-2 Only cylindrical auxiliary member after deposition film formation Discharge and cleaning cylindrical auxiliary member Transport container 104 for discharging / carrying out only Cylindrical substrate discharge and cleaning support discharge / carrying transport container 105, 130, 111, 305, 405, 511, 604, 704 after deposit film formation Gate valve 110 207-1, 207-2, 307, 407, 517, 609, 707-1, 707-2 Cylindrical substrate 1 8, 208, 308, 408, 518, 708 Cylindrical auxiliary member 209, 409, 709 Cylindrical support member 124 Input area 126 in the clean room shown in the present invention Transport rail 127 Deposited film forming apparatus installation floor 210 For cylindrical auxiliary member Transfer and installation table 211 Transfer and installation table for cylindrical substrate 212 Transfer and installation table for cylindrical support member 216 Automatic assembly device base table 218 Core transfer and installation tables 219 and 710 Cores 302, 402 and 702 First transfer arm 303, 403, 703 Second transfer arm 121, 521 Exhaust line 603 Transfer arm shown in conventional example

Claims (11)

円筒状基体を減圧可能な搬送容器に格納する手段、格納された前記搬送容器内を真空排気する手段、前記搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、前記搬送容器内に格納された前記円筒状基体を前記堆積膜形成装置内に設置する手段を具備した真空搬送装置において、前記搬送容器内に第1のアーム及び間隔が可変である第2のアームを有する事を特徴とする真空搬送装置。   Means for storing the cylindrical substrate in a depressurized transfer container; means for evacuating the stored transfer container; means for moving the transfer machine equipped with the transfer container onto the deposited film forming apparatus; In the vacuum transfer apparatus having means for installing the cylindrical substrate stored in the deposition film forming apparatus, the transfer container has a first arm and a second arm whose interval is variable. A featured vacuum transfer device. 前記円筒状基体の同軸上に円筒状補助部材を載置する手段を有する事を特徴とする請求項1に記載の真空搬送装置。   2. The vacuum transfer apparatus according to claim 1, further comprising means for mounting a cylindrical auxiliary member on the same axis of the cylindrical base. 円筒状基体の同軸上に円筒状補助部材を載置する手段、前記円筒状基体を搬送容器内の第1のアーム及び間隔が可変である第2のアームにて減圧可能な搬送容器に格納する手段、格納された前記搬送容器内を真空排気する手段、前記搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、前記搬送容器内に格納された前記円筒状基体を前記堆積膜形成装置内に設置する手段を具備した真空搬送装置を用い、堆積膜形成装置内に設置された前記円筒状基体を回転する手段、複数原料ガス導入管から、前記堆積膜形成装置内に原料ガスを導入する手段、前記堆積膜形成装置内を排気する手段、前記円筒基体を加熱する手段、放電エネルギーにより前記原料ガスを励起する手段、前記円筒状基体上に堆積膜を形成手段を有する事を特徴とする堆積膜形成装置。   Means for placing a cylindrical auxiliary member on the same axis of the cylindrical base, and storing the cylindrical base in a transport container that can be depressurized by a first arm in the transport container and a second arm whose interval is variable. Means for evacuating the stored transport container; means for moving a transport machine equipped with the transport container onto a deposition film forming apparatus; and depositing the cylindrical substrate stored in the transport container on the deposited film Using a vacuum transfer device provided with a means installed in the forming apparatus, a means for rotating the cylindrical substrate installed in the deposited film forming apparatus, a plurality of source gas introduction pipes, and a source gas into the deposited film forming apparatus Means for evacuating the deposited film forming apparatus, means for heating the cylindrical substrate, means for exciting the source gas with discharge energy, and means for forming a deposited film on the cylindrical substrate. Features and That the deposited film forming apparatus. 請求項3の堆積膜形成装置は電子写真感光体を作成する装置である事を特徴とする堆積膜形成装置。   4. The deposited film forming apparatus according to claim 3, wherein the deposited film forming apparatus is an apparatus for producing an electrophotographic photosensitive member. 円筒状基体の同軸上に円筒状補助部材を載置し、前記円筒状基体を減圧可能な搬送容器に格納し、格納された前記搬送容器内を真空排気し、前記搬送容器を具備した搬送機を堆積膜形成装置上に移動させ、前記搬送容器内に格納された前記円筒状基体を前記堆積膜形成装置内に設置する真空搬送方法において、
前記円筒状基体の同軸上に載置された前記円筒状基体及び前記円筒状補助部材を前記搬送容器内に格納する際には搬送容器内の第1の搬送アームにより前記円筒状補助部材を前記搬送容器内に格納後、前記搬送容器内の第2の搬送アームにより前記円筒状基体を格納すると共に、前記堆積膜形成装置内に前記円筒状基体を設置する際には、前記搬送容器内の第2の搬送アームにより前記堆積膜形成装置に前記円筒状基体を設置後に前記円筒状補助部材を前記搬送容器内の第1の搬送アームにより前記堆積膜形成装置内の前記円筒状基体と同軸上に載置する事を特徴とする真空搬送方法。
A cylindrical auxiliary member is placed on the same axis of the cylindrical substrate, the cylindrical substrate is stored in a depressurized transfer container, the stored transfer container is evacuated, and the transfer machine includes the transfer container. In a vacuum transfer method in which the cylindrical substrate stored in the transfer container is placed in the deposited film forming apparatus.
When the cylindrical base and the cylindrical auxiliary member placed on the same axis of the cylindrical base are stored in the transfer container, the cylindrical auxiliary member is moved by the first transfer arm in the transfer container. After storing in the transfer container, the cylindrical substrate is stored by the second transfer arm in the transfer container, and when the cylindrical substrate is installed in the deposited film forming apparatus, After the cylindrical substrate is installed in the deposited film forming apparatus by the second transfer arm, the cylindrical auxiliary member is coaxially aligned with the cylindrical substrate in the deposited film forming apparatus by the first transfer arm in the transfer container. A vacuum conveying method characterized by being placed on the surface.
前記円筒状基体の同軸上に載置された前記円筒状基体及び前記円筒状補助部材を前記搬送容器内に格納する際には搬送容器内の第1の搬送アームにより前記円筒状補助部材を前記搬送容器内に格納後、前記搬送容器内の第2の搬送アームにより前記円筒状基体を格納すると共に、前記堆積膜形成装置内に前記円筒状基体を設置する際には、前記搬送容器内の第2の搬送アームにより前記堆積膜形成装置に前記円筒状基体を設置後に前記円筒状補助部材を前記搬送容器内の第1の搬送アームにより前記堆積膜形成装置内の前記円筒状基体と同軸上に載置する真空搬送方法を用い、前記堆積膜形成装置内に前記円筒状基体上を設置し、前記円筒状支持体を回転可能し、複数の原料ガス導入管から、前記堆積膜形成装置内に原料ガスを導入し、前記堆積膜形成装置内を排気し、前記円筒基体を加熱し、放電エネルギーにより前記原料ガスを励起しプラズマCVD法により堆積膜を形成する事を特徴とする堆積膜形成方法。   When the cylindrical base and the cylindrical auxiliary member placed on the same axis of the cylindrical base are stored in the transfer container, the cylindrical auxiliary member is moved by the first transfer arm in the transfer container. After storing in the transfer container, the cylindrical substrate is stored by the second transfer arm in the transfer container, and when the cylindrical substrate is installed in the deposited film forming apparatus, After the cylindrical substrate is installed in the deposited film forming apparatus by the second transfer arm, the cylindrical auxiliary member is coaxially aligned with the cylindrical substrate in the deposited film forming apparatus by the first transfer arm in the transfer container. Using a vacuum transfer method placed on the deposition film forming apparatus, placing the cylindrical substrate on the cylindrical substrate, allowing the cylindrical support to rotate, and from a plurality of source gas introduction pipes to the deposition film forming apparatus. The raw material gas is introduced into the Evacuating the Sekimaku forming the device, the cylindrical body is heated, the deposited film forming method and forming a deposited film by the excited plasma CVD method the raw material gas by the discharge energy. 円筒状支持部材の同軸上に前記円筒状基体を載置する手段、前記円筒状基体の同軸上に前記円筒状補助部材を載置する手段を有する事を特徴とする請求項1に記載の真空搬送装置。   2. The vacuum according to claim 1, further comprising means for placing the cylindrical substrate on the same axis as the cylindrical support member, and means for placing the cylindrical auxiliary member on the same axis as the cylindrical substrate. Conveying device. 円筒状支持部材の同軸上に円筒状基体を載置する手段、前記円筒状基体の同軸上に円筒状補助部材を載置する手段、前記円筒状基体を搬送容器内の第1のアーム及び間隔が可変である第2のアームにて減圧可能な搬送容器に格納する手段、格納された前記搬送容器内を真空排気する手段、前記搬送容器を具備した搬送機を堆積膜形成装置上に移動させる手段、前記搬送容器内に格納された前記円筒状基体を前記堆積膜形成装置内に設置する手段を具備した真空搬送装置を用い、前記堆積膜形成装置内に設置された前記円筒状基体を回転する手段、複数原料ガス導入管から、前記堆積膜形成装置内に原料ガスを導入する手段、前記堆積膜形成装置内を排気する手段、前記円筒基体を加熱する手段、放電エネルギーにより前記原料ガスを励起する手段、前記円筒状基体上に堆積膜を形成手段を有する事を特徴とする堆積膜形成装置。   Means for placing a cylindrical substrate on the same axis of the cylindrical support member, means for placing a cylindrical auxiliary member on the same axis of the cylindrical substrate, and a first arm and a gap in the transfer container. Means for storing in a transport container that can be depressurized by a second arm that is variable, means for evacuating the stored transport container, and transporting the transport machine equipped with the transport container onto the deposited film forming apparatus And a vacuum transfer device having means for installing the cylindrical substrate stored in the transfer container in the deposited film forming apparatus, and rotating the cylindrical substrate installed in the deposited film forming device. Means for introducing a source gas into the deposited film forming apparatus from a plurality of source gas introduction pipes, means for exhausting the inside of the deposited film forming apparatus, means for heating the cylindrical substrate, and the source gas by discharge energy. Excite Stage, the deposited film forming apparatus characterized in that it has a forming means deposited film on the cylindrical substrate on. 請求項8の堆積膜形成装置は電子写真感光体を作成する装置である事を特徴とする堆積膜形成装置。   9. The deposited film forming apparatus according to claim 8, wherein the deposited film forming apparatus is an apparatus for producing an electrophotographic photosensitive member. 前記円筒状支持部材の同軸上に前記円筒状基体、前記円筒状補助部材の順で載置し、前記円筒状基体を減圧可能な搬送容器に格納し、格納された前記搬送容器内を真空排気し、前記搬送容器を具備した搬送機を堆積膜形成装置上に移動させ、前記搬送容器内に格納された前記円筒状基体を前記堆積膜形成装置内に設置する真空搬送方法において、前記円筒状支持部材の同軸上に前記円筒状基体、前記円筒状補助部材の順で載置された状態の前記円筒上支持部材および前記円筒状基体及び前記円筒状補助部材を前記搬送容器内に格納する際には前記搬送容器内の第1の搬送アームにより前記円筒状補助部材を前記搬送容器内に格納後に前記搬送容器内の第2の搬送アームにより前記円筒状基体及び前記円筒状支持部材を格納すると共に、前記堆積膜形成装置内に前記円筒状基体を設置する時には前記搬送容器内の第2の搬送アームにより前記堆積膜形成装置に前記円筒状基体及び前記円筒状支持部材を設置後に前記円筒状補助部材を前記搬送機内の第1の搬送アームにより前記堆積膜形成装置内の前記円筒状基体と同軸上に載置する事を特徴とする真空搬送方法。   The cylindrical base member and the cylindrical auxiliary member are placed in this order on the same axis of the cylindrical support member, and the cylindrical base body is stored in a transport container that can be decompressed, and the stored transport container is evacuated. In the vacuum transfer method in which the transfer machine provided with the transfer container is moved onto the deposition film forming apparatus, and the cylindrical substrate stored in the transfer container is installed in the deposition film forming apparatus, the cylindrical shape When storing the cylindrical support member, the cylindrical base member, and the cylindrical auxiliary member in a state where the cylindrical base member and the cylindrical auxiliary member are placed in this order on the same axis of the support member in the transport container The cylindrical auxiliary member is stored in the transfer container by the first transfer arm in the transfer container, and then the cylindrical substrate and the cylindrical support member are stored in the second transfer arm in the transfer container. Together with the stack When the cylindrical substrate is installed in the film forming apparatus, the cylindrical auxiliary member is moved after the cylindrical substrate and the cylindrical support member are installed in the deposited film forming apparatus by the second transfer arm in the transfer container. A vacuum transfer method characterized in that the first transfer arm in the transfer device is placed coaxially with the cylindrical substrate in the deposited film forming apparatus. 前記円筒状支持部材の同軸上に前記円筒状基体、前記円筒状補助部材の順で載置された状態の前記円筒上支持部材および前記円筒状基体及び前記円筒状補助部材を前記搬送容器内に格納する際には前記搬送容器内の第1の搬送アームにより前記円筒状補助部材を前記搬送容器内に格納後に前記搬送容器内の第2の搬送アームにより前記円筒状基体及び前記円筒状支持部材を格納すると共に、前記堆積膜形成装置内に前記円筒状基体を設置する時には前記搬送容器内の第2の搬送アームにより前記堆積膜形成装置に前記円筒状基体及び前記円筒状支持部材を設置後に前記円筒状補助部材を前記搬送機内の第1の搬送アームにより前記堆積膜形成装置内の前記円筒状基体と同軸上に載置する真空搬送方法を用い、前記堆積膜形成装置内に前記円筒状基体上を設置し、前記円筒状支持体を回転可能し、前記複数の原料ガス導入管から、前記堆積膜形成装置内に原料ガスを導入し、前記堆積膜形成装置内を排気し、前記円筒基体を加熱し、放電エネルギーにより前記原料ガスを励起しプラズマCVD法により堆積膜を形成する事を特徴とする堆積膜形成方法。   The cylindrical support member, the cylindrical base member, and the cylindrical auxiliary member that are placed in the order of the cylindrical base member and the cylindrical auxiliary member on the same axis of the cylindrical support member are placed in the transport container. When storing, the cylindrical auxiliary member is stored in the transfer container by the first transfer arm in the transfer container, and then the cylindrical substrate and the cylindrical support member are stored in the transfer container by the second transfer arm. And when the cylindrical substrate is installed in the deposited film forming apparatus, the cylindrical substrate and the cylindrical support member are installed in the deposited film forming apparatus by the second transfer arm in the transfer container. Using the vacuum transfer method in which the cylindrical auxiliary member is placed coaxially with the cylindrical substrate in the deposited film forming apparatus by a first transfer arm in the transfer machine, the cylinder is placed in the deposited film forming apparatus. A cylindrical substrate is installed on the substrate, the cylindrical support is rotatable, the source gas is introduced into the deposited film forming apparatus from the plurality of source gas introduction pipes, the inside of the deposited film forming apparatus is exhausted, and the cylinder A deposited film forming method comprising heating a substrate, exciting the source gas by discharge energy, and forming a deposited film by a plasma CVD method.
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* Cited by examiner, † Cited by third party
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JP2012014131A (en) * 2010-07-05 2012-01-19 Canon Inc Installation method of treatment container

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