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JP2006181488A - Substrate processing apparatus and substrate processing method - Google Patents

Substrate processing apparatus and substrate processing method Download PDF

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JP2006181488A
JP2006181488A JP2004378338A JP2004378338A JP2006181488A JP 2006181488 A JP2006181488 A JP 2006181488A JP 2004378338 A JP2004378338 A JP 2004378338A JP 2004378338 A JP2004378338 A JP 2004378338A JP 2006181488 A JP2006181488 A JP 2006181488A
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substrate
brush
main surface
tip
processing apparatus
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JP4387938B2 (en
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Satoshi Yamamoto
悟史 山本
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Dainippon Screen Manufacturing Co Ltd
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Priority to TW094138750A priority patent/TWI274385B/en
Priority to CN200510128972XA priority patent/CN1814357B/en
Priority to KR1020050123115A priority patent/KR100740385B1/en
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    • H10P72/0412
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1316Methods for cleaning the liquid crystal cells, or components thereof, during manufacture: Materials therefor

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  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
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  • Cleaning In General (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

【課題】 充分な洗浄機能を確保しつつ、正確に基板を搬送することができ、しかも、基板洗浄機構の製作が容易な基板処理装置を提供する。
【解決手段】 搬送ローラに支持された基板Bの主面に、ブラシ部221,222の毛束50の先端50Hを、当該毛束50が延びる方向から基板Bの主面に沿わせて一方向に曲げた状態として、当該先端50Hを基板Bの主面に摺接させるようにする。この姿勢で、先端50Hが基板Bの面に当接しながら、当該ブラシ部221が基板搬送方向に直交する基板面と平行な方向に往復移動して、搬送中の基板面を洗浄する。
【選択図】 図5
PROBLEM TO BE SOLVED: To provide a substrate processing apparatus capable of accurately transporting a substrate while ensuring a sufficient cleaning function and easily manufacturing a substrate cleaning mechanism.
SOLUTION: A tip 50H of a hair bundle 50 of brush portions 221 and 222 is placed on a main surface of a substrate B supported by a conveyance roller in one direction along a main surface of the substrate B from a direction in which the hair bundle 50 extends. In this state, the tip 50H is brought into sliding contact with the main surface of the substrate B. In this posture, while the tip 50H is in contact with the surface of the substrate B, the brush portion 221 moves back and forth in a direction parallel to the substrate surface orthogonal to the substrate transport direction to clean the substrate surface being transported.
[Selection] Figure 5

Description

本発明は、液晶表示デバイス(LCD)、プラズマ表示デバイス(PDP)、半導体デバイス等の製造プロセスにおいて、LCD又はPDP用ガラス基板、半導体基板、プリント基板等に対して各種の処理、例えば洗浄処理を行う基板処理装置に関する。   In the manufacturing process of a liquid crystal display device (LCD), a plasma display device (PDP), a semiconductor device, etc., the present invention performs various processes such as a cleaning process on a glass substrate for LCD or PDP, a semiconductor substrate, a printed circuit board, etc. The present invention relates to a substrate processing apparatus.

従来から、LCDまたはPDP用ガラス基板等の基板製造ラインにおいては、例えばエッチング処理等の薬液を用いた特定の処理装置の後に基板洗浄機構を設け、基板表面に残った薄膜やパーティクル等の異物を洗浄除去することが行われている。このような基板洗浄機構を有する基板処理装置としては、例えば、特許文献1に示されるように、ローラコンベア等の搬送手段により搬送される基板に純水等の処理液を供給しつつ、該基板表面に円筒状のロールブラシを当接させるものが提案されている。   Conventionally, in a substrate production line such as a glass substrate for LCD or PDP, a substrate cleaning mechanism has been provided after a specific processing apparatus using a chemical solution such as an etching process to remove foreign matters such as thin films and particles remaining on the substrate surface. Washing and removal is performed. As a substrate processing apparatus having such a substrate cleaning mechanism, for example, as shown in Patent Document 1, while supplying a processing liquid such as pure water to a substrate transported by transporting means such as a roller conveyor, the substrate The thing which makes a cylindrical roll brush contact | abut on the surface is proposed.

また、特許文献2に示されるように、搬送される基板の上面側及び下面側に、棒状ブラシを所定間隔をおいて複数配設し、基板搬送方向に対して直交する方向に往復運動させることで基板上の埃等を除去する洗浄装置も提案されている。
特開平9−326377号公報 特開平10−34090号公報
Further, as shown in Patent Document 2, a plurality of rod-like brushes are arranged at predetermined intervals on the upper surface side and the lower surface side of a substrate to be conveyed, and reciprocating in a direction perpendicular to the substrate conveyance direction. Also, a cleaning device for removing dust on the substrate has been proposed.
JP 9-326377 A JP 10-34090 A

しかしながら、上記特許文献1に示される基板処理装置は、ロールブラシを用いて基板を洗浄するため、大型サイズの基板の洗浄に要求される精度を備えたロールブラシを製作することが困難である。すなわち、基板大型化に伴って、基板の搬送方向に直交する水平方向に延びるロールブラシの長さが長くなったため、ロールブラシ自身の重みで長さ方向中央部近傍に撓みが発生し、基板とロールブラシとの間隔を一定に保つことが困難となっており、基板とロールブラシとの間隔が一定とされた洗浄機構の製作は容易ではない。   However, since the substrate processing apparatus disclosed in Patent Document 1 cleans a substrate using a roll brush, it is difficult to manufacture a roll brush having the accuracy required for cleaning a large-sized substrate. That is, with the increase in the size of the substrate, the length of the roll brush extending in the horizontal direction orthogonal to the substrate transport direction is increased, and therefore the deflection of the central portion in the length direction occurs due to the weight of the roll brush itself, It is difficult to keep the distance between the roll brush constant, and it is not easy to manufacture a cleaning mechanism in which the distance between the substrate and the roll brush is constant.

上記特許文献2に示される洗浄装置の場合、ブラシ毛束の先端で形成される平面が均一でないと、ブラシを基板の主面に均一に摺接させることができないが、ブラシ毛束の先端の平面を均一にすることは加工上、困難である。また、このような基板表面に対して直交する姿勢からなる棒状ブラシによって、充分な洗浄性能を確保するには、基板表面に対する押圧力を大きくせざるを得ないため、基板搬送時において、当該押圧力によって基板搬送に支障が生じたり、基板が蛇行して搬送されてしまうおそれがある。さらに、上記ブラシ先端の平面と基板主面とを平行な状態としてブラシを押圧する必要があるが、基板大型化に伴って、基板の搬送方向に直交する水平方向に延びるブラシ長さが長くなり、ブラシ自身の重みで長さ方向中央部近傍に撓みが発生しやすくなったため、ブラシの長尺方向においてブラシを上下に傾斜させないようにして、基板とブラシとの間隔を一定に保った状態でブラシ本体を基板主面に押圧することは、高精度が要求され困難となっている。   In the case of the cleaning apparatus shown in Patent Document 2, the brush cannot be uniformly slidably contacted with the main surface of the substrate unless the plane formed at the tip of the brush bristle bundle is uniform. It is difficult for processing to make the plane uniform. Further, in order to ensure sufficient cleaning performance with such a rod-shaped brush that is orthogonal to the substrate surface, the pressing force on the substrate surface must be increased. There is a possibility that the substrate conveyance may be hindered by the pressure, or the substrate may meander and be conveyed. Furthermore, it is necessary to press the brush with the plane of the brush tip parallel to the main surface of the substrate, but as the substrate size increases, the brush length extending in the horizontal direction perpendicular to the substrate transport direction becomes longer. Because the weight of the brush itself is likely to cause bending near the center in the longitudinal direction, the brush is not inclined up and down in the longitudinal direction of the brush, and the distance between the substrate and the brush is kept constant. It is difficult to press the brush body against the main surface of the substrate because high accuracy is required.

本発明は、上記の問題を解決するためになされたもので、充分な洗浄機能を確保しつつ、正確に基板を搬送することができ、しかも、基板洗浄機構の製作が容易な基板処理装置及び基板処理方法を提供することを目的とするものである。   The present invention has been made to solve the above-described problems, and can provide a substrate processing apparatus that can accurately transport a substrate while ensuring a sufficient cleaning function, and that can easily manufacture a substrate cleaning mechanism. An object of the present invention is to provide a substrate processing method.

本発明の請求項1に記載の発明は、基板を支持する支持手段と、
基部と、当該基部から延びる多数の毛からなる毛束とを有するブラシと、
前記支持手段に支持された基板の主面に、前記ブラシの毛束の先端部を、当該毛束が延びる方向から前記基板の主面に沿わせて一方向に曲げた状態として、当該先端部を前記基板の主面に摺接させる摺接手段と
を備えるものである。
The invention according to claim 1 of the present invention comprises a supporting means for supporting the substrate,
A brush having a base and a hair bundle composed of a plurality of hairs extending from the base;
The tip portion of the bristles of the brush supported on the main surface of the substrate supported by the support means is bent in one direction along the main surface of the substrate from the direction in which the bristles extend. And a sliding contact means for slidingly contacting the main surface of the substrate.

また、請求項9に記載の発明は、前記ブラシの基部から延びる多数の毛からなる毛束の先端部を、前記基板の主面に沿うように一方向に曲げた状態で、前記先端部を前記基板の主面に摺接させて基板を処理する基板処理方法である。   In the invention according to claim 9, the tip end portion is bent in one direction along the main surface of the substrate with the tip end portion of the hair bundle composed of a large number of hairs extending from the base portion of the brush. In this substrate processing method, the substrate is processed in sliding contact with the main surface of the substrate.

これらの構成では、ブラシの毛束の先端部が、基板の主面に沿うように曲がった状態で基板の主面に摺接するようになっている。そのため、このように曲がった状態のブラシ毛束の先端部には、真直ぐな状態に戻ろうとする応力が働くので、ブラシ毛束の先端部は基板の主面側に付勢される。この結果、例えブラシの毛束の先端部が形成する平面が不均一であったり、また、ブラシの長尺化によりブラシ自身の重みでブラシの長さ方向中央部近傍に撓みが発生して、ブラシの長尺方向においてブラシが上下に多少傾斜していても、ブラシの毛束の先端部を基板主面に対して均一に摺接させることができる。   In these configurations, the tip of the bristles of the brush is in sliding contact with the main surface of the substrate in a bent state along the main surface of the substrate. For this reason, stress that tends to return to the straight state acts on the tip of the bent bristle bundle, so that the tip of the bristle bundle is urged toward the main surface of the substrate. As a result, for example, the flat surface formed by the tip of the hair bundle of the brush is uneven, or due to the length of the brush, the weight of the brush itself causes the deflection in the vicinity of the central portion in the length direction of the brush, Even if the brush is slightly tilted up and down in the longitudinal direction of the brush, the tip of the bristles of the brush can be slidably contacted with the main surface of the substrate.

また、請求項2に記載の発明は、請求項1に記載の基板処理装置であって、前記ブラシは、第1方向に延びる棒状とされ、
前記第1方向と交差する第2方向に、前記基板を前記ブラシに対して相対的に搬送する搬送手段をさらに備え、
前記搬送手段により前記第2方向に沿って前記ブラシに対して相対的に搬送される前記基板の主面に対して、前記摺接手段は、前記ブラシの毛束の先端部を前記基板の相対搬送方向の下流側に向けて曲げた状態として、前記ブラシを前記第1方向に沿って往復移動させつつ前記基板の主面に摺接させるものである。
Moreover, invention of Claim 2 is the substrate processing apparatus of Claim 1, Comprising: The said brush is made into the rod-shape extended in a 1st direction,
Transporting means for transporting the substrate relative to the brush in a second direction intersecting the first direction;
With respect to the main surface of the substrate that is conveyed relative to the brush along the second direction by the conveying means, the sliding contact means moves the tip of the bristle bundle of the brush relative to the substrate. As a state bent toward the downstream side in the transport direction, the brush is slidably contacted with the main surface of the substrate while reciprocating along the first direction.

この構成によれば、第2方向に沿ってブラシに対して相対的に搬送される基板の主面に対して、ブラシの毛束の先端部を基板の相対搬送方向の下流側に向けて曲げた状態として、当該ブラシを第1方向に沿って往復移動させつつ基板の主面に摺接させるので、ブラシの長尺化により、ブラシの長尺方向においてブラシが上下に多少傾斜していても、ブラシの毛束の先端部を基板主面に対して均一に摺接させた状態で、ブラシを上記第1方向に沿って往復移動させることができる。   According to this configuration, the front end portion of the bristles of the brush is bent toward the downstream side in the relative conveyance direction of the substrate with respect to the main surface of the substrate conveyed relative to the brush along the second direction. Since the brush is slidably contacted with the main surface of the substrate while reciprocating along the first direction, even if the brush is slightly inclined up and down in the lengthwise direction of the brush due to the lengthening of the brush The brush can be reciprocated along the first direction with the tip of the bristles of the brush being in sliding contact with the substrate main surface uniformly.

また、請求項3に記載の発明は、請求項2に記載の基板処理装置であって、前記摺接手段は、前記ブラシの毛束の先端部が前記基板の相対搬送方向の下流側に向かうように、前記ブラシを傾斜させて支持しつつ、前記ブラシを前記基板の主面に摺接させるものである。   Further, the invention according to claim 3 is the substrate processing apparatus according to claim 2, wherein the sliding contact means has a tip end portion of the bristle bundle of the brush directed toward a downstream side in a relative conveyance direction of the substrate. As described above, the brush is slidably brought into contact with the main surface of the substrate while the brush is inclined and supported.

この構成によれば、基板の相対搬送方向に抗わないようにブラシが配置されているので、ブラシを基板主面に摺接させた状態としていても、基板を円滑に搬送することができる。   According to this configuration, since the brush is disposed so as not to resist the relative conveyance direction of the substrate, the substrate can be smoothly conveyed even when the brush is in sliding contact with the main surface of the substrate.

また、請求項4に記載の発明は、請求項2又は請求項3に記載の基板処理装置であって、前記第2方向に沿って、複数の前記ブラシが並列に配置されているものである。   According to a fourth aspect of the present invention, there is provided the substrate processing apparatus according to the second or third aspect, wherein the plurality of brushes are arranged in parallel along the second direction. .

この構成では、上記第2方向に沿った複数ブラシの並列配置によって、ブラシによる基板面からの汚れの掻き取りを連続的に行って、基板主面に対する洗浄力を高めている。   In this configuration, by the parallel arrangement of the plurality of brushes along the second direction, the cleaning of the substrate main surface is enhanced by continuously scraping off the dirt from the substrate surface with the brush.

また、請求項5に記載の発明は、請求項3又は請求項4に記載の基板処理装置であって、前記支持手段に支持された前記基板の両方の主面側に、複数の前記ブラシがそれぞれ配置されているものである。   The invention according to claim 5 is the substrate processing apparatus according to claim 3 or claim 4, wherein a plurality of the brushes are provided on both principal surface sides of the substrate supported by the support means. Each is arranged.

この構成では、上記基板の両方の主面側に複数ブラシを配置することによって、ブラシによる基板の両方の主面に対する洗浄力を高めている。   In this configuration, by disposing a plurality of brushes on both main surface sides of the substrate, the cleaning power of both main surfaces of the substrate by the brush is enhanced.

また、請求項6に記載の発明は、請求項5に記載の基板処理装置であって、前記支持手段に支持された前記基板の両方の主面側に複数の前記ブラシが互いに対向配置され、かつ、前記支持手段に前記基板が支持されていないときに、当該対向配置された前記各ブラシの先端部が互いに当接するように前記各ブラシが配置されるとともに、前記支持手段に前記基板が支持されていないときに、前記摺接手段によって対向配置された前記各ブラシの先端部を互いに摺接させるものである。   Further, the invention according to claim 6 is the substrate processing apparatus according to claim 5, wherein the plurality of brushes are arranged opposite to each other on both main surface sides of the substrate supported by the support means, In addition, when the substrate is not supported by the support means, the brushes are arranged so that the tip portions of the brushes arranged opposite to each other come into contact with each other, and the substrate is supported by the support means. When not done, the tip portions of the brushes arranged to face each other by the sliding contact means are brought into sliding contact with each other.

この構成では、支持手段に基板が支持されていない状態においては、上記各ブラシの先端部を互いに当接させ、摺接手段が、対向配置された前記各ブラシの先端部を互いに摺接させて、両方のブラシ部の毛束先端部同士を擦り合わせ、これにより、各ブラシの両方の毛束先端を洗浄するようにしている。   In this configuration, when the substrate is not supported by the supporting means, the tip portions of the brushes are brought into contact with each other, and the sliding contact means is brought into sliding contact with the tip portions of the brushes arranged to face each other. The hair bundle tips of both brush portions are rubbed together, thereby washing both hair bundle tips of each brush.

また、請求項7に記載の発明は、請求項1乃至請求項6のいずれかに記載の基板処理装置であって、前記ブラシの毛束の先端部が形成する平面が、毛束が曲げられるべき一方向に向かって前記支持手段に支持された前記基板の主面に近づく傾斜面とされているものである。   The invention described in claim 7 is the substrate processing apparatus according to any one of claims 1 to 6, wherein the flat surface formed by the tip of the hair bundle of the brush is bent. The inclined surface approaches the main surface of the substrate supported by the support means in one power direction.

この構成では、ブラシの毛束が基板の主面に対して摺接して曲がった状態となるとき、ブラシの先端部が側面視で扇状に広がるので、基板の主面に作用する毛の本数が増え、洗浄処理効率が向上する。例えば、ブラシ毛束の先端が斜めカットされていないと、ブラシの毛束が基板の主面に対して摺接したときに毛が積層され、毛束の曲がった部分の上側に位置する毛は基板の主面に作用しないものもあるが、上記構成によれば、そのような事態が生じることを少なくすることができる。   In this configuration, when the bristles of the brush are in sliding contact with the main surface of the substrate and bent, the tip of the brush spreads in a fan shape in a side view, so the number of hairs acting on the main surface of the substrate can be reduced. This increases the cleaning efficiency. For example, if the tip of the bristles is not cut obliquely, the bristles are stacked when the bristles of the brush come into sliding contact with the main surface of the substrate, and the bristles located above the bent portion of the bristles are Although there are some which do not act on the main surface of the substrate, according to the above configuration, occurrence of such a situation can be reduced.

また、請求項8に記載の発明は、請求項1乃至請求項7のいずれかに記載の基板処理装置であって、前記基板の主面に摺接して曲がった状態となっている前記ブラシの毛束の先端部に向けて処理液を供給する処理液供給手段をさらに有するものである。   The invention according to claim 8 is the substrate processing apparatus according to any one of claims 1 to 7, wherein the brush is in a state of being bent in sliding contact with the main surface of the substrate. The apparatus further includes processing liquid supply means for supplying a processing liquid toward the tip of the hair bundle.

また、請求項10に記載の発明は、請求項9に記載の基板処理方法であって、前記基板の主面に摺接して曲がった状態となっている前記ブラシの毛束の先端部に向けて処理液を供給するものである。   The invention according to claim 10 is the substrate processing method according to claim 9, wherein the brush treatment is directed toward the tip of the bristle bundle of the brush which is in a slidable contact with the main surface of the substrate. The processing liquid is supplied.

これらの構成によれば、ブラシの毛束の先端部に向けた処理液の供給により、基板主面に対するブラシの摺接により発生する物(異物)をブラシ外に排出できるため、処理(洗浄)効率が向上する。   According to these configurations, by supplying the treatment liquid toward the tip of the bristle bundle of the brush, the matter (foreign matter) generated by the sliding contact of the brush with the main surface of the substrate can be discharged out of the brush, so that the treatment (cleaning) Efficiency is improved.

請求項1及び請求項9に記載の発明によれば、ブラシの毛束の先端部が、基板の主面に沿うように曲がった状態で基板の主面に摺接するようになっており、当該曲がった状態のブラシ毛束の先端部には真直ぐな状態に戻ろうとする応力が働き、ブラシ毛束の先端部が基板の主面側に付勢されるので、例えブラシの毛束の先端部が形成する平面が不均一であったり、また、ブラシの長尺化によりブラシ自身の重みでブラシの長さ方向中央部近傍に撓みが発生して、ブラシの長尺方向においてブラシが上下に多少傾斜していても、ブラシの毛束の先端部を基板主面に対して均一に摺接させることができる。   According to the invention described in claim 1 and claim 9, the tip of the bristle bundle of the brush is in sliding contact with the main surface of the substrate in a bent state along the main surface of the substrate. The tip of the bristle bundle is bent, for example, because the tip of the bristle bundle is biased toward the main surface of the substrate. The flat surface formed by the brush is uneven, or due to the length of the brush, the weight of the brush itself causes deflection near the center in the length direction of the brush, and the brush slightly moves up and down in the length direction of the brush. Even if it is inclined, the tip of the bristle bundle of the brush can be slid uniformly against the main surface of the substrate.

請求項2に記載の発明によれば、第2方向に沿ってブラシに対して相対的に搬送される基板の主面に対して、ブラシの毛束の先端部を基板の相対搬送方向の下流側に向けて曲げた状態として、当該ブラシを第1方向に沿って往復移動させつつ基板の主面に摺接させるので、ブラシの長尺化により、ブラシの長尺方向においてブラシが上下に多少傾斜していても、ブラシの毛束の先端部を基板主面に対して均一に摺接させた状態で、ブラシを上記第1方向に沿って往復移動させることができる。   According to the second aspect of the present invention, with respect to the main surface of the substrate that is conveyed relative to the brush along the second direction, the tip of the bristle bundle of the brush is downstream in the relative conveyance direction of the substrate. Since the brush is slidably contacted with the main surface of the substrate while reciprocating along the first direction, the brush is slightly moved up and down in the lengthwise direction of the brush. Even if it is inclined, the brush can be reciprocated along the first direction in a state where the tip of the bristles of the brush is in sliding contact with the substrate main surface uniformly.

請求項3に記載の発明によれば、基板の相対搬送方向に抗わないようにブラシが配置されているので、ブラシを基板主面に摺接させた状態としていても、基板を円滑に搬送することができる。   According to the invention described in claim 3, since the brush is disposed so as not to resist the relative conveyance direction of the substrate, the substrate can be smoothly conveyed even when the brush is in sliding contact with the main surface of the substrate. can do.

請求項4に記載の発明によれば、上記第2方向に沿った複数ブラシの並列配置によって、ブラシによる基板面からの汚れの掻き取りを連続的に行って、基板主面に対する洗浄力を高めることができる。   According to the fourth aspect of the present invention, due to the parallel arrangement of the plurality of brushes along the second direction, dirt is continuously scraped off from the substrate surface by the brush, and the cleaning power for the substrate main surface is increased. be able to.

請求項5に記載の発明によれば、上記基板の両方の主面側に複数ブラシを配置することによって、ブラシによる基板の両方の主面に対する洗浄力を高めることができる。   According to the fifth aspect of the present invention, by disposing a plurality of brushes on both main surfaces of the substrate, it is possible to enhance the cleaning power of the brushes on both main surfaces of the substrate.

請求項6に記載の発明によれば、支持手段に基板が支持されていない状態においては、上記各ブラシの先端部を互いに当接させ、摺接手段が、対向配置された前記各ブラシの先端部を互いに摺接させて、両方のブラシ部の毛束先端部同士を擦り合わせて、各ブラシの両方の毛束先端を洗浄することができる。   According to the sixth aspect of the present invention, in a state where the substrate is not supported by the support means, the tip portions of the brushes are brought into contact with each other, and the sliding contact means is arranged to face the tip of each brush. It is possible to clean the ends of both hair bundles of each brush by bringing the parts into sliding contact with each other and rubbing the ends of the hair bundles of both brush parts.

請求項7に記載の発明によれば、ブラシの毛束が基板の主面に対して摺接して曲がった状態となるとき、ブラシの先端部が側面視で扇状に広がるので、基板の主面に作用する毛の本数が増え、洗浄処理効率が向上する。   According to the seventh aspect of the present invention, when the bristles of the brush are bent in sliding contact with the main surface of the substrate, the tip of the brush spreads in a fan shape in a side view. The number of hairs acting on the hair increases, and the cleaning efficiency is improved.

請求項8及び請求項10に記載の発明によれば、ブラシの毛束の先端部に向けた処理液の供給により、基板主面に対するブラシの摺接により発生する物(異物)をブラシ外に排出できるため、処理(洗浄)効率が向上する。   According to the invention described in claims 8 and 10, an object (foreign matter) generated by the sliding contact of the brush with respect to the main surface of the substrate is removed from the brush by supplying the treatment liquid toward the tip of the bristle bundle of the brush. Since it can be discharged, the processing (cleaning) efficiency is improved.

以下、本発明の一実施形態に係る基板処理装置について図面を参照して説明する。図1は本発明の一実施形態に係る基板処理装置に備えられる基板洗浄装置の概略を示す図である。基板処理装置1に備えられる基板洗浄装置10は、処理対象となる基板Bに対し薬液処理を行うブラシ洗浄室2と、ブラシ洗浄室2を通過した基板Bに対して濯ぎを行うリンス室3と、エアナイフ室4とを有している。また、基板Bは、基板Bの搬送方向に直交する水平方向から傾斜させた姿勢で搬送されることが好ましい。基板Bをこの姿勢で搬送することによって、ブラシ洗浄室2及びリンス室3において基板Bに対して供給される各液を下方に落としやすくして、基板Bの面上からの液切れを良くしている。   Hereinafter, a substrate processing apparatus according to an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a diagram showing an outline of a substrate cleaning apparatus provided in a substrate processing apparatus according to an embodiment of the present invention. The substrate cleaning apparatus 10 provided in the substrate processing apparatus 1 includes a brush cleaning chamber 2 that performs chemical treatment on the substrate B to be processed, and a rinse chamber 3 that rinses the substrate B that has passed through the brush cleaning chamber 2. And an air knife chamber 4. Moreover, it is preferable that the board | substrate B is conveyed with the attitude | position inclined from the horizontal direction orthogonal to the conveyance direction of the board | substrate B. FIG. By transporting the substrate B in this posture, the liquid supplied to the substrate B in the brush cleaning chamber 2 and the rinsing chamber 3 can be easily dropped downward, and the liquid breakage from the surface of the substrate B is improved. ing.

ブラシ洗浄室2は、例えば、エッチング工程、剥離工程等の前工程での処理を終えた基板Bを受け入れて搬送する搬送ローラ21と、搬送ローラ21によって搬送される基板Bの上面に接触して洗浄するブラシ部221と、基板Bの下面に接触して洗浄するブラシ部222と、基板Bの上面に対して純水等の処理液(基板洗浄のために用いる各種の処理液の適用が可能。純水は一例)を供給する処理液供給ノズル(液供給部)231と、基板Bの下面に対して処理液を供給する処理液供給ノズル232とを有している。これらブラシ部221,222と、処理液供給ノズル231,232はそれぞれ複数設けられている。また、処理液供給ノズル231,232は、乾いた基板Bの表面をブラシ221,222が摺接することによる表面へのダメージを防止するために、ブラシ部221,222によよりも基板搬送方向上流側(ブラシ部221,222による基板Bの摺接前)の位置にも配設されており、その処理液吐出方向は基板搬送方向下流側に向けられている。なお、処理液供給ノズル231,232は図略の処理液供給源に接続されている。   For example, the brush cleaning chamber 2 is in contact with the transport roller 21 that receives and transports the substrate B that has been processed in the previous process such as the etching process and the peeling process, and the upper surface of the substrate B transported by the transport roller 21. The brush part 221 to be cleaned, the brush part 222 to be in contact with the lower surface of the substrate B, and the upper surface of the substrate B can be applied with a processing liquid such as pure water (various processing liquids used for substrate cleaning can be applied. A pure water is an example), and a processing liquid supply nozzle (liquid supply unit) 231 for supplying the processing liquid and a processing liquid supply nozzle 232 for supplying the processing liquid to the lower surface of the substrate B are provided. A plurality of these brush portions 221 and 222 and a plurality of treatment liquid supply nozzles 231 and 232 are provided. Further, the treatment liquid supply nozzles 231 and 232 are disposed upstream of the brush portions 221 and 222 in the substrate transport direction in order to prevent damage to the surface due to the brushes 221 and 222 slidingly contacting the surface of the dry substrate B. It is also disposed at a position on the side (before sliding contact of the substrate B by the brush portions 221 and 222), and the treatment liquid discharge direction is directed to the downstream side in the substrate transport direction. The processing liquid supply nozzles 231 and 232 are connected to a processing liquid supply source (not shown).

リンス室3は、ブラシ洗浄室2での処理を終えた基板Bに対して濯ぎ処理を行うものである。リンス室3は、ブラシ洗浄室2から基板Bを受け入れて搬送する搬送ローラ31と、リンス液として純水等を基板Bの上面に供給するリンス液供給ノズル32と、基板Bの下面にリンス液を供給するリンス液供給ノズル33とを有する。   The rinsing chamber 3 performs a rinsing process on the substrate B that has been processed in the brush cleaning chamber 2. The rinse chamber 3 includes a transport roller 31 that receives and transports the substrate B from the brush cleaning chamber 2, a rinse liquid supply nozzle 32 that supplies pure water or the like as a rinse liquid to the upper surface of the substrate B, and a rinse liquid on the lower surface of the substrate B A rinsing liquid supply nozzle 33 for supplying

エアナイフ室4は、リンス室3から搬送されてくる基板Bを受け入れて搬送する搬送ローラ41と、搬送ローラ41により搬送される基板Bの上面に対してエアを吹き付けて基板Bの上面乾燥させるエアナイフ421と、基板Bの下面に対してエアを吹き付けて乾燥させるエアナイフ422とを有する。   The air knife chamber 4 includes a transport roller 41 that receives and transports the substrate B transported from the rinse chamber 3, and an air knife that blows air onto the upper surface of the substrate B transported by the transport roller 41 to dry the upper surface of the substrate B. 421 and an air knife 422 that blows air against the lower surface of the substrate B and dries it.

図2は基板洗浄装置10のブラシ洗浄室2に備えられるブラシ部221及びその駆動機構を簡易的に示す構成図である。なお、ブラシ部222は当該ブラシ部221と同様の構成である。ブラシ洗浄室2のブラシ部221は、基板Bの面洗浄用のブラシ毛束50と、このブラシ毛束50が立設(植毛)される平板状のブラシ基部51とを有する。これらブラシ毛束50及びブラシ基部51からなるブラシ部221は、基板Bの搬送方向に直交する方向又はそれに近い方向であって、基板Bの上面に平行な方向に長尺状に延びる形状とされている。また、ブラシ部221は、基板Bの面に対して直交する姿勢から予め定められた角度だけブラシ毛束50の先端50H側を基板Bの搬送方向下流側に向けて、傾けた姿勢とされている(詳細は後述)。   FIG. 2 is a configuration diagram simply showing the brush unit 221 provided in the brush cleaning chamber 2 of the substrate cleaning apparatus 10 and its driving mechanism. The brush unit 222 has the same configuration as the brush unit 221. The brush unit 221 of the brush cleaning chamber 2 includes a brush bristle bundle 50 for cleaning the surface of the substrate B, and a flat brush base 51 on which the brush bristle bundle 50 is erected (planted). The brush portion 221 including the brush bristle bundle 50 and the brush base portion 51 has a shape extending in a long shape in a direction perpendicular to or in the direction perpendicular to the conveyance direction of the substrate B and parallel to the upper surface of the substrate B. ing. Further, the brush portion 221 is inclined such that the tip 50H side of the bristle bundle 50 is directed downstream in the conveyance direction of the substrate B from a posture orthogonal to the surface of the substrate B. (Details will be described later).

ブラシ基部51の上面部111側には、ブラシ部221を吊止め支持する支持材60が取り付けられ、この支持材60によってブラシ部221が、剛直な部材からなるブラシ取り付けベース61に取り付けられている。ブラシ取り付けベース61には、揺動機構8が取り付けられており、この揺動機構8から与えられる水平横方向における駆動力によりブラシ取り付けベース61が、基板Bの搬送方向に直交する基板B上面に平行な方向(例えば、図2の左右方向)に揺動されることで、ブラシ取り付けベース61に取り付けられているブラシ部221のブラシ毛束50の先端50Hが、基板Bの上面と平行な方向に揺動される。揺動機構8の機構については後述する。なお、支持材60は、図2に示す距離Gを可変させられるように、ブラシ取り付けベース61に対して移動自在に設けられている。なお、支持材60、ブラシ取り付けベース61及び揺動機構8は、摺接手段の一例である(摺接手段の構成をこれに限定する趣旨ではない)。   A support member 60 that supports the brush portion 221 in a suspended manner is attached to the upper surface portion 111 side of the brush base portion 51, and the brush portion 221 is attached to a brush attachment base 61 made of a rigid member by the support member 60. . A swinging mechanism 8 is attached to the brush mounting base 61, and the brush mounting base 61 is placed on the upper surface of the substrate B perpendicular to the transport direction of the substrate B by the driving force in the horizontal lateral direction given from the swinging mechanism 8. The tip 50H of the bristle bundle 50 of the brush part 221 attached to the brush attachment base 61 is parallel to the upper surface of the substrate B by swinging in a parallel direction (for example, the horizontal direction in FIG. 2). Is swung. The mechanism of the swing mechanism 8 will be described later. The support member 60 is provided so as to be movable with respect to the brush mounting base 61 so that the distance G shown in FIG. The support member 60, the brush mounting base 61, and the swing mechanism 8 are examples of sliding contact means (the configuration of the sliding contact means is not intended to be limited to this).

このように構成された基板洗浄装置10の動作を説明する。まず、ブラシ基部51の高さ位置の設定がなされる。この高さ位置は、ブラシ毛束50をなす各毛の径や材質等、基板Bの上面に対するブラシ毛束50の角度(傾き)、並びに洗浄ターゲットとするパーティクルの粒径等を考慮し、洗浄すべき基板Bの上面に、どの程度の圧力で、またどの程度の接触面積でブラシ毛束50の先端50Hを接触させるかの観点から決定される。   The operation of the substrate cleaning apparatus 10 configured as described above will be described. First, the height position of the brush base 51 is set. This height position is determined by considering the diameter and material of each bristles constituting the bristles 50, the angle (inclination) of the bristles 50 with respect to the upper surface of the substrate B, the particle size of the particles to be cleaned, and the like. It is determined from the viewpoint of how much pressure and how much contact area the tip 50H of the brush bristle bundle 50 is brought into contact with the upper surface of the substrate B to be processed.

基板B上面に対してブラシ毛束50の先端50Hの位置を微調整する作業は、ブラシ取り付けベース61に対する支持材60の位置を調整することでも可能とされている。例えば、ブラシ基部51が、大型の基板に対応した長尺状のものとされている場合、ブラシ基部51の長手方向略中央部は、下方向に撓みやすい。そのような場合には、当該撓んだ部分に近い支持材60のブラシ取り付けベース61に対する位置を調整し、撓んだ部分を上方向に持ち上げることで、ブラシ毛束50の先端50Hの基板B上面に対する位置関係を、ブラシ部222の長手方向において均一にすることが可能となっている。   The operation of finely adjusting the position of the tip 50H of the brush bristle bundle 50 with respect to the upper surface of the substrate B is also possible by adjusting the position of the support member 60 with respect to the brush mounting base 61. For example, when the brush base 51 has a long shape corresponding to a large substrate, the substantially central portion in the longitudinal direction of the brush base 51 is easily bent downward. In such a case, by adjusting the position of the support member 60 near the bent portion with respect to the brush mounting base 61 and lifting the bent portion upward, the substrate B of the tip 50H of the brush bristle bundle 50 is lifted. The positional relationship with respect to the upper surface can be made uniform in the longitudinal direction of the brush portion 222.

このように、基板Bの上面に対するブラシ毛束50の先端50Hの位置関係が調整された上で、基板Bの洗浄処理が行われる。この洗浄処理に際しては、処理液供給機構9の供給ポンプ93を動作させ、処理液をブラシ基部51に設けられた処理液吐出孔131から処理液を基板Bに向けて吐出させつつ、揺動機構8によりブラシ取り付けベース61を揺動させる。これにより、搬送されてくる基板Bの表面にブラシ毛束50の先端50Hが、基板Bに対して上記のように傾いた姿勢となって、処理液の存在下で揺動接触することとなり、ブラシ毛束50が基板Bに作用してパーティクル等が除去される。   Thus, the cleaning process of the substrate B is performed after the positional relationship of the tip 50H of the bristle bundle 50 with respect to the upper surface of the substrate B is adjusted. In this cleaning process, the supply pump 93 of the processing liquid supply mechanism 9 is operated to discharge the processing liquid from the processing liquid discharge hole 131 provided in the brush base 51 toward the substrate B, and to swing the mechanism. 8, the brush mounting base 61 is swung. As a result, the tip 50H of the bristle bundle 50 is inclined with respect to the substrate B as described above on the surface of the substrate B being conveyed, and comes into rocking contact in the presence of the processing liquid. The brush hair bundle 50 acts on the substrate B to remove particles and the like.

続いて、揺動機構8の具体的態様につき説明する。図3は、ブラシ取り付けベース61(ブラシ先端50H)を、基板Bの進行方向(図中矢印bで表示)と直交する方向(図中矢印cの方向)に、直線的な往復運動をさせる揺動機構8の概略を示す平面図である。   Next, a specific aspect of the swing mechanism 8 will be described. FIG. 3 shows a swinging motion that causes the brush mounting base 61 (brush tip 50H) to reciprocate linearly in a direction (indicated by arrow c in the figure) perpendicular to the direction of travel of the substrate B (indicated by arrow b in the figure). 3 is a plan view showing an outline of a moving mechanism 8. FIG.

クランク機構部80は、電動モータ(駆動源)82により駆動されるものであって、駆動源82の回転軸821に結合された回転円板811の外周部付近に軸支ピン812が突設され、この軸支ピン812に駆動シャフト813の一端側に設けられた連結孔が遊嵌されてなる。そして駆動シャフト813の他端側に設けられた連結孔と、ブラシ取り付けベース61の側端縁に突設された軸支部611とが、連結ピン612により回動自在に連結されている。   The crank mechanism 80 is driven by an electric motor (drive source) 82, and a shaft support pin 812 is provided in the vicinity of the outer peripheral portion of a rotary disk 811 coupled to the rotary shaft 821 of the drive source 82. A connecting hole provided on one end side of the drive shaft 813 is loosely fitted to the shaft support pin 812. A connecting hole provided on the other end side of the drive shaft 813 and a shaft support portion 611 protruding from the side end edge of the brush mounting base 61 are rotatably connected by a connecting pin 612.

一方、ブラシ取り付けベース61はリニアガイド613により、図中矢印cの方向への直線的な往復動が可能なように支持されている。このリニアガイド613に代えて、リニアブッシュ等を用いるようにしても良い。   On the other hand, the brush mounting base 61 is supported by a linear guide 613 so as to be capable of linear reciprocation in the direction of arrow c in the figure. Instead of the linear guide 613, a linear bush or the like may be used.

このような構成において、駆動源82が駆動されると、駆動源82の回転軸821に結合された回転円板811が回転され、該回転円板811に突設されている軸支ピン812に一端側が連結されている駆動シャフト813が、図面左右方向のクランク動作を行うことになる。このクランク動作により、連結ピン612により駆動シャフト813に連結されているブラシ取り付けベース61は、前記リニアガイド613によりガイドされつつ、図中矢印cの方向へ往復運動するものである。すなわち、ブラシ部221は、基板Bに対して直交する姿勢から角度θ1だけ傾いた姿勢でブラシ毛束50の先端50Hが基板Bの上面に接触し、図中矢印cの方向へ往復運動することによって、基板Bの表面上の汚れを掻き取って洗浄する。なお、このようなクランク機構部80と駆動源82とを用いた直線往復動機構に代えて、エアシリンダ等を用いた直線往復動機構を採用するようにしても良い。   In such a configuration, when the driving source 82 is driven, the rotating disk 811 coupled to the rotating shaft 821 of the driving source 82 is rotated, and the shaft support pin 812 projecting from the rotating disk 811 is rotated. The drive shaft 813 to which one end side is connected performs a crank operation in the horizontal direction of the drawing. By this crank operation, the brush mounting base 61 connected to the drive shaft 813 by the connecting pin 612 reciprocates in the direction of arrow c in the figure while being guided by the linear guide 613. That is, the brush portion 221 has the tip 50H of the bristle bundle 50 in contact with the upper surface of the substrate B in a posture inclined by an angle θ1 from a posture orthogonal to the substrate B, and reciprocates in the direction of arrow c in the figure. Thus, the dirt on the surface of the substrate B is scraped off and cleaned. Instead of such a linear reciprocating mechanism using the crank mechanism 80 and the drive source 82, a linear reciprocating mechanism using an air cylinder or the like may be adopted.

次に、ブラシ部221の構造について説明する。図4は、図2に示すブラシ部221の側断面図である。ブラシ部221は、上述したように、基板Bの面洗浄用のブラシ毛束50と、このブラシ毛束50が立設(植毛)される平板状のブラシ基部51とを有する。ブラシ毛束50は、多数本の毛が、その長さ方向における略中央部に軸52が挟み込まれ、当該軸52を挟み込んだブラシ毛束50部分にその上方からブラシ基部51が被せられている。ブラシ基部51は、断面形状が側面視で略「コ」の字状とされ、下方開口部に向けて側面視で先細り形状とされている。かかる形状のブラシ基部51により、当該軸52を挟み込んだのブラシ毛束50部分がブラシ基部51の内部に収められ、ブラシ基部51により、かしめられた状態とされている。   Next, the structure of the brush part 221 will be described. 4 is a side sectional view of the brush portion 221 shown in FIG. As described above, the brush part 221 includes the brush bristle bundle 50 for cleaning the surface of the substrate B and the flat brush base part 51 on which the brush bristle bundle 50 is erected (planted). The brush bristle bundle 50 has a large number of bristles in which a shaft 52 is sandwiched at a substantially central portion in the length direction, and a brush base 51 is covered from above the brush bristle bundle 50 portion sandwiching the shaft 52. . The brush base 51 has a substantially “U” shape in cross section when viewed from the side, and has a tapered shape when viewed from the side toward the lower opening. With this shape of the brush base 51, the portion of the bristle bundle 50 sandwiching the shaft 52 is housed inside the brush base 51 and is caulked by the brush base 51.

ブラシ毛束50をなす各毛は、例えば、ナイロン系、テフロン(登録商標)系、塩化ビニール(PVC:Poly Vinyl Chloride)系の材質からなり、径は0.05〜0.2(mm)とされる。ブラシ毛束50は、ブラシ基部51から露出した部分であって、最も脚の長い部分の長さLが、10≦L≦40(mm)とされる。   Each of the bristles constituting the bristle bundle 50 is made of, for example, nylon, Teflon (registered trademark), or vinyl chloride (PVC), and has a diameter of 0.05 to 0.2 (mm). The brush bristle bundle 50 is a portion exposed from the brush base 51, and the length L of the longest leg is 10 ≦ L ≦ 40 (mm).

また、ブラシ基部51の基板搬送方向における幅寸法Wは、ブラシ毛束50が立設(植毛)可能である限り小さい寸法であることが好ましく、具体的には、10mm以下であることが好ましい。ブラシ基部51の長さ方向寸法は、処理対象となる基板の搬送方向に直交する方向における寸法に合わせて逐次設定される。   Further, the width dimension W in the substrate transport direction of the brush base 51 is preferably as small as possible so long as the bristle bundle 50 can be erected (planted), and specifically, it is preferably 10 mm or less. The length direction dimension of the brush base 51 is sequentially set according to the dimension in the direction orthogonal to the transport direction of the substrate to be processed.

図5は、基板Bに対するブラシ部221,222及び処理液供給ノズル231,232の配置を示す側面図である。ブラシ部221,222は、それぞれ基板Bの上方又は下方に配設される。   FIG. 5 is a side view showing the arrangement of the brush portions 221 and 222 and the treatment liquid supply nozzles 231 and 232 with respect to the substrate B. The brush portions 221 and 222 are disposed above or below the substrate B, respectively.

ブラシ部221,222は、ブラシ毛束50の先端50H側を基板Bの搬送方向下流側に向けて、基板Bの上面又は下面に対して直交する姿勢から予め定められた角度θ1だけ傾けた姿勢とされている。この角度θ1は、5〜20°(より好ましくは15°)である。ブラシ部221,222を、このように基板Bの各面に対して傾けた姿勢で配置することにより、ブラシ部221,222のブラシ毛束50の先端50Hと基板Bの各面とのギャップ調節に精度が要求されず、また、ブラシ部221,222の傾き角θ1の設定を高い精度で行わなくても、ブラシ毛束50の先端50Hと基板Bの各面との間に隙間が生じたり、先端50Hによって基板Bの各面が不必要に押圧されてしまう不具合を生じる可能性は極めて少ない。   The brush portions 221 and 222 are tilted by a predetermined angle θ1 from a posture orthogonal to the upper surface or the lower surface of the substrate B with the tip 50H side of the brush bristle bundle 50 facing downstream in the transport direction of the substrate B. It is said that. This angle θ1 is 5 to 20 ° (more preferably 15 °). By arranging the brush portions 221 and 222 in such a manner as to be inclined with respect to each surface of the substrate B, the gap adjustment between the tip 50H of the brush bristle bundle 50 of the brush portions 221 and 222 and each surface of the substrate B is adjusted. Accuracy is not required, and there is a gap between the tip 50H of the bristle bundle 50 and each surface of the substrate B without setting the inclination angle θ1 of the brush portions 221 and 222 with high accuracy. There is very little possibility of causing a problem that each surface of the substrate B is unnecessarily pressed by the tip 50H.

処理液供給ノズル231,232は、例えば、(1)主に純水を高圧で吐出する高圧ノズル、(2)霧吹き状に液的を基体を圧力によって基板に供給することによって、液流体と気流体の二流体を噴射する二流体ノズル、(3)超音波振動が付与された純水を吐出する超音波ノズルなどである。処理液供給ノズル231,232は、ブラシ部221,222よりも基板搬送方向下流側における基板Bの上方又は下方に配設される。この処理液供給ノズル231,232は、処理液供給ノズル231,232からの処理液が、ブラシ毛束50の先端50Hと、基板Bの上面又は下面と、ブラシ毛束50の先端50Hと基板Bの上面又は下面の接触部分とに噴射(供給)されるように、配設位置及び配設角度が設定される。これにより、基板Bの各面の洗浄と、ブラシ毛束50の先端50Hの洗浄との両方を行うことができる。   The processing liquid supply nozzles 231 and 232 are, for example, (1) a high-pressure nozzle that mainly discharges pure water at a high pressure, and (2) liquid-like liquid and gas are supplied by spraying the liquid to the substrate by pressure. A two-fluid nozzle that ejects two fluids, and (3) an ultrasonic nozzle that discharges pure water to which ultrasonic vibration is applied. The processing liquid supply nozzles 231 and 232 are disposed above or below the substrate B on the downstream side of the brush portions 221 and 222 in the substrate transport direction. In the treatment liquid supply nozzles 231 and 232, the treatment liquid from the treatment liquid supply nozzles 231 and 232 is such that the tip 50 </ b> H of the brush bristle bundle 50, the upper or lower surface of the substrate B, and the tip 50 </ b> H of the brush bristle bundle 50 and the substrate B The arrangement position and the arrangement angle are set so as to be sprayed (supplied) to the contact portion of the upper surface or the lower surface. Thereby, both the cleaning of each surface of the substrate B and the cleaning of the tip 50H of the brush bristle bundle 50 can be performed.

図6は、基板Bに対するブラシ部221,222及び処理液供給ノズル231,232の配置を示す側面図であって、基板Bが無い状態を示すものである。図6に示すように、ブラシ部221とブラシ部222とは、互いのブラシ毛束50の先端50Hが、これらの間に基板Bが存在しない場合において当接する位置に配設されていることが好ましい。ブラシ部221及びブラシ部222をこのように配置して、ブラシ部221及びブラシ部222間の基板搬送路に基板Bが存在しない状態で、揺動機構8を駆動してブラシ部221及びブラシ部222を上記図3のc方向に往復運動(振動)させれば、ブラシ部221及びブラシ部222のブラシ毛束50の先端50H同士を擦り合わせることができ、ブラシ部221及びブラシ部222のブラシ毛束50の先端50Hを洗浄することが可能になる。   FIG. 6 is a side view showing the arrangement of the brush portions 221 and 222 and the treatment liquid supply nozzles 231 and 232 with respect to the substrate B, and shows a state where the substrate B is not present. As shown in FIG. 6, the brush portion 221 and the brush portion 222 are disposed at positions where the tips 50H of the brush bristle bundle 50 come into contact with each other when there is no substrate B therebetween. preferable. The brush unit 221 and the brush unit 222 are arranged in this manner, and the swing mechanism 8 is driven in a state where the substrate B does not exist in the substrate transport path between the brush unit 221 and the brush unit 222 to drive the brush unit 221 and the brush unit. If the 222 is reciprocated (vibrated) in the direction c of FIG. 3, the tips 50H of the bristle bundle 50 of the brush part 221 and the brush part 222 can be rubbed together, and the brushes of the brush part 221 and the brush part 222 can be rubbed together. The tip 50H of the hair bundle 50 can be cleaned.

図7は、ブラシ部221,222及び処理液供給ノズル231,232がそれぞれ複数配設された状態を示す側面図である。ブラシ部221,222及び処理液供給ノズル231,232は、ブラシ洗浄室2にそれぞれ複数設けられ、ブラシ部221と処理液供給ノズル231とが基板Bの搬送方向において交互に配置され、同様に、ブラシ部222と処理液供給ノズル232も基板Bの搬送方向において交互に配置される。このように構成すれば、ブラシ部221,222による基板B各面からの汚れの掻き取りと、処理液供給ノズル231,232から供給される線上液による汚れ除去とを比較的時間差を設けずに行うことになるため、基板Bの各面に対する洗浄力を高めることができる。   FIG. 7 is a side view showing a state in which a plurality of brush portions 221 and 222 and a plurality of treatment liquid supply nozzles 231 and 232 are arranged. A plurality of brush portions 221 and 222 and processing liquid supply nozzles 231 and 232 are provided in the brush cleaning chamber 2, and the brush portions 221 and the processing liquid supply nozzles 231 are alternately arranged in the transport direction of the substrate B. Similarly, The brush portions 222 and the treatment liquid supply nozzles 232 are also alternately arranged in the transport direction of the substrate B. If comprised in this way, scraping of the stain | pollution | contamination from each surface of the board | substrate B by the brush parts 221 and 222 and removal of the stain | pollution | contamination by the on-line liquid supplied from the process liquid supply nozzles 231 and 232 do not provide a comparative time difference. Therefore, the cleaning power for each surface of the substrate B can be increased.

本発明の他の実施形態を説明する。例えば、上記実施形態では、ブラシ部222の構造は、図4に示したように、ブラシ毛束50の先端50Hの下面部が水平面に平行な形状とされているが、この下面部を、図8に示すように、水平面に対して5〜20°(より好ましくは、15°)の傾斜角θ2を有する形状としてもよい。これにより、ブラシ毛束50の先端50Hの下面部を基板Bの上面又は下面に沿わせるようにする。この場合、ブラシ毛束50は、ブラシ基部51から露出した部分であって、最も脚の長い部分の長さLが、10≦L≦40(mm)とされる。   Another embodiment of the present invention will be described. For example, in the above embodiment, the structure of the brush portion 222 is such that the lower surface portion of the tip 50H of the bristle bundle 50 has a shape parallel to the horizontal plane as shown in FIG. As shown in FIG. 8, it is good also as a shape which has inclination-angle (theta) 2 of 5-20 degrees (more preferably 15 degrees) with respect to a horizontal surface. Accordingly, the lower surface portion of the tip 50H of the bristle bundle 50 is made to follow the upper surface or the lower surface of the substrate B. In this case, the brush bristle bundle 50 is a portion exposed from the brush base 51, and the length L of the longest leg is 10 ≦ L ≦ 40 (mm).

図9は、上記傾斜角θ2を有するブラシ毛束50からなるブラシ部221,222及び処理液供給ノズル231,232の配置を示す側面図である。上記傾斜角θ2を有するブラシ毛束50からなるブラシ部221,222を配設する場合も、ブラシ部221,222は、ブラシ毛束50の先端50H側を基板Bの搬送方向下流側に向けて、基板Bの上面又は下面に対して直交する姿勢から予め定められた角度θ3だけ傾けた姿勢とされるが、この角度θ2とθ3との関係は、θ2<θ3(例えば、15°<20°)となるようにする。ブラシ部221,222を、このように基板Bの各面に対して傾けた姿勢で配置することにより、ブラシ毛束50の先端50Hが基板Bの上面又は下面に対向する面のほぼ全域を、基板Bの上面又は下面に当接させることができる。   FIG. 9 is a side view showing the arrangement of the brush portions 221 and 222 and the treatment liquid supply nozzles 231 and 232 that are formed of the brush bristle bundle 50 having the inclination angle θ2. Even when the brush portions 221 and 222 including the brush bristle bundle 50 having the inclination angle θ <b> 2 are disposed, the brush portions 221 and 222 have the tip 50 </ b> H side of the brush bristle bundle 50 facing the downstream side in the conveyance direction of the substrate B. The posture is inclined by a predetermined angle θ3 from the posture orthogonal to the upper surface or the lower surface of the substrate B. The relationship between the angles θ2 and θ3 is θ2 <θ3 (for example, 15 ° <20 °). ). By arranging the brush portions 221 and 222 in such a posture inclined with respect to each surface of the substrate B, almost the entire surface of the surface where the tip 50H of the brush bristle bundle 50 faces the upper surface or the lower surface of the substrate B, It can be brought into contact with the upper surface or the lower surface of the substrate B.

さらには、ブラシ部221,222の毛束50の先端50Hの曲がった部分に向けて処理液を供給するとき、傾斜角θ2を有する傾斜面が形成されていない毛束先端部と比べて、当該傾斜面を有している毛束50は、基板Bの主面に対して当接したときに扇状に広がっていることにより先端50Hの厚みが薄くなるため(毛の呈が疎らになるため)、処理液が毛束50と基板Bの主面との間に浸透しやすくなり、処理液による処理効率が向上する。   Furthermore, when supplying the treatment liquid toward the bent portion of the tip 50H of the hair bundle 50 of the brush portions 221 and 222, compared to the hair bundle tip portion in which the inclined surface having the inclination angle θ2 is not formed, Since the hair bundle 50 having an inclined surface spreads in a fan shape when it comes into contact with the main surface of the substrate B, the thickness of the tip 50H is reduced (because hair is sparse). The treatment liquid easily penetrates between the hair bundle 50 and the main surface of the substrate B, and the treatment efficiency by the treatment liquid is improved.

また、ブラシ部221,222の傾き角θ3の設定や、上記角度θ3と角度θ2とを略等しくする調整が高い精度で行われなかったとしても、ブラシ部221,222を傾けて基板Bの各面に接触させているので、ブラシ毛束50の先端50Hと基板Bの各面との間に隙間が生じたり、先端50Hによって基板Bの各面が不必要に押圧されてしまうといった不具合を生じる可能性は極めて少ない。   Even if the setting of the inclination angle θ3 of the brush portions 221 and 222 and the adjustment for making the angle θ3 and the angle θ2 substantially equal to each other are not performed with high accuracy, the brush portions 221 and 222 are inclined to each of the substrates B. Since the surfaces are in contact with each other, a gap is generated between the tip 50H of the bristle bundle 50 and each surface of the substrate B, and each surface of the substrate B is unnecessarily pressed by the tip 50H. There is very little possibility.

なお、本発明は上記実施の形態の構成に限られず種々の変形が可能である。例えば。上記実施形態では、ブラシ部221,222が基板Bの両方の主面に対向する位置に設けられているが、いずれか一方の主面側に設けられていてもよい。また、ブラシ部221,222は、基板Bの主面に対して、その先端50Hが基板Bの搬送方向側に向けて傾けた姿勢で配設されているが、ブラシ毛束50の先端50Hが、基板Bの主面に沿うように曲がった状態で基板Bの主面に当接していれば、ブラシ部221,222を基板Bの主面に対して略垂直な姿勢や、逆向きに傾けた傾斜姿勢等、上記の傾斜姿勢以外の姿勢で配設することも可能である。   The present invention is not limited to the configuration of the above embodiment, and various modifications can be made. For example. In the said embodiment, although the brush parts 221 and 222 are provided in the position facing both the main surfaces of the board | substrate B, you may provide in any one main surface side. Further, the brush portions 221 and 222 are arranged in such a posture that the tip 50H is inclined with respect to the main surface of the substrate B toward the conveyance direction side of the substrate B, but the tip 50H of the brush bristle bundle 50 is arranged. If the brush B is in contact with the main surface of the substrate B in a state of being bent along the main surface of the substrate B, the brush portions 221 and 222 are inclined substantially perpendicularly to the main surface of the substrate B or in the opposite direction. It is also possible to arrange in a posture other than the above-mentioned tilted posture, such as a tilted posture.

また、上記実施形態では、ブラシ部221,222がブラシ洗浄室2に適用される場合を例にして説明したが、このブラシ部221,222の適用はブラシ洗浄室2に限定されるものではなく、剥離処理や現像処理等の他の処理を行う処理室において、ブラシによる処理を行う場合にも適用可能である。   Moreover, in the said embodiment, although the case where the brush parts 221 and 222 were applied to the brush cleaning chamber 2 was demonstrated as an example, application of this brush part 221 and 222 is not limited to the brush cleaning chamber 2. The present invention can also be applied to a case where a process is performed with a brush in a processing chamber that performs other processes such as a peeling process and a developing process.

また、上記実施形態では、ブラシ洗浄室2において、ブラシ部221,222に対して処理液を、処理液供給ノズル231,232によって供給する構成を示したが、処理液をブラシ基部51の内部を通してブラシ部221,222の根元から基板Bに向けて供給する機構を設けてもよい。   In the above-described embodiment, the configuration in which the treatment liquid is supplied to the brush portions 221 and 222 by the treatment liquid supply nozzles 231 and 232 in the brush cleaning chamber 2 is shown. You may provide the mechanism supplied toward the board | substrate B from the base of the brush parts 221,222.

また、上記実施形態では、ブラシ洗浄室2は、前工程用の処理室と連接させる構成として説明したが、ブラシ部221,222が適用されるブラシ洗浄室2は、このようにものに限定されることなく、広く適用が可能である。例えば、洗浄装置単体として配置され、他の前工程用単体装置(エッチング装置等)で処理された基板を洗浄するような基板洗浄機構等に適用されるものであってもよい。   In the above embodiment, the brush cleaning chamber 2 has been described as being connected to the processing chamber for the previous process. However, the brush cleaning chamber 2 to which the brush portions 221 and 222 are applied is limited to the above. And can be widely applied. For example, it may be applied to a substrate cleaning mechanism or the like that is disposed as a single cleaning device and that cleans a substrate that has been processed by another single device for pre-process (such as an etching device).

また、上記実施形態では、揺動機構8により、ブラシ部221,222を所定方向に揺動させるようにしているが、この揺動機構8を設けずに本発明を構成することも可能である。   In the above-described embodiment, the brush portions 221 and 222 are swung in a predetermined direction by the swing mechanism 8. However, the present invention can be configured without providing the swing mechanism 8. .

本発明の一実施形態に係る基板処理装置に備えられる基板洗浄装置の概略を示す図である。It is a figure which shows the outline of the substrate cleaning apparatus with which the substrate processing apparatus which concerns on one Embodiment of this invention is equipped. 基板洗浄装置の薬液処理室に備えられるブラシ部及びその駆動機構を簡易的に示す構成図である。It is a block diagram which shows simply the brush part with which the chemical | medical solution process chamber of a board | substrate cleaning apparatus is equipped, and its drive mechanism. ブラシ取り付けベースを往復運動させる揺動機構の概略を示す平面図である。It is a top view which shows the outline of the rocking | fluctuation mechanism which reciprocates a brush attachment base. ブラシ部の側断面図である。It is a sectional side view of a brush part. 基板に対するブラシ部及び処理液供給ノズルの配置を示す側面図である。It is a side view which shows arrangement | positioning of the brush part with respect to a board | substrate, and a process liquid supply nozzle. 基板に対するブラシ部及び処理液供給ノズルの配置を示す側面図であって、基板が無い状態を示すものである。It is a side view which shows arrangement | positioning of the brush part and process liquid supply nozzle with respect to a board | substrate, Comprising: The state without a board | substrate is shown. ブラシ部及び処理液供給ノズルがそれぞれ複数配設された状態を示す側面図である。It is a side view which shows the state by which multiple brush parts and process liquid supply nozzles are each arrange | positioned. ブラシ部の他の実施形態を示す側断面図である。It is a sectional side view which shows other embodiment of a brush part. 他の実施形態に係るブラシ部及び処理液供給ノズルの配置を示す側面図である。It is a side view which shows arrangement | positioning of the brush part and process liquid supply nozzle which concern on other embodiment.

符号の説明Explanation of symbols

1 基板処理装置
2 薬液処理室
3 リンス室
4 エアナイフ室
8 揺動機構
9 処理液供給部
10 基板洗浄装置
21,31 搬送ローラ
32,33 リンス液供給ノズル
50 ブラシ毛束
50H 先端
51 ブラシ基部
52 巻付軸
221,222 ブラシ部
231,232 処理液供給ノズル
B 基板
DESCRIPTION OF SYMBOLS 1 Substrate processing apparatus 2 Chemical solution processing chamber 3 Rinse chamber 4 Air knife chamber 8 Oscillating mechanism 9 Processing liquid supply part 10 Substrate cleaning apparatus 21, 31 Conveyance roller 32, 33 Rinse liquid supply nozzle 50 Brush hair bundle 50H Tip 51 Brush base 52 Winding Attached shafts 221 and 222 Brush portions 231 and 232 Processing liquid supply nozzle B Substrate

Claims (10)

基板を支持する支持手段と、
基部と、当該基部から延びる多数の毛からなる毛束とを有するブラシと、
前記支持手段に支持された基板の主面に、前記ブラシの毛束の先端部を、当該毛束が延びる方向から前記基板の主面に沿わせて一方向に曲げた状態として、当該先端部を前記基板の主面に摺接させる摺接手段と
を備える基板処理装置。
A support means for supporting the substrate;
A brush having a base and a hair bundle composed of a plurality of hairs extending from the base;
The tip portion of the bristles of the brush supported on the main surface of the substrate supported by the support means is bent in one direction along the main surface of the substrate from the direction in which the bristles extend. A substrate processing apparatus comprising: sliding contact means for slidingly contacting the main surface of the substrate.
前記ブラシは、第1方向に延びる棒状とされ、
前記第1方向と交差する第2方向に、前記基板を前記ブラシに対して相対的に搬送する搬送手段をさらに備え、
前記搬送手段により前記第2方向に沿って前記ブラシに対して相対的に搬送される前記基板の主面に対して、前記摺接手段は、前記ブラシの毛束の先端部を前記基板の相対搬送方向の下流側に向けて曲げた状態として、前記ブラシを前記第1方向に沿って往復移動させつつ前記基板の主面に摺接させる請求項1に記載の基板処理装置。
The brush has a rod shape extending in the first direction,
Transporting means for transporting the substrate relative to the brush in a second direction intersecting the first direction;
With respect to the main surface of the substrate that is conveyed relative to the brush along the second direction by the conveying means, the sliding contact means moves the tip of the bristle bundle of the brush relative to the substrate. The substrate processing apparatus according to claim 1, wherein the brush is slidably contacted with the main surface of the substrate while being reciprocated along the first direction as a state bent toward the downstream side in the transport direction.
前記摺接手段は、前記ブラシの毛束の先端部が前記基板の相対搬送方向の下流側に向かうように、前記ブラシを傾斜させて支持しつつ、前記ブラシを前記基板の主面に摺接させる請求項2に記載の基板処理装置。   The sliding contact means slides the brush against the main surface of the substrate while tilting and supporting the brush so that the tip of the bristle bundle of the brush is directed downstream in the relative transport direction of the substrate. The substrate processing apparatus according to claim 2. 前記第2方向に沿って、複数の前記ブラシが並列に配置されている請求項2又は請求項3に記載の基板処理装置。   The substrate processing apparatus according to claim 2, wherein the plurality of brushes are arranged in parallel along the second direction. 前記支持手段に支持された前記基板の両方の主面側に、複数の前記ブラシがそれぞれ配置されている請求項3又は請求項4に記載の基板処理装置。   The substrate processing apparatus of Claim 3 or Claim 4 with which the said some brush is each arrange | positioned at the both main surface sides of the said board | substrate supported by the said support means. 前記支持手段に支持された前記基板の両方の主面側に複数の前記ブラシが互いに対向配置され、かつ、前記支持手段に前記基板が支持されていないときに、当該対向配置された前記各ブラシの先端部が互いに当接するように前記各ブラシが配置されるとともに、前記支持手段に前記基板が支持されていないときに、前記摺接手段によって対向配置された前記各ブラシの先端部を互いに摺接させる請求項5に記載の基板処理装置。   The plurality of brushes arranged opposite to each other when the plurality of brushes are arranged opposite to each other on both main surface sides of the substrate supported by the support means, and the substrate is not supported by the support means. The brushes are arranged so that the tips of the brushes come into contact with each other, and when the substrate is not supported by the support means, the tips of the brushes arranged to face each other are slid against each other. The substrate processing apparatus of Claim 5 made to contact. 前記ブラシの毛束の先端部が形成する平面が、毛束が曲げられるべき一方向に向かって前記支持手段に支持された前記基板の主面に近づく傾斜面とされている請求項1乃至請求項6のいずれかに記載の基板処理装置。   The plane formed by the tip of the bristle bundle of the brush is an inclined surface that approaches the main surface of the substrate supported by the support means in one direction in which the bristle bundle is to be bent. Item 7. The substrate processing apparatus according to Item 6. 前記基板の主面に摺接して曲がった状態となっている前記ブラシの毛束の先端部に向けて処理液を供給する処理液供給手段をさらに有する請求項1乃至請求項7のいずれかに記載の基板処理装置。   The processing liquid supply means for supplying a processing liquid toward the tip of the bristle bundle of the brush which is in a state of being bent in sliding contact with the main surface of the substrate. The substrate processing apparatus as described. 前記ブラシの基部から延びる多数の毛からなる毛束の先端部を、前記基板の主面に沿うように一方向に曲げた状態で、前記先端部を前記基板の主面に摺接させて基板を処理する基板処理方法。   In a state in which the tip of the hair bundle consisting of a large number of hairs extending from the base of the brush is bent in one direction along the main surface of the substrate, the tip is brought into sliding contact with the main surface of the substrate. A substrate processing method for processing. 前記基板の主面に摺接して曲がった状態となっている前記ブラシの毛束の先端部に向けて処理液を供給する請求項9に記載の基板処理方法。   The substrate processing method according to claim 9, wherein the processing liquid is supplied toward a tip end portion of the bristle bundle of the brush that is in a state of being bent in sliding contact with the main surface of the substrate.
JP2004378338A 2004-12-27 2004-12-27 Substrate processing equipment Expired - Fee Related JP4387938B2 (en)

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CN200510128972XA CN1814357B (en) 2004-12-27 2005-12-02 Substrate processing apparatus and substrate processing method
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CN113786122A (en) * 2021-09-13 2021-12-14 广东电网有限责任公司 Clean dust extraction of power distribution room
CN113786122B (en) * 2021-09-13 2022-06-14 广东电网有限责任公司 Clean dust extraction of power distribution room
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