JP2006030042A - Orientation measuring method and orientation measuring apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To process a signal by irradiating an object to be measured such as a sheet-like film from an oblique direction and receiving the reflected light by a plurality of light receiving elements to measure the orientation. Provided are an orientation measuring method and an orientation measuring apparatus having a configuration with fewer / D converters and the like.
An orientation measuring apparatus includes: a light emitting means for irradiating a light to be measured from a light emitting element provided at a position having a predetermined angle away from the measured object; And a light receiving means provided at a position along an arc shape where the light beam irradiated from the means is reflected by the object to be measured and receives the reflected light beam, and the light receiving means is the object to be measured. A plurality of light receiving elements for receiving the reflected light beam are provided.
[Selection] Figure 1

Description

  The present invention relates to an orientation measurement method and an orientation measurement device, and more particularly to an orientation measurement method and an orientation measurement device that measure the orientation of a sheet member such as a fiber or a film using a light waveguiding effect.

In the fiber orientation meter in the prior art, as shown in FIG. 7, the light source 111 is an LED, a laser, or the like installed substantially perpendicular to the paper to be measured 112, and the light source 111 using the condenser lens 113. The light emitted from is condensed on paper (object to be measured 112). The light receiving element 114 is a plurality of, for example, 8 to 12 light receiving diodes with the light source 111 as the center, and receives the reflected light of the paper and converts it into an electrical signal. For example, the reflection angle formed with the optical axis When θ is selected from 40 to 65 degrees, preferably 55 degrees, the orientation direction can be measured with high accuracy.
The light receiving element holding portion 115 holds a ring-shaped flange 116 that engages with the mounting position of the protective glass of the sensor housing, a light receiving element mounting hole 117 provided for each light receiving element 114, and a condenser lens 113. A lens mounting hole 118 is provided. The light source holding part 119 is fixed to the light receiving element holding part 115 concentrically with the lens mounting hole 118, and holds the light source 111 in a predetermined posture.

FIG. 8 is a plan view of the light receiving element holding unit 115. Here, the positioning part 120 is formed by cutting out a part of the flange part 116 to uniquely determine the mounting angle of the light receiving element holding part 115 with respect to the sensor housing.
The fixing hole 121 is provided in the flange portion 116, and fixes the light receiving element holding portion 115 to the sensor housing with a screw or the like. Here, twelve light receiving element mounting holes 117 are provided, and the light receiving element fixing holes 122 are provided one-on-one. The light receiving element fixing hole 122 is used, for example, for screwing a printed board on which the light receiving element 114 is mounted to the light receiving element holding portion 115. The upper outer peripheral portion 123 is a cylindrical portion provided concentrically with the lens mounting hole 118, and a light source holding portion 119 (see FIG. 7) is fixed to the upper outer peripheral portion 123.
The light receiving element holding portion 115 is integrated into a module by resin molding, metal casting, or the like. When the module is integrally formed by resin molding, metal casting, or the like in this manner, the light receiving element mounting holes 117 are accurately molded, so that the arrangement angle of each light receiving element 114 with respect to the optical axis can be accurately mounted as designed.

In the orientation meter having such a configuration, a light receiving element that irradiates light on the paper surface of the measurement object 112 from the light source 111 in the vertical direction, and reflects light on the paper surface along the optical axis irradiated from the light source 111. 114 is used to measure the distribution of reflected light.
The distribution of reflected light is A / D converted from signals obtained from the respective light receiving elements 114 and used for calculation.
In order to ensure accuracy, eight or more light receiving elements are considered good. Actually, FIG. 9 provided with twelve light receiving elements shows the configuration. The converted signal is input as an element signal 124 to the A / D converter 125 for each light receiving element. After the light distribution is measured by the distribution measuring means 126, the orientation calculating means 127 calculates the orientation direction. Measurement value is output.
JP-A-3-214202 (page 7, Fig. 1)

However, in the configuration of the orientation meter described in the prior art, a large number of light receiving elements are required to maintain accuracy, and thus it is necessary to prepare A / D converters corresponding to the number of elements.
In this case, the cost of the A / D converter is high, and the volume of the parts is increased, so that it is difficult to satisfy the demand for downsizing.

  Therefore, there is a problem to be solved that it is possible to quickly measure the molecular orientation of the film and the filler orientation in the plastic, to reduce the cost of components including the A / D converter, and to reduce the volume of the components. .

  In order to solve the above problems, the orientation measuring method and orientation measuring apparatus of the present invention are configured as follows.

(1) An orientation measurement method is a method in which a light beam is emitted from a light emitting element provided at a position away from a vertical direction with respect to a measurement object, and the measurement object is irradiated with the light beam. The reflected light reflected by the light is captured by a plurality of light receiving elements arranged opposite to the light emitting element and reflected, and the orientation of the object to be measured is determined from the intensity of the reflected light captured by the plurality of light receiving elements. This is to calculate the characteristics.
(2) The orientation measuring method according to (1), wherein the plurality of light receiving elements are provided at positions along an arc.
(3) The reflecting position where the plurality of light receiving elements are arranged is located in a direction irradiated from the light emitting element and regularly reflected by the object to be measured (1) or (2) ) Orientation measuring method.
(4) The orientation measuring method according to (1), (2) or (3), wherein the plurality of light receiving elements are arranged in a semicircular arc shape at five light receiving elements.
(5) The orientation measurement method according to any one of (1) to (4), wherein the object to be measured is a sheet-like film.

(6) An orientation measuring apparatus includes: a light emitting unit that irradiates a light beam from a light emitting element provided at a position having a predetermined angle with respect to the object to be measured; And a light receiving means for receiving the reflected light beam. The light receiving means is disposed at a position facing the light emitting element, and the target object to be measured. A plurality of light receiving elements for receiving the light beam reflected by the object.
(7) The orientation measuring apparatus according to (6), wherein the plurality of light receiving elements are provided at positions along an arc.
(8) (6) or (7), wherein the plurality of light receiving elements are arranged in a direction irradiated from the light emitting elements and regularly reflected by the object to be measured. The orientation measuring apparatus described.
(9) The orientation measuring apparatus according to (6), (7), or (8), wherein the plurality of light receiving elements are arranged in a semicircular arc shape at five light receiving elements.
(10) The orientation measuring apparatus according to any one of (6) to (9), wherein the object to be measured is a sheet-like film.

  The orientation measuring method and orientation measuring apparatus of the present invention emit light from an oblique direction with respect to an object to be measured, and receive the reflected light reflected by the plurality of light receiving elements arranged in the opposing oblique directions. Since at least the number of light receiving elements does not need to be arranged around the light emitting elements as in the conventional case, the absolute number can be reduced, and the number of parts such as A / D converters can be reduced correspondingly. Can be achieved.

  Hereinafter, embodiments of an orientation measuring method and an orientation measuring apparatus according to the present invention will be described in detail with reference to the drawings.

As shown in FIG. 1, the orientation measuring apparatus that can embody the orientation measuring method of the present invention emits light from a position having a predetermined angle with respect to the object 14 to be measured. A light emitting means having an element 11 and a light receiving means for reflecting a light beam irradiated from the light emitting means by the measurement object 14 and receiving the reflected light beam. A structure provided with a plurality of light receiving elements, in the embodiment, five light receiving elements 12a, 12b, 12c, 12d, and 12e, at positions where the light beams reflected by the measurement object 14 are substantially specularly reflected. It has become.
The light emitting element 11 is attached to the disk-like substrate 13 with an inclination, and is formed by attaching five light receiving elements 12a, 12b, 12c, 12d, and 12e in an arc shape at equal intervals on the opposing position of the substrate 13. ing. In this attachment state, the light-emitting element 11 is attached in a tilted state so as to irradiate a predetermined position of the measurement object 14 arranged at the lower position of the substrate 13 and is received at a position where the irradiated light is reflected. The elements 12a, 12b, 12c, 12d, and 12e are attached, and the light receiving elements 12a, 12b, 12c, 12d, and 12e are attached so as to be directed toward the reflecting positions.

Here, the irradiation light from the light emitting element 11 may use p-polarized light or s-polarized light according to the absorbance characteristics of the sample surface of the measurement object 14. For example, the reflective surface has a large absorbance for s-polarized light, which may help to increase the S / N ratio. Further, as a method for creating p-polarized light and s-polarized light, a deflecting plate may be added to the light emitting element, or a coherent light source such as a laser may be used.
Further, in order to average the light intensity distribution of the light source or increase the light intensity, a plurality of light emitting elements may be arranged in a direction generally facing the light receiving element, or a diffusion plate or the like may be applied as appropriate. The light receiving elements are arranged along an arc in the embodiment, but may be arranged linearly.
The light receiving element may be in the form of an array. The position range of the arrangement of the light receiving elements may be appropriately changed according to the degree of orientation and the irradiation / reflection angle of the light receiving / emitting elements.

As described above, when irradiating light, the object to be measured 14 is irradiated with light from a position inclined with respect to the object 14 to be measured. The concept of reflected light due to molecular orientation when 14 is a film will be described with reference to FIG.
First, since the molecular orientation of the film has the effect of an optical waveguide, the intensity distribution of reflected light is shifted in the molecular arrangement direction.
This is because when the light is irradiated along the molecular chain formed in parallel because the molecules are connected in a chain at a fixed interval in parallel, the molecules are irradiated. A light beam is guided by a chain of molecules and becomes a guided light diffused at least within a predetermined range. By measuring any of a plurality of reflected lights among the guided light diffused within the predetermined range, the orientation characteristic of the object to be measured can be measured.

  Further, the intensity shift of the reflected light will be described. As shown in FIG. 3, when a light beam is irradiated from a position having a predetermined angle in substantially the same direction with respect to a molecular orientation composed of molecular chains, the irradiation is performed. The light rays are diffused and guided within a predetermined range. As shown in FIG. 3, the reflected light having the strongest intensity among the diffused guided light is far from the position guided by the molecular orientation as compared with the incident light. It should shift to a position shifted compared to the light intensity. If the light receiving means is provided at this shifted position, the orientation characteristics can be measured.

Now, referring back to FIG. 1, the orientation is measured by the reflected light of the light emitted from the light emitting means. If necessary, each light receiving element 12a obtained from the light emitting element 11 with a reference plate placed on the reflecting surface in advance. , 12b, 12c, 12d, and 12e are measured, and the measured values are normalized so as to eliminate the sensitivity difference. For measurement to remove individual differences, it is preferable to prepare a non-oriented reference plate on the reflecting surface.
Based on the normalized measurement value, for example, approximation by a normal distribution as shown in the following formula (1) is performed, and the position x of the reflected light intensity distribution shown in FIG. 4 and the height or half width of the distribution are shown. Ask for.

When the object to be measured is a film, the molecular orientation has an optical wave guide (optical waveguide) effect, so that the intensity distribution of reflected light is shifted in the molecular orientation direction as shown in FIG. The height or half width of the intensity distribution reflects the strength of orientation, that is, the orientation index.
The strength of the orientation is large when the half width is small, and is small when the half width is large. Therefore, it is easy to understand the orientation index as an inverse of the half width. Further, when obtaining the orientation index as a function of the height of the intensity distribution, it is easy to understand if it is understood as a proportional function having an appropriate coefficient for the intensity.

Thus, the calculation of the orientation intensity and angle can be obtained from the intensity distribution of the reflected light. However, the method may be an approximation by a Lorentz curve or other methods in addition to a normalized distribution approximation by a Gaussian curve.

  The operation of the apparatus including the light emitting means and the light receiving means will be described below with reference to FIG. 1 and the flowchart shown in FIG.

  First, in order to calculate the individual difference of each light receiving element 12a, 12b, 12c, 12d, 12e, it is necessary to calibrate. For this calibration, a non-oriented reference plate is used, and light is emitted from the light emitting element 11 to the reference plate and irradiated (steps ST11 and ST12).

  Next, the reflected light is received by each of the light receiving elements 12a, 12b, 12c, 12d, and 12e and measured. Individual differences between the light receiving elements 12a, 12b, 12c, 12d, and 12e at this time are stored in the storage means (steps ST13 and ST14). This completes the calibration.

  Now, in actual measurement, first, the light-emitting element 11 is caused to emit light to the measurement target object 14 such as a sheet-like film, and the measurement target object 14 is irradiated (steps ST21 and ST22).

The reflected light of the light beam irradiated on the measurement object 14 is received and measured by the light receiving elements 12a, 12b, 12c, 12d, and 12e (step ST23).
Since the light receiving elements 12a, 12b, 12c, 12d, and 12e store individual differences at the time of calibration, they are normalized by the stored calibration values (step ST24).

Based on the normalized data, the reflected light distribution is calculated (step ST25).
Then, the orientation is measured by calculating the change of the distribution position and the magnitude of dispersion of the intensity distribution from the intensity distribution of the reflected light (step ST26).

  Next, an apparatus provided with the orientation measurement method having the above-described configuration will be described. As the apparatus, for example, a configuration of an apparatus as shown in FIG. 6 is considered.

The light emitting element 11 repeats pulse lighting by the light emitting circuit 15. In the embodiment, the pulse light emission output control of the light emitting element 11 is performed on the substrate having the light emitting circuit 15, but is not limited thereto, and may be performed on the CPU module 18 side, for example.

The reflected light of the light emitted from the light emitting element 11 is captured by a plurality of light receiving elements 12a, 12b, 12c, 12d, and 12e, and the light emitting circuit 15 removes the extraneous light component from the ON / OFF difference of the pulse light reception and analogizes it. The signal is taken into the A / D converter 17 as a signal.
Here, the directions in which the light emitting element 11 and the light receiving elements 12a, 12b, 12c, 12d, and 12e are directed do not have to be exactly the same. Depending on the optical waveguide characteristics of the sample to be measured 14, there is a distance that allows light to be guided between the irradiation position of the light irradiated to increase the waveguide path and the reflection position to which the light receiving element faces. It does not matter.

The A / D converted value is stored as data for each light receiving element.
The value obtained by A / D conversion in the CPU module 18 is normalized based on the data acquired using the non-oriented reference plate when calibrated in advance, and the reflector is reflected by the CPU module 18 based on the normalized value of each element signal. The distribution calculation is performed.

The measured values of the light receiving elements 12a, 12b, 12c, 12d, and 12e are approximated to, for example, a normal distribution, and the orientation angle is obtained from the position shift of the distribution intensity, and the orientation index is obtained from the half width of the intensity distribution.
The obtained orientation angle and orientation index are output to necessary equipment by a method such as digital data, analog data, or screen output.

  In this way, the orientation of the object 14 to be measured can be measured. This is measured offline, as in the conventional orientation measurement of a film. can do. This will help improve man-hours and yield.

Further, the S / N ratio is improved by attaching the light emitting element 11 and the light receiving elements 12a, 12b, 12c, 12d, and 12e in the regular reflection direction.
Furthermore, by receiving the reflected light of the light emitted from the inclined position, the number of light receiving elements themselves can be reduced. Specifically, conventionally, 8 or 12 is required. The number of light receiving elements of the present invention is five, so A / D conversion circuits can be reduced by that amount, and the number of I / O points is reduced, resulting in excellent cost performance. Can be manufactured.
In the case of a liquid crystal film as the object 14 to be measured, the molecular orientation directly affects the characteristics thereof, so that it is necessary to perform the orientation measurement and can be used for the orientation measurement.
In addition, in the insertion reaction of lithium into the carbon negative electrode, which is often used in battery electrode materials in recent years, it is considered effective to improve the negative electrode characteristics by clarifying the orientation characteristics of inert film and highly oriented pyrolytic graphite. ing. Useful for measuring this orientation characteristic.
In addition, in a multilayer film or the like formed using a molecular beam, investigating the characteristics of the orientation of molecules generated on the substrate surface leads to the examination of the characteristics of the thin film itself, and is useful for this orientation measurement.
When various fillers including fibers are mixed in the plastic in order to increase the strength of the plastic, the entanglement, direction and mixing of the filler greatly affect the strength characteristics. The degree of entanglement, direction, and mixing can be measured as an orientation, which helps to measure this type of characteristic value.

  By emitting light from the oblique direction to the object to be measured and receiving the reflected light by a plurality of light receiving elements arranged in opposing diagonal directions, at least the number of light receiving elements is as conventional. Since there is no need to arrange it around the light emitting element, the absolute number can be reduced, and the orientation measuring method and orientation measuring apparatus which are reduced in size by reducing the number of parts such as A / D converters accordingly. I will provide a.

It is explanatory drawing which showed the measurement part of the orientation measuring apparatus of this invention. It is explanatory drawing which showed the concept of the reflected light by molecular orientation similarly. It is explanatory drawing which showed the concept of the reflected light shift by molecular orientation. It is a graph for performing the approximation by normalization distribution similarly. 3 is a flowchart showing the operation of the apparatus. It is explanatory drawing which showed the example of a structure of the apparatus similarly. It is sectional drawing of the measurement part of the orientation meter in a prior art. It is a top view of the measurement part of the orientation meter in a prior art. It is explanatory drawing which showed the structure of the apparatus in a prior art.

Explanation of symbols

DESCRIPTION OF SYMBOLS 11 Light emitting element 12a Light receiving element 12b Light receiving element 12c Light receiving element 12d Light receiving element 12e Light receiving element 13 Substrate 14 Measurement object 15 Light emitting circuit 16 Light receiving circuit 17 A / D converter 18 CPU module.

Claims (10)

Irradiate a light beam from a light emitting element provided at a position where the vertical direction of the object to be measured is removed,
The reflected light reflected by the light beam applied to the object to be measured is captured by a plurality of light receiving elements arranged at positions that face and reflect the light emitting elements,
An orientation measurement method, wherein an orientation characteristic of an object to be measured is calculated from the intensity of reflected light captured by the plurality of light receiving elements.   The orientation measurement method according to claim 1, wherein the plurality of light receiving elements are provided at positions along an arc.   3. The orientation according to claim 1, wherein the reflection position where the plurality of light receiving elements are arranged is located in a direction that is irradiated from the light emitting element and is regularly reflected by the object to be measured. Measuring method.   The orientation measuring method according to claim 1, 2 or 3, wherein the plurality of light receiving elements are arranged in a semicircular arc shape.   The orientation measurement method according to claim 1, wherein the object to be measured is a sheet-like film. A light emitting means for irradiating a light beam from a light emitting element provided at a position having a predetermined angle with respect to the object to be measured and deviating from the vertical direction;
A light receiving unit configured to receive a light beam reflected from the object to be measured, and to receive the reflected light beam.
The orientation measuring apparatus according to claim 1, wherein the light receiving means includes a plurality of light receiving elements that are disposed at positions facing the light emitting elements and receive light rays reflected by the measurement object.   The orientation measuring apparatus according to claim 6, wherein the plurality of light receiving elements are provided at positions along an arc.   The orientation measuring device according to claim 6 or 7, wherein the position where the plurality of light receiving elements are arranged is located in a direction irradiated from the light emitting element and regularly reflected by the object to be measured. .   The orientation measuring apparatus according to claim 6, 7 or 8, wherein the plurality of light receiving elements are arranged in a semicircular arc-like position. The orientation measuring apparatus according to claim 6, wherein the object to be measured is a sheet-like film.

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