JP2004502931A - 試験品を試験する方法および装置 - Google Patents
試験品を試験する方法および装置 Download PDFInfo
- Publication number
- JP2004502931A JP2004502931A JP2002508052A JP2002508052A JP2004502931A JP 2004502931 A JP2004502931 A JP 2004502931A JP 2002508052 A JP2002508052 A JP 2002508052A JP 2002508052 A JP2002508052 A JP 2002508052A JP 2004502931 A JP2004502931 A JP 2004502931A
- Authority
- JP
- Japan
- Prior art keywords
- operating
- response
- test
- stimulation
- test article
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 45
- 238000000034 method Methods 0.000 title claims abstract description 20
- 238000012545 processing Methods 0.000 claims abstract description 16
- 238000006243 chemical reaction Methods 0.000 claims abstract description 8
- 230000004936 stimulating effect Effects 0.000 claims abstract 3
- 230000004044 response Effects 0.000 claims description 26
- 238000011156 evaluation Methods 0.000 claims description 7
- 230000000638 stimulation Effects 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000010998 test method Methods 0.000 description 3
- 230000002776 aggregation Effects 0.000 description 2
- 238000004220 aggregation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000010339 dilation Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000013213 extrapolation Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000007620 mathematical function Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D7/00—Indicating measured values
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2000131078 DE10031078A1 (de) | 2000-07-03 | 2000-07-03 | Verfahren und Vorrichtung zum Testen eines Prüflings |
| PCT/DE2001/002394 WO2002003035A1 (fr) | 2000-07-03 | 2001-06-28 | Procede et dispositif pour tester une ebauche |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2004502931A true JP2004502931A (ja) | 2004-01-29 |
Family
ID=7646842
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002508052A Pending JP2004502931A (ja) | 2000-07-03 | 2001-06-28 | 試験品を試験する方法および装置 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1299696A1 (fr) |
| JP (1) | JP2004502931A (fr) |
| DE (1) | DE10031078A1 (fr) |
| WO (1) | WO2002003035A1 (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003054487A1 (fr) * | 2001-12-11 | 2003-07-03 | Sz Testsysteme Ag | Procede et dispositif pour tester un echantillon |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4317199A (en) * | 1980-01-31 | 1982-02-23 | Tektronix, Inc. | Diagnostic extender test apparatus |
| DE3921093A1 (de) * | 1988-05-31 | 1991-01-03 | Brunner Wolfgang | Verfahren zum darstellen der ortsaufgeloesten verteilung von physikalischen groessen auf einer anzeige sowie vorrichtung zur durchfuehrung des verfahrens |
| DE3842636C2 (de) * | 1988-12-18 | 1999-01-21 | Betr Forsch Inst Angew Forsch | Verfahren zum Erzeugen einer Äquidensiten- oder einer Falschfarbendarstellung und dessen Anwendung zur Überprüfung von Bauteilen |
| US5610994A (en) * | 1995-05-03 | 1997-03-11 | The Gleason Works | Digital imaging of tooth contact pattern |
| US5982920A (en) * | 1997-01-08 | 1999-11-09 | Lockheed Martin Energy Research Corp. Oak Ridge National Laboratory | Automated defect spatial signature analysis for semiconductor manufacturing process |
| JP3887660B2 (ja) * | 1997-07-11 | 2007-02-28 | エーユー オプトロニクス コーポレイション | 液晶表示装置の検査システム及び検査方法 |
| DE19740024C1 (de) * | 1997-09-11 | 1999-03-11 | Siemens Ag | Berührungsloses Prüfverfahren für Schweißpunkte |
| US5864730A (en) * | 1998-04-06 | 1999-01-26 | Xerox Corporation | Photoreceptor seam signature |
-
2000
- 2000-07-03 DE DE2000131078 patent/DE10031078A1/de not_active Withdrawn
-
2001
- 2001-06-28 JP JP2002508052A patent/JP2004502931A/ja active Pending
- 2001-06-28 WO PCT/DE2001/002394 patent/WO2002003035A1/fr not_active Ceased
- 2001-06-28 EP EP01984084A patent/EP1299696A1/fr not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| WO2002003035A1 (fr) | 2002-01-10 |
| DE10031078A1 (de) | 2002-05-02 |
| EP1299696A1 (fr) | 2003-04-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5032727A (en) | Product defect detection using thermal ratio analysis | |
| US8278961B2 (en) | Test apparatus and test method | |
| CN109272948B (zh) | 基于机器学习的电子纸驱动调试方法、装置及计算机设备 | |
| JP2516536B2 (ja) | 信号特性表示方法 | |
| JP2019050376A (ja) | 試験方策を生成する方法およびそのシステム | |
| EP1361446A3 (fr) | Méthode et dispositif de génération de programmes de test électronique et d'une structure de données | |
| CN109425786A (zh) | 非线性失真检测 | |
| TWI418826B (zh) | 裝置之獲取測試資料 | |
| CN107068027A (zh) | 液晶显示面板、液晶显示面板检测系统及方法 | |
| US4951141A (en) | Method of determining the transmission function of a video camera | |
| US5107205A (en) | Semiconductor device tester with a test waveform monitoring circuit | |
| JPH03103770A (ja) | 信号解析方法 | |
| JP2004502931A (ja) | 試験品を試験する方法および装置 | |
| CN110998613A (zh) | 用于测量感知变量的值的系统和方法 | |
| CN100399033C (zh) | 表面映像和3-d参数分析 | |
| CN114333736B (zh) | 显示装置和显示装置的亮度调节方法 | |
| CN104427210B (zh) | 一种随机异常闪烁点检测方法及装置 | |
| CN106488312B (zh) | 视频源的检测方法及装置 | |
| JP2018116672A (ja) | 情報処理装置、情報処理方法およびプログラム | |
| KR100222985B1 (ko) | 비디오보드 검사용 화면표시방법 | |
| JPH06324118A (ja) | 半導体集積回路の試験装置 | |
| JP2019056591A (ja) | 外観検査装置及び外観検査方法 | |
| CN117607943B (zh) | 一种模拟放射源核信号的质检仪 | |
| CN111337813B (zh) | 可控硅耐量测试装置及方法 | |
| JPH102937A (ja) | Ｉｃ試験装置 |