JP2004163364A - Probe and contact device using the same - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To reduce the price of a probe 1 and that of a contact device 4 by cutting down the number of components constituting the probe 1 used for the contact device 4. <P>SOLUTION: What is used as this probe 1 is formed out of a conductive material into a coil shape and is formed so that both end parts thereof extend along their own center axis. It is preferable to form the tips of the both end parts into pointed shapes. This contact device 4 is structured so that the probe 1 is held in probe holding holes 6 of probe holding boards 5 in which the plurality of holding holes 6 for folding the probe 1 are disposed so that its both end parts project or come out from both upper and lower surfaces but do not drop off. The probe 1 is adapted so as to shrink with both the end parts pressed by two contacted bodies (an insulated conductor 8 of a coated code 7 and a wiring film 10 of a printed circuit board 9), thereby storing elastic force necessary for electrical connection to the contacted bodies. <P>COPYRIGHT: (C)2004,JPO

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a probe for electrically connecting each electrode, each wiring portion, and a measurement circuit for testing, measuring, testing, and measuring characteristics, performance, and the like of electronic components such as ICs and printed wiring boards. And a contact device using the probe.
[0002]
[Prior art]
For testing and measuring electronic components, for example, ICs, printed wiring boards, etc., characteristics, performance, etc., by electrically connecting each electrode, each wiring portion and a measuring circuit, each electrode, It is necessary to electrically lead each wiring film to its measurement circuit. Then, a contact device is used for electrically leading out each wiring film, electrode, and the like. This type of contact device has a large number of probes on a plate, one end of each probe is brought into contact with a portion to be electrically connected to a measurement circuit such as each wiring film of a printed circuit board, and the other end is connected to the measurement circuit. Many are designed to come into contact with the end of the cord. In this regard, the present applicant has made various proposals in Japanese Patent Application Nos. 7-61728, 8-183449, 10-66333, and 2001-139420.
[0003]
FIG. 3 is a cross-sectional view showing one conventional example of such a contact device. a is a probe holding board, which is formed by stacking a plurality of plates a1, a2, a3, a4, and a5. Reference symbol b denotes a holding hole formed in the probe holding board a, and the holding holes b1, b2, b3, b4, and b5 formed in the stacked plates a1, a2, a3, a4, and a5 communicate with each other. . c is a coil spring made of a conductive material, d is a probe body made of a conductive material, and the probe is composed of the probe body d and the coil spring c, that is, a probe is composed of a plurality of components. The pointed ends of the probe main body d are held at the portions b2, b3, b4, and b5 in such a manner that they protrude from the upper surface of the probe holding board a and are prevented from falling off.
[0004]
Reference numeral e denotes a coating cord for electrically connecting the probe and a measuring circuit (not shown). The core wire f is stripped of the coating, passed through the hole b1 of the plate a1, and fixed to the probe holding board a. The distal end surface of the core wire f is located on substantially the same plane as the upper surface of the plate a1, and the sharp lower end of the coil spring c is in contact with the distal end surface. g is an object to be inspected such as an IC, for example, and f is an electrode thereof, for example.
[0005]
At the time of inspection, the object g to be inspected faces the probe holding board a by aligning each electrode f with its corresponding probe so that the electrode h side faces downward, and faces the probe holding board a. Is pressed downward by the pressure of Then, each probe body d is moved downward, and the coil spring c stores the elasticity of contracting and expanding. The elastic force makes the probe body d and the electrode h and the coil spring c and the core wire f of the sheathed cable e elastically contact with each other, so that a good electrical connection state can be formed therebetween.
[0006]
[Problems to be solved by the invention]
By the way, the conventional contact device as shown in FIG. 3 can be said to be the result of efforts to simplify the shape and reduce the number of parts by repeatedly improving to meet the demand for lower price. The demand for lower prices has never stopped, and further lower prices are being demanded.
[0007]
Therefore, the inventor of the present application sought to reduce the cost of the probe in order to meet the demand. This is because the number of pins, the number of electrodes, the degree of integration, etc. of ICs and printed wiring boards are increasing, and the number of probes required by one contact device is steadily increasing. If the price per contact can be reduced, the price of the contact device can be reduced by a number of times the number of probes at the reduced cost per probe.
[0008]
The inventor of the present application has proposed that the probe used in the conventional contact device as shown in FIG. 3 requires a coil spring c in addition to the probe body d. I got the idea that the number of parts could be reduced by half.
The present invention has been made as a result of further prototyping on the basis of such an idea, and reduces the number of parts of a probe used in a contact device, reduces the cost of the probe, and It is another object of the present invention to reduce the cost of a contact device using a probe.
[0009]
[Means for Solving the Problems]
The probe according to claim 1 is formed in a coil shape from a conductive material.
[0010]
Therefore, according to the probe of the first aspect, since the probe has a coil shape, one end thereof comes into contact with one contact body and the other end comes into contact with the other contact body, and shrinks when pressed from both contact bodies. Stores the elasticity of trying to expand. That is, the probe itself serves as a coil spring, and the stored elasticity brings the two ends into elastic contact with each other. Therefore, a favorable electrical connection state can be formed during that time.
Since the coil spring itself is used, there is no need to provide a separate spring for elastic contact, the probe can be formed only of a coiled conductor, and the number of parts of the probe can be reduced.
[0011]
A probe according to a second aspect of the present invention is the probe according to the first aspect, wherein both end portions extend along its own central axis.
Therefore, according to the probe of the second aspect, since both end portions extend along the center axis of the probe itself, the probe can be vertically contacted with the contact surface of the contacted body, and good contact can be achieved.
A probe according to a third aspect of the present invention is the probe according to the first or second aspect, characterized in that the end surfaces of both end portions extending along the center axis of the probe are pointed. Therefore, according to the probe of the third aspect, since the contact with the contacted body can be made at the pointed portion of the tip end surface, the contact can be made more favorably, and the probe and the contacted body can be extended. Good electrical connection with the device.
[0012]
A contact device according to claim 4, wherein a probe holding board is provided with a plurality of probes according to claim 1 and a plurality of probe holding holes for holding the probes so that both end portions project or expose on both upper and lower surfaces and do not fall off. The probe is characterized in that both ends are pressed and shrunk by two contacted bodies to store elasticity required for electrical connection with the contacted body.
[0013]
Therefore, according to the contact device of claim 4, since the probe of claim 1 is used, the effect of the probe of claim 1 can be enjoyed, and the price of the contact device can be further reduced.
[0014]
BEST MODE FOR CARRYING OUT THE INVENTION
In the present invention, a probe formed of a coil made of a conductive material is basically used as a probe of a contact device, but it is preferable that the probe has a shape in which both ends extend along its own central axis. Good. This is because the probe can resiliently contact the surface of the body to be contacted perpendicularly, and good electrical contact can be obtained.
Furthermore, it can be said that it is more preferable that both end portions of the probe have sharp end surfaces. This is because the contact with the contacted body can be made at the pointed portion of the distal end surface, so that the contact can be made better, and the electric contact between the probe and the contacted body can be extended. This is because good connectivity can be achieved.
[0015]
【Example】
Hereinafter, the present invention will be described in detail with reference to illustrated embodiments. FIG. 1 is a perspective view showing a first embodiment of the probe of the present invention.
In the figure, reference numeral 1 denotes a probe, which is made of a conductive material formed in a coil shape, for example, a metal. Reference numeral 2 denotes one end (lower end) of the probe 1 which is formed so as to extend along the central axis of the probe 1 itself, and has a tip surface 2a which is finished in a conical shape and sharpened.
The other end (upper end) 3 of the probe 1 is formed so as to extend along the center axis of the probe 1 itself, and the tip surface 3a is finished in a conical shape and sharpened.
[0016]
FIG. 2 is a sectional view showing a contact device (first embodiment of the contact device of the present invention) 4 using a large number of probes 1 shown in FIG. Although FIG. 2 shows only a portion of the contact device 4 that holds one probe 1, in actuality, one contact device 4 holds tens to thousands of probes 1. ing.
Reference numeral 5 denotes a probe holding board, which is formed by stacking a plurality of plates 5a, 5b, 5c, and 5d. Reference numeral 6 denotes a holding hole formed in the probe holding board 5, and the holding holes 6a, 6b, 6c, 6d formed in the superposed plates 5a, 5b, 5c, 5d communicate with each other.
[0017]
The probe 1 is housed in the holding hole 6c of the plate 5c except for the upper end 3 extending in the axial direction of the probe 1, the base of the upper end 3 is housed in the holding hole 6d of the plate 5d, and the tip of the upper end 3 is the probe. It is projected upward from the upper surface of the holding board 5. Then, the step between the upper end 3 of the probe 1 and the portion below it engages with the downward step formed between the holding holes 6d and 6c, so that the probe 1 can be pulled out upward. Is being blocked.
[0018]
Further, the holding hole 6c has a shape in which the upper part is larger in diameter than the lower part and an upward step is formed therebetween, and the step between the upper part and the step engages this step. As a result, the probe 1 is prevented from falling down.
[0019]
Reference numeral 7 denotes a coating cord for electrically connecting the probe 1 to a measurement circuit (not shown). The core wire 8 is stripped of the coating, and the stripped portion is passed through the holding hole 6b of the plate 5b. The tip of the coating is passed through the holding hole 6a of the plate 5a and fixed to the probe holding board 4. The distal end surface of the core wire 8 is located on substantially the same plane as the upper surface of the plate 5b, and is in contact with the sharp distal end of the lower end 2 of the probe 1. Reference numeral 9 denotes an inspection object such as an IC, and reference numeral 10 denotes, for example, an electrode thereof.
[0020]
At the time of inspection, the inspection object 9 is positioned on the probe holding board 5 such that the electrodes 10 face downward and the electrodes 10 and the corresponding probes 1 are positioned so as to be in contact with each other. Is pressed downward by the pressure of Then, since each probe 1 is formed in a coil shape, it accumulates the elasticity of contracting and expanding according to the pressing force. The elasticity allows the probe 1 and the electrode 10 and the probe 1 and the core wire 8 of the sheathed cable 7 to be elastically contacted with each other, and a good electrical connection state can be formed therebetween.
[0021]
According to such a contact device 4, the probe 1 uses only one member made of a conductive material formed in a coil shape, and the probe 1 itself serves as a coil spring. Therefore, there is no need to provide a separate spring. Therefore, the number of parts of the probe can be reduced, and the cost of the contact device can be further reduced.
[0022]
【The invention's effect】
According to the probe of the first aspect, since the probe is formed in a coil shape, one end thereof comes into contact with one contact body, and the other end comes into contact with the other contact body. Stores the elasticity of trying to expand. In other words, the probe itself becomes a coil spring, and the stored elastic force allows the both ends and the two contacted members to be elastically contacted with each other so that a good electrical connection state can be formed therebetween. .
Since the coil spring itself is used, there is no need to provide a separate spring for elastic contact, the probe can be formed only of a coiled conductor, and the number of parts of the probe can be reduced.
[0023]
According to the probe of the second aspect, since both end portions extend along the center axis of the probe itself, the probe can be vertically contacted with the contact surface of the contacted body and can be satisfactorily contacted.
According to the probe of the third aspect, the contact with the contacted body can be made at a pointed portion of the tip end surface, so that the contact can be made more favorably, and further, the contact between the probe and the contacted body can be extended. Good electrical connectivity can be achieved.
[0024]
According to the contact device of claim 4, since the probe of claim 1 is used, the effect of the probe of claim 1 can be enjoyed, and the price of the contact device can be further reduced.
[Brief description of the drawings]
FIG. 1 is a perspective view showing a first embodiment of the probe of the present invention.
FIG. 2 is a cross-sectional view showing an example of a contact device using the probe according to the first embodiment of the present invention (first embodiment of the contact device of the present invention).
FIG. 3 is a sectional view showing a conventional example of a contact device.
[Explanation of symbols]
1 ... probe, 2, 3 ... both ends extending in the axial direction,
4 contact device, 5 probe holding board,
6 ... Probe holding hole.

Claims (4)

A probe made of a conductive material, having a coil shape and having both ends extending along its own central axis. The probe according to claim 1, wherein both ends extend along its own central axis. The probe according to claim 1 or 2, wherein the tip surfaces of both end portions extending along the center axis of the probe are pointed. A plurality of probes formed in a coil shape by a conductive material,
A probe holding board provided with a plurality of probe holding holes for holding the probe so that both ends thereof are projected or exposed on both upper and lower surfaces and do not fall off,
Has,
A contact device wherein each of the probes is pressed and shrunk at both ends by two contacted bodies to store elasticity required for electrical connection with the contacted body.

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