[go: up one dir, main page]

JP2003245861A - Polishing foam sheet and method for producing the same - Google Patents

Polishing foam sheet and method for producing the same

Info

Publication number
JP2003245861A
JP2003245861A JP2002044307A JP2002044307A JP2003245861A JP 2003245861 A JP2003245861 A JP 2003245861A JP 2002044307 A JP2002044307 A JP 2002044307A JP 2002044307 A JP2002044307 A JP 2002044307A JP 2003245861 A JP2003245861 A JP 2003245861A
Authority
JP
Japan
Prior art keywords
polishing
sheet
gas
resin
foaming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002044307A
Other languages
Japanese (ja)
Inventor
Yoshinori Masaki
義則 政木
Takeshi Furukawa
剛 古川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP2002044307A priority Critical patent/JP2003245861A/en
Publication of JP2003245861A publication Critical patent/JP2003245861A/en
Pending legal-status Critical Current

Links

Landscapes

  • Polishing Bodies And Polishing Tools (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Manufacture Of Porous Articles, And Recovery And Treatment Of Waste Products (AREA)
  • Molding Of Porous Articles (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

(57)【要約】 【課題】 層間絶縁膜や金属配線等の、半導体のデバイ
スウエハの表面平坦化加工に用いられる研磨パッドにお
いて、研磨性能ばらつきが小さく、研磨精度の高い、さ
らには環境に優しい研磨用発泡シート、およびその製造
方法を提供する。 【解決手段】 常温・常圧で気体状態のガスを発泡剤と
して、平均径が0.1μm以上、300μm未満である
気泡を発泡させた発泡シートであり、該シート中には砥
粒を含有することを特徴とする研磨用発泡シートであ
り、常温・常圧で気体状態のガスは二酸化炭素、窒素又
はそれらの混合ガスであり、シートを構成する原料の主
成分はポリウレタンであることが好ましい。
PROBLEM TO BE SOLVED: To provide a polishing pad used for flattening a surface of a semiconductor device wafer, such as an interlayer insulating film and a metal wiring, which has small polishing performance variation, high polishing accuracy, and is environmentally friendly. An abrasive foam sheet and a method for producing the same are provided. SOLUTION: This is a foamed sheet in which gas having a gaseous state at normal temperature and normal pressure is used as a foaming agent to foam bubbles having an average diameter of 0.1 μm or more and less than 300 μm, and the sheet contains abrasive grains. The polishing foam sheet is characterized in that the gas in a gaseous state at normal temperature and normal pressure is carbon dioxide, nitrogen or a mixed gas thereof, and the main component of the material constituting the sheet is preferably polyurethane.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、半導体、各種メモ
リーハードディスク用基板等の研磨に使用される研磨パ
ッドに関し、その中でも特に層間絶縁膜や金属配線等
の、半導体のデバイスウエハの表面平坦化加工に好適に
用いられる研磨パッドに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing pad used for polishing semiconductors, substrates for various memory hard disks and the like, and in particular, surface flattening of a semiconductor device wafer such as an interlayer insulating film and metal wiring. The present invention relates to a polishing pad that is preferably used in.

【0002】[0002]

【従来の技術】半導体のデバイスウエハの表面平坦化加
工に用いられる、代表的なプロセスである化学的機械的
研磨法(CMP)の一例を図1に示す。定盤(2)、試
料ホルダー(5)を回転させ、砥粒を含有する研磨スラ
リー(4)をスラリー供給用配管(10)を通して滴下
しながら、半導体ウエハ(1)を研磨パッド(6)表面
に押しあてることにより、研磨対象物の表面を高精度に
平坦化するというものである。なお研磨中、ドレッシン
グディスクホルダー(9)を回転させながら、ドレッシ
ングディスク(3)を研磨パッド(6)表面に押しあて
ることにより、研磨パッド(6)の表面状態を整えてい
る。研磨条件はもとより、研磨パッド(6)、ドレッシ
ングディスク(3)、研磨スラリー(4)、バッキング
材(11)およびウエハ固定用治具(8)等、各構成部
材の特性が、研磨速度、研磨後の平坦性および半導体ウ
エハ面内における均一性等に代表される研磨性能に影響
を及ぼすが、その中でも研磨パッド(6)と研磨スラリ
ー(4)および研磨スラリー中に含まれる砥粒の及ぼす
影響は極めて大きい。
2. Description of the Related Art FIG. 1 shows an example of a chemical mechanical polishing (CMP) which is a typical process used for surface flattening of a semiconductor device wafer. While rotating the platen (2) and the sample holder (5) and dropping the polishing slurry (4) containing abrasive grains through the slurry supply pipe (10), the semiconductor wafer (1) is placed on the polishing pad (6) surface. The surface of the object to be polished is flattened with high precision by pressing it against. During polishing, the surface state of the polishing pad (6) is adjusted by pressing the dressing disc (3) against the surface of the polishing pad (6) while rotating the dressing disc holder (9). Not only the polishing conditions, but also the polishing pad (6), the dressing disk (3), the polishing slurry (4), the backing material (11), the wafer fixing jig (8), and other characteristics of each component are the polishing rate and the polishing. The polishing performance represented by the subsequent flatness and the in-plane uniformity of the semiconductor wafer is affected. Among them, the influence of the polishing pad (6) and the polishing slurry (4) and the abrasive grains contained in the polishing slurry is exerted. Is extremely large.

【0003】従来から、研磨パッドは、例えば層間絶縁
膜や金属配線等を始めとする研磨対象の種類や研磨精度
の要求レベルに応じて、研磨層のみの単層又は研磨層と
クッション層を貼り合わせた積層構造のものが用いられ
てきたが、いずれの構造においても、研磨層としては、
大別して、例えばロデール社製のIC1000(商品
名)に代表される独立発泡体、又は砥粒を含有した、無
発泡の固定砥粒成形体等が使用されている。従来の独立
発泡体は、使用前、使用中におけるドレッシング、およ
び研磨の進行に伴う研磨パッド表面の摩耗により、気泡
が開口し、研磨スラリーの保持能力を発現するというも
のであった。様々な研磨スラリーと組み合わせて使用す
ることができ、汎用性が高いという点において標準的に
使用されてきた。ところが従来の独立発泡体において
は、例えば、気泡径、気泡密度、気泡の分布状態等に代
表される発泡状態のばらつきや樹脂架橋密度のばらつき
等に起因する発泡体自体の密度ばらつきが、研磨面内お
よび発泡体の厚み方向において存在しうるために、従来
の独立発泡体は、加工数量の増加に伴って研磨性能が変
動し、研磨精度がばらつくという問題を有していた。
Conventionally, a polishing pad has a single layer consisting of only a polishing layer or a polishing layer and a cushion layer, depending on the type of object to be polished such as an interlayer insulating film or metal wiring and the required level of polishing accuracy. Although a laminated structure having been combined has been used, in any structure, the polishing layer is
Broadly classified, for example, an independent foamed body represented by IC1000 (trade name) manufactured by Rodel, or a non-foamed fixed-abrasive molded body containing abrasive grains is used. In the conventional closed-cell foam, air bubbles are opened due to dressing before and during use, and abrasion of the polishing pad surface as the polishing progresses, so that the polishing slurry retaining ability is exhibited. It can be used in combination with various polishing slurries, and has been standardly used because of its high versatility. However, in the conventional closed-cell foam, for example, the density variation of the foam itself caused by the variation of the foaming state represented by the cell diameter, the cell density, the distribution state of the cells, the resin crosslink density, etc. Since it can exist inside and in the thickness direction of the foam, the conventional independent foam has a problem that the polishing performance varies with an increase in the number of processing, and the polishing accuracy varies.

【0004】一方、固定砥粒成形体においては、成形す
る段階で砥粒を混合分散し、あらかじめ固定してしまう
ことにより、例えば独立発泡体の密度ばらつきに起因す
る研磨性能の変動を抑える効果が期待できる。研磨パッ
ドの研磨層として固定砥粒成形体を使用する場合、基本
的に研磨スラリーは使用しない、又は砥粒を含まない砥
粒レスと呼ばれているスラリーを使用するが、砥粒入り
の研磨スラリーを用いる場合と比べて、例えば、砥粒の
絶対量が不足し、研磨レートがでない、又は脱落した砥
粒が原因となり、加工面にスクラッチと呼ばれるミクロ
ンレベルの傷が入る等の問題があった。
On the other hand, in the fixed-abrasive molding, the abrasive particles are mixed and dispersed at the stage of molding and fixed in advance, which has the effect of suppressing fluctuations in polishing performance due to, for example, variations in density of the independent foam. Can be expected. When using a fixed-abrasive compact as the polishing layer of the polishing pad, basically no polishing slurry is used, or a slurry called abrasive-less containing no abrasive is used, but polishing with abrasive is used. Compared to the case of using a slurry, for example, there is a problem that the absolute amount of the abrasive grains is insufficient, the polishing rate is low, or the dropped abrasive grains cause the scratches at the micron level called scratches on the processed surface. It was

【0005】エレクトロニクス業界の最近の著しい発展
により、トランジスター、IC、LSI、超LSIと進
化してきている。これら半導体素子における回路の集積
度が急激に増大するにつれて、半導体デバイスのデザイ
ンルールは、年々微細化が進み、デバイス製造プロセス
での焦点深度は浅くなり、パターン形成面の平坦性はま
すます厳しくなってきている。それに伴い、今後、CM
Pに求められる研磨精度もますます高まり、研磨パッド
に要求される研磨性能レベルも併せて高まっていくこと
は必至であることから、従来パッドの問題点を克服し、
高精度な研磨を実現できる研磨パッドの出現が大望され
ている。
Due to the recent remarkable development of the electronics industry, it has evolved into transistors, ICs, LSIs and VLSIs. As the degree of integration of circuits in these semiconductor elements has rapidly increased, the design rules of semiconductor devices have become finer year by year, the depth of focus in the device manufacturing process has become shallower, and the flatness of the pattern formation surface has become more and more strict. Is coming. Along with that, CM in the future
Since the polishing accuracy required for P is further increased and the polishing performance level required for the polishing pad is inevitably increased, the problems of the conventional pad are overcome,
The advent of polishing pads that can achieve highly accurate polishing is highly desired.

【0006】[0006]

【発明が解決しようとする課題】本発明は、従来の独立
発泡体を用いた研磨パッドの、例えば研磨性能ばらつき
の問題、又は固定砥粒成形体を用いた研磨パッドの、例
えば砥粒の脱落等によるスクラッチの問題等を解決する
ためのもので、その目的とするところは、研磨パッドの
研磨層として用いた場合において、高精度の研磨性能を
安定に発現し、さらには環境に優しい研磨用発泡シー
ト、およびその製造方法を提供することにある。
SUMMARY OF THE INVENTION The present invention is directed to a conventional polishing pad using an independent foam, for example, a problem of variations in polishing performance, or a polishing pad using a fixed-abrasive compact, for example, dropping of abrasive grains. It is intended to solve the problem of scratches due to the like, and its purpose is to provide stable, high-precision polishing performance when used as the polishing layer of a polishing pad, and for environmentally friendly polishing. It is to provide a foamed sheet and a manufacturing method thereof.

【0007】[0007]

【課題を解決するための手段】本発明者らは、前記従来
の問題点を鑑み、鋭意検討を重ねた結果、以下の手段に
より、本発明を完成するに至った。すなわち本発明は、
(1) 常温・常圧で気体状態のガスを発泡剤として、
平均径が0.1μm以上、300μm未満である気泡を
発泡させた発泡シートであり、該シート中には砥粒を含
有することを特徴とする研磨用発泡シート、(2) 常
温・常圧で気体状態のガスが二酸化炭素、窒素又はそれ
らの混合ガスである(1)項記載の研磨用発泡シート、
(3) シートを構成する原料の主成分がポリウレタン
である(1)又は(2)項記載の研磨用発泡シート、
(4) シートを構成する原料の主成分が、ポリウレタ
ンとフッ素樹脂との共重合体、及び/又はポリウレタン
とフッ素樹脂との混合体である(1)又は(2)項記載
の研磨用発泡シート、(5) アクリル変性を施したフ
ッ素樹脂を必須成分とする(1)〜(4)いずれか1項
に記載の研磨用発泡シート、(6) 常温・常圧で気体
状態のガスを、高温・高圧下で樹脂に溶解及び/又は樹
脂と混合した後、該樹脂を溶解及び/又は混合時の圧力
より低い圧力雰囲気下に曝すことにより(1)〜(5)
のいずれか1項に記載の研磨用発泡シートを得ることを
特徴とする研磨用発泡シートの製造方法、(7) 高温
・高圧下が、そのガスの超臨界状態である、(6)項記
載の研磨用発泡シートの製造方法である。
DISCLOSURE OF THE INVENTION The inventors of the present invention have made extensive studies in view of the problems of the prior art, and as a result, have accomplished the present invention by the following means. That is, the present invention is
(1) As a foaming agent, a gas in a gaseous state at room temperature and pressure is used.
A foaming sheet obtained by foaming bubbles having an average diameter of 0.1 μm or more and less than 300 μm, wherein the sheet contains abrasive grains, (2) at room temperature and atmospheric pressure The foamed sheet for polishing according to the item (1), wherein the gas in a gaseous state is carbon dioxide, nitrogen or a mixed gas thereof.
(3) The foaming sheet for polishing according to the item (1) or (2), wherein the main component of the raw material constituting the sheet is polyurethane.
(4) The foaming sheet for polishing according to the item (1) or (2), wherein the main component of the raw material constituting the sheet is a copolymer of polyurethane and fluororesin and / or a mixture of polyurethane and fluororesin. , (5) A foaming sheet for polishing according to any one of (1) to (4), which comprises an acrylic-modified fluororesin as an essential component, (6) a gas in a gaseous state at room temperature and atmospheric pressure, and a high temperature. -(1) to (5) by dissolving in a resin under high pressure and / or mixing with a resin, and then exposing the resin to a pressure atmosphere lower than the pressure at the time of dissolving and / or mixing
(7) A method for producing a foaming sheet for polishing, comprising: obtaining the foaming sheet for polishing according to any one of (1) to (6), wherein the gas is in a supercritical state under high temperature and high pressure. Is a method for producing a foam sheet for polishing.

【0008】[0008]

【発明の実施の形態】本発明の研磨用発泡シートにおい
ては、常温・常圧で気体状態のガスを発泡剤とする。使
用するガスは、シート原料に不活性な気体であれば特に
制限はなく、無機ガス、フロンガス、低分子量の炭化水
素などの有機ガス等が挙げられるが、ガスの回収が不要
という点で無機ガスが好ましい。無機ガスとしては、常
温・常圧で気体である無機物質であって、シート原料に
溶解、及び/又は混合できるものであれば特に制限はな
く、例えば二酸化炭素、窒素、アルゴン、ネオン、ヘリ
ウム、酸素等が好ましいが、シート原料に溶解、及び/
又は混合し易く、取り扱いが容易である、さらには環境
に優しく、他の発泡剤と比べて安価であるという点等か
ら、二酸化炭素と窒素がより好ましい。これらは単独で
用いてもよく、2種以上を混合して用いてもよい。本発
明の研磨用発泡シートは砥粒を含有する。砥粒は、研磨
スラリー中に含まれる砥粒と同じ研磨材としての機能を
果たすだけでなく、発泡剤が発泡する際の発泡核材とし
ての役割も担っており、気泡の均質化、つまり発泡ばら
つきの低減に大きく寄与する。特に発泡剤が常温・常圧
で気体状態のガスを用いる本発明において、砥粒は必須
成分である。
BEST MODE FOR CARRYING OUT THE INVENTION In the foaming sheet for polishing of the present invention, a gas in a gaseous state at room temperature and atmospheric pressure is used as a foaming agent. The gas to be used is not particularly limited as long as it is an inert gas for the sheet raw material, and examples thereof include inorganic gas, CFC gas, organic gas such as low molecular weight hydrocarbon, and the like. Is preferred. The inorganic gas is not particularly limited as long as it is an inorganic substance that is a gas at room temperature and atmospheric pressure, and can be dissolved and / or mixed in the sheet raw material, for example, carbon dioxide, nitrogen, argon, neon, helium, Oxygen or the like is preferable, but dissolved in the sheet material and /
Alternatively, carbon dioxide and nitrogen are more preferable because they are easy to mix, are easy to handle, are environmentally friendly, and are cheaper than other foaming agents. These may be used alone or in combination of two or more. The foaming sheet for polishing of the present invention contains abrasive grains. Abrasive grains not only function as the same abrasive as the abrasive grains contained in the polishing slurry, but also play a role as a foam nuclei material when the foaming agent foams. It greatly contributes to the reduction of variations. Particularly in the present invention in which the foaming agent uses a gas in a gaseous state at room temperature and atmospheric pressure, the abrasive grains are an essential component.

【0009】砥粒の種類については特に限定しない。加
工対象や要求される研磨精度等によって任意に選択する
ことができる。例えばシリカ系(SiO2)、セリア系
(CeO2)、アルミナ系(Al23)、ジルコニア系
(ZrO2)、およびマンガン系(MnO2、Mn
23)、酸化チタン等をはじめ、ポリメチルメタクリレ
ート、ポリメチルメタクリレートとジビニルベンゼンの
共重合物、およびメラミンホルムアルデヒド縮合物等が
挙げられる。これらは単独あるいは任意に組み合わせて
複数用いることができる。組み合わせや比率等は特に限
定されるものではない。本発明の研磨用発泡シートに含
まれる気泡の平均径は、好ましくは0.1μm以上、3
00μm未満、さらに好ましくは0.5μm以上、20
0μm未満、最も好ましくは1.0μm以上、100μ
m未満である。気泡の平均径が0.1μm未満である
と、例えば研磨の際、研磨スラリー中に含まれる砥粒の
凝集物や研磨屑等により目詰まりし易くなり、短時間で
研磨性能が低下する、つまりは、研磨パッドとしてのラ
イフが著しく短くなるので好ましくない。逆に300μ
m以上であると、機械的強度が著しく低下するので好ま
しくない。
The kind of abrasive grains is not particularly limited. It can be arbitrarily selected depending on the processing target, required polishing accuracy, and the like. For example, silica-based (SiO 2 ), ceria-based (CeO 2 ), alumina-based (Al 2 O 3 ), zirconia-based (ZrO 2 ), and manganese-based (MnO 2 , Mn).
2 O 3 ), titanium oxide and the like, polymethyl methacrylate, copolymers of polymethyl methacrylate and divinylbenzene, and melamine formaldehyde condensates. These may be used alone or in combination of two or more. The combination, ratio, etc. are not particularly limited. The average diameter of bubbles contained in the polishing foam sheet of the present invention is preferably 0.1 μm or more and 3
Less than 00 μm, more preferably 0.5 μm or more, 20
Less than 0 μm, most preferably 1.0 μm or more, 100 μm
It is less than m. If the average diameter of the bubbles is less than 0.1 μm, for example, during polishing, clogging is likely to occur due to agglomerates of abrasive grains contained in the polishing slurry, polishing debris, etc., and polishing performance decreases in a short time. Is not preferable because the life as a polishing pad is significantly shortened. On the contrary, 300μ
When it is m or more, the mechanical strength is significantly lowered, which is not preferable.

【0010】本発明の研磨用発泡シートは、研磨対象物
の種類、要求される研磨精度等に応じて、単独で研磨パ
ッドとして使用しても良いし、または、例えばロデール
社製Suba400のような軟質シートと貼り合わせ、
積層構造の研磨パッドにおける研磨層として使用するこ
ともできる。本発明の研磨用発泡シートを研磨層とし
て、従来の研磨スラリーによる研磨方式、いわゆる遊離
砥粒方式のCMPに用いた場合、研磨層中に気泡と砥粒
とが共存していることから、双方がお互いの欠点を補完
する。具体的には、砥粒は気泡による研磨スラリーの保
持不足、及び/又は保持ばらつきを補足し、長時間にわ
たる、安定した研磨性能発現に寄与する。また従来の遊
離砥粒方式を採用することにより、例えば脱落した砥粒
によるスクラッチの発生等が抑えられる。本発明の研磨
用発泡シート原料の主成分は特に限定しないが、ポリウ
レタン、ポリスチレン、ポリエステル、ポリプロピレ
ン、ポリエチレン、ナイロン、ポリ塩化ビニル、ポリ塩
化ビニリデン、ポリブテン、ポリアセタール、ポリフェ
ニレンオキシド、ポリビニルアルコール、ポリメチルメ
タクリレート、ポリカーボネート、ポリアリレート、芳
香族系ポリサルホン、ポリアミド、ポリイミド、フッ素
樹脂、エチレン−プロピレン樹脂、エチレン−エチルア
クリレート樹脂、アクリル樹脂、ノルボルネン系樹脂、
例えば、ビニルポリイソプレン−スチレン共重合体、ブ
タジエン−スチレン共重合体、アクリロニトリル−スチ
レン共重合体、アクリロニトリル−ブタジエン−スチレ
ン共重合体等に代表されるスチレン共重合体、あるいは
天然ゴム、合成ゴム等が好ましい。これらは単独で用い
ても良いし、混合あるいは共重合させてもよい。なおシ
ートの耐摩耗性、表面硬度、圧縮率等が、非常にバラン
ス良く、研磨に適しているという点から、ポリウレタン
及び/又はポリウレタンとフッ素樹脂との共重合体を主
成分とすることが好ましい。
The foaming sheet for polishing of the present invention may be used alone as a polishing pad depending on the type of object to be polished, required polishing accuracy, or the like, or, for example, Suba400 manufactured by Rodel Co. Laminated with a soft sheet,
It can also be used as a polishing layer in a polishing pad having a laminated structure. When the foaming sheet for polishing of the present invention is used as a polishing layer in conventional polishing slurry polishing method, that is, so-called free abrasive grain CMP, both bubbles and abrasive grains coexist in the polishing layer. Complement each other's shortcomings. Specifically, the abrasive grains supplement insufficient retention and / or variation in retention of the polishing slurry due to bubbles, and contribute to stable polishing performance expression for a long time. Further, by adopting the conventional free abrasive grain method, for example, the occurrence of scratches due to the dropped abrasive grains can be suppressed. The main component of the foaming sheet material for polishing of the present invention is not particularly limited, but polyurethane, polystyrene, polyester, polypropylene, polyethylene, nylon, polyvinyl chloride, polyvinylidene chloride, polybutene, polyacetal, polyphenylene oxide, polyvinyl alcohol, polymethylmethacrylate. , Polycarbonate, polyarylate, aromatic polysulfone, polyamide, polyimide, fluororesin, ethylene-propylene resin, ethylene-ethyl acrylate resin, acrylic resin, norbornene-based resin,
For example, vinyl polyisoprene-styrene copolymer, butadiene-styrene copolymer, acrylonitrile-styrene copolymer, styrene copolymer represented by acrylonitrile-butadiene-styrene copolymer, or natural rubber, synthetic rubber, etc. Is preferred. These may be used alone, or may be mixed or copolymerized. From the viewpoint that the abrasion resistance, surface hardness, compression rate, etc. of the sheet are very well balanced and suitable for polishing, it is preferable to use polyurethane and / or a copolymer of polyurethane and fluororesin as a main component. .

【0011】なおフッ素樹脂は、超臨界状態の二酸化炭
素に対して親和性が高く、二酸化炭素の溶解性を高め、
発泡の均質化に寄与するため、特に、発泡剤として二酸
化炭素及び/又は二酸化炭素を含む混合ガスを用いる場
合は、ポリウレタンとフッ素樹脂との共重合体を本発明
の研磨用発泡シート原料の主成分とすることがより好ま
しい。一般的に、発泡シート成形においては、例えばシ
ート表面近傍での発泡及び/又は破泡等によりシート表
面に凹凸が発生する。凹凸がひどい場合には、例えば、
研磨前のドレッシングに長時間を要する、及び/又は研
磨精度を低下させる等の問題を引き起こす。本発明の研
磨用発泡シートにおいて、例えば、シート表面の凹凸、
つまりは表面外観等を向上させる目的で、樹脂改質剤、
加工助剤、可塑剤等を始めとする各種添加剤を使用する
ことができる。例えば三菱レイヨン製熱可塑性樹脂用改
質剤(商品名:メタブレンA−3000)に代表される
アクリル変性を施したフッ素樹脂は、原料樹脂中にあら
かじめ混合、及び/又はシート成形時に添加することに
より、シート表面外観を向上させるだけでなく、樹脂の
溶融張力を増大させ、破泡を抑制するとともに、発泡の
均質化にも寄与することから、非常に好ましい。
The fluororesin has a high affinity for carbon dioxide in the supercritical state, and enhances the solubility of carbon dioxide.
In order to contribute to the homogenization of foaming, particularly when carbon dioxide and / or a mixed gas containing carbon dioxide is used as a foaming agent, a copolymer of polyurethane and a fluororesin is mainly used as a raw material for the foaming sheet for polishing of the present invention. More preferably, it is used as a component. Generally, in forming a foamed sheet, unevenness is generated on the sheet surface due to, for example, foaming and / or breaking of foam near the surface of the sheet. If the unevenness is severe, for example,
This causes problems such as long dressing time before polishing and / or reduction in polishing accuracy. In the polishing foam sheet of the present invention, for example, the unevenness of the sheet surface,
In other words, for the purpose of improving the surface appearance, etc., a resin modifier,
Various additives such as processing aids and plasticizers can be used. For example, an acrylic-modified fluororesin typified by Mitsubishi Rayon's thermoplastic resin modifier (trade name: METABLEN A-3000) may be mixed in advance with the raw resin and / or added at the time of sheet molding. It is very preferable because it not only improves the appearance of the surface of the sheet, but also increases the melt tension of the resin, suppresses foam breakage, and contributes to homogenization of foaming.

【0012】本発明の研磨用発泡シートの製造方法は特
に制限しないが、例えば研磨用発泡シートを効率良く、
低コストで生産できるという点から、常温・常圧で気体
状態のガスを、高温・高圧下で樹脂に溶解及び/又は樹
脂と混合した後、該樹脂を溶解及び/又は混合時の圧力
より低い圧力雰囲気下に曝す方法が好ましい。具体的に
は、あらかじめ成形しておいたシートを高圧容器中に仕
込み、密閉状態において、発泡剤である常温・常圧で気
体状態のガスを、高温・高圧下でシートに溶解させた
後、密閉状態を開放し、溶解時の圧力より低い圧力雰囲
気下に曝す方法の他、押出機中において原料樹脂を混
練、溶融状態にある樹脂に発泡剤である常温・常圧で気
体状態のガスを溶解、及び/又は樹脂と混合した後に、
成形用金型を通して溶解及び/又は混合時の圧力より低
い圧力雰囲気下に曝す方法等が挙げられるが、この限り
ではない。押出機としては、単軸押出機、二軸押出機、
又はこれらの押出機を連結管等で接続したものを適宜選
択し、使用することができる。
The method for producing the foaming sheet for polishing of the present invention is not particularly limited.
From the viewpoint of being able to produce at low cost, a gas that is in a gaseous state at room temperature and atmospheric pressure is dissolved in and / or mixed with a resin at high temperature and high pressure, and then lower than the pressure when the resin is dissolved and / or mixed. The method of exposing to a pressure atmosphere is preferable. Specifically, a preformed sheet is charged into a high-pressure container, and in a closed state, a gas in a gas state at room temperature and normal pressure, which is a foaming agent, is dissolved in the sheet at high temperature and high pressure, In addition to the method of opening the closed state and exposing it to a pressure atmosphere lower than the pressure at the time of melting, kneading the raw material resin in the extruder, the gas in the gaseous state at room temperature and atmospheric pressure which is the foaming agent is added to the molten resin. After dissolution and / or mixing with resin,
Examples of the method include, but are not limited to, a method of exposing to a pressure atmosphere lower than the pressure during melting and / or mixing through a molding die. As the extruder, a single-screw extruder, a twin-screw extruder,
Alternatively, those obtained by connecting these extruders with a connecting pipe or the like can be appropriately selected and used.

【0013】なお常温・常圧で気体状態のガスを、高温
・高圧下で樹脂に溶解及び/又は樹脂と混合する場合、
その高温・高圧下が該ガスの超臨界状態であることが好
ましい。超臨界状態とは、臨界温度、臨界圧力以上の状
態を意味し、例えば二酸化炭素の場合、30℃以上、
7.3MPa以上である。超臨界状態では、液体状態よ
りも粘性が低くかつ拡散性が高いという特性を有し、ま
た気体状態よりも密度が大きいことから、樹脂中に大量
のガスを速やかに溶解、又は樹脂と混合させることがで
きるので好ましい。
When a gas that is in a gaseous state at room temperature and pressure is dissolved in a resin and / or mixed with a resin at a high temperature and a high pressure,
It is preferable that the high temperature and high pressure is in a supercritical state of the gas. The supercritical state means a state at a critical temperature or a critical pressure or higher, for example, in the case of carbon dioxide, 30 ° C. or higher,
It is 7.3 MPa or more. In the supercritical state, it has the characteristics of lower viscosity and higher diffusivity than the liquid state, and since it has a higher density than the gas state, a large amount of gas can be quickly dissolved in the resin or mixed with the resin. It is possible because it is possible.

【0014】[0014]

【実施例】以下に、実施例により本発明を具体的に説明
するが、本発明は、実施例の内容になんら限定されるも
のではない。 <発泡シート化設備>本発明の実施例で使用した発泡シ
ート化設備の概略図を図2に示す。バレル径50mm、
L/D=32の単軸押出機(12)とバレル径65m
m、L/D=36の単軸押出機(13)を中空の単管
(19)で連結したタンデム型押出機の先端に、リップ
幅300mm、リップ間隙1.0mmの成形用金型(1
4)を取り付けた。単軸押出機(12)のほぼ中央に発
泡剤の注入用部品(15)を設け、ボンベ(17)から
取り出した後に、昇圧ポンプ(16)により昇圧したガ
スを、注入口から押出機中に注入した。
EXAMPLES The present invention will be specifically described below with reference to examples, but the present invention is not limited to the contents of the examples. <Foam sheet forming equipment> A schematic view of the foam sheet forming equipment used in the examples of the present invention is shown in FIG. Barrel diameter 50mm,
Single screw extruder (12) with L / D = 32 and barrel diameter 65m
m, L / D = 36 single-screw extruder (13) connected by a hollow single tube (19), at the tip of a tandem extruder, a molding die with a lip width of 300 mm and a lip gap of 1.0 mm (1
4) was attached. A single-screw extruder (12) is provided with a foaming agent injecting part (15) at approximately the center, and after taking out from a cylinder (17), gas pressurized by a pressure boosting pump (16) is introduced into the extruder through an injection port. Injected.

【0015】<研磨性能評価>被研磨物として、3イン
チのシリコンウエハ上に、電解メッキで10000Åの
Cuを製膜したものを準備した。研磨には定盤径200
mmの片面研磨機を用いた。研磨機の定盤には、研磨パ
ッドを両面テープで貼り付け、ダイヤモンドを電着した
ドレッシングディスクにより、荷重10kPa、定盤の
回転数60rpm、ドレッシングディスクホルダーの回
転数50rpmの条件で2時間、研磨パッド表面をドレ
ッシングした後に、Cabot社製研磨スラリー(商品
名:iCue5003)を流し、1分間、Cu膜を研磨
した。研磨条件としては、ウエハに加える荷重を350
g/cm2、定盤の回転数を70rpm、ウエハ回転数
を70rpm、研磨スラリーの流量を200ml/mi
nとした。研磨後のウエハを洗浄、乾燥後、シート抵抗
測定機を用いてCu膜厚を測定し、平均研磨速度および
ウエハ面内における研磨速度ばらつき、平坦性を従来パ
ッドと比較した。
<Evaluation of Polishing Performance> As an object to be polished, a 3-inch silicon wafer on which 10000 Å of Cu was formed by electrolytic plating was prepared. Plate diameter 200 for polishing
A mm single-side polishing machine was used. A polishing pad is attached to the surface plate of the polishing machine with double-sided tape, and a diamond-coated dressing disk is used for polishing for 2 hours under the conditions of a load of 10 kPa, a surface plate rotation speed of 60 rpm, and a dressing disk holder rotation speed of 50 rpm. After dressing the pad surface, a polishing slurry (trade name: iCue5003) manufactured by Cabot Co. was poured to polish the Cu film for 1 minute. As the polishing condition, the load applied to the wafer is 350
g / cm 2 , the rotation number of the platen is 70 rpm, the rotation number of the wafer is 70 rpm, and the flow rate of the polishing slurry is 200 ml / mi.
It was set to n. After the wafer after polishing was washed and dried, the Cu film thickness was measured using a sheet resistance measuring device, and the average polishing rate, variation in polishing rate within the wafer surface, and flatness were compared with those of the conventional pad.

【0016】(実施例1)大日精化製の酸化チタン含有
ポリウレタン(商品名:レザミンP)と三菱レイヨン製
熱可塑性樹脂用改質剤(商品名:メタブレンA−300
0)をあらかじめ二軸押出機で混合して作製したペレッ
トをシート原料とし、発泡剤として二酸化炭素を使用し
た。なお原料樹脂ペレットは、100℃で4時間、棚段
式乾燥機中で乾燥させた後に使用した。単軸押出機(1
2)、単軸押出機(13)および成形用金型の平均温度
は、それぞれ210℃、160℃、および160℃に設
定した。なお、ガス注入部直後の押出機内圧力は20M
Paであり、樹脂に溶解及び/又は樹脂と混合するゾー
ンにおいて、発泡剤である二酸化炭素は超臨界状態であ
ることを確認した。得られた幅270mm、厚み1.1
mmの発泡シートを液体窒素中に浸した後に破断し、そ
の断面を走査型電子顕微鏡S−2400(HITACH
I製)で観察したところ、平均径32μmの気泡が、シ
ート厚み方向および幅方向において、ほぼ均一に分散し
ている状態が確認できた。得られた発泡シートから、直
径200mmの円盤を切り取り、単独で研磨パッドとし
て用い、Cu膜を研磨した。
(Example 1) Polyurethane containing titanium oxide (trade name: Resamine P) manufactured by Dainichiseika and a modifier for thermoplastic resin (trade name: METABLEN A-300, manufactured by Mitsubishi Rayon Co., Ltd.)
Pellets prepared by mixing 0) in advance with a twin-screw extruder were used as sheet raw materials, and carbon dioxide was used as a foaming agent. The raw material resin pellets were used after being dried in a tray dryer at 100 ° C. for 4 hours. Single screw extruder (1
2), the average temperature of the single-screw extruder (13) and the molding die were set to 210 ° C, 160 ° C, and 160 ° C, respectively. The pressure inside the extruder immediately after the gas injection part is 20M.
It was Pa, and it was confirmed that carbon dioxide as a foaming agent was in a supercritical state in the zone where it was dissolved in the resin and / or mixed with the resin. Width obtained 270 mm, thickness 1.1
mm foam sheet was soaked in liquid nitrogen and then fractured, and its cross section was taken with a scanning electron microscope S-2400 (HITACH
As a result of observation with (I), it was confirmed that bubbles having an average diameter of 32 μm were dispersed almost uniformly in the sheet thickness direction and the width direction. A disc having a diameter of 200 mm was cut out from the obtained foamed sheet and used alone as a polishing pad to polish a Cu film.

【0017】(実施例2)大日精化製の酸化チタン含有
ポリウレタン(商品名:レザミンP)にポリウレタンと
フッ素樹脂の共重合体(商品名:レザミンFR)を混合
したものを、シート原料とし、発泡剤として二酸化炭素
を使用した。なお原料樹脂ペレットは、100℃で4時
間、棚段式乾燥機中で乾燥させた後に使用した。単軸押
出機(12)、単軸押出機(13)および成形用金型の
平均温度は、それぞれ210℃、160℃、および16
0℃に設定した。なお、ガス注入部直後の押出機内圧力
は18MPaであり、樹脂に溶解及び/又は樹脂と混合
するゾーンにおいて、発泡剤である二酸化炭素は超臨界
状態であることを確認した。得られた幅275mm、厚
み1.1mmの発泡シートを液体窒素中に浸した後に破
断し、その断面を走査型電子顕微鏡S−2400(HI
TACHI製)で観察したところ、平均径41μmの気
泡が、シート厚み方向および幅方向において、ほぼ均一
に分散している状態が確認できた。得られた発泡シート
から、直径200mmの円盤を切り取り、単独で研磨パ
ッドとして用い、Cu膜を研磨した。
(Example 2) A sheet material was prepared by mixing a titanium oxide-containing polyurethane (trade name: Rezamin P) manufactured by Dainichiseika Co., Ltd. with a copolymer of polyurethane and a fluororesin (trade name: Rezamin FR). Carbon dioxide was used as a blowing agent. The raw material resin pellets were used after being dried in a tray dryer at 100 ° C. for 4 hours. The average temperatures of the single-screw extruder (12), the single-screw extruder (13) and the molding die are 210 ° C, 160 ° C and 16 ° C, respectively.
It was set to 0 ° C. The pressure inside the extruder immediately after the gas injection part was 18 MPa, and it was confirmed that carbon dioxide as a foaming agent was in a supercritical state in the zone where it was dissolved in the resin and / or mixed with the resin. The obtained foamed sheet having a width of 275 mm and a thickness of 1.1 mm was immersed in liquid nitrogen and then fractured, and its cross section was taken with a scanning electron microscope S-2400 (HI.
As a result of observation with TACHI), it was confirmed that bubbles having an average diameter of 41 μm were dispersed almost uniformly in the sheet thickness direction and the width direction. A disc having a diameter of 200 mm was cut out from the obtained foamed sheet and used alone as a polishing pad to polish a Cu film.

【0018】(比較例)研磨パッドとして、ロデール社
製パッド(商品名:IC1000)を使用し、Cu膜を
研磨した。 <評価結果>(実施例1)および(実施例2)と(比較
例)との比較において、研磨速度については顕著な差は
現れなかったが、(比較例)に対し、(実施例1)およ
び(実施例2)のウエハ面内における研磨速度ばらつき
は低減し、平坦性が向上した。
(Comparative Example) As a polishing pad, a pad (trade name: IC1000) manufactured by Rodel Co. was used to polish a Cu film. <Evaluation Results> In the comparison between (Example 1) and (Example 2) and (Comparative Example), no remarkable difference was observed in the polishing rate, but in contrast to (Comparative Example), (Example 1) Variations in the polishing rate in the wafer surface of Example 2 and (Example 2) were reduced, and the flatness was improved.

【0019】[0019]

【発明の効果】本発明の、発泡剤が常温・常圧で気体状
態のガスであり、かつシート中には砥粒を含有し、さら
には気泡の平均径が0.1μm以上、300μm未満で
ある研磨用発泡シートを研磨パッドの研磨層として用い
れば、研磨性能ばらつきが低減し、研磨精度が向上し
た。さらには、本発明の、常温・常圧で気体状態のガス
を、高温・高圧下で樹脂に溶解及び/又は樹脂と混合し
た後、該樹脂を溶解及び/又は混合時の圧力より低い圧
力雰囲気下に曝す製造方法によれば、該研磨用発泡シー
トを効率良く、低コストで生産することが期待できる。
The foaming agent of the present invention is a gas in a gaseous state at room temperature and atmospheric pressure, contains abrasive grains in the sheet, and has an average bubble diameter of 0.1 μm or more and less than 300 μm. When a certain foaming sheet for polishing was used as the polishing layer of the polishing pad, variation in polishing performance was reduced and polishing accuracy was improved. Further, the gas of the present invention, which is in a gaseous state at room temperature and atmospheric pressure, is dissolved in and / or mixed with a resin at high temperature and high pressure, and then the pressure atmosphere is lower than the pressure at the time of dissolving and / or mixing the resin. According to the manufacturing method which exposes below, it can be expected that this foaming sheet for polishing can be efficiently manufactured at low cost.

【図面の簡単な説明】[Brief description of drawings]

【図1】 化学的機械的研磨法(CMP)の標準的なプ
ロセスの一例である。
FIG. 1 is an example of a standard process of chemical mechanical polishing (CMP).

【図2】 実施例で使用した発泡シート化設備の概略図
である。
FIG. 2 is a schematic diagram of a foamed sheet forming facility used in Examples.

【符号の説明】[Explanation of symbols]

1 半導体ウエハ 2 定盤 3 ドレッシングディスク 4 研磨スラリー 5 試料ホルダー 6 研磨パッド 7 回転軸 8 ウエハ固定用治具 9 ドレッシングディスクホルダー 10 スラリー供給用配管 11 バッキング材 12 単軸押出機 13 単軸押出機 14 成形用金型 15 発泡剤の注入用部品 16 昇圧ポンプ 17 ボンベ 18 原料ホッパ 19 単管 1 Semiconductor wafer 2 surface plate 3 dressing discs 4 Polishing slurry 5 Sample holder 6 polishing pad 7 rotation axis 8 Wafer fixing jig 9 Dressing disc holder 10 Slurry supply pipe 11 Backing material 12 Single screw extruder 13 Single screw extruder 14 Mold for molding 15 Parts for injection of foaming agents 16 Booster pump 17 cylinders 18 Raw material hopper 19 single pipe

フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 21/304 621 H01L 21/304 622F 622 622X B29K 27:12 // B29K 27:12 75:00 75:00 B29L 7:00 B29L 7:00 C08L 75:00 C08L 75:00 B29C 67/22 Fターム(参考) 3C058 AA07 AA09 CB01 DA17 3C063 AB07 BB01 BB03 BB26 BC03 BC04 BC09 CC05 EE10 FF22 FF23 4F074 AA38 AA78 BA32 BA33 CA21 CC03X CC34Y 4F212 AA16 AA31 AB02 AG01 AG20 UA09 UG02 UH30 UN11 Front page continuation (51) Int.Cl. 7 Identification code FI theme code (reference) H01L 21/304 621 H01L 21/304 622F 622 622X B29K 27:12 // B29K 27:12 75:00 75:00 B29L 7 : 00 B29L 7:00 C08L 75:00 C08L 75:00 B29C 67/22 F term (reference) 3C058 AA07 AA09 CB01 DA17 3C063 AB07 BB01 BB03 BB26 BC03 BC04 BC09 CC05 EE10 FF22 FF23 4F074 AA38 AA78 BA32 BA34 CA33 CA33 CA33 AA31 AB02 AG01 AG20 UA09 UG02 UH30 UN11

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 常温・常圧で気体状態のガスを発泡剤と
して、平均径が0.1μm以上、300μm未満である
気泡を発泡させた発泡シートであり、該シート中には砥
粒を含有することを特徴とする研磨用発泡シート。
1. A foamed sheet in which bubbles having an average diameter of 0.1 μm or more and less than 300 μm are foamed by using a gas in a gas state at room temperature and atmospheric pressure as a foaming agent, and the sheet contains abrasive grains. A foamed sheet for polishing, which is characterized by:
【請求項2】 常温・常圧で気体状態のガスが二酸化炭
素、窒素又はそれらの混合ガスである請求項1記載の研
磨用発泡シート。
2. The foaming sheet for polishing according to claim 1, wherein the gas in a gaseous state at room temperature and atmospheric pressure is carbon dioxide, nitrogen or a mixed gas thereof.
【請求項3】 シートを構成する原料の主成分がポリウ
レタンである請求項1又は2記載の研磨用発泡シート。
3. The foaming sheet for polishing according to claim 1, wherein the main component of the raw material constituting the sheet is polyurethane.
【請求項4】 シートを構成する原料の主成分が、ポリ
ウレタンとフッ素樹脂との共重合体、及び/又はポリウ
レタンとフッ素樹脂との混合体である請求項1又は2記
載の研磨用発泡シート。
4. The foaming sheet for polishing according to claim 1, wherein the main component of the raw material constituting the sheet is a copolymer of polyurethane and fluororesin, and / or a mixture of polyurethane and fluororesin.
【請求項5】 アクリル変性を施したフッ素樹脂を必須
成分とする請求項1〜4いずれか1項に記載の研磨用発
泡シート。
5. The foaming sheet for polishing according to claim 1, which contains an acrylic-modified fluororesin as an essential component.
【請求項6】 常温・常圧で気体状態のガスを、高温・
高圧下で樹脂に溶解及び/又は樹脂と混合した後、該樹
脂を溶解及び/又は混合時の圧力より低い圧力雰囲気下
に曝すことにより請求項1〜5のいずれか1項に記載の
研磨用発泡シートを得ることを特徴とする研磨用発泡シ
ートの製造方法。
6. A gas that is in a gaseous state at normal temperature and pressure is
The polishing according to any one of claims 1 to 5, which is obtained by dissolving the resin in a resin under high pressure and / or mixing with the resin, and then exposing the resin to an atmosphere of a pressure lower than the pressure at the time of dissolving and / or mixing. A method for producing a foam sheet for polishing, which comprises obtaining a foam sheet.
【請求項7】 高温・高圧下が、そのガスの超臨界状態
である、請求項6記載の研磨用発泡シートの製造方法。
7. The method for producing a foaming sheet for polishing according to claim 6, wherein the gas is in a supercritical state under high temperature and high pressure.
JP2002044307A 2002-02-21 2002-02-21 Polishing foam sheet and method for producing the same Pending JP2003245861A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002044307A JP2003245861A (en) 2002-02-21 2002-02-21 Polishing foam sheet and method for producing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002044307A JP2003245861A (en) 2002-02-21 2002-02-21 Polishing foam sheet and method for producing the same

Publications (1)

Publication Number Publication Date
JP2003245861A true JP2003245861A (en) 2003-09-02

Family

ID=28659087

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002044307A Pending JP2003245861A (en) 2002-02-21 2002-02-21 Polishing foam sheet and method for producing the same

Country Status (1)

Country Link
JP (1) JP2003245861A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008047849A (en) * 2006-07-20 2008-02-28 Toray Ind Inc Polishing method, polishing pad and its manufacturing method
JP2010228009A (en) * 2009-03-25 2010-10-14 Admatechs Co Ltd Polishing pad and polishing method
JP2010535643A (en) * 2007-08-14 2010-11-25 ビーエーエスエフ ソシエタス・ヨーロピア Manufacturing method of abrasive foam
KR101175337B1 (en) 2009-07-02 2012-08-20 주식회사 엘지화학 Manufacturing method of porous sheet and porous sheet manufactured by the method
KR101217265B1 (en) 2009-06-24 2012-12-31 주식회사 엘지화학 Manufacturing method of porous sheet and porous sheet manufactured by the method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008047849A (en) * 2006-07-20 2008-02-28 Toray Ind Inc Polishing method, polishing pad and its manufacturing method
JP2010535643A (en) * 2007-08-14 2010-11-25 ビーエーエスエフ ソシエタス・ヨーロピア Manufacturing method of abrasive foam
JP2010228009A (en) * 2009-03-25 2010-10-14 Admatechs Co Ltd Polishing pad and polishing method
KR101217265B1 (en) 2009-06-24 2012-12-31 주식회사 엘지화학 Manufacturing method of porous sheet and porous sheet manufactured by the method
KR101175337B1 (en) 2009-07-02 2012-08-20 주식회사 엘지화학 Manufacturing method of porous sheet and porous sheet manufactured by the method

Similar Documents

Publication Publication Date Title
TWI386442B (en) Chemical mechanical polishing pad comprising a core of liquid organic material loaded into a polymer shell and method of making same
CN100377837C (en) Microporous polishing pad
US8177603B2 (en) Polishing pad composition
JP2001244223A (en) Polishing pad
JP2008546550A (en) Permeable microporous material for CMP
US20150133039A1 (en) Polishing pad and method for manufacturing same
US20020098789A1 (en) Polishing pad and methods for improved pad surface and pad interior characteristics
JP2001277304A (en) Producing method for polishing pad for semiconductor wafer
JP2003245861A (en) Polishing foam sheet and method for producing the same
US7790788B2 (en) Method for producing chemical mechanical polishing pad
JP2003220550A (en) Abrasive pad and manufacturing method for the same
JP2004034173A (en) Fixed abrasive grain polishing tool
JPH11285961A (en) Polishing pad and polishing method
JP4873667B2 (en) Polishing pad
US20090266002A1 (en) Polishing pad and method of use
JP2003209078A (en) Foam plastic sheet for polishing and manufacturing method therefor
JP4591980B2 (en) Polishing pad and manufacturing method thereof
JP2001088013A (en) Polishing pad
JP2004315785A (en) Method for molding hardly foaming resin for use in polishing
JP2003209079A (en) Porous plastic grain polishing pad
JP2004260070A (en) Foamed polishing material and polishing method using the same
JP2005041006A (en) Method for producing grooved abrasive foam
JP2004203024A (en) Manufacturing method of closed cell foam body for polishing
JP2003236764A (en) Foam sheet, and fixed abrasive grain foam for polishing
US6911059B2 (en) Abrasive pad and process for the wet-chemical grinding of a substrate surface