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JP2003008174A - Wiring board manufacturing method - Google Patents

Wiring board manufacturing method

Info

Publication number
JP2003008174A
JP2003008174A JP2001188624A JP2001188624A JP2003008174A JP 2003008174 A JP2003008174 A JP 2003008174A JP 2001188624 A JP2001188624 A JP 2001188624A JP 2001188624 A JP2001188624 A JP 2001188624A JP 2003008174 A JP2003008174 A JP 2003008174A
Authority
JP
Japan
Prior art keywords
wiring board
manufacturing
insulating layer
copper foil
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001188624A
Other languages
Japanese (ja)
Inventor
Tatsuhiro Okano
達広 岡野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd filed Critical Toppan Printing Co Ltd
Priority to JP2001188624A priority Critical patent/JP2003008174A/en
Publication of JP2003008174A publication Critical patent/JP2003008174A/en
Pending legal-status Critical Current

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  • Laser Beam Processing (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

(57)【要約】 【課題】絶縁層の残渣が発生しずらく。これが発生しに
くくなる事によって導通の信頼性が向上するとともにビ
アの導通不良などが起きない配線基板の製造方法が望ま
れていた。また、絶縁層がポリイミドである場合でも、
レーザー加工後のビアの検査でポリイミドの残渣の視認
性が良くなる配線基板の製造方法が望まれていた。 【解決手段】絶縁層の一方の面に、導通ビアの底部とな
る銅層が形成されてなる材料を用い、前記銅層に達する
ように絶縁層側からレーザー加工を行い、加工された穴
の内部に導通化処理を行う配線基板の製造方法におい
て、レーザー加工を行う前に、前記銅層の絶縁層に接す
る面の少なくとも導通ビアの底部となる部分に、着色処
理を施しておくことを特徴とする配線基板の製造方法を
提供する。
(57) [Summary] [Problem] It is difficult to generate an insulating layer residue. There has been a demand for a method of manufacturing a wiring board in which the reliability of conduction is improved by making this less likely to occur, and a via conduction failure does not occur. Moreover, even when the insulating layer is polyimide,
There has been a demand for a method of manufacturing a wiring board in which the visibility of polyimide residues is improved by inspection of vias after laser processing. Using a material in which a copper layer serving as the bottom of a conductive via is formed on one surface of an insulating layer, laser processing is performed from the insulating layer side so as to reach the copper layer, and the processed holes are formed. In the method of manufacturing a wiring board that conducts conduction inside, a coloring treatment is performed on at least the bottom portion of the conductive via on the surface of the copper layer that contacts the insulating layer before laser processing. A method for manufacturing a wiring board is provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、フィルムキャリア
やプリント配線基板に代表される配線基板の製造方法に
関し、特に絶縁層の両側に配線回路を有して導通ビアに
よって両側の配線回路の導通を行った配線基板の製造方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a wiring board typified by a film carrier or a printed wiring board, and more particularly, it has wiring circuits on both sides of an insulating layer and conducts the wiring circuits on both sides by conducting vias. The present invention relates to a method of manufacturing a wiring board.

【0002】[0002]

【従来の技術】従来は、導通ビアの形成にレーザーを用
いて行う場合、銅箔を加工できるエネルギでビア形成部
の銅箔を加工し次に絶縁層を加工するエネルギにエネル
ギ密度を低下させポリイミドの加工を行う。それを、裏
面の銅箔に達するまで加工してビア部のレーザー加工を
行い、加工された穴の内部に導通化処理を行って配線基
板の製造方法をしていた。
2. Description of the Related Art Conventionally, when a conductive via is formed by using a laser, the energy density is lowered to the energy for processing the copper foil in the via forming portion and then the insulating layer with the energy for processing the copper foil. Process polyimide. The wiring board is manufactured by processing the copper foil until it reaches the copper foil on the back surface, laser processing the via portion, and conducting the inside of the processed hole.

【0003】特にUV−YAGレーザーはパルスレーザ
ーであるためショット数によって徐々に加工物を加工で
きる特性がある。このためレーザーのショット数が不足
していると加工残渣が発生してしまう。(図5,図6参
照)
In particular, since the UV-YAG laser is a pulse laser, it has a characteristic that a workpiece can be gradually processed depending on the number of shots. Therefore, if the number of laser shots is insufficient, processing residues will occur. (See FIGS. 5 and 6)

【0004】[0004]

【発明が解決しようとする課題】従来は、両面に配線パ
ターンを有した配線回路基板の製造をする際に、UV−
YAGレーザー加工によってビア部の加工を行う際にビ
アの底部に絶縁層の残渣が発生しビアの導通が不十分で
ある場合が発生する。これによって導通の信頼性が低下
するとともにビアの導通不良などの原因にもなる。
Conventionally, when manufacturing a printed circuit board having wiring patterns on both sides, UV-
When the via portion is processed by the YAG laser processing, a residue of the insulating layer may be generated at the bottom portion of the via and the conduction of the via may be insufficient. As a result, the reliability of conduction is lowered, and it also causes a failure in conduction of the via.

【0005】また、絶縁層がポリイミドである場合に
は、レーザー加工後のビアの検査でポリイミドの残渣の
視認性が悪く検査が困難であった。
Further, when the insulating layer is polyimide, the visibility of the polyimide residue is poor in the inspection of the via after laser processing, and the inspection is difficult.

【0006】そこで、両面に配線パターンを有した配線
回路基板の作製する際に、UV−YAGレーザー加工に
よってビア部の加工を行う際にビアの底部に絶縁層の残
渣が発生しずらく。これが発生しにくくなる事によって
導通の信頼性が向上するとともにビアの導通不良などが
起きない配線基板の製造方法が望まれていた。
Therefore, when manufacturing a printed circuit board having wiring patterns on both sides, when the via portion is processed by UV-YAG laser processing, residues of the insulating layer are less likely to occur at the bottom of the via. There is a demand for a method for manufacturing a wiring board in which the reliability of conduction is improved by making this less likely to occur and a conduction failure of vias does not occur.

【0007】また、絶縁層がポリイミドである場合で
も、レーザー加工後のビアの検査でポリイミドの残渣の
視認性が良くなる配線基板の製造方法が望まれていた。
Further, even when the insulating layer is made of polyimide, there is a demand for a method of manufacturing a wiring board in which the visibility of polyimide residue is improved by inspection of vias after laser processing.

【0008】[0008]

【課題を解決するための手段】請求項1記載の発明では
上記課題を解決するために、絶縁層の一方の面に、導通
ビアの底部となる銅層が形成されてなる材料を用い、前
記銅層に達するように絶縁層側からレーザー加工を行
い、加工された穴の内部に導通化処理を行う配線基板の
製造方法において、レーザー加工を行う前に、前記銅層
の絶縁層に接する面の少なくとも導通ビアの底部となる
部分に、着色処理を施しておくことを特徴とする配線基
板の製造方法を提供するものである。
In order to solve the above-mentioned problems, the invention according to claim 1 uses a material in which a copper layer serving as a bottom portion of a conductive via is formed on one surface of an insulating layer, In the method of manufacturing a wiring board, in which laser processing is performed from the insulating layer side so as to reach the copper layer, and conduction processing is performed inside the processed hole, the surface of the copper layer that contacts the insulating layer before laser processing is performed. The present invention provides a method for manufacturing a wiring board, characterized in that at least a portion that becomes the bottom of the conductive via is subjected to coloring treatment.

【0009】これにより、前記銅層の絶縁層に接する面
の少なくとも導通ビアの底部となる部分に着色処理され
ているため、レーザー加工が銅層に達した時に反射率が
変わり、加工の終点を検知しやすくなり、その時点から
さらに加工を行うことにより、残渣のない加工を行うこ
とが可能となる。
As a result, since at least the bottom surface of the conductive via on the surface of the copper layer in contact with the insulating layer is colored, the reflectance changes when the laser processing reaches the copper layer, and the processing end point is reached. It becomes easier to detect, and by further processing from that point, it becomes possible to perform processing without residue.

【0010】なお、着色処理としては、加工の終点の検
知が可能な色に着色されるものであればどの様なもので
もよく、色も黒に限らず、加工の終点の検知が可能な色
であればどの様な色でも良く、例えば、着色された導電
性材料例えば導電性接着剤を塗布しておく等の方法でも
よいが、酸化処理が好ましい。
The coloring process may be any color as long as it can be colored with a color capable of detecting the processing end point, and the color is not limited to black, and a color with which the processing end point can be detected. Any color may be used, for example, a method in which a colored conductive material such as a conductive adhesive is applied may be used, but an oxidation treatment is preferable.

【0011】銅層と絶縁層の密着力を高めることができ
るからである。酸化処理としても特にCuOを主体とし
た酸化銅(黒化処理:実施例2)とすることが好まし
い。酸化銅としてはCuO、Cu2Oがあるが、CuO
は色が黒色であり、レーザー加工の際に、終端検知を行
いやすい。
This is because the adhesion between the copper layer and the insulating layer can be increased. Also as the oxidation treatment, copper oxide mainly composed of CuO (blackening treatment: Example 2) is particularly preferable. Copper oxide includes CuO and Cu 2 O, but CuO
Has a black color, and it is easy to detect the end during laser processing.

【0012】また、少なくとも導通ビアの底部となる部
分に加工が施されていればよいが、例えば酸化処理の場
合は、選択的に行うよりも全体を酸化処理したほうが加
工が行いやすく好ましい。また、他方の面側にも銅層が
形成されていてももちろんよい。
Further, at least the portion which becomes the bottom of the conductive via may be processed. For example, in the case of an oxidation treatment, it is preferable that the whole is oxidized rather than being selectively processed. In addition, a copper layer may of course be formed on the other surface side.

【0013】請求項2記載の発明では上記課題を解決す
るために、前記絶縁層の他方の面にも銅層が形成されて
おり、前記他方の面の銅層の、絶縁層とは反対面にも着
色処理を施しておくことを特徴とする請求項1記載の配
線基板の製造方法を提供するものである。
In order to solve the above-mentioned problems, a copper layer is formed on the other surface of the insulating layer, and the copper layer on the other surface is opposite to the insulating layer. The present invention also provides a method for manufacturing a wiring board according to claim 1, characterized in that it is also colored.

【0014】これにより、他方の面の銅層の、絶縁層と
は反対面、即ちレーザー照射を行う面に着色処理を行っ
ておくと、加工後にビアの径が所望の大きさになってい
るか、というような検査を行う際に検査が行いやすくな
り好ましいものである。
As a result, if the copper layer on the other surface is colored on the surface opposite to the insulating layer, that is, the surface on which the laser irradiation is performed, whether the diameter of the via becomes a desired size after processing. This is preferable because it facilitates the inspection when such an inspection is performed.

【0015】もっとも、片面だけに黒化処理や酸化処理
をする場合でも、レーザー加工側の銅箔がどちらである
か明確にする効果もあるので、場合により適宜選択可能
である。
However, even when the blackening treatment or the oxidation treatment is performed on only one side, there is an effect of clarifying which is the copper foil on the laser processing side, and therefore it can be appropriately selected depending on the case.

【0016】この様に、レーザー照射側と反対面の銅箔
の絶縁層側にのみ黒化処理や酸化処理を行った場合は、
ビア部にレーザー加工を行った際に絶縁層の加工が終わ
り裏側の銅箔表面までレーザー加工を行うことで黒化処
理や酸化処理した銅箔表面がレーザー加工によって除去
され銅箔の反射率の変化によってレーザー加工の終点を
明確にすることができ、これによりで問題となっている
絶縁層の加工残渣をなくすことができる。
In this way, when the blackening treatment or the oxidation treatment is performed only on the insulating layer side of the copper foil opposite to the laser irradiation side,
When the laser processing is performed on the via part, the processing of the insulating layer is finished and the copper surface on the back side is also laser processed to remove the blackened or oxidized copper foil surface by laser processing and to reduce the reflectance of the copper foil. The change makes it possible to clarify the end point of the laser processing, thereby eliminating the processing residue of the insulating layer which is a problem.

【0017】請求項3記載の発明では上記課題を解決す
るために、前記レーザー加工として、前記一方の面の銅
層に達した後、着色処理された部分を除去する加工をさ
らに行うことを特徴とする請求項1または請求項2記載
の配線基板の製造方法を提供するものである。
In order to solve the above-mentioned problems, the invention according to claim 3 further includes, as the laser processing, processing for removing the colored portion after reaching the copper layer on the one surface. A method of manufacturing a wiring board according to claim 1 or claim 2 is provided.

【0018】これは、着色処理された部分は、ビアの底
部となるため、酸化処理の場合は除去しておいたほうが
好ましいからであり、絶縁物で着色処理がされている場
合は除去が必要である。なお、他の場合でも、電気抵抗
が銅層と異なる場合、ビア内に施す導通処理が行いにく
かったりするような場合は除去しておくほうが好まし
い。
This is because the colored portion becomes the bottom of the via, so it is preferable to remove it in the case of oxidation treatment, and it is necessary to remove it in the case of coloring treatment with an insulator. Is. Even in other cases, it is preferable to remove it when the electric resistance is different from that of the copper layer, or when the conduction process performed in the via is difficult to perform.

【0019】請求項4記載の発明では上記課題を解決す
るために、前記レーザー加工にUV−YAGレーザーを
用いることを特徴とする請求項1乃至請求項3のいずれ
か一項記載の配線基板の製造方法を提供するものであ
る。
In order to solve the above-mentioned problems, the invention described in claim 4 uses a UV-YAG laser for the laser processing, and the wiring board according to any one of claims 1 to 3. A manufacturing method is provided.

【0020】本発明に使用できるレーザーとしては、エ
キシマレーザー、炭酸ガスレーザー等があげられる。し
かし、請求項4記載の発明の様にUV−YAGレーザー
を用いるのが、特に銅層と絶縁層の両方を容易に加工す
ることができるため、好ましい。これにより、照射面側
に銅層が存在し、その銅層を加工する場合には優れた加
工性を発揮する。
Examples of lasers that can be used in the present invention include excimer lasers and carbon dioxide lasers. However, it is preferable to use the UV-YAG laser as in the fourth aspect of the present invention, since both the copper layer and the insulating layer can be easily processed. As a result, a copper layer exists on the irradiation surface side, and when the copper layer is processed, excellent workability is exhibited.

【0021】請求項5記載の発明では上記課題を解決す
るために、前記着色処理が酸化処理であることを特徴と
する請求項1乃至請求項4のいずれか一項記載の配線基
板の製造方法を提供するものである。これにより、容易
に、厚さが薄い着色層が加工でき、加工部以外の部分に
酸化膜が残存した場合にも、配線基板の使用にあたって
も特に悪影響がないからである。特にCuOを主体とし
た酸化膜を形成することが好ましい。
In order to solve the above problems, the invention according to claim 5 is characterized in that the coloring treatment is an oxidation treatment, and the method for manufacturing a wiring board according to any one of claims 1 to 4. Is provided. This is because a thin colored layer can be easily processed, and even if an oxide film remains in a portion other than the processed portion, there is no particular adverse effect on the use of the wiring board. Particularly, it is preferable to form an oxide film mainly composed of CuO.

【0022】[0022]

【発明の実施の形態】配線基板の製造方法を図1と図2
を使って説明する。絶縁体11にポリイミドを用いてな
にも処理していない銅箔10と表裏に黒化処理を施した
銅箔20を熱可塑性の接着剤で貼り合わせる。この材料
を用いてUV−YAGレーザー加工を行う。
1 and 2 show a method of manufacturing a wiring board.
Use to explain. A copper foil 10 that has not been treated with polyimide for the insulator 11 and a copper foil 20 that has been blackened on the front and back are bonded together with a thermoplastic adhesive. UV-YAG laser processing is performed using this material.

【0023】レーザー加工の条件としては、例えば、銅
箔を1パルス当たり0.2Jで加工を行っていく。ショ
ット数は使用する機器によって異なるが、12μmの銅
箔で2〜15ショット程度で銅箔の加工が終わり銅箔1
0bのような形態が得られる。次にポリイミドを加工す
る場合には、レーザーの加工エネルギーを1パルス当た
り0.02Jまで落として使用する。これを20〜30
ショットすることでポリイミドだけ加工して裏面の銅箔
で加工を完了することが可能となる。
As the conditions for laser processing, for example, copper foil is processed at 0.2 J per pulse. The number of shots depends on the equipment used, but with a copper foil of 12 μm, the processing of the copper foil is completed in about 2 to 15 shots.
A form like 0b is obtained. When processing the polyimide next, the processing energy of the laser is dropped to 0.02 J per pulse before use. 20 to 30
The shot makes it possible to process only the polyimide and complete the process with the copper foil on the back surface.

【0024】ショット数は、50μmのポリイミドの場
合で30〜50ショット程度必要となる。ポリイミドの
材質によって加工できるエッチングレートが異なるため
ポリイミドの材料が異なるとショット数の条件だしが必
要になる。ポリイミドの加工が終わるとポリイミドの1
1cのような形態が得られる。
The number of shots required is about 30 to 50 in the case of 50 μm polyimide. Since the etching rate that can be processed is different depending on the material of the polyimide, if the material of the polyimide is different, the condition of the shot number is necessary. When processing of polyimide is over,
A form such as 1c is obtained.

【0025】ポリイミドの加工が終わった段階では、裏
面の銅箔20は黒化処理表面が残っており図2(a)の
状態にある。この状態では、ポリイミドの加工残渣があ
るかないか分からない状態である。さらにレーザーの加
工エネルギを銅箔の加工エネルギーを1パルス当たり
0.2Jにもどし裏面の銅箔を1,2ショット加工する
ことで黒化処理膜が除去され、銅箔20aを得ることが
できる。この状態の銅箔が得られていればポリイミドの
残渣がないことが明確となりビアの信頼性は向上する。
When the processing of the polyimide is completed, the blackened surface of the copper foil 20 on the rear surface remains in the state shown in FIG. 2 (a). In this state, whether or not there is a processing residue of polyimide is unknown. Further, the processing energy of the laser is returned to 0.2 J per pulse and the backside copper foil is processed for 1 or 2 shots, whereby the blackening treatment film is removed and the copper foil 20a can be obtained. If the copper foil in this state is obtained, it is clear that there is no polyimide residue, and the reliability of the via is improved.

【0026】この後に、めっき処理を行い、表裏の導通
を行う導通化処理を行い、配線基板の製造方法を行う。
この工程において、ビア内の加工残渣があれば、残渣が
残った部分でめっきが付かなかったため、導通不良の原
因になっていたが、残渣付着がなくなり、または発見が
容易で、事前に導通化処理後の導通不良が予測できるの
で、安定した導通化処理が可能になった。
After that, a plating process is performed, and a conduction process for conducting the front and back sides is performed to perform a method for manufacturing a wiring board.
In this process, if there was a processing residue in the via, plating was not applied to the part where the residue remained, which was the cause of poor conduction, but the residue did not adhere, or it was easy to find it, and conduction was made in advance. Since conduction failure after processing can be predicted, stable conduction processing is possible.

【0027】[0027]

【実施例】(実施例1)以下、実施例について図1,図
2を用いて詳細に説明する。9μmの銅箔10に対し、
黒化処理液(次亜塩素酸ナトリウム40g/l,水酸化
ナトリウム20g/l,リン酸三ナトリウム20g/
l,液温90℃,5分デップ処理)で両面を黒化処理
し、30μmのポリイミド11にポリイミド系の熱可塑
性接着剤(デュポン社製ポリイミド熱可塑性接着剤)1
0μmを両面に挟んで9μmの銅箔20を接着する。こ
れによって図1(a)のような両面銅箔基材が形成でき
る。
EXAMPLE 1 Example 1 will be described in detail below with reference to FIGS. 1 and 2. For 9 μm copper foil 10,
Blackening solution (sodium hypochlorite 40g / l, sodium hydroxide 20g / l, trisodium phosphate 20g /
l, liquid temperature 90 ° C., dipping treatment for 5 minutes), blackened both surfaces, and polyimide thermoplastic adhesive (polyimide thermoplastic adhesive manufactured by DuPont) on 30 μm polyimide 11 1
9 μm copper foil 20 is adhered with 0 μm sandwiched on both sides. As a result, a double-sided copper foil substrate as shown in FIG. 1 (a) can be formed.

【0028】次に、UV−YAGレーザー加工機(住友
重機械工業株式会社製LAVIAUV 2000)を使
用して、ビア形成部に60μm径のビームを照射する。
銅箔10を加工するために1パルス当たり0.2Jのエ
ネルギーで6ショット照射することで図1(c)のよう
な状態で銅箔10を除去できる。なお、2,3ショット
だと図1(b)の状態である。
Then, a UV-YAG laser beam machine (LAVIA UV 2000 manufactured by Sumitomo Heavy Industries, Ltd.) is used to irradiate the via formation portion with a beam having a diameter of 60 μm.
The copper foil 10 can be removed in a state as shown in FIG. 1C by irradiating 6 shots with energy of 0.2 J per pulse in order to process the copper foil 10. It should be noted that the state shown in FIG. 1B is obtained with a few shots.

【0029】次にポリイミド11を加工するためレーザ
ーを1パルス当たり0.2Jのエネルギーでに設定し3
0ショット照射することで図1(f)の形態が得られ
る。なお、ショット数が少ないと図1(d),(e)の
状態になる。
Next, in order to process the polyimide 11, the laser was set to 0.2 J per pulse for 3
By irradiating 0 shots, the form of FIG. 1 (f) is obtained. When the number of shots is small, the states shown in FIGS. 1D and 1E are obtained.

【0030】ポリイミドの加工が完了すると、銅箔は図
2(a)のような状態になる。この状態だとポリイミド
の加工残りが銅箔表面に存在することがあり、ビアの接
続不良になってしまうため、さらにレーザーのエネルギ
密度を銅箔加工の1パルス当たり0.2Jのエネルギー
に戻し、さらに1,2ショット照射すると図1(g)の
ように銅箔の黒化処理面が除去され、確実にポリイミド
の残渣がないことが確認できる。また図2でみると黒化
処理面にレーザーを照射することで図2(c)の導体層
20aのような状態になり、ポリイミド残渣のない加工
部が得られる。
When the processing of the polyimide is completed, the copper foil will be in the state as shown in FIG. In this state, unprocessed polyimide may remain on the copper foil surface, resulting in poor connection of vias. Therefore, the energy density of the laser is returned to 0.2 J per pulse of copper foil processing. Further irradiation with 1 or 2 shots removes the blackened surface of the copper foil as shown in FIG. 1 (g), and it can be confirmed that there is no residue of polyimide. In addition, as shown in FIG. 2, by irradiating the blackened surface with a laser, the conductor layer 20a shown in FIG. 2C is formed, and a processed portion having no polyimide residue is obtained.

【0031】本発明のレーザー加工方法を用いること
で、加工残渣のないビアの形成が可能で、さらに残渣の
有無が明確なレーザー加工が行えた。この後に、ビアを
めっき液(メルテックス株式会社製ダイレクトプレーテ
ィングプロセス)で処理し、10μm厚形成するめっき
処理を行い、表裏の導通を行う導通化処理を行い、配線
基板の製造方法を行う。残渣がなかったために導通化処
理が完全に行えた。
By using the laser processing method of the present invention, it is possible to form a via without a processing residue, and it is possible to perform laser processing in which the presence or absence of a residue is clear. After that, the vias are treated with a plating solution (direct plating process manufactured by Meltex Co., Ltd.), a plating treatment for forming a thickness of 10 μm is performed, a conduction treatment for conducting the front and back sides is performed, and a wiring board manufacturing method is performed. Since there was no residue, the conduction treatment could be completed completely.

【0032】(実施例2)以下、実施例について図3を
用いて詳細に説明する。12μmの銅箔10に、黒化処
理液(次亜塩素酸ナトリウム40g/l,水酸化ナトリ
ウム20g/l,リン酸三ナトリウム20g/l,液温
90℃,5分デップ処理)でポリイミドと貼り付ける面
を黒化処理し、30μmのポリイミド11に実施例1と
同様のポリイミド系の熱可塑性接着剤10μmを両面に
挟んで12μmの銅箔20をを接着する。これによって
図1(a)のような両面銅箔基材が形成できる。
(Embodiment 2) Hereinafter, an embodiment will be described in detail with reference to FIG. A 12 μm copper foil 10 was pasted with polyimide using a blackening treatment solution (sodium hypochlorite 40 g / l, sodium hydroxide 20 g / l, trisodium phosphate 20 g / l, solution temperature 90 ° C., 5 minutes dip treatment). The surface to be applied is blackened, and 10 μm of the same polyimide-based thermoplastic adhesive as in Example 1 is sandwiched between both sides of the polyimide 11 of 30 μm to adhere the copper foil 20 of 12 μm. As a result, a double-sided copper foil substrate as shown in FIG. 1 (a) can be formed.

【0033】次に、UV−YAGレーザー加工機を使用
して、ビア形成部に50μm径のビームを照射する。銅
箔10を加工するためにエネルギ密度20J/cm2
エネルギで10ショット照射することで図3(c)のよ
うな状態で銅箔10を除去できる。(2,3ショットだ
と図3(b)の状態)次にポリイミド11を加工するた
めレーザーのエネルギ密度を1パルス当たり0.02J
に設定し30ショット照射することで図3(f)の形態
が得られる。(ショット数が少ないと図3(d),
(e)の状態になる。)
Next, a UV-YAG laser beam machine is used to irradiate the via formation portion with a beam having a diameter of 50 μm. By irradiating 10 shots with energy having an energy density of 20 J / cm 2 to process the copper foil 10, the copper foil 10 can be removed in the state as shown in FIG. 3C. (The state of FIG. 3B for a few shots) Next, the laser energy density is 0.02 J per pulse for processing the polyimide 11.
And irradiation for 30 shots gives the form of FIG. 3 (f). (When the number of shots is small,
The state of (e) is obtained. )

【0034】ポリイミドの加工が完了すると、銅箔は図
2(a)のような状態になる。この状態だとポリイミド
の加工残りが銅箔表面に存在することがあり、ビアの接
続不良になってしまうため、さらにレーザーのエネルギ
密度を銅箔加工の1パルス当たり0.2Jに戻し、さら
に1,2ショット照射すると図3(g)のように銅箔の
黒化処理面が除去され、確実にポリイミドの残渣がない
ことが確認できる。また図2でみると黒化処理面にレー
ザーを照射することで図2(c)の20aのような状態
になり、ポリイミド残渣のない加工部が得られる。
When the processing of the polyimide is completed, the copper foil will be in a state as shown in FIG. In this state, unprocessed polyimide may be left on the copper foil surface, resulting in poor connection of vias. Therefore, the energy density of the laser is further reduced to 0.2 J per pulse of copper foil processing, and then 1 After 2 shots of irradiation, the blackened surface of the copper foil is removed as shown in FIG. 3 (g), and it can be confirmed that there is no polyimide residue. Further, as shown in FIG. 2, by irradiating the blackened surface with a laser, a state as shown by 20a in FIG. 2C is obtained, and a processed portion having no polyimide residue is obtained.

【0035】本発明のレーザー加工方法を用いること
で、請求項1と同様に加工残渣のないビアの形成が可能
で、さらに残渣の有無が明確なレーザー加工が行えた。
この後に、実施例1と同様なめっき処理を行い、表裏の
導通を行う導通化処理を行い、配線基板の製造方法を行
った結果、残渣がなかったために導通化処理が完全に行
えた。
By using the laser processing method of the present invention, it is possible to form a via without a processing residue as in the case of claim 1, and it is possible to perform laser processing in which the presence or absence of a residue is clear.
After that, the same plating treatment as in Example 1 was performed, a conduction treatment for conducting the front and back sides was performed, and a method for manufacturing a wiring board was performed. As a result, there was no residue, so that the conduction treatment was completed.

【0036】(実施例3)以下、実施例について図4を
用いて詳細に説明する。銅箔40と20に銅箔12μm
を使用し、それらを酸化処理(250℃で空気中でベー
ク20分)する。次に、実施例1と同様のポリイミドと
熱可塑性接着剤10μmを両面に挟んで銅箔と接着す
る。これによって図1(a)のような両面銅箔基材が形
成できる。
(Embodiment 3) Hereinafter, an embodiment will be described in detail with reference to FIG. 12 μm copper foil on copper foil 40 and 20
And oxidize them (bake in air at 250 ° C. for 20 minutes). Next, the same polyimide as in Example 1 and a thermoplastic adhesive of 10 μm are sandwiched on both sides and bonded to a copper foil. As a result, a double-sided copper foil substrate as shown in FIG. 1 (a) can be formed.

【0037】次に、UV−YAGレーザー加工機を使用
して、ビア形成部に60μm径のビームを照射する。銅
箔40を加工するためにエネルギ密度1パルス当たり
0.2Jのエネルギで10ショット照射することで図4
(c)のような状態で銅箔40を除去できる。なお、
2,3ショットだと図4(b)の状態になる。
Next, a UV-YAG laser beam machine is used to irradiate the via formation portion with a beam having a diameter of 60 μm. By irradiating 10 shots with an energy density of 0.2 J per pulse in order to process the copper foil 40, FIG.
The copper foil 40 can be removed in the state as shown in (c). In addition,
With a few shots, the state shown in FIG.

【0038】次にポリイミド11を加工するためレーザ
ーのエネルギ密度を1パルス当たり0.02Jに設定し
30ショット照射することで図4(f)の形態が得られ
る。なお、ショット数が少ないと図4(d),(e)の
状態になる。
Next, in order to process the polyimide 11, the energy density of the laser is set to 0.02 J per pulse and irradiation is performed for 30 shots to obtain the form of FIG. 4 (f). When the number of shots is small, the states shown in FIGS.

【0039】この状態だとポリイミドの加工残りが銅箔
表面に存在することがあり、ビアの接続不良になってし
まうため、さらにレーザーのエネルギ密度を銅箔加工の
1パルス当たり0.2Jに戻し、さらに1,2ショット
照射すると図4(g)のように銅箔の酸化処理面が除去
され、酸化処理によって光沢のない銅箔が従来の銅箔の
光沢に戻り、確実にポリイミドの残渣がないことが確認
できる。
In this state, unprocessed polyimide may remain on the surface of the copper foil, resulting in poor connection of vias. Therefore, the energy density of the laser is further returned to 0.2 J per pulse of the copper foil processing. After irradiating 1 or 2 more shots, the oxidized surface of the copper foil is removed as shown in Fig. 4 (g), and the dull copper foil returns to the gloss of the conventional copper foil by the oxidation treatment, and the polyimide residue is surely left. It can be confirmed that there is not.

【0040】銅箔40を酸化処理することで、レーザー
加工部の銅箔20aと銅箔40の光沢度のコントラスト
が大きくなり、検査機で確認する際に確認がとりやすく
なる。
By oxidizing the copper foil 40, the contrast of the glossiness between the copper foil 20a and the copper foil 40 in the laser-processed portion becomes large, and it becomes easier to confirm when checking with an inspection machine.

【0041】本発明のレーザー加工方法を用いること
で、請求項1と同様に加工残渣のないビアの形成が可能
で、さらに残渣の有無が明確なレーザー加工が行えた。
By using the laser processing method of the present invention, it is possible to form a via without a processing residue as in the first aspect, and it is possible to perform laser processing in which the presence or absence of a residue is clear.

【0042】この後に、実施例1と同様なめっき処理を
行い、表裏の導通を行う導通化処理を行い、配線基板の
製造方法を行った結果、残渣がなかったために導通化処
理が完全に行えた。
After that, the same plating treatment as in Example 1 was performed, and a conduction treatment for conducting the front and back sides was performed. As a result of carrying out the method for manufacturing the wiring board, there was no residue, so that the conduction treatment could be completely performed. It was

【0043】[0043]

【発明の効果】本発明の配線基板の製造方法を用いるこ
とで、レーザー加工の残渣のない加工が可能となり、さ
らに加工部の検査を容易にすることができた。さらに銅
箔を酸化処理する工程は、いままでのように高温で銅箔
を貼り付けする際の貼り付け時の雰囲気を気にせずに貼
り付けることができるため、コストメリットも大きい。
By using the method for manufacturing a wiring board according to the present invention, it is possible to perform processing without a residue of laser processing, and it is possible to easily inspect a processed portion. Further, in the step of oxidizing the copper foil, the copper foil can be attached without worrying about the atmosphere at the time of attaching the copper foil at a high temperature as in the past, so that the cost advantage is large.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す模式断面図である。FIG. 1 is a schematic sectional view showing an embodiment of the present invention.

【図2】図1の実施例を示す模式斜視図である。FIG. 2 is a schematic perspective view showing the embodiment of FIG.

【図3】図1の実施例とは別の本発明の一実施例を示す
模式断面図である。
FIG. 3 is a schematic cross-sectional view showing another embodiment of the present invention different from the embodiment shown in FIG.

【図4】図1及び図2の実施例とは別の本発明の一実施
例を示す模式断面図である。
FIG. 4 is a schematic cross-sectional view showing an embodiment of the present invention different from the embodiments of FIGS. 1 and 2.

【図5】従来例を示す模式断面図である。FIG. 5 is a schematic cross-sectional view showing a conventional example.

【図6】従来例を示す模式斜視図である。FIG. 6 is a schematic perspective view showing a conventional example.

【符号の説明】[Explanation of symbols]

10・・・導体層 10a・・レーザー加工後の導体層 10b・・レーザー加工後の導体層 11・・・絶縁層 11a・・レーザー加工後の絶縁層 11b・・レーザー加工後の絶縁層 11c・・レーザー加工後の絶縁層 12・・・導体層 20・・・黒化あるいは酸化処理後の導体層 20a・・レーザー加工後の導体層 30・・・片面が黒化あるいは酸化処理後の導体層 30a・・・レーザー加工後の導体層 40・・・黒化あるいは酸化処理後の導体層 40a・・レーザー加工後の導体層 40b・・レーザー加工後の導体層 10 ... Conductor layer 10a ... Conductor layer after laser processing 10b ... Conductor layer after laser processing 11 ... Insulating layer 11a..Insulation layer after laser processing 11b..Insulation layer after laser processing 11c..Insulation layer after laser processing 12 ... Conductor layer 20 ... Conductor layer after blackening or oxidation treatment 20a ... Laser processed conductor layer 30 ... Conductor layer after blackening or oxidation on one side 30a ... Conductor layer after laser processing 40 ... Conductor layer after blackening or oxidation treatment 40a ... Conductor layer after laser processing 40b ··· Conductor layer after laser processing

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】絶縁層の一方の面に、導通ビアの底部とな
る銅層が形成されてなる材料を用い、前記銅層に達する
ように絶縁層側からレーザー加工を行い、加工された穴
の内部に導通化処理を行う配線基板の製造方法におい
て、 レーザー加工を行う前に、前記銅層の絶縁層に接する面
の少なくとも導通ビアの底部となる部分に、着色処理を
施しておくことを特徴とする配線基板の製造方法。
1. A hole processed by laser processing from the insulating layer side so as to reach the copper layer by using a material in which a copper layer which is a bottom of a conductive via is formed on one surface of the insulating layer. In the method for manufacturing a wiring board in which the inside of the copper layer is subjected to a conduction treatment, it is preferable to perform a coloring treatment on at least a bottom portion of the conduction via of a surface of the copper layer in contact with the insulating layer before performing the laser processing. A method for manufacturing a characteristic wiring board.
【請求項2】前記絶縁層の他方の面にも銅層が形成され
ており、前記他方の面の銅層の、絶縁層とは反対面にも
着色処理を施しておくことを特徴とする請求項1記載の
配線基板の製造方法。
2. A copper layer is also formed on the other surface of the insulating layer, and the copper layer on the other surface is also colored on the surface opposite to the insulating layer. The method for manufacturing a wiring board according to claim 1.
【請求項3】前記レーザー加工として、前記一方の面の
銅層に達した後、着色処理された部分を除去する加工を
さらに行うことを特徴とする請求項1または請求項2記
載の配線基板の製造方法。
3. The wiring board according to claim 1, further comprising, as the laser processing, processing for removing a colored portion after reaching the copper layer on the one surface. Manufacturing method.
【請求項4】前記レーザー加工にUV−YAGレーザー
を用いることを特徴とする請求項1乃至請求項3のいず
れか一項記載の配線基板の製造方法。
4. The method of manufacturing a wiring board according to claim 1, wherein a UV-YAG laser is used for the laser processing.
【請求項5】前記着色処理が酸化処理であることを特徴
とする請求項1乃至請求項4のいずれか一項記載の配線
基板の製造方法。
5. The method of manufacturing a wiring board according to claim 1, wherein the coloring treatment is an oxidation treatment.
JP2001188624A 2001-06-21 2001-06-21 Wiring board manufacturing method Pending JP2003008174A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001188624A JP2003008174A (en) 2001-06-21 2001-06-21 Wiring board manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001188624A JP2003008174A (en) 2001-06-21 2001-06-21 Wiring board manufacturing method

Publications (1)

Publication Number Publication Date
JP2003008174A true JP2003008174A (en) 2003-01-10

Family

ID=19027696

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2003008174A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013073638A1 (en) 2011-11-18 2013-05-23 旭硝子株式会社 Curable composition, composition for application, cured film, laser processing method, and manufacturing method for multi-layer wiring structure
CN116261273A (en) * 2023-03-08 2023-06-13 广州广合科技股份有限公司 Manufacturing method of HDI printed circuit board and HDI printed circuit board

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6199596A (en) * 1984-10-22 1986-05-17 Hitachi Ltd How to drill holes in the board
JPH1085976A (en) * 1996-09-10 1998-04-07 Matsushita Electric Ind Co Ltd Laser processing apparatus and laser processing method
JPH11300487A (en) * 1998-04-20 1999-11-02 Sony Corp Drilling method and drilled body
JP2001102720A (en) * 1999-07-27 2001-04-13 Matsushita Electric Works Ltd Method for machining printed wiring board

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6199596A (en) * 1984-10-22 1986-05-17 Hitachi Ltd How to drill holes in the board
JPH1085976A (en) * 1996-09-10 1998-04-07 Matsushita Electric Ind Co Ltd Laser processing apparatus and laser processing method
JPH11300487A (en) * 1998-04-20 1999-11-02 Sony Corp Drilling method and drilled body
JP2001102720A (en) * 1999-07-27 2001-04-13 Matsushita Electric Works Ltd Method for machining printed wiring board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013073638A1 (en) 2011-11-18 2013-05-23 旭硝子株式会社 Curable composition, composition for application, cured film, laser processing method, and manufacturing method for multi-layer wiring structure
CN116261273A (en) * 2023-03-08 2023-06-13 广州广合科技股份有限公司 Manufacturing method of HDI printed circuit board and HDI printed circuit board

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