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JP2000081575A - Specimen retaining device of microscope - Google Patents

Specimen retaining device of microscope

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Publication number
JP2000081575A
JP2000081575A JP10252279A JP25227998A JP2000081575A JP 2000081575 A JP2000081575 A JP 2000081575A JP 10252279 A JP10252279 A JP 10252279A JP 25227998 A JP25227998 A JP 25227998A JP 2000081575 A JP2000081575 A JP 2000081575A
Authority
JP
Japan
Prior art keywords
sample
specimen
holding device
main body
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10252279A
Other languages
Japanese (ja)
Other versions
JP4208302B2 (en
Inventor
Minoru Sukegawa
実 祐川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP25227998A priority Critical patent/JP4208302B2/en
Publication of JP2000081575A publication Critical patent/JP2000081575A/en
Application granted granted Critical
Publication of JP4208302B2 publication Critical patent/JP4208302B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To attach and detach a specimen by simple operation. SOLUTION: This specimen retaining device is provided with a retaining device body 1 supported on a stage of a microscope, at least one specimen abutting device (5, 6, 7, 8) arranged on the retaining device body 1, a specimen pressurizing means (3, 4) mounted rotatably on the retaining device body 1, and an operation control mechanism (1d, 3, 4, 5, 6, 7, 8, 9) wherein this specimen pressurizing means is opened before the specimen is retained, and the specimen pressurizing means is rotated and retains the specimen 2 when the specimen 2 is inserted, and when the specimen 2 is inserted further, the above-mentioned specimen pressurizing means is made open to push out the specimen 2.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、スライドガラスな
どの標本を顕微鏡のステージに保持する顕微鏡の標本保
持装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microscope sample holding apparatus for holding a sample such as a slide glass on a microscope stage.

【0002】[0002]

【従来の技術】顕微鏡の検鏡作業、例えば細胞診などで
は、1日に数百枚というスライドガラスを交換しながら
観察しているので、このような標本保持装置には、標本
の着脱が簡単にできることが望まれている。従来、この
ような標本保持装置には、実開昭56−137113号
(従来技術1)、実開昭63−155118号(従来技
術2)、実公昭57−51372号(従来技術3)およ
び実開平6−15019号(従来技術4)の各公報に所
載の技術が開示されており、それぞれ標本の着脱性の改
良を課題としている。
2. Description of the Related Art In microscopy work of a microscope, for example, cytology, observation is performed while exchanging several hundred slide glasses a day. It is hoped that it can be done. Conventionally, such specimen holding devices include Japanese Utility Model Laid-Open No. 56-137113 (Prior Art 1), Japanese Utility Model Laid-Open No. 63-155118 (Prior Art 2), Japanese Utility Model Publication No. 57-51372 (Prior Art 3) and The technology disclosed in each gazette of Japanese Unexamined Patent Publication No. Hei 6-15019 (prior art 4) is disclosed, and it is an object to improve the detachability of each sample.

【0003】従来技術1では、標本が挿入し易いよう
に、挿入口にR面または斜面を形成し、それらの先端間
隔を標本よりも大きく設定している。従来技術2では、
一対の標本押え部材を左右対象に配設し、一方の標本押
え部材の開閉に、他方の標本押え部材が連動して開閉す
るようにしている。従来技術3では、標本の導入に連動
して、回転する2つの回転部材を設けて、案内部材に沿
って標本を案内すれば、標本を所定の位置に保持固定し
得るようにしている。従来技術4では、標本を保持する
回転爪に連動して、標本を手前側に押し出すための押出
部材を設けて、標本の取り出しを容易にしている。
In the prior art 1, an R-shaped surface or an inclined surface is formed in the insertion opening so that the sample can be easily inserted, and the interval between the tips is set to be larger than that of the sample. In prior art 2,
A pair of sample holding members are arranged symmetrically to each other so that opening and closing of one sample holding member opens and closes in conjunction with opening and closing of the other sample holding member. In the prior art 3, two rotating members that rotate in synchronization with the introduction of the sample are provided, and the sample can be held and fixed at a predetermined position by guiding the sample along the guide member. In the prior art 4, an extruding member for pushing the sample toward the near side is provided in conjunction with the rotating claw that holds the sample, thereby facilitating removal of the sample.

【0004】[0004]

【発明が解決しようとする課題】しかるに、上記従来技
術には、つぎのような問題点があった。すなわち、従来
技術1および従来技術2の標本保持装置では、標本を挿
入するときに、標本により標本押え部材を押し開きなが
ら、標本を挿入しなければならず、ある程度正確に標本
を導くことが要求される。また、標本を取り出す時は、
従来技術3の標本保持装置を含めて、標本を指で直接引
き出さねばならず、滑りやすく取り出しが困難である。
さらに、従来技術4の標本保持装置では、回転爪を操作
するために、図11に示すように、標本より奥、すなわ
ち対物レンズより奥に配された操作部のつまみを操作す
る必要があり、対物レンズの陰になるので、かなり煩わ
しい作業となる。
However, the above prior art has the following problems. That is, in the sample holding devices of the prior art 1 and the prior art 2, when inserting a sample, the sample must be inserted while pushing the sample holding member open with the sample, and it is required that the sample be guided to some extent accurately. Is done. Also, when removing the specimen,
The sample, including the sample holding device of the prior art 3, must be directly pulled out with a finger, and it is slippery and difficult to take out.
Furthermore, in the sample holding device of the prior art 4, in order to operate the rotating claw, it is necessary to operate a knob of an operation unit disposed behind the sample, that is, behind the objective lens, as shown in FIG. Since it is behind the objective lens, the operation is rather troublesome.

【0005】本発明は、上記従来の問題点に鑑みてなさ
れたもので、請求項1、2または3に係る発明の課題
は、簡単な操作で標本を容易に着脱することができる顕
微鏡の標本保持装置を提供することである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems, and an object of the invention according to claims 1, 2 and 3 is to provide a microscope specimen which can be easily attached and detached by a simple operation. It is to provide a holding device.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するため
に、請求項1、2または3に係る発明は、顕微鏡の標本
保持装置において、顕微鏡ステージ上に支持された保持
装置本体と、該保持装置本体に設けられた少なくとも一
つの標本当接手段と、前記保持装置本体に回転自在に装
着された標本押圧手段と、標本保持前は前記標本押圧手
段が開放されており、標本を挿入すると前記標本押圧手
段が回転して標本を保持し、標本を更に押し込むと前記
標本押圧手段が開放され標本が押し出される作動制御機
構とを備えた。
In order to solve the above-mentioned problems, the invention according to claim 1, 2 or 3 is directed to a sample holding device for a microscope, comprising: a holding device main body supported on a microscope stage; At least one sample abutting means provided on the apparatus main body, a sample pressing means rotatably mounted on the holding apparatus main body, and the sample pressing means is opened before holding the sample, and the sample is inserted when the sample is inserted. An operation control mechanism is provided in which the sample pressing means rotates to hold the sample, and when the sample is further pushed in, the sample pressing means is opened and the sample is pushed out.

【0007】請求項1、2または3に係る発明の顕微鏡
の標本保持装置では、作動制御機構により、標本保持前
は標本押圧手段が開放されており、標本を挿入すると標
本押圧手段が回転して標本を保持し、標本を更に押し込
むと標本押圧手段が開放され標本が押し出される。請求
項2または3に係る発明の顕微鏡の標本保持装置では、
上記作用に加え、標本当接手段に標本が当接して、該標
本当接手段が移動し、標本押圧手段が回転して標本を保
持する。請求項3に係る発明の顕微鏡の標本保持装置で
は、上記作用に加え、標本取出し時に、標本を挿入した
方向に標本を介して標本当接手段を押圧すると、標本押
圧手段が標本保持方向と逆方向に回転するとともに、標
本当接手段が標本を押し出す。
In the sample holding device for a microscope according to the first, second or third aspect of the present invention, the sample pressing means is opened before the sample is held by the operation control mechanism, and when the sample is inserted, the sample pressing means is rotated. When the sample is held and the sample is further pushed in, the sample pressing means is opened and the sample is pushed out. In the specimen holding device for a microscope according to the invention according to claim 2 or 3,
In addition to the above operation, the sample comes into contact with the sample contact means, the sample contact means moves, and the sample pressing means rotates to hold the sample. In the sample holding device of the microscope according to the third aspect of the present invention, in addition to the above operation, when the sample abutment means is pressed through the sample in the direction in which the sample is inserted at the time of removing the sample, the sample pressing means reverses the sample holding direction. While rotating in the direction, the sample abutting means pushes the sample.

【0008】[0008]

【発明の実施の形態】以下、具体的な実施の形態につい
て説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Specific embodiments will be described below.

【0009】(実施の形態1)図1〜図5は実施の形態
1を示し、図1は標本保持装置の標本押圧部材が開放状
態の平面図、図2は標本保持装置の標本押圧部材が保持
状態の平面図、図3は標本保持装置の標本押圧部材が開
放開始直前の状態の平面図、図4は標本保持装置の第1
の変形例を示す平面図、図5は標本保持装置の第2の変
形例を示す平面図である。
(Embodiment 1) FIGS. 1 to 5 show Embodiment 1, FIG. 1 is a plan view of a sample holding device in a state where a sample pressing member is opened, and FIG. FIG. 3 is a plan view of the sample holding device in a state immediately before the opening of the sample holding member, and FIG. 4 is a first view of the sample holding device.
FIG. 5 is a plan view showing a second modification of the sample holding device.

【0010】図1において、標本保持装置の保持装置本
体としての本体1は、図示しない顕微鏡ステージ上に支
持されている。本体1の右前側には、標本当接手段の一
つとして、標本2の挿入方向に本体当接部1aと、挿入
方向と直角の方向に本体当接部1bとが形成されてい
る。また、本体1の左側には、標本押圧部材3が配設さ
れ、その回転軸3aは本体1に回転自在に装着されてい
る。標本押圧部材3には、回転軸3aの半径方向に突出
した突起部3bと、標本2に当接して押圧する標本当接
部3cとが形成されている。本体1と標本押圧部材3と
の間には、捩じりバネ4が配設され、本体1には本体側
支持部4aにより、標本押圧部材3には標本押圧側支持
部4bによりそれぞれ固着され、標本押圧部材3が開放
されているときは、図1に示すように、矢印Aの方向に
弾発力が作用し、標本押圧部材3を右回りに回転させ
る。本体1には、標本押圧部材3の突起部3bの近傍
に、ピン9が立設され、このピン9に突起部3bが当接
して、標本押圧部材3の右回りの回転を制限している。
標本押圧部材3と捩じりバネ4とにより標本押圧手段を
構成している。
In FIG. 1, a main body 1 as a main body of a holding device of a sample holding device is supported on a microscope stage (not shown). On the right front side of the main body 1, a main body abutting portion 1a is formed as a sample abutting means in the inserting direction of the sample 2, and a main body abutting portion 1b is formed in a direction perpendicular to the inserting direction. A specimen pressing member 3 is provided on the left side of the main body 1, and its rotation shaft 3 a is rotatably mounted on the main body 1. The sample pressing member 3 is formed with a protrusion 3b protruding in the radial direction of the rotation shaft 3a and a sample contact portion 3c that contacts and presses the sample 2. A torsion spring 4 is disposed between the main body 1 and the sample pressing member 3, and is fixed to the main body 1 by a main body side supporting portion 4a and to the sample pressing member 3 by a sample pressing side supporting portion 4b. When the sample pressing member 3 is opened, an elastic force acts in the direction of arrow A to rotate the sample pressing member 3 clockwise as shown in FIG. A pin 9 is erected on the main body 1 in the vicinity of the projection 3b of the sample pressing member 3, and the projection 3b abuts on the pin 9 to limit clockwise rotation of the sample pressing member 3. .
The sample pressing member 3 and the torsion spring 4 constitute a sample pressing unit.

【0011】本体1には、本体当接部1aと並列に、標
本挿入方向に直進移動自在な第1の標本当接部材5が配
設されている。第1の標本当接部材5と本体1との間に
は、圧縮バネ6が装着され、第1の標本当接部材5は弾
発力により標本2側に付勢されている。第1の標本当接
部材5には、第1突起部5aが形成され、本体1の溝部
1cに係止して、第1の標本当接部材5の移動範囲を制
限している。また、第1の標本当接部材5に隣接して、
同様に直進移動自在な第2の標本当接部材7が配設され
ている。第2の標本当接部材7と本体1との間には、圧
縮バネ8が装着され、第2の標本当接部材7は弾発力に
より標本2側および第1の標本当接部材5側に付勢され
ている。第2の標本当接部材7には、切欠き部7bが凹
設され、標本押圧部材3の突起部3bに係止して、第2
の標本当接部材7の移動範囲を制限している。
The main body 1 is provided with a first specimen contact member 5 which is movable in a straight line in the specimen insertion direction in parallel with the main body contact portion 1a. A compression spring 6 is mounted between the first sample contact member 5 and the main body 1, and the first sample contact member 5 is urged toward the sample 2 by an elastic force. The first sample contact member 5 is formed with a first protrusion 5a, which is engaged with the groove 1c of the main body 1 to limit the moving range of the first sample contact member 5. Also, adjacent to the first specimen contact member 5,
Similarly, a second specimen contact member 7 that can move linearly is provided. A compression spring 8 is mounted between the second sample contact member 7 and the main body 1, and the second sample contact member 7 is resilient to the sample 2 side and the first sample contact member 5 side Has been energized. The second specimen contact member 7 has a notch 7b recessed therein, which is engaged with the projection 3b of the specimen pressing member 3 and
Of the sample contact member 7 is limited.

【0012】また、第1の標本当接部材5の第2の標本
当接部材7に隣接する側には、第2突起部5bが凸設さ
れ、第2の標本当接部材7には、標本2を保持するとき
に第2突起部5bに係合する箇所に切欠き7aが凹設さ
れている。また、第2の標本当接部材7を圧縮バネ8に
抗して押し込んだときに、第2の標本当接部材7の後端
部7cが当接すると、第1の標本当接部材5から離れる
方向に移動させる斜面部1dが、本体1に形成されてい
る。第1の標本当接部材5、圧縮バネ6、第2の標本当
接部材7および圧縮バネ8により、もう一つの標本当接
手段を構成している。また、本体1に形成された斜面部
1d、標本押圧部材3、捩じりバネ4、第1の標本当接
部材5、圧縮バネ6、第2の標本当接部材7、圧縮バネ
8およびピン9により作動制御機構を構成している。
On the side of the first sample contact member 5 adjacent to the second sample contact member 7, a second protrusion 5 b is provided so as to project therefrom. A notch 7a is recessed at a position where the sample 2 is engaged with the second protrusion 5b when the sample 2 is held. When the rear end portion 7c of the second sample contact member 7 comes into contact when the second sample contact member 7 is pushed in against the compression spring 8, the first sample contact member 5 An inclined surface portion 1d to be moved in a separating direction is formed in the main body 1. The first sample contact member 5, the compression spring 6, the second sample contact member 7 and the compression spring 8 constitute another sample contact means. Further, a slope portion 1d formed on the main body 1, a sample pressing member 3, a torsion spring 4, a first sample contact member 5, a compression spring 6, a second sample contact member 7, a compression spring 8, and a pin 9 constitutes an operation control mechanism.

【0013】つぎに、上記構成の標本保持装置の作用に
ついて説明する。標本2を保持する前には、図1に示す
ように、標本押圧部材3は、捩じりバネ4の弾発力によ
り、突起部3bがピン9に当接していて標本押圧部材3
は開放され、標本当接部3cと本体1の本体当接部1b
との間隔は、標本2の長手方向の寸法よりも十分大きく
開いている。圧縮バネ8の弾発力により、第2の標本押
圧部材7の切欠き部7bが標本押圧部材3の突起部3b
に当接し、第1の標本押圧部材5よりも標本側に突出し
た状態で静止している。
Next, the operation of the sample holding device having the above configuration will be described. Before holding the sample 2, as shown in FIG. 1, the sample pressing member 3 is pressed by the resilient force of the torsion spring 4 so that the projection 3 b is in contact with the pin 9.
Is opened, and the sample contact portion 3c and the main body contact portion 1b of the main body 1 are opened.
Are sufficiently larger than the longitudinal dimension of the specimen 2. Due to the resiliency of the compression spring 8, the notch 7b of the second sample pressing member 7 is turned into the protrusion 3b of the sample pressing member 3.
, And stands still with the first sample pressing member 5 protruding toward the sample.

【0014】つぎに、図2に示すように、十分大きく開
いている標本押圧部材3の標本当接部3cと本体1の本
体当接部1bとの間に、標本2を滑り込ませ、標本当接
部材7を押すと、切欠き部7bが標本押圧部材3の突起
部3bを押して、標本押圧部材3を回転させる。ある程
度回転させると、捩じりバネ4の弾発力の作用する方向
の変極点を超え、標本押圧部材3が標本2を押圧する方
向(矢印Bの方向)すなわち左回りに捩じりバネ4の弾
発力が作用する。さらに、標本2を第1の標本当接部材
5に当接するまで押し込むと第2突起部5bが第2の標
本当接部材7の切欠き部7aに落ち込み、第1の標本当
接部材5と第2の標本当接部材7との標本2に当接する
面が同一面になり、標本2は静止し保持される。このと
き、標本2は、本体1の本体当接部1a、1bにも当接
している。
Next, as shown in FIG. 2, the sample 2 is slid between the sample abutting portion 3c of the sample pressing member 3 and the body abutting portion 1b of the main body 1 which are sufficiently wide open. When the contact member 7 is pressed, the notch 7b pushes the projection 3b of the sample pressing member 3 to rotate the sample pressing member 3. When the torsion spring 4 is rotated to some extent, it exceeds the inflection point in the direction in which the elastic force of the torsion spring 4 acts, and the sample pressing member 3 presses the sample 2 (in the direction of arrow B), that is, counterclockwise. Resilience acts. Further, when the sample 2 is pushed until it comes into contact with the first sample contact member 5, the second protrusion 5b falls into the notch 7a of the second sample contact member 7, and the first sample contact member 5 The surface of the second sample contact member 7 that contacts the sample 2 is the same, and the sample 2 is held stationary. At this time, the specimen 2 is also in contact with the main body contact portions 1a and 1b of the main body 1.

【0015】つぎに、標本2を取り外すときは、図3に
示すように、標本2をさらに挿入方向に押し込む。標本
2を押し込むと、第1の標本当接部材5と第2の標本当
接部材7とが、それぞれ圧縮バネ6、8の弾発力に抗し
て移動し、第2の標本当接部材7の後端部7cは、本体
1の斜面部1dに沿って移動する。すると、第2の標本
当接部材7は第1の標本当接部材5から離れていき、第
2突起部5bが切欠き部7aから外れる。この状態で標
本2から手を離すか、もしくは押す力を緩めれば、第1
の標本当接部材5と第2の標本当接部材7とがそれぞれ
圧縮バネ6、8の弾発力により、標本2を押し出しなが
ら、図1の状態に戻り、第2の標本当接部材7が第1の
標本当接部材5よりも突出した位置に静止する。このと
き、標本押圧部材3の突起部3bが切欠き部7bに当接
して、標本押圧部材3が回転し、捩じりバネ4の弾発力
の変極点を超え、標本押圧部材3を開放する方向(図1
矢印Aの方向)に弾発力が加わり、突起部3bがピン9
に当接して静止する。
Next, when removing the specimen 2, the specimen 2 is further pushed in the insertion direction as shown in FIG. When the specimen 2 is pushed in, the first specimen contact member 5 and the second specimen contact member 7 move against the elastic forces of the compression springs 6 and 8, respectively, and the second specimen contact member The rear end 7c moves along the slope 1d of the main body 1. Then, the second sample contact member 7 moves away from the first sample contact member 5, and the second protrusion 5b comes off the notch 7a. In this state, if you release your hand from specimen 2 or loosen the pressing force,
The sample contact member 5 and the second sample contact member 7 return to the state shown in FIG. 1 while pushing out the sample 2 by the resilient force of the compression springs 6 and 8, respectively. Stops at a position protruding from the first specimen contact member 5. At this time, the projection 3b of the sample pressing member 3 comes into contact with the notch 7b, and the sample pressing member 3 rotates, exceeding the reversal point of the elastic force of the torsion spring 4, and opening the sample pressing member 3. Direction (Fig. 1
An elastic force is applied in the direction of arrow A), and the projection 3b is
Abut on and stand still.

【0016】本実施の形態によれば、簡単な操作で標本
を容易に着脱することができる。また、標本押圧部材の
当接部と本体の当接部との間隔が標本の長手方向の寸法
よりも十分大きく開いているので、標本挿入時の精度が
ラフでもよい。また、標本を取り出すときも、挿入方向
に標本をワンプッシュするのみで済む。
According to the present embodiment, the sample can be easily attached and detached by a simple operation. In addition, since the distance between the contact portion of the sample pressing member and the contact portion of the main body is sufficiently larger than the length of the sample in the longitudinal direction, accuracy in inserting the sample may be rough. Also, when removing the specimen, it is only necessary to push the specimen in the insertion direction.

【0017】本実施の形態では、標本押圧部材の回転を
捩じりバネの弾発力によったが、圧縮コイルバネやゴム
などの弾性部材に替えてもよい。また、図4に示すよう
に、標本押圧部材に掛ける位置を変更して引張りバネ4
Aに替えてもよい。さらに、標本当接部材を付勢するの
に、圧縮バネを用いているが、ストロークを確保できれ
ば、ゴム等の弾性部材に替えてもよい。
In this embodiment, the rotation of the sample pressing member is based on the elastic force of the torsion spring, but may be replaced by an elastic member such as a compression coil spring or rubber. Further, as shown in FIG. 4, the position of the tension
A may be substituted. Further, a compression spring is used to bias the sample contact member, but may be replaced with an elastic member such as rubber if a stroke can be secured.

【0018】また、図5に示すように、本体当接部1a
を除去した本体1Aとし、幅の大きな第1の標本当接部
材5Aと第2の標本当接部材7とにより、標本2を挿入
方向で受けることもできる。
As shown in FIG. 5, the main body contact portion 1a
The sample 2 can be received in the insertion direction by the first sample abutting member 5A and the second sample abutting member 7 having a large width.

【0019】(実施の形態2)図6〜図10は実施の形
態2を示し、図6は標本保持装置の標本押圧部材が開放
状態の平面図、図7は標本保持装置の標本押圧部材が保
持状態の平面図、図8は標本保持装置の作動制御機構の
縦断面図、図9は標本保持装置の作動制御機構の平面
図、図10は作動制御機構の作動制御溝の平面図であ
る。
(Embodiment 2) FIGS. 6 to 10 show Embodiment 2, FIG. 6 is a plan view of a sample holding device of a sample holding device in an open state, and FIG. 8 is a longitudinal sectional view of an operation control mechanism of the sample holding device, FIG. 9 is a plan view of an operation control mechanism of the sample holding device, and FIG. 10 is a plan view of an operation control groove of the operation control mechanism. .

【0020】図6において、標本保持装置の保持装置本
体としての本体11は、図示しない顕微鏡ステージ上に
支持されている。本体11の上面には、壁11aが周設
され、壁11a上に蓋20が取着され、上面を被覆して
いる。また、本体11の上面には、左右対象位置に、一
対の回転軸15、16が立設されている。この回転軸1
5、16には、標本12を挟み込むため勝手の異なる一
対の標本押圧部材13、14が回転自在に嵌装されてい
る。標本押圧部材13、14は、それぞれ内アーム13
a、14a、外アーム13b、14b、標本当接部13
c、14cにより形成されている。標本押圧部材13、
14は互いに、それぞれに立設されたバネ支持部材13
A、14Aにて支持された捩じりバネ17により連結さ
れている。標本12を保持するときは、標本押圧部材1
3、14が標本12を挟み込む方向(図7矢印Dの方
向)に弾発力が作用し、標本12を保持していないとき
は、標本押圧部材13、14が互いに開く方向(図6矢
印Cの方向)に弾発力が作用する。標本押圧部材13、
14、バネ支持部材13A、14Aおよび捩じりバネ1
7により、標本押圧手段を構成している。
In FIG. 6, a main body 11 as a main body of a holding device of the sample holding device is supported on a microscope stage (not shown). A wall 11a is provided around the upper surface of the main body 11, and a lid 20 is attached on the wall 11a to cover the upper surface. A pair of rotating shafts 15 and 16 are erected on the upper surface of the main body 11 at left and right target positions. This rotating shaft 1
A pair of specimen pressing members 13 and 14 having different abilities to hold the specimen 12 therebetween are rotatably fitted to the specimens 5 and 16. The sample pressing members 13 and 14 are respectively
a, 14a, outer arms 13b, 14b, specimen contact portion 13
c, 14c. Specimen pressing member 13,
14 are spring support members 13 erected from each other.
A and A are connected by a torsion spring 17 supported by 14A. When holding the sample 12, the sample pressing member 1
When the resilient force acts in the direction in which the specimens 3 and 14 sandwich the specimen 12 (the direction of arrow D in FIG. 7) and the specimen 12 is not held, the specimen pressing members 13 and 14 open in the direction in which the specimens 12 are opened (arrow C in FIG. 6). Direction). Specimen pressing member 13,
14, spring support members 13A, 14A and torsion spring 1
7 constitutes a sample pressing means.

【0021】また、本体11には、標本12がその挿入
方向に当接する標本当接部材18が直進移動自在に配設
され、圧縮バネ19により標本12側に付勢されてい
る。標本当接部材18には、標本押圧部材13、14の
内アーム13a、14aが当接し、移動量を規制する位
置に、切欠き27、28が凹設され、それぞれ前当接面
27a、28aおよび後当接面27b、28bが形成さ
れている。さらに、本体11の壁11aには、標本押圧
部材13、14の外アーム13b、14bが当接し、標
本押圧部材13、14の開放位置を規制する当接部11
b、11cが形成されている。標本当接部材18と圧縮
バネ19とにより、標本当接手段を構成している。
A sample contact member 18 with which the sample 12 abuts in the insertion direction is disposed on the main body 11 so as to be able to move straight, and is urged toward the sample 12 by a compression spring 19. The notch 27, 28 is recessed at the position where the inner arms 13a, 14a of the sample pressing members 13, 14 abut on the sample abutting member 18 and regulates the amount of movement, and the front abutting surfaces 27a, 28a, respectively. Further, rear contact surfaces 27b and 28b are formed. Furthermore, the outer arms 13b and 14b of the sample pressing members 13 and 14 abut against the wall 11a of the main body 11, and the contact portions 11 that regulate the open positions of the sample pressing members 13 and 14.
b, 11c are formed. The specimen contact member 18 and the compression spring 19 constitute a specimen contact means.

【0022】図8および図9に示すように、本体11に
取着された蓋20には、軸21が嵌装され、蓋20の表
面側に突出した軸21に、板バネ22が回動自在に取着
されている。板バネ22には、ピン23が取着され、蓋
20に穿設された長穴24内を軸21周りに回動するこ
とができるようになっている。標本当接部材18には、
板バネ22に取着されたピン23がガイドされる作動制
御溝25が刻設されている。作動制御溝25は、図10
に示すように、通常プッシュオン−プッシュオフスイッ
チで用いられる環状溝のように、分岐部分25a、25
b、25c、25dで段差になっており、標本当接部材
18の前後動によるピン23の移動は、溝25に沿って
矢印Eの方向に、即ち一方向のみに動くようになってい
る。蓋20、軸21、板バネ22、ピン23および標本
当接18に刻設された作動制御溝25により、作動制御
機構を構成している。
As shown in FIGS. 8 and 9, a shaft 21 is fitted on the cover 20 attached to the main body 11, and a leaf spring 22 is rotated on the shaft 21 protruding toward the surface of the cover 20. It is freely attached. A pin 23 is attached to the leaf spring 22 so that the leaf spring 22 can rotate around an axis 21 in an elongated hole 24 formed in the lid 20. The sample contact member 18 includes
An operation control groove 25 for guiding the pin 23 attached to the leaf spring 22 is formed. The operation control groove 25 corresponds to FIG.
As shown in the figure, the branch portions 25a, 25 like the annular groove normally used in a push-on-push-off switch.
There are steps at b, 25c, and 25d, and the movement of the pin 23 due to the forward and backward movement of the sample contact member 18 moves in the direction of arrow E along the groove 25, that is, only in one direction. An operation control mechanism is constituted by the lid 20, the shaft 21, the leaf spring 22, the pin 23, and the operation control groove 25 formed in the specimen contact 18.

【0023】つぎに、上記構成の標本保持装置の作用に
ついて説明する。標本12を保持する前には、図6に示
すように、標本押圧部材13、14は、捩じりバネ17
の弾発力により、矢印Cの方向に付勢され、それぞれ、
外アーム13b、14bが本体11の当接部11b、1
1cに当接していて、標本押圧部材13、14は開放さ
れ、標本当接部13c、14cの間隔は、標本12の長
手方向の寸法よりも十分大きく開いている。この状態
で、ピン23は、図10のアの位置に静止している。
Next, the operation of the sample holding device having the above configuration will be described. Before holding the sample 12, as shown in FIG.
Urged in the direction of arrow C by
The outer arms 13b, 14b are connected to the contact portions 11b, 1
1c, the sample pressing members 13, 14 are opened, and the interval between the sample abutting portions 13c, 14c is sufficiently larger than the length of the sample 12 in the longitudinal direction. In this state, the pin 23 is stationary at the position A in FIG.

【0024】つぎに、図7に示すように、十分大きく開
いている標本押圧部材13、14の標本当接部13c、
14c(鎖線で図示)の間に、標本2を滑り込ませ、標
本当接部材18を押すと、前当接面27a、28aが標
本押圧部材13、14の内ア−ム13a、14aを押し
て、標本押圧部材13、14を回転させる。ある程度回
転させると、捩じりバネ17の弾発力の作用する方向の
変極点を超え、標本押圧部材13、14の標本当接部1
3c、14cが標本12を押圧する方向(矢印Dの方
向)に弾発力が作用する。このとき、ピン23は、溝2
5を図10のアからイまで移動し、ここで標本12から
手を離せば、圧縮バネ19の弾発力により、ピン23は
ウの位置に静止し、標本当接部13c、14c(実線で
図示)により標本12が固定される。
Next, as shown in FIG. 7, the sample abutting portions 13c of the sample pressing members 13, 14 which are sufficiently wide open,
When the specimen 2 is slid and the specimen contact member 18 is pressed during the period 14c (shown by a chain line), the front contact surfaces 27a and 28a push the inner arms 13a and 14a of the specimen pressing members 13 and 14, respectively. The specimen pressing members 13 and 14 are rotated. When the torsion spring 17 is rotated to some extent, it exceeds the inflection point in the direction in which the elastic force of the torsion spring 17 acts, and the sample abutting portions 1 of the sample pressing members 13 and 14
An elastic force acts in the direction in which the specimens 3c and 14c press the specimen 12 (the direction of arrow D). At this time, the pin 23 is
5 is moved from a to a in FIG. 10, and when the hand is released from the sample 12, the pin 23 is stopped at the position of c by the elastic force of the compression spring 19, and the sample contact portions 13 c and 14 c (solid lines) Sample 12) is fixed.

【0025】標本12を取り出すとき、標本12を挿入
方向に押し込むと、ピン23が溝25のエの位置(図1
0参照)に移動し、ここで、標本12から手を離せば、
ピン23がアの位置(図10参照)に戻り、標本当接部
材18が標本12を押し出すとともに、後当接面27
b、28bが標本押圧部材13、14の後アーム14
a、14bに当接し、標本押圧部材13、14を回転さ
せ、捩じりバネ17の弾発力の作用する方向の変極点を
超え、標本押圧部材13、14を開く方向(図6Cの方
向)に捩じりバネ17の弾発力が作用し、本体11の当
接部11b、11cに当接して静止する。
When the specimen 12 is taken out, the specimen 12 is pushed in the insertion direction, and the pin 23 is moved to the position of the groove 25 (FIG. 1).
0), and if you release your hand from the specimen 12,
The pin 23 returns to the position A (see FIG. 10), the sample contact member 18 pushes out the sample 12, and the rear contact surface 27
b, 28b are the rear arms 14 of the sample pressing members 13, 14.
a, 14b, the specimen pressing members 13, 14 are rotated, exceeding the inflection point in the direction in which the elastic force of the torsion spring 17 acts, and opening the specimen pressing members 13, 14 (the direction of FIG. 6C). ), The elastic force of the torsion spring 17 acts on the main body 11 to come into contact with the contact portions 11b and 11c and to stand still.

【0026】本実施の形態によれば、簡単な操作で標本
を容易に着脱することができる。また、一対の標本押圧
部材の標本当接部間の間隔が標本の長手方向の寸法より
も十分大きく開いているので、標本挿入時の精度がより
ラフでもよい。また、標本を取り出すときも、挿入方向
にワンプッシュするのみで済む。
According to the present embodiment, the sample can be easily attached and detached by a simple operation. Further, since the interval between the sample abutting portions of the pair of sample pressing members is sufficiently larger than the length of the sample in the longitudinal direction, the accuracy at the time of inserting the sample may be rougher. Also, when removing the specimen, only one push in the insertion direction is required.

【0027】本実施の形態では、一対の標本押圧部材を
捩じりバネの弾発力で連結しているが、圧縮コイルバネ
やゴムなどの弾性部材に替えてもよい。また、標本当接
部材を付勢するのに、圧縮バネを用いているが、ストロ
ークを確保できれば、ゴム等の弾性部材に替えてもよ
い。
In the present embodiment, the pair of specimen pressing members are connected by the elastic force of the torsion spring, but may be replaced by an elastic member such as a compression coil spring or rubber. Although a compression spring is used to bias the sample contact member, an elastic member such as rubber may be used as long as the stroke can be secured.

【0028】[0028]

【発明の効果】請求項1、2または3に係る発明によれ
ば、作動制御機構により、標本保持前は標本押圧手段が
開放されており、標本を挿入すると標本押圧手段が回転
して標本を保持し、標本を更に押し込むと標本押圧手段
が開放され標本が押し出されるので、簡単な操作で標本
を容易に着脱することができる。請求項2または3に係
る発明によれば、上記効果に加え、標本当接手段に標本
が当接して、該標本当接手段が移動し、標本押圧手段が
回転して標本を保持するので、標本保持装置への標本の
装着が迅速にできる。請求項3に係る発明によれば、上
記効果に加え、標本取出し時に、標本を挿入した方向に
標本を介して標本当接手段を押圧すると、標本押圧手段
が標本保持方向と逆方向に回転するとともに、標本当接
手段が標本を押し出すので、標本保持装置からの標本の
取り出しが迅速にできる。
According to the first, second or third aspect of the present invention, the sample pressing means is opened before the sample is held by the operation control mechanism, and when the sample is inserted, the sample pressing means rotates to remove the sample. When the sample is held and the sample is further pushed in, the sample pressing means is opened and the sample is pushed out, so that the sample can be easily attached and detached by a simple operation. According to the invention according to claim 2 or 3, in addition to the above effects, the sample abuts on the sample abutting means, the sample abutting means moves, and the sample pressing means rotates to hold the sample. The specimen can be quickly mounted on the specimen holding device. According to the third aspect of the present invention, in addition to the above-mentioned effects, when the sample abutment means is pressed through the sample in the direction in which the sample is inserted at the time of removing the sample, the sample pressing means rotates in a direction opposite to the sample holding direction. At the same time, since the sample contact means pushes the sample, the sample can be quickly taken out of the sample holding device.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施の形態1の標本保持装置の標本押圧部材が
開放状態の平面図である。
FIG. 1 is a plan view of a sample holding device of a first embodiment in a state where a sample pressing member is in an open state.

【図2】実施の形態1の標本保持装置の標本押圧部材が
保持状態の平面図である。
FIG. 2 is a plan view of the sample holding device of the first embodiment in a state where a sample pressing member is held.

【図3】実施の形態1の標本保持装置の標本押圧部材が
開放開始直前の状態の平面図である。
FIG. 3 is a plan view of the sample holding device of the first embodiment in a state immediately before the opening of the sample pressing member.

【図4】実施の形態1の標本保持装置の第1の変形例を
示す平面図である。
FIG. 4 is a plan view showing a first modification of the sample holding device of the first embodiment.

【図5】実施の形態1の標本保持装置の第2の変形例を
示す平面図である。
FIG. 5 is a plan view showing a second modification of the sample holding device according to the first embodiment.

【図6】実施の形態2の標本保持装置の標本押圧部材が
開放状態の平面図である。
FIG. 6 is a plan view of the sample holding device according to the second embodiment with a sample pressing member in an open state.

【図7】実施の形態2の標本保持装置の標本押圧部材が
保持状態の平面図である。
FIG. 7 is a plan view of a sample holding device of the second embodiment in a state where a sample pressing member is held.

【図8】実施の形態2の標本保持装置の作動制御機構の
縦断面図である。
FIG. 8 is a longitudinal sectional view of an operation control mechanism of the sample holding device according to the second embodiment.

【図9】実施の形態2の標本保持装置の作動制御機構の
平面図である。
FIG. 9 is a plan view of an operation control mechanism of the sample holding device according to the second embodiment.

【図10】実施の形態2の作動制御機構の作動制御溝の
平面図である。
FIG. 10 is a plan view of an operation control groove of the operation control mechanism according to the second embodiment.

【図11】従来技術4の顕微鏡の標本保持装置の斜視図
である。
FIG. 11 is a perspective view of a sample holding device of a microscope according to prior art 4;

【符号の説明】[Explanation of symbols]

1 本体 1d 斜面部 2 標本 3 標本押圧部材 4 捩じりバネ 5 第1の標本当接部材 6 圧縮バネ 7 第2の標本当接部材 8 圧縮バネ 9 ピン DESCRIPTION OF SYMBOLS 1 Main body 1d Slope part 2 Sample 3 Sample pressing member 4 Torsion spring 5 First sample contact member 6 Compression spring 7 Second sample contact member 8 Compression spring 9 Pin

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 顕微鏡ステージ上に支持された保持装置
本体と、該保持装置本体に設けられた少なくとも一つの
標本当接手段と、前記保持装置本体に回転自在に装着さ
れた標本押圧手段と、標本保持前は前記標本押圧手段が
開放されており、標本を挿入すると前記標本押圧手段が
回転して標本を保持し、標本を更に押し込むと前記標本
押圧手段が開放され標本が押し出される作動制御機構と
を備えたことを特徴とする顕微鏡の標本保持装置。
1. A holding device main body supported on a microscope stage, at least one sample contact means provided on the holding device main body, and a sample pressing means rotatably mounted on the holding device main body. Before holding the sample, the sample pressing means is opened, and when the sample is inserted, the sample pressing means rotates to hold the sample, and when the sample is further pushed in, the sample pressing means is opened and the sample is pushed out. And a sample holding device for a microscope.
【請求項2】 前記作動制御機構は、前記標本当接手段
に標本が当接して、該標本当接手段が移動する事によ
り、前記標本押圧手段が回転して標本を保持するもので
あることを特徴とする請求項1記載の顕微鏡の標本保持
装置。
2. The operation control mechanism according to claim 1, wherein the sample abuts on the sample abutting means, and the sample abutting means moves, whereby the sample pressing means rotates to hold the sample. The specimen holding device for a microscope according to claim 1, wherein:
【請求項3】 前記作動制御機構は、標本取出し時に、
標本を挿入した方向に標本を介して前記標本当接手段を
押圧すると、前記標本押圧手段が標本保持方向と逆方向
に回転するとともに、前記標本当接手段が標本を押し出
すものであることを特徴とする請求項2記載の顕微鏡の
標本保持装置。
3. The operation control mechanism according to claim 1, further comprising:
When the sample abutting means is pressed through the sample in the direction in which the sample is inserted, the sample pressing means rotates in a direction opposite to the sample holding direction, and the sample abutting means pushes the sample. The specimen holding device for a microscope according to claim 2, wherein
JP25227998A 1998-09-07 1998-09-07 Microscope specimen holding device Expired - Fee Related JP4208302B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25227998A JP4208302B2 (en) 1998-09-07 1998-09-07 Microscope specimen holding device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25227998A JP4208302B2 (en) 1998-09-07 1998-09-07 Microscope specimen holding device

Publications (2)

Publication Number Publication Date
JP2000081575A true JP2000081575A (en) 2000-03-21
JP4208302B2 JP4208302B2 (en) 2009-01-14

Family

ID=17235046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25227998A Expired - Fee Related JP4208302B2 (en) 1998-09-07 1998-09-07 Microscope specimen holding device

Country Status (1)

Country Link
JP (1) JP4208302B2 (en)

Cited By (1)

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JP2022522481A (en) * 2019-03-01 2022-04-19 レアサイト インコーポレイテッド Hold the board in a secondary device

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Publication number Priority date Publication date Assignee Title
JP2022522481A (en) * 2019-03-01 2022-04-19 レアサイト インコーポレイテッド Hold the board in a secondary device
JP7674253B2 (en) 2019-03-01 2025-05-09 レアサイト インコーポレイテッド Device for holding substrates in secondary devices

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