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JP1755925S - 電気接触子 - Google Patents

電気接触子

Info

Publication number
JP1755925S
JP1755925S JP2023004350F JP2023004350F JP1755925S JP 1755925 S JP1755925 S JP 1755925S JP 2023004350 F JP2023004350 F JP 2023004350F JP 2023004350 F JP2023004350 F JP 2023004350F JP 1755925 S JP1755925 S JP 1755925S
Authority
JP
Japan
Prior art keywords
electrical contacts
article
semiconductor
inspecting
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023004350F
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2023004350F priority Critical patent/JP1755925S/ja
Priority to US29/911,553 priority patent/USD1087034S1/en
Priority to TW112304606F priority patent/TWD233293S/zh
Application granted granted Critical
Publication of JP1755925S publication Critical patent/JP1755925S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

本物品は、半導体チップ等の半導体デバイスの電気特性を試験検査するための電気接触子であり、半導体デバイスの試験検査装置に組み込まれて使用される物品である。
JP2023004350F 2023-03-06 2023-03-06 電気接触子 Active JP1755925S (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2023004350F JP1755925S (ja) 2023-03-06 2023-03-06 電気接触子
US29/911,553 USD1087034S1 (en) 2023-03-06 2023-09-05 Electric contact
TW112304606F TWD233293S (zh) 2023-03-06 2023-09-06 電性接觸件

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023004350F JP1755925S (ja) 2023-03-06 2023-03-06 電気接触子

Publications (1)

Publication Number Publication Date
JP1755925S true JP1755925S (ja) 2023-10-23

Family

ID=88418410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023004350F Active JP1755925S (ja) 2023-03-06 2023-03-06 電気接触子

Country Status (3)

Country Link
US (1) USD1087034S1 (ja)
JP (1) JP1755925S (ja)
TW (1) TWD233293S (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1087034S1 (en) * 2023-03-06 2025-08-05 Kabushiki Kaisha Nihon Micronics Electric contact

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4917017B2 (ja) * 2005-03-07 2012-04-18 株式会社日本マイクロニクス 通電試験用プローブ及びこれを用いた電気的接続装置
US20090009197A1 (en) * 2007-07-02 2009-01-08 Kabushiki Kaisha Nihon Micronics Probe for electrical test
USD590350S1 (en) * 2008-04-21 2009-04-14 Hon Hai Precision Ind. Co., Ltd. Electrical contact
USD615494S1 (en) * 2009-11-17 2010-05-11 Cheng Uei Precision Industry Co., Ltd. Battery connector contact
JP1646397S (ja) * 2019-05-21 2019-11-25
JP7353859B2 (ja) * 2019-08-09 2023-10-02 株式会社日本マイクロニクス 電気的接触子及び電気的接続装置
TWD207332S (zh) 2019-09-27 2020-09-21 湧德電子股份有限公司 端子
JP1755925S (ja) * 2023-03-06 2023-10-23 電気接触子

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1087034S1 (en) * 2023-03-06 2025-08-05 Kabushiki Kaisha Nihon Micronics Electric contact

Also Published As

Publication number Publication date
TWD233293S (zh) 2024-09-01
USD1087034S1 (en) 2025-08-05

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