[go: up one dir, main page]

IL127534A - Method and system for acquiring a three-dimensional shape description - Google Patents

Method and system for acquiring a three-dimensional shape description

Info

Publication number
IL127534A
IL127534A IL12753497A IL12753497A IL127534A IL 127534 A IL127534 A IL 127534A IL 12753497 A IL12753497 A IL 12753497A IL 12753497 A IL12753497 A IL 12753497A IL 127534 A IL127534 A IL 127534A
Authority
IL
Israel
Prior art keywords
acquiring
dimensional shape
shape description
lines
scene
Prior art date
Application number
IL12753497A
Other languages
English (en)
Other versions
IL127534A0 (en
Original Assignee
Leuven K U Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leuven K U Res & Dev filed Critical Leuven K U Res & Dev
Publication of IL127534A0 publication Critical patent/IL127534A0/xx
Publication of IL127534A publication Critical patent/IL127534A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/521Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/10Image acquisition
    • G06V10/12Details of acquisition arrangements; Constructional details thereof
    • G06V10/14Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145Illumination specially adapted for pattern recognition, e.g. using gratings

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Artificial Intelligence (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Manipulator (AREA)
IL12753497A 1996-06-13 1997-06-12 Method and system for acquiring a three-dimensional shape description IL127534A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP96201643 1996-06-13
PCT/BE1997/000070 WO1997047942A1 (en) 1996-06-13 1997-06-12 Method and system for acquiring a three-dimensional shape description

Publications (2)

Publication Number Publication Date
IL127534A0 IL127534A0 (en) 1999-10-28
IL127534A true IL127534A (en) 2001-08-26

Family

ID=8224076

Family Applications (1)

Application Number Title Priority Date Filing Date
IL12753497A IL127534A (en) 1996-06-13 1997-06-12 Method and system for acquiring a three-dimensional shape description

Country Status (12)

Country Link
US (1) US6510244B2 (xx)
EP (1) EP1009969B1 (xx)
JP (1) JP2000512012A (xx)
KR (1) KR20000016663A (xx)
AT (1) ATE253721T1 (xx)
AU (1) AU712090B2 (xx)
BR (1) BR9709679A (xx)
CA (1) CA2256587A1 (xx)
DE (1) DE69726025T2 (xx)
IL (1) IL127534A (xx)
NO (1) NO985746L (xx)
WO (1) WO1997047942A1 (xx)

Families Citing this family (91)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2785674B1 (fr) * 1998-11-06 2000-12-08 Eastman Kodak Co Procede de restitution d'informations relatives a un objet en trois dimensions
US6957177B1 (en) * 1999-12-10 2005-10-18 Microsoft Corporation Geometric model database for use in ubiquitous computing
DE10000790C2 (de) * 2000-01-11 2003-11-13 Map Medizin Technologie Gmbh Atemmasekenanordnung und Verfahren zur Bereitstellung derselben
US6900802B2 (en) * 2000-08-04 2005-05-31 Pts Corporation Method of determining relative Z-ordering in an image and method of using same
US6993179B1 (en) * 2000-08-07 2006-01-31 Koninklijke Philips Electronics N.V. Strapdown system for three-dimensional reconstruction
US6909801B2 (en) * 2001-02-05 2005-06-21 National Instruments Corporation System and method for generating a low discrepancy curve on an abstract surface
US7034831B2 (en) * 2001-02-05 2006-04-25 National Instruments Corporation System and method for generating a low discrepancy curve in a region
US6917710B2 (en) * 2001-02-05 2005-07-12 National Instruments Corporation System and method for scanning a region using a low discrepancy curve
US6959104B2 (en) * 2001-02-05 2005-10-25 National Instruments Corporation System and method for scanning a region using a low discrepancy sequence
US6950552B2 (en) * 2001-02-05 2005-09-27 National Instruments Corporation System and method for precise location of a point of interest
EP1236970A1 (de) 2001-02-26 2002-09-04 Leuze electronic GmbH + Co. Bilderverarbeitungssystem
JP3519698B2 (ja) * 2001-04-20 2004-04-19 照明 與語 3次元形状測定方法
US7127100B2 (en) * 2001-06-25 2006-10-24 National Instruments Corporation System and method for analyzing an image
FR2830079B1 (fr) * 2001-09-26 2004-04-30 Holo 3 Procede et dispositif de mesure d'au moins une grandeur geometrique d'une surface optiquement reflechissante
DE10212364A1 (de) * 2002-03-20 2003-10-16 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objekts
CA2391133C (en) 2002-06-21 2011-02-15 Jiwei Yang Method and apparatus for measuring the thickness of compressed objects
US7103212B2 (en) * 2002-11-22 2006-09-05 Strider Labs, Inc. Acquisition of three-dimensional images by an active stereo technique using locally unique patterns
TW200413694A (en) * 2003-01-17 2004-08-01 Xsense Technology Corp Three-dimensional scanning system and its method
DE10317078B4 (de) * 2003-04-11 2013-03-28 Karlsruher Institut für Technologie, Institut für Mess- und Regelungstechnik Verfahren und Vorrichtung zur Analyse reflektierender Oberflächen
EP1524494A1 (en) * 2003-10-17 2005-04-20 inos Automationssoftware GmbH Method for calibrating a camera-laser-unit in respect to a calibration-object
GB2410794A (en) * 2004-02-05 2005-08-10 Univ Sheffield Hallam Apparatus and methods for three dimensional scanning
WO2005082075A2 (en) * 2004-02-25 2005-09-09 The University Of North Carolina At Chapel Hill Systems and methods for imperceptibly embedding structured light patterns in projected color images
US8152305B2 (en) * 2004-07-16 2012-04-10 The University Of North Carolina At Chapel Hill Methods, systems, and computer program products for full spectrum projection
EP1619623A1 (en) * 2004-07-22 2006-01-25 Icos Vision Systems N.V. Apparatus for three dimensional measuring on an electronic component
US9024949B2 (en) * 2004-10-13 2015-05-05 Sony Corporation Object representation using distance functions
US7620209B2 (en) * 2004-10-14 2009-11-17 Stevick Glen R Method and apparatus for dynamic space-time imaging system
EP1851527A2 (en) * 2005-01-07 2007-11-07 GestureTek, Inc. Creating 3d images of objects by illuminating with infrared patterns
CN100565589C (zh) * 2005-01-12 2009-12-02 皇家飞利浦电子股份有限公司 用于深度感知的装置和方法
US20060153427A1 (en) * 2005-01-12 2006-07-13 Zanzucchi Peter J Image methods for determining contour of terrain
FR2891645B1 (fr) * 2005-09-30 2007-12-14 Thales Sa Procede et dispositif d'evaluation de la liceite de la situation d'un mobile sur la surface d'un aeroport.
US20070171526A1 (en) * 2006-01-26 2007-07-26 Mass Institute Of Technology (Mit) Stereographic positioning systems and methods
US20070273894A1 (en) * 2006-05-23 2007-11-29 Johnson James T Method and apparatus for remote spatial calibration and imaging
BRPI0621997A2 (pt) * 2006-09-21 2011-12-27 Thomson Licensing mÉtodo e sistema para aquisiÇço de modelo tridimensional
EP1923836A1 (en) * 2006-11-20 2008-05-21 Agfa HealthCare NV Picking on fused 3D volume rendered images and updating corresponding views according to a picking action.
EP2084491A2 (en) 2006-11-21 2009-08-05 Mantisvision Ltd. 3d geometric modeling and 3d video content creation
US8090194B2 (en) 2006-11-21 2012-01-03 Mantis Vision Ltd. 3D geometric modeling and motion capture using both single and dual imaging
US7877210B2 (en) * 2007-01-11 2011-01-25 Siemens Industry, Inc. System and method for projecting b-rep outlines to detect collisions along a translational path
EP2122409B1 (en) * 2007-02-25 2016-12-07 Humaneyes Technologies Ltd. A method and a system for calibrating and/or visualizing a multi image display and for reducing ghosting artifacts
WO2009013744A2 (en) 2007-07-23 2009-01-29 Humaneyes Technologies Ltd. Multi view displays and methods for producing the same
US8792707B2 (en) * 2007-08-17 2014-07-29 Renishaw Plc Phase analysis measurement apparatus and method
DE602007014218D1 (de) * 2007-09-20 2011-06-09 Biocompatibles Uk Ltd Vorrichtung und Verfahren zur Messung der Kollagendicke
CA2606267A1 (fr) * 2007-10-11 2009-04-11 Hydro-Quebec Systeme et methode de cartographie tridimensionnelle d'une surface structurelle
US8244066B2 (en) * 2008-03-24 2012-08-14 The Aerospace Corporation Adaptive membrane shape deformation system
FR2929421B1 (fr) * 2008-03-25 2012-04-27 Thales Sa Procede de reconstruction synthetique tridimensionnelle d'objets exposes a une onde electromagnetique et/ou elastique
JP5317169B2 (ja) * 2008-06-13 2013-10-16 洋 川崎 画像処理装置、画像処理方法およびプログラム
US8339616B2 (en) * 2009-03-31 2012-12-25 Micrometric Vision Technologies Method and apparatus for high-speed unconstrained three-dimensional digitalization
US9195121B2 (en) * 2009-04-28 2015-11-24 The Regents Of The University Of California Markerless geometric registration of multiple projectors on extruded surfaces using an uncalibrated camera
WO2010151780A2 (en) 2009-06-25 2010-12-29 The University Of North Carolina At Chapel Hill Methods and systems for using actuated surface-attached posts for assessing biofluid rheology
US8363957B2 (en) * 2009-08-06 2013-01-29 Delphi Technologies, Inc. Image classification system and method thereof
GB0915904D0 (en) * 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
US9116003B2 (en) 2009-10-01 2015-08-25 Qualcomm Incorporated Routing graphs for buildings
US8812015B2 (en) 2009-10-01 2014-08-19 Qualcomm Incorporated Mobile device locating in conjunction with localized environments
US8880103B2 (en) 2009-10-12 2014-11-04 Qualcomm Incorporated Method and apparatus for transmitting indoor context information
KR101407818B1 (ko) * 2009-12-08 2014-06-17 한국전자통신연구원 텍스쳐 영상과 깊이 영상을 추출하는 장치 및 방법
JP5578844B2 (ja) * 2009-12-21 2014-08-27 キヤノン株式会社 情報処理装置、情報処理方法及びプログラム
US9389085B2 (en) 2010-01-22 2016-07-12 Qualcomm Incorporated Map handling for location based services in conjunction with localized environments
KR20120020627A (ko) * 2010-08-30 2012-03-08 삼성전자주식회사 3d 영상 포맷을 이용한 영상 처리 장치 및 방법
EP2646769B1 (en) * 2010-11-29 2020-01-01 Hewlett-Packard Development Company, L.P. System and method for creating a three-dimensional image file
AT511223B1 (de) 2011-03-18 2013-01-15 A Tron3D Gmbh Vorrichtung zum aufnehmen von bildern von dreidimensionalen objekten
WO2012135014A2 (en) * 2011-03-25 2012-10-04 Tk Holdings Inc. Image sensor calibration system and method
JP6170281B2 (ja) * 2011-05-10 2017-07-26 キヤノン株式会社 三次元計測装置、三次元計測装置の制御方法、およびプログラム
US8754954B2 (en) * 2011-05-16 2014-06-17 National Research Council Of Canada High resolution high contrast edge projection
EP2715278B1 (en) * 2011-05-24 2019-10-16 Koninklijke Philips N.V. 3d scanner using structured lighting
CN103649680B (zh) 2011-06-07 2016-11-09 形创有限公司 用于3d扫描的传感器定位
WO2013013127A1 (en) * 2011-07-20 2013-01-24 Goszyk Kurt A Laser obstacle detector
US8385732B2 (en) 2011-07-29 2013-02-26 Hewlett-Packard Development Company, L.P. Image stabilization
US8675997B2 (en) 2011-07-29 2014-03-18 Hewlett-Packard Development Company, L.P. Feature based image registration
US9064312B2 (en) * 2011-09-23 2015-06-23 The Regents Of The University Of California Augmented reality using projector-camera enabled devices
US9349182B2 (en) 2011-11-10 2016-05-24 Carestream Health, Inc. 3D intraoral measurements using optical multiline method
US9295532B2 (en) 2011-11-10 2016-03-29 Carestream Health, Inc. 3D intraoral measurements using optical multiline method
WO2013076605A1 (en) * 2011-11-23 2013-05-30 Creaform Inc. Method and system for alignment of a pattern on a spatial coded slide image
US9217636B2 (en) 2012-06-11 2015-12-22 Canon Kabushiki Kaisha Information processing apparatus, information processing method, and a computer-readable storage medium
JP6429772B2 (ja) 2012-07-04 2018-11-28 クレアフォーム・インコーポレイテッドCreaform Inc. 3d走査および位置決めシステム
WO2014013363A1 (en) 2012-07-18 2014-01-23 Creaform Inc. 3-d scanning and positioning interface
JP6055228B2 (ja) * 2012-08-07 2016-12-27 中央発條株式会社 形状計測装置
JP6394005B2 (ja) * 2014-03-10 2018-09-26 株式会社リコー 投影画像補正装置、投影する原画像を補正する方法およびプログラム
WO2015183550A1 (en) * 2014-05-27 2015-12-03 Bourbaki 13, Inc. Determining three-dimensional information from projections or placement of two-dimensional patterns
WO2016032470A1 (en) 2014-08-28 2016-03-03 Carestream Health, Inc. 3- d intraoral measurements using optical multiline method
TWI503518B (zh) * 2014-12-29 2015-10-11 Pixart Imaging Inc 測距方法與裝置
CN104729430B (zh) * 2015-03-26 2017-09-22 中国科学院电工研究所 一种塔式太阳能热发电用定日镜面形检测方法
CN105464374B (zh) * 2015-11-20 2018-02-06 河北省电力勘测设计研究院 建筑方格网控制点测量平差后的改正方法
CN108779978B (zh) * 2016-03-01 2020-12-11 奇跃公司 深度感测系统和方法
CH713447B1 (de) * 2017-02-09 2020-08-14 Besi Switzerland Ag Verfahren und Vorrichtung für die Montage von Halbleiterchips.
DE102017129737A1 (de) * 2017-12-13 2019-06-13 Hauni Maschinenbau Gmbh Vorrichtung zur berührungslosen, optischen 3D-Erfassung einer Stirnfläche eines sich queraxial bewegenden, stabförmigen Artikels der tabakverarbeitenden Industrie
CN109996060B (zh) * 2017-12-30 2021-09-03 深圳多哚新技术有限责任公司 一种虚拟现实影院系统及信息处理方法
JP6880512B2 (ja) * 2018-02-14 2021-06-02 オムロン株式会社 3次元測定装置、3次元測定方法及び3次元測定プログラム
JP2020102014A (ja) 2018-12-21 2020-07-02 富士通株式会社 生体認証装置、生体認証プログラム、及び生体認証方法
CN111121664A (zh) * 2019-12-18 2020-05-08 南京理工大学 一种类干涉镜面面型检测方法
DE102021108232A1 (de) 2021-03-31 2022-10-06 Carl Zeiss Industrielle Messtechnik Gmbh Messgerät zur 3D-Erfassung einer Oberfläche
DE102021205046A1 (de) * 2021-05-18 2022-11-24 Wmf Gmbh Vorrichtung, Verfahren und Getränkeautomat zur Volumenbestimmung eines Behälters
US12247829B2 (en) * 2023-01-31 2025-03-11 Lawrence Livermore National Security, Llc Optimal parameter selection for structured light metrology

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4640620A (en) * 1983-12-29 1987-02-03 Robotic Vision Systems, Inc. Arrangement for rapid depth measurement using lens focusing
US4584704A (en) * 1984-03-01 1986-04-22 Bran Ferren Spatial imaging system
FR2591329B1 (fr) * 1985-12-10 1992-05-22 Canon Kk Appareil et procede de traitement d'informations tridimensionnelles
JPH0615968B2 (ja) * 1986-08-11 1994-03-02 伍良 松本 立体形状測定装置
US4982438A (en) * 1987-06-02 1991-01-01 Hitachi, Ltd. Apparatus and method for recognizing three-dimensional shape of object
JPH0241582A (ja) * 1988-08-02 1990-02-09 Nec Corp 曲面形状の判定装置
US5003166A (en) 1989-11-07 1991-03-26 Massachusetts Institute Of Technology Multidimensional range mapping with pattern projection and cross correlation
JP3157001B2 (ja) * 1990-08-17 2001-04-16 株式会社資生堂 3次元形状測定装置
JP2906745B2 (ja) * 1991-07-16 1999-06-21 三菱電機株式会社 表面うねり検査装置
JPH0628478A (ja) * 1992-07-06 1994-02-04 Fujitsu Ltd 3次元特徴抽出方式
US5619625A (en) * 1993-05-28 1997-04-08 Ricoh Company, Ltd. Method for interpolating smooth free-form surfaces into curve mesh including composite curves
JP2868985B2 (ja) * 1993-11-15 1999-03-10 マルコ株式会社 下着用3次元人体計測装置
JP2919284B2 (ja) * 1994-02-23 1999-07-12 松下電工株式会社 物体認識方法
US5852672A (en) * 1995-07-10 1998-12-22 The Regents Of The University Of California Image system for three dimensional, 360 DEGREE, time sequence surface mapping of moving objects

Also Published As

Publication number Publication date
ATE253721T1 (de) 2003-11-15
US20020057832A1 (en) 2002-05-16
US6510244B2 (en) 2003-01-21
NO985746D0 (no) 1998-12-08
IL127534A0 (en) 1999-10-28
DE69726025T2 (de) 2004-09-16
KR20000016663A (ko) 2000-03-25
AU3085297A (en) 1998-01-07
EP1009969A1 (en) 2000-06-21
NO985746L (no) 1999-02-12
JP2000512012A (ja) 2000-09-12
DE69726025D1 (de) 2003-12-11
AU712090B2 (en) 1999-10-28
WO1997047942A1 (en) 1997-12-18
CA2256587A1 (en) 1997-12-18
EP1009969B1 (en) 2003-11-05
BR9709679A (pt) 2000-01-11

Similar Documents

Publication Publication Date Title
IL127534A0 (en) Method and system for acquiring a three-dimensional shape description
GB2313507B (en) Method and system for determining the relationship between a laser plane and an external coordinate system
AU8949391A (en) Method for pattern recognition
SG52937A1 (en) Method and systems for self-servowriting including maintaining a reference level within a usable dynamic range
DE69638186D1 (de) Dreidimensionales Bildverarbeitungssystem
GB2311601B (en) Systems and method for establishing positional accuracy
EP0697687A4 (en) ZERO KNOWLEDGE AUTHENTICATION PROTOCOL-BASED METHOD AND SYSTEM FOR MESSAGE TRANSMISSION
AU3032295A (en) Communication system and method for determining the location of a transponder unit
AU3736697A (en) System and method for modeling a three-dimensional object
AU4720897A (en) A pattern recognition system
AU3139295A (en) Method and system for the placement of texture on three-dimensional objects
IL118786A (en) Process for the reconstruction of three-dimensional images on a mobile or deformable object
IL122325A0 (en) A method and a system for acquiring autostereoscopic images
EP0617919A3 (en) Device for obtaining rib line pattern images on a curved surface.
ZA972062B (en) Apparatus and method for forming a decorative pattern on glassware having an edge.
NL1000201C2 (nl) Patroonprojectiewerkwijze.
EP0606913A3 (en) Method and system for recognizing a sample.
IL113204A0 (en) Pattern recognition system
AU8924291A (en) A method for imaging an object and a system for carrying out the method
FI960030A7 (fi) Järjestelmä aikajakoperiaatteella toimivan aseman dynaamisen käsittelyn ajalliseksi jakamiseksi
DE69006150D1 (de) Selbstadaptivverfahren zur steuerungsbetätigung eines physikalischen systems.
EP0612025A3 (en) Device and method for displaying a three-dimensional scene using the highest intensity projection.
IL121973A (en) Dynamic pattern recognition system
AU8133398A (en) A method and a device for producing three-dimensional physical reproductions
ZA962022B (en) Method and system for translating between an image and a 3-dimensional relief.

Legal Events

Date Code Title Description
KB Patent renewed
KB Patent renewed
KB Patent renewed
MM9K Patent not in force due to non-payment of renewal fees