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GB2609588B - Systems and methods for controlling image contrast in an X-ray system - Google Patents

Systems and methods for controlling image contrast in an X-ray system Download PDF

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Publication number
GB2609588B
GB2609588B GB2216885.0A GB202216885A GB2609588B GB 2609588 B GB2609588 B GB 2609588B GB 202216885 A GB202216885 A GB 202216885A GB 2609588 B GB2609588 B GB 2609588B
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GB
United Kingdom
Prior art keywords
systems
methods
image contrast
ray system
controlling image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB2216885.0A
Other versions
GB202216885D0 (en
GB2609588A (en
Inventor
r schubert Jeffrey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of GB202216885D0 publication Critical patent/GB202216885D0/en
Publication of GB2609588A publication Critical patent/GB2609588A/en
Application granted granted Critical
Publication of GB2609588B publication Critical patent/GB2609588B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/313Accessories, mechanical or electrical features filters, rotating filter disc

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
GB2216885.0A 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an X-ray system Active GB2609588B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2020/035508 WO2021246998A1 (en) 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an x-ray system

Publications (3)

Publication Number Publication Date
GB202216885D0 GB202216885D0 (en) 2022-12-28
GB2609588A GB2609588A (en) 2023-02-08
GB2609588B true GB2609588B (en) 2024-11-13

Family

ID=78831358

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2216885.0A Active GB2609588B (en) 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an X-ray system

Country Status (4)

Country Link
EP (1) EP4157093A4 (en)
CN (1) CN115697202B (en)
GB (1) GB2609588B (en)
WO (1) WO2021246998A1 (en)

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US5394454A (en) * 1992-05-09 1995-02-28 U.S. Philips Corporation Filter method for an x-ray system, and device for carrying out such a filter method
US20030095626A1 (en) * 2001-11-21 2003-05-22 Anderton R. Larry Method and apparatus for enhancing the contrast of a medical diagnostic image that includes foreign objects
US20050286681A1 (en) * 2004-06-25 2005-12-29 Philipp Bernhardt X-ray diagnostics method and device
US20130156151A1 (en) * 2010-09-07 2013-06-20 Yoshiaki Sugaya X-ray ct apparatus and tube current determination method
US20170071559A1 (en) * 2015-09-11 2017-03-16 Siemens Healthcare Gmbh Spectral filtration of x-rays for energy-selective x-ray imaging
US20180333109A1 (en) * 2017-05-18 2018-11-22 Robert Zamenhof Contrast enhanced energy subtraction mammography

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WO2002091023A2 (en) 2001-05-03 2002-11-14 American Science And Engineering, Inc. Nautical x-ray inspection system
US6542580B1 (en) 2002-01-15 2003-04-01 Rapiscan Security Products (Usa), Inc. Relocatable X-ray imaging system and method for inspecting vehicles and containers
US7322745B2 (en) 2002-07-23 2008-01-29 Rapiscan Security Products, Inc. Single boom cargo scanning system
US7369643B2 (en) 2002-07-23 2008-05-06 Rapiscan Security Products, Inc. Single boom cargo scanning system
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US7783004B2 (en) 2002-07-23 2010-08-24 Rapiscan Systems, Inc. Cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US7486768B2 (en) 2002-07-23 2009-02-03 Rapiscan Security Products, Inc. Self-contained mobile inspection system and method
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US7099434B2 (en) 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US20090257555A1 (en) 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
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DE602005019552D1 (en) 2004-04-09 2010-04-08 American Science & Eng Inc ELIMINATION OF CROSS-TALK IN A MULTIPLE SOURCE COMPRISING RETROFIT INSPECTION PORTAL BY ENSURING THAT ONE TIME POINT EACH ONLY A SOURCE OF RADIATION IS EMITTED
WO2007074772A1 (en) * 2005-12-28 2007-07-05 Hitachi Medical Corporation X-ray ct device
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US8345819B2 (en) 2009-07-29 2013-01-01 American Science And Engineering, Inc. Top-down X-ray inspection trailer
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Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3417243A (en) * 1965-10-28 1968-12-17 Minnesota Mining & Mfg Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
US5394454A (en) * 1992-05-09 1995-02-28 U.S. Philips Corporation Filter method for an x-ray system, and device for carrying out such a filter method
US20030095626A1 (en) * 2001-11-21 2003-05-22 Anderton R. Larry Method and apparatus for enhancing the contrast of a medical diagnostic image that includes foreign objects
US20050286681A1 (en) * 2004-06-25 2005-12-29 Philipp Bernhardt X-ray diagnostics method and device
US20130156151A1 (en) * 2010-09-07 2013-06-20 Yoshiaki Sugaya X-ray ct apparatus and tube current determination method
US20170071559A1 (en) * 2015-09-11 2017-03-16 Siemens Healthcare Gmbh Spectral filtration of x-rays for energy-selective x-ray imaging
US20180333109A1 (en) * 2017-05-18 2018-11-22 Robert Zamenhof Contrast enhanced energy subtraction mammography

Also Published As

Publication number Publication date
EP4157093A4 (en) 2024-01-24
CN115697202A (en) 2023-02-03
GB202216885D0 (en) 2022-12-28
GB2609588A (en) 2023-02-08
CN115697202B (en) 2025-08-08
EP4157093A1 (en) 2023-04-05
WO2021246998A1 (en) 2021-12-09

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