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GB2609588A - Systems and methods for controlling image contrast in an X-ray system - Google Patents

Systems and methods for controlling image contrast in an X-ray system Download PDF

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Publication number
GB2609588A
GB2609588A GB2216885.0A GB202216885A GB2609588A GB 2609588 A GB2609588 A GB 2609588A GB 202216885 A GB202216885 A GB 202216885A GB 2609588 A GB2609588 A GB 2609588A
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GB
United Kingdom
Prior art keywords
beam filter
inspection system
contrast
ray
ray inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB2216885.0A
Other versions
GB2609588B (en
GB202216885D0 (en
Inventor
r schubert Jeffrey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
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American Science and Engineering Inc
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Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of GB202216885D0 publication Critical patent/GB202216885D0/en
Publication of GB2609588A publication Critical patent/GB2609588A/en
Application granted granted Critical
Publication of GB2609588B publication Critical patent/GB2609588B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

An X-ray inspection system for scanning objects and providing corresponding contrast controlled scan images is provided. The system includes an X-ray source configured to generate an X-ray beam for irradiating the object where the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness greater than the first thickness, a detector array, a processing unit, a user interface configured to receive a user input indicative of a desired level of contrast in an image, and a controller configured to adjust a position of at least one of the first or second beam filters based on the user input indicative of the desired level of contrast in the at least one image.

Claims (18)

1. An X-ray inspection system for scanning an object, the system comprising: an X-ray source configured to generate an X-ray beam for irradiating the object, wherein the X-ray beam irradiating the object defines a field of view and wherein the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness greater than the first thickness; a detector array adapted to receive radiation, originating from the X-ray beam, that is transmitted through, or scattered from, the object and to generate data representative of at least one image; a processing unit configured to receive the data representative of at least one image and to generate the at least one image for display based on the data representative of at least one image; a user interface configured to receive a user input indicative of a desired level of contrast in the at least one image; and a controller configured to adjust a position of at least one of the first beam filter or the second beam filter based on the user input indicative of the desired level of contrast in the at least one image.
2. The X-ray inspection system of claim 1 , wherein the desired level of contrast comprises at least one of a first contrast level, a second contrast level, a third contrast level, or a fourth contrast level and wherein the first contrast level is less than the second contrast level, the second contrast level is less than the third contrast level, and the third contrast level is less than the fourth contrast level.
3. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the first contrast level, the controller is configured to cause the first beam filter and the second beam filter to not be in the field of view of the X-ray source.
4. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the second contrast level, the controller is configured to cause the first beam filter to be in the field of view of the X-ray source and the second beam filter to not be in the field of view of the X-ray source.
5. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the third contrast level, the controller is configured to cause the first beam filter to not be in the field of view of the X-ray source and the second beam filter to be in the field of view of the X-ray source.
6. The X-ray inspection system of claim 2, wherein, upon the user interface receiving the user input of the fourth contrast level, the controller is configured to cause the first beam filter to be in the field of view of the X-ray source and the second beam filter to be in the field of view of the X-ray source.
7. The X-ray inspection system of claim 1, wherein the first beam filter and the second beam filter comprise a metallic material having a high atomic number.
8. The X-ray inspection system of claim 1, wherein the first beam filter and the second beam filter comprise at least one of bronze, tin, tungsten, copper or a copper matrix embedded with tungsten particles.
9. The X-ray inspection system of claim 1, wherein the first beam filter and the second beam filter comprise a first layer made of tungsten or lead and a second layer made of steel or copper configured to absorb fluorescence emitted by the first layer.
10. The X-ray inspection system of claim 1, further comprising a shielding coupled with the first beam filter and the second beam filter configured to reduce radiation leakage.
11. The X-ray inspection system of claim 1, further comprising a pencil beam forming aperture placed in front of the X-ray source wherein the first beam filter is positioned between the X- ray source and the pencil beam forming aperture, and wherein image contrast increases by: increasing the distance between the pencil beam forming aperture and the first beam filter, and decreasing the distance between the first beam filter and the X-ray source.
12. The X-ray inspection system of claim 1, further comprising a third beam filter.
13. The X-ray inspection system of claim 12, wherein the first beam filter, second beam filter, and third beam filter comprise a 0.5mm thick copper material, a 1.0mm thick copper material, and a 2.0mm thick copper material, respectively.
14. The X-ray inspection system of claim 1, wherein the processing unit is further configured to modify one or more nonlinear transfer functions adapted to process the data representative of at least one image based on the desired level of contrast.
15. The X-ray inspection system of claim 14, wherein the nonlinear transfer functions comprise at least one of a gamma function or a S-curve function.
16. The X-ray inspection system of claim 2, wherein the processing unit is further configured to implement at least one of a first set of programmatic instructions or a second set of programmatic instructions based on the desired level of contrast.
17. The X-ray inspection system of claim 16, wherein the processing unit is further configured to implement the first set of programmatic instructions based on at least one of the first contrast level or second contrast level and wherein the first set of programmatic instructions comprise one or more contrast enhancement functions.
18. The X-ray inspection system of claim 16, wherein the processing unit is further configured to implement the second set of programmatic instructions based on at least one of the third contrast level or fourth contrast level and wherein the second set of programmatic instructions comprise one or more edge enhancement functions.
GB2216885.0A 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an X-ray system Active GB2609588B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2020/035508 WO2021246998A1 (en) 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an x-ray system

Publications (3)

Publication Number Publication Date
GB202216885D0 GB202216885D0 (en) 2022-12-28
GB2609588A true GB2609588A (en) 2023-02-08
GB2609588B GB2609588B (en) 2024-11-13

Family

ID=78831358

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2216885.0A Active GB2609588B (en) 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an X-ray system

Country Status (4)

Country Link
EP (1) EP4157093A4 (en)
CN (1) CN115697202B (en)
GB (1) GB2609588B (en)
WO (1) WO2021246998A1 (en)

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Also Published As

Publication number Publication date
EP4157093A4 (en) 2024-01-24
CN115697202A (en) 2023-02-03
GB2609588B (en) 2024-11-13
GB202216885D0 (en) 2022-12-28
CN115697202B (en) 2025-08-08
EP4157093A1 (en) 2023-04-05
WO2021246998A1 (en) 2021-12-09

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