GB2486039B - CMOS time delay integration sensor for X-ray imaging applications - Google Patents

CMOS time delay integration sensor for X-ray imaging applications

Info

Publication number: GB2486039B
Authority: GB; United Kingdom
Prior art keywords: time delay; ray imaging; imaging applications; delay integration; integration sensor
Prior art date: 2010-11-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Active

Application number

GB1113980.5A

Other versions

GB201113980D0 (en

GB2486039A (en

Inventor

Li Shizu

Wang Chinlee

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

X-SCAN IMAGING CORP

X Scan Imaging Corp

Original Assignee

X-SCAN IMAGING CORP

X Scan Imaging Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2010-11-30

Filing date

2011-08-12

Publication date

2016-10-05

2010-11-30 Priority claimed from US12/927,961 external-priority patent/US8039811B1/en

2011-08-12 Application filed by X-SCAN IMAGING CORP, X Scan Imaging Corp filed Critical X-SCAN IMAGING CORP

2011-09-28 Publication of GB201113980D0 publication Critical patent/GB201113980D0/en

2012-06-06 Publication of GB2486039A publication Critical patent/GB2486039A/en

2016-10-05 Application granted granted Critical

2016-10-05 Publication of GB2486039B publication Critical patent/GB2486039B/en

Status Active legal-status Critical Current

2031-08-12 Anticipated expiration legal-status Critical

Classifications

- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/768—Addressed sensors, e.g. MOS or CMOS sensors for time delay and integration [TDI]
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays

Landscapes

Engineering & Computer Science (AREA)
Multimedia (AREA)
Signal Processing (AREA)
Transforming Light Signals Into Electric Signals (AREA)
Solid State Image Pick-Up Elements (AREA)
Measurement Of Radiation (AREA)

GB1113980.5A 2010-11-30 2011-08-12 CMOS time delay integration sensor for X-ray imaging applications Active GB2486039B (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US12/927,961 US8039811B1 (en)	2009-12-04	2010-11-30	CMOS time delay integration sensor for X-ray imaging applications

Publications (3)

Publication Number	Publication Date
GB201113980D0 GB201113980D0 (en)	2011-09-28
GB2486039A GB2486039A (en)	2012-06-06
GB2486039B true GB2486039B (en)	2016-10-05

Family

ID=44764467

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
GB1113980.5A Active GB2486039B (en)	2010-11-30	2011-08-12	CMOS time delay integration sensor for X-ray imaging applications

Country Status (5)

Country	Link
JP (1)	JP5809492B2 (en)
CN (1)	CN102611853B (en)
DE (1)	DE102011052874B4 (en)
GB (1)	GB2486039B (en)
IT (1)	ITUD20110133A1 (en)

Cited By (1)

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US20220201235A1 (en) *	2020-12-22	2022-06-23	Samsung Electronics Co., Ltd.	Time-resolving computational image sensor architecture for time-of-flight, high-dynamic-range, and high-speed imaging

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CN104270584A (en) *	2014-09-15	2015-01-07	天津大学	Current accumulation pixel structure for CMOS-TDI image sensor
JP6623734B2 (en) *	2015-12-14	2019-12-25	セイコーエプソン株式会社	Image reading device and semiconductor device
FR3047112B1 (en) *	2016-01-22	2018-01-19	Teledyne E2V Semiconductors Sas	MULTILINEAR IMAGE SENSOR WITH LOAD TRANSFER WITH INTEGRATION TIME ADJUSTMENT
CN110034136B (en) *	2017-12-08	2022-12-16	X-Scan映像股份有限公司	Multi-energy X-ray detector based on integrated side-by-side pixel array sensor
KR102639599B1 (en) *	2018-12-28	2024-02-21	엘지디스플레이 주식회사	Digital x-ray detector and method for driving the same
JP2021064703A (en)	2019-10-15	2021-04-22	ソニーセミコンダクタソリューションズ株式会社	Solid-state imaging device and imaging method
JP7674175B2 (en) *	2021-07-13	2025-05-09	浜松ホトニクス株式会社	Image sensor
US20240319116A1 (en) *	2021-07-13	2024-09-26	Hamamatsu Photonics K.K.	X-ray image acquisition device and x-ray image acquisition system
CN113824910B (en) *	2021-08-10	2023-07-21	西安理工大学	An advanced digital TDI acceleration circuit in the analog domain and its acceleration implementation method

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US8039811B1 (en) *	2009-12-04	2011-10-18	X-Scan Imaging Corporation	CMOS time delay integration sensor for X-ray imaging applications

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2011
- 2011-08-12 GB GB1113980.5A patent/GB2486039B/en active Active
- 2011-08-19 DE DE102011052874.1A patent/DE102011052874B4/en active Active
- 2011-08-24 IT IT000133A patent/ITUD20110133A1/en unknown
- 2011-09-08 JP JP2011196089A patent/JP5809492B2/en active Active
- 2011-09-09 CN CN201110266773.0A patent/CN102611853B/en active Active

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WO2007141388A1 (en) *	2006-06-05	2007-12-13	Planmeca Oy	X-ray imaging sensor and x-ray imaging method
US8039811B1 (en) *	2009-12-04	2011-10-18	X-Scan Imaging Corporation	CMOS time delay integration sensor for X-ray imaging applications
CN101883221A (en) *	2010-06-29	2010-11-10	天津大学	Circuit and method for realizing TDI in CMOS image sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US20220201235A1 (en) *	2020-12-22	2022-06-23	Samsung Electronics Co., Ltd.	Time-resolving computational image sensor architecture for time-of-flight, high-dynamic-range, and high-speed imaging
US11877079B2 (en) *	2020-12-22	2024-01-16	Samsung Electronics Co., Ltd.	Time-resolving computational image sensor architecture for time-of-flight, high-dynamic-range, and high-speed imaging

Also Published As

Publication number	Publication date
GB201113980D0 (en)	2011-09-28
GB2486039A (en)	2012-06-06
JP2012120153A (en)	2012-06-21
DE102011052874B4 (en)	2021-08-05
JP5809492B2 (en)	2015-11-11
CN102611853B (en)	2016-06-08
CN102611853A (en)	2012-07-25
DE102011052874A1 (en)	2012-06-14
ITUD20110133A1 (en)	2012-05-31

Publication	Publication Date	Title
GB2486039B (en)	2016-10-05	CMOS time delay integration sensor for X-ray imaging applications
GB2478329B (en)	2015-03-04	Medical image processing
EP2362257A4 (en)	2012-10-03	Solid-state imaging device
EP2643730A4 (en)	2014-10-08	An imaging robot
EP2604176A4 (en)	2015-11-04	Imaging device
EP2629504A4 (en)	2016-01-13	Imaging device
EP2531105A4 (en)	2013-08-07	Radiation imaging system
EG27135A (en)	2015-07-30	Using seismic sensor transfer functions for high fidelity seismic imaging
GB201021144D0 (en)	2011-01-26	Improved image sensor arrangement
EP2689709A4 (en)	2014-12-03	Imaging unit structure for electronic endoscope
GB2481090B (en)	2012-05-02	Thermal imaging camera
EP2667410A4 (en)	2017-09-06	Solid-state imaging device
ZA201108938B (en)	2014-05-28	Cmos moesms sensor device
EP2604190A4 (en)	2014-03-12	X-ray photographing device
GB201205249D0 (en)	2012-05-09	Imaging device
EP2518999A4 (en)	2014-01-01	Imaging device
IL225404A0 (en)	2013-06-27	Three dimensional imaging
GB2482066B (en)	2012-12-12	Imaging
EP2667589A4 (en)	2017-03-08	Solid-state imaging device
EP2541281A4 (en)	2017-12-13	Radiological imaging device
PL2558882T3 (en)	2018-11-30	An imaging system
EP2413162A4 (en)	2017-06-21	X-ray imaging device
GB201006180D0 (en)	2010-06-02	Imaging apparatus
EP2579580A4 (en)	2015-07-08	Solid-state imaging device
GB201013783D0 (en)	2010-09-29	Image sensor