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GB2235581A - Apparatus for loading and unloading sleeves for a IC tester - Google Patents

Apparatus for loading and unloading sleeves for a IC tester Download PDF

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Publication number
GB2235581A
GB2235581A GB9017541A GB9017541A GB2235581A GB 2235581 A GB2235581 A GB 2235581A GB 9017541 A GB9017541 A GB 9017541A GB 9017541 A GB9017541 A GB 9017541A GB 2235581 A GB2235581 A GB 2235581A
Authority
GB
United Kingdom
Prior art keywords
sleeve
section
sleeves
plate
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB9017541A
Other versions
GB2235581B (en
GB9017541D0 (en
Inventor
Soo-Pil Lee
Ill-Sub Kim
Duk-Hee Lee
Yul Kim
Dong-Chol Ahn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Goldstar Electron Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1019890012565A external-priority patent/KR910005377A/en
Priority claimed from KR1019890015372A external-priority patent/KR960015559B1/en
Priority claimed from KR2019890015506U external-priority patent/KR930008125Y1/en
Priority claimed from KR2019890017069U external-priority patent/KR940001273Y1/en
Priority claimed from KR2019890017068U external-priority patent/KR940000547Y1/en
Priority claimed from KR2019900003834U external-priority patent/KR950006931Y1/en
Application filed by Goldstar Electron Co Ltd filed Critical Goldstar Electron Co Ltd
Publication of GB9017541D0 publication Critical patent/GB9017541D0/en
Publication of GB2235581A publication Critical patent/GB2235581A/en
Publication of GB2235581B publication Critical patent/GB2235581B/en
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • H10P72/06
    • H10P72/0604
    • H10P72/0612

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Filling Or Emptying Of Bunkers, Hoppers, And Tanks (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

An apparatus for loading and unloading sleeves for a IC tester, which may automatically transport the IC chip-contained sleeves randomly contained in a hopper (2) to a sorter section in a correct posture by means of a timing belt (4) having sleeve holders (5) to feed the chips to the tester (8) by a first transfer block, and then automatically transfer empty sleeves from an ejector section having a cam plate and an ejector through a dropping section having a pair of guide rails (35) to an unloader section having a second transfer block, a sleeve holder, a sensor and a pushing plate (61), thereby permitting the sleeves to be refilled with the tested and sorted IC chips and stored in a storage box (66). <IMAGE>

Description

1.
AP.PA.111ATUS 170n, -LOA'DING AND UbELOADING S]-EEVIES 17-01t A 1 C TEST1:1R 13,3,Itg of the Invent ion Field of' the Inveni ion
1 The present invention relates lo an apparatus for loadingand unloading sleeves for a IC tester wherein electronic components, stich as IC chips cont-ained in the sleeves are continuously fed I'iorn a supply source to the tester, tested in the tester, sorted according to characteristics of the tested chips, and thereafter conlainod again in empty sleeves.
Description of the prior Art
In a prior apparatus for. loading and unloading sleeves for a IC tester, when the sleeves containing IC chips therein are orderly pul iinnually by an operator into a pair of loaders each iiivini,. a - shaped. cross section, the sleeves are transporled ont, onc, to the tester to 1'eed the IC chips in tile io 1 - the tester, and then empty sleeves are randomly collected into a storage box. Thereafter, if the empty sleeves collected into the storage box are gathered and fed to an unloader by the operator, 1 the IC chips passed through the tester and sorted according to I-fie 1 characteristics of the chips are contained in the empty sleeves put orderly into the unloader. In this case, the sleeves irtust be.
constantly and orderly fed to the loader and the unloader iii,,,iiitt; illy by the operator. Therefore, in such a prior apparatus, because a feeding of the sleeves to the loader and the unloader is carried out by hand, working hours become excessively long. In addition, because the empty sleeves must be transported by the operator from the loader to the unloader, automatic arrangements may not be obtained and thus.productivity is lowered.
Summary of the Invention
In view of the aforesaid problem of the convention-A al)pir,-Attis, it is an object of tlic present invention is to provide m k for loading and unloading sleeves for a IC tester, which way convey automatically the IC chip-contained sleeves put randomly into a containing box to the tester one by one by means of a timing belt provided between an interior of the containing box and a sorter 1 section, and transfer automatically empty sleeves to an unloader section so that the IC chips tested and sorted according to the their characteristics can be contained in the empty sleeves.
To achieve the above object, the present invention provides an apparatus for loading and unloading sleeves for a IC tester, comprising a loader section including a timing belt provided between a containing box and a bracket, both being fixed to a frame, sleeve holders equidistantly mounted on said timing bell and conveying the sleeves, and first and second aligning plates secured to a fixed plate; a sorter section including a first transfer block integrally having legs formed with hooking grooves, the transfer block also having a gripping recess for gripping the 7 sleeve, transfer bars for guiding a reciprocation of said first transfer block, a carriage movable along said transfer bars, a solenoid valve secured to said first transfer block, a swing arifi for elevating and lowering said first transfer block, and a pushing 1 plate for inserting the sleeve into said gripping recess; an ejector section including a roller supporting table having a pair of rollers and mounted on a stationary plate, a cam plate movable by said rollers, supporting bars connected to said cant plate by means of a connecting plate, a sliding block connected to said roller supporting table by means of a connecting plate, and an ejector linked to said sliding block via connecting pieces: a dropping section including a pair of guide rails, a pair of first cylinders mounted on a stationary plate and each having a silicon plate and a pushing plate, and another pair of second cylinders disposed outside of said first cylinders and each having an engaging rod; and an unloading section including a second transfer block - 4 I for gripping and transporting an empty sleeve, a sleeve holder connected to guide bars passing through said second transfer block, a sensor pin disposed in said sleeve holder and normally biased downwardly by a spring, a sensor for detecting an insertion of the 1 sleeve through said sensor pin, and a pushing plate for inserting the sleeve into said second transfer block:
whereby when the sleeves filled with the IC chips are put into said containing box, the sleeves are fed to said sorter section through said loader section, thereby feeding the IC chips to said tester, and the empty sleeves which arrived at a given position of said sorter section are transferred to said dropping section by means of said ejector section, and then, when the OC IC chips are sorted by said tester, the empty sleeves receive the tested IC chips and thereafter ar classified and stored in storage box at said unloading section.
According to the apparatus of the present invention, when the sleeves filled w;th the IC chips are randomly contained in the 1 containing box with one of the caps of the respective sleeves removed, the sleeves are continuously transported by the timing belt and automalically fed to the sorter section in a correct.
posture, and then the IC chips are fed to the tester. Therefore, 1 the loading section way be automated.
Further, because the empty sleeves are automatically transferred by the first transfer block to the ejector section and then fed one by one from the ejector section through the dropping section to the unloading section to be refilled with the IC chips sorted by the tester, the whole operation from the loading to the unloading of the tester may be automated, thereby improving the productivity.
Many other advantages, features and additional objects of the C present-invention will become manifest to the persons skilled in the art upon making reference to the following detailed description and the accompanying drawings in which a preferred embodiment incorporating the principle of the present invention is shown by way of illustrative 6 - k 1 example..
Brief Description of the Drawings
Fig. 1 is a schematic elevational view of an apparatus according to the present invention Fig. 2 is a schematic side view of the apparatus Fig. 3 is an enlarged fragmentary view, partly in cross section, of a portion of the apparatus shown in Fig. 1; Fig. 4 is an enlarged view of a portion " A " encircled in Fig.
3 Fig. 5 is a Perspective view of the portion shown in Fig. 4; Fig. 6 is an elarged perspective view of a sorter section of a portion " B " shown in Fig. 2; Fig. 7 is a cross sectional view of a sorter section shown in Fig. 6 Fig. 8 is a perspective view of an ejector section:
Fig. 9 A is a cross sectional view of the ejector section before it operates Fig. 9 B is a view similar to Fig. 9 A, illustrating the ejector section after it operates 1 Fig. 10 is a longitudinal sectional view of a first transfer 1 block with an ejector arranged under the block Fig.
11 is a plan view of the first transfer block shown in Fig.
Fig. 12 is a plan view of a dropping section, showing the sleeve supported by an engaging rod; Fig. 13 is a side view of the dropping section shown in Fig.
12 Fig. 14 is an enlarged perspective view of a portion " E " shown in Fig.-2 showing an engaging member; Fig. 15 is an enlarged perspective view, partly in cross section, of a portion " C " shown in Fig. 19; Fig, 16 is a side view of an unloading section with parts 8 - 1 k partially broken away Fig. 17 is a plan view of the unloading section shown in Fig.
16:
Fig. 18 is a cross sectional view taken on line D - 1) of Fig.
1 17; and Fig. 19 is a view shows that the sleeve inserted into a second transfer block of the unloading section has been moved along a guide rod to a position for receiving IC chips sorted by a tester.
Description of the Preferred Embodiment
Figs. 1 and 2 are schematic illustrations of an embodiment of an apparatus for loading and unloading sleeves for a IC tester according to the present invention.
Figs. 3 to 5 are views for explaining a loader section of the apparatus, wherein Fig. 3 is a sectional view illustrating a portion of the apparatus shown in Fig.
1.
Referring to Figs. 1 and 3, there is shown a hopper type box (2) for 9 - p k containing sleeves (11) filled with electronic components such as IC chips (10). The sleeves (11) are randomly contained in the containing box (2) with one of the caps of the respective sleeves removed. A timing belt (4) is mounted for rotation at one gide of 1 the containiDg box at a certain angle(for example, about 100)to a vertical plane to encircle a plate (3) fixed to a frame (1).
The timing belt (4) is provided with sleeve holders (5) equidistantly spaced along the length of the belt.
The sleeve holders (5) serve to lift Lip the sleeves (11) in the containing box (2) and feed thew to a sorter section as the timing belt rotates by actuation of' a main switchOlot shown).
First and second aligning plates(6, 7) each having a lower sloping surface are secured on the opposite sides of the timIng belt (4) to the fixed plate (3) disposed under the timing belt. Therefore, when the sleeves (11) are conveyed to the sorter section by the timing belt (4), they slide on the aligning plates (6, 7), as shown in Fig. 4. Specifically, the sleeve (11) which slides . 10 X on the aligning plates with its groove faced leftward(as seen Finn th- drawing) may be transported to the sorter section without dopirting from the sleeve holder (5) by virtue of the center of glavily or 1hp IC chip (10) contained in the sleeve.
1 When the sleeve is supported on the sleeve holder wilb the groovt, faced to the other directions as shown in (a) - (c) of Fig. 4. however, the sleeve is pushed outwzirdly during passing over the aligning plaks, and Cus falls into the containing box (2) due to instability or tht- cenler of gravity of the sleeve having the IC chips contained therein.
The sleeves fallen into the containing box (2) may he lift up again by the sleeve holders (5) and only the correctly positioned sleeves, may be transported to the sorter section.
With the timing belt (4) and the fixed plate (3) inclined C an angle of about 10 degrees to the vertical plane, more effective working performance can be achived.
The arrangeepnt of t& aligning plates in several pairs is intended to increnup The abm"nf k or thr skeves (113 being transported and AprOW Widhilify ni aligning the sleeves. A distance (ti between the upper surraeo of the sleeve holder (5) and the upper surfaces of the rirsL and second aligning plates (6, 7) may be adjusted for example, by 1 changing the plates according to a size of the sleeve (11) and a shape of the IC chip (10).
In Figs. 6 and 7, there is shown the sorter section for trans- ferring the sleoves(I1) to the IC tester (8) from a loader seciion, and then sending the empty sleeves to an ejector section. A CirPI 1 1 transfer block (13) is mounted on a top of a carriage 112) which slides horizontally along a pair of transfer bars (9). The Iransfer block (13) is biased by means of a tension spring (14) to the carriage (12) ant may be rotated about the carriage (12) at a certain angJe.
A pair of legs (15) having hooking grooves (15 a, 15 b) fornted therein are integrally secured to a lower portion of the first Iransfer block (13).
12 A swing.arin (17) connected to a cylinder (16) for up and down movement may be selectively inserted into the hooking grooves (15 a, 15 b) formed in the legs (15).
A gripping recess (13 a) for gripping the sleeve (11) is formed in the transfer block (13) 1 As shown in Figs. 10 and 11, an elongated aperture (13 b) in which an ejector (18) is positioned is also formed at the lower portion of the transfer block (13).
The ejector (18) takes out the empty sleeves and feeds them to a dropping section.
A cuver plate (15) rests on and is secured to the top of the transfer block (13).
A solenoid valve (20) having at its leading end a control pin (20 a) is mounted on the cover plate (19).
In addition, to an extension portion extending from one end of the cover plate, a vibrator (21) is fixed for assuring a smooth introduction of the IC chip OG) during the feeding of the chips contained in the sleeve (11) into the tester.
As shown in Fig. 2, a pushing plate (23) having a V-sliaped cross 13 section and being actuated by means of a cylinder (22) is mounted through a bracket (24) on the side of a frame (1) opposite the first transfer block.
The pushing plate (23) inserts the 1 sleeve (11) into the gripping recess (13 a) upon actuation of the 1 cylinder (22) when the sleeve is transported to an inlet of the gripping recess (13 a) by means of the timing belt (4). In a normal(or initial)-condition, the swing arm (17) functioning to swing the transfer block (13) remain,.-> elevated or extended.
Then, when the sleeve (11) being transported by means of the timing belt (4) in the preceding loader section is positioned in the gripping recess (13 a) and at the same time the timing belt is stopped by a signal from a sensor(not shown), the swing arm (17) inserted-into one (15 a) of the booking grooves of the legs (15) is lowered or retracted by actuation of the cylinder (16), whereby the first transfer block (13) may be lowered against the pulling force of the spring (14) and then maintained horizont.aljy. In 1 114 - this Position, the pushing plate (23) having a V-shape(l cross section is actuated by the cylinder (22) so as to insert. the sleeve (11) into the gripping recess (13 a). The V-shape in cross section of the pushing plate (23) is advantageous for the sake of 1 a correct insertion of the sleeve into the gripping recess.
Then, as the swing arm (17) is elevated by means of the cylinder (16), the transfer block (13) into which the sleeve (II) has been inserted as mentioned, above is rotated and inclined by means of the pulling force of the spring (14) at a certain angle. At this point, the IC chips (10) in the sleeve are blocked by means of the control pin (20 a) arranged at the end of the solenoid valve (20), as shown in Fig. 7.
Then, when the swing arm (17) is removed from the hooking groove (15 a) of the legs (15) by a signal from a sensor(not shown), the first transfer block (13) may be moved along the transfer bars (9) to an empty inlet of the tester (8).
Thereafter, the control pin (20 a) is elevated by actuation of the i solenoid.valve (20) to open the gripping recess (13 a) As a result, the IC chips (10) in the sleeve (11) enter into the tester by their own weight.
If the IC chips tightly contact an inner surface of the sleeve, however, the chips may not he entirely fed 1 into the tester.
To prevent such incomplete feeding, the vibrator (21) mounted on the extension portion of the cover plate (19) to contact an upper surface of the sleeve (11) is operated to vibrate the sleeve. Therefore, all the IC chips in the sleeve may he smoothly fed into the tester (8).
After the IC chips in the sleeve have been fed into the tester, the transfer block (13) holding the empty sleeve is moved along the transfer bars (9) in a reverse direction to such a position that the leg-(15) having the hooking groove (15 b) is positioned on the right side portion of the elevated swing arm (17) as shown in a dash-and-dotted line in Fig. 6 Then,_the swing arm (17) lowered by actuation of the cylinder (13) to return the transfer - lG - A block (13) to its original horizontal position.
Now, the transfer block (13) is located at the ejector section.
Fig. 8 is as perspective view, partly in cross section, of' the ejector section, Figs. 9 A and 9 B show the operation of' the, ejector 1 section, and Figs. 10 and 11 show an ejector located under the first transfer block. A guide post (27) having a guide plate (26) fixed thereto is mounted on a side portion of an upper surface or a stationary plate (25).
A roller supporting table (29) having a pair of rollers (28) rotatably mounted on the top thereof is arranged at one side of the guide post (27).
The table (25) may be reciprocatably moved by actuation of a cylinder (30) in opposite directions as indicated by the arrow in Fig. 8.
Further, a cam plate (31) having a sloping surface is mounted on the top of the roller supporting table (29) in confronting relation to the guide plate (26). A tension spring (32) is mounted on the underside of the cam plate (31) to constantly bias the sloping surface of' the 17 - cam plate to one of the rollers (28). Therefore, when the roller supporting table (29) is reciprocated by means of the cylinder (30), the cam plate (31) is moved in a direction prependicular to the moving direction of the table (29) by means of the rollers (28) 1 arranged between the sloping surface of the cam plate and the guide plate (26). Specifically, because the sloping surface of the cam plate (31) is shaped in such a manner that a distance between Ihe cant plate and the guide plate becomes narrower, when the rollers (28) arranged between the stationary guide plate (26) and the movable cam 1 plate (31) are moved by the movement of the supporting table (29), the rollers widen the distance stated above, whereby the cam plate (31) may be moved away from the guide plate (26).
A connecting plate (34) having a pair of supporting bars (33) fixed thereto is secured to one side of the cam plate (31) and may be reciprocatably moved between a pair of guide rails (35) so that the supporting bars (33) may receive the empty sleeve released From 18 the first transfer block (13).
The guide rails (35) are arranged at the dropping section.
Another guide post (37) is secured to the other side of the stationary plate (25). A pair of guide rods (36) are fixed to the guide post (37) and pass through a sliding 1 block (38). The sliding block (38) is linked to the roller supporting table (29) by means or a connecting plate (39), and therefore, may bc moved along the guide rods (36) by the moveitient of the roller supporting table.
The ejector (IB) movable in the elongated aperture (13 b) of the first transfer block (13) is linked to the sliding block (38) via connecting pieces (40).
Therefore, when the transfer block (13) is moved to a position in which the leg (15) having the hooking groove (15 b) is, located on the right side portion of the swing arm (17) as shown in a dash-and -dotted line in Fig. 6, and then maintained horizontally by the swing arm (17) the empty sleeve (11) is positioned bet%Teii the guide rails (35) arranged at the dropping section, as shown in Fig. 8.
19 - Thereafter, when the _sliding block (38) which may slide oil tile guide rails (36) is moved from the position shown in Fig. 9 A to tile position shown in Fig. 9 B by actuation of the. cylinder (30) -in order to separate the empty sleeve from the first transfer block (13), the 1 ejector (18) located in the elongated aperture (13 b) of' tile transfer block is moved along with the sliding block to push ono en(l of the empty sleeve.
As a result, the empty sleeve is removed froni the gripping recess (13 a) of the transfer block (13) and I'alls between the guide rails (35). At the same titte, the roller supporting table (29) linked to the sliding block (38) via the connecting plate (39) is also moved in the same direction as the moving direction of the sliding block.
Therefore, the rollers (28) rotatably mounted on the t-op of the roller supporting table is moved under the guidance of the guide plate (26), thereby pushing the sloping surface of the cam plate (31). As a result, the cam plate is moved in a direction perpendicular to the roller supporting table (29), whereby the empty i - sleeve removed from the gripping recess (13 a) of the transfer block (13) may be put on the supporting bars (33). Then, whon 111)011 a retractation of the rod of the cylinder (30) the roller supporting table (29) restores in the reverse order to that mentioned above., 1 the cam plate (31) returns to its initial position by means of the tension spring (32) mounted on the underside of the cam plate.
As this time, the empty sleeve (11) held between the guide rails (35) may not be moved along with the supporting bars (33) and drops int.o the subsequent dropping section by its own weight upon a removal of the supporting bars (33).
Fig. 12 is a plan view of the dropping section, Fig. 13 is a side view thereof, and Fig. 14 is a perspective view of' an engaging member arranged at the lower portions of the guide rails of the dropping section. A pair of first cylinders (42) are mounted inside of a stationary plate (41) fixed to a sidewall of the frame ( 1). A pushing plate (44) having a silicon plate (43) fixed 1 thereto.is attached to a forward end of the first cylinder (42) to be able to advance and retreat hy actua-. Lion of the cylinder (42).
The silicon plate (43) on the pushing plate (44) prevents the sleeve (11) from being deformed by the pushing plate when the pushing plate 1 supports the sleeve by actuation ofthe first cylinder (42).
A pair of second cylinders (4G) each having at its forward end an engaging rod (45) are mounted outside of the first cylinders (42).
The engaging rod (45) way extend and retract by actuation of' the second cylinder (46) and support the lowest sleeve in its extended position. Further, a stopper (47) is mounted on the side of the frame (1) opposite the first transfer block (13), i.e., the side adjacent to one of the guide rails (35) which guide the sleeves when they are stacked on the dropping section while being held in constantly spaced relation to the stationary plate (41). All engaging member (48) having a sloping surface formed at a given position as shown ill Fig. 14 is attached to the lower portions of t lie gui do rails ( 35) by means of' screw ( 49), thereby permi t ( int, t lie lowest sleeve (11) stacked on the dropping section to be more easily fed into the subsequent unloading section.
As shown in Fig. 13, in the condition wherein the sleeves I'ed from the preceding ejector sectionhave been stacked bet.ween the guide rails (35), the first cylinder (42) remains retracted, while the second cylinder (46) remains extended to support the lowest sleeve by tile engaging rod (45).
Then, when the lowest sleeve is to be fed int.o the unloading section, the first cylinder (42) is firstly extended so that the silicon plate (43) secured to the pushing plate (44) moderately grips the upper sleeves except for the lowest sleeve, as shown in a dash-and-dotted line in Fig. 13.
Thereafter, the extended engaging rod (45) of the second cylinder (46) is retracted to release the supperted lowest sleeve (11), whereby the sleeve may freely fall into the subsequent process.
At this time, the sleeve falls in a inclined state due to the 1 A sloping. surf ace of the engaging member (48) as shown in Fig. 14.
Fig. 15 is a perspective view, partly ill cross section, of the unloading section, Figs. 16 avid 17 are a side view and a plan view of the unloading section with parts partially broken away, 1 respectively, Fig. 18 is a cross sectional view taken on line D-D of Fig. 17, and Fig. 19 shows that Ahe empty sleeve is movod hy a second transfer block of the unloading section for receiving 1he IC chips sorted by the tester.
A sleeve holder (53) connected to a cylinder (51) by means of a pair of guide bars (52) is mounted oil the Lop of the second t.raiisf'(i- block (50) having guide stitl', ices (50 a) and gripping the sleeve (11).
A sensor pill (54) which may contact the sleeve (11) is mounted in a hole of the sleeve holder (53) and normally biased downwardly by a sping (55) and is protruded downwardly through a recess (53 a) formed at the underside of the sleeve hoidpr (53).
In addition, there are mounted on the top of' the sleeve holder a sensor (SG) for detecting ail insertion of the sCove (11) through the rising sensor pin (54) and an engaging block ( 57) having a V-shaped groove ( 57 a) for guiding the sleeve fa I I ing in a inclined state by the engaging member (48) attached to the guide rails (35).
As shown in Fig. 16, a carriage (58) is secured to the underside of the second transfer block (50) and slidably engaged with a pair of transfer bars (59), whereby the second transfer block (50) way be reciprocated along the trnasfer bars.
An inclined plate (GO) having an angle of about 30 - 40' to a horizontal plane is mounted on one side of the second transfer block (50).
A V-shaped pushing plate (61) connected to a cylinder (62) is also secured to the end of the inclined plate (60) opposite to the second transfer block (50). - A stationary plate (64) having a sensor (63) fixed thereto is mounted closely to the inner surface of the pushing plate (61).
The guide surfaces (50 a) are formed at one side of the second transfer block (50) for guiding a precise insertion of the sleeve (11) into the second transfer block during the feeding of The sleeve to the transfer block by means of the pushing plate (61). The sensor (63) is mounted on the stationary plate (64) closely to the pushing plate (60 for detecting The IC chip (10) remaining in the 1 sleeve Without being fed to the testel. (8) when the empty is sent to the unloading section.
Further, with thp inclinp(l plate (60) arranged at an angle of 30' - 400 to a horizontal plane, the IC chips can easily enter into the empty sleeve (11) due to the inclination when the empty sleeve is transported by the second transfer block (50) and then filled with the chips sorted by the tester (8).
The lowest empty sleeve freely dropping by means of the dropping section is placed on the inclined plate (60) under the guidance of the V-shaped groove (57 a) of the engaging block (57) secured to the second transfer block (50), and at its one end is engaged with the pushing plate (61).
At this point, the sleeve holder (53) is maintained in the elevated position in which the rod.
of the cylinder (51) connected thereto via the guide bars C2) is extended to separate the sleeve holder (53) from the upper surFace or the second transfer block (50).
1 In the Condition wherein the sIdeve (11) rests on the inclined plate (60) and at its one end is engaged wit.h the pushing plate (61), the IC chips (10) which likely remain in the sleeve without entering into the tester (8) by means of the sorter section may be moved to the lower end of the sleeve inclined by the inclined plate (60).
Accordingly, when the sensor (63) fixed to the stationary plate (64) closely to the pushing plate (61) detects the IC chip, the sensor stops the actuation of the cylinder and gives notice the operator of the remaining of the chip, for example, by means of a buzzer or any other signal.
When the IC chip is absent in the sleeve, the cylinder (62) actuates to move the pushing plate (61) in the arrow direction, as shown in 27 1 a solid line in Fig. IG, thereby inserting the sleeve into tile second transfer block (50) under the guidance of the guiffi, surfaces (50 a) formed ill the second transfer block.
At the time the 1 sleeve has been inserted into the second transfer block (50), the 1 sleeve holder (53) is lowered by ineans of the cylinder (51) to grip the sleeve and at the same time the sensor pin (54) mounted in the sleeve holder (53) to protrude downwardly moves toward tile sleeve (11). In case that the sleeve is situated with its groove faced upwardly as shown in Fig. 15, the sensor pin (54) descending within the given limits is positioned in the groove of the sleeve, thereby failing to contact the sleeve and actuate the sensor. (56), whereby the subsequent stage may be carried out. As shown in (a), (b) and (c) of Fig. 15, however, when the sleeve (11 ) is situated below the sensor pin (54) with the groove faced downwardly or laterally, the sensor pin contacts the upper surface of the sleeve, and then - ') 1 2 C - t ascends against the biasing of the coil spring (55) to actuate the sensor (56) mounted on the top of the sleeve holder (53). When the sensor detects misplacement of the sleeve, it outputs a signal to shut. down the unloading section and give notice theoperator of 1 such misplacement, for example, by m6ans of the buzzer or the lamp connected to the sensor.
When the sleeve (11) is normally inserted into the second transfer block (50) and gripped by the sleeve holder (53), as shown in Fig. 19, the carriage (58) secured to the second transfer block (50) may be moved along the transfer bars (59) to the outlets of the tester (8) so that the sleeve may receive that IC chips (10) sorted by the tester.
The second transfer block (50) being moved to the outlets of the tester is stopped at the outlet which is selecled according to sensing of the amount of the sorted IC chips, Lc., contains the tested IC chips to the extent that may be contained in one sleeve. Thereafter, a solenoid valve (65) provided above c) - 1,19 X the outlet of the tester actuates to put the tested chips into the sleeve by means of an air pressure. After the chips are fully contained in the sleeve, the second transfer block (50) is moved to storage box (66) disposed below the transfer bars (59) and having 1 partition walls (66 a), thereby pefinitting the IC chips to bc classif ied and stored according to their characterist ics. Whe n the second transfer block is stopped at the storage box, tho sleeve holder (53) is elevated by actuation of the cylinder;51) to release the gripped sleeve, whereby the refilled sleeve may fall into the 1 storage box (66) by its own weight and stored therein.
Tile foregoing description is-one cycle of the operation comprising the steps of automatically feeding the IC chips (10) in 1 the sleeve (11) put randomly into the containing box (2) to the tester (8) through the loader and sorter sections, sending the empty sleeve to the unloading section through the ejector and dropping sections, refilling the empty sJoeve wit], tile IC chips, sorted by k the tester, and storing the refilled sleeve in the storage 1wx.
While the invention has been particularly shown aPd described with reference to the preferred embodiment thereof, it will be understood by those skilled in the art that various changes and 1 modifications in form and details may be made therein withoul departing from the spirit and scope of the invention.
31 4 t 1 32 -

Claims (12)

CLAIMS:
1. Apparatus for automatically loading and unloading sleeves for an IC tester, comprising: a loader section including conveyor means having sleeve holders to convey loaded sleeves in a proper orientation from a hopper; a sorter section to receive loaded sleeves from the conveyor means and including first transfer means to grip and tilt a loaded sleeve to feed the IC chips to an IC tester; an ejector section to eject the transfer means; an empty sleeve from a dropping section to receive empty sleeves from the ejector section; and an unloading section to receive empty sleeves from the dropping section and including second transfer means to grip an empty sleeve while tested chips from the IC tester are received therein.
z 1 1 1 An apparatus for loading and unloading sleeves for a IC tester, comprising:
a loader section including a timing belt (4) provided between a containing box (2) and a bracket (67), both being Vixed lo a frame (1), sleeve holders (5) equidistantly mounted on said timing bell (4) for supporting and conveying the sleeves (11), and first and second aligning plates (6, 7) secured to a fixed platc,(3 a sorter section including a first transfer block (13) integrally having legs (15) formed with hooking grooves (15 a, 15 b), the transfer block also having a gripping recess (13 a) for gripping the sleeve, transfer bars (9) for guiding a reciprocation of said first transfer block (13), a carriage (12) movable along said transfer bars, a solenoid valve (20) secured to said first Lransfer block (13), a swing arm (17) for elevating and lowering maid first Iransfer block, and a pushing piate (23) for inserting the Toevo 1 7 - 34 into said gripping recess (13 a) an ejector section including a roller supporting table (29) having a pair of rollers (28) and mounted on a stationary plate (25), a cant plate (31) movable by said rollers (28), supporting bars (33) connected to said cam plate.by means of a connecting plate (34), a sliding block (38) connected to said roller supporting table by means of a connecting plate (39), and an ejector (18) linked to said sliding block via connecting pieces (40) a dropping section including a pair of guide rails (35), a pair of first cylinders (42) mounted on a stationary plate (41) and each having a silicon plate (43) and a pushing plate (44), and another pair of second cylinders (46) disposed outside of said first cylinders and each having an engaging rod (45); and an unloading section including a second transfer block (50) for gripping and transporting an empty sleeve, a sleeve holder r i 1 1 - 35 (53) connected to guide bars (52) passing through said second transfer block, a sensor pin (54) disposed in said sleeve holder (53) and normally biased downwardly by a spring (55), a sensor (56) for detecting an insertion of the sleeve through said sensor pin, and a pushing plate (61) for inserting the sleeve into said second transfer block (50) whereby when the sleeves (11) filled with the IC chips (10) are pul into said containing boy (2), the sleeves are sent. to said sorter s(et.ioii 1hrough said section, thereby feeding (lip IC chips to said tester (8), and the empty sleeves which arrived at a given position of said sorter section are transferred to said dropping section by means or said ejector section, and then, when t-he IC chips are sorted by said tester (8), the empty sleeves receive the tested IC chips and thereafter are classified and stored in storage box (66) at said unloading section.
3.An apparatus as claimed in Claill, 2, wherein a height of' each said 0 1 sleeve.holders (5) on said timing belt (4) of said loader section is higher than the height of said first and second aligning plates (6, 7) by a distance (t), whereby when the sleeve is not supported 1 by said sleeve holder on a givon condition, it may fall into said 1 containing box (2) by its own weight.
4.An apparatus as claimed in Claim 2, wherein c,,lid pushing plale (23) is disposed opposite to said first transfer block (13) and is V-shaped in cross section for inserting the sleeve (11) fed_-by means of said timing belt (4) into said gripping recess (13 a) 1 of said first transfer block.
5.An apparatus as claimed in Claim 2, wherein said solenoicl valve (20) mounted on the top of said first transfer block (13) of said sorter section has at its lower end a control pin (20 a), said control pin being extended into and retracted from said gripping recess (13 a) to control the feeding of the IC chips (10) in the a k 37 sleeve. (11) to said tester (8).
6.An cllilll((1 in Claim 5, whercin said soi-1.01, svelion --further comprises a vibrator (21) mounted on one side of' a cover plate (19), said vibrator being operated after the lapse of given 1 time from a retractation of said control pin (20 a) of said solenoid Valve (20).
7.An apparatus as claimed in Claim 2, wherein said swing arm (17) is selectively inserted into said hooking grooves (15 a, 15 b) of said legs (15) secured to the lower portion of said first transfer, block (13) to elevate or lower said first transfer block.
S.An apparatus as claimed in Claim 2, wherein said sorter section further comprises a spring (14) disposed between said first transfer block (13) and saiel carriage (12), whereby said first transfer Mock may be always maintained in an elevated position.
1 0 38 -
9.An apparatus as claimed in Claini 2, wherein said guide rails (35) of said dropping section comprise rods each formed into a spear shape.
1O.An apparatus as claimed in Claim 2, wherein said dropping section 1 further comprises an engaging member (48) having a sloping surface and attached to the lower portions of said guide rails (35), and said unloading section further comprises an engaging block (57) disposed above said sensor (56) and having at its forward end a V-shaped groove (57 a) inclinedly formed to permit the sleeve (11) falling by its own weight to sloppingly slide to said unloading section.
]].An apparatus as claimed in Claim 2, wherein said unloading secl ion further coniprise's an inclined plate (60). a stationary plat.e (64) disposed parelled to said inclined plate (60) and closely to said pushing plate (601, and a sensor (63) I'ixed to -Y A - 39 said slationary plate (64) for (1c%tectiiig the presence of the IC chip in the empty sleeve.
12. Apparatus for loading and unloading sleeves for an K xescer substantially as described herein with 1 reference to the accompanying drawings.
Published 1991 at The Patent Office. State House, 66/71 High Holbom, LondonWC I R477P. Further copies Tnay be obtained from Sales Branch. Unit 6. Nine Mile Point. Cwrnfelinfach. Cross Keys. Newport. NPI 7HZ. Printed by Multiplex techniques ltd. St Mary Cray, Kent.
GB9017541A 1989-08-31 1990-08-10 Apparatus for loading and unloading sleeves for a ic tester Expired - Fee Related GB2235581B (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
KR1019890012565A KR910005377A (en) 1989-08-31 1989-08-31 Automatic device for separating, leveling and dropping sleeves
KR2019890015506U KR930008125Y1 (en) 1989-10-25 1989-10-25 Detecting apparatus of slive direction
KR1019890015372A KR960015559B1 (en) 1989-10-25 1989-10-25 Sleeve loading apparatus of ic tester
KR2019890017068U KR940000547Y1 (en) 1989-11-18 1989-11-18 Sleeve dropping device
KR2019890017069U KR940001273Y1 (en) 1989-11-18 1989-11-18 I.c. detecting apparatus in sleeve
KR2019900003834U KR950006931Y1 (en) 1990-03-31 1990-03-31 Lifter of IC Test Sleeve

Publications (3)

Publication Number Publication Date
GB9017541D0 GB9017541D0 (en) 1990-09-26
GB2235581A true GB2235581A (en) 1991-03-06
GB2235581B GB2235581B (en) 1993-06-09

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Application Number Title Priority Date Filing Date
GB9017541A Expired - Fee Related GB2235581B (en) 1989-08-31 1990-08-10 Apparatus for loading and unloading sleeves for a ic tester

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JP (1) JPH0645406B2 (en)
DE (1) DE4023772A1 (en)
FR (1) FR2651330B1 (en)
GB (1) GB2235581B (en)
NL (1) NL195037C (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5702224A (en) * 1995-12-22 1997-12-30 Hitachi Electronics Engineering Co., Ltd. Gravitational IC package transfer mechanism
US6641348B1 (en) 1998-03-27 2003-11-04 Brooks Automation Gmbh Docking station for substrate transport containers
CN108152778A (en) * 2018-01-29 2018-06-12 昆山立讯射频科技有限公司 The automatic intermodulation testing equipment of wave filter

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950001245Y1 (en) * 1991-09-13 1995-02-24 금성일렉트론 주식회사 Apparatus for autotransmitting device of handler
DE4430846C2 (en) * 1994-08-31 1997-04-10 Jenoptik Jena Gmbh Device for the implementation of a transport object between two end positions
DE4430844C1 (en) * 1994-08-31 1996-02-22 Jenoptik Technologie Gmbh Feeding device for semiconductor processing systems
DE4443061A1 (en) * 1994-12-03 1996-06-05 Elmako Damm Gmbh Chip handling appts. for conveying chips from magazine to processing station or vice versa
TW371347B (en) * 1995-12-27 1999-10-01 Advantest Corp Structure of rotary arm and device chuck part of a device handler
KR100481298B1 (en) * 1997-08-04 2006-05-22 삼성전자주식회사 Semiconductor device transfer / insertion system and semiconductor device transfer / insertion method through it
DE19733937C1 (en) * 1997-08-06 1999-03-04 Multitest Elektronische Syst Guide path for microelectronic component in automatic handling device
CN115432423B (en) * 2022-08-29 2023-08-18 深圳市博辉特科技有限公司 Simple material classification mechanism
CN115870228B (en) * 2022-12-21 2023-10-20 江苏晟銮电子科技有限公司 Schottky chip detection system and chip detection method
CN117068737A (en) * 2023-08-24 2023-11-17 江苏信息职业技术学院 An automatic supply device for material tubes
CN119702271B (en) * 2025-01-06 2025-11-07 温州市瑞泰紧固件有限公司 Nut deoiling machine

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0227968A2 (en) * 1986-01-03 1987-07-08 Motorola, Inc. High speed integrated circuit handler

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3584319D1 (en) * 1984-06-29 1991-11-14 Advantest Corp IC TEST DEVICE.
US4775279A (en) * 1985-12-11 1988-10-04 American Tech Manufacturing, Inc. Method and apparatus for loading/unloading dip devices
US4744799A (en) * 1986-06-06 1988-05-17 Usm Corporation Combined sequencer and insertion machine
US4850785A (en) * 1987-03-13 1989-07-25 Quality Automation, Inc. Eprom feed apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0227968A2 (en) * 1986-01-03 1987-07-08 Motorola, Inc. High speed integrated circuit handler

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5702224A (en) * 1995-12-22 1997-12-30 Hitachi Electronics Engineering Co., Ltd. Gravitational IC package transfer mechanism
US6641348B1 (en) 1998-03-27 2003-11-04 Brooks Automation Gmbh Docking station for substrate transport containers
CN108152778A (en) * 2018-01-29 2018-06-12 昆山立讯射频科技有限公司 The automatic intermodulation testing equipment of wave filter
CN108152778B (en) * 2018-01-29 2024-01-30 苏州立讯技术有限公司 Automatic intermodulation test equipment of filter

Also Published As

Publication number Publication date
NL9001820A (en) 1991-03-18
GB2235581B (en) 1993-06-09
DE4023772A1 (en) 1991-03-14
JPH0645406B2 (en) 1994-06-15
DE4023772C2 (en) 1992-07-16
FR2651330A1 (en) 1991-03-01
NL195037C (en) 2003-06-25
JPH03238233A (en) 1991-10-24
FR2651330B1 (en) 1994-10-28
GB9017541D0 (en) 1990-09-26

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Effective date: 20060810