GB1219001A - Digital setup apparatus for radiation gauging and controlling systems - Google Patents
Digital setup apparatus for radiation gauging and controlling systemsInfo
- Publication number
- GB1219001A GB1219001A GB05314/68A GB1531468A GB1219001A GB 1219001 A GB1219001 A GB 1219001A GB 05314/68 A GB05314/68 A GB 05314/68A GB 1531468 A GB1531468 A GB 1531468A GB 1219001 A GB1219001 A GB 1219001A
- Authority
- GB
- United Kingdom
- Prior art keywords
- scale
- gauge
- desired value
- composition
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 title abstract 4
- 239000000203 mixture Substances 0.000 abstract 4
- 239000000956 alloy Substances 0.000 abstract 2
- 229910045601 alloy Inorganic materials 0.000 abstract 2
- 239000004033 plastic Substances 0.000 abstract 2
- 229920003023 plastic Polymers 0.000 abstract 2
- 238000004164 analytical calibration Methods 0.000 abstract 1
- 235000019504 cigarettes Nutrition 0.000 abstract 1
- 239000012530 fluid Substances 0.000 abstract 1
- 238000005286 illumination Methods 0.000 abstract 1
- 239000003550 marker Substances 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 238000005096 rolling process Methods 0.000 abstract 1
- 238000005070 sampling Methods 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
- 239000004753 textile Substances 0.000 abstract 1
- 210000003813 thumb Anatomy 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D5/00—Control of dimensions of material
- G05D5/02—Control of dimensions of material of thickness, e.g. of rolled material
- G05D5/03—Control of dimensions of material of thickness, e.g. of rolled material characterised by the use of electric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Extrusion Moulding Of Plastics Or The Like (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Abstract
1,219,001. Radiation gauges; Indicating and recording apparatus. INDUSTRIAL NUCLEONICS CORP. March 29, 1968 [April 28, 1967], No.15314/68. Headings G1A and G1J. A radiation gauge for measuring a property of travelling material comprises means for receiving digital signals indicative of the desired value of said property, logic circuits responsive to the digital signals and selecting the proper one from a plurality of available scales and means responsive to the logic circuits to set calibration circuits of the gauge and indicate the desired value on the gauge recorder. The invention is described applied to a mucleonic thickness gauge for a rolling mill. An operator (using thumb wheel switches) or an automatic controller selects a desired thickness which is stored in a digital memory together with a code indicating the type of alloy being rolled. Logic circuits read the stored desired thickness and produce a signal indicative of the appropriate scale. This scale signal causes illumination of the numerals on the corresponding scale of the instrument indicator/recorder and is used in a logic circuit together with the alloy type code to determine the centre point and span adjustments for the instrument calibration circuits. When the gauge is of the type having a feedback circuit to oppose the output of the radiation detector the adjustments will be made to the gain and off-set voltage of the feedback loop, by changing the settings of digital potentiometers. Scale, composition and target marking A sequencer is provided for sequentially sampling the scale signal, composition signal and target or desired value signal and deflecting a marker pen on the recorder first to a position representing the scale, then to a position representing composition and finally to a position representing the desired value where it stays. The sequencer operates whenever the apparatus starts working, or the composition or desired value is changed or when manually initiated. The marking sequence may be stopped at any point for test purposes. The invention may also be applied to a plastics or rubber calender, a paper making machine, a plastics or metal extruding machine, textile drafting apparatus or a cigarette making machine. It may also be used to monitor a fluid from a chemical or mixing process. The logic circuits, which mainly use resistor and diode matrices, are described in detail.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US63459467A | 1967-04-28 | 1967-04-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1219001A true GB1219001A (en) | 1971-01-13 |
Family
ID=24544443
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB05314/68A Expired GB1219001A (en) | 1967-04-28 | 1968-03-29 | Digital setup apparatus for radiation gauging and controlling systems |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE1773283A1 (en) |
| GB (1) | GB1219001A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2403826A (en) * | 2003-06-26 | 2005-01-12 | Hewlett Packard Development Co | Voltage margin testing system for computer systems |
| GB2404046B (en) * | 2003-06-26 | 2006-10-18 | Hewlett Packard Development Co | Method and construct for enabling programmable integrated system margin testing |
| US7437258B2 (en) | 2003-06-26 | 2008-10-14 | Hewlett-Packard Development Company, L.P. | Use of I2C programmable clock generator to enable frequency variation under BMC control |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004041041A1 (en) * | 2004-08-25 | 2006-03-09 | Sauer-Danfoss Aps | Analog signal e.g. temperature, pressure signals, evaluation method, involves providing supply inputs of primary detector being evaluated with different logic levels |
-
1968
- 1968-03-29 GB GB05314/68A patent/GB1219001A/en not_active Expired
- 1968-04-25 DE DE19681773283 patent/DE1773283A1/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2403826A (en) * | 2003-06-26 | 2005-01-12 | Hewlett Packard Development Co | Voltage margin testing system for computer systems |
| GB2404046B (en) * | 2003-06-26 | 2006-10-18 | Hewlett Packard Development Co | Method and construct for enabling programmable integrated system margin testing |
| GB2403826B (en) * | 2003-06-26 | 2007-02-28 | Hewlett Packard Development Co | Voltage margin testing under BMC control |
| US7400996B2 (en) | 2003-06-26 | 2008-07-15 | Benjamin Thomas Percer | Use of I2C-based potentiometers to enable voltage rail variation under BMC control |
| US7437258B2 (en) | 2003-06-26 | 2008-10-14 | Hewlett-Packard Development Company, L.P. | Use of I2C programmable clock generator to enable frequency variation under BMC control |
| US7493226B2 (en) | 2003-06-26 | 2009-02-17 | Hewlett-Packard Development Company, L.P. | Method and construct for enabling programmable, integrated system margin testing |
Also Published As
| Publication number | Publication date |
|---|---|
| DE1773283A1 (en) | 1972-04-06 |
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