GB1118849A - Diffusion of impurities into semiconductors - Google Patents
Diffusion of impurities into semiconductorsInfo
- Publication number
- GB1118849A GB1118849A GB28793/67A GB2879367A GB1118849A GB 1118849 A GB1118849 A GB 1118849A GB 28793/67 A GB28793/67 A GB 28793/67A GB 2879367 A GB2879367 A GB 2879367A GB 1118849 A GB1118849 A GB 1118849A
- Authority
- GB
- United Kingdom
- Prior art keywords
- nitrogen
- oxygen
- deposition
- tetraethylorthosilicate
- phosphorus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
- C30B31/06—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
- C30B31/18—Controlling or regulating
- C30B31/185—Pattern diffusion, e.g. by using masks
-
- H10P14/6334—
-
- H10P14/6923—
-
- H10P95/00—
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Silicon Compounds (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
A phosphorus-doped layer of silicon dioxide is deposited on a semi-conductor substrate by heating mixed streams of oxygen-tetraethylorthosilicate and nitrogen-triethylphosphate. At a deposition temperature of 350-400 DEG C. the ratio of phosphorus to silicon may be 0.1:1.0 or 0.16:1.0. At a deposition temperature of 650-750 DEG C. the ratio of P:Si may be 0.03:1.0 or 0.01:1.0. Fig. 1 (not shown) depicts deposition apparatus having a quartz loading tube for moving substrates between preheat and deposition zones of a quartz furnace, the apparatus having provision for the separate or combined supply of streams of oxygen, oxygen-tetraethylorthosilicate, nitrogen, and nitrogen-triethyl phosphate. A liquid trap and flame arrestor are provided in the common input line to the furnace.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US56492866A | 1966-07-13 | 1966-07-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1118849A true GB1118849A (en) | 1968-07-03 |
Family
ID=24256471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB28793/67A Expired GB1118849A (en) | 1966-07-13 | 1967-06-22 | Diffusion of impurities into semiconductors |
Country Status (3)
| Country | Link |
|---|---|
| DE (1) | DE1619969C3 (en) |
| FR (1) | FR1527293A (en) |
| GB (1) | GB1118849A (en) |
-
1967
- 1967-06-06 FR FR8538A patent/FR1527293A/en not_active Expired
- 1967-06-22 GB GB28793/67A patent/GB1118849A/en not_active Expired
- 1967-06-30 DE DE1619969A patent/DE1619969C3/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE1619969B2 (en) | 1975-05-07 |
| FR1527293A (en) | 1968-05-31 |
| DE1619969A1 (en) | 1971-03-18 |
| DE1619969C3 (en) | 1975-12-18 |
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