FI921827A7 - Provapparatur - Google Patents

Provapparatur Download PDF

Info

Publication number: FI921827A7
Authority: FI; Finland
Prior art keywords: provapparatur
Prior art date: 1991-05-21

Application number

FI921827A

Other languages

English (en)

Other versions

FI921827A0 (fi

Inventor

Helmut Lang-Dahlke

Original Assignee

Lang Dahlke Helmut

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1991-05-21

Filing date

1992-04-23

Publication date

1992-11-22

1992-04-23 Application filed by Lang Dahlke Helmut filed Critical Lang Dahlke Helmut

1992-04-23 Publication of FI921827A0 publication Critical patent/FI921827A0/fi

1992-11-22 Publication of FI921827A7 publication Critical patent/FI921827A7/fi

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)
Testing Of Individual Semiconductor Devices (AREA)
Holo Graphy (AREA)
Dry Shavers And Clippers (AREA)
Glass Compositions (AREA)
Coupling Device And Connection With Printed Circuit (AREA)
Multi-Conductor Connections (AREA)
Compounds Of Unknown Constitution (AREA)

FI921827A 1991-05-21 1992-04-23 Provapparatur FI921827A7 (fi)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
DE4116457A DE4116457C1 (fi)	1991-05-21	1991-05-21

Publications (2)

Publication Number	Publication Date
FI921827A0 FI921827A0 (fi)	1992-04-23
FI921827A7 true FI921827A7 (fi)	1992-11-22

Family

ID=6432047

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FI921827A FI921827A7 (fi)	1991-05-21	1992-04-23	Provapparatur

Country Status (6)

Country	Link
US (1)	US5283605A (fi)
EP (1)	EP0514671B1 (fi)
AT (1)	ATE125366T1 (fi)
DE (2)	DE4116457C1 (fi)
FI (1)	FI921827A7 (fi)
IL (1)	IL101918A (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE19508902A1 (de) *	1995-03-11	1996-09-12	Nadejda Dipl Phys Poskatcheeva	Vorrichtung zur Prüfung von Platinen sowie deren Verwendung
SG59913A1 (en) *	1995-12-20	1999-02-27	Tan Yin Leong	Zero insertion apparatus for burn-in test probe
KR100295228B1 (ko)	1998-10-13	2001-07-12	윤종용	통합테스트시스템과그를이용한통합테스트공정수행방법
US6441627B1 (en) *	1998-10-26	2002-08-27	Micron Technology, Inc.	Socket test device for detecting characteristics of socket signals
US6400134B1 (en) *	2000-07-17	2002-06-04	Infineon Technologies North America Corp.	Automated bad socket masking in real-time for test handlers
US6788081B2 (en) *	2001-07-18	2004-09-07	Micron Technology, Inc.	Motherboard memory slot ribbon cable and apparatus
KR100493058B1 (ko) *	2003-04-15	2005-06-02	삼성전자주식회사	소켓 이상 유무를 실시간으로 판단하는 반도체 소자의전기적 검사방법
TW576505U (en) *	2003-05-07	2004-02-11	Hon Hai Prec Ind Co Ltd	Testing device for slots of motherboards
US7208936B2 (en) *	2004-04-12	2007-04-24	Intel Corporation	Socket lid and test device
TW201201638A (en) *	2010-06-23	2012-01-01	Hon Hai Prec Ind Co Ltd	Load board
JP5579547B2 (ja) *	2010-09-07	2014-08-27	株式会社ヨコオ	コネクタ接続用検査治具

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE8417765U1 (de) *		1984-09-13	Siemens AG, 1000 Berlin und 8000 München	Prüfgerät mit Bestückvorrichtung für die elektrischeFunktionsprüfung eines Einschubs für ein elektrisches Gerät
US4460236A (en) *	1981-12-17	1984-07-17	At&T Bell Laboratories	Test apparatus for electrical circuit boards
US4516072A (en) *	1982-11-22	1985-05-07	Amp Incorporated	Device for use in testing printed circuit board components
DE3340180C1 (de) *	1983-11-07	1985-05-15	MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH	Kontaktfeldanordnung fuer ein rechnergesteuertes Leiterplattenpruefgeraet
DE3533810A1 (de) *	1984-09-25	1986-04-03	International Standard Electric Corp., New York, N.Y.	Adapter zum pruefen von leiterplatten-baugruppen
US4846702A (en) *	1988-01-07	1989-07-11	Minnesota Mining & Manufacturing Company	Electrical connector for surface mount chip carrier installed in a socket
DE8911411U1 (de) *	1989-09-25	1989-11-30	Siemens AG, 1000 Berlin und 8000 München	Prüfadapter für Baugruppen der elektrischen Nachrichtentechnik
US4978912A (en) *	1989-10-23	1990-12-18	Ag Communication Systems Corporation	Chip carrier socket test probe
FR2659175B1 (fr) *	1990-03-02	1992-06-19	Souriau & Cie	Connecteur electrique pour banc de test.

1991
- 1991-05-21 DE DE4116457A patent/DE4116457C1/de not_active Expired - Lifetime
1992
- 1992-04-18 EP EP92106723A patent/EP0514671B1/de not_active Expired - Lifetime
- 1992-04-18 AT AT92106723T patent/ATE125366T1/de not_active IP Right Cessation
- 1992-04-18 DE DE59202910T patent/DE59202910D1/de not_active Expired - Fee Related
- 1992-04-23 FI FI921827A patent/FI921827A7/fi not_active Application Discontinuation
- 1992-05-19 IL IL10191892A patent/IL101918A/en unknown
- 1992-05-21 US US07/888,049 patent/US5283605A/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
DE59202910D1 (de)	1995-08-24
ATE125366T1 (de)	1995-08-15
DE4116457C1 (fi)	1992-10-29
US5283605A (en)	1994-02-01
IL101918A (en)	1994-12-29
EP0514671A1 (de)	1992-11-25
EP0514671B1 (de)	1995-07-19
FI921827A0 (fi)	1992-04-23
IL101918A0 (en)	1992-12-30

Publication	Publication Date	Title
DE69133396D1 (de)	2004-07-22	Warenauszahlsystem
DE69212332D1 (de)	1996-08-22	Farbball
DE59206583D1 (de)	1996-07-18	Windsichter
ATE137279T1 (de)	1996-05-15	Stoffauflauf
DE59209976D1 (de)	2003-03-20	Flaschendispenser
DE69218585D1 (de)	1997-04-30	Anzeigetafel
DE69219252D1 (de)	1997-05-28	Ölbehälter
ATA131391A (de)	1992-09-15	Reibring
DE69232811D1 (de)	2002-11-21	Infustionspräparat
BR9204511A (pt)	1993-06-01	Recolhedor-enrolador
DE59208716D1 (de)	1997-08-21	Lymphoides cd30-antigen
DE59207013D1 (de)	1996-10-02	Sportschuh
DE69126968D1 (de)	1997-09-04	Tamburin
FI921827A7 (fi)	1992-11-22	Provapparatur
FI933808L (fi)	1993-08-31	Insekticidiskt aktiva peptider
DE69230668D1 (de)	2000-03-16	Imaginograph
FI923224A7 (fi)	1994-01-15	Oeppnande aendvaegg foer sluten dubbeldaeckad jaernvaegsgodsvagn
NO923797L (no)	1993-04-02	Broennverktoey
ATA170491A (de)	1993-02-15	Mauerstein
DE69232673D1 (de)	2002-08-14	Tiefsttemperaturmessausrüstung
DE69220547D1 (de)	1997-07-31	5-substituierte-2-Oxazolidinone
ATA9892A (de)	1994-04-15	Formstein
BR9201945A (pt)	1993-01-12	Filatorio
DE69224122D1 (de)	1998-02-26	Kephalostat
CA68725S (fr)	1991-06-18	Mobilier-jeu

Legal Events

Date	Code	Title	Description
1997-11-10	FD	Application lapsed