FI20055326A0 - Method and measuring device for microwave measurement - Google Patents
Method and measuring device for microwave measurementInfo
- Publication number
- FI20055326A0 FI20055326A0 FI20055326A FI20055326A FI20055326A0 FI 20055326 A0 FI20055326 A0 FI 20055326A0 FI 20055326 A FI20055326 A FI 20055326A FI 20055326 A FI20055326 A FI 20055326A FI 20055326 A0 FI20055326 A0 FI 20055326A0
- Authority
- FI
- Finland
- Prior art keywords
- measuring device
- microwave measurement
- microwave
- measurement
- measuring
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2623—Measuring-systems or electronic circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
- G01R27/2658—Cavities, resonators, free space arrangements, reflexion or interference arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P7/00—Resonators of the waveguide type
- H01P7/06—Cavity resonators
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20055326A FI119744B (en) | 2005-06-17 | 2005-06-17 | Method and measuring device for microwave measurement |
| PCT/FI2006/050266 WO2006134237A1 (en) | 2005-06-17 | 2006-06-16 | Method and measuring device for measuring with microwaves |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20055326A FI119744B (en) | 2005-06-17 | 2005-06-17 | Method and measuring device for microwave measurement |
| FI20055326 | 2005-06-17 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| FI20055326A0 true FI20055326A0 (en) | 2005-06-17 |
| FI20055326L FI20055326L (en) | 2006-12-18 |
| FI119744B FI119744B (en) | 2009-02-27 |
Family
ID=34778462
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20055326A FI119744B (en) | 2005-06-17 | 2005-06-17 | Method and measuring device for microwave measurement |
Country Status (2)
| Country | Link |
|---|---|
| FI (1) | FI119744B (en) |
| WO (1) | WO2006134237A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI121195B (en) | 2006-06-22 | 2010-08-13 | Senfit Oy | Method and instrument for radio wave measurement |
| EP2530458B1 (en) * | 2010-01-28 | 2014-05-21 | Oji Holdings Corporation | Method and device for measuring basis weight and water content amount |
| US9797703B2 (en) * | 2016-03-07 | 2017-10-24 | Duke University | Non-invasive thickness measurement using resonant frequency shift |
| CN111433556A (en) | 2017-06-05 | 2020-07-17 | 杜克大学 | Non-invasive thickness measurement using fixed frequency |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1351107A (en) * | 1953-10-23 | 1974-04-24 | Emi Ltd | Range sensitive devices |
| BE759483R (en) * | 1969-12-08 | 1971-04-30 | Commissariat Energie Atomique | METHOD OF MEASURING A DISPLACEMENT AND DEVICE BY MAKING APPLICATIO |
| US6297648B1 (en) * | 1996-08-16 | 2001-10-02 | The Boeing Company | Oscillating cavity paint meter |
| FI119005B (en) * | 2004-09-20 | 2008-06-13 | Senfit Oy | Procedure for measurement on microwaves, measuring apparatus and oscillator |
-
2005
- 2005-06-17 FI FI20055326A patent/FI119744B/en not_active IP Right Cessation
-
2006
- 2006-06-16 WO PCT/FI2006/050266 patent/WO2006134237A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| FI20055326L (en) | 2006-12-18 |
| FI119744B (en) | 2009-02-27 |
| WO2006134237A1 (en) | 2006-12-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PC | Transfer of assignment of patent |
Owner name: SENFIT OY Free format text: SENFIT OY |
|
| FG | Patent granted |
Ref document number: 119744 Country of ref document: FI |
|
| MM | Patent lapsed |