FI20001733L - Refraktometer - Google Patents

Refraktometer Download PDF

Info

Publication number: FI20001733L
Authority: FI; Finland
Prior art keywords: refractometer
Prior art date: 2000-08-01

Application number

FI20001733A

Other languages

English (en)

Finnish (fi)

Other versions

FI20001733A0 (sv

FI113566B (sv

Inventor

Harri Salo

Original Assignee

Janesko Oy

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-08-01

Filing date

2000-08-01

Publication date

2002-02-02

2000-08-01 Application filed by Janesko Oy filed Critical Janesko Oy

2000-08-01 Priority to FI20001733A priority Critical patent/FI113566B/sv

2000-08-01 Publication of FI20001733A0 publication Critical patent/FI20001733A0/sv

2001-08-01 Priority to US09/918,528 priority patent/US6760098B2/en

2002-02-02 Publication of FI20001733L publication Critical patent/FI20001733L/sv

2004-05-14 Application granted granted Critical

2004-05-14 Publication of FI113566B publication Critical patent/FI113566B/sv

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
- G01N21/431—Dip refractometers, e.g. using optical fibres
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
- G01N2021/434—Dipping block in contact with sample, e.g. prism

Landscapes

Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Or Analysing Materials By Optical Means (AREA)

FI20001733A 2000-08-01 2000-08-01 Refraktometer FI113566B (sv)

Priority Applications (2)

Application Number	Priority Date	Filing Date	Title
FI20001733A FI113566B (sv)	2000-08-01	2000-08-01	Refraktometer
US09/918,528 US6760098B2 (en)	2000-08-01	2001-08-01	Refractometer

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
FI20001733A FI113566B (sv)	2000-08-01	2000-08-01	Refraktometer
FI20001733		2000-08-01

Publications (3)

Publication Number	Publication Date
FI20001733A0 FI20001733A0 (sv)	2000-08-01
FI20001733L true FI20001733L (sv)	2002-02-02
FI113566B FI113566B (sv)	2004-05-14

Family

ID=8558836

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FI20001733A FI113566B (sv)	2000-08-01	2000-08-01	Refraktometer

Country Status (2)

Country	Link
US (1)	US6760098B2 (sv)
FI (1)	FI113566B (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2004150923A (ja) *	2002-10-30	2004-05-27	Atago:Kk	屈折計
GB0401998D0 (en) *	2004-01-30	2004-03-03	Tyco Electronics Raychem Nv	Optical device
JP2008536095A (ja) *	2005-02-11	2008-09-04	スワゲロックカンパニー	流体濃度感知配置
EP2079857B1 (en) *	2006-10-11	2015-08-19	Janesko Oy	Method for measuring the active koh concentration in a koh etching process
US20090139318A1 (en) *	2007-12-04	2009-06-04	Caterpillar Inc.	Systems and methods for monitoring the quality of a reducing agent
FI124114B (sv)	2009-09-29	2014-03-31	Janesko Oy	Mätfönsterkonstruktion
US20110168876A1 (en) *	2010-01-14	2011-07-14	Hsiung Hsiao	Optical module and system for liquid sample
US8528399B2 (en)	2010-05-21	2013-09-10	The Mercury Iron and Steel Co.	Methods and apparatuses for measuring properties of a substance in a process stream
FI20135064L (sv)	2013-01-23	2014-07-24	Janesko Oy	Förfarande för mätning av brytningsindex och refraktometer
FI126449B (sv)	2014-06-11	2016-12-15	Janesko Oy	Förfarande och anordning i samband med mätning av ett separatprov taget från processvätskan
FI128037B (sv)	2015-06-29	2019-08-15	Janesko Oy	Arrangemang i samband med en refraktometers mätfönster samt refraktometer
FI126927B (sv)	2016-06-09	2017-08-15	Janesko Oy	Tätningsarrangemang för en mätanordning samt tätningsmetod
US10203279B1 (en) *	2017-12-07	2019-02-12	Janesko Oy	Optical measuring device, a refractometer and an arrangement for an optical measurement
IT201800004247A1 (it) *	2018-04-05	2019-10-05		Dispositivo sensore ottico per sostanze fluide
WO2021126633A1 (en) *	2019-12-20	2021-06-24	Entegris, Inc.	Accurate temperature reading of fluid near interface
JP6900566B1 (ja) *	2020-10-12	2021-07-07	株式会社ソディック	放電加工装置
FI20206374A1 (sv) *	2020-12-28	2022-06-29	Kxs Tech Oy	Refraktometer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4451147A (en)	1981-08-31	1984-05-29	Karel Dobes	Refractometer
DE4214572C2 (de)	1992-05-03	1994-08-18	Roland Dr Ing Emmrich	Hohler vakuumdichter Formkörper aus keramischem Werkstoff
US5585729A (en)	1993-05-13	1996-12-17	Gamma Precision Technology, Inc.	Fluid concentration detecting apparatus
DE4418180C2 (de)	1994-06-27	1997-05-15	Emmrich Roland	Sondenanordnung zur Messung der spektralen Absorption in Flüssigkeiten, Gasen oder Feststoffen
US6097479A (en)	1996-10-01	2000-08-01	Texas Instruments Incorporated	Critical angle sensor
FR2766923B1 (fr) *	1997-07-30	1999-10-15	France Etat	Instrument de mesure de l'indice de refraction d'un fluide
FI108259B (sv)	1998-01-30	2001-12-14	Janesko Oy	Refraktometer
US6457478B1 (en) *	1999-11-12	2002-10-01	Michael J. Danese	Method for treating an object using ultra-violet light
EP1272268B1 (en) *	2000-03-02	2012-05-02	Dow Global Technologies LLC	Tubular reactor, process for conducting liquid/liquid multiphase reactions in a tubular reactor, and a process for ring-nitrating aromatic compounds
US6500699B1 (en) *	2000-07-11	2002-12-31	Advanced Micro Devices, Inc.	Test fixture for future integration

2000
- 2000-08-01 FI FI20001733A patent/FI113566B/sv not_active IP Right Cessation
2001
- 2001-08-01 US US09/918,528 patent/US6760098B2/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
US6760098B2 (en)	2004-07-06
FI20001733A0 (sv)	2000-08-01
FI113566B (sv)	2004-05-14
US20020018200A1 (en)	2002-02-14

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DE50100710D1 (de)	2003-11-06	Wischblatt
ATE298751T1 (de)	2005-07-15	7-oxopyridoryrimidine
FI20001733L (sv)	2002-02-02	Refraktometer
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DE10192638T1 (de)	2002-10-31	Bohrstangenladevorrichtung
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DE50100817D1 (de)	2003-11-27	Kugelgelenk
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AR027931A1 (es)	2003-04-16	Antitranspirantes
AR028061A1 (es)	2003-04-23	2-enamino-cetonitrilos fenil-substituidos
ATE476423T1 (de)	2010-08-15	Benzoylpyridazine
DE10052925B4 (de)	2005-03-10	Schaukelbett
DE50007634D1 (de)	2004-10-07	Kardioplegieballonkatheter
DE10085445T1 (de)	2003-02-27	Drahterodierbearbeitungseinrichtung
DE10195909T1 (de)	2003-02-20	Viehfüttervorrichtung

Legal Events

Date	Code	Title	Description
2019-10-22	PC	Transfer of assignment of patent	Owner name: VAISALA OYJ
2020-10-09	MA	Patent expired