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FI20001733A0 - Refraktometer - Google Patents

Refraktometer

Info

Publication number
FI20001733A0
FI20001733A0 FI20001733A FI20001733A FI20001733A0 FI 20001733 A0 FI20001733 A0 FI 20001733A0 FI 20001733 A FI20001733 A FI 20001733A FI 20001733 A FI20001733 A FI 20001733A FI 20001733 A0 FI20001733 A0 FI 20001733A0
Authority
FI
Finland
Prior art keywords
refractometer
Prior art date
Application number
FI20001733A
Other languages
English (en)
Finnish (fi)
Other versions
FI113566B (sv
FI20001733L (sv
Inventor
Harri Salo
Original Assignee
Janesko Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Janesko Oy filed Critical Janesko Oy
Priority to FI20001733A priority Critical patent/FI113566B/sv
Publication of FI20001733A0 publication Critical patent/FI20001733A0/sv
Priority to US09/918,528 priority patent/US6760098B2/en
Publication of FI20001733L publication Critical patent/FI20001733L/sv
Application granted granted Critical
Publication of FI113566B publication Critical patent/FI113566B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431—Dip refractometers, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N2021/434—Dipping block in contact with sample, e.g. prism

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20001733A 2000-08-01 2000-08-01 Refraktometer FI113566B (sv)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20001733A FI113566B (sv) 2000-08-01 2000-08-01 Refraktometer
US09/918,528 US6760098B2 (en) 2000-08-01 2001-08-01 Refractometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20001733 2000-08-01
FI20001733A FI113566B (sv) 2000-08-01 2000-08-01 Refraktometer

Publications (3)

Publication Number Publication Date
FI20001733A0 true FI20001733A0 (sv) 2000-08-01
FI20001733L FI20001733L (sv) 2002-02-02
FI113566B FI113566B (sv) 2004-05-14

Family

ID=8558836

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20001733A FI113566B (sv) 2000-08-01 2000-08-01 Refraktometer

Country Status (2)

Country Link
US (1) US6760098B2 (sv)
FI (1) FI113566B (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004150923A (ja) * 2002-10-30 2004-05-27 Atago:Kk 屈折計
GB0401998D0 (en) * 2004-01-30 2004-03-03 Tyco Electronics Raychem Nv Optical device
JP2008536095A (ja) * 2005-02-11 2008-09-04 スワゲロック カンパニー 流体濃度感知配置
US8628678B2 (en) * 2006-10-11 2014-01-14 Janesko Oy Method for measuring the active KOH concentration in a KOH etching process
US20090139318A1 (en) * 2007-12-04 2009-06-04 Caterpillar Inc. Systems and methods for monitoring the quality of a reducing agent
FI124114B (sv) 2009-09-29 2014-03-31 Janesko Oy Mätfönsterkonstruktion
US20110168876A1 (en) * 2010-01-14 2011-07-14 Hsiung Hsiao Optical module and system for liquid sample
US8528399B2 (en) 2010-05-21 2013-09-10 The Mercury Iron and Steel Co. Methods and apparatuses for measuring properties of a substance in a process stream
FI20135064L (sv) 2013-01-23 2014-07-24 Janesko Oy Förfarande för mätning av brytningsindex och refraktometer
FI126449B (sv) 2014-06-11 2016-12-15 Janesko Oy Förfarande och anordning i samband med mätning av ett separatprov taget från processvätskan
FI128037B (sv) 2015-06-29 2019-08-15 Janesko Oy Arrangemang i samband med en refraktometers mätfönster samt refraktometer
FI126927B (sv) 2016-06-09 2017-08-15 Janesko Oy Tätningsarrangemang för en mätanordning samt tätningsmetod
US10203279B1 (en) * 2017-12-07 2019-02-12 Janesko Oy Optical measuring device, a refractometer and an arrangement for an optical measurement
IT201800004247A1 (it) * 2018-04-05 2019-10-05 Dispositivo sensore ottico per sostanze fluide
US11788902B2 (en) * 2019-12-20 2023-10-17 Entegris, Inc. Accurate temperature reading of fluid near interface
JP6900566B1 (ja) * 2020-10-12 2021-07-07 株式会社ソディック 放電加工装置
FI20206374A1 (sv) * 2020-12-28 2022-06-29 Kxs Tech Oy Refraktometer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4451147A (en) 1981-08-31 1984-05-29 Karel Dobes Refractometer
DE4214572C2 (de) 1992-05-03 1994-08-18 Roland Dr Ing Emmrich Hohler vakuumdichter Formkörper aus keramischem Werkstoff
US5585729A (en) 1993-05-13 1996-12-17 Gamma Precision Technology, Inc. Fluid concentration detecting apparatus
DE4418180C2 (de) 1994-06-27 1997-05-15 Emmrich Roland Sondenanordnung zur Messung der spektralen Absorption in Flüssigkeiten, Gasen oder Feststoffen
US6097479A (en) 1996-10-01 2000-08-01 Texas Instruments Incorporated Critical angle sensor
FR2766923B1 (fr) * 1997-07-30 1999-10-15 France Etat Instrument de mesure de l'indice de refraction d'un fluide
FI108259B (sv) 1998-01-30 2001-12-14 Janesko Oy Refraktometer
US6457478B1 (en) * 1999-11-12 2002-10-01 Michael J. Danese Method for treating an object using ultra-violet light
JP4485731B2 (ja) * 2000-03-02 2010-06-23 ダウ グローバル テクノロジーズ インコーポレイティド 管状反応器、管状反応器中で液／液多相反応を行うための方法及び管状反応器中で芳香族化合物を環ニトロ化するための方法
US6500699B1 (en) * 2000-07-11 2002-12-31 Advanced Micro Devices, Inc. Test fixture for future integration

Also Published As

Publication number Publication date
FI113566B (sv) 2004-05-14
US6760098B2 (en) 2004-07-06
US20020018200A1 (en) 2002-02-14
FI20001733L (sv) 2002-02-02

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Legal Events

Date Code Title Description
PC Transfer of assignment of patent

Owner name: VAISALA OYJ

MA Patent expired