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FI20000032A0 - Järjestely ja menetelmä pinnan tarkistamiseksi - Google Patents

Järjestely ja menetelmä pinnan tarkistamiseksi

Info

Publication number
FI20000032A0
FI20000032A0 FI20000032A FI20000032A FI20000032A0 FI 20000032 A0 FI20000032 A0 FI 20000032A0 FI 20000032 A FI20000032 A FI 20000032A FI 20000032 A FI20000032 A FI 20000032A FI 20000032 A0 FI20000032 A0 FI 20000032A0
Authority
FI
Finland
Prior art keywords
examining
procedure
arrangement
Prior art date
Application number
FI20000032A
Other languages
English (en)
Swedish (sv)
Other versions
FI20000032A7 (fi
Inventor
Martti Karppinen
Heimo Keraenen
Pekka Juntunen
Original Assignee
Spectra Physics Visiontech Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spectra Physics Visiontech Oy filed Critical Spectra Physics Visiontech Oy
Priority to FI20000032A priority Critical patent/FI20000032A7/fi
Publication of FI20000032A0 publication Critical patent/FI20000032A0/fi
Priority to EP01660002A priority patent/EP1114993A3/en
Priority to US09/754,214 priority patent/US20010015414A1/en
Priority to JP2001001777A priority patent/JP2001242091A/ja
Publication of FI20000032A7 publication Critical patent/FI20000032A7/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
FI20000032A 2000-01-07 2000-01-07 Järjestely ja menetelmä pinnan tarkistamiseksi FI20000032A7 (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20000032A FI20000032A7 (fi) 2000-01-07 2000-01-07 Järjestely ja menetelmä pinnan tarkistamiseksi
EP01660002A EP1114993A3 (en) 2000-01-07 2001-01-05 Method and arrangement for inspection of surfaces
US09/754,214 US20010015414A1 (en) 2000-01-07 2001-01-05 Method and arrangement for inspection of surfaces
JP2001001777A JP2001242091A (ja) 2000-01-07 2001-01-09 表面検査のための方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20000032A FI20000032A7 (fi) 2000-01-07 2000-01-07 Järjestely ja menetelmä pinnan tarkistamiseksi

Publications (2)

Publication Number Publication Date
FI20000032A0 true FI20000032A0 (fi) 2000-01-07
FI20000032A7 FI20000032A7 (fi) 2001-10-26

Family

ID=8556992

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20000032A FI20000032A7 (fi) 2000-01-07 2000-01-07 Järjestely ja menetelmä pinnan tarkistamiseksi

Country Status (4)

Country Link
US (1) US20010015414A1 (fi)
EP (1) EP1114993A3 (fi)
JP (1) JP2001242091A (fi)
FI (1) FI20000032A7 (fi)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1813182A (zh) * 2003-04-24 2006-08-02 奥迪赛能源有限公司 公路反射能力和街道照明的监测
US7122819B2 (en) * 2004-05-06 2006-10-17 Micron Technology, Inc. Method and apparatus for imager die package quality testing
US7285767B2 (en) * 2005-10-24 2007-10-23 General Electric Company Methods and apparatus for inspecting an object
WO2007057993A1 (ja) * 2005-11-21 2007-05-24 Daihatsu Motor Co., Ltd. 圧延材識別方法およびその装置
US7834991B2 (en) * 2006-07-13 2010-11-16 Byk Gardner Gmbh Determining surface properties with angle offset correction
FI121151B (fi) * 2007-11-22 2010-07-30 Valtion Teknillinen Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
JP5621178B2 (ja) * 2009-10-24 2014-11-05 株式会社第一メカテック 外観検査装置及び印刷半田検査装置
JP2011242176A (ja) * 2010-05-14 2011-12-01 Bridgestone Corp 帯状部材の形状測定方法とその装置及び変位センサー
US8416409B2 (en) * 2010-06-04 2013-04-09 Lockheed Martin Corporation Method of ellipsometric reconnaissance
RU2483295C2 (ru) * 2011-02-02 2013-05-27 Николай Александрович Кравцов Способ диагностирования качества поверхностной структуры металлопроката
JP2013096784A (ja) * 2011-10-31 2013-05-20 Toppan Printing Co Ltd 表面特性測定装置及びコンピュータプログラム
JP5882730B2 (ja) 2011-12-28 2016-03-09 株式会社ブリヂストン 外観検査装置及び外観検査方法
CN104297162A (zh) * 2014-09-17 2015-01-21 宁波高新区晓圆科技有限公司 一种多波长多方位视觉检测方法
JP6686569B2 (ja) * 2016-03-14 2020-04-22 東芝三菱電機産業システム株式会社 表面疵撮影装置
EP3252457B1 (en) * 2016-04-08 2025-01-22 Nippon Steel Corporation Metal-body surface state monitoring device and method for monitoring metal-body surface state vorrichtung zur überwachung des oberflächenzustandes von metallkörpern und verfahren zur überwachung des oberflächenzustandes von metallkörpern
EP3465171B1 (en) * 2016-05-30 2024-07-24 Bobst Mex Sa Surface inspection system and inspection method
KR102484352B1 (ko) * 2016-08-18 2023-01-04 한화정밀기계 주식회사 부품 실장기의 카메라 모듈
JP6149990B2 (ja) * 2016-09-02 2017-06-21 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
JP6683088B2 (ja) * 2016-09-23 2020-04-15 日本製鉄株式会社 表面性状検査装置、表面性状検査方法及びプログラム
CN113310441B (zh) * 2021-06-01 2022-06-10 湖南大学 一种对金属表面粗糙度加工进行探测的偏振关联成像方法
DE102022002963B4 (de) * 2022-08-16 2024-08-22 Baumer lnspection GmbH Optische Prüfvorrichtung und Prüfverfahren

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2612482A1 (de) * 1976-03-24 1977-10-06 Hoesch Werke Ag Verfahren und einrichtung zur optischen beobachtung der oberflaeche von schnell bewegtem walzmaterial
DE19720308C2 (de) * 1997-05-15 1999-05-20 Parsytec Computer Gmbh Vorrichtung zur kontinuierlichen Detektion von Fehlern nach Größe und Art auf der Oberfläche eines bewegten Materials
EP0898163B1 (en) * 1997-08-22 2000-11-08 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Method and apparatus for automatic inspection of moving surfaces
AT406528B (de) * 1998-05-05 2000-06-26 Oesterr Forsch Seibersdorf Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen

Also Published As

Publication number Publication date
EP1114993A3 (en) 2002-06-05
EP1114993A2 (en) 2001-07-11
US20010015414A1 (en) 2001-08-23
JP2001242091A (ja) 2001-09-07
FI20000032A7 (fi) 2001-10-26

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