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EE201100004A - Knowing the technical solution and method of the system - Google Patents

Knowing the technical solution and method of the system

Info

Publication number
EE201100004A
EE201100004A EEP201100004A EEP201100004A EE201100004A EE 201100004 A EE201100004 A EE 201100004A EE P201100004 A EEP201100004 A EE P201100004A EE P201100004 A EEP201100004 A EE P201100004A EE 201100004 A EE201100004 A EE 201100004A
Authority
EE
Estonia
Prior art keywords
knowing
technical solution
solution
technical
Prior art date
Application number
EEP201100004A
Other languages
Estonian (et)
Inventor
Ilkka Dillström Tommi
Original Assignee
Visiometric Oü
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Visiometric Oü filed Critical Visiometric Oü
Priority to EEP201100004A priority Critical patent/EE05696B1/en
Priority to PCT/IB2012/000070 priority patent/WO2012098455A1/en
Publication of EE201100004A publication Critical patent/EE201100004A/en
Publication of EE05696B1 publication Critical patent/EE05696B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8986—Wood

Landscapes

  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Textile Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EEP201100004A 2011-01-20 2011-01-20 A technical solution and method for improving the performance of line-based scanners EE05696B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EEP201100004A EE05696B1 (en) 2011-01-20 2011-01-20 A technical solution and method for improving the performance of line-based scanners
PCT/IB2012/000070 WO2012098455A1 (en) 2011-01-20 2012-01-19 Arrangement and method in measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EEP201100004A EE05696B1 (en) 2011-01-20 2011-01-20 A technical solution and method for improving the performance of line-based scanners

Publications (2)

Publication Number Publication Date
EE201100004A true EE201100004A (en) 2012-10-15
EE05696B1 EE05696B1 (en) 2013-12-16

Family

ID=45855965

Family Applications (1)

Application Number Title Priority Date Filing Date
EEP201100004A EE05696B1 (en) 2011-01-20 2011-01-20 A technical solution and method for improving the performance of line-based scanners

Country Status (2)

Country Link
EE (1) EE05696B1 (en)
WO (1) WO2012098455A1 (en)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE9400849L (en) 1994-03-08 1995-04-03 Soliton Elektronik Ab Device and method for detecting defects in wood
SE0103279L (en) 2001-10-02 2003-04-03 Integrated Vision Prod Procedure for measuring light scattering and geometric profile
DE10208781B4 (en) * 2002-02-28 2004-02-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method for determining the intensity distribution when a laser beam strikes an object surface
DE102004053298B4 (en) * 2004-08-26 2008-10-09 ARGES Gesellschaft für Industrieplanung und Lasertechnik m.b.H. Scan head as part of a laser drilling and cutting device
JP2007173782A (en) * 2005-11-23 2007-07-05 Semiconductor Energy Lab Co Ltd Laser irradiation device
US20070263918A1 (en) 2006-02-13 2007-11-15 David Jenya Method and system of recognizing profiles and defects in wood processing
DE102006048954A1 (en) * 2006-10-17 2008-04-24 Ba Messtechnik Gmbh Extruded profile cross section recording method for inline operation, involves recording diameter of extruded profile using shadow measuring method, and recording profile section of extruded profile using light-section method
JP5331586B2 (en) * 2009-06-18 2013-10-30 株式会社日立ハイテクノロジーズ Defect inspection apparatus and inspection method

Also Published As

Publication number Publication date
EE05696B1 (en) 2013-12-16
WO2012098455A1 (en) 2012-07-26

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Legal Events

Date Code Title Description
MM4A Lapsed by not paying the annual fees

Effective date: 20170120