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DK105006C - Apparat til ved røntgenspektrografi af bestemme koncentrationen af et bestemt grundstof i de faste partikler i en blanding af faste partikler og væske. - Google Patents

Apparat til ved røntgenspektrografi af bestemme koncentrationen af et bestemt grundstof i de faste partikler i en blanding af faste partikler og væske.

Info

Publication number
DK105006C
DK105006C DK439562A DK439562A DK105006C DK 105006 C DK105006 C DK 105006C DK 439562 A DK439562 A DK 439562A DK 439562 A DK439562 A DK 439562A DK 105006 C DK105006 C DK 105006C
Authority
DK
Denmark
Prior art keywords
solid particles
concentration
mixture
liquid
particular element
Prior art date
Application number
DK439562A
Other languages
English (en)
Original Assignee
Rhoanglo Mine Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rhoanglo Mine Services Ltd filed Critical Rhoanglo Mine Services Ltd
Application granted granted Critical
Publication of DK105006C publication Critical patent/DK105006C/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK439562A 1961-10-11 1962-10-11 Apparat til ved røntgenspektrografi af bestemme koncentrationen af et bestemt grundstof i de faste partikler i en blanding af faste partikler og væske. DK105006C (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
RH49261 1961-10-11

Publications (1)

Publication Number Publication Date
DK105006C true DK105006C (da) 1966-08-01

Family

ID=52275567

Family Applications (1)

Application Number Title Priority Date Filing Date
DK439562A DK105006C (da) 1961-10-11 1962-10-11 Apparat til ved røntgenspektrografi af bestemme koncentrationen af et bestemt grundstof i de faste partikler i en blanding af faste partikler og væske.

Country Status (7)

Country Link
BE (1) BE623395A (da)
DE (1) DE1201089B (da)
DK (1) DK105006C (da)
FR (1) FR1336991A (da)
GB (1) GB974393A (da)
NL (1) NL284051A (da)
SE (1) SE303890B (da)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1103562A (en) * 1964-04-08 1968-02-14 Hilger & Watts Ltd Improvements in radiometric analysis
US10684238B2 (en) 2016-01-11 2020-06-16 Bruker Technologies Ltd. Method and apparatus for X-ray scatterometry
US11519868B2 (en) 2018-02-07 2022-12-06 Sorterra Global Pty Ltd Apparatus and method for analysing and processing granular material
JP2019191168A (ja) 2018-04-23 2019-10-31 ブルカー ジェイヴィ イスラエル リミテッドBruker Jv Israel Ltd. 小角x線散乱測定用のx線源光学系
US11181490B2 (en) 2018-07-05 2021-11-23 Bruker Technologies Ltd. Small-angle x-ray scatterometry
US11781999B2 (en) 2021-09-05 2023-10-10 Bruker Technologies Ltd. Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
US12249059B2 (en) 2022-03-31 2025-03-11 Bruker Technologies Ltd. Navigation accuracy using camera coupled with detector assembly

Also Published As

Publication number Publication date
GB974393A (en) 1964-11-04
BE623395A (da) 1900-01-01
SE303890B (da) 1968-09-09
FR1336991A (fr) 1963-09-06
DE1201089B (de) 1965-09-16
NL284051A (da) 1900-01-01

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