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DE69900725D1 - Kristallzellenparameterbestimmungsverfahren - Google Patents

Kristallzellenparameterbestimmungsverfahren

Info

Publication number
DE69900725D1
DE69900725D1 DE69900725T DE69900725T DE69900725D1 DE 69900725 D1 DE69900725 D1 DE 69900725D1 DE 69900725 T DE69900725 T DE 69900725T DE 69900725 T DE69900725 T DE 69900725T DE 69900725 D1 DE69900725 D1 DE 69900725D1
Authority
DE
Germany
Prior art keywords
determination process
crystal cells
parameters determination
cells parameters
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69900725T
Other languages
English (en)
Other versions
DE69900725T2 (de
Inventor
Wilhelmus Hooft
Jozef Duisenberg
Matthias Schreurs
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nonius BV
Original Assignee
Nonius BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nonius BV filed Critical Nonius BV
Publication of DE69900725D1 publication Critical patent/DE69900725D1/de
Application granted granted Critical
Publication of DE69900725T2 publication Critical patent/DE69900725T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69900725T 1998-04-28 1999-04-01 Kristallzellenparameterbestimmungsverfahren Expired - Lifetime DE69900725T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL1009012A NL1009012C2 (nl) 1998-04-28 1998-04-28 Werkwijze voor het bepalen van celparameters van een kristalstructuur onder toepassing van diffractie.
PCT/NL1999/000197 WO1999056115A1 (en) 1998-04-28 1999-04-01 Method for determining parameters of a unit cell of a crystal structure using diffraction

Publications (2)

Publication Number Publication Date
DE69900725D1 true DE69900725D1 (de) 2002-02-21
DE69900725T2 DE69900725T2 (de) 2002-08-08

Family

ID=19767033

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69900725T Expired - Lifetime DE69900725T2 (de) 1998-04-28 1999-04-01 Kristallzellenparameterbestimmungsverfahren

Country Status (7)

Country Link
US (1) US6411676B1 (de)
EP (1) EP1075653B1 (de)
JP (1) JP2002513152A (de)
AU (1) AU3173999A (de)
DE (1) DE69900725T2 (de)
NL (1) NL1009012C2 (de)
WO (1) WO1999056115A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6518778B2 (en) * 2001-01-23 2003-02-11 The United States Of America As Represented By The Secretary Of The Army Method of determining angle-of-cut
GB0312499D0 (en) * 2003-05-31 2003-07-09 Council Cent Lab Res Councils Tomographic energy dispersive diffraction imaging system
RU2541700C1 (ru) * 2013-10-08 2015-02-20 Национальный исследовательский центр "Курчатовский институт" Федеральное Государственное Бюджетное Учреждение "Петербургский институт ядерной физики им. Б.П. Константинова" (ФГБУ "ПИЯФ") Способ определения концентрации примесей в монокристалле

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3394255A (en) * 1965-06-28 1968-07-23 Picker Corp Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation
US4412345A (en) * 1981-08-03 1983-10-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for precise determinations of crystallographic orientation in crystalline substances
GB8325544D0 (en) * 1983-09-23 1983-10-26 Howe S H Orienting crystals
JPS6093335A (ja) 1983-10-27 1985-05-25 Natl Inst For Res In Inorg Mater 多結晶体の結晶粒子状態の検出測定装置
US5359640A (en) * 1993-08-10 1994-10-25 Siemens Industrial Automation, Inc. X-ray micro diffractometer sample positioner
JP2904055B2 (ja) * 1995-05-30 1999-06-14 株式会社島津製作所 Ｘ線回折装置
JP3037106B2 (ja) * 1995-05-31 2000-04-24 矢崎総業株式会社 アルコール濃度の測定方法及び測定装置
DE19945773C2 (de) * 1999-09-24 2002-02-07 Geesthacht Gkss Forschung Vorrichtung zum Monochromatisieren von Neutronen- oder Röntgenstrahlen

Also Published As

Publication number Publication date
AU3173999A (en) 1999-11-16
EP1075653B1 (de) 2001-11-21
EP1075653A1 (de) 2001-02-14
JP2002513152A (ja) 2002-05-08
WO1999056115A1 (en) 1999-11-04
DE69900725T2 (de) 2002-08-08
US6411676B1 (en) 2002-06-25
NL1009012C2 (nl) 1999-10-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition