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DE60315396D1 - Schaltung und Verfahren zum Erzeugen einer internen Betriebsspannung - Google Patents

Schaltung und Verfahren zum Erzeugen einer internen Betriebsspannung

Info

Publication number
DE60315396D1
DE60315396D1 DE60315396T DE60315396T DE60315396D1 DE 60315396 D1 DE60315396 D1 DE 60315396D1 DE 60315396 T DE60315396 T DE 60315396T DE 60315396 T DE60315396 T DE 60315396T DE 60315396 D1 DE60315396 D1 DE 60315396D1
Authority
DE
Germany
Prior art keywords
generating
circuit
operating voltage
internal operating
internal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60315396T
Other languages
English (en)
Other versions
DE60315396T2 (de
Inventor
June Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE60315396D1 publication Critical patent/DE60315396D1/de
Application granted granted Critical
Publication of DE60315396T2 publication Critical patent/DE60315396T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current 
    • G05F1/46Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G05F1/462Regulating voltage or current  wherein the variable actually regulated by the final control device is DC as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465Internal voltage generators for integrated circuits, e.g. step down generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
  • Dram (AREA)
  • Read Only Memory (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
DE60315396T 2002-10-15 2003-10-08 Schaltung und Verfahren zum Erzeugen einer internen Betriebsspannung Expired - Lifetime DE60315396T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/272,404 US6795366B2 (en) 2002-10-15 2002-10-15 Internal voltage converter scheme for controlling the power-up slope of internal supply voltage
US272404 2002-10-15

Publications (2)

Publication Number Publication Date
DE60315396D1 true DE60315396D1 (de) 2007-09-20
DE60315396T2 DE60315396T2 (de) 2008-05-08

Family

ID=32042936

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60315396T Expired - Lifetime DE60315396T2 (de) 2002-10-15 2003-10-08 Schaltung und Verfahren zum Erzeugen einer internen Betriebsspannung

Country Status (7)

Country Link
US (1) US6795366B2 (de)
EP (1) EP1411407B1 (de)
JP (1) JP2004139594A (de)
KR (1) KR100471185B1 (de)
CN (1) CN100520960C (de)
DE (1) DE60315396T2 (de)
TW (1) TWI229347B (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7212067B2 (en) * 2003-08-01 2007-05-01 Sandisk Corporation Voltage regulator with bypass for multi-voltage storage system
US20050088222A1 (en) * 2003-10-27 2005-04-28 Stmicroelectronics, Inc. Chip enabled voltage regulator
JP2005176513A (ja) * 2003-12-11 2005-06-30 Sanyo Electric Co Ltd 電源回路
JP4549711B2 (ja) * 2004-03-29 2010-09-22 ルネサスエレクトロニクス株式会社 半導体回路装置
KR100571278B1 (ko) * 2004-04-20 2006-04-13 주식회사 하이닉스반도체 전압 상승 컨버터
KR20070034468A (ko) * 2004-05-14 2007-03-28 제트모스 테크놀로지 인코포레이티드 내부 전압 발생기 구조 및 전력 운영 방법
KR100610020B1 (ko) * 2005-01-13 2006-08-08 삼성전자주식회사 반도체 메모리 장치에서의 셀 파워 스위칭 회로와 그에따른 셀 파워 전압 인가방법
DE102005002381A1 (de) 2005-01-18 2006-08-10 Beru Ag Verfahren zum Betreiben einer Heizvorrichtung für ein Kraftfahrzeug
US7994833B2 (en) 2005-09-28 2011-08-09 Hynix Semiconductor Inc. Delay locked loop for high speed semiconductor memory device
KR100834400B1 (ko) * 2005-09-28 2008-06-04 주식회사 하이닉스반도체 Dram의 동작 주파수를 높이기 위한 지연고정루프 및 그의 출력드라이버
US7602222B2 (en) * 2005-09-30 2009-10-13 Mosaid Technologies Incorporated Power up circuit with low power sleep mode operation
US7500081B2 (en) * 2005-09-30 2009-03-03 Intel Corporation Power-up implementation for block-alterable memory with zero-second erase time
KR100763250B1 (ko) * 2006-02-22 2007-10-04 삼성전자주식회사 반도체 메모리 장치의 내부 전원전압 발생회로
KR100806127B1 (ko) * 2006-09-06 2008-02-22 삼성전자주식회사 피크 커런트를 감소시키는 파워 게이팅 회로 및 파워게이팅 방법
US8715235B2 (en) 2007-07-05 2014-05-06 Baxter International Inc. Dialysis system having disposable cassette and heated cassette interface
US7909795B2 (en) 2007-07-05 2011-03-22 Baxter International Inc. Dialysis system having disposable cassette and interface therefore
US7925910B2 (en) * 2007-07-19 2011-04-12 Micron Technology, Inc. Systems, methods and devices for limiting current consumption upon power-up
US9305609B2 (en) 2008-04-30 2016-04-05 Micron Technology, Inc. System and method of command based and current limit controlled memory device power up
DE102008027392B4 (de) 2008-06-09 2019-03-21 Atmel Corp. Schaltung und Verfahren zum Betrieb einer Schaltung
KR101535267B1 (ko) * 2008-12-01 2015-07-09 삼성전자주식회사 파워-온 검출기, 파워-온 검출기의 동작 방법, 그리고 파워-온 검출기를 포함하는 메모리 장치
US8638161B2 (en) * 2011-07-20 2014-01-28 Nxp B.V. Power control device and method therefor
US9417675B2 (en) * 2014-05-29 2016-08-16 Silicon Storage Technology, Inc. Power sequencing for embedded flash memory devices
JP6050804B2 (ja) * 2014-11-28 2016-12-21 力晶科技股▲ふん▼有限公司 内部電源電圧補助回路、半導体記憶装置及び半導体装置
JP6466761B2 (ja) * 2015-03-31 2019-02-06 ラピスセミコンダクタ株式会社 半導体装置、及び電源供給方法
US10579087B2 (en) * 2018-05-02 2020-03-03 Silicon Laboratories Inc. System, apparatus and method for flexible control of a voltage regulator of an integrated circuit
CN112202432B (zh) * 2020-09-30 2022-11-22 合肥寰芯微电子科技有限公司 一种低功耗按键和外部中断兼容唤醒电路及其控制方法
CN112272022B (zh) * 2020-09-30 2022-11-08 合肥寰芯微电子科技有限公司 一种低功耗外部中断唤醒电路及其控制方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5781784A (en) * 1992-07-09 1998-07-14 Zilog, Inc. Dynamic power management of solid state memories
JP2925422B2 (ja) * 1993-03-12 1999-07-28 株式会社東芝 半導体集積回路
US5896338A (en) * 1997-04-11 1999-04-20 Intel Corporation Input/output power supply detection scheme for flash memory
US5923156A (en) * 1997-08-15 1999-07-13 Micron Technology, Inc. N-channel voltage regulator
KR100308479B1 (ko) * 1998-08-11 2001-11-01 윤종용 컴퓨터 시스템 내에서 부트-업 메모리로 사용되는 플래시 메모리 장치 및 그것의 데이터 읽기 방법
JP2000155617A (ja) * 1998-11-19 2000-06-06 Mitsubishi Electric Corp 内部電圧発生回路
US6320454B1 (en) * 2000-06-01 2001-11-20 Atmel Corporation Low power voltage regulator circuit for use in an integrated circuit device
US6343044B1 (en) * 2000-10-04 2002-01-29 International Business Machines Corporation Super low-power generator system for embedded applications
US6522193B2 (en) * 2000-12-19 2003-02-18 Hynix Semiconductor Inc. Internal voltage generator for semiconductor memory device

Also Published As

Publication number Publication date
CN1497605A (zh) 2004-05-19
EP1411407B1 (de) 2007-08-08
CN100520960C (zh) 2009-07-29
TWI229347B (en) 2005-03-11
JP2004139594A (ja) 2004-05-13
EP1411407A2 (de) 2004-04-21
KR20040034312A (ko) 2004-04-28
TW200406781A (en) 2004-05-01
KR100471185B1 (ko) 2005-03-10
US20040071036A1 (en) 2004-04-15
US6795366B2 (en) 2004-09-21
EP1411407A3 (de) 2005-08-10
DE60315396T2 (de) 2008-05-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition